JP5451801B2 - 電界効果型トランジスタの製造方法 - Google Patents
電界効果型トランジスタの製造方法 Download PDFInfo
- Publication number
- JP5451801B2 JP5451801B2 JP2012058087A JP2012058087A JP5451801B2 JP 5451801 B2 JP5451801 B2 JP 5451801B2 JP 2012058087 A JP2012058087 A JP 2012058087A JP 2012058087 A JP2012058087 A JP 2012058087A JP 5451801 B2 JP5451801 B2 JP 5451801B2
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- Prior art keywords
- film
- substrate
- amorphous oxide
- amorphous
- oxide
- Prior art date
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6704—Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device
- H10D30/6713—Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device characterised by the properties of the source or drain regions, e.g. compositions or sectional shapes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/674—Thin-film transistors [TFT] characterised by the active materials
- H10D30/6755—Oxide semiconductors, e.g. zinc oxide, copper aluminium oxide or cadmium stannate
- H10D30/6756—Amorphous oxide semiconductors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D99/00—Subject matter not provided for in other groups of this subclass
Landscapes
- Thin Film Transistor (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
- Physical Vapour Deposition (AREA)
- Formation Of Insulating Films (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2012058087A JP5451801B2 (ja) | 2004-11-10 | 2012-03-15 | 電界効果型トランジスタの製造方法 |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004326686 | 2004-11-10 | ||
| JP2004326686 | 2004-11-10 | ||
| JP2012058087A JP5451801B2 (ja) | 2004-11-10 | 2012-03-15 | 電界効果型トランジスタの製造方法 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005325369A Division JP5126730B2 (ja) | 2004-11-10 | 2005-11-09 | 電界効果型トランジスタの製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012160740A JP2012160740A (ja) | 2012-08-23 |
| JP2012160740A5 JP2012160740A5 (cg-RX-API-DMAC7.html) | 2012-12-06 |
| JP5451801B2 true JP5451801B2 (ja) | 2014-03-26 |
Family
ID=36461431
Family Applications (4)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012058087A Expired - Lifetime JP5451801B2 (ja) | 2004-11-10 | 2012-03-15 | 電界効果型トランジスタの製造方法 |
| JP2012058253A Expired - Lifetime JP5401573B2 (ja) | 2004-11-10 | 2012-03-15 | 電界効果型トランジスタの製造方法 |
| JP2012058163A Expired - Lifetime JP5401571B2 (ja) | 2004-11-10 | 2012-03-15 | 電界効果型トランジスタの製造方法 |
| JP2012058252A Expired - Lifetime JP5401572B2 (ja) | 2004-11-10 | 2012-03-15 | 電界効果型トランジスタの製造方法 |
Family Applications After (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012058253A Expired - Lifetime JP5401573B2 (ja) | 2004-11-10 | 2012-03-15 | 電界効果型トランジスタの製造方法 |
| JP2012058163A Expired - Lifetime JP5401571B2 (ja) | 2004-11-10 | 2012-03-15 | 電界効果型トランジスタの製造方法 |
| JP2012058252A Expired - Lifetime JP5401572B2 (ja) | 2004-11-10 | 2012-03-15 | 電界効果型トランジスタの製造方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (2) | US7829444B2 (cg-RX-API-DMAC7.html) |
| JP (4) | JP5451801B2 (cg-RX-API-DMAC7.html) |
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| KR100785038B1 (ko) * | 2006-04-17 | 2007-12-12 | 삼성전자주식회사 | 비정질 ZnO계 TFT |
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| JP5127183B2 (ja) | 2006-08-23 | 2013-01-23 | キヤノン株式会社 | アモルファス酸化物半導体膜を用いた薄膜トランジスタの製造方法 |
| US7651896B2 (en) | 2006-08-30 | 2010-01-26 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
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| JP7528063B2 (ja) | 2019-04-26 | 2024-08-05 | 株式会社半導体エネルギー研究所 | 半導体装置および電子機器 |
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| WO2020240331A1 (ja) | 2019-05-31 | 2020-12-03 | 株式会社半導体エネルギー研究所 | 半導体装置、および当該半導体装置を備えた無線通信装置 |
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- 2012-03-15 JP JP2012058163A patent/JP5401571B2/ja not_active Expired - Lifetime
- 2012-03-15 JP JP2012058252A patent/JP5401572B2/ja not_active Expired - Lifetime
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| JP2012124532A (ja) | 2012-06-28 |
| US20060110867A1 (en) | 2006-05-25 |
| JP5401573B2 (ja) | 2014-01-29 |
| US7829444B2 (en) | 2010-11-09 |
| JP5401571B2 (ja) | 2014-01-29 |
| JP2012164986A (ja) | 2012-08-30 |
| JP5401572B2 (ja) | 2014-01-29 |
| US20100267198A1 (en) | 2010-10-21 |
| JP2012160740A (ja) | 2012-08-23 |
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