JP5064747B2 - 半導体装置、電気泳動表示装置、表示モジュール、電子機器、及び半導体装置の作製方法 - Google Patents
半導体装置、電気泳動表示装置、表示モジュール、電子機器、及び半導体装置の作製方法 Download PDFInfo
- Publication number
- JP5064747B2 JP5064747B2 JP2006262991A JP2006262991A JP5064747B2 JP 5064747 B2 JP5064747 B2 JP 5064747B2 JP 2006262991 A JP2006262991 A JP 2006262991A JP 2006262991 A JP2006262991 A JP 2006262991A JP 5064747 B2 JP5064747 B2 JP 5064747B2
- Authority
- JP
- Japan
- Prior art keywords
- film
- gate electrode
- oxide semiconductor
- substrate
- semiconductor film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Liquid Crystal (AREA)
- Electrodes Of Semiconductors (AREA)
- Shift Register Type Memory (AREA)
- Thin Film Transistor (AREA)
- Recrystallisation Techniques (AREA)
- Dram (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006262991A JP5064747B2 (ja) | 2005-09-29 | 2006-09-27 | 半導体装置、電気泳動表示装置、表示モジュール、電子機器、及び半導体装置の作製方法 |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005283782 | 2005-09-29 | ||
JP2005283782 | 2005-09-29 | ||
JP2006262991A JP5064747B2 (ja) | 2005-09-29 | 2006-09-27 | 半導体装置、電気泳動表示装置、表示モジュール、電子機器、及び半導体装置の作製方法 |
Related Child Applications (8)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008200670A Division JP5020190B2 (ja) | 2005-09-29 | 2008-08-04 | 半導体装置及びその作製方法 |
JP2009177524A Division JP5137912B2 (ja) | 2005-09-29 | 2009-07-30 | 半導体装置の作製方法 |
JP2010129921A Division JP5116804B2 (ja) | 2005-09-29 | 2010-06-07 | 半導体装置 |
JP2011008550A Division JP5031109B2 (ja) | 2005-09-29 | 2011-01-19 | 半導体装置及びその作製方法 |
JP2012055690A Division JP5640032B2 (ja) | 2005-09-29 | 2012-03-13 | 半導体装置、モジュール、及び電子機器 |
JP2012160330A Division JP5448280B2 (ja) | 2005-09-29 | 2012-07-19 | 半導体装置 |
JP2012160290A Division JP5478676B2 (ja) | 2005-09-29 | 2012-07-19 | 半導体装置の作製方法 |
JP2012160408A Division JP5640045B2 (ja) | 2005-09-29 | 2012-07-19 | 半導体装置、電気泳動表示装置、表示モジュール、及び電子機器 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2007123861A JP2007123861A (ja) | 2007-05-17 |
JP2007123861A5 JP2007123861A5 (enrdf_load_stackoverflow) | 2008-09-18 |
JP5064747B2 true JP5064747B2 (ja) | 2012-10-31 |
Family
ID=38147305
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006262991A Active JP5064747B2 (ja) | 2005-09-29 | 2006-09-27 | 半導体装置、電気泳動表示装置、表示モジュール、電子機器、及び半導体装置の作製方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP5064747B2 (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101515543B1 (ko) * | 2013-08-12 | 2015-05-11 | 동의대학교 산학협력단 | 박막 트랜지스터 및 그 제조 방법 |
KR101680047B1 (ko) | 2009-10-14 | 2016-11-28 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
Families Citing this family (933)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3614442A3 (en) * | 2005-09-29 | 2020-03-25 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device having oxide semiconductor layer and manufactoring method thereof |
JP4793679B2 (ja) * | 2005-11-10 | 2011-10-12 | 富士電機株式会社 | 薄膜トランジスタ |
EP1821578A3 (en) | 2006-02-21 | 2010-07-07 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device |
JP4999400B2 (ja) * | 2006-08-09 | 2012-08-15 | キヤノン株式会社 | 酸化物半導体膜のドライエッチング方法 |
US8803781B2 (en) * | 2007-05-18 | 2014-08-12 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and display device |
JP4989309B2 (ja) | 2007-05-18 | 2012-08-01 | 株式会社半導体エネルギー研究所 | 液晶表示装置 |
JP2008300514A (ja) * | 2007-05-30 | 2008-12-11 | Ihi Corp | レーザアニール方法及びレーザアニール装置 |
JP2008299269A (ja) * | 2007-06-04 | 2008-12-11 | Bridgestone Corp | 書籍型情報表示装置 |
US8354674B2 (en) * | 2007-06-29 | 2013-01-15 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device wherein a property of a first semiconductor layer is different from a property of a second semiconductor layer |
US7738050B2 (en) | 2007-07-06 | 2010-06-15 | Semiconductor Energy Laboratory Co., Ltd | Liquid crystal display device |
EP2183780A4 (en) * | 2007-08-02 | 2010-07-28 | Applied Materials Inc | THIN FILM TRANSISTORS WITH THIN FILM SEMICONDUCTOR MATERIALS |
US20100320457A1 (en) * | 2007-11-22 | 2010-12-23 | Masahito Matsubara | Etching solution composition |
JP5213422B2 (ja) * | 2007-12-04 | 2013-06-19 | キヤノン株式会社 | 絶縁層を有する酸化物半導体素子およびそれを用いた表示装置 |
JPWO2009075281A1 (ja) | 2007-12-13 | 2011-04-28 | 出光興産株式会社 | 酸化物半導体を用いた電界効果型トランジスタ及びその製造方法 |
WO2009089198A1 (en) * | 2008-01-08 | 2009-07-16 | Moxtronics, Inc. | High-performance heterostructure light emitting devices and methods |
TWI467761B (zh) * | 2008-01-17 | 2015-01-01 | Idemitsu Kosan Co | Field effect transistor, semiconductor device and manufacturing method thereof |
US20100295042A1 (en) * | 2008-01-23 | 2010-11-25 | Idemitsu Kosan Co., Ltd. | Field-effect transistor, method for manufacturing field-effect transistor, display device using field-effect transistor, and semiconductor device |
US8247315B2 (en) | 2008-03-17 | 2012-08-21 | Semiconductor Energy Laboratory Co., Ltd. | Plasma processing apparatus and method for manufacturing semiconductor device |
JP2009267399A (ja) * | 2008-04-04 | 2009-11-12 | Fujifilm Corp | 半導体装置,半導体装置の製造方法,表示装置及び表示装置の製造方法 |
JP5704790B2 (ja) * | 2008-05-07 | 2015-04-22 | キヤノン株式会社 | 薄膜トランジスタ、および、表示装置 |
KR101461127B1 (ko) | 2008-05-13 | 2014-11-14 | 삼성디스플레이 주식회사 | 반도체 장치 및 이의 제조 방법 |
KR101449460B1 (ko) * | 2008-05-23 | 2014-10-13 | 주성엔지니어링(주) | 박막 트랜지스터 어레이 기판 및 이의 제조 방법 |
KR20090126766A (ko) | 2008-06-05 | 2009-12-09 | 삼성전자주식회사 | 박막 트랜지스터 표시판 |
US8314765B2 (en) | 2008-06-17 | 2012-11-20 | Semiconductor Energy Laboratory Co., Ltd. | Driver circuit, display device, and electronic device |
US8258511B2 (en) * | 2008-07-02 | 2012-09-04 | Applied Materials, Inc. | Thin film transistors using multiple active channel layers |
KR100963104B1 (ko) | 2008-07-08 | 2010-06-14 | 삼성모바일디스플레이주식회사 | 박막 트랜지스터, 그의 제조 방법 및 박막 트랜지스터를구비하는 평판 표시 장치 |
TWI450399B (zh) * | 2008-07-31 | 2014-08-21 | Semiconductor Energy Lab | 半導體裝置及其製造方法 |
TWI626744B (zh) * | 2008-07-31 | 2018-06-11 | 半導體能源研究所股份有限公司 | 半導體裝置及半導體裝置的製造方法 |
TWI491048B (zh) * | 2008-07-31 | 2015-07-01 | Semiconductor Energy Lab | 半導體裝置 |
JP2010056541A (ja) * | 2008-07-31 | 2010-03-11 | Semiconductor Energy Lab Co Ltd | 半導体装置およびその作製方法 |
US9666719B2 (en) | 2008-07-31 | 2017-05-30 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
JP5608347B2 (ja) | 2008-08-08 | 2014-10-15 | 株式会社半導体エネルギー研究所 | 半導体装置及び半導体装置の作製方法 |
TWI637444B (zh) | 2008-08-08 | 2018-10-01 | 半導體能源研究所股份有限公司 | 半導體裝置的製造方法 |
JP5480554B2 (ja) | 2008-08-08 | 2014-04-23 | 株式会社半導体エネルギー研究所 | 半導体装置 |
TWI508282B (zh) * | 2008-08-08 | 2015-11-11 | Semiconductor Energy Lab | 半導體裝置及其製造方法 |
JP5525778B2 (ja) | 2008-08-08 | 2014-06-18 | 株式会社半導体エネルギー研究所 | 半導体装置 |
KR20100023151A (ko) * | 2008-08-21 | 2010-03-04 | 삼성모바일디스플레이주식회사 | 박막 트랜지스터 및 그 제조방법 |
CN102165570A (zh) | 2008-08-29 | 2011-08-24 | 株式会社爱发科 | 场效应晶体管的制造方法和制造装置 |
JP5627071B2 (ja) | 2008-09-01 | 2014-11-19 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
US8021916B2 (en) | 2008-09-01 | 2011-09-20 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
US9082857B2 (en) * | 2008-09-01 | 2015-07-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device comprising an oxide semiconductor layer |
JP5274165B2 (ja) * | 2008-09-08 | 2013-08-28 | 富士フイルム株式会社 | 薄膜電界効果型トランジスタ及びその製造方法 |
KR101545460B1 (ko) * | 2008-09-12 | 2015-08-18 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 생산 방법 |
WO2010029859A1 (en) | 2008-09-12 | 2010-03-18 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
KR101722913B1 (ko) | 2008-09-12 | 2017-04-05 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
EP2327069A4 (en) | 2008-09-12 | 2013-03-20 | Semiconductor Energy Lab | DISPLAY DEVICE |
KR101762112B1 (ko) | 2008-09-19 | 2017-07-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 액정표시장치 |
CN104134673B (zh) * | 2008-09-19 | 2017-04-12 | 株式会社半导体能源研究所 | 显示装置及其制造方法 |
KR102113024B1 (ko) * | 2008-09-19 | 2020-06-02 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
KR101920196B1 (ko) * | 2008-09-19 | 2018-11-20 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체장치 |
CN102881696A (zh) * | 2008-09-19 | 2013-01-16 | 株式会社半导体能源研究所 | 显示装置 |
JPWO2010038566A1 (ja) * | 2008-09-30 | 2012-03-01 | コニカミノルタホールディングス株式会社 | 薄膜トランジスタおよびその製造方法 |
JP5525224B2 (ja) * | 2008-09-30 | 2014-06-18 | 株式会社半導体エネルギー研究所 | 表示装置 |
CN101714546B (zh) | 2008-10-03 | 2014-05-14 | 株式会社半导体能源研究所 | 显示装置及其制造方法 |
WO2010038820A1 (en) | 2008-10-03 | 2010-04-08 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
EP2172977A1 (en) | 2008-10-03 | 2010-04-07 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
EP2172804B1 (en) * | 2008-10-03 | 2016-05-11 | Semiconductor Energy Laboratory Co, Ltd. | Display device |
KR101803720B1 (ko) | 2008-10-03 | 2017-12-01 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
JP5552753B2 (ja) | 2008-10-08 | 2014-07-16 | ソニー株式会社 | 薄膜トランジスタおよび表示装置 |
CN101719493B (zh) | 2008-10-08 | 2014-05-14 | 株式会社半导体能源研究所 | 显示装置 |
JP5484853B2 (ja) * | 2008-10-10 | 2014-05-07 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
WO2010044478A1 (en) | 2008-10-16 | 2010-04-22 | Semiconductor Energy Laboratory Co., Ltd. | Light-emitting display device |
JP5361651B2 (ja) | 2008-10-22 | 2013-12-04 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
US8106400B2 (en) * | 2008-10-24 | 2012-01-31 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
JP5442234B2 (ja) | 2008-10-24 | 2014-03-12 | 株式会社半導体エネルギー研究所 | 半導体装置及び表示装置 |
US8741702B2 (en) | 2008-10-24 | 2014-06-03 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
KR102095625B1 (ko) | 2008-10-24 | 2020-03-31 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제조 방법 |
WO2010047288A1 (en) * | 2008-10-24 | 2010-04-29 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductordevice |
EP2180518B1 (en) * | 2008-10-24 | 2018-04-25 | Semiconductor Energy Laboratory Co, Ltd. | Method for manufacturing semiconductor device |
JP5616012B2 (ja) * | 2008-10-24 | 2014-10-29 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
KR101667909B1 (ko) * | 2008-10-24 | 2016-10-28 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체장치의 제조방법 |
KR101634411B1 (ko) * | 2008-10-31 | 2016-06-28 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 구동 회로, 표시 장치 및 전자 장치 |
TWI567829B (zh) | 2008-10-31 | 2017-01-21 | 半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
KR101603303B1 (ko) | 2008-10-31 | 2016-03-14 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 도전성 산질화물 및 도전성 산질화물막의 제작 방법 |
KR101631454B1 (ko) | 2008-10-31 | 2016-06-17 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 논리회로 |
TWI467663B (zh) * | 2008-11-07 | 2015-01-01 | Semiconductor Energy Lab | 半導體裝置和該半導體裝置的製造方法 |
KR102149626B1 (ko) | 2008-11-07 | 2020-08-28 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치의 제작 방법 |
TWI831050B (zh) | 2008-11-07 | 2024-02-01 | 日商半導體能源研究所股份有限公司 | 半導體裝置和其製造方法 |
TWI535037B (zh) | 2008-11-07 | 2016-05-21 | 半導體能源研究所股份有限公司 | 半導體裝置和其製造方法 |
EP2184783B1 (en) | 2008-11-07 | 2012-10-03 | Semiconductor Energy Laboratory Co, Ltd. | Semiconductor device and method for manufacturing the same |
CN101740631B (zh) * | 2008-11-07 | 2014-07-16 | 株式会社半导体能源研究所 | 半导体装置及该半导体装置的制造方法 |
TWI656645B (zh) | 2008-11-13 | 2019-04-11 | 日商半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
KR101432764B1 (ko) | 2008-11-13 | 2014-08-21 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체장치의 제조방법 |
JP2010123595A (ja) * | 2008-11-17 | 2010-06-03 | Sony Corp | 薄膜トランジスタおよび表示装置 |
JP2010123758A (ja) * | 2008-11-19 | 2010-06-03 | Nec Corp | 薄膜デバイス及びその製造方法 |
JP2010153802A (ja) | 2008-11-20 | 2010-07-08 | Semiconductor Energy Lab Co Ltd | 半導体装置及び半導体装置の作製方法 |
KR101785887B1 (ko) * | 2008-11-21 | 2017-10-16 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 표시 장치 |
KR101238823B1 (ko) * | 2008-11-21 | 2013-03-04 | 한국전자통신연구원 | 박막 트랜지스터 및 그의 제조 방법 |
JP2012033516A (ja) * | 2008-11-26 | 2012-02-16 | Ulvac Japan Ltd | トランジスタ及びその製造方法。 |
TWI616707B (zh) | 2008-11-28 | 2018-03-01 | 半導體能源研究所股份有限公司 | 液晶顯示裝置 |
TWI606593B (zh) | 2008-11-28 | 2017-11-21 | 半導體能源研究所股份有限公司 | 半導體裝置和其製造方法 |
CN102227765B (zh) | 2008-11-28 | 2014-09-17 | 株式会社半导体能源研究所 | 显示器件以及包含显示器件的电子器件 |
TWI585955B (zh) | 2008-11-28 | 2017-06-01 | 半導體能源研究所股份有限公司 | 光感測器及顯示裝置 |
KR101472771B1 (ko) | 2008-12-01 | 2014-12-15 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
US9721825B2 (en) | 2008-12-02 | 2017-08-01 | Arizona Board Of Regents, A Body Corporate Of The State Of Arizona, Acting For And On Behalf Of Arizona State University | Method of providing a flexible semiconductor device and flexible semiconductor device thereof |
US9991311B2 (en) | 2008-12-02 | 2018-06-05 | Arizona Board Of Regents On Behalf Of Arizona State University | Dual active layer semiconductor device and method of manufacturing the same |
US9601530B2 (en) | 2008-12-02 | 2017-03-21 | Arizona Board Of Regents, A Body Corporated Of The State Of Arizona, Acting For And On Behalf Of Arizona State University | Dual active layer semiconductor device and method of manufacturing the same |
TWI633371B (zh) | 2008-12-03 | 2018-08-21 | 半導體能源研究所股份有限公司 | 液晶顯示裝置 |
JP5491833B2 (ja) | 2008-12-05 | 2014-05-14 | 株式会社半導体エネルギー研究所 | 半導体装置 |
WO2010071183A1 (en) | 2008-12-19 | 2010-06-24 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
CN102257621B (zh) | 2008-12-19 | 2013-08-21 | 株式会社半导体能源研究所 | 晶体管的制造方法 |
EP2515337B1 (en) * | 2008-12-24 | 2016-02-24 | Semiconductor Energy Laboratory Co., Ltd. | Driver circuit and semiconductor device |
