KR20190135003A - 반도체 소자를 제조하기 위한 장치 및 방법 - Google Patents
반도체 소자를 제조하기 위한 장치 및 방법Info
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- KR20190135003A KR20190135003A KR1020197028050A KR20197028050A KR20190135003A KR 20190135003 A KR20190135003 A KR 20190135003A KR 1020197028050 A KR1020197028050 A KR 1020197028050A KR 20197028050 A KR20197028050 A KR 20197028050A KR 20190135003 A KR20190135003 A KR 20190135003A
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- 239000004065 semiconductor Substances 0.000 title claims description 10
- 238000004519 manufacturing process Methods 0.000 title claims description 7
- 238000000034 method Methods 0.000 title description 14
- 239000000758 substrate Substances 0.000 claims abstract description 236
- 230000005855 radiation Effects 0.000 claims abstract description 54
- 238000006243 chemical reaction Methods 0.000 claims abstract description 29
- 238000010438 heat treatment Methods 0.000 claims abstract description 23
- 239000000463 material Substances 0.000 claims description 4
- 230000008569 process Effects 0.000 description 10
- 238000012545 processing Methods 0.000 description 10
- 238000005229 chemical vapour deposition Methods 0.000 description 7
- 238000003780 insertion Methods 0.000 description 7
- 230000037431 insertion Effects 0.000 description 7
- 238000005192 partition Methods 0.000 description 7
- 230000035939 shock Effects 0.000 description 7
- 238000000151 deposition Methods 0.000 description 6
- 230000008021 deposition Effects 0.000 description 6
- 238000012546 transfer Methods 0.000 description 5
- 239000007789 gas Substances 0.000 description 4
- 230000002411 adverse Effects 0.000 description 3
- 239000000376 reactant Substances 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000000137 annealing Methods 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 238000005336 cracking Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000002829 reductive effect Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 125000006850 spacer group Chemical group 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000000407 epitaxy Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 230000000670 limiting effect Effects 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000036961 partial effect Effects 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 239000012495 reaction gas Substances 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 230000002277 temperature effect Effects 0.000 description 1
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Abstract
본 발명은 기판을 유지하기 위한 기판 홀더; 및 기판을 가열하기 위한 히터를 포함하는 반응 챔버를 포함하는, 반도체 소자 제조용 장치에 관한 것이다. 히터는 기판을 가열하기 위해, 기판 홀더에 의해 유지된 기판에 복사선 빔을 방출하도록 구성되고 배열되는 수직 공동 표면 방출 레이저를 포함할 수 있다.
Description
본 발명은 일반적으로 반도체 소자를 제조하기 위한 방법 및 장치에 관한 것이다. 보다 구체적으로, 본 발명은,
하나의 기판을 유지하기 위해 기판 홀더를 구비한 반응 챔버; 및
기판을 가열하기 위해 히터를 포함하는 장치에 관한 것이다.
반도체 기판 상에 집적 회로와 같은 미세 치수 구조를 생성하기 위해, 반응기 기능의 고온 퍼니스를 반응 챔버로서 사용할 수 있다. 실리콘 웨이퍼와 같은 여러 기판을 반응기 내측의 기판 랙 또는 보트 같은 기판 홀더 상에 배치할 수 있다. 대안적으로, 단일 기판을 반응기 내부의 기판 서셉터와 같은 기판 홀더 상에 배치할 수 있다. 기판 및 홀더를 원하는 온도까지 가열할 수 있다. 전형적인 기판 처리 단계에서, 반응물 가스를 가열된 기판 위로 통과시켜 반응물 재료 또는 가스 반응물의 얇은 층을 기판 상에 증착시킬 수 있다.
기판 상에 일련의 처리 단계를 레시피라고 한다. 증착된 층이 하부 실리콘 기판과 동일한 결정학적 구조를 갖는 경우, 이를 에피택셜층이라고 한다. 이는 하나의 결정 구조만을 가지기 때문에 종종 단결정질층이라고 또한 부른다. 후속 증착, 도핑, 리소그래피, 에칭 및 기타 공정을 통해, 이들을 집적 회로 내에 만들고, 기판 크기와 회로의 복잡성에 따라 수십 개 내지 수천 개 또는 심지어 수백만 개의 집적 소자를 생성한다.
최종 층의 고품질을 보장하기 위해 다양한 공정 파라미터를 세심하게 제어한다. 이러한 중요 파라미터 하나는 각 레시피 단계 동안의 기판 온도이다. 예를 들어, CVD 동안의 증착 가스는 특정 온도 윈도우 내에서 반응하여 기판 상에 증착한다. 상이한 온도는 또한 상이한 증착 속도를 초래한다. 따라서, 처리를 시작하기 전에 기판을 원하는 온도로 해놓고 기판 온도를 정확하게 제어하는 것이 중요하다.
처리 반응기의 처리량에 중점적으로 영향을 미치는 하나의 요인은 기판 온도 램프 속도이다. 주어진 레시피 중 여러 지점에서 이러한 온도 램프를 요구할 수 있다. 예를 들어, 차가운 기판을 적절한 처리 온도로 가열해야 한다. 또한, 레시피는 상이한 처리 단계에 대해 상이한 온도를 필요로 할 수 있다. 레시피의 말단에서, 기판을 보통 기판 취급 장치가 견딜 수 있는 수준으로 냉각한다. 가열 및 냉각 단계는 공정 시간의 상당한 분율을 나타낼 수 있고 반응기의 처리량을 제한할 수 있다. 정상 상태 온도 사이의 시간은 본질적으로, 반응기의 처리량을 증가시키기 위해 최소화되어야 하는 시간이다.
따라서, 높은 파워 및 제어도로 기판 온도를 제어할 필요가 있을 수 있다.
본 발명의 적어도 일 구현예에 따라, 반도체 소자를 제조하기 위한 장치가 제공되며, 이 장치는
하나의 기판을 유지하기 위해 기판 홀더를 구비한 반응 챔버; 및
상기 기판을 가열하기 위한 히터를 포함하되, 상기 히터는 상기 기판 홀더에 의해 유지된 기판에 복사선 빔을 방출하도록 구성되고 배열되는 수직 공동 표면 방출 레이저(vertical cavity surface emitting laser, VCSEL)를 포함한다.
