JP2015161030A - ガス供給マニホールド及びガス供給マニホールドを使用してチャンバにガスを供給する方法 - Google Patents
ガス供給マニホールド及びガス供給マニホールドを使用してチャンバにガスを供給する方法 Download PDFInfo
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- 238000012545 processing Methods 0.000 claims abstract description 27
- 238000000231 atomic layer deposition Methods 0.000 claims description 16
- 238000011144 upstream manufacturing Methods 0.000 claims description 16
- 239000011261 inert gas Substances 0.000 claims description 9
- 239000000758 substrate Substances 0.000 claims description 8
- 238000005229 chemical vapour deposition Methods 0.000 claims description 7
- 238000007599 discharging Methods 0.000 claims description 4
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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Abstract
【解決手段】ウェーハ処理リアクタのためのガス注入システム31は、ウェーハ処理リアクタのガス注入ポートに接続されるように構成される管状ガスマニホールド導管32と、第1のガスを管状ガスマニホールド導管内に供給するための第1の供給口33及び第2のガスを管状ガスマニホールド導管内に供給するための第2の供給口を備えるガス供給口34とを備える。各々の供給口は、管状ガスマニホールド導管の第1の軸位置51にて管状ガスマニホールド導管に接続される2つ以上の注入ポートを有し、ガス供給口の各々の注入ポートは第1の軸位置にて管状ガスマニホールド導管の円周に沿って均一に分配される。
【選択図】図4
Description
NU=100×[1−((最大信号−最小信号)/(信号の平均値))]
Claims (20)
- ウェーハ処理リアクタのためのガス注入システムであって、
管状ガスマニホールド導管内で混合されたガスをウェーハ処理リアクタに供給するための前記ウェーハ処理リアクタのガス注入ポートに接続されるように構成される管状ガスマニホールド導管と、
第1のガスを前記管状ガスマニホールド導管内に供給するための第1の供給口及び第2のガスを前記管状ガスマニホールド導管内に供給するための第2の供給口を備え、各々の供給口が、前記管状ガスマニホールド導管の第1の軸位置にて前記管状ガスマニホールド導管に接続される2つ以上の注入ポートを有する、ガス供給口と、
を備え、
前記ガス供給口の各々の注入ポートは、前記第1の軸位置にて前記管状ガスマニホールド導管の円周に沿って均一に分配される、ガス注入システム。 - 前記第1の供給口の注入ポートの数及び前記第2の供給口の注入ポートの数は同じであり、前記第1の供給口の注入ポート及び前記第2の供給口の注入ポートは前記管状ガスマニホールド導管の円周に沿って交互に配置される、請求項1に記載のガス注入システム。
- 前記第1の供給口は、前記第1のガスを注入するための注入口及び前記第1のガスを流出するための複数の流出口を有するC形状の共通チャネルを更に備え、前記第1のガスを流出するための複数の流出口は、前記第1の供給口の2つ以上の注入ポートのそれぞれに接続され、前記第2の供給口は、前記第2のガスを注入するための注入口及び前記第2のガスを流出するための複数の流出口を有するC形状の共通チャネルを更に備え、前記第2のガスを流出するための複数の流出口は、前記第2の供給口の2つ以上の注入ポートのそれぞれに接続される、請求項1に記載のガス注入システム。
- 各々の供給口の前記注入ポートは、前記管状ガスマニホールド導管の軸に対して約0°〜約45°の角度にて前記管状ガスマニホールド導管に接続される、請求項1に記載のガス注入システム。
- 各々の供給口の前記注入ポートは、前記管状ガスマニホールド導管の軸に対して約90°の角度にて前記管状ガスマニホールド導管に接続される、請求項1に記載のガス注入システム。
- 前記管状ガスマニホールド導管は、前記第1の軸位置の下流における第1の直径、及び前記第1の軸位置における第2の直径を有し、前記第2の直径は前記第1の直径より小さい、請求項1に記載のガス注入システム。
- 前記第1の供給口は反応ガスを提供するガス源に接続され、前記第2の供給口は不活性ガスを提供するガス源に接続される、請求項1に記載のガス注入システム。
- 前記ガス供給口は下側ガス供給口として機能し、前記ガス注入システムは上側ガス供給口を更に備え、前記上側ガス供給口は、第3のガスを前記管状ガスマニホールド導管内に供給するための第3の供給口及び第4のガスを前記管状ガスマニホールド導管内に供給するための第4の供給口を備え、前記上側ガス供給口の各々は、前記管状ガスマニホールド導管の第2の軸位置にて前記管状ガスマニホールド導管に接続される2つ以上の注入ポートを有し、前記第2の軸位置は前記第1の軸位置の上流に配置される、請求項1に記載のガス注入システム。