US8114720B2 (en) | 2008-12-25 | 2012-02-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
KR101719350B1 (ko) * | 2008-12-25 | 2017-03-23 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
US8383470B2 (en) | 2008-12-25 | 2013-02-26 | Semiconductor Energy Laboratory Co., Ltd. | Thin film transistor (TFT) having a protective layer and manufacturing method thereof |
US8441007B2 (en) * | 2008-12-25 | 2013-05-14 | Semiconductor Energy Laboratory Co., Ltd. | Display device and manufacturing method thereof |
US8330156B2 (en) | 2008-12-26 | 2012-12-11 | Semiconductor Energy Laboratory Co., Ltd. | Thin film transistor with a plurality of oxide clusters over the gate insulating layer |
TWI482226B (zh) * | 2008-12-26 | 2015-04-21 | Semiconductor Energy Lab | 具有包含氧化物半導體層之電晶體的主動矩陣顯示裝置 |
KR101648927B1 (ko) | 2009-01-16 | 2016-08-17 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
KR100993416B1 (ko) | 2009-01-20 | 2010-11-09 | 삼성모바일디스플레이주식회사 | 박막 트랜지스터, 그의 제조 방법 및 박막 트랜지스터를 구비하는 평판 표시 장치 |
US8492756B2 (en) | 2009-01-23 | 2013-07-23 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
US8395740B2 (en) * | 2009-01-30 | 2013-03-12 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal display device having blue phase liquid crystal and particular electrode arrangement |
US8436350B2 (en) | 2009-01-30 | 2013-05-07 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device using an oxide semiconductor with a plurality of metal clusters |
US8174021B2 (en) * | 2009-02-06 | 2012-05-08 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method of manufacturing the semiconductor device |
JP4752927B2 (ja) * | 2009-02-09 | 2011-08-17 | ソニー株式会社 | 薄膜トランジスタおよび表示装置 |
CN101840936B (zh) | 2009-02-13 | 2014-10-08 | 株式会社半导体能源研究所 | 包括晶体管的半导体装置及其制造方法 |
US8247812B2 (en) | 2009-02-13 | 2012-08-21 | Semiconductor Energy Laboratory Co., Ltd. | Transistor, semiconductor device including the transistor, and manufacturing method of the transistor and the semiconductor device |
US8247276B2 (en) | 2009-02-20 | 2012-08-21 | Semiconductor Energy Laboratory Co., Ltd. | Thin film transistor, method for manufacturing the same, and semiconductor device |
US8841661B2 (en) | 2009-02-25 | 2014-09-23 | Semiconductor Energy Laboratory Co., Ltd. | Staggered oxide semiconductor TFT semiconductor device and manufacturing method thereof |
US8704216B2 (en) | 2009-02-27 | 2014-04-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
US20100224878A1 (en) | 2009-03-05 | 2010-09-09 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US8461582B2 (en) | 2009-03-05 | 2013-06-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
US20100224880A1 (en) * | 2009-03-05 | 2010-09-09 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
JP5504008B2 (ja) | 2009-03-06 | 2014-05-28 | 株式会社半導体エネルギー研究所 | 半導体装置 |
TW201106069A (en) * | 2009-03-11 | 2011-02-16 | Semiconductor Energy Lab | Liquid crystal display device |
KR101906751B1 (ko) | 2009-03-12 | 2018-10-10 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치의 제작 방법 |
TWI556323B (zh) | 2009-03-13 | 2016-11-01 | 半導體能源研究所股份有限公司 | 半導體裝置及該半導體裝置的製造方法 |
US8450144B2 (en) | 2009-03-26 | 2013-05-28 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
KR101681884B1 (ko) | 2009-03-27 | 2016-12-05 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체장치, 표시장치 및 전자기기 |
TWI617029B (zh) * | 2009-03-27 | 2018-03-01 | 半導體能源研究所股份有限公司 | 半導體裝置 |
US8927981B2 (en) | 2009-03-30 | 2015-01-06 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
US8338226B2 (en) | 2009-04-02 | 2012-12-25 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
TWI489628B (zh) | 2009-04-02 | 2015-06-21 | Semiconductor Energy Lab | 半導體裝置和其製造方法 |
TWI476917B (zh) * | 2009-04-16 | 2015-03-11 | Semiconductor Energy Lab | 半導體裝置和其製造方法 |
JP2010276829A (ja) * | 2009-05-28 | 2010-12-09 | Sumitomo Chemical Co Ltd | 表示装置 |
EP2256814B1 (en) * | 2009-05-29 | 2019-01-16 | Semiconductor Energy Laboratory Co, Ltd. | Oxide semiconductor device and method for manufacturing the same |
JP5564331B2 (ja) | 2009-05-29 | 2014-07-30 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
SG176601A1 (en) | 2009-05-29 | 2012-01-30 | Univ Arizona | Method of providing a flexible semiconductor device at high temperatures and flexible semiconductor device thereof |
EP2256795B1 (en) * | 2009-05-29 | 2014-11-19 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method for oxide semiconductor device |
WO2010150446A1 (ja) * | 2009-06-24 | 2010-12-29 | シャープ株式会社 | 薄膜トランジスタおよびその製造方法、アクティブマトリクス基板、表示パネル、ならびに表示装置 |
WO2011001715A1 (ja) | 2009-06-29 | 2011-01-06 | シャープ株式会社 | 酸化物半導体、薄膜トランジスタアレイ基板及びその製造方法、並びに、表示装置 |
KR101457837B1 (ko) | 2009-06-30 | 2014-11-05 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 제작 방법 |
KR101903930B1 (ko) | 2009-06-30 | 2018-10-02 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 제조 방법 |
KR101944656B1 (ko) | 2009-06-30 | 2019-04-17 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 제조 방법 |
KR101420025B1 (ko) | 2009-06-30 | 2014-07-15 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 제조 방법 |
JP5663214B2 (ja) * | 2009-07-03 | 2015-02-04 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
KR102106460B1 (ko) * | 2009-07-03 | 2020-05-04 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치의 제작 방법 |
KR101476817B1 (ko) | 2009-07-03 | 2014-12-26 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 트랜지스터를 갖는 표시 장치 및 그 제작 방법 |
KR102216028B1 (ko) | 2009-07-10 | 2021-02-16 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제조 방법 |
KR101791370B1 (ko) | 2009-07-10 | 2017-10-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
KR101935752B1 (ko) * | 2009-07-10 | 2019-01-04 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치의 제작 방법 |
WO2011007677A1 (en) | 2009-07-17 | 2011-01-20 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
WO2011007682A1 (en) | 2009-07-17 | 2011-01-20 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing semiconductor device |
KR101739154B1 (ko) * | 2009-07-17 | 2017-05-23 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제조 방법 |
WO2011010545A1 (en) | 2009-07-18 | 2011-01-27 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
KR101929726B1 (ko) * | 2009-07-18 | 2018-12-14 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 반도체 장치의 제조 방법 |
KR101782176B1 (ko) * | 2009-07-18 | 2017-09-26 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 반도체 장치의 제조 방법 |
CN102576732B (zh) * | 2009-07-18 | 2015-02-25 | 株式会社半导体能源研究所 | 半导体装置与用于制造半导体装置的方法 |
WO2011010542A1 (en) * | 2009-07-23 | 2011-01-27 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
KR101785992B1 (ko) | 2009-07-24 | 2017-10-18 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
KR102490468B1 (ko) | 2009-07-31 | 2023-01-19 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
KR102153841B1 (ko) | 2009-07-31 | 2020-09-08 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제조 방법 |
WO2011013502A1 (en) * | 2009-07-31 | 2011-02-03 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
WO2011013523A1 (en) | 2009-07-31 | 2011-02-03 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
WO2011013522A1 (en) | 2009-07-31 | 2011-02-03 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
TWI650848B (zh) | 2009-08-07 | 2019-02-11 | 日商半導體能源研究所股份有限公司 | 半導體裝置和其製造方法 |
TWI634642B (zh) * | 2009-08-07 | 2018-09-01 | 半導體能源研究所股份有限公司 | 半導體裝置和其製造方法 |
JP5663231B2 (ja) | 2009-08-07 | 2015-02-04 | 株式会社半導体エネルギー研究所 | 発光装置 |
TWI582951B (zh) * | 2009-08-07 | 2017-05-11 | 半導體能源研究所股份有限公司 | 半導體裝置及包括該半導體裝置之電話、錶、和顯示裝置 |
TWI596741B (zh) | 2009-08-07 | 2017-08-21 | 半導體能源研究所股份有限公司 | 半導體裝置和其製造方法 |
JP5642447B2 (ja) * | 2009-08-07 | 2014-12-17 | 株式会社半導体エネルギー研究所 | 半導体装置 |
EP2284891B1 (en) * | 2009-08-07 | 2019-07-24 | Semiconductor Energy Laboratory Co, Ltd. | Semiconductor device and manufacturing method thereof |
US8115883B2 (en) | 2009-08-27 | 2012-02-14 | Semiconductor Energy Laboratory Co., Ltd. | Display device and method for manufacturing the same |
WO2011027649A1 (en) * | 2009-09-02 | 2011-03-10 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device including a transistor, and manufacturing method of semiconductor device |
KR101460869B1 (ko) | 2009-09-04 | 2014-11-11 | 가부시끼가이샤 도시바 | 박막 트랜지스터 및 그 제조 방법 |
WO2011027701A1 (en) * | 2009-09-04 | 2011-03-10 | Semiconductor Energy Laboratory Co., Ltd. | Light-emitting device and method for manufacturing the same |
KR102775255B1 (ko) * | 2009-09-04 | 2025-03-06 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 발광 장치 및 발광 장치를 제작하기 위한 방법 |
KR101746198B1 (ko) | 2009-09-04 | 2017-06-12 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시장치 및 전자기기 |
WO2011027664A1 (en) | 2009-09-04 | 2011-03-10 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal display device and method for manufacturing the same |
KR101672072B1 (ko) | 2009-09-04 | 2016-11-02 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치의 제작 방법 |
JP5700626B2 (ja) * | 2009-09-04 | 2015-04-15 | 株式会社半導体エネルギー研究所 | El表示装置 |
WO2011027656A1 (en) | 2009-09-04 | 2011-03-10 | Semiconductor Energy Laboratory Co., Ltd. | Transistor and display device |
WO2011027702A1 (en) | 2009-09-04 | 2011-03-10 | Semiconductor Energy Laboratory Co., Ltd. | Light-emitting device and method for manufacturing the same |
WO2011027676A1 (en) | 2009-09-04 | 2011-03-10 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
KR101269812B1 (ko) | 2009-09-04 | 2013-05-30 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치, 표시 패널, 표시 모듈, 전자 기기 및 표시 장치 |
TWI783356B (zh) * | 2009-09-10 | 2022-11-11 | 日商半導體能源研究所股份有限公司 | 半導體裝置和顯示裝置 |
KR20120071398A (ko) * | 2009-09-16 | 2012-07-02 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제조 방법 |
KR102157249B1 (ko) | 2009-09-16 | 2020-09-17 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제조 방법 |
CN102024410B (zh) | 2009-09-16 | 2014-10-22 | 株式会社半导体能源研究所 | 半导体装置及电子设备 |
KR20230165355A (ko) * | 2009-09-16 | 2023-12-05 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
US9715845B2 (en) * | 2009-09-16 | 2017-07-25 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor display device |
KR102009813B1 (ko) | 2009-09-16 | 2019-08-12 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 발광 장치 및 이의 제조 방법 |
KR20190045396A (ko) * | 2009-09-16 | 2019-05-02 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 트랜지스터 |
WO2011034012A1 (en) | 2009-09-16 | 2011-03-24 | Semiconductor Energy Laboratory Co., Ltd. | Logic circuit, light emitting device, semiconductor device, and electronic device |
KR101026213B1 (ko) * | 2009-09-21 | 2011-03-31 | 경원대학교 산학협력단 | 레이저 패터닝을 이용한 투명 박막 트랜지스터의 제조 |
CN102549758B (zh) | 2009-09-24 | 2015-11-25 | 株式会社半导体能源研究所 | 半导体器件及其制造方法 |
KR101707260B1 (ko) * | 2009-09-24 | 2017-02-15 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
WO2011037008A1 (en) | 2009-09-24 | 2011-03-31 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing oxide semiconductor film and method for manufacturing semiconductor device |
KR101470785B1 (ko) * | 2009-09-24 | 2014-12-08 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치의 제조 방법 |
KR101809759B1 (ko) * | 2009-09-24 | 2018-01-18 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 소자 및 그 제조 방법 |
WO2011036987A1 (en) * | 2009-09-24 | 2011-03-31 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
KR102443297B1 (ko) | 2009-09-24 | 2022-09-15 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 산화물 반도체막 및 반도체 장치 |
CN105513644B (zh) | 2009-09-24 | 2019-10-15 | 株式会社半导体能源研究所 | 驱动器电路、包括驱动器电路的显示设备以及包括显示设备的电子电器 |
WO2011043182A1 (en) | 2009-10-05 | 2011-04-14 | Semiconductor Energy Laboratory Co., Ltd. | Method for removing electricity and method for manufacturing semiconductor device |
KR20120084751A (ko) | 2009-10-05 | 2012-07-30 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
CN102484139B (zh) * | 2009-10-08 | 2016-07-06 | 株式会社半导体能源研究所 | 氧化物半导体层及半导体装置 |
KR102596694B1 (ko) | 2009-10-08 | 2023-11-01 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
WO2011043164A1 (en) | 2009-10-09 | 2011-04-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the semiconductor device |
KR101843558B1 (ko) | 2009-10-09 | 2018-03-30 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 시프트 레지스터, 표시 장치, 및 그 구동 방법 |
WO2011043194A1 (en) * | 2009-10-09 | 2011-04-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
CN102576736B (zh) | 2009-10-09 | 2015-05-13 | 株式会社半导体能源研究所 | 半导体器件及其制造方法 |
KR101949670B1 (ko) * | 2009-10-09 | 2019-02-19 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
KR101778513B1 (ko) * | 2009-10-09 | 2017-09-15 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 발광 표시 장치 및 이를 포함한 전자 기기 |
EP2486593B1 (en) * | 2009-10-09 | 2017-02-01 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
CN102598278B (zh) | 2009-10-09 | 2015-04-08 | 株式会社半导体能源研究所 | 半导体器件 |
KR101820973B1 (ko) * | 2009-10-09 | 2018-01-22 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 반도체 장치 제조 방법 |
WO2011043175A1 (en) | 2009-10-09 | 2011-04-14 | Semiconductor Energy Laboratory Co., Ltd. | Logic circuit and display device having the same |
WO2011043206A1 (en) | 2009-10-09 | 2011-04-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
KR101882350B1 (ko) | 2009-10-09 | 2018-07-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