수직 공동 표면 방출 레이저(VCSEL)는 기판에서의 온도를 가파르게 경사지도록 제공하기 위해 복사선에 충분한 파워를 생성할 수 있다. 수직 공동 표면 방출 레이저는, 짧은 스위치 온/스위치 오프 시간에 의해 매우 높은 제어도를 갖는 반도체 소자이다. 수직 공동 표면 방출 레이저에 의해 방출된 복사선 빔은, VCSEL이 VCSEL의 일부 거리에서 매우 양호한 파워를 제어하도록 매우 작은 분기 각도를 나타낸다.
기판 홀더는 이격된 관계로 복수의 반도체 기판을 유지하기 위한 기판 랙일 수 있으며, 기판 랙은 복수의 이격된 기판 유지 설비를 정의하는 적어도 하나의 지지 부재를 포함하며, 각각의 기판 유지 설비는 실질적으로 수평 배향으로 기판을 독립적으로 유지시키도록 구성되고, 수직 공동 표면 방출 레이저는 적어도 기판 랙 측면으로부터 기판 랙 내의 기판으로 복사선을 방출하도록 구성되고 배열된다. 히터는 기판을 사전 가열하기 위한 예비 히터와 최종 온도에서 기판을 가열하기 위한 최종 히터를 포함할 수 있고, 랙을 예비 히터로부터 최종 히터로 이동시키기 위한 랙 핸들러 그리고 기판 랙 내의 기판으로 복사선을 방출하기 위한 수직 공동 표면 방출 레이저를 예비 히터에 제공한다.
본 발명의 추가 구현예에 따라, 반도체 소자를 제조하는 방법이 제공되며, 방법은
기판을 제공하는 단계; 및
상기 기판을 수직 공동 표면 방출 레이저로 가열하는 단계를 포함한다.
선행 기술에 비해 달성되는 장점들 및 본 발명을 요약하기 위해, 본 발명의 특정 목적 및 장점들이 앞서 본원에 기술되었다. 물론, 모든 목적 및 장점들이 본 발명의 임의의 특별한 구현예에 따라 반드시 달성되는 것이 아니라는 것을 이해하여야 한다. 따라서, 예들 들어 당업자는, 본 발명이, 본원에 교시 또는 제안될 수 있는 다른 목적들 또는 장점들을 반드시 달성하지 않고서, 본원에 교시되거나 제시된 바와 같은 하나의 장점 또는 여러 장점들을 달성 또는 최적화 하는 방식으로 구현되거나 수행될 수 있다는 것을 인식할 것이다.
이들 구현예 모두 본원에 개시된 본 발명의 범주 내에 있도록 의도된다. 이들 및 다른 구현예들은 첨부된 도면들을 참조하는 특정 구현예들의 다음의 상세한 설명으로부터 당업자에게 쉽게 분명하게 될 것이고, 본 발명은 개시된 임의의 특정 구현예(들)에 한정되지 않는다.
도면의 구성 요소들은 간략하게 및 명료하게 도시되어 있으며, 도시된 본 개시의 구현예의 이해를 돕기 위해 반드시 축적대로 그려지지 않았음을 이해할 것이다. 예를 들어, 본 개시에서 도시된 구현예의 이해를 돕기 위해 도면 중 일부 구성 요소의 치수는 다른 구성 요소에 비해 과장될 수 있다.
도 1은 본 발명에 따라 수직 공동 표면 방출 레이저를 적용하기 위한 장치의 사시도를 개략적이고 부분적으로 전개한 것을 도시한다.
도 2는 도 1에 따른 장치의 평면도를 개략적으로 도시한다.
도 3은 수직 공동 표면 방출 레이저를 도시한다.
도 4는 어레이에서 도 3의 복수의 수직 공동 표면 방출 레이저를 도시한다.
도 5는 도 4의 어레이에 의해 가열된 다수의 기판을 운반하기 위한 기판 랙의 측면도를 도시한다.
도 6은 도 4의 어레이에 의해 가열 중인 도 5의 기판 랙의 일부를 도시한다.
도 7은 도 5의 기판 랙 내에서 가열 중인 기판의 상부도를 도시한다.
도 8은 VCSEL 어레이를 사용하여 장치에서 발생할 수 있는 과도한 가열 문제를 도시한다.
도 9는 도 8의 과도한 가열 문제에 대한 해결책을 도시한다.
도 1은 본 발명에 따라 수직 공동 표면 방출 레이저를 적용하기 위한 장치의 사시도를 개략적이고 부분적으로 전개한 것을 도시한다.
도 2는 도 1에 따른 장치의 평면도를 개략적으로 도시한다.
도 3은 수직 공동 표면 방출 레이저를 도시한다.
도 4는 어레이에서 도 3의 복수의 수직 공동 표면 방출 레이저를 도시한다.
도 5는 도 4의 어레이에 의해 가열된 다수의 기판을 운반하기 위한 기판 랙의 측면도를 도시한다.
도 6은 도 4의 어레이에 의해 가열 중인 도 5의 기판 랙의 일부를 도시한다.
도 7은 도 5의 기판 랙 내에서 가열 중인 기판의 상부도를 도시한다.
도 8은 VCSEL 어레이를 사용하여 장치에서 발생할 수 있는 과도한 가열 문제를 도시한다.
도 9는 도 8의 과도한 가열 문제에 대한 해결책을 도시한다.
특정 구현예 및 실시예가 아래에 개시되었지만, 당업자는 본 발명이 구체적으로 개시된 구현예 및/또는 본 발명의 용도 및 이들의 명백한 변형 및 균등물을 넘어 연장된다는 것을 이해할 것이다. 따라서, 개시된 발명의 범주는 후술되는 구체적인 개시된 구현예에 의해 제한되지 않도록 의도된다.
기판 적층체를 가열하기 위한 VCSEL
본 발명에 따라 수직 공동 표면 방출 레이저(VCSEL)을 포함하는 장치(1)를 도 1 및 도 2에 표시할 수 있다. 상기 장치(1)는 하우징(2)을 포함하고, 일반적으로 소위 "클린룸"에 부분적으로 또는 완전히 설치될 수 있다. 하우징(2) 외에 특히, 도 2에서 볼 수 있는 바와 같이 격벽(3 내지 5)이 존재할 수 있다. 하우징(2)은 격벽(3)으로 반응기 영역(21)을 구분한다. 기판 핸들링 챔버(22)는 하우징(2)과 격벽(3, 4) 사이에서 구분된다. 카세트 핸들링 챔버(23)는 격벽(4, 5)과 하우징(2) 사이에서 구분된다. 장치(1)는 카세트 도입부(33)를 추가로 포함한다.