- 前記管状ガスマニホールド導管は、前記第1の軸位置の下流における第1の直径、前記第1の軸位置における第2の直径、及び前記第2の軸位置における第3の直径を有し、前記第3の直径は前記第2の直径より小さく、前記第2の直径は前記第1の直径より小さい、請求項8に記載のガス注入システム。
- 前記第3の供給口は、前記第3のガスを注入するための注入口及び前記第3のガスを流出するための複数の流出口を有するC形状の共通チャネルを更に備え、前記第3のガスを流出するための複数の流出口は、前記第3の供給口の2つ以上の注入ポートのそれぞれに接続され、前記第4の供給口は、前記第4のガスを注入するための注入口及び前記第4のガスを流出するための複数の流出口を有するC形状の共通チャネルを更に備え、前記第4のガスを流出するための複数の流出口は、前記第4の供給口の2つ以上の注入ポートのそれぞれに接続される、請求項8に記載のガス注入システム。
- 前記第3の供給口及び前記第4の供給口の各々の前記注入ポートは、前記管状ガスマニホールド導管の軸に対して約0°〜約45°の角度にて前記管状ガスマニホールド導管に接続される、請求項8に記載のガス注入システム。
- 前記第3の供給口及び前記第4の供給口の各々の前記注入ポートは、前記管状ガスマニホールド導管の軸に対してほぼ平行に前記管状ガスマニホールド導管に接続され、前記第1の供給口及び前記第2の供給口の各々の前記注入ポートは、前記管状ガスマニホールド導管の軸に対して約15°〜約25°の角度にて前記管状ガスマニホールド導管に接続される、請求項11に記載のガス注入システム。
- 補助ガスを前記管状ガスマニホールド導管内に供給するための最上部供給口を更に備え、前記最上部供給口は前記管状ガスマニホールド導管の上流端部にて前記管状ガスマニホールド導管に接続される注入ポートを有する、請求項1に記載のガス注入システム。
- 最上部供給口は、ドライガスを提供するガス源に接続される、請求項12に記載のガス注入システム。
- 前記ウェーハ処理リアクタは、原子層堆積(ALD)用のリアクタ又は化学気相成長(CVD)用のリアクタであり、前記管状ガスマニホールド導管はALD又はCVD用の前記リアクタのガス注入ポートに接続される、請求項1に記載のガス注入システム。
- 前記管状ガスマニホールド導管は、前記ウェーハ処理リアクタのウェーハ収容領域上の中心にガス注入ポートを配置するように構成される、請求項15に記載のガス注入システム。
- 請求項1に記載のガス注入システムを使用して混合ガスをウェーハ処理リアクタに供給するための方法であって、
前記第1の供給口の注入ポートを通して前記第1のガスを前記管状ガスマニホールド導管に供給し、前記第2の供給口の注入ポートを通して前記第2のガスを前記管状ガスマニホールド導管に供給するステップであって、前記第1のガス及び前記第2のガスは前記管状ガスマニホールド導管の内部で混合される、ステップと、
前記リアクタにロードされた基板上に膜を堆積させるために、前記ガス注入システムを通して混合したガスを前記ウェーハ処理リアクタに供給するステップと、
を含む、方法。 - 前記管状ガスマニホールド導管は、前記管状ガスマニホールド導管の上流端部にて前記管状ガスマニホールド導管に接続される注入ポートを有する最上部供給口を更に備え、前記方法は、いずれか一方がプロセスガスである前記第1のガス及び前記第2のガスを前記管状ガスマニホールド導管に供給しながら、前記最上部供給口の注入ポートを通して不活性ガスを前記管状ガスマニホールド導管に供給するステップを更に含む、請求項17に記載の方法。
- 前記膜は第1の条件下で堆積され、前記方法は、前記第1の条件下で堆積された膜の均一性と比較して、膜の改良された均一性を有して基板上に膜を堆積させるように、前記不活性ガスの流量を除いて前記第1の条件を維持しながら、前記最上部供給口からの前記不活性ガスの流量を変化させるステップを更に含む、請求項18に記載の方法。
- 前記ガス供給口は下側ガス供給口として機能し、前記ガス注入システムは第3の供給口及び第4の供給口を備える上側ガス供給口を更に備え、前記上側ガス供給口の各々は、前記管状ガスマニホールド導管の第2の軸位置にて前記管状ガスマニホールド導管に接続される2つ以上の注入ポートを有し、前記第2の軸位置は前記第1の軸位置の上流に配置され、前記方法は、一方がプロセスガスである前記第1のガス及び前記第2のガスを前記管状ガスマニホールド導管に供給しながら、前記第3の供給口及び前記第4の供給口のそれぞれの注入ポートを通して第3のガス及び第4のガスを前記管状ガスマニホールド導管に供給するステップを更に含む、請求項17に記載の方法。
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TW201602393A (zh) | 2016-01-16 |
KR20150100536A (ko) | 2015-09-02 |
JP6639095B2 (ja) | 2020-02-05 |
KR102313335B1 (ko) | 2021-10-15 |
US20150240359A1 (en) | 2015-08-27 |
US10683571B2 (en) | 2020-06-16 |
TWI683026B (zh) | 2020-01-21 |
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