MY158956A (en) | 2009-10-16 | 2016-11-30 | Semiconductor Energy Lab | Logic circuit and semiconductor device |
CN116722019A (zh) | 2009-10-16 | 2023-09-08 | 株式会社半导体能源研究所 | 显示设备 |
KR101945301B1 (ko) * | 2009-10-16 | 2019-02-07 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치, 표시 장치 및 전자 장치 |
WO2011046010A1 (en) * | 2009-10-16 | 2011-04-21 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal display device and electronic device including the liquid crystal display device |
US8546797B2 (en) | 2009-10-20 | 2013-10-01 | Stanley Electric Co., Ltd. | Zinc oxide based compound semiconductor device |
JP5426315B2 (ja) * | 2009-10-20 | 2014-02-26 | スタンレー電気株式会社 | ZnO系化合物半導体素子 |
WO2011048968A1 (en) | 2009-10-21 | 2011-04-28 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
CN102576734B (zh) | 2009-10-21 | 2015-04-22 | 株式会社半导体能源研究所 | 显示装置和包括显示装置的电子设备 |
KR102023128B1 (ko) * | 2009-10-21 | 2019-09-19 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 아날로그 회로 및 반도체 장치 |
KR101847656B1 (ko) * | 2009-10-21 | 2018-05-24 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제조 방법 |
WO2011048923A1 (en) | 2009-10-21 | 2011-04-28 | Semiconductor Energy Laboratory Co., Ltd. | E-book reader |
KR20130130879A (ko) * | 2009-10-21 | 2013-12-02 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 제작방법 |
CN102598248B (zh) * | 2009-10-21 | 2015-09-23 | 株式会社半导体能源研究所 | 半导体器件 |
SG10201406934WA (en) * | 2009-10-29 | 2014-11-27 | Semiconductor Energy Lab | Semiconductor device |
WO2011052382A1 (en) | 2009-10-30 | 2011-05-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
MY163862A (en) * | 2009-10-30 | 2017-10-31 | Semiconductor Energy Lab | Logic circuit and semiconductor device |
WO2011052384A1 (en) | 2009-10-30 | 2011-05-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
CN102668095B (zh) * | 2009-10-30 | 2016-08-03 | 株式会社半导体能源研究所 | 晶体管 |
IN2012DN03080A (enrdf_load_stackoverflow) | 2009-10-30 | 2015-07-31 | Semiconductor Energy Lab | |
WO2011055769A1 (en) | 2009-11-06 | 2011-05-12 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor element and semiconductor device, and deposition apparatus |
CN102598279B (zh) | 2009-11-06 | 2015-10-07 | 株式会社半导体能源研究所 | 半导体装置 |
KR101930230B1 (ko) | 2009-11-06 | 2018-12-18 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치를 제작하기 위한 방법 |
KR101750982B1 (ko) * | 2009-11-06 | 2017-06-26 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 반도체 장치의 제작 방법 |
JP5539846B2 (ja) | 2009-11-06 | 2014-07-02 | 株式会社半導体エネルギー研究所 | 評価方法、半導体装置の作製方法 |
KR20190066086A (ko) | 2009-11-06 | 2019-06-12 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
KR102066532B1 (ko) * | 2009-11-06 | 2020-01-15 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
WO2011055474A1 (ja) | 2009-11-09 | 2011-05-12 | シャープ株式会社 | アクティブマトリクス基板及びそれを備えた液晶表示パネル、並びにアクティブマトリクス基板の製造方法 |
CN102612714B (zh) * | 2009-11-13 | 2016-06-29 | 株式会社半导体能源研究所 | 半导体器件及其驱动方法 |
KR20120094013A (ko) | 2009-11-13 | 2012-08-23 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 스퍼터링 타겟 및 그 제조방법, 및 트랜지스터 |
KR20230173233A (ko) * | 2009-11-13 | 2023-12-26 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 및 이 표시 장치를 구비한 전자 기기 |
KR101975741B1 (ko) | 2009-11-13 | 2019-05-09 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 타깃 재료의 포장 방법 및 타깃의 장착 방법 |
WO2011058865A1 (en) * | 2009-11-13 | 2011-05-19 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor devi ce |
KR20170076818A (ko) * | 2009-11-13 | 2017-07-04 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 스퍼터링 타겟 및 그 제작 방법 및 트랜지스터 |
KR101799265B1 (ko) * | 2009-11-13 | 2017-11-20 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
KR101800854B1 (ko) * | 2009-11-20 | 2017-11-23 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 트랜지스터 |
KR101922849B1 (ko) * | 2009-11-20 | 2018-11-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
KR20120106766A (ko) | 2009-11-20 | 2012-09-26 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치의 제작 방법 |
KR101800852B1 (ko) * | 2009-11-20 | 2017-12-20 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
WO2011062048A1 (en) | 2009-11-20 | 2011-05-26 | Semiconductor Energy Laboratory Co., Ltd. | Thin film transistor |
US8355109B2 (en) * | 2009-11-24 | 2013-01-15 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal display device comprising a liquid crystal material exhibiting a blue phase and a structure body projecting into the liquid crystal layer |
KR101658533B1 (ko) * | 2009-11-25 | 2016-09-22 | 엘지디스플레이 주식회사 | 산화물 박막 트랜지스터 및 그 제조방법 |
KR101517944B1 (ko) | 2009-11-27 | 2015-05-06 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 반도체 장치의 제작방법 |
CN102640293B (zh) | 2009-11-27 | 2015-07-22 | 株式会社半导体能源研究所 | 半导体器件 |
CN105140101B (zh) | 2009-11-28 | 2018-11-16 | 株式会社半导体能源研究所 | 层叠的氧化物材料、半导体器件、以及用于制造该半导体器件的方法 |
WO2011065210A1 (en) | 2009-11-28 | 2011-06-03 | Semiconductor Energy Laboratory Co., Ltd. | Stacked oxide material, semiconductor device, and method for manufacturing the semiconductor device |
WO2011065243A1 (en) | 2009-11-28 | 2011-06-03 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
EP2507787A4 (en) | 2009-11-30 | 2013-07-17 | Semiconductor Energy Lab | Liquid crystal display device, control method therefor and electronic device therefor |
KR101605723B1 (ko) * | 2009-12-01 | 2016-03-24 | 엘지디스플레이 주식회사 | 산화물 박막 트랜지스터의 제조방법 |
KR101623961B1 (ko) * | 2009-12-02 | 2016-05-26 | 삼성전자주식회사 | 트랜지스터와 그 제조방법 및 트랜지스터를 포함하는 전자소자 |
WO2011068022A1 (en) | 2009-12-04 | 2011-06-09 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
KR101800038B1 (ko) * | 2009-12-04 | 2017-11-21 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
CN104795323B (zh) | 2009-12-04 | 2017-12-29 | 株式会社半导体能源研究所 | 半导体装置及其制造方法 |
CN105609509A (zh) | 2009-12-04 | 2016-05-25 | 株式会社半导体能源研究所 | 显示装置 |
KR102153034B1 (ko) | 2009-12-04 | 2020-09-07 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
JP2011139052A (ja) | 2009-12-04 | 2011-07-14 | Semiconductor Energy Lab Co Ltd | 半導体記憶装置 |
KR101396102B1 (ko) | 2009-12-04 | 2014-05-15 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
CN104992962B (zh) | 2009-12-04 | 2018-12-25 | 株式会社半导体能源研究所 | 半导体器件及其制造方法 |
KR101945171B1 (ko) | 2009-12-08 | 2019-02-07 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
KR101511076B1 (ko) | 2009-12-08 | 2015-04-10 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
US8685803B2 (en) | 2009-12-09 | 2014-04-01 | Sharp Kabushiki Kaisha | Semiconductor device and method for producing same |
WO2011070887A1 (en) | 2009-12-11 | 2011-06-16 | Semiconductor Energy Laboratory Co., Ltd. | Field effect transistor |
WO2011070901A1 (en) | 2009-12-11 | 2011-06-16 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
KR101770976B1 (ko) * | 2009-12-11 | 2017-08-24 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
WO2011070929A1 (en) | 2009-12-11 | 2011-06-16 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and electronic device |
IN2012DN04871A (enrdf_load_stackoverflow) * | 2009-12-11 | 2015-09-25 | Semiconductor Energy Laoboratory Co Ltd | |
JP5727204B2 (ja) | 2009-12-11 | 2015-06-03 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
JP5185357B2 (ja) | 2009-12-17 | 2013-04-17 | 株式会社半導体エネルギー研究所 | 半導体装置 |
CN102668377B (zh) * | 2009-12-18 | 2015-04-08 | 株式会社半导体能源研究所 | 非易失性锁存电路和逻辑电路以及使用它们的半导体器件 |
KR101768433B1 (ko) | 2009-12-18 | 2017-08-16 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 제작 방법 |
WO2011074407A1 (en) | 2009-12-18 | 2011-06-23 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
KR101830195B1 (ko) | 2009-12-18 | 2018-02-20 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치와 그것의 제작 방법 |
KR102275522B1 (ko) | 2009-12-18 | 2021-07-08 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 액정 표시 장치 및 전자 기기 |
KR101900662B1 (ko) * | 2009-12-18 | 2018-11-08 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 액정 표시 장치 및 그 구동 방법 |
KR101622733B1 (ko) * | 2009-12-21 | 2016-05-20 | 엘지디스플레이 주식회사 | 산화물 박막 트랜지스터의 제조방법 |
CN102656801B (zh) | 2009-12-25 | 2016-04-27 | 株式会社半导体能源研究所 | 存储器装置、半导体器件和电子装置 |
WO2011077978A1 (en) | 2009-12-25 | 2011-06-30 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing display device |
CN102656690B (zh) * | 2009-12-25 | 2016-04-20 | 株式会社半导体能源研究所 | 半导体装置 |
KR101883802B1 (ko) | 2009-12-28 | 2018-07-31 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치의 제작 방법 |
KR101872678B1 (ko) | 2009-12-28 | 2018-07-02 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 액정 표시 장치 및 전자 기기 |
KR102480794B1 (ko) * | 2009-12-28 | 2022-12-22 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 기억 장치와 반도체 장치 |
WO2011081041A1 (en) | 2009-12-28 | 2011-07-07 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the semiconductor device |
KR101781788B1 (ko) | 2009-12-28 | 2017-09-26 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 액정 표시 장치 및 전자 기기 |
CN102714029B (zh) | 2010-01-20 | 2016-03-23 | 株式会社半导体能源研究所 | 显示装置的显示方法 |
KR101805102B1 (ko) | 2010-01-20 | 2017-12-05 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 액정 표시 장치의 구동 방법 |
KR101787734B1 (ko) | 2010-01-20 | 2017-10-18 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 기억 장치 |
KR101861991B1 (ko) | 2010-01-20 | 2018-05-30 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 신호 처리 회로 및 신호 처리 회로를 구동하기 위한 방법 |
KR101744906B1 (ko) * | 2010-01-20 | 2017-06-20 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 및 표시 장치의 구동 방법 |
KR101842860B1 (ko) | 2010-01-20 | 2018-03-28 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치의 구동 방법 |
KR101750126B1 (ko) * | 2010-01-20 | 2017-06-22 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치의 구동 방법 및 액정 표시 장치 |
KR101803987B1 (ko) * | 2010-01-20 | 2017-12-01 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
MY160598A (en) | 2010-01-20 | 2017-03-15 | Semiconductor Energy Lab | Semiconductor device |
US8778730B2 (en) | 2010-01-21 | 2014-07-15 | Sharp Kabushiki Kaisha | Process for production of circuit board |
KR102174859B1 (ko) * | 2010-01-22 | 2020-11-05 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
KR102008754B1 (ko) * | 2010-01-24 | 2019-08-09 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치와 이의 제조 방법 |
KR101873730B1 (ko) | 2010-01-24 | 2018-07-04 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
KR101800850B1 (ko) * | 2010-01-29 | 2017-11-23 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 기억 장치 |
US9391209B2 (en) | 2010-02-05 | 2016-07-12 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
KR102026603B1 (ko) | 2010-02-05 | 2019-10-01 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
WO2011096276A1 (en) | 2010-02-05 | 2011-08-11 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal display device |
KR20150010776A (ko) | 2010-02-05 | 2015-01-28 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치, 및 반도체 장치의 제조 방법 |
WO2011096286A1 (en) | 2010-02-05 | 2011-08-11 | Semiconductor Energy Laboratory Co., Ltd. | Field effect transistor and semiconductor device |
KR20180028557A (ko) * | 2010-02-05 | 2018-03-16 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 반도체 장치의 제조 방법 |
US8947337B2 (en) | 2010-02-11 | 2015-02-03 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
CN102763156B (zh) * | 2010-02-12 | 2015-11-25 | 株式会社半导体能源研究所 | 液晶显示装置和电子装置 |
KR101636998B1 (ko) * | 2010-02-12 | 2016-07-08 | 삼성디스플레이 주식회사 | 박막 트랜지스터 및 그 제조 방법 |
US8617920B2 (en) | 2010-02-12 | 2013-12-31 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
KR102586642B1 (ko) | 2010-02-18 | 2023-10-11 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
CN102763202B (zh) | 2010-02-19 | 2016-08-03 | 株式会社半导体能源研究所 | 半导体装置及其制造方法 |
KR102049472B1 (ko) | 2010-02-19 | 2019-11-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
KR101848684B1 (ko) * | 2010-02-19 | 2018-04-16 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 액정 표시 장치 및 전자 장치 |
JP5740169B2 (ja) | 2010-02-19 | 2015-06-24 | 株式会社半導体エネルギー研究所 | トランジスタの作製方法 |
KR20180110212A (ko) * | 2010-02-19 | 2018-10-08 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 트랜지스터 및 이를 이용한 표시 장치 |
KR102455879B1 (ko) * | 2010-02-23 | 2022-10-19 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제조 방법 |
US9000438B2 (en) | 2010-02-26 | 2015-04-07 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
KR20120120458A (ko) | 2010-02-26 | 2012-11-01 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 액정 표시 장치 |
WO2011105218A1 (en) * | 2010-02-26 | 2011-09-01 | Semiconductor Energy Laboratory Co., Ltd. | Display device and e-book reader provided therewith |
WO2011105198A1 (en) * | 2010-02-26 | 2011-09-01 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
KR20180001562A (ko) * | 2010-02-26 | 2018-01-04 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치를 제작하기 위한 방법 |
WO2011105184A1 (en) * | 2010-02-26 | 2011-09-01 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
JP5413845B2 (ja) * | 2010-02-26 | 2014-02-12 | 住友化学株式会社 | 液晶表示装置、液晶表示装置の製造方法及び液晶表示装置の製造装置 |
DE112011106185B3 (de) | 2010-03-02 | 2023-05-04 | Semiconductor Energy Laboratory Co., Ltd. | Impulssignal-Ausgangsschaltung und Schieberegister |
DE112011100749B4 (de) | 2010-03-02 | 2015-06-11 | Semiconductor Energy Laboratory Co., Ltd. | Impulssignal-Ausgangsschaltung und Schieberegister |
JP2011203726A (ja) * | 2010-03-05 | 2011-10-13 | Semiconductor Energy Lab Co Ltd | 表示装置 |
KR102341927B1 (ko) * | 2010-03-05 | 2021-12-23 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