히터를 구비한 2개의 반응기 챔버, 예를 들어 퍼니스(6, 7)를 반응기 영역(21)에 배열하나, 단일 퍼니스를 또한 사용할 수 있다. 상기 퍼니스는 수직으로 위치하고, 기판(13)으로 충진된 기판 랙(12)을 아래로부터 수직 방향으로 퍼니스(6, 7) 내에 도입할 수 있다. 각각의 퍼니스는, 스핀들(38)의 보조로 수직 방향으로 이동 가능한 삽입 아암(14)을 포함하는 랙 핸들러를 여기 단부에 갖는다. 하나의 삽입 아암(14)만 도 1의 도면에서는 보여질 수 있다. 도 2에서, 장치의 양 측면에 2개의 삽입 아암(14)이 있음을 나타낸다. 기판 랙(12)은 보다 상세하게 표시되지 않은, 퍼니스에 대한 밀봉을 제공하는 절연 플러그를 바닥에 구비한다.
랙 핸들러는 반응 영역(21)에 배열되고 절개부(15)를 구비한 회전 플랫폼(11)을 추가로 포함한다. 절개부(15)가 정확한 위치 내로 오는 경우, 아암(14)이 절개부를 통해 위와 아래로 이동할 수 있도록 상기 절개부(15)의 모양을 성형한다. 반면에, 기판 랙 바닥의 직경은 상기 직경이 플랫폼(11)의 절개부(15)보다 크도록 되어, 아암(14)이 도 1에 도시된 위치로부터 하향 이동하는 경우에 기판 랙(12)이 회전 플랫폼(11) 상에 위치할 수 있고 역방향 작동 시 재차 제거될 수 있도록 한다.
기판 랙(12)은 랙 핸들러로 퍼니스(6)와 퍼니스(7) 모두에 공급될 수 있다. 그 안에 연속적인 처리를 수행하는 것이 가능하다. 기판 랙(12)의 평행한 그룹을 퍼니스(6)에 의해 독점적으로 그리고 퍼니스(7)에 의해 독점적으로 처리시키는 것이 또한 가능하다. 상기 기판 랙(12)은 기판(13)을 구비할 수 있다.
기판(13)은 카세트 도입부(33)로부터, 카세트 핸들링 로봇(35)의 아암(31)의 도움으로 밀폐 가능한 개구(34)를 통해 저장소(8) 내에 위치할 수 있는 (이송) 카세트(10)에 공급될 수 있다. 아암(31)은 회전 플랫폼(27)의 일련의 절개부(26)보다 더 작은 치수를 갖는 베어링 표면(32)을 구비할 수 있다. 다수의 이러한 회전 플랫폼을 저장소(8)에서 수직 방향으로 다른 하나 위에 하나로 제공한다. 아암(31)은 카세트 핸들링 로봇(35)의 도움을 받아 수직 방향으로 이동 가능하다. 아암(31)은, 상기 아암이 도입부(33)에서 저장소(8)로(또는 저장소에서 도입부로) 카세트를 집어 들거나 제거할 뿐만 아니라, 저장소(8)에서 회전 플랫폼(30)으로(또는 회전 플랫폼에서 저장소로) 카세트를 이동시킬 수 있도록 장착된다.
상기 회전 플랫폼(30)은 회전 시 카세트를 개구(37)가 제조된 격벽(4)에 대하여 배치하도록 구성되며, 카세트를 개방한 후에 기판은 기판 핸들러의 아암(24)의 도움과 연관된 카세트에서 하나씩 취해질 수 있고 기판 핸들링 챔버(22)에 위치한 기판 랙(12) 내에 배치될 수 있다. 상기 기판 랙(12)은, 랙 핸들러의 일부이며 상기 단부에서 베어링 표면(17)을 구비하는 힌지식 아암(16)에 의해 지지되고, 그 치수는 회전 플랫폼(11)의 절개부(15)보다 다소 작다. 상기 아암(16)은 회전 지점(18)을 중심으로 회전함으로써 격벽(3) 내의 밀폐 가능한 개구를 통해 기판 랙과 함께 이동한다. 반응 구역(21)과 기판 핸들링 챔버(22) 사이의 개구(19)를 폐쇄할 수 있도록 잠금부를 제공한다.
운전자 또는 자동화된 카세트 이송 시스템(미도시)은 도입부(33) 상에 다수의 카세트를 도입함으로써 저장소(8)에 적재할 수 있다. 제어 작동은 패널(36)에서 수행될 수 있다. 아암(31)의 도움으로 도입부(33)에서 이들 카세트에 대해 제조된 저장소(8)의 저장실(9) 내로 카세트(10)를 이송시킬 수 있다. 관련 카세트(10)를 개구(34)를 통해 도입부(33)로부터 제거하기 위한 최저 위치에서부터 출발함으로써, 카세트 핸들링 로봇(35)에 의해 저장소(8)의 더 높은 저장실(9) 내로 이동하기 위해 상기 카세트를 위쪽으로 이동시킬 수 있다. 저장소(8)의 회전에 의해, 카세트(10)로 다양한 저장실(9)을 충진할 수 있다.
관심 있는 카세트(10)는 아암(31)에 의해 저장소로부터 제거될 수 있고 회전 플랫폼(30) 상에 배치될 수 있다. 카세트는 회전 플랫폼(30) 상에서 회전되고 격벽(4)에 대해 그들의 문과 함께 배치된다. 카세트의 문은 도어 개방기로 제거될 수 있다. 아암(24)에 의해, 기판은 기판 하나씩 제거될 수 있고 기판 핸들러로 스윙 아암(16) 상에 배치된 기판 랙(12) 내에 배치될 수 있다.
그 중간에서, 회전 플랫폼(11)은 반응기 영역(21) 내측에 존재하는 기판 상에서 수행될 처리에 관하여 최적의 방식으로 반응기 영역(21)에서 이동할 수 있다. 기판 랙(12)이 기판 핸들링 챔버(22) 내에 충진되고 반응기(6, 7) 중 하나에 이용될 수 있게 된 후에, 이 때까지 폐쇄되었던 개구(19)는 개방되고, 상기 신규 충진된 기판 랙(12)이 회전 플랫폼(11) 상에 배치될 수 있다. 그 다음, 상기 회전 플랫폼(11)은 위치 하나를 이동시킬 수 있고, 충진된 기판 랙(12)은 삽입 아암(14)의 도움으로 플랫폼(11)으로부터 퍼니스(6, 7) 내로 제거될 수 있다. 완성된 랙 내의 처리 기판은 상기 충진된 플랫폼(11) 상에서 하강될 수 있다. 상기 기판은 카세트에서 마무리하기 위해 위로 이동 계수기를 실행한다.
각 퍼니스(6, 7)에 제공된 삽입 아암(14)과 함께 퍼니스(6) 또는 퍼니스(7)에 공급된 신규 기판을 갖는 기판 랙(12)은 상기 퍼니스에서 처리될 수 있다. 퍼니스(6, 7)에서 연속적인 처리를 수행하는 것이 가능하다. 처리는 랙(12) 내의 기판 온도를 증가시키는 것을 포함할 수 있다. 특히, 처리가 비교적 높은 온도를 요구하는 경우에 이러한 온도 증가는 긴 시간을 요구할 수 있다. 기판 온도가 하나의 정상 상태에서 다른 정상 상태로 변할 수 있는 속도는 반응기의 램프 속도에 따라 달라진다.
장치는, 가열 시간을 감소시키기 위해 기판(13)으로 지향된 레이저 빔으로 랙(12) 내의 기판(13)을 가열하기 위한 예비 히터, 예를 들어 수직 공동 표면 방출 레이저(39)를 가질 수 있다. 랙(12)은, 스핀들(38)의 도움으로 수직 방향으로 이동 가능한 삽입 아암(14)의 도움을 받아 최종 히터로서 기능하는 퍼니스(6, 7) 내에 도입될 수 있다. 이 이동 중에, 기판(13)을 수직 공동 표면 방출 레이저(39)를 따라 이동시킬 수 있다. 수직 공동 표면 방출 레이저(39)는 레이저 빔에 충분한 파워를 생성할 수 있어서, 기판이 이동 중에 수직 공동 표면 방출 레이저(39)를 따라 통과할 때에 기판(13)의 온도 램프를 제공한다. 수직 공동 표면 방출 레이저(39)를 어레이로 배열할 수 있다.
예비 히터로서 기능하는 수직 공동 표면 방출 레이저(39)의 어레이는, 수직 방향으로의 랙(12)의 길이보다 작은 수직 방향으로의 길이를 가질 수 있다. 더욱 더 바람직하게, 예비 히터는 수직 방향으로 랙(12) 길이의 2/3, 절반 또는 심지어 1/3 미만인 수직 방향 길이를 가질 수 있다.
하나의 수직 공동 표면 방출 레이저(39)만을 도 1의 도면에서 볼 수 있다. 도 2에 도시된 바와 같이, 퍼니스(6, 7) 중 하나와 함께 각각 작업하기 위해 2개의 수직 공동 표면 방출 레이저(39)가 있을 수 있다. 대안적으로, 둘 이상의 수직 공동 표면 방출 레이저를 단일 퍼니스(6, 7) 아래에 위치시킬 수 있어서 가열의 균일성을 증가시킨다.
기판 랙(12)은, 랙(12)이 퍼니스(6, 7) 내에서 위쪽으로 이동할 때에 퍼니스(6, 7)에 대한 밀봉을 제공하는 절연 플러그를 바닥에 구비할 수 있다. 수직 공동 표면 방출 레이저(39)에 의한 예열의 균일성을 증가시키기 위해서, 수직 공동 표면 방출 레이저(39)에 의해 랙(12) 내 기판(13)의 가열 중에 수직 축 주위에 기판(13)과 함께 랙(12)을 회전시키기 위한 랙 회전 장치에 절연 플러그를 제공할 수 있다. 랙 회전 장치는 본원에 참고로 포함되는 US9018567 B2호로부터 공지될 수 있다.
도 3은 도 1 및 도 2의 장치에서 사용하기 위한 수직 공동 표면 방출 레이저(VCSEL)(39)를 도시한다. 수직 공동 표면 방출 레이저(39)는, 결정질 기판(43), 상기 기판 상에 형성된 하부 다중 간섭 미러(45)(예, 브레그 리플렉터) 에피택셜층, 상기 하부 미러 상에 형성된 적어도 하나의 양자 우물 에피택셜층을 포함하고 소정의 파장을 레이징하는 활성 영역(47), 및 상기 활성 영역 상에 형성된 상부 다중 간섭 미러(49)(예, 브레그 리플렉터) 에피택셜층을 포함할 수 있다. 층은 수직 방향으로 배열된다.
하부 및 상부 스페이서 영역을 상기 활성 영역(47)과 상기 미러(45, 49) 에피택셜층 중 각각의 것 사이에 개재시켜, 상기 파장과 소정 관계의 광학 거리만큼 분리되는 상기 미러의 대향하는 면 사이에 수직인 광학 공동을 제공한다. 상기 활성 영역(47), 상기 상부 스페이서 영역, 및 상기 상부 미러는, 실질적으로 일정한 단면적과 상기 상부 미러(49) 아래에서 제1 유효 유전 상수를 갖는 수직형 웨이브가이드 영역으로 형성된다. 레이저는 상기 웨이브가이드 영역을 측 방향에서 실질적으로 둘러싸고 상기 제1 유효 유전 상수보다 작은 제2 유전 상수를 갖는 매질을 추가로 포함한다.
2개의 전기 접촉 영역이 제공되며, 하나의 전기 접촉 영역(51)은 상기 활성 영역(47) 위의 상기 웨이브가이드 영역에 전기적으로 연결되고, 다른 하나의 전기 접촉 영역(49)은 상기 활성 영역(47) 아래의 상기 웨이브 가이드 영역에 전기적으로 연결된다. 상기 접촉 영역에 인가된 전력은 상기 거울(45, 49)의 대향하는 면 사이에 정현파를 생성함으로써, 상기 레이저를 상기 파장에서 레이징시킨다.