KR101878206B1 (ko) | 2010-03-05 | 2018-07-16 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 산화물 반도체막의 제작 방법 및 트랜지스터의 제작 방법 |
WO2011111531A1 (en) * | 2010-03-12 | 2011-09-15 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
KR102112065B1 (ko) * | 2010-03-26 | 2020-06-04 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
WO2011118364A1 (en) | 2010-03-26 | 2011-09-29 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
DE112011101152T5 (de) * | 2010-03-31 | 2013-01-10 | Semiconductor Energy Laboratory Co.,Ltd. | Flüssigkristallanzeigeeinrichtung und Verfahren zu deren Ansteuerung |
WO2011122299A1 (en) | 2010-03-31 | 2011-10-06 | Semiconductor Energy Laboratory Co., Ltd. | Driving method of liquid crystal display device |
WO2011122280A1 (en) * | 2010-03-31 | 2011-10-06 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor display device |
KR102292523B1 (ko) | 2010-04-02 | 2021-08-20 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
KR101465192B1 (ko) * | 2010-04-09 | 2014-11-25 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
US8653514B2 (en) | 2010-04-09 | 2014-02-18 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
CN102844847B (zh) | 2010-04-16 | 2015-09-23 | 株式会社半导体能源研究所 | 沉积方法及半导体装置的制造方法 |
KR101887336B1 (ko) * | 2010-04-23 | 2018-08-09 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 및 그 구동 방법 |
CN102859703B (zh) | 2010-04-23 | 2015-12-02 | 株式会社半导体能源研究所 | 半导体装置的制造方法 |
JP5581263B2 (ja) * | 2010-05-13 | 2014-08-27 | 株式会社半導体エネルギー研究所 | バッファ回路 |
US8664658B2 (en) | 2010-05-14 | 2014-03-04 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
WO2012021196A2 (en) | 2010-05-21 | 2012-02-16 | Arizona Board Of Regents, For And On Behalf Of Arizona State University | Method for manufacturing electronic devices and electronic devices thereof |
WO2011145484A1 (en) | 2010-05-21 | 2011-11-24 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US8629438B2 (en) | 2010-05-21 | 2014-01-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
WO2012021197A2 (en) | 2010-05-21 | 2012-02-16 | Arizona Board Of Regents, For And On Behalf Of Arizona State University | Method of manufacturing electronic devices on both sides of a carrier substrate and electronic devices thereof |
US9123820B2 (en) | 2010-05-31 | 2015-09-01 | Sharp Kabushiki Kaisha | Thin film transistor including semiconductor oxide layer having reduced resistance regions |
EP2579315B1 (en) | 2010-06-02 | 2018-08-15 | Sharp Kabushiki Kaisha | Method of manufacturing a thin film transistor |
WO2011155295A1 (en) | 2010-06-10 | 2011-12-15 | Semiconductor Energy Laboratory Co., Ltd. | Dc/dc converter, power supply circuit, and semiconductor device |
KR101862808B1 (ko) | 2010-06-18 | 2018-05-30 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
US8552425B2 (en) * | 2010-06-18 | 2013-10-08 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
KR101822526B1 (ko) | 2010-06-30 | 2018-01-26 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치와 그 제작 방법 |
KR101801960B1 (ko) | 2010-07-01 | 2017-11-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 액정 표시 장치의 구동 방법 |
US8441010B2 (en) | 2010-07-01 | 2013-05-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
WO2012002186A1 (en) | 2010-07-02 | 2012-01-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US8642380B2 (en) | 2010-07-02 | 2014-02-04 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method of semiconductor device |
US9336739B2 (en) * | 2010-07-02 | 2016-05-10 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal display device |
US8785241B2 (en) | 2010-07-16 | 2014-07-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
KR101920709B1 (ko) * | 2010-07-30 | 2018-11-22 | 삼성전자주식회사 | 트랜지스터와 그 제조방법 및 트랜지스터를 포함하는 전자소자 |
KR101809105B1 (ko) * | 2010-08-06 | 2017-12-14 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 집적 회로 |
JP5671418B2 (ja) * | 2010-08-06 | 2015-02-18 | 株式会社半導体エネルギー研究所 | 半導体装置の駆動方法 |
US8422272B2 (en) | 2010-08-06 | 2013-04-16 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and driving method thereof |
TWI688047B (zh) * | 2010-08-06 | 2020-03-11 | 半導體能源研究所股份有限公司 | 半導體裝置 |
TWI559409B (zh) | 2010-08-16 | 2016-11-21 | 半導體能源研究所股份有限公司 | 半導體裝置之製造方法 |
TWI508294B (zh) | 2010-08-19 | 2015-11-11 | Semiconductor Energy Lab | 半導體裝置 |
US8883555B2 (en) | 2010-08-25 | 2014-11-11 | Semiconductor Energy Laboratory Co., Ltd. | Electronic device, manufacturing method of electronic device, and sputtering target |
US8685787B2 (en) | 2010-08-25 | 2014-04-01 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method of semiconductor device |
JP5727892B2 (ja) * | 2010-08-26 | 2015-06-03 | 株式会社半導体エネルギー研究所 | 半導体装置 |
JP2013009285A (ja) * | 2010-08-26 | 2013-01-10 | Semiconductor Energy Lab Co Ltd | 信号処理回路及びその駆動方法 |
US8592261B2 (en) | 2010-08-27 | 2013-11-26 | Semiconductor Energy Laboratory Co., Ltd. | Method for designing semiconductor device |
US8575610B2 (en) | 2010-09-02 | 2013-11-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for driving the same |
WO2012029596A1 (en) * | 2010-09-03 | 2012-03-08 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
WO2012029595A1 (en) * | 2010-09-03 | 2012-03-08 | Semiconductor Energy Laboratory Co., Ltd. | Oscillator circuit and semiconductor device using the oscillator circuit |
WO2012029612A1 (en) | 2010-09-03 | 2012-03-08 | Semiconductor Energy Laboratory Co., Ltd. | Sputtering target and method for manufacturing semiconductor device |
US8922236B2 (en) * | 2010-09-10 | 2014-12-30 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor memory device and method for inspecting the same |
US8797487B2 (en) | 2010-09-10 | 2014-08-05 | Semiconductor Energy Laboratory Co., Ltd. | Transistor, liquid crystal display device, and manufacturing method thereof |
US8766253B2 (en) | 2010-09-10 | 2014-07-01 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
KR20120026970A (ko) | 2010-09-10 | 2012-03-20 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 발광 장치 |
US9546416B2 (en) | 2010-09-13 | 2017-01-17 | Semiconductor Energy Laboratory Co., Ltd. | Method of forming crystalline oxide semiconductor film |
JP2012256821A (ja) | 2010-09-13 | 2012-12-27 | Semiconductor Energy Lab Co Ltd | 記憶装置 |
US8835917B2 (en) | 2010-09-13 | 2014-09-16 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, power diode, and rectifier |
US8592879B2 (en) | 2010-09-13 | 2013-11-26 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
US8871565B2 (en) | 2010-09-13 | 2014-10-28 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
US8664097B2 (en) * | 2010-09-13 | 2014-03-04 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method of semiconductor device |
KR101932576B1 (ko) | 2010-09-13 | 2018-12-26 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
TWI670711B (zh) | 2010-09-14 | 2019-09-01 | 日商半導體能源研究所股份有限公司 | 記憶體裝置和半導體裝置 |
WO2012035984A1 (en) | 2010-09-15 | 2012-03-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and display device |
CN103119699B (zh) * | 2010-09-22 | 2016-08-17 | 凸版印刷株式会社 | 薄膜晶体管及其制造方法和图像显示装置 |
TWI574259B (zh) | 2010-09-29 | 2017-03-11 | 半導體能源研究所股份有限公司 | 半導體記憶體裝置和其驅動方法 |
TWI664631B (zh) | 2010-10-05 | 2019-07-01 | 日商半導體能源研究所股份有限公司 | 半導體記憶體裝置及其驅動方法 |
US8803143B2 (en) * | 2010-10-20 | 2014-08-12 | Semiconductor Energy Laboratory Co., Ltd. | Thin film transistor including buffer layers with high resistivity |
JP5775712B2 (ja) * | 2010-10-28 | 2015-09-09 | 株式会社ジャパンディスプレイ | 表示装置 |
US8916866B2 (en) | 2010-11-03 | 2014-12-23 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
TWI555205B (zh) | 2010-11-05 | 2016-10-21 | 半導體能源研究所股份有限公司 | 半導體裝置及半導體裝置的製造方法 |
US8569754B2 (en) | 2010-11-05 | 2013-10-29 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
US8936965B2 (en) | 2010-11-26 | 2015-01-20 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
US8629496B2 (en) | 2010-11-30 | 2014-01-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
US8816425B2 (en) | 2010-11-30 | 2014-08-26 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
US8823092B2 (en) | 2010-11-30 | 2014-09-02 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
TWI525818B (zh) | 2010-11-30 | 2016-03-11 | 半導體能源研究所股份有限公司 | 半導體裝置及半導體裝置之製造方法 |
US8809852B2 (en) | 2010-11-30 | 2014-08-19 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor film, semiconductor element, semiconductor device, and method for manufacturing the same |
KR101995082B1 (ko) | 2010-12-03 | 2019-07-02 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 산화물 반도체막 및 반도체 장치 |
US8894825B2 (en) | 2010-12-17 | 2014-11-25 | Semiconductor Energy Laboratory Co., Ltd. | Sputtering target, method for manufacturing the same, manufacturing semiconductor device |
KR102001577B1 (ko) | 2010-12-17 | 2019-07-18 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 산화물 재료 및 반도체 장치 |
US9443984B2 (en) * | 2010-12-28 | 2016-09-13 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
JP5784479B2 (ja) | 2010-12-28 | 2015-09-24 | 株式会社半導体エネルギー研究所 | 半導体装置 |
WO2012090799A1 (en) * | 2010-12-28 | 2012-07-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
US8883556B2 (en) | 2010-12-28 | 2014-11-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
JP5975635B2 (ja) * | 2010-12-28 | 2016-08-23 | 株式会社半導体エネルギー研究所 | 半導体装置 |
JP5731369B2 (ja) | 2010-12-28 | 2015-06-10 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
KR101761804B1 (ko) * | 2011-11-22 | 2017-08-10 | 주성엔지니어링(주) | 박막 트랜지스터 및 그 제조 방법 |
KR101812702B1 (ko) * | 2010-12-30 | 2018-01-30 | 주성엔지니어링(주) | 박막 트랜지스터 및 그 제조 방법 |
TWI621121B (zh) | 2011-01-05 | 2018-04-11 | 半導體能源研究所股份有限公司 | 儲存元件、儲存裝置、及信號處理電路 |
JP5977523B2 (ja) | 2011-01-12 | 2016-08-24 | 株式会社半導体エネルギー研究所 | トランジスタの作製方法 |
TWI570809B (zh) | 2011-01-12 | 2017-02-11 | 半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
US8536571B2 (en) | 2011-01-12 | 2013-09-17 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method of semiconductor device |
TWI535032B (zh) | 2011-01-12 | 2016-05-21 | 半導體能源研究所股份有限公司 | 半導體裝置的製造方法 |
JP5982125B2 (ja) | 2011-01-12 | 2016-08-31 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
JP5888990B2 (ja) | 2011-01-12 | 2016-03-22 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
TWI619230B (zh) | 2011-01-14 | 2018-03-21 | 半導體能源研究所股份有限公司 | 半導體記憶裝置 |
JP5527225B2 (ja) * | 2011-01-14 | 2014-06-18 | ソニー株式会社 | 薄膜トランジスタおよび表示装置 |
JP5859839B2 (ja) | 2011-01-14 | 2016-02-16 | 株式会社半導体エネルギー研究所 | 記憶素子の駆動方法、及び、記憶素子 |
KR102026718B1 (ko) | 2011-01-14 | 2019-09-30 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 기억장치, 반도체 장치, 검출 방법 |
JP5716407B2 (ja) * | 2011-01-17 | 2015-05-13 | 株式会社リコー | 電界効果型トランジスタ、表示素子、画像表示装置、及びシステム |
KR101942701B1 (ko) | 2011-01-20 | 2019-01-29 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 산화물 반도체 소자 및 반도체 장치 |
TWI570920B (zh) | 2011-01-26 | 2017-02-11 | 半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
TWI787452B (zh) | 2011-01-26 | 2022-12-21 | 日商半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
TWI525619B (zh) | 2011-01-27 | 2016-03-11 | 半導體能源研究所股份有限公司 | 記憶體電路 |
KR20190007525A (ko) | 2011-01-27 | 2019-01-22 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
TWI520273B (zh) | 2011-02-02 | 2016-02-01 | 半導體能源研究所股份有限公司 | 半導體儲存裝置 |
US9799773B2 (en) | 2011-02-02 | 2017-10-24 | Semiconductor Energy Laboratory Co., Ltd. | Transistor and semiconductor device |
JP6000560B2 (ja) | 2011-02-02 | 2016-09-28 | 株式会社半導体エネルギー研究所 | 半導体メモリ装置 |
US8643007B2 (en) | 2011-02-23 | 2014-02-04 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US8669552B2 (en) * | 2011-03-02 | 2014-03-11 | Applied Materials, Inc. | Offset electrode TFT structure |
US9023684B2 (en) | 2011-03-04 | 2015-05-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
US9646829B2 (en) | 2011-03-04 | 2017-05-09 | Semiconductor Energy Laboratory Co., Ltd. | Manufacturing method of semiconductor device |
US8841664B2 (en) | 2011-03-04 | 2014-09-23 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
JP5827145B2 (ja) | 2011-03-08 | 2015-12-02 | 株式会社半導体エネルギー研究所 | 信号処理回路 |
US8541781B2 (en) | 2011-03-10 | 2013-09-24 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
JP2012209543A (ja) | 2011-03-11 | 2012-10-25 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
TWI521612B (zh) * | 2011-03-11 | 2016-02-11 | 半導體能源研究所股份有限公司 | 半導體裝置的製造方法 |
WO2012128030A1 (en) | 2011-03-18 | 2012-09-27 | Semiconductor Energy Laboratory Co., Ltd. | Oxide semiconductor film, semiconductor device, and manufacturing method of semiconductor device |
US9012904B2 (en) | 2011-03-25 | 2015-04-21 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
TWI545652B (zh) | 2011-03-25 | 2016-08-11 | 半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
US8956944B2 (en) | 2011-03-25 | 2015-02-17 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
US9219159B2 (en) | 2011-03-25 | 2015-12-22 | Semiconductor Energy Laboratory Co., Ltd. | Method for forming oxide semiconductor film and method for manufacturing semiconductor device |
JP6053098B2 (ja) | 2011-03-28 | 2016-12-27 | 株式会社半導体エネルギー研究所 | 半導体装置 |
US8927329B2 (en) | 2011-03-30 | 2015-01-06 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing oxide semiconductor device with improved electronic properties |
US9082860B2 (en) * | 2011-03-31 | 2015-07-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