복사선 빔(55)은, 상부 다층 간섭 미러(49)가 100% 반사성이 아니기 때문에 수직 공동 표면 방출 레이저(39)를 빠져 나오고 있다. 하부 미러 및 상부 미러(45, 49) 사이의 거리를 조정함으로써 복사선 빔(55)의 파장을 조정할 수 있다.
수직 공동 표면 방출 레이저(39)는 800 nm 내지 1100 nm 사이, 바람직하게는 약 808 nm, 850 nm 또는 980 nm의 파장을 갖는 적외선(55)을 방출할 수 있다. 이들 파장은 복사선 빔(55)으로 조사된 기판에 의해 최적으로 흡수될 수 있다. 수직 공동 표면 방출 레이저(39)는 기판을 50 내지 1200°C, 바람직하게는 100 내지 900°C, 더욱 바람직하게는 150 내지 600°C의 온도로 가열할 수 있다.
도 4는 기판 방향으로 복사선 빔(55)을 방출하기 위해 VCSEL 어레이(57)에 제공된 다수의 수직 공동 표면 방출 레이저(39)를 도시한다. VCSEL 어레이(57)에서, VCSEL 어레이(57) 내의 개별적인 수직 공동 표면 방출 레이저(39)의 개별 파워는 전력 제어기(59)로 개별적으로 제어될 수 있어 복사선 빔(55)의 파워 출력을 조정한다. 수직 공동 표면 방출 레이저는 높은 제어도로 높은 에너지 밀도를 갖는다. 수직 공동 표면 방출 레이저(39)는 매우 좁은 방향성 복사선 빔(55)을 제공하고 수직 공동 표면 방출 레이저(39)는 좁은 스펙트럼으로 복사선 빔(55)의 매우 빠른 스위칭을 허용하고 조광을 허용하기 때문에, 제어도가 높다. 수직 공동 표면 방출 레이저(39)는 고체 상태 소자이므로, 매우 긴 수명을 갖는다. 기판 방향으로 복사선을 방출하기 위한 수직 공동 표면 방출 레이저(39)의 VCSEL 어레이(57)는, 10 W/cm² 내지 40 kW/cm², 바람직하게는 100 W/cm² 내지 10 kW/cm², 더욱 바람직하게는 약 1 kW/cm²의 파워 출력을 가질 수 있다.
고온 막 증착 또는 어닐링 공정에서, 기판을 반응 챔버, 예를 들어 퍼니스(6, 7)에 도입한 후에 소정의 온도로 가열해야 한다. 현재의 화학 기상 증착 반응기에서, 기판을 반응 챔버 내로 로딩할 때 전형적으로 실온일 수 있으며, 반응 챔버는 훨씬 높은 온도, 대략 900°C만큼 높은 온도에 있다.
기판이 반응 챔버 내에 로딩될 때, 기판은 열 충격을 겪는다. 기판에 의해 경험된 열 효과는 일반적으로 기판 전체에 걸쳐서 변하며, 이는 완화하기 어려울 수 있는 큰 열 구배가 존재한다고 말할 수 있다. 이는 기판의 휨 및 깨짐 및 또한 증착된 막의 불량한 균일성과 품질을 초래할 수 있다.
처리량에 악영향을 미치지 않으면서, 그리고 대신에 처리량을 향상시키면서, 기판이 경험하는 열 충격을 감소시키는 기판 교환에 대한 필요성이 고온 반응 챔버에서 있을 수 있다. 수직 공동 표면 방출 레이저는, 기판을 반응 챔버 내에 로딩하기 전에 기판을 가열하도록 구성되고 배열될 수 있다.
수직 공동 표면 방출 레이저는 예비 히터로서, 반응기 영역(21)내에서 기판을 가열하도록 구성되고 배열될 수 있다. 랙 핸들러의 삽입 아암(14)을 예비 히터에서 기판을 최종 온도에서 가열하거나 제어할 수 있는 최종 히터로, 예를 들어 반응기 안으로, 예를 들어 퍼니스(6, 7)로 기판과 함께 랙(12)을 이동시키기 위해 사용될 수 있다.
도 5는 이격된 관계로 복수의 기판(13)을 유지하기 위한 기판 랙(12)을 도시한다. 기판 랙(12)은 복수의 이격된 기판 유지 설비를 정의하는 적어도 하나의 지지 부재(예, 3개의 버팀대(61))를 포함하며, 이들 기판 유지 설비 각각은 실질적인 수평 배향으로 기판(13)을 독립적으로 유지하도록 구성된다.
기판(13)의 방향으로 복사선 빔(55)을 방출하기 위한 수직 공동 표면 방출 레이저(39)의 VCSEL 어레이(57)는, 랙(12)의 측면 상에 위치할 수 있다. VCSEL 어레이(57)는 복사선 빔을 기판(13)의 바닥을 향하여 측면으로부터 위로 복사시킬 수 있다. 복사선 빔(55)의 각도는 기판(13)의 상부 표면에 수직인 선(L)에 대하여 60 내지 90° 사이, 바람직하게는 80 내지 89.5° 사이, 더욱 바람직하게는 85 내지 89° 사이일 수 있다.
수직 공동 표면 방출 레이저(39)의 복사선 빔(55)은 매우 평행하지만, (매우) 작은 각도로 여전히 방출될 수 있다. 따라서, 복사선 빔(55)의 방향은 수직 공동 표면 방출 레이저(39)에 의해 방출된 복사선의 평균 방향으로서 정의된다.
기판(13)에서 다시 기판 랙으로 반사된 복사선을 반사하기 위해, 리플렉터를 기판 랙의 다른 측면에 적용할 수 있다. 리플렉터는 복사선 빔이 나오는 곳과 동일한 방향으로 복사선 빔을 다시 반사시키도록 하는 리트로리플렉터일 수 있다. 반사광의 흡수를 개선하기 위해 반사광의 편광을 90도로 변경하기 위해, 리플렉터는 편광기를 구비할 수 있다. 편광기는 1/8 파장의 두께를 갖는 얇은 플레이트일 수 있다.
도 6은 도 5의 다수의 기판(13)을 운반하기 위한 기판 랙(12)의 일부를 도시한다. 기판(13) 표면으로 약간 탈축이고 상향으로 방출되는 VCSEL 어레이(57)의 복사선 빔(55)을 가짐으로써, 확실히 기판(13)을 바닥으로부터 위로 가열하는 것이 더 좋을 수 있고, 그 이유는 민감한 특징부가 기판(13)의 상부 표면 상에 있을 수 있기 때문이다.
도 7은 기판 랙 내의 기판(13) 상부도를 도시한다. 측면으로부터 기판(13)을 가열하는 VCSEL 어레이(57)를 가짐으로써, 기판(13)의 일부(59)만이 직접 가열된다. 화살표(61)에 의해 도시된 방향으로 기판(13)을 회전 장치로 회전시킴으로써, 확실히 기판(13)을 균일하게 가열한다. 회전 장치 내의 회전 모터는, 기판(13)과 함께 랙을 회전시키고 기판(13)을 균일하게 가열하는 데 사용될 수 있다.
대안적으로, 수직 공동 표면 방출 레이저는 반응기, 예를 들어 퍼니스(6, 7) 내의 기판을 가열하고, 최종 히터로서의 기능을 하도록 구성되고 배열될 수 있다. 따라서 반응기 벽을 통한 복사선 빔(55)의 투과를 허용하는 반응기 벽이 필요할 수 있다. 반응기 벽은 이 목적을 위해 유리로 제조될 수 있다.
도 8은 퍼니스에서 기판 랙(12)을 이동시키기 전에 기판(13)을 가열하기 위해 VCSEL 어레이(57)를 사용하는 장치에서 발생할 수 있는 문제를 도시한다. VCSEL 어레이(57)의 복사선은 기판 랙의 부분(12a)을 과도하게 가열할 수 있다. 복사선은 지지 부재의 주변을 통해 가열된 기판 랙(12)으로부터 산란하여 가열되도록 의도하지 않은 장치의 부분을 가열하거나, 존재하는 랙(12)의 만곡부로 복사선을 집속할 수 있다.
이러한 문제점을 부분적으로 피하기 위해, 기판 랙(12)을 회전시켜 보다 균일한 온도 분포를 달성하고 과도한 가열을 피할 수 있다. 또한 기판 랙(12)의 형상, 및 제어 시스템으로부터 이용 가능한 랙(12)의 회전 위치에 관한 정보를 사용하여, 랙(12)의 전술한 일부(12a)를 조사하는 VCSEL 매트릭스(57)의 부품 전력을 끄거나 제한할 수 있다(도 9 참조). 따라서, 감소된 양의 복사선은 기판 랙(12)의 일부(12a)에 의해 수용될 수 있고, 감소된 복사선은 가열하도록 의도되지 않은 장치의 일부를 가열하는 지지 부재의 주변을 통해 가열된 기판 랙(12)으로부터 산란할 수 있다. 장치는 다수의 수직 공동 표면 방출 레이저, 및 개별 수직 공동 표면 방출 레이저의 파워를 개별 제어하기 위한 전력 제어기를 포함하고, 전력 제어기는 기판 랙의 과도한 가열을 피하기 위해 기판 랙의 폭을 따라 수직 공동 표면 방출 레이저의 복사선 출력을 조정하도록 프로그래밍될 수 있다.
단일 기판을 가열하기 위한 VCSEL
복사선 빔(55)을 방출하기 위한 수직 공동 표면 방출 레이저(39)의 VCSEL 어레이(57)를 또한 사용하여 단일 기판 반응 챔버 내에서 개별 기판을 가열할 수 있다. 예를 들어, VCSEL 어레이(57)는 단일 기판 화학 기상 증착(CVD) 장치에 사용될 수 있다. 이러한 화학 기상 증착 장치는,
반응 챔버;
기판 홀더, 예를 들어 상부 표면 상에서 처리될 기판을 지지하기 위해 챔버 내에 배치된 서셉터;
반응 챔버의 표면 상에 위치하는 복수의 수직 공동 표면 방출 레이저(39)를 포함할 수 있고, 이들 각각은 서셉터의 상부 표면을 향해 복사선 빔(55)으로 복사 에너지를 방출하도록 구성된다. 수직 공동 표면 방출 레이저(39)는 기판을 기판 아래로부터 또는 선택적으로 기판 위로부터 가열할 수 있다. 장비는 기판을 균일하게 가열하기 위해, 복수의 수직 공동 표면 방출 레이저(39) 중 하나에 대해 복수의 수직 공동 표면 방출 레이저(39) 중 적어도 다른 하나에 의해 방출된 복사 에너지를 조정하도록 구성되는 제어기를 가질 수 있다.
리플렉터 또는 복사선 재분배기를 복수의 수직 공동 표면 방출 레이저(39)와 서셉터 사이에 위치시킬 수 있다. 반응 챔버 구성 및 제어기(59)의 목적은, 기판과 관련 서셉터에 대한 균일한 복사선을 가능한 정도까지 제공하는 환경을 제공하는 것일 수 있다. 복사선이 균일한 경우에 기판-서셉터 조합의 온도는, 열 손실 또한 균일한 정도로 균일할 것이다. 반응기 표면은 금색 도금과 같이 내측 상에 반사성 재료로 코팅될 수 있다.
반응 챔버 내의 개구를 사용하여 반응 챔버 내에 반응 가스를 도입할 수 있다. 화학 기상 증착 반응 챔버에 대한 상세 내용은 미국 특허 제 6,191,399호에 기술될 수 있고, 이는 그 전체가 본원에 참조로써 포함된다. 서셉터에 대한 상세 내용은 2000년 5월 30일 발행된 미국 특허 제6,068,441호에 기술될 수 있고, 본원에 참조로써 포함된다.
반응 챔버의 기능은 에피택셜 반응기를 제공하는 것일 수 있다. 증착 재료와 함께 가스를 도입 및 제거하기 위한 필요성뿐만 아니라, 기판 자체를 도입 및 제거하기 위한 필요성 때문에, 반응기 챔버는 관련 기능을 달성하기 위한 개구를 가질 수 있다. 고온 막 증착 또는 어닐링 공정에서, 기판을 반응 챔버에 도입한 후에 소정의 온도로 가열해야 한다.