TWI567735B (zh) | 2011-03-31 | 2017-01-21 | 半導體能源研究所股份有限公司 | 記憶體電路,記憶體單元,及訊號處理電路 |
US9960278B2 (en) * | 2011-04-06 | 2018-05-01 | Yuhei Sato | Manufacturing method of semiconductor device |
CN103548146A (zh) * | 2011-04-07 | 2014-01-29 | 代表亚利桑那大学的亚利桑那校董会 | 用于半导体器件的双有源层及其制造方法 |
US9012905B2 (en) | 2011-04-08 | 2015-04-21 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device including transistor comprising oxide semiconductor and method for manufacturing the same |
US9093538B2 (en) | 2011-04-08 | 2015-07-28 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
US8878174B2 (en) | 2011-04-15 | 2014-11-04 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor element, memory circuit, integrated circuit, and driving method of the integrated circuit |
US8779488B2 (en) | 2011-04-15 | 2014-07-15 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor memory device |
US9331206B2 (en) | 2011-04-22 | 2016-05-03 | Semiconductor Energy Laboratory Co., Ltd. | Oxide material and semiconductor device |
JP5946683B2 (ja) | 2011-04-22 | 2016-07-06 | 株式会社半導体エネルギー研究所 | 半導体装置 |
CN105931967B (zh) | 2011-04-27 | 2019-05-03 | 株式会社半导体能源研究所 | 半导体装置的制造方法 |
TWI671911B (zh) | 2011-05-05 | 2019-09-11 | 日商半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
US9117701B2 (en) | 2011-05-06 | 2015-08-25 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US8709922B2 (en) * | 2011-05-06 | 2014-04-29 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US8946066B2 (en) | 2011-05-11 | 2015-02-03 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing semiconductor device |
TWI541978B (zh) * | 2011-05-11 | 2016-07-11 | 半導體能源研究所股份有限公司 | 半導體裝置及半導體裝置之驅動方法 |
JP5886127B2 (ja) | 2011-05-13 | 2016-03-16 | 株式会社半導体エネルギー研究所 | 半導体装置 |
JP5886128B2 (ja) | 2011-05-13 | 2016-03-16 | 株式会社半導体エネルギー研究所 | 半導体装置 |
WO2012157463A1 (en) | 2011-05-13 | 2012-11-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
WO2012157472A1 (en) | 2011-05-13 | 2012-11-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
TWI595495B (zh) * | 2011-05-13 | 2017-08-11 | 半導體能源研究所股份有限公司 | 半導體裝置 |
JP6109489B2 (ja) | 2011-05-13 | 2017-04-05 | 株式会社半導体エネルギー研究所 | El表示装置 |
JP6076617B2 (ja) * | 2011-05-13 | 2017-02-08 | 株式会社半導体エネルギー研究所 | 表示装置 |
KR101946360B1 (ko) | 2011-05-16 | 2019-02-11 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 프로그래머블 로직 디바이스 |
US9117920B2 (en) * | 2011-05-19 | 2015-08-25 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device using oxide semiconductor |
US8581625B2 (en) | 2011-05-19 | 2013-11-12 | Semiconductor Energy Laboratory Co., Ltd. | Programmable logic device |
KR102081792B1 (ko) | 2011-05-19 | 2020-02-26 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 연산회로 및 연산회로의 구동방법 |
JP5936908B2 (ja) | 2011-05-20 | 2016-06-22 | 株式会社半導体エネルギー研究所 | パリティビット出力回路およびパリティチェック回路 |
JP5892852B2 (ja) | 2011-05-20 | 2016-03-23 | 株式会社半導体エネルギー研究所 | プログラマブルロジックデバイス |
TWI570719B (zh) | 2011-05-20 | 2017-02-11 | 半導體能源研究所股份有限公司 | 儲存裝置及信號處理電路 |
JP5886496B2 (ja) | 2011-05-20 | 2016-03-16 | 株式会社半導体エネルギー研究所 | 半導体装置 |
WO2012161059A1 (en) * | 2011-05-20 | 2012-11-29 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for driving the same |
JP5731904B2 (ja) | 2011-05-25 | 2015-06-10 | ルネサスエレクトロニクス株式会社 | 半導体装置及び半導体装置の製造方法 |
US8610482B2 (en) | 2011-05-27 | 2013-12-17 | Semiconductor Energy Laboratory Co., Ltd. | Trimming circuit and method for driving trimming circuit |
US8669781B2 (en) | 2011-05-31 | 2014-03-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US8679905B2 (en) * | 2011-06-08 | 2014-03-25 | Cbrite Inc. | Metal oxide TFT with improved source/drain contacts |
CN103597545B (zh) | 2011-06-09 | 2016-10-19 | 株式会社半导体能源研究所 | 高速缓冲存储器及其驱动方法 |
JP6012263B2 (ja) | 2011-06-09 | 2016-10-25 | 株式会社半導体エネルギー研究所 | 半導体記憶装置 |
JP6104522B2 (ja) | 2011-06-10 | 2017-03-29 | 株式会社半導体エネルギー研究所 | 半導体装置 |
KR20120138074A (ko) * | 2011-06-14 | 2012-12-24 | 삼성디스플레이 주식회사 | 박막 트랜지스터, 및 박막 트랜지스터 표시판과 이들을 제조하는 방법 |
TWI557910B (zh) | 2011-06-16 | 2016-11-11 | 半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
KR20190039345A (ko) | 2011-06-17 | 2019-04-10 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그의 제조 방법 |
KR20130007426A (ko) | 2011-06-17 | 2013-01-18 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
US9166055B2 (en) | 2011-06-17 | 2015-10-20 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
US8901554B2 (en) | 2011-06-17 | 2014-12-02 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device including channel formation region including oxide semiconductor |
US9130044B2 (en) | 2011-07-01 | 2015-09-08 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
JP2013021034A (ja) * | 2011-07-07 | 2013-01-31 | Ulvac Japan Ltd | レーザアニール法及び半導体装置の製造方法 |
US9496138B2 (en) * | 2011-07-08 | 2016-11-15 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing oxide semiconductor film, method for manufacturing semiconductor device, and semiconductor device |
US9385238B2 (en) * | 2011-07-08 | 2016-07-05 | Semiconductor Energy Laboratory Co., Ltd. | Transistor using oxide semiconductor |
TWI565067B (zh) | 2011-07-08 | 2017-01-01 | 半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
KR102014876B1 (ko) * | 2011-07-08 | 2019-08-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 반도체 장치의 제작 방법 |
JP2013042117A (ja) | 2011-07-15 | 2013-02-28 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
US8847220B2 (en) | 2011-07-15 | 2014-09-30 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US8643008B2 (en) * | 2011-07-22 | 2014-02-04 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US8718224B2 (en) | 2011-08-05 | 2014-05-06 | Semiconductor Energy Laboratory Co., Ltd. | Pulse signal output circuit and shift register |
JP6231880B2 (ja) * | 2011-08-11 | 2017-11-15 | 出光興産株式会社 | 薄膜トランジスタ |
JP6006572B2 (ja) | 2011-08-18 | 2016-10-12 | 株式会社半導体エネルギー研究所 | 半導体装置 |
JP6128775B2 (ja) * | 2011-08-19 | 2017-05-17 | 株式会社半導体エネルギー研究所 | 半導体装置 |
WO2013039126A1 (en) | 2011-09-16 | 2013-03-21 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US9082663B2 (en) | 2011-09-16 | 2015-07-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
WO2013042562A1 (en) | 2011-09-22 | 2013-03-28 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US8841675B2 (en) | 2011-09-23 | 2014-09-23 | Semiconductor Energy Laboratory Co., Ltd. | Minute transistor |
JP2013084333A (ja) | 2011-09-28 | 2013-05-09 | Semiconductor Energy Lab Co Ltd | シフトレジスタ回路 |
US8716708B2 (en) | 2011-09-29 | 2014-05-06 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
KR102304125B1 (ko) | 2011-09-29 | 2021-09-17 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
US8736315B2 (en) | 2011-09-30 | 2014-05-27 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US20130087784A1 (en) | 2011-10-05 | 2013-04-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
US10014068B2 (en) | 2011-10-07 | 2018-07-03 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
JP6022880B2 (ja) | 2011-10-07 | 2016-11-09 | 株式会社半導体エネルギー研究所 | 半導体装置及び半導体装置の作製方法 |
JP2013093561A (ja) * | 2011-10-07 | 2013-05-16 | Semiconductor Energy Lab Co Ltd | 酸化物半導体膜及び半導体装置 |
US9018629B2 (en) | 2011-10-13 | 2015-04-28 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing semiconductor device |
JP6026839B2 (ja) | 2011-10-13 | 2016-11-16 | 株式会社半導体エネルギー研究所 | 半導体装置 |
US9117916B2 (en) | 2011-10-13 | 2015-08-25 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device comprising oxide semiconductor film |
JP5912394B2 (ja) | 2011-10-13 | 2016-04-27 | 株式会社半導体エネルギー研究所 | 半導体装置 |
KR101976212B1 (ko) * | 2011-10-24 | 2019-05-07 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 반도체 장치의 제작 방법 |
JP6226518B2 (ja) | 2011-10-24 | 2017-11-08 | 株式会社半導体エネルギー研究所 | 半導体装置 |
KR20140086954A (ko) | 2011-10-28 | 2014-07-08 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
KR102012981B1 (ko) | 2011-11-09 | 2019-08-21 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
JP2013104079A (ja) * | 2011-11-11 | 2013-05-30 | Solar Applied Materials Technology Corp | ターゲット、CoベースのまたはFeベースの磁気記録媒体のための下層材料および磁気記録媒体 |
JP6076038B2 (ja) | 2011-11-11 | 2017-02-08 | 株式会社半導体エネルギー研究所 | 表示装置の作製方法 |
JP6122275B2 (ja) | 2011-11-11 | 2017-04-26 | 株式会社半導体エネルギー研究所 | 表示装置 |
US8878177B2 (en) | 2011-11-11 | 2014-11-04 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing semiconductor device |
US8796682B2 (en) | 2011-11-11 | 2014-08-05 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing a semiconductor device |
US8772094B2 (en) | 2011-11-25 | 2014-07-08 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
US8951899B2 (en) | 2011-11-25 | 2015-02-10 | Semiconductor Energy Laboratory | Method for manufacturing semiconductor device |
US9057126B2 (en) | 2011-11-29 | 2015-06-16 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing sputtering target and method for manufacturing semiconductor device |
US20130137232A1 (en) | 2011-11-30 | 2013-05-30 | Semiconductor Energy Laboratory Co., Ltd. | Method for forming oxide semiconductor film and method for manufacturing semiconductor device |
US9076871B2 (en) | 2011-11-30 | 2015-07-07 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
TWI639150B (zh) | 2011-11-30 | 2018-10-21 | 日商半導體能源研究所股份有限公司 | 半導體顯示裝置 |
JP6147992B2 (ja) | 2011-11-30 | 2017-06-14 | 株式会社半導体エネルギー研究所 | 半導体装置 |
JP2013137853A (ja) | 2011-12-02 | 2013-07-11 | Semiconductor Energy Lab Co Ltd | 記憶装置および記憶装置の駆動方法 |
WO2013089115A1 (en) | 2011-12-15 | 2013-06-20 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
JP2013149953A (ja) * | 2011-12-20 | 2013-08-01 | Semiconductor Energy Lab Co Ltd | 半導体装置及び半導体装置の作製方法 |
US8785258B2 (en) | 2011-12-20 | 2014-07-22 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
KR102100425B1 (ko) | 2011-12-27 | 2020-04-13 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 반도체 장치의 제작 방법 |
TWI584383B (zh) | 2011-12-27 | 2017-05-21 | 半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
US9099560B2 (en) | 2012-01-20 | 2015-08-04 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
KR102034911B1 (ko) | 2012-01-25 | 2019-10-21 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 반도체 장치의 제작 방법 |
TWI642193B (zh) | 2012-01-26 | 2018-11-21 | 半導體能源研究所股份有限公司 | 半導體裝置及半導體裝置的製造方法 |
US8956912B2 (en) | 2012-01-26 | 2015-02-17 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
US9419146B2 (en) | 2012-01-26 | 2016-08-16 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
US9196741B2 (en) | 2012-02-03 | 2015-11-24 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US8916424B2 (en) | 2012-02-07 | 2014-12-23 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
US9859114B2 (en) | 2012-02-08 | 2018-01-02 | Semiconductor Energy Laboratory Co., Ltd. | Oxide semiconductor device with an oxygen-controlling insulating layer |
US9112037B2 (en) | 2012-02-09 | 2015-08-18 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US20130207111A1 (en) | 2012-02-09 | 2013-08-15 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, display device including semiconductor device, electronic device including semiconductor device, and method for manufacturing semiconductor device |
JP6108858B2 (ja) | 2012-02-17 | 2017-04-05 | 株式会社半導体エネルギー研究所 | p型半導体材料および半導体装置 |
KR101963226B1 (ko) * | 2012-02-29 | 2019-04-01 | 삼성전자주식회사 | 트랜지스터와 그 제조방법 및 트랜지스터를 포함하는 전자소자 |
JP6075922B2 (ja) * | 2012-02-29 | 2017-02-08 | 株式会社半導体エネルギー研究所 | 表示装置 |
JP6220526B2 (ja) | 2012-02-29 | 2017-10-25 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
JP2013183001A (ja) | 2012-03-01 | 2013-09-12 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
US9735280B2 (en) | 2012-03-02 | 2017-08-15 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, method for manufacturing semiconductor device, and method for forming oxide film |
US8754693B2 (en) | 2012-03-05 | 2014-06-17 | Semiconductor Energy Laboratory Co., Ltd. | Latch circuit and semiconductor device |
US9058892B2 (en) | 2012-03-14 | 2015-06-16 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and shift register |
JP6168795B2 (ja) | 2012-03-14 | 2017-07-26 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
US9349849B2 (en) | 2012-03-28 | 2016-05-24 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and electronic device including the semiconductor device |
US8941113B2 (en) | 2012-03-30 | 2015-01-27 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor element, semiconductor device, and manufacturing method of semiconductor element |
US8901556B2 (en) | 2012-04-06 | 2014-12-02 | Semiconductor Energy Laboratory Co., Ltd. | Insulating film, method for manufacturing semiconductor device, and semiconductor device |
JP6059566B2 (ja) | 2012-04-13 | 2017-01-11 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
JP6128906B2 (ja) | 2012-04-13 | 2017-05-17 | 株式会社半導体エネルギー研究所 | 半導体装置 |
KR20230004930A (ko) | 2012-04-13 | 2023-01-06 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
JP6143423B2 (ja) | 2012-04-16 | 2017-06-07 | 株式会社半導体エネルギー研究所 | 半導体装置の製造方法 |
US9219164B2 (en) | 2012-04-20 | 2015-12-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device with oxide semiconductor channel |
CN102683424B (zh) * | 2012-04-28 | 2013-08-07 | 京东方科技集团股份有限公司 | 显示装置、阵列基板、薄膜晶体管及其制作方法 |
US9048323B2 (en) | 2012-04-30 | 2015-06-02 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
CN107403840B (zh) * | 2012-05-10 | 2021-05-11 | 株式会社半导体能源研究所 | 半导体装置 |