예를 들어, 에피택시 공정에서, 온도는 전형적으로 약 1090°C 내지 1190°C일 수 있다. 이러한 기판 가열은 가열된 서셉터와의 직접 접촉을 통한 전도에 의해, 또는 가열 램프, 예를 들어 수직 공동 표면 방출 레이저(39)의 사용을 통한 복사에 의해 영향 받을 수 있다.
현재의 화학 기상 증착 에피택셜 반응기에서, 기판을 반응 챔버 내로 로딩할 때 전형적으로 실온이며, 반응 챔버는 훨씬 높은 온도, 대략 900°C만큼 높은 온도에 있다. 기판이 서셉터 상으로 놓이는 경우, 기판과 서셉터 모두 열충격을 겪는다. 기판의 질량이 서셉터보다 훨씬 작기 때문에, 기판의 충격은 더욱 크다. 기판에 의해 경험된 열 효과는 일반적으로 기판 전체에 걸쳐서 변하며, 이는 완화하기 어려울 수 있는 큰 열 구배가 존재한다고 말할 수 있다. 이는 기판의 휨 및 깨짐 및 또한 증착된 막의 불량한 균일성과 품질을 초래할 수 있다.
서셉터도 열충격을 겪고, 이는 기판 다음 기판으로 반복되고, 궁극적으로 서셉터의 작동 수명을 감소시킬 수 있다. 보통 서셉터는 열 충격을 감소시키기 위해 공정 온도보다 훨씬 작은 온도로 냉각함으로써 기판을 수용하도록 준비된다. 그 다음, 일단 기판이 제자리에 있게 되면, 처리를 진행할 수 있기 전에 서셉터를 공정 온도로 재가열해야 한다. 이렇게 반복된 온도 사이클은, 기판 이송의 목적을 위해서만, 장치에서의 기판 처리량을 느리게 한다.
처리량에 악영향을 미치지 않으면서, 그리고 대신에 처리량을 향상시키면서, 기판과 서셉터 모두가 경험하는 열 충격을 감소시키는 기판 교환에 대한 필요성이 고온 반응 챔버에서 명백히 있다. 따라서, 히터 및/또는 예비 히터로서 장치 내에 수직 공동 표면 방출 레이저를 제공하는 것이 유리할 수 있다.
히터는 기판을 예비 가열하기 위한 예비 히터, 및 최종 온도에서 기판을 가열하기 위한 최종 히터를 포함할 수 있다. 기판을 예비 히터로부터 최종 히터로 이동시키기 위한 기판 핸들러가 제공될 수 있다. 기판을 반응 챔버로 이송하기 전 또는 이송하는 중에 기판을 예비 가열하도록 예비 히터에서 기판으로 복사선을 방출하기 위해, 수직 공동 표면 방출 레이저를 구성하고 배열할 수 있다. 이로써, 공정 처리량에 악영향을 미치지 않고, 그 대신 처리량을 향상시키면서 기판과 서셉터 모두가 경험한 열 충격을 감소시킬 수 있다.
단일 기판 장치의 경우, 저온 적용은 비교적 고온 적용과 관련이 있을 수 있다. 비교적 고온에서 열 전달은 더 쉬우며, 저온에서 열 전달은 더 느리다. 따라서 저온에서 들어오는 차가운 웨이퍼의 온도 효과는 작으나, 절대 온도에서 이렇게 낮은 온도를 제어하는 것이 더 어려울 수 있음도 사실일 수 있다.
도시되고 설명된 구체적인 적용예는 본 발명의 예시이자 최적 실시모드이며, 어떤 방식으로도 양태와 적용예의 범주를 달리 제한하도록 의도되지 않는다. 실제로, 간결성을 위해서, 시스템의 종래의 제조, 연결, 준비 및 다른 기능적 양태는 상세히 기술되지 않을 수 있다. 또한, 다양한 도면들에서 도시된 연결선들은 다양한 요소들 사이의 예시적인 기능 관계 및/또는 물리적 결합을 표시하려는 의도이다. 많은 선택적인 또는 추가적인 기능적 관계 또는 물리적 연결은 실질적인 시스템에 존재할 수 있고/있거나 일부 실시예들에서는 없을 수 있다.
본원에 기술된 구성 및/또는 접근법은 본질적으로 예시적인 것이며, 다양한 변형이 가능하기 때문에, 이들 특정 구현예 또는 실시예가 제한적인 의미로 고려되어서는 안 된다는 것을 이해해야 한다. 본원에 설명된 특정 루틴 또는 방법은 임의의 처리 전략 중 하나 이상을 나타낼 수 있다. 따라서, 도시된 다양한 동작은 도시된 시퀀스에서, 상이한 시퀀스에서 수행되거나, 경우에 따라 생략될 수 있다.
본 개시의 요지는 본원에 개시된 다양한 공정, 시스템, 및 구성, 다른 특징, 기능, 행위 및/또는 성질의 모든 신규하고 비자명한 조합 및 하위조합뿐만 아니라 임의의 그리고 모든 이들의 등가물들을 포함한다.
Claims (25)
- 반도체 소자를 제조하기 위한 장치로서,
하나의 기판을 유지하기 위해 기판 홀더를 구비한 반응 챔버; 및
상기 기판을 가열하기 위한 히터를 포함하되, 상기 히터는 상기 장치에서 상기 기판으로 복사선 빔을 방출하도록 구성되고 배열되는 수직 공동 표면 방출 레이저를 포함하는 장치. - 제1항에 있어서, 상기 히터는 상기 기판의 방향으로 다수의 복사 빔을 방출하는 어레이에 제공되는, 다수의 수직 공동 표면 방출 레이저를 포함하는 장치.
- 제2항에 있어서, 상기 장치는, 각각의 복사선 빔의 파워를 개별적으로 제어하기 위해 상기 어레이에서 상기 개별 수직 공동 표면 방출 레이저의 파워를 개별적으로 제어하는 전력 제어기를 포함하는 장치.
- 제2항에 있어서, 상기 상기 기판을 50 내지 1200°C의 온도로 가열하도록 상기 수직 공동 표면 방출 레이저 어레이를 구성하고 배열하는 장치.
- 제2항에 있어서, 상기 기판의 방향으로 복사선을 방출하기 위해 상기 수직 공동 표면 방출 레이저 어레이는 10 W/cm² 내지 40 kW/cm²사이의 파워 출력을 갖는 장치.
- 제1항에 있어서, 상기 수직 공동 표면 방출 레이저는 800 nm 내지 1100 nm 사이의 파장을 갖는 적외선을 방출하는 장치.
- 제1항에 있어서, 상기 기판 홀더는 이격된 관계로 복수의 반도체 기판을 유지하기 위한 기판 랙이고, 상기 기판 랙은 복수의 이격된 기판 유지 설비를 정의하는 적어도 하나의 지지 부재를 포함하며, 각각의 기판 유지 설비는 실질적인 수평 배향으로 기판을 독립적으로 유지시키도록 구성되고, 상기 수직 공동 표면 방출 레이저는 적어도 상기 기판 랙 측면으로부터 상기 기판 랙 내의 기판으로 복사선을 방출하도록 구성되고 배열되는 장치.
- 제7항에 있어서, 상기 장치는 상기 기판 랙을 회전시키도록 구성되고 배열되는 기판 랙 회전 장치를 구비한 장치.
- 제7항에 있어서, 상기 수직 공동 표면 방출 레이저는 상기 기판 표면에 직각인 선에 대해 60 내지 90° 사이의 각도 하에 상기 기판 랙 내에 유지된 상기 기판의 바닥을 상향하는 상기 복사선 빔을 상기 기판 랙의 측면으로부터 방출시키도록 구성되고 배열되는 장치.
- 제7항에 있어서, 상기 장치는 상기 기판에서 다시 상기 기판 랙으로 반사된 복사선을 반사하기 위해 상기 수직 공동 표면 방출 레이저에 대해서 상기 장치 내에서 상기 기판 랙의 다른 측면 상에 구성되고 배열되는 리플렉터를 구비하는 장치.
- 제10항에 있어서, 상기 리플렉터는 복사선 빔이 나왔던 곳과 동일한 방향으로 상기 복사선 빔을 다시 반사시키도록 하는 리트로리플렉터를 포함하는 장치.
- 제7항에 있어서, 상기 기판 랙을 따라 상기 수직 공동 표면 방출 레이저의 복사선 출력을 조정하기 위해, 상기 장치는 다수의 수직 공동 표면 방출 레이저, 및 상기 개별 수직 공동 표면 방출 레이저의 파워를 개별 제어하는 전력 제어기를 포함하는 장치.
- 제12항에 있어서, 상기 기판 랙의 상부 및 바닥에서 상기 수직 공동 표면 방출 레이저로 더 높은 복사선 출력을 제공하기 위해 상기 전력 제어기를 프로그래밍하는 장치.
- 제7항에 있어서, 상기 히터는 상기 기판을 예비 가열하기 위한 예비 히터와 최종 온도에서 상기 기판을 가열하기 위한 최종 히터를 포함하고, 상기 랙을 상기 예비 히터로부터 상기 최종 히터로 이동시키기 위한 랙 핸들러 그리고 기판 랙 내의 상기 기판으로 복사선을 방출하기 위한 상기 수직 공동 표면 방출 레이저를 상기 예비 히터에 제공하는 장치.
- 제14항에 있어서, 상기 예비 히터와 상기 최종 히터를 상기 반응 영역에 제공하는 장치.
- 제15항에 있어서, 상기 예비 히터를 상기 최종 히터 아래에 구성하고 배열하고, 상기 랙 핸들러는 상기 랙을 상기 최종 히터로 상향 이동시킬 수 있는 장치.
- 제14항에 있어서, 상기 예비 히터가 상기 랙 내의 상기 기판의 일부를 가열하면서, 상기 예비 히터를 따라 상기 랙을 이동시키도록 상기 랙 핸들러와 상기 예비 히터를 구성하고 배열하는 장치.
- 제17항에 있어서, 상기 예비 히터의 수직 방향 길이는 상기 랙의 수직 방향 길이보다 작은 장치.
- 제1항에 있어서, 상기 히터는 상기 기판을 예비 가열하기 위한 예비 히터와 최종 온도에서 상기 기판을 가열하기 위한 최종 히터를 포함하고, 상기 기판을 상기 예비 히터로부터 상기 최종 히터로 이동시키기 위한 기판 핸들러 그리고 상기 기판으로 복사선을 방출하기 위한 상기 수직 공동 표면 방출 레이저를 상기 예비 히터에 제공하는 장치.
- 제19항에 있어서, 상기 수직 공동 표면 방출 레이저를 기판 핸들링 챔버 내에 제공하는 장치.
- 제1항에 있어서, 상기 반응 챔버 내의 기판을 가열하도록 상기 수직 공동 표면 방출 레이저를 구성하고 배열하는 장치.
- 제21항에 있어서, 상기 반응 챔버는 상기 수직 공동 표면 방출 레이저의 복사선이 투과하는 챔버 벽을 구비하는 장치.
- 제22항에 있어서, 상기 챔버 벽을 상기 수직 공동 표면 방출 레이저의 복사선에 투명한 재료로 제조하는 장치.
- 제7항에 있어서, 상기 기판 랙의 폭을 따라 상기 수직 공동 표면 방출 레이저의 복사선 출력을 조정하기 위해, 상기 장치는 다수의 수직 공동 표면 방출 레이저, 및 상기 개별 수직 공동 표면 방출 레이저의 파워를 개별 제어하는 전력 제어기를 포함하는 장치.
- 반도체 소자를 제조하는 방법으로서,
기판을 제공하는 단계; 및
상기 기판을 수직 공동 표면 방출 레이저로 가열하는 단계를 포함하는 방법.
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US20180286711A1 (en) | 2018-10-04 |
US10103040B1 (en) | 2018-10-16 |
CN110494968B (zh) | 2023-08-11 |
JP7097383B2 (ja) | 2022-07-07 |
TW201838113A (zh) | 2018-10-16 |
JP2020516059A (ja) | 2020-05-28 |
CN110494968A (zh) | 2019-11-22 |
WO2018178771A1 (en) | 2018-10-04 |
TWI762585B (zh) | 2022-05-01 |
KR102500125B1 (ko) | 2023-02-15 |
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