WO2013168624A1 (en) | 2012-05-10 | 2013-11-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
KR102082793B1 (ko) | 2012-05-10 | 2020-02-28 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 및 그 제작 방법 |
KR102087443B1 (ko) | 2012-05-11 | 2020-03-10 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 구동 방법 |
JP6174899B2 (ja) | 2012-05-11 | 2017-08-02 | 株式会社半導体エネルギー研究所 | 半導体装置 |
WO2013180040A1 (en) | 2012-05-31 | 2013-12-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US8995607B2 (en) | 2012-05-31 | 2015-03-31 | Semiconductor Energy Laboratory Co., Ltd. | Pulse signal output circuit and shift register |
US8901557B2 (en) | 2012-06-15 | 2014-12-02 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US9059219B2 (en) | 2012-06-27 | 2015-06-16 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing semiconductor device |
CN104395991B (zh) | 2012-06-29 | 2017-06-20 | 株式会社半导体能源研究所 | 半导体装置 |
KR102161077B1 (ko) | 2012-06-29 | 2020-09-29 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
US8873308B2 (en) | 2012-06-29 | 2014-10-28 | Semiconductor Energy Laboratory Co., Ltd. | Signal processing circuit |
DE112013003041T5 (de) | 2012-06-29 | 2015-03-12 | Semiconductor Energy Laboratory Co., Ltd. | Halbleitervorrichtung |
CN104685633B (zh) * | 2012-07-03 | 2018-08-03 | Imec 非营利协会 | 制作薄膜晶体管的方法 |
KR102099262B1 (ko) | 2012-07-11 | 2020-04-09 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 액정 표시 장치, 및 액정 표시 장치의 구동 방법 |
JP2014032399A (ja) * | 2012-07-13 | 2014-02-20 | Semiconductor Energy Lab Co Ltd | 液晶表示装置 |
JP6006558B2 (ja) | 2012-07-17 | 2016-10-12 | 株式会社半導体エネルギー研究所 | 半導体装置及びその製造方法 |
KR102282866B1 (ko) | 2012-07-20 | 2021-07-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치, 및 표시 장치를 포함하는 전자 장치 |
KR102644240B1 (ko) | 2012-07-20 | 2024-03-07 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
JP2014042004A (ja) | 2012-07-26 | 2014-03-06 | Semiconductor Energy Lab Co Ltd | 半導体装置及びその作製方法 |
JP6224931B2 (ja) | 2012-07-27 | 2017-11-01 | 株式会社半導体エネルギー研究所 | 半導体装置 |
KR20150040873A (ko) | 2012-08-03 | 2015-04-15 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
SG11201505225TA (en) | 2012-08-03 | 2015-08-28 | Semiconductor Energy Lab | Oxide semiconductor stacked film and semiconductor device |
TWI581404B (zh) | 2012-08-10 | 2017-05-01 | 半導體能源研究所股份有限公司 | 半導體裝置以及該半導體裝置的驅動方法 |
US9929276B2 (en) | 2012-08-10 | 2018-03-27 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
US8937307B2 (en) | 2012-08-10 | 2015-01-20 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
KR102099261B1 (ko) | 2012-08-10 | 2020-04-09 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
JP2014057296A (ja) | 2012-08-10 | 2014-03-27 | Semiconductor Energy Lab Co Ltd | 半導体装置の駆動方法 |
JP2014057298A (ja) | 2012-08-10 | 2014-03-27 | Semiconductor Energy Lab Co Ltd | 半導体装置の駆動方法 |
JP2014199899A (ja) | 2012-08-10 | 2014-10-23 | 株式会社半導体エネルギー研究所 | 半導体装置 |
US9245958B2 (en) | 2012-08-10 | 2016-01-26 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
KR102100290B1 (ko) * | 2012-08-14 | 2020-05-27 | 삼성디스플레이 주식회사 | 박막 트랜지스터 및 그 제조 방법과 상기 박막 트랜지스터를 포함하는 표시 장치 |
KR20140026257A (ko) | 2012-08-23 | 2014-03-05 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
KR102161078B1 (ko) | 2012-08-28 | 2020-09-29 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 및 그 제작 방법 |
US9625764B2 (en) | 2012-08-28 | 2017-04-18 | Semiconductor Energy Laboratory Co., Ltd. | Display device and electronic device |
KR20140029202A (ko) | 2012-08-28 | 2014-03-10 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
DE102013216824B4 (de) | 2012-08-28 | 2024-10-17 | Semiconductor Energy Laboratory Co., Ltd. | Halbleitervorrichtung |
TWI611511B (zh) | 2012-08-31 | 2018-01-11 | 半導體能源研究所股份有限公司 | 半導體裝置 |
US8981372B2 (en) | 2012-09-13 | 2015-03-17 | Semiconductor Energy Laboratory Co., Ltd. | Display device and electronic appliance |
CN104620390A (zh) | 2012-09-13 | 2015-05-13 | 株式会社半导体能源研究所 | 半导体装置 |
US9018624B2 (en) | 2012-09-13 | 2015-04-28 | Semiconductor Energy Laboratory Co., Ltd. | Display device and electronic appliance |
KR102226090B1 (ko) | 2012-10-12 | 2021-03-09 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치의 제작 방법 및 반도체 장치의 제조 장치 |
JP6021586B2 (ja) | 2012-10-17 | 2016-11-09 | 株式会社半導体エネルギー研究所 | 半導体装置 |
JP5951442B2 (ja) | 2012-10-17 | 2016-07-13 | 株式会社半導体エネルギー研究所 | 半導体装置 |
WO2014061535A1 (en) | 2012-10-17 | 2014-04-24 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
KR102220279B1 (ko) | 2012-10-19 | 2021-02-24 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 산화물 반도체막을 포함하는 다층막 및 반도체 장치의 제작 방법 |
KR102279459B1 (ko) | 2012-10-24 | 2021-07-19 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
US9287411B2 (en) | 2012-10-24 | 2016-03-15 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
TWI782259B (zh) | 2012-10-24 | 2022-11-01 | 日商半導體能源研究所股份有限公司 | 半導體裝置及其製造方法 |
JP6219562B2 (ja) * | 2012-10-30 | 2017-10-25 | 株式会社半導体エネルギー研究所 | 表示装置及び電子機器 |
JP6317059B2 (ja) | 2012-11-16 | 2018-04-25 | 株式会社半導体エネルギー研究所 | 半導体装置及び表示装置 |
JP6285150B2 (ja) * | 2012-11-16 | 2018-02-28 | 株式会社半導体エネルギー研究所 | 半導体装置 |
TWI600157B (zh) | 2012-11-16 | 2017-09-21 | 半導體能源研究所股份有限公司 | 半導體裝置 |
KR102148549B1 (ko) | 2012-11-28 | 2020-08-26 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
US9412764B2 (en) | 2012-11-28 | 2016-08-09 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, display device, and electronic device |
US9153649B2 (en) | 2012-11-30 | 2015-10-06 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for evaluating semiconductor device |
US9594281B2 (en) | 2012-11-30 | 2017-03-14 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal display device |
US9246011B2 (en) | 2012-11-30 | 2016-01-26 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US9349593B2 (en) | 2012-12-03 | 2016-05-24 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
KR102207028B1 (ko) | 2012-12-03 | 2021-01-22 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
JP5995698B2 (ja) * | 2012-12-06 | 2016-09-21 | 富士フイルム株式会社 | 薄膜トランジスタ及びその製造方法、結晶性酸化物半導体薄膜及びその製造方法、表示装置、並びにx線センサ |
CN104885230B (zh) | 2012-12-25 | 2018-02-23 | 株式会社半导体能源研究所 | 半导体装置 |
US9905585B2 (en) | 2012-12-25 | 2018-02-27 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device comprising capacitor |
KR102241249B1 (ko) | 2012-12-25 | 2021-04-15 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 저항 소자, 표시 장치, 및 전자기기 |
KR101395906B1 (ko) * | 2012-12-26 | 2014-05-19 | 중앙대학교 산학협력단 | 박막 트랜지스터 및 그 제조방법 |
CN104904018B (zh) | 2012-12-28 | 2019-04-09 | 株式会社半导体能源研究所 | 半导体装置及半导体装置的制造方法 |
TWI607510B (zh) | 2012-12-28 | 2017-12-01 | 半導體能源研究所股份有限公司 | 半導體裝置及半導體裝置的製造方法 |
US9391096B2 (en) | 2013-01-18 | 2016-07-12 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
TWI614813B (zh) | 2013-01-21 | 2018-02-11 | 半導體能源研究所股份有限公司 | 半導體裝置的製造方法 |
US8981374B2 (en) | 2013-01-30 | 2015-03-17 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
JP2014154714A (ja) * | 2013-02-08 | 2014-08-25 | Nippon Hoso Kyokai <Nhk> | 有機電界発光素子、表示装置および有機電界発光素子の製造方法 |
TWI618252B (zh) | 2013-02-12 | 2018-03-11 | 半導體能源研究所股份有限公司 | 半導體裝置 |
TWI611567B (zh) | 2013-02-27 | 2018-01-11 | 半導體能源研究所股份有限公司 | 半導體裝置、驅動電路及顯示裝置 |
KR102153110B1 (ko) | 2013-03-06 | 2020-09-07 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체막 및 반도체 장치 |
US9269315B2 (en) | 2013-03-08 | 2016-02-23 | Semiconductor Energy Laboratory Co., Ltd. | Driving method of semiconductor device |
JP6355374B2 (ja) | 2013-03-22 | 2018-07-11 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
US10347769B2 (en) | 2013-03-25 | 2019-07-09 | Semiconductor Energy Laboratory Co., Ltd. | Thin film transistor with multi-layer source/drain electrodes |
JP6376788B2 (ja) | 2013-03-26 | 2018-08-22 | 株式会社半導体エネルギー研究所 | 半導体装置およびその作製方法 |
JP6395409B2 (ja) | 2013-03-27 | 2018-09-26 | 株式会社半導体エネルギー研究所 | 半導体装置およびその作製方法 |
JP6211287B2 (ja) * | 2013-04-04 | 2017-10-11 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
JP6224338B2 (ja) | 2013-04-11 | 2017-11-01 | 株式会社半導体エネルギー研究所 | 半導体装置、表示装置及び半導体装置の作製方法 |
JP6198434B2 (ja) | 2013-04-11 | 2017-09-20 | 株式会社半導体エネルギー研究所 | 表示装置及び電子機器 |
US10304859B2 (en) | 2013-04-12 | 2019-05-28 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device having an oxide film on an oxide semiconductor film |
US9915848B2 (en) | 2013-04-19 | 2018-03-13 | Semiconductor Energy Laboratory Co., Ltd. | Display device and electronic device |
US9893192B2 (en) | 2013-04-24 | 2018-02-13 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
JP6401483B2 (ja) | 2013-04-26 | 2018-10-10 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
TWI631711B (zh) | 2013-05-01 | 2018-08-01 | 半導體能源研究所股份有限公司 | 半導體裝置 |
US9231002B2 (en) | 2013-05-03 | 2016-01-05 | Semiconductor Energy Laboratory Co., Ltd. | Display device and electronic device |
US9704894B2 (en) | 2013-05-10 | 2017-07-11 | Semiconductor Energy Laboratory Co., Ltd. | Display device including pixel electrode including oxide |
US9647125B2 (en) | 2013-05-20 | 2017-05-09 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
SG10201601511RA (en) | 2013-05-20 | 2016-03-30 | Semiconductor Energy Lab | Semiconductor device |
TWI664731B (zh) | 2013-05-20 | 2019-07-01 | 半導體能源研究所股份有限公司 | 半導體裝置 |
US9343579B2 (en) | 2013-05-20 | 2016-05-17 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
WO2014192210A1 (ja) * | 2013-05-29 | 2014-12-04 | パナソニック株式会社 | 薄膜トランジスタ装置とその製造方法、および表示装置 |
TWI624936B (zh) | 2013-06-05 | 2018-05-21 | 半導體能源研究所股份有限公司 | 顯示裝置 |
JP6374221B2 (ja) | 2013-06-05 | 2018-08-15 | 株式会社半導体エネルギー研究所 | 半導体装置 |
TWI649606B (zh) | 2013-06-05 | 2019-02-01 | 日商半導體能源研究所股份有限公司 | 顯示裝置及電子裝置 |
US9773915B2 (en) | 2013-06-11 | 2017-09-26 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
JP6018607B2 (ja) | 2013-07-12 | 2016-11-02 | 株式会社半導体エネルギー研究所 | 半導体装置 |
JP2015036797A (ja) | 2013-08-15 | 2015-02-23 | ソニー株式会社 | 表示装置および電子機器 |
JP6329843B2 (ja) | 2013-08-19 | 2018-05-23 | 株式会社半導体エネルギー研究所 | 半導体装置 |
KR102232133B1 (ko) | 2013-08-22 | 2021-03-24 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
US9443987B2 (en) | 2013-08-23 | 2016-09-13 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
TWI741298B (zh) | 2013-10-10 | 2021-10-01 | 日商半導體能源研究所股份有限公司 | 半導體裝置 |
WO2015060133A1 (en) | 2013-10-22 | 2015-04-30 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US9276128B2 (en) | 2013-10-22 | 2016-03-01 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, method for manufacturing the same, and etchant used for the same |
DE102014220672A1 (de) | 2013-10-22 | 2015-05-07 | Semiconductor Energy Laboratory Co., Ltd. | Halbleitervorrichtung |
JP2015179247A (ja) * | 2013-10-22 | 2015-10-08 | 株式会社半導体エネルギー研究所 | 表示装置 |
US9583516B2 (en) | 2013-10-25 | 2017-02-28 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
JP6440457B2 (ja) | 2013-11-07 | 2018-12-19 | 株式会社半導体エネルギー研究所 | 半導体装置 |
WO2015079360A1 (en) | 2013-11-29 | 2015-06-04 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, method for manufacturing the same, and display device |
US20150155313A1 (en) | 2013-11-29 | 2015-06-04 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US9882014B2 (en) | 2013-11-29 | 2018-01-30 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
JP2016001712A (ja) | 2013-11-29 | 2016-01-07 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
WO2015083034A1 (en) | 2013-12-02 | 2015-06-11 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
US9601634B2 (en) | 2013-12-02 | 2017-03-21 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US9991392B2 (en) | 2013-12-03 | 2018-06-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
JP2016027597A (ja) * | 2013-12-06 | 2016-02-18 | 株式会社半導体エネルギー研究所 | 半導体装置 |
US9349751B2 (en) | 2013-12-12 | 2016-05-24 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
TWI642186B (zh) | 2013-12-18 | 2018-11-21 | 日商半導體能源研究所股份有限公司 | 半導體裝置 |
US9379192B2 (en) | 2013-12-20 | 2016-06-28 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
JP6444714B2 (ja) | 2013-12-20 | 2018-12-26 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
KR102283814B1 (ko) | 2013-12-25 | 2021-07-29 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
JP6402017B2 (ja) | 2013-12-26 | 2018-10-10 | 株式会社半導体エネルギー研究所 | 半導体装置 |
KR20160101904A (ko) | 2013-12-26 | 2016-08-26 | 아사히 가라스 가부시키가이샤 | 반도체 장치 및 반도체 장치의 제조 방법 |
KR102472875B1 (ko) | 2013-12-26 | 2022-12-02 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
KR102529174B1 (ko) | 2013-12-27 | 2023-05-08 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
WO2015156891A2 (en) | 2014-01-23 | 2015-10-15 | Arizona Board Of Regents, Acting For And On Behalf Of Arizona State University | Method of providing a flexible semiconductor device and flexible semiconductor device thereof |
US10381224B2 (en) | 2014-01-23 | 2019-08-13 | Arizona Board Of Regents On Behalf Of Arizona State University | Method of providing an electronic device and electronic device thereof |
WO2017034644A2 (en) | 2015-06-09 | 2017-03-02 | ARIZONA BOARD OF REGENTS a body corporate for THE STATE OF ARIZONA for and on behalf of ARIZONA STATE UNIVERSITY | Method of providing an electronic device and electronic device thereof |
KR102306200B1 (ko) | 2014-01-24 | 2021-09-30 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
WO2015114476A1 (en) | 2014-01-28 | 2015-08-06 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
KR102325158B1 (ko) | 2014-01-30 | 2021-11-10 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치, 전자 기기, 및 반도체 장치의 제작 방법 |
US9929279B2 (en) | 2014-02-05 | 2018-03-27 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
TWI702187B (zh) | 2014-02-21 | 2020-08-21 | 日商半導體能源研究所股份有限公司 | 半導體膜、電晶體、半導體裝置、顯示裝置以及電子裝置 |
US10325937B2 (en) | 2014-02-24 | 2019-06-18 | Lg Display Co., Ltd. | Thin film transistor substrate with intermediate insulating layer and display using the same |
US10985196B2 (en) | 2014-02-24 | 2021-04-20 | Lg Display Co., Ltd. | Thin film transistor substrate with intermediate insulating layer and display using the same |
US10096489B2 (en) | 2014-03-06 | 2018-10-09 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
JP6545976B2 (ja) | 2014-03-07 | 2019-07-17 | 株式会社半導体エネルギー研究所 | 半導体装置 |
US9653611B2 (en) | 2014-03-07 | 2017-05-16 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
KR102450562B1 (ko) | 2014-03-13 | 2022-10-07 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 촬상 장치 |
KR102252213B1 (ko) | 2014-03-14 | 2021-05-14 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 회로 시스템 |
JP2015176965A (ja) * | 2014-03-14 | 2015-10-05 | 株式会社日本製鋼所 | 酸化物系材料の製造方法 |
JP2016027608A (ja) | 2014-03-14 | 2016-02-18 | 株式会社半導体エネルギー研究所 | 半導体装置 |
WO2015140656A1 (en) | 2014-03-18 | 2015-09-24 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
KR102400212B1 (ko) | 2014-03-28 | 2022-05-23 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 트랜지스터 및 반도체 장치 |
JP6541398B2 (ja) | 2014-04-11 | 2019-07-10 | 株式会社半導体エネルギー研究所 | 半導体装置 |
WO2015159179A1 (en) | 2014-04-18 | 2015-10-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and electronic device |
KR102380829B1 (ko) | 2014-04-23 | 2022-03-31 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 촬상 장치 |
JP6486712B2 (ja) | 2014-04-30 | 2019-03-20 | 株式会社半導体エネルギー研究所 | 酸化物半導体膜 |
US10043913B2 (en) | 2014-04-30 | 2018-08-07 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor film, semiconductor device, display device, module, and electronic device |
TWI686899B (zh) | 2014-05-02 | 2020-03-01 | 日商半導體能源研究所股份有限公司 | 半導體裝置、觸控感測器、顯示裝置 |
JP6537341B2 (ja) | 2014-05-07 | 2019-07-03 | 株式会社半導体エネルギー研究所 | 半導体装置 |
TWI695502B (zh) | 2014-05-09 | 2020-06-01 | 日商半導體能源研究所股份有限公司 | 半導體裝置 |
EP3143641A4 (en) | 2014-05-13 | 2018-01-17 | Arizona Board of Regents, a Body Corporate of the State of Arizona acting for and on behalf of Arizona State University | Method of providing an electronic device and electronic device thereof |
TWI672804B (zh) | 2014-05-23 | 2019-09-21 | 日商半導體能源研究所股份有限公司 | 半導體裝置的製造方法 |
US9874775B2 (en) | 2014-05-28 | 2018-01-23 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal display device and electronic device |
TWI646658B (zh) | 2014-05-30 | 2019-01-01 | 日商半導體能源研究所股份有限公司 | 半導體裝置 |
KR20170013240A (ko) | 2014-05-30 | 2017-02-06 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 이를 제조하기 위한 방법 |
KR20250019744A (ko) | 2014-05-30 | 2025-02-10 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 발광 장치 |
US9881954B2 (en) | 2014-06-11 | 2018-01-30 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device |
WO2015189731A1 (en) | 2014-06-13 | 2015-12-17 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and electronic device including the semiconductor device |
KR20150146409A (ko) | 2014-06-20 | 2015-12-31 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치, 표시 장치, 입출력 장치, 및 전자 기기 |
US9722090B2 (en) | 2014-06-23 | 2017-08-01 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device including first gate oxide semiconductor film, and second gate |
US9461179B2 (en) | 2014-07-11 | 2016-10-04 | Semiconductor Energy Laboratory Co., Ltd. | Thin film transistor device (TFT) comprising stacked oxide semiconductor layers and having a surrounded channel structure |
US10147747B2 (en) | 2014-08-21 | 2018-12-04 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, manufacturing method thereof, and electronic device |
US10559667B2 (en) | 2014-08-25 | 2020-02-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for measuring current of semiconductor device |
US9766517B2 (en) | 2014-09-05 | 2017-09-19 | Semiconductor Energy Laboratory Co., Ltd. | Display device and display module |
WO2016046685A1 (en) | 2014-09-26 | 2016-03-31 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device |
US9450581B2 (en) | 2014-09-30 | 2016-09-20 | Semiconductor Energy Laboratory Co., Ltd. | Logic circuit, semiconductor device, electronic component, and electronic device |
JP6392061B2 (ja) * | 2014-10-01 | 2018-09-19 | 東京エレクトロン株式会社 | 電子デバイス、その製造方法、及びその製造装置 |
JP6570417B2 (ja) | 2014-10-24 | 2019-09-04 | 株式会社半導体エネルギー研究所 | 撮像装置および電子機器 |
WO2016067144A1 (en) | 2014-10-28 | 2016-05-06 | Semiconductor Energy Laboratory Co., Ltd. | Display device, manufacturing method of display device, and electronic device |
CN107111972B (zh) | 2014-10-28 | 2020-04-28 | 株式会社半导体能源研究所 | 功能面板、功能面板的制造方法、模块、数据处理装置 |
US9761730B2 (en) | 2014-10-29 | 2017-09-12 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device and electronic device |
TWI711165B (zh) | 2014-11-21 | 2020-11-21 | 日商半導體能源研究所股份有限公司 | 半導體裝置及電子裝置 |
KR102456654B1 (ko) | 2014-11-26 | 2022-10-18 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 및 전자 기기 |
JP6647841B2 (ja) | 2014-12-01 | 2020-02-14 | 株式会社半導体エネルギー研究所 | 酸化物の作製方法 |
US9773832B2 (en) | 2014-12-10 | 2017-09-26 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and electronic device |
US9741742B2 (en) | 2014-12-22 | 2017-08-22 | Arizona Board Of Regents, A Body Corporate Of The State Of Arizona, Acting For And On Behalf Of Arizona State University | Deformable electronic device and methods of providing and using deformable electronic device |
US10446582B2 (en) | 2014-12-22 | 2019-10-15 | Arizona Board Of Regents On Behalf Of Arizona State University | Method of providing an imaging system and imaging system thereof |
JP5859632B2 (ja) * | 2014-12-22 | 2016-02-10 | 株式会社半導体エネルギー研究所 | 表示装置 |
US10522693B2 (en) | 2015-01-16 | 2019-12-31 | Semiconductor Energy Laboratory Co., Ltd. | Memory device and electronic device |
US9647132B2 (en) | 2015-01-30 | 2017-05-09 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and memory device |
TWI792065B (zh) | 2015-01-30 | 2023-02-11 | 日商半導體能源研究所股份有限公司 | 成像裝置及電子裝置 |
TWI732383B (zh) | 2015-02-06 | 2021-07-01 | 日商半導體能源研究所股份有限公司 | 裝置及其製造方法以及電子裝置 |
CN112768511A (zh) | 2015-02-06 | 2021-05-07 | 株式会社半导体能源研究所 | 半导体装置及其制造方法 |
US9685560B2 (en) | 2015-03-02 | 2017-06-20 | Semiconductor Energy Laboratory Co., Ltd. | Transistor, method for manufacturing transistor, semiconductor device, and electronic device |
WO2016139828A1 (ja) * | 2015-03-03 | 2016-09-09 | 株式会社 東芝 | 半導体装置 |
TWI686870B (zh) | 2015-03-03 | 2020-03-01 | 日商半導體能源研究所股份有限公司 | 半導體裝置、顯示裝置及使用該顯示裝置之電子裝置 |
JP6765199B2 (ja) | 2015-03-17 | 2020-10-07 | 株式会社半導体エネルギー研究所 | タッチパネル |
CN107430461B (zh) | 2015-03-17 | 2022-01-28 | 株式会社半导体能源研究所 | 触摸屏 |
JP6662665B2 (ja) | 2015-03-19 | 2020-03-11 | 株式会社半導体エネルギー研究所 | 液晶表示装置及び該液晶表示装置を用いた電子機器 |
US9634048B2 (en) | 2015-03-24 | 2017-04-25 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device and electronic device |
US10429704B2 (en) | 2015-03-26 | 2019-10-01 | Semiconductor Energy Laboratory Co., Ltd. | Display device, display module including the display device, and electronic device including the display device or the display module |
TWI723984B (zh) | 2015-03-27 | 2021-04-11 | 日商半導體能源研究所股份有限公司 | 觸控面板 |
US9716852B2 (en) | 2015-04-03 | 2017-07-25 | Semiconductor Energy Laboratory Co., Ltd. | Broadcast system |
US9685476B2 (en) | 2015-04-03 | 2017-06-20 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device and electronic device |
US10389961B2 (en) | 2015-04-09 | 2019-08-20 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device and electronic device |
US10372274B2 (en) | 2015-04-13 | 2019-08-06 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and touch panel |
US9848146B2 (en) | 2015-04-23 | 2017-12-19 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device and electronic device |
DE102016206922A1 (de) | 2015-05-08 | 2016-11-10 | Semiconductor Energy Laboratory Co., Ltd. | Touchscreen |
US9912897B2 (en) | 2015-05-11 | 2018-03-06 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device and electronic device |
US10684500B2 (en) | 2015-05-27 | 2020-06-16 | Semiconductor Energy Laboratory Co., Ltd. | Touch panel |
US10139663B2 (en) | 2015-05-29 | 2018-11-27 | Semiconductor Energy Laboratory Co., Ltd. | Input/output device and electronic device |
KR102553553B1 (ko) | 2015-06-12 | 2023-07-10 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 촬상 장치, 및 그 동작 방법 및 전자 기기 |
KR102619052B1 (ko) | 2015-06-15 | 2023-12-29 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
WO2017006419A1 (ja) * | 2015-07-06 | 2017-01-12 | 堺ディスプレイプロダクト株式会社 | 表示装置 |
TWI738569B (zh) | 2015-07-07 | 2021-09-01 | 日商半導體能源研究所股份有限公司 | 成像裝置及其運作方法 |
US9887218B2 (en) | 2015-07-16 | 2018-02-06 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device, operating method thereof, and electronic device |
US9876946B2 (en) | 2015-08-03 | 2018-01-23 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device and electronic device |
US10373991B2 (en) | 2015-08-19 | 2019-08-06 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device, operating method thereof, and electronic device |
US10090344B2 (en) | 2015-09-07 | 2018-10-02 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device, method for operating the same, module, and electronic device |
WO2017042658A1 (en) | 2015-09-10 | 2017-03-16 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device, module, electronic device, and method of operating the imaging device |
US10896923B2 (en) | 2015-09-18 | 2021-01-19 | Semiconductor Energy Laboratory Co., Ltd. | Method of operating an imaging device with global shutter system |
JP2017063420A (ja) | 2015-09-25 | 2017-03-30 | 株式会社半導体エネルギー研究所 | 半導体装置 |
KR20180063084A (ko) | 2015-09-30 | 2018-06-11 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 전자 기기 |
US10109667B2 (en) | 2015-10-09 | 2018-10-23 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device, module, and electronic device |
JP6864456B2 (ja) | 2015-10-15 | 2021-04-28 | 株式会社半導体エネルギー研究所 | 半導体装置 |
JP6917700B2 (ja) | 2015-12-02 | 2021-08-11 | 株式会社半導体エネルギー研究所 | 半導体装置 |
US20170168333A1 (en) | 2015-12-11 | 2017-06-15 | Semiconductor Energy Laboratory Co., Ltd. | Display device and separation method |
JP6907512B2 (ja) * | 2015-12-15 | 2021-07-21 | 株式会社リコー | 電界効果型トランジスタの製造方法 |
CN106887436B (zh) * | 2015-12-16 | 2019-10-25 | 鸿富锦精密工业(深圳)有限公司 | 薄膜晶体管阵列基板及其制备方法 |
US10114263B2 (en) | 2015-12-18 | 2018-10-30 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
US10020336B2 (en) | 2015-12-28 | 2018-07-10 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device and electronic device using three dimentional (3D) integration |
KR102617041B1 (ko) | 2015-12-28 | 2023-12-26 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 장치, 텔레비전 시스템, 및 전자 기기 |
US9806179B2 (en) * | 2016-01-14 | 2017-10-31 | Hon Hai Precision Industry Co., Ltd. | Method for fabricating conducting structure and thin film transistor array panel |
US10027896B2 (en) | 2016-01-15 | 2018-07-17 | Semiconductor Energy Laboratory Co., Ltd. | Image display system, operation method of the same, and electronic device |
JP6676990B2 (ja) * | 2016-02-01 | 2020-04-08 | 株式会社リコー | 電界効果型トランジスタの製造方法 |
US9947700B2 (en) | 2016-02-03 | 2018-04-17 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device and electronic device |
US10115741B2 (en) | 2016-02-05 | 2018-10-30 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and electronic device |
KR20170096956A (ko) | 2016-02-17 | 2017-08-25 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치, 전자 기기 |
US10347681B2 (en) | 2016-02-19 | 2019-07-09 | Semiconductor Energy Laboratory Co., Ltd. | Imaging device |
US10573621B2 (en) | 2016-02-25 | 2020-02-25 | Semiconductor Energy Laboratory Co., Ltd. | Imaging system and manufacturing apparatus |
US10263114B2 (en) | 2016-03-04 | 2019-04-16 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, method for manufacturing the same, or display device including the same |
US9882064B2 (en) | 2016-03-10 | 2018-01-30 | Semiconductor Energy Laboratory Co., Ltd. | Transistor and electronic device |
US10014325B2 (en) | 2016-03-10 | 2018-07-03 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and electronic device |
KR20170106200A (ko) | 2016-03-11 | 2017-09-20 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 입출력 패널, 입출력 장치 |
WO2017158464A1 (en) | 2016-03-15 | 2017-09-21 | Semiconductor Energy Laboratory Co., Ltd. | Display device, module, and electronic device |
US10333004B2 (en) | 2016-03-18 | 2019-06-25 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, semiconductor wafer, module and electronic device |
US10096720B2 (en) | 2016-03-25 | 2018-10-09 | Semiconductor Energy Laboratory Co., Ltd. | Transistor, semiconductor device, and electronic device |
JP6863803B2 (ja) | 2016-04-07 | 2021-04-21 | 株式会社半導体エネルギー研究所 | 表示装置 |
WO2017175095A1 (en) | 2016-04-08 | 2017-10-12 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
US10032918B2 (en) | 2016-04-22 | 2018-07-24 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
JP6968567B2 (ja) | 2016-04-22 | 2021-11-17 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
US10008502B2 (en) | 2016-05-04 | 2018-06-26 | Semiconductor Energy Laboratory Co., Ltd. | Memory device |
JP2017203983A (ja) * | 2016-05-06 | 2017-11-16 | 株式会社半導体エネルギー研究所 | 半導体装置、システム、及び動作方法 |
JP7109887B2 (ja) | 2016-05-20 | 2022-08-01 | 株式会社半導体エネルギー研究所 | 表示システム |
US10078243B2 (en) | 2016-06-03 | 2018-09-18 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
TWI712029B (zh) | 2016-06-17 | 2020-12-01 | 日商半導體能源研究所股份有限公司 | 顯示裝置,及顯示裝置的驅動方法 |
KR102330605B1 (ko) | 2016-06-22 | 2021-11-24 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
JP2016174186A (ja) * | 2016-06-27 | 2016-09-29 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
TWI709952B (zh) | 2016-07-01 | 2020-11-11 | 日商半導體能源研究所股份有限公司 | 電子裝置、電子裝置的驅動方法 |
TWI737665B (zh) | 2016-07-01 | 2021-09-01 | 日商半導體能源硏究所股份有限公司 | 半導體裝置以及半導體裝置的製造方法 |
TWI720097B (zh) | 2016-07-11 | 2021-03-01 | 日商半導體能源硏究所股份有限公司 | 濺射靶材及濺射靶材的製造方法 |
KR20190032414A (ko) | 2016-07-26 | 2019-03-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 |
KR102446134B1 (ko) | 2016-07-29 | 2022-09-21 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치, 표시 시스템, 및 전자 기기 |
DE112017003898B4 (de) | 2016-08-03 | 2024-07-18 | Semiconductor Energy Laboratory Co., Ltd. | Abbildungsvorrichtungen und Bildsensor |
KR20180016271A (ko) | 2016-08-05 | 2018-02-14 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
US10678078B2 (en) | 2016-08-05 | 2020-06-09 | Semiconductor Energy Laboratory Co., Ltd. | Display device and method for manufacturing the display device |
US10141544B2 (en) | 2016-08-10 | 2018-11-27 | Semiconductor Energy Laboratory Co., Ltd. | Electroluminescent display device and manufacturing method thereof |
KR102393565B1 (ko) | 2016-08-17 | 2022-05-04 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
JP2018032018A (ja) | 2016-08-17 | 2018-03-01 | 株式会社半導体エネルギー研究所 | 半導体装置、表示モジュール及び電子機器 |
TWI718330B (zh) | 2016-08-24 | 2021-02-11 | 日商半導體能源硏究所股份有限公司 | 半導體裝置及其製造方法 |
WO2018042285A1 (en) | 2016-08-30 | 2018-03-08 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, display device, and electronic device |
US9978879B2 (en) | 2016-08-31 | 2018-05-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
WO2018051208A1 (en) | 2016-09-14 | 2018-03-22 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method of the same |
KR102372150B1 (ko) | 2016-09-30 | 2022-03-07 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 시스템 및 전자 기기 |
KR20180037105A (ko) | 2016-10-03 | 2018-04-11 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치, 표시 모듈, 및 표시 장치의 제작 방법 |
US10411003B2 (en) | 2016-10-14 | 2019-09-10 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
WO2018073689A1 (en) | 2016-10-21 | 2018-04-26 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
KR20180048327A (ko) | 2016-11-01 | 2018-05-10 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치, 및 반도체 장치의 제작 방법 |
KR102490188B1 (ko) | 2016-11-09 | 2023-01-18 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치, 표시 모듈, 전자 기기, 및 표시 장치의 제작 방법 |
DE112017005659T5 (de) | 2016-11-10 | 2019-08-22 | Semiconductor Energy Laboratory Co., Ltd. | Anzeigevorrichtung und Betriebsverfahren der Anzeigevorrichtung |
US10790318B2 (en) | 2016-11-22 | 2020-09-29 | Semiconductor Energy Laboratory Co., Ltd. | Display device, method for manufacturing the same, and electronic device |
JP7050460B2 (ja) | 2016-11-22 | 2022-04-08 | 株式会社半導体エネルギー研究所 | 表示装置 |
US20180145096A1 (en) | 2016-11-23 | 2018-05-24 | Semiconductor Energy Laboratory Co., Ltd. | Display device and electronic device |
WO2018096425A1 (ja) | 2016-11-23 | 2018-05-31 | 株式会社半導体エネルギー研究所 | 表示装置、表示モジュール、及び電子機器 |
US10756118B2 (en) | 2016-11-30 | 2020-08-25 | Semiconductor Energy Laboratory Co., Ltd. | Display device, display module, and electronic device |
WO2018104824A1 (en) | 2016-12-07 | 2018-06-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, display system, and electronic device |
US10147681B2 (en) | 2016-12-09 | 2018-12-04 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
JP2018098313A (ja) * | 2016-12-12 | 2018-06-21 | 株式会社ブイ・テクノロジー | 酸化物半導体装置の製造方法 |
US10319743B2 (en) | 2016-12-16 | 2019-06-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device, display system, and electronic device |
CN108307131B (zh) | 2016-12-27 | 2021-08-03 | 株式会社半导体能源研究所 | 摄像装置及电子设备 |
CN110100203B (zh) | 2017-01-11 | 2023-04-21 | 株式会社半导体能源研究所 | 显示装置 |
DE112018000392T5 (de) | 2017-01-16 | 2019-09-26 | Semiconductor Energy Laboratory Co., Ltd. | Halbleitervorrichtung |
CN110178170B (zh) | 2017-01-16 | 2021-12-07 | 株式会社半导体能源研究所 | 显示装置 |
TWI748035B (zh) | 2017-01-20 | 2021-12-01 | 日商半導體能源硏究所股份有限公司 | 顯示系統及電子裝置 |
KR20190104394A (ko) | 2017-01-24 | 2019-09-09 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 및 전자 기기 |
WO2018138619A1 (en) | 2017-01-30 | 2018-08-02 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
US10608017B2 (en) | 2017-01-31 | 2020-03-31 | Semiconductor Energy Laboratory Co., Ltd. | Display device, display module, and electronic device |
US10504470B2 (en) | 2017-02-07 | 2019-12-10 | Semiconductor Energy Laboratory Co., Ltd. | Driving method of display device |
CN110402497B (zh) | 2017-03-29 | 2024-08-06 | 株式会社半导体能源研究所 | 半导体装置、半导体装置的制造方法 |
JP6498715B2 (ja) * | 2017-04-05 | 2019-04-10 | 三星ディスプレイ株式會社Samsung Display Co.,Ltd. | 表示装置 |
DE112018002191T5 (de) | 2017-04-28 | 2020-01-09 | Semiconductor Energy Laboratory Co., Ltd. | Halbleitervorrichtung und Herstellungsverfahren der Halbleitervorrichtung |
KR102674906B1 (ko) | 2017-06-27 | 2024-06-12 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 시스템 및 데이터 처리 방법 |
WO2019003045A1 (ja) | 2017-06-27 | 2019-01-03 | 株式会社半導体エネルギー研究所 | 記憶装置 |
WO2019021098A1 (en) | 2017-07-26 | 2019-01-31 | Semiconductor Energy Laboratory Co., Ltd. | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
KR102472837B1 (ko) | 2017-08-11 | 2022-11-30 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 및 전자 기기 |
US11296231B2 (en) | 2017-08-25 | 2022-04-05 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing semiconductor device |
EP3676822A4 (en) | 2017-08-31 | 2021-08-04 | Semiconductor Energy Laboratory Co., Ltd. | DISPLAY DEVICE AND ELECTRONIC DEVICE |
JP7146778B2 (ja) | 2017-09-05 | 2022-10-04 | 株式会社半導体エネルギー研究所 | 表示システム |
KR20230170155A (ko) | 2017-09-15 | 2023-12-18 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 및 전자 기기 |
KR102597945B1 (ko) | 2017-09-15 | 2023-11-02 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
JP2019066517A (ja) * | 2017-09-28 | 2019-04-25 | 株式会社ジャパンディスプレイ | 表示装置 |
WO2019087023A1 (ja) | 2017-11-02 | 2019-05-09 | 株式会社半導体エネルギー研究所 | 表示装置および電子機器 |
CN115359757B (zh) | 2017-11-09 | 2025-05-27 | 株式会社半导体能源研究所 | 显示装置及其工作方法以及电子设备 |
CN111448608B (zh) | 2017-12-22 | 2025-07-08 | 株式会社半导体能源研究所 | 显示装置及电子设备 |
CN111542780B (zh) | 2018-01-05 | 2023-11-21 | 株式会社半导体能源研究所 | 显示装置、显示模块及电子设备 |
JP7267212B2 (ja) | 2018-02-09 | 2023-05-01 | 株式会社半導体エネルギー研究所 | 液晶表示装置 |
WO2019193454A1 (ja) | 2018-04-06 | 2019-10-10 | 株式会社半導体エネルギー研究所 | 表示装置、表示装置の動作方法および電子機器 |
KR20240091114A (ko) | 2018-04-26 | 2024-06-21 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 및 전자 기기 |
US12118333B2 (en) | 2018-04-26 | 2024-10-15 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
KR20210009326A (ko) | 2018-05-17 | 2021-01-26 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 |
WO2019224655A1 (ja) | 2018-05-25 | 2019-11-28 | 株式会社半導体エネルギー研究所 | 表示装置および電子機器 |
WO2019234543A1 (ja) | 2018-06-06 | 2019-12-12 | 株式会社半導体エネルギー研究所 | 表示装置、表示モジュール、及び電子機器 |
US11521569B2 (en) | 2018-07-05 | 2022-12-06 | Semiconductor Energy Laboratory Co., Ltd. | Display apparatus and electronic device |
KR20250069696A (ko) | 2018-08-21 | 2025-05-19 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 및 전자 기기 |
WO2020058798A1 (ja) | 2018-09-21 | 2020-03-26 | 株式会社半導体エネルギー研究所 | 表示装置および電子機器 |
US12278223B2 (en) | 2018-09-28 | 2025-04-15 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing display device and display device manufacturing apparatus |
CN112970053A (zh) | 2018-11-02 | 2021-06-15 | 株式会社半导体能源研究所 | 显示装置、显示模块及电子设备 |
JP7441176B2 (ja) | 2018-11-09 | 2024-02-29 | 株式会社半導体エネルギー研究所 | 表示装置および電子機器 |
JP6715312B2 (ja) * | 2018-12-04 | 2020-07-01 | 三星ディスプレイ株式會社Samsung Display Co.,Ltd. | 表示装置 |
WO2020128721A1 (ja) | 2018-12-19 | 2020-06-25 | 株式会社半導体エネルギー研究所 | 表示装置および電子機器 |
KR102019935B1 (ko) * | 2018-12-21 | 2019-11-04 | 엘지디스플레이 주식회사 | 박막트랜지스터를 구비한 엑스레이 검출기 |
US11373610B2 (en) | 2018-12-26 | 2022-06-28 | Semiconductor Energy Laboratory Co., Ltd. | Display apparatus including circuit and pixel |
KR20210116657A (ko) | 2019-02-05 | 2021-09-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 및 전자 기기 |
KR101987800B1 (ko) * | 2019-02-08 | 2019-10-01 | 삼성디스플레이 주식회사 | 박막 트랜지스터 표시판 및 박막 트랜지스터 표시판 제조 방법 |
WO2020229911A1 (ja) | 2019-05-10 | 2020-11-19 | 株式会社半導体エネルギー研究所 | 表示装置および電子機器 |
JP7356815B2 (ja) * | 2019-05-14 | 2023-10-05 | トライベイル テクノロジーズ, エルエルシー | 薄膜トランジスタ基板及び表示装置 |
CN113841253A (zh) * | 2019-05-30 | 2021-12-24 | 株式会社半导体能源研究所 | 显示装置及电子设备 |
WO2020254914A1 (ja) | 2019-06-21 | 2020-12-24 | 株式会社半導体エネルギー研究所 | 酸化物半導体を用いる記憶回路 |
US11711922B2 (en) | 2019-07-12 | 2023-07-25 | Semiconductor Energy Laboratory Co., Ltd. | Memory device with memory cells comprising multiple transistors |
WO2021033075A1 (ja) | 2019-08-22 | 2021-02-25 | 株式会社半導体エネルギー研究所 | メモリセルおよび記憶装置 |
US12132057B2 (en) | 2019-09-09 | 2024-10-29 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device with transistors including oxide semiconductors and capacitor elements |
US11210048B2 (en) | 2019-10-04 | 2021-12-28 | Semiconductor Energy Laboratory Co., Ltd. | Display device, display module, and electronic device |
JP7510431B2 (ja) | 2019-10-11 | 2024-07-03 | 株式会社半導体エネルギー研究所 | 記憶装置 |
JP7682886B2 (ja) | 2020-07-09 | 2025-05-26 | 株式会社半導体エネルギー研究所 | 表示装置 |
TW202211195A (zh) | 2020-08-12 | 2022-03-16 | 日商半導體能源研究所股份有限公司 | 顯示裝置、其工作方法以及電子裝置 |
US12355019B2 (en) | 2020-10-01 | 2025-07-08 | Semiconductor Energy Laboratory Co., Ltd. | Display apparatus and electronic device |
US12009432B2 (en) | 2021-03-05 | 2024-06-11 | Semiconductor Energy Laboratory Co., Ltd. | Transistor and display device |
TW202320033A (zh) | 2021-11-05 | 2023-05-16 | 日商半導體能源研究所股份有限公司 | 顯示裝置及電子裝置 |
WO2023094937A1 (ja) | 2021-11-26 | 2023-06-01 | 株式会社半導体エネルギー研究所 | 表示装置および電子機器 |
TW202329259A (zh) | 2021-12-16 | 2023-07-16 | 日商半導體能源研究所股份有限公司 | 顯示裝置及電子裝置 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3402030B2 (ja) * | 1995-11-10 | 2003-04-28 | ソニー株式会社 | 薄膜半導体装置製造方法 |
JP4326604B2 (ja) * | 1997-09-29 | 2009-09-09 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
JP4164562B2 (ja) * | 2002-09-11 | 2008-10-15 | 独立行政法人科学技術振興機構 | ホモロガス薄膜を活性層として用いる透明薄膜電界効果型トランジスタ |
WO2003098699A1 (fr) * | 2002-05-22 | 2003-11-27 | Sharp Kabushiki Kaisha | Dispositif semiconducteur et afficheur comprenant ce dispositif |
JP2004235180A (ja) * | 2003-01-28 | 2004-08-19 | Sanyo Electric Co Ltd | 半導体装置及びその製造方法 |
JP4118706B2 (ja) * | 2003-02-25 | 2008-07-16 | 株式会社半導体エネルギー研究所 | 液晶表示装置の作製方法 |
JP2004273732A (ja) * | 2003-03-07 | 2004-09-30 | Sharp Corp | アクティブマトリクス基板およびその製造方法 |
JP2004311702A (ja) * | 2003-04-07 | 2004-11-04 | Sumitomo Heavy Ind Ltd | 薄膜トランジスタの製造方法および薄膜トランジスタ |
JP4108633B2 (ja) * | 2003-06-20 | 2008-06-25 | シャープ株式会社 | 薄膜トランジスタおよびその製造方法ならびに電子デバイス |
US7642573B2 (en) * | 2004-03-12 | 2010-01-05 | Hewlett-Packard Development Company, L.P. | Semiconductor device |
CN101057333B (zh) * | 2004-11-10 | 2011-11-16 | 佳能株式会社 | 发光器件 |
-
2006
- 2006-09-27 JP JP2006262991A patent/JP5064747B2/ja active Active
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101680047B1 (ko) | 2009-10-14 | 2016-11-28 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
KR101515543B1 (ko) * | 2013-08-12 | 2015-05-11 | 동의대학교 산학협력단 | 박막 트랜지스터 및 그 제조 방법 |
Also Published As
Publication number | Publication date |
---|---|
JP2007123861A (ja) | 2007-05-17 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6990263B2 (ja) | 半導体装置 | |
JP5064747B2 (ja) | 半導体装置、電気泳動表示装置、表示モジュール、電子機器、及び半導体装置の作製方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20080806 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20080806 |
|
A871 | Explanation of circumstances concerning accelerated examination |
Free format text: JAPANESE INTERMEDIATE CODE: A871 Effective date: 20110817 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20110929 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20111011 |
|
A975 | Report on accelerated examination |
Free format text: JAPANESE INTERMEDIATE CODE: A971005 Effective date: 20110927 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20111207 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20120117 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20120313 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20120619 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20120719 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20120807 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20120809 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 5064747 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20150817 Year of fee payment: 3 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20150817 Year of fee payment: 3 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |