JP5064747B2 - 半導体装置、電気泳動表示装置、表示モジュール、電子機器、及び半導体装置の作製方法 - Google Patents

半導体装置、電気泳動表示装置、表示モジュール、電子機器、及び半導体装置の作製方法 Download PDF

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JP5064747B2
JP5064747B2 JP2006262991A JP2006262991A JP5064747B2 JP 5064747 B2 JP5064747 B2 JP 5064747B2 JP 2006262991 A JP2006262991 A JP 2006262991A JP 2006262991 A JP2006262991 A JP 2006262991A JP 5064747 B2 JP5064747 B2 JP 5064747B2
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film
gate electrode
oxide semiconductor
substrate
semiconductor film
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JP2007123861A (ja
JP2007123861A5 (enrdf_load_stackoverflow
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健吾 秋元
達也 本田
寛人 曽根
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Semiconductor Energy Laboratory Co Ltd
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  • Electrodes Of Semiconductors (AREA)
  • Shift Register Type Memory (AREA)
  • Thin Film Transistor (AREA)
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JP2006262991A 2005-09-29 2006-09-27 半導体装置、電気泳動表示装置、表示モジュール、電子機器、及び半導体装置の作製方法 Active JP5064747B2 (ja)

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JP2008200670A Division JP5020190B2 (ja) 2005-09-29 2008-08-04 半導体装置及びその作製方法
JP2009177524A Division JP5137912B2 (ja) 2005-09-29 2009-07-30 半導体装置の作製方法
JP2010129921A Division JP5116804B2 (ja) 2005-09-29 2010-06-07 半導体装置
JP2011008550A Division JP5031109B2 (ja) 2005-09-29 2011-01-19 半導体装置及びその作製方法
JP2012055690A Division JP5640032B2 (ja) 2005-09-29 2012-03-13 半導体装置、モジュール、及び電子機器
JP2012160330A Division JP5448280B2 (ja) 2005-09-29 2012-07-19 半導体装置
JP2012160290A Division JP5478676B2 (ja) 2005-09-29 2012-07-19 半導体装置の作製方法
JP2012160408A Division JP5640045B2 (ja) 2005-09-29 2012-07-19 半導体装置、電気泳動表示装置、表示モジュール、及び電子機器

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Publication number Priority date Publication date Assignee Title
EP3614442A3 (en) * 2005-09-29 2020-03-25 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device having oxide semiconductor layer and manufactoring method thereof
JP4793679B2 (ja) * 2005-11-10 2011-10-12 富士電機株式会社 薄膜トランジスタ
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JP4999400B2 (ja) * 2006-08-09 2012-08-15 キヤノン株式会社 酸化物半導体膜のドライエッチング方法
US8803781B2 (en) * 2007-05-18 2014-08-12 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and display device
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US8354674B2 (en) * 2007-06-29 2013-01-15 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device wherein a property of a first semiconductor layer is different from a property of a second semiconductor layer
US7738050B2 (en) 2007-07-06 2010-06-15 Semiconductor Energy Laboratory Co., Ltd Liquid crystal display device
EP2183780A4 (en) * 2007-08-02 2010-07-28 Applied Materials Inc THIN FILM TRANSISTORS WITH THIN FILM SEMICONDUCTOR MATERIALS
US20100320457A1 (en) * 2007-11-22 2010-12-23 Masahito Matsubara Etching solution composition
JP5213422B2 (ja) * 2007-12-04 2013-06-19 キヤノン株式会社 絶縁層を有する酸化物半導体素子およびそれを用いた表示装置
JPWO2009075281A1 (ja) 2007-12-13 2011-04-28 出光興産株式会社 酸化物半導体を用いた電界効果型トランジスタ及びその製造方法
WO2009089198A1 (en) * 2008-01-08 2009-07-16 Moxtronics, Inc. High-performance heterostructure light emitting devices and methods
TWI467761B (zh) * 2008-01-17 2015-01-01 Idemitsu Kosan Co Field effect transistor, semiconductor device and manufacturing method thereof
US20100295042A1 (en) * 2008-01-23 2010-11-25 Idemitsu Kosan Co., Ltd. Field-effect transistor, method for manufacturing field-effect transistor, display device using field-effect transistor, and semiconductor device
US8247315B2 (en) 2008-03-17 2012-08-21 Semiconductor Energy Laboratory Co., Ltd. Plasma processing apparatus and method for manufacturing semiconductor device
JP2009267399A (ja) * 2008-04-04 2009-11-12 Fujifilm Corp 半導体装置,半導体装置の製造方法,表示装置及び表示装置の製造方法
JP5704790B2 (ja) * 2008-05-07 2015-04-22 キヤノン株式会社 薄膜トランジスタ、および、表示装置
KR101461127B1 (ko) 2008-05-13 2014-11-14 삼성디스플레이 주식회사 반도체 장치 및 이의 제조 방법
KR101449460B1 (ko) * 2008-05-23 2014-10-13 주성엔지니어링(주) 박막 트랜지스터 어레이 기판 및 이의 제조 방법
KR20090126766A (ko) 2008-06-05 2009-12-09 삼성전자주식회사 박막 트랜지스터 표시판
US8314765B2 (en) 2008-06-17 2012-11-20 Semiconductor Energy Laboratory Co., Ltd. Driver circuit, display device, and electronic device
US8258511B2 (en) * 2008-07-02 2012-09-04 Applied Materials, Inc. Thin film transistors using multiple active channel layers
KR100963104B1 (ko) 2008-07-08 2010-06-14 삼성모바일디스플레이주식회사 박막 트랜지스터, 그의 제조 방법 및 박막 트랜지스터를구비하는 평판 표시 장치
TWI450399B (zh) * 2008-07-31 2014-08-21 Semiconductor Energy Lab 半導體裝置及其製造方法
TWI626744B (zh) * 2008-07-31 2018-06-11 半導體能源研究所股份有限公司 半導體裝置及半導體裝置的製造方法
TWI491048B (zh) * 2008-07-31 2015-07-01 Semiconductor Energy Lab 半導體裝置
JP2010056541A (ja) * 2008-07-31 2010-03-11 Semiconductor Energy Lab Co Ltd 半導体装置およびその作製方法
US9666719B2 (en) 2008-07-31 2017-05-30 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
JP5608347B2 (ja) 2008-08-08 2014-10-15 株式会社半導体エネルギー研究所 半導体装置及び半導体装置の作製方法
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JP5480554B2 (ja) 2008-08-08 2014-04-23 株式会社半導体エネルギー研究所 半導体装置
TWI508282B (zh) * 2008-08-08 2015-11-11 Semiconductor Energy Lab 半導體裝置及其製造方法
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KR20100023151A (ko) * 2008-08-21 2010-03-04 삼성모바일디스플레이주식회사 박막 트랜지스터 및 그 제조방법
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JP5627071B2 (ja) 2008-09-01 2014-11-19 株式会社半導体エネルギー研究所 半導体装置の作製方法
US8021916B2 (en) 2008-09-01 2011-09-20 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
US9082857B2 (en) * 2008-09-01 2015-07-14 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device comprising an oxide semiconductor layer
JP5274165B2 (ja) * 2008-09-08 2013-08-28 富士フイルム株式会社 薄膜電界効果型トランジスタ及びその製造方法
KR101545460B1 (ko) * 2008-09-12 2015-08-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 생산 방법
WO2010029859A1 (en) 2008-09-12 2010-03-18 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
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EP2327069A4 (en) 2008-09-12 2013-03-20 Semiconductor Energy Lab DISPLAY DEVICE
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CN102881696A (zh) * 2008-09-19 2013-01-16 株式会社半导体能源研究所 显示装置
JPWO2010038566A1 (ja) * 2008-09-30 2012-03-01 コニカミノルタホールディングス株式会社 薄膜トランジスタおよびその製造方法
JP5525224B2 (ja) * 2008-09-30 2014-06-18 株式会社半導体エネルギー研究所 表示装置
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WO2010038820A1 (en) 2008-10-03 2010-04-08 Semiconductor Energy Laboratory Co., Ltd. Display device
EP2172977A1 (en) 2008-10-03 2010-04-07 Semiconductor Energy Laboratory Co., Ltd. Display device
EP2172804B1 (en) * 2008-10-03 2016-05-11 Semiconductor Energy Laboratory Co, Ltd. Display device
KR101803720B1 (ko) 2008-10-03 2017-12-01 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
JP5552753B2 (ja) 2008-10-08 2014-07-16 ソニー株式会社 薄膜トランジスタおよび表示装置
CN101719493B (zh) 2008-10-08 2014-05-14 株式会社半导体能源研究所 显示装置
JP5484853B2 (ja) * 2008-10-10 2014-05-07 株式会社半導体エネルギー研究所 半導体装置の作製方法
WO2010044478A1 (en) 2008-10-16 2010-04-22 Semiconductor Energy Laboratory Co., Ltd. Light-emitting display device
JP5361651B2 (ja) 2008-10-22 2013-12-04 株式会社半導体エネルギー研究所 半導体装置の作製方法
US8106400B2 (en) * 2008-10-24 2012-01-31 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
JP5442234B2 (ja) 2008-10-24 2014-03-12 株式会社半導体エネルギー研究所 半導体装置及び表示装置
US8741702B2 (en) 2008-10-24 2014-06-03 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
KR102095625B1 (ko) 2008-10-24 2020-03-31 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제조 방법
WO2010047288A1 (en) * 2008-10-24 2010-04-29 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductordevice
EP2180518B1 (en) * 2008-10-24 2018-04-25 Semiconductor Energy Laboratory Co, Ltd. Method for manufacturing semiconductor device
JP5616012B2 (ja) * 2008-10-24 2014-10-29 株式会社半導体エネルギー研究所 半導体装置の作製方法
KR101667909B1 (ko) * 2008-10-24 2016-10-28 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체장치의 제조방법
KR101634411B1 (ko) * 2008-10-31 2016-06-28 가부시키가이샤 한도오따이 에네루기 켄큐쇼 구동 회로, 표시 장치 및 전자 장치
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KR101603303B1 (ko) 2008-10-31 2016-03-14 가부시키가이샤 한도오따이 에네루기 켄큐쇼 도전성 산질화물 및 도전성 산질화물막의 제작 방법
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EP2184783B1 (en) 2008-11-07 2012-10-03 Semiconductor Energy Laboratory Co, Ltd. Semiconductor device and method for manufacturing the same
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JP2010123595A (ja) * 2008-11-17 2010-06-03 Sony Corp 薄膜トランジスタおよび表示装置
JP2010123758A (ja) * 2008-11-19 2010-06-03 Nec Corp 薄膜デバイス及びその製造方法
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JP2012033516A (ja) * 2008-11-26 2012-02-16 Ulvac Japan Ltd トランジスタ及びその製造方法。
TWI616707B (zh) 2008-11-28 2018-03-01 半導體能源研究所股份有限公司 液晶顯示裝置
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US9721825B2 (en) 2008-12-02 2017-08-01 Arizona Board Of Regents, A Body Corporate Of The State Of Arizona, Acting For And On Behalf Of Arizona State University Method of providing a flexible semiconductor device and flexible semiconductor device thereof
US9991311B2 (en) 2008-12-02 2018-06-05 Arizona Board Of Regents On Behalf Of Arizona State University Dual active layer semiconductor device and method of manufacturing the same
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JP5491833B2 (ja) 2008-12-05 2014-05-14 株式会社半導体エネルギー研究所 半導体装置
WO2010071183A1 (en) 2008-12-19 2010-06-24 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
CN102257621B (zh) 2008-12-19 2013-08-21 株式会社半导体能源研究所 晶体管的制造方法
EP2515337B1 (en) * 2008-12-24 2016-02-24 Semiconductor Energy Laboratory Co., Ltd. Driver circuit and semiconductor device
US8114720B2 (en) 2008-12-25 2012-02-14 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
KR101719350B1 (ko) * 2008-12-25 2017-03-23 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
US8383470B2 (en) 2008-12-25 2013-02-26 Semiconductor Energy Laboratory Co., Ltd. Thin film transistor (TFT) having a protective layer and manufacturing method thereof
US8441007B2 (en) * 2008-12-25 2013-05-14 Semiconductor Energy Laboratory Co., Ltd. Display device and manufacturing method thereof
US8330156B2 (en) 2008-12-26 2012-12-11 Semiconductor Energy Laboratory Co., Ltd. Thin film transistor with a plurality of oxide clusters over the gate insulating layer
TWI482226B (zh) * 2008-12-26 2015-04-21 Semiconductor Energy Lab 具有包含氧化物半導體層之電晶體的主動矩陣顯示裝置
KR101648927B1 (ko) 2009-01-16 2016-08-17 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
KR100993416B1 (ko) 2009-01-20 2010-11-09 삼성모바일디스플레이주식회사 박막 트랜지스터, 그의 제조 방법 및 박막 트랜지스터를 구비하는 평판 표시 장치
US8492756B2 (en) 2009-01-23 2013-07-23 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
US8395740B2 (en) * 2009-01-30 2013-03-12 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device having blue phase liquid crystal and particular electrode arrangement
US8436350B2 (en) 2009-01-30 2013-05-07 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device using an oxide semiconductor with a plurality of metal clusters
US8174021B2 (en) * 2009-02-06 2012-05-08 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method of manufacturing the semiconductor device
JP4752927B2 (ja) * 2009-02-09 2011-08-17 ソニー株式会社 薄膜トランジスタおよび表示装置
CN101840936B (zh) 2009-02-13 2014-10-08 株式会社半导体能源研究所 包括晶体管的半导体装置及其制造方法
US8247812B2 (en) 2009-02-13 2012-08-21 Semiconductor Energy Laboratory Co., Ltd. Transistor, semiconductor device including the transistor, and manufacturing method of the transistor and the semiconductor device
US8247276B2 (en) 2009-02-20 2012-08-21 Semiconductor Energy Laboratory Co., Ltd. Thin film transistor, method for manufacturing the same, and semiconductor device
US8841661B2 (en) 2009-02-25 2014-09-23 Semiconductor Energy Laboratory Co., Ltd. Staggered oxide semiconductor TFT semiconductor device and manufacturing method thereof
US8704216B2 (en) 2009-02-27 2014-04-22 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
US20100224878A1 (en) 2009-03-05 2010-09-09 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US8461582B2 (en) 2009-03-05 2013-06-11 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
US20100224880A1 (en) * 2009-03-05 2010-09-09 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP5504008B2 (ja) 2009-03-06 2014-05-28 株式会社半導体エネルギー研究所 半導体装置
TW201106069A (en) * 2009-03-11 2011-02-16 Semiconductor Energy Lab Liquid crystal display device
KR101906751B1 (ko) 2009-03-12 2018-10-10 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치의 제작 방법
TWI556323B (zh) 2009-03-13 2016-11-01 半導體能源研究所股份有限公司 半導體裝置及該半導體裝置的製造方法
US8450144B2 (en) 2009-03-26 2013-05-28 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
KR101681884B1 (ko) 2009-03-27 2016-12-05 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체장치, 표시장치 및 전자기기
TWI617029B (zh) * 2009-03-27 2018-03-01 半導體能源研究所股份有限公司 半導體裝置
US8927981B2 (en) 2009-03-30 2015-01-06 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
US8338226B2 (en) 2009-04-02 2012-12-25 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
TWI489628B (zh) 2009-04-02 2015-06-21 Semiconductor Energy Lab 半導體裝置和其製造方法
TWI476917B (zh) * 2009-04-16 2015-03-11 Semiconductor Energy Lab 半導體裝置和其製造方法
JP2010276829A (ja) * 2009-05-28 2010-12-09 Sumitomo Chemical Co Ltd 表示装置
EP2256814B1 (en) * 2009-05-29 2019-01-16 Semiconductor Energy Laboratory Co, Ltd. Oxide semiconductor device and method for manufacturing the same
JP5564331B2 (ja) 2009-05-29 2014-07-30 株式会社半導体エネルギー研究所 半導体装置の作製方法
SG176601A1 (en) 2009-05-29 2012-01-30 Univ Arizona Method of providing a flexible semiconductor device at high temperatures and flexible semiconductor device thereof
EP2256795B1 (en) * 2009-05-29 2014-11-19 Semiconductor Energy Laboratory Co., Ltd. Manufacturing method for oxide semiconductor device
WO2010150446A1 (ja) * 2009-06-24 2010-12-29 シャープ株式会社 薄膜トランジスタおよびその製造方法、アクティブマトリクス基板、表示パネル、ならびに表示装置
WO2011001715A1 (ja) 2009-06-29 2011-01-06 シャープ株式会社 酸化物半導体、薄膜トランジスタアレイ基板及びその製造方法、並びに、表示装置
KR101457837B1 (ko) 2009-06-30 2014-11-05 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 제작 방법
KR101903930B1 (ko) 2009-06-30 2018-10-02 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 제조 방법
KR101944656B1 (ko) 2009-06-30 2019-04-17 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 제조 방법
KR101420025B1 (ko) 2009-06-30 2014-07-15 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 제조 방법
JP5663214B2 (ja) * 2009-07-03 2015-02-04 株式会社半導体エネルギー研究所 半導体装置の作製方法
KR102106460B1 (ko) * 2009-07-03 2020-05-04 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치의 제작 방법
KR101476817B1 (ko) 2009-07-03 2014-12-26 가부시키가이샤 한도오따이 에네루기 켄큐쇼 트랜지스터를 갖는 표시 장치 및 그 제작 방법
KR102216028B1 (ko) 2009-07-10 2021-02-16 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제조 방법
KR101791370B1 (ko) 2009-07-10 2017-10-27 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR101935752B1 (ko) * 2009-07-10 2019-01-04 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치의 제작 방법
WO2011007677A1 (en) 2009-07-17 2011-01-20 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
WO2011007682A1 (en) 2009-07-17 2011-01-20 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing semiconductor device
KR101739154B1 (ko) * 2009-07-17 2017-05-23 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제조 방법
WO2011010545A1 (en) 2009-07-18 2011-01-27 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
KR101929726B1 (ko) * 2009-07-18 2018-12-14 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 반도체 장치의 제조 방법
KR101782176B1 (ko) * 2009-07-18 2017-09-26 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 반도체 장치의 제조 방법
CN102576732B (zh) * 2009-07-18 2015-02-25 株式会社半导体能源研究所 半导体装置与用于制造半导体装置的方法
WO2011010542A1 (en) * 2009-07-23 2011-01-27 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
KR101785992B1 (ko) 2009-07-24 2017-10-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR102490468B1 (ko) 2009-07-31 2023-01-19 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
KR102153841B1 (ko) 2009-07-31 2020-09-08 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제조 방법
WO2011013502A1 (en) * 2009-07-31 2011-02-03 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
WO2011013523A1 (en) 2009-07-31 2011-02-03 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
WO2011013522A1 (en) 2009-07-31 2011-02-03 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
TWI650848B (zh) 2009-08-07 2019-02-11 日商半導體能源研究所股份有限公司 半導體裝置和其製造方法
TWI634642B (zh) * 2009-08-07 2018-09-01 半導體能源研究所股份有限公司 半導體裝置和其製造方法
JP5663231B2 (ja) 2009-08-07 2015-02-04 株式会社半導体エネルギー研究所 発光装置
TWI582951B (zh) * 2009-08-07 2017-05-11 半導體能源研究所股份有限公司 半導體裝置及包括該半導體裝置之電話、錶、和顯示裝置
TWI596741B (zh) 2009-08-07 2017-08-21 半導體能源研究所股份有限公司 半導體裝置和其製造方法
JP5642447B2 (ja) * 2009-08-07 2014-12-17 株式会社半導体エネルギー研究所 半導体装置
EP2284891B1 (en) * 2009-08-07 2019-07-24 Semiconductor Energy Laboratory Co, Ltd. Semiconductor device and manufacturing method thereof
US8115883B2 (en) 2009-08-27 2012-02-14 Semiconductor Energy Laboratory Co., Ltd. Display device and method for manufacturing the same
WO2011027649A1 (en) * 2009-09-02 2011-03-10 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device including a transistor, and manufacturing method of semiconductor device
KR101460869B1 (ko) 2009-09-04 2014-11-11 가부시끼가이샤 도시바 박막 트랜지스터 및 그 제조 방법
WO2011027701A1 (en) * 2009-09-04 2011-03-10 Semiconductor Energy Laboratory Co., Ltd. Light-emitting device and method for manufacturing the same
KR102775255B1 (ko) * 2009-09-04 2025-03-06 가부시키가이샤 한도오따이 에네루기 켄큐쇼 발광 장치 및 발광 장치를 제작하기 위한 방법
KR101746198B1 (ko) 2009-09-04 2017-06-12 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시장치 및 전자기기
WO2011027664A1 (en) 2009-09-04 2011-03-10 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device and method for manufacturing the same
KR101672072B1 (ko) 2009-09-04 2016-11-02 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치의 제작 방법
JP5700626B2 (ja) * 2009-09-04 2015-04-15 株式会社半導体エネルギー研究所 El表示装置
WO2011027656A1 (en) 2009-09-04 2011-03-10 Semiconductor Energy Laboratory Co., Ltd. Transistor and display device
WO2011027702A1 (en) 2009-09-04 2011-03-10 Semiconductor Energy Laboratory Co., Ltd. Light-emitting device and method for manufacturing the same
WO2011027676A1 (en) 2009-09-04 2011-03-10 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
KR101269812B1 (ko) 2009-09-04 2013-05-30 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 표시 패널, 표시 모듈, 전자 기기 및 표시 장치
TWI783356B (zh) * 2009-09-10 2022-11-11 日商半導體能源研究所股份有限公司 半導體裝置和顯示裝置
KR20120071398A (ko) * 2009-09-16 2012-07-02 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제조 방법
KR102157249B1 (ko) 2009-09-16 2020-09-17 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제조 방법
CN102024410B (zh) 2009-09-16 2014-10-22 株式会社半导体能源研究所 半导体装置及电子设备
KR20230165355A (ko) * 2009-09-16 2023-12-05 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
US9715845B2 (en) * 2009-09-16 2017-07-25 Semiconductor Energy Laboratory Co., Ltd. Semiconductor display device
KR102009813B1 (ko) 2009-09-16 2019-08-12 가부시키가이샤 한도오따이 에네루기 켄큐쇼 발광 장치 및 이의 제조 방법
KR20190045396A (ko) * 2009-09-16 2019-05-02 가부시키가이샤 한도오따이 에네루기 켄큐쇼 트랜지스터
WO2011034012A1 (en) 2009-09-16 2011-03-24 Semiconductor Energy Laboratory Co., Ltd. Logic circuit, light emitting device, semiconductor device, and electronic device
KR101026213B1 (ko) * 2009-09-21 2011-03-31 경원대학교 산학협력단 레이저 패터닝을 이용한 투명 박막 트랜지스터의 제조
CN102549758B (zh) 2009-09-24 2015-11-25 株式会社半导体能源研究所 半导体器件及其制造方法
KR101707260B1 (ko) * 2009-09-24 2017-02-15 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
WO2011037008A1 (en) 2009-09-24 2011-03-31 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing oxide semiconductor film and method for manufacturing semiconductor device
KR101470785B1 (ko) * 2009-09-24 2014-12-08 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치의 제조 방법
KR101809759B1 (ko) * 2009-09-24 2018-01-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 소자 및 그 제조 방법
WO2011036987A1 (en) * 2009-09-24 2011-03-31 Semiconductor Energy Laboratory Co., Ltd. Display device
KR102443297B1 (ko) 2009-09-24 2022-09-15 가부시키가이샤 한도오따이 에네루기 켄큐쇼 산화물 반도체막 및 반도체 장치
CN105513644B (zh) 2009-09-24 2019-10-15 株式会社半导体能源研究所 驱动器电路、包括驱动器电路的显示设备以及包括显示设备的电子电器
WO2011043182A1 (en) 2009-10-05 2011-04-14 Semiconductor Energy Laboratory Co., Ltd. Method for removing electricity and method for manufacturing semiconductor device
KR20120084751A (ko) 2009-10-05 2012-07-30 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
CN102484139B (zh) * 2009-10-08 2016-07-06 株式会社半导体能源研究所 氧化物半导体层及半导体装置
KR102596694B1 (ko) 2009-10-08 2023-11-01 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
WO2011043164A1 (en) 2009-10-09 2011-04-14 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the semiconductor device
KR101843558B1 (ko) 2009-10-09 2018-03-30 가부시키가이샤 한도오따이 에네루기 켄큐쇼 시프트 레지스터, 표시 장치, 및 그 구동 방법
WO2011043194A1 (en) * 2009-10-09 2011-04-14 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
CN102576736B (zh) 2009-10-09 2015-05-13 株式会社半导体能源研究所 半导体器件及其制造方法
KR101949670B1 (ko) * 2009-10-09 2019-02-19 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR101778513B1 (ko) * 2009-10-09 2017-09-15 가부시키가이샤 한도오따이 에네루기 켄큐쇼 발광 표시 장치 및 이를 포함한 전자 기기
EP2486593B1 (en) * 2009-10-09 2017-02-01 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
CN102598278B (zh) 2009-10-09 2015-04-08 株式会社半导体能源研究所 半导体器件
KR101820973B1 (ko) * 2009-10-09 2018-01-22 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 반도체 장치 제조 방법
WO2011043175A1 (en) 2009-10-09 2011-04-14 Semiconductor Energy Laboratory Co., Ltd. Logic circuit and display device having the same
WO2011043206A1 (en) 2009-10-09 2011-04-14 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
KR101882350B1 (ko) 2009-10-09 2018-07-27 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
MY158956A (en) 2009-10-16 2016-11-30 Semiconductor Energy Lab Logic circuit and semiconductor device
CN116722019A (zh) 2009-10-16 2023-09-08 株式会社半导体能源研究所 显示设备
KR101945301B1 (ko) * 2009-10-16 2019-02-07 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 표시 장치 및 전자 장치
WO2011046010A1 (en) * 2009-10-16 2011-04-21 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device and electronic device including the liquid crystal display device
US8546797B2 (en) 2009-10-20 2013-10-01 Stanley Electric Co., Ltd. Zinc oxide based compound semiconductor device
JP5426315B2 (ja) * 2009-10-20 2014-02-26 スタンレー電気株式会社 ZnO系化合物半導体素子
WO2011048968A1 (en) 2009-10-21 2011-04-28 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
CN102576734B (zh) 2009-10-21 2015-04-22 株式会社半导体能源研究所 显示装置和包括显示装置的电子设备
KR102023128B1 (ko) * 2009-10-21 2019-09-19 가부시키가이샤 한도오따이 에네루기 켄큐쇼 아날로그 회로 및 반도체 장치
KR101847656B1 (ko) * 2009-10-21 2018-05-24 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제조 방법
WO2011048923A1 (en) 2009-10-21 2011-04-28 Semiconductor Energy Laboratory Co., Ltd. E-book reader
KR20130130879A (ko) * 2009-10-21 2013-12-02 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 제작방법
CN102598248B (zh) * 2009-10-21 2015-09-23 株式会社半导体能源研究所 半导体器件
SG10201406934WA (en) * 2009-10-29 2014-11-27 Semiconductor Energy Lab Semiconductor device
WO2011052382A1 (en) 2009-10-30 2011-05-05 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
MY163862A (en) * 2009-10-30 2017-10-31 Semiconductor Energy Lab Logic circuit and semiconductor device
WO2011052384A1 (en) 2009-10-30 2011-05-05 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
CN102668095B (zh) * 2009-10-30 2016-08-03 株式会社半导体能源研究所 晶体管
IN2012DN03080A (enrdf_load_stackoverflow) 2009-10-30 2015-07-31 Semiconductor Energy Lab
WO2011055769A1 (en) 2009-11-06 2011-05-12 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor element and semiconductor device, and deposition apparatus
CN102598279B (zh) 2009-11-06 2015-10-07 株式会社半导体能源研究所 半导体装置
KR101930230B1 (ko) 2009-11-06 2018-12-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치를 제작하기 위한 방법
KR101750982B1 (ko) * 2009-11-06 2017-06-26 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 반도체 장치의 제작 방법
JP5539846B2 (ja) 2009-11-06 2014-07-02 株式会社半導体エネルギー研究所 評価方法、半導体装置の作製方法
KR20190066086A (ko) 2009-11-06 2019-06-12 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
KR102066532B1 (ko) * 2009-11-06 2020-01-15 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
WO2011055474A1 (ja) 2009-11-09 2011-05-12 シャープ株式会社 アクティブマトリクス基板及びそれを備えた液晶表示パネル、並びにアクティブマトリクス基板の製造方法
CN102612714B (zh) * 2009-11-13 2016-06-29 株式会社半导体能源研究所 半导体器件及其驱动方法
KR20120094013A (ko) 2009-11-13 2012-08-23 가부시키가이샤 한도오따이 에네루기 켄큐쇼 스퍼터링 타겟 및 그 제조방법, 및 트랜지스터
KR20230173233A (ko) * 2009-11-13 2023-12-26 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치 및 이 표시 장치를 구비한 전자 기기
KR101975741B1 (ko) 2009-11-13 2019-05-09 가부시키가이샤 한도오따이 에네루기 켄큐쇼 타깃 재료의 포장 방법 및 타깃의 장착 방법
WO2011058865A1 (en) * 2009-11-13 2011-05-19 Semiconductor Energy Laboratory Co., Ltd. Semiconductor devi ce
KR20170076818A (ko) * 2009-11-13 2017-07-04 가부시키가이샤 한도오따이 에네루기 켄큐쇼 스퍼터링 타겟 및 그 제작 방법 및 트랜지스터
KR101799265B1 (ko) * 2009-11-13 2017-11-20 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
KR101800854B1 (ko) * 2009-11-20 2017-11-23 가부시키가이샤 한도오따이 에네루기 켄큐쇼 트랜지스터
KR101922849B1 (ko) * 2009-11-20 2018-11-27 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR20120106766A (ko) 2009-11-20 2012-09-26 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치의 제작 방법
KR101800852B1 (ko) * 2009-11-20 2017-12-20 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
WO2011062048A1 (en) 2009-11-20 2011-05-26 Semiconductor Energy Laboratory Co., Ltd. Thin film transistor
US8355109B2 (en) * 2009-11-24 2013-01-15 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device comprising a liquid crystal material exhibiting a blue phase and a structure body projecting into the liquid crystal layer
KR101658533B1 (ko) * 2009-11-25 2016-09-22 엘지디스플레이 주식회사 산화물 박막 트랜지스터 및 그 제조방법
KR101517944B1 (ko) 2009-11-27 2015-05-06 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 반도체 장치의 제작방법
CN102640293B (zh) 2009-11-27 2015-07-22 株式会社半导体能源研究所 半导体器件
CN105140101B (zh) 2009-11-28 2018-11-16 株式会社半导体能源研究所 层叠的氧化物材料、半导体器件、以及用于制造该半导体器件的方法
WO2011065210A1 (en) 2009-11-28 2011-06-03 Semiconductor Energy Laboratory Co., Ltd. Stacked oxide material, semiconductor device, and method for manufacturing the semiconductor device
WO2011065243A1 (en) 2009-11-28 2011-06-03 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
EP2507787A4 (en) 2009-11-30 2013-07-17 Semiconductor Energy Lab Liquid crystal display device, control method therefor and electronic device therefor
KR101605723B1 (ko) * 2009-12-01 2016-03-24 엘지디스플레이 주식회사 산화물 박막 트랜지스터의 제조방법
KR101623961B1 (ko) * 2009-12-02 2016-05-26 삼성전자주식회사 트랜지스터와 그 제조방법 및 트랜지스터를 포함하는 전자소자
WO2011068022A1 (en) 2009-12-04 2011-06-09 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
KR101800038B1 (ko) * 2009-12-04 2017-11-21 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
CN104795323B (zh) 2009-12-04 2017-12-29 株式会社半导体能源研究所 半导体装置及其制造方法
CN105609509A (zh) 2009-12-04 2016-05-25 株式会社半导体能源研究所 显示装置
KR102153034B1 (ko) 2009-12-04 2020-09-07 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
JP2011139052A (ja) 2009-12-04 2011-07-14 Semiconductor Energy Lab Co Ltd 半導体記憶装置
KR101396102B1 (ko) 2009-12-04 2014-05-15 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
CN104992962B (zh) 2009-12-04 2018-12-25 株式会社半导体能源研究所 半导体器件及其制造方法
KR101945171B1 (ko) 2009-12-08 2019-02-07 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR101511076B1 (ko) 2009-12-08 2015-04-10 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
US8685803B2 (en) 2009-12-09 2014-04-01 Sharp Kabushiki Kaisha Semiconductor device and method for producing same
WO2011070887A1 (en) 2009-12-11 2011-06-16 Semiconductor Energy Laboratory Co., Ltd. Field effect transistor
WO2011070901A1 (en) 2009-12-11 2011-06-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
KR101770976B1 (ko) * 2009-12-11 2017-08-24 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
WO2011070929A1 (en) 2009-12-11 2011-06-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and electronic device
IN2012DN04871A (enrdf_load_stackoverflow) * 2009-12-11 2015-09-25 Semiconductor Energy Laoboratory Co Ltd
JP5727204B2 (ja) 2009-12-11 2015-06-03 株式会社半導体エネルギー研究所 半導体装置の作製方法
JP5185357B2 (ja) 2009-12-17 2013-04-17 株式会社半導体エネルギー研究所 半導体装置
CN102668377B (zh) * 2009-12-18 2015-04-08 株式会社半导体能源研究所 非易失性锁存电路和逻辑电路以及使用它们的半导体器件
KR101768433B1 (ko) 2009-12-18 2017-08-16 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 제작 방법
WO2011074407A1 (en) 2009-12-18 2011-06-23 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
KR101830195B1 (ko) 2009-12-18 2018-02-20 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치와 그것의 제작 방법
KR102275522B1 (ko) 2009-12-18 2021-07-08 가부시키가이샤 한도오따이 에네루기 켄큐쇼 액정 표시 장치 및 전자 기기
KR101900662B1 (ko) * 2009-12-18 2018-11-08 가부시키가이샤 한도오따이 에네루기 켄큐쇼 액정 표시 장치 및 그 구동 방법
KR101622733B1 (ko) * 2009-12-21 2016-05-20 엘지디스플레이 주식회사 산화물 박막 트랜지스터의 제조방법
CN102656801B (zh) 2009-12-25 2016-04-27 株式会社半导体能源研究所 存储器装置、半导体器件和电子装置
WO2011077978A1 (en) 2009-12-25 2011-06-30 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing display device
CN102656690B (zh) * 2009-12-25 2016-04-20 株式会社半导体能源研究所 半导体装置
KR101883802B1 (ko) 2009-12-28 2018-07-31 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치의 제작 방법
KR101872678B1 (ko) 2009-12-28 2018-07-02 가부시키가이샤 한도오따이 에네루기 켄큐쇼 액정 표시 장치 및 전자 기기
KR102480794B1 (ko) * 2009-12-28 2022-12-22 가부시키가이샤 한도오따이 에네루기 켄큐쇼 기억 장치와 반도체 장치
WO2011081041A1 (en) 2009-12-28 2011-07-07 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the semiconductor device
KR101781788B1 (ko) 2009-12-28 2017-09-26 가부시키가이샤 한도오따이 에네루기 켄큐쇼 액정 표시 장치 및 전자 기기
CN102714029B (zh) 2010-01-20 2016-03-23 株式会社半导体能源研究所 显示装置的显示方法
KR101805102B1 (ko) 2010-01-20 2017-12-05 가부시키가이샤 한도오따이 에네루기 켄큐쇼 액정 표시 장치의 구동 방법
KR101787734B1 (ko) 2010-01-20 2017-10-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 기억 장치
KR101861991B1 (ko) 2010-01-20 2018-05-30 가부시키가이샤 한도오따이 에네루기 켄큐쇼 신호 처리 회로 및 신호 처리 회로를 구동하기 위한 방법
KR101744906B1 (ko) * 2010-01-20 2017-06-20 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치 및 표시 장치의 구동 방법
KR101842860B1 (ko) 2010-01-20 2018-03-28 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치의 구동 방법
KR101750126B1 (ko) * 2010-01-20 2017-06-22 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치의 구동 방법 및 액정 표시 장치
KR101803987B1 (ko) * 2010-01-20 2017-12-01 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
MY160598A (en) 2010-01-20 2017-03-15 Semiconductor Energy Lab Semiconductor device
US8778730B2 (en) 2010-01-21 2014-07-15 Sharp Kabushiki Kaisha Process for production of circuit board
KR102174859B1 (ko) * 2010-01-22 2020-11-05 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR102008754B1 (ko) * 2010-01-24 2019-08-09 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치와 이의 제조 방법
KR101873730B1 (ko) 2010-01-24 2018-07-04 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
KR101800850B1 (ko) * 2010-01-29 2017-11-23 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 기억 장치
US9391209B2 (en) 2010-02-05 2016-07-12 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
KR102026603B1 (ko) 2010-02-05 2019-10-01 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
WO2011096276A1 (en) 2010-02-05 2011-08-11 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device
KR20150010776A (ko) 2010-02-05 2015-01-28 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 및 반도체 장치의 제조 방법
WO2011096286A1 (en) 2010-02-05 2011-08-11 Semiconductor Energy Laboratory Co., Ltd. Field effect transistor and semiconductor device
KR20180028557A (ko) * 2010-02-05 2018-03-16 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 반도체 장치의 제조 방법
US8947337B2 (en) 2010-02-11 2015-02-03 Semiconductor Energy Laboratory Co., Ltd. Display device
CN102763156B (zh) * 2010-02-12 2015-11-25 株式会社半导体能源研究所 液晶显示装置和电子装置
KR101636998B1 (ko) * 2010-02-12 2016-07-08 삼성디스플레이 주식회사 박막 트랜지스터 및 그 제조 방법
US8617920B2 (en) 2010-02-12 2013-12-31 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
KR102586642B1 (ko) 2010-02-18 2023-10-11 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
CN102763202B (zh) 2010-02-19 2016-08-03 株式会社半导体能源研究所 半导体装置及其制造方法
KR102049472B1 (ko) 2010-02-19 2019-11-27 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR101848684B1 (ko) * 2010-02-19 2018-04-16 가부시키가이샤 한도오따이 에네루기 켄큐쇼 액정 표시 장치 및 전자 장치
JP5740169B2 (ja) 2010-02-19 2015-06-24 株式会社半導体エネルギー研究所 トランジスタの作製方法
KR20180110212A (ko) * 2010-02-19 2018-10-08 가부시키가이샤 한도오따이 에네루기 켄큐쇼 트랜지스터 및 이를 이용한 표시 장치
KR102455879B1 (ko) * 2010-02-23 2022-10-19 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제조 방법
US9000438B2 (en) 2010-02-26 2015-04-07 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
KR20120120458A (ko) 2010-02-26 2012-11-01 가부시키가이샤 한도오따이 에네루기 켄큐쇼 액정 표시 장치
WO2011105218A1 (en) * 2010-02-26 2011-09-01 Semiconductor Energy Laboratory Co., Ltd. Display device and e-book reader provided therewith
WO2011105198A1 (en) * 2010-02-26 2011-09-01 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
KR20180001562A (ko) * 2010-02-26 2018-01-04 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치를 제작하기 위한 방법
WO2011105184A1 (en) * 2010-02-26 2011-09-01 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
JP5413845B2 (ja) * 2010-02-26 2014-02-12 住友化学株式会社 液晶表示装置、液晶表示装置の製造方法及び液晶表示装置の製造装置
DE112011106185B3 (de) 2010-03-02 2023-05-04 Semiconductor Energy Laboratory Co., Ltd. Impulssignal-Ausgangsschaltung und Schieberegister
DE112011100749B4 (de) 2010-03-02 2015-06-11 Semiconductor Energy Laboratory Co., Ltd. Impulssignal-Ausgangsschaltung und Schieberegister
JP2011203726A (ja) * 2010-03-05 2011-10-13 Semiconductor Energy Lab Co Ltd 表示装置
KR102341927B1 (ko) * 2010-03-05 2021-12-23 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
KR101878206B1 (ko) 2010-03-05 2018-07-16 가부시키가이샤 한도오따이 에네루기 켄큐쇼 산화물 반도체막의 제작 방법 및 트랜지스터의 제작 방법
WO2011111531A1 (en) * 2010-03-12 2011-09-15 Semiconductor Energy Laboratory Co., Ltd. Display device
KR102112065B1 (ko) * 2010-03-26 2020-06-04 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
WO2011118364A1 (en) 2010-03-26 2011-09-29 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
DE112011101152T5 (de) * 2010-03-31 2013-01-10 Semiconductor Energy Laboratory Co.,Ltd. Flüssigkristallanzeigeeinrichtung und Verfahren zu deren Ansteuerung
WO2011122299A1 (en) 2010-03-31 2011-10-06 Semiconductor Energy Laboratory Co., Ltd. Driving method of liquid crystal display device
WO2011122280A1 (en) * 2010-03-31 2011-10-06 Semiconductor Energy Laboratory Co., Ltd. Semiconductor display device
KR102292523B1 (ko) 2010-04-02 2021-08-20 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR101465192B1 (ko) * 2010-04-09 2014-11-25 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
US8653514B2 (en) 2010-04-09 2014-02-18 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
CN102844847B (zh) 2010-04-16 2015-09-23 株式会社半导体能源研究所 沉积方法及半导体装置的制造方法
KR101887336B1 (ko) * 2010-04-23 2018-08-09 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치 및 그 구동 방법
CN102859703B (zh) 2010-04-23 2015-12-02 株式会社半导体能源研究所 半导体装置的制造方法
JP5581263B2 (ja) * 2010-05-13 2014-08-27 株式会社半導体エネルギー研究所 バッファ回路
US8664658B2 (en) 2010-05-14 2014-03-04 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
WO2012021196A2 (en) 2010-05-21 2012-02-16 Arizona Board Of Regents, For And On Behalf Of Arizona State University Method for manufacturing electronic devices and electronic devices thereof
WO2011145484A1 (en) 2010-05-21 2011-11-24 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US8629438B2 (en) 2010-05-21 2014-01-14 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
WO2012021197A2 (en) 2010-05-21 2012-02-16 Arizona Board Of Regents, For And On Behalf Of Arizona State University Method of manufacturing electronic devices on both sides of a carrier substrate and electronic devices thereof
US9123820B2 (en) 2010-05-31 2015-09-01 Sharp Kabushiki Kaisha Thin film transistor including semiconductor oxide layer having reduced resistance regions
EP2579315B1 (en) 2010-06-02 2018-08-15 Sharp Kabushiki Kaisha Method of manufacturing a thin film transistor
WO2011155295A1 (en) 2010-06-10 2011-12-15 Semiconductor Energy Laboratory Co., Ltd. Dc/dc converter, power supply circuit, and semiconductor device
KR101862808B1 (ko) 2010-06-18 2018-05-30 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
US8552425B2 (en) * 2010-06-18 2013-10-08 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
KR101822526B1 (ko) 2010-06-30 2018-01-26 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치와 그 제작 방법
KR101801960B1 (ko) 2010-07-01 2017-11-27 가부시키가이샤 한도오따이 에네루기 켄큐쇼 액정 표시 장치의 구동 방법
US8441010B2 (en) 2010-07-01 2013-05-14 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
WO2012002186A1 (en) 2010-07-02 2012-01-05 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US8642380B2 (en) 2010-07-02 2014-02-04 Semiconductor Energy Laboratory Co., Ltd. Manufacturing method of semiconductor device
US9336739B2 (en) * 2010-07-02 2016-05-10 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device
US8785241B2 (en) 2010-07-16 2014-07-22 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
KR101920709B1 (ko) * 2010-07-30 2018-11-22 삼성전자주식회사 트랜지스터와 그 제조방법 및 트랜지스터를 포함하는 전자소자
KR101809105B1 (ko) * 2010-08-06 2017-12-14 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 집적 회로
JP5671418B2 (ja) * 2010-08-06 2015-02-18 株式会社半導体エネルギー研究所 半導体装置の駆動方法
US8422272B2 (en) 2010-08-06 2013-04-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and driving method thereof
TWI688047B (zh) * 2010-08-06 2020-03-11 半導體能源研究所股份有限公司 半導體裝置
TWI559409B (zh) 2010-08-16 2016-11-21 半導體能源研究所股份有限公司 半導體裝置之製造方法
TWI508294B (zh) 2010-08-19 2015-11-11 Semiconductor Energy Lab 半導體裝置
US8883555B2 (en) 2010-08-25 2014-11-11 Semiconductor Energy Laboratory Co., Ltd. Electronic device, manufacturing method of electronic device, and sputtering target
US8685787B2 (en) 2010-08-25 2014-04-01 Semiconductor Energy Laboratory Co., Ltd. Manufacturing method of semiconductor device
JP5727892B2 (ja) * 2010-08-26 2015-06-03 株式会社半導体エネルギー研究所 半導体装置
JP2013009285A (ja) * 2010-08-26 2013-01-10 Semiconductor Energy Lab Co Ltd 信号処理回路及びその駆動方法
US8592261B2 (en) 2010-08-27 2013-11-26 Semiconductor Energy Laboratory Co., Ltd. Method for designing semiconductor device
US8575610B2 (en) 2010-09-02 2013-11-05 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for driving the same
WO2012029596A1 (en) * 2010-09-03 2012-03-08 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
WO2012029595A1 (en) * 2010-09-03 2012-03-08 Semiconductor Energy Laboratory Co., Ltd. Oscillator circuit and semiconductor device using the oscillator circuit
WO2012029612A1 (en) 2010-09-03 2012-03-08 Semiconductor Energy Laboratory Co., Ltd. Sputtering target and method for manufacturing semiconductor device
US8922236B2 (en) * 2010-09-10 2014-12-30 Semiconductor Energy Laboratory Co., Ltd. Semiconductor memory device and method for inspecting the same
US8797487B2 (en) 2010-09-10 2014-08-05 Semiconductor Energy Laboratory Co., Ltd. Transistor, liquid crystal display device, and manufacturing method thereof
US8766253B2 (en) 2010-09-10 2014-07-01 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
KR20120026970A (ko) 2010-09-10 2012-03-20 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 발광 장치
US9546416B2 (en) 2010-09-13 2017-01-17 Semiconductor Energy Laboratory Co., Ltd. Method of forming crystalline oxide semiconductor film
JP2012256821A (ja) 2010-09-13 2012-12-27 Semiconductor Energy Lab Co Ltd 記憶装置
US8835917B2 (en) 2010-09-13 2014-09-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, power diode, and rectifier
US8592879B2 (en) 2010-09-13 2013-11-26 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
US8871565B2 (en) 2010-09-13 2014-10-28 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
US8664097B2 (en) * 2010-09-13 2014-03-04 Semiconductor Energy Laboratory Co., Ltd. Manufacturing method of semiconductor device
KR101932576B1 (ko) 2010-09-13 2018-12-26 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
TWI670711B (zh) 2010-09-14 2019-09-01 日商半導體能源研究所股份有限公司 記憶體裝置和半導體裝置
WO2012035984A1 (en) 2010-09-15 2012-03-22 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and display device
CN103119699B (zh) * 2010-09-22 2016-08-17 凸版印刷株式会社 薄膜晶体管及其制造方法和图像显示装置
TWI574259B (zh) 2010-09-29 2017-03-11 半導體能源研究所股份有限公司 半導體記憶體裝置和其驅動方法
TWI664631B (zh) 2010-10-05 2019-07-01 日商半導體能源研究所股份有限公司 半導體記憶體裝置及其驅動方法
US8803143B2 (en) * 2010-10-20 2014-08-12 Semiconductor Energy Laboratory Co., Ltd. Thin film transistor including buffer layers with high resistivity
JP5775712B2 (ja) * 2010-10-28 2015-09-09 株式会社ジャパンディスプレイ 表示装置
US8916866B2 (en) 2010-11-03 2014-12-23 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
TWI555205B (zh) 2010-11-05 2016-10-21 半導體能源研究所股份有限公司 半導體裝置及半導體裝置的製造方法
US8569754B2 (en) 2010-11-05 2013-10-29 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
US8936965B2 (en) 2010-11-26 2015-01-20 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
US8629496B2 (en) 2010-11-30 2014-01-14 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
US8816425B2 (en) 2010-11-30 2014-08-26 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
US8823092B2 (en) 2010-11-30 2014-09-02 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
TWI525818B (zh) 2010-11-30 2016-03-11 半導體能源研究所股份有限公司 半導體裝置及半導體裝置之製造方法
US8809852B2 (en) 2010-11-30 2014-08-19 Semiconductor Energy Laboratory Co., Ltd. Semiconductor film, semiconductor element, semiconductor device, and method for manufacturing the same
KR101995082B1 (ko) 2010-12-03 2019-07-02 가부시키가이샤 한도오따이 에네루기 켄큐쇼 산화물 반도체막 및 반도체 장치
US8894825B2 (en) 2010-12-17 2014-11-25 Semiconductor Energy Laboratory Co., Ltd. Sputtering target, method for manufacturing the same, manufacturing semiconductor device
KR102001577B1 (ko) 2010-12-17 2019-07-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 산화물 재료 및 반도체 장치
US9443984B2 (en) * 2010-12-28 2016-09-13 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
JP5784479B2 (ja) 2010-12-28 2015-09-24 株式会社半導体エネルギー研究所 半導体装置
WO2012090799A1 (en) * 2010-12-28 2012-07-05 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
US8883556B2 (en) 2010-12-28 2014-11-11 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
JP5975635B2 (ja) * 2010-12-28 2016-08-23 株式会社半導体エネルギー研究所 半導体装置
JP5731369B2 (ja) 2010-12-28 2015-06-10 株式会社半導体エネルギー研究所 半導体装置の作製方法
KR101761804B1 (ko) * 2011-11-22 2017-08-10 주성엔지니어링(주) 박막 트랜지스터 및 그 제조 방법
KR101812702B1 (ko) * 2010-12-30 2018-01-30 주성엔지니어링(주) 박막 트랜지스터 및 그 제조 방법
TWI621121B (zh) 2011-01-05 2018-04-11 半導體能源研究所股份有限公司 儲存元件、儲存裝置、及信號處理電路
JP5977523B2 (ja) 2011-01-12 2016-08-24 株式会社半導体エネルギー研究所 トランジスタの作製方法
TWI570809B (zh) 2011-01-12 2017-02-11 半導體能源研究所股份有限公司 半導體裝置及其製造方法
US8536571B2 (en) 2011-01-12 2013-09-17 Semiconductor Energy Laboratory Co., Ltd. Manufacturing method of semiconductor device
TWI535032B (zh) 2011-01-12 2016-05-21 半導體能源研究所股份有限公司 半導體裝置的製造方法
JP5982125B2 (ja) 2011-01-12 2016-08-31 株式会社半導体エネルギー研究所 半導体装置の作製方法
JP5888990B2 (ja) 2011-01-12 2016-03-22 株式会社半導体エネルギー研究所 半導体装置の作製方法
TWI619230B (zh) 2011-01-14 2018-03-21 半導體能源研究所股份有限公司 半導體記憶裝置
JP5527225B2 (ja) * 2011-01-14 2014-06-18 ソニー株式会社 薄膜トランジスタおよび表示装置
JP5859839B2 (ja) 2011-01-14 2016-02-16 株式会社半導体エネルギー研究所 記憶素子の駆動方法、及び、記憶素子
KR102026718B1 (ko) 2011-01-14 2019-09-30 가부시키가이샤 한도오따이 에네루기 켄큐쇼 기억장치, 반도체 장치, 검출 방법
JP5716407B2 (ja) * 2011-01-17 2015-05-13 株式会社リコー 電界効果型トランジスタ、表示素子、画像表示装置、及びシステム
KR101942701B1 (ko) 2011-01-20 2019-01-29 가부시키가이샤 한도오따이 에네루기 켄큐쇼 산화물 반도체 소자 및 반도체 장치
TWI570920B (zh) 2011-01-26 2017-02-11 半導體能源研究所股份有限公司 半導體裝置及其製造方法
TWI787452B (zh) 2011-01-26 2022-12-21 日商半導體能源研究所股份有限公司 半導體裝置及其製造方法
TWI525619B (zh) 2011-01-27 2016-03-11 半導體能源研究所股份有限公司 記憶體電路
KR20190007525A (ko) 2011-01-27 2019-01-22 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
TWI520273B (zh) 2011-02-02 2016-02-01 半導體能源研究所股份有限公司 半導體儲存裝置
US9799773B2 (en) 2011-02-02 2017-10-24 Semiconductor Energy Laboratory Co., Ltd. Transistor and semiconductor device
JP6000560B2 (ja) 2011-02-02 2016-09-28 株式会社半導体エネルギー研究所 半導体メモリ装置
US8643007B2 (en) 2011-02-23 2014-02-04 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US8669552B2 (en) * 2011-03-02 2014-03-11 Applied Materials, Inc. Offset electrode TFT structure
US9023684B2 (en) 2011-03-04 2015-05-05 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
US9646829B2 (en) 2011-03-04 2017-05-09 Semiconductor Energy Laboratory Co., Ltd. Manufacturing method of semiconductor device
US8841664B2 (en) 2011-03-04 2014-09-23 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP5827145B2 (ja) 2011-03-08 2015-12-02 株式会社半導体エネルギー研究所 信号処理回路
US8541781B2 (en) 2011-03-10 2013-09-24 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
JP2012209543A (ja) 2011-03-11 2012-10-25 Semiconductor Energy Lab Co Ltd 半導体装置
TWI521612B (zh) * 2011-03-11 2016-02-11 半導體能源研究所股份有限公司 半導體裝置的製造方法
WO2012128030A1 (en) 2011-03-18 2012-09-27 Semiconductor Energy Laboratory Co., Ltd. Oxide semiconductor film, semiconductor device, and manufacturing method of semiconductor device
US9012904B2 (en) 2011-03-25 2015-04-21 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
TWI545652B (zh) 2011-03-25 2016-08-11 半導體能源研究所股份有限公司 半導體裝置及其製造方法
US8956944B2 (en) 2011-03-25 2015-02-17 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
US9219159B2 (en) 2011-03-25 2015-12-22 Semiconductor Energy Laboratory Co., Ltd. Method for forming oxide semiconductor film and method for manufacturing semiconductor device
JP6053098B2 (ja) 2011-03-28 2016-12-27 株式会社半導体エネルギー研究所 半導体装置
US8927329B2 (en) 2011-03-30 2015-01-06 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing oxide semiconductor device with improved electronic properties
US9082860B2 (en) * 2011-03-31 2015-07-14 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
TWI567735B (zh) 2011-03-31 2017-01-21 半導體能源研究所股份有限公司 記憶體電路,記憶體單元,及訊號處理電路
US9960278B2 (en) * 2011-04-06 2018-05-01 Yuhei Sato Manufacturing method of semiconductor device
CN103548146A (zh) * 2011-04-07 2014-01-29 代表亚利桑那大学的亚利桑那校董会 用于半导体器件的双有源层及其制造方法
US9012905B2 (en) 2011-04-08 2015-04-21 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device including transistor comprising oxide semiconductor and method for manufacturing the same
US9093538B2 (en) 2011-04-08 2015-07-28 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
US8878174B2 (en) 2011-04-15 2014-11-04 Semiconductor Energy Laboratory Co., Ltd. Semiconductor element, memory circuit, integrated circuit, and driving method of the integrated circuit
US8779488B2 (en) 2011-04-15 2014-07-15 Semiconductor Energy Laboratory Co., Ltd. Semiconductor memory device
US9331206B2 (en) 2011-04-22 2016-05-03 Semiconductor Energy Laboratory Co., Ltd. Oxide material and semiconductor device
JP5946683B2 (ja) 2011-04-22 2016-07-06 株式会社半導体エネルギー研究所 半導体装置
CN105931967B (zh) 2011-04-27 2019-05-03 株式会社半导体能源研究所 半导体装置的制造方法
TWI671911B (zh) 2011-05-05 2019-09-11 日商半導體能源研究所股份有限公司 半導體裝置及其製造方法
US9117701B2 (en) 2011-05-06 2015-08-25 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US8709922B2 (en) * 2011-05-06 2014-04-29 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US8946066B2 (en) 2011-05-11 2015-02-03 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing semiconductor device
TWI541978B (zh) * 2011-05-11 2016-07-11 半導體能源研究所股份有限公司 半導體裝置及半導體裝置之驅動方法
JP5886127B2 (ja) 2011-05-13 2016-03-16 株式会社半導体エネルギー研究所 半導体装置
JP5886128B2 (ja) 2011-05-13 2016-03-16 株式会社半導体エネルギー研究所 半導体装置
WO2012157463A1 (en) 2011-05-13 2012-11-22 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
WO2012157472A1 (en) 2011-05-13 2012-11-22 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
TWI595495B (zh) * 2011-05-13 2017-08-11 半導體能源研究所股份有限公司 半導體裝置
JP6109489B2 (ja) 2011-05-13 2017-04-05 株式会社半導体エネルギー研究所 El表示装置
JP6076617B2 (ja) * 2011-05-13 2017-02-08 株式会社半導体エネルギー研究所 表示装置
KR101946360B1 (ko) 2011-05-16 2019-02-11 가부시키가이샤 한도오따이 에네루기 켄큐쇼 프로그래머블 로직 디바이스
US9117920B2 (en) * 2011-05-19 2015-08-25 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device using oxide semiconductor
US8581625B2 (en) 2011-05-19 2013-11-12 Semiconductor Energy Laboratory Co., Ltd. Programmable logic device
KR102081792B1 (ko) 2011-05-19 2020-02-26 가부시키가이샤 한도오따이 에네루기 켄큐쇼 연산회로 및 연산회로의 구동방법
JP5936908B2 (ja) 2011-05-20 2016-06-22 株式会社半導体エネルギー研究所 パリティビット出力回路およびパリティチェック回路
JP5892852B2 (ja) 2011-05-20 2016-03-23 株式会社半導体エネルギー研究所 プログラマブルロジックデバイス
TWI570719B (zh) 2011-05-20 2017-02-11 半導體能源研究所股份有限公司 儲存裝置及信號處理電路
JP5886496B2 (ja) 2011-05-20 2016-03-16 株式会社半導体エネルギー研究所 半導体装置
WO2012161059A1 (en) * 2011-05-20 2012-11-29 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for driving the same
JP5731904B2 (ja) 2011-05-25 2015-06-10 ルネサスエレクトロニクス株式会社 半導体装置及び半導体装置の製造方法
US8610482B2 (en) 2011-05-27 2013-12-17 Semiconductor Energy Laboratory Co., Ltd. Trimming circuit and method for driving trimming circuit
US8669781B2 (en) 2011-05-31 2014-03-11 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US8679905B2 (en) * 2011-06-08 2014-03-25 Cbrite Inc. Metal oxide TFT with improved source/drain contacts
CN103597545B (zh) 2011-06-09 2016-10-19 株式会社半导体能源研究所 高速缓冲存储器及其驱动方法
JP6012263B2 (ja) 2011-06-09 2016-10-25 株式会社半導体エネルギー研究所 半導体記憶装置
JP6104522B2 (ja) 2011-06-10 2017-03-29 株式会社半導体エネルギー研究所 半導体装置
KR20120138074A (ko) * 2011-06-14 2012-12-24 삼성디스플레이 주식회사 박막 트랜지스터, 및 박막 트랜지스터 표시판과 이들을 제조하는 방법
TWI557910B (zh) 2011-06-16 2016-11-11 半導體能源研究所股份有限公司 半導體裝置及其製造方法
KR20190039345A (ko) 2011-06-17 2019-04-10 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그의 제조 방법
KR20130007426A (ko) 2011-06-17 2013-01-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
US9166055B2 (en) 2011-06-17 2015-10-20 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
US8901554B2 (en) 2011-06-17 2014-12-02 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device including channel formation region including oxide semiconductor
US9130044B2 (en) 2011-07-01 2015-09-08 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
JP2013021034A (ja) * 2011-07-07 2013-01-31 Ulvac Japan Ltd レーザアニール法及び半導体装置の製造方法
US9496138B2 (en) * 2011-07-08 2016-11-15 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing oxide semiconductor film, method for manufacturing semiconductor device, and semiconductor device
US9385238B2 (en) * 2011-07-08 2016-07-05 Semiconductor Energy Laboratory Co., Ltd. Transistor using oxide semiconductor
TWI565067B (zh) 2011-07-08 2017-01-01 半導體能源研究所股份有限公司 半導體裝置及其製造方法
KR102014876B1 (ko) * 2011-07-08 2019-08-27 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 반도체 장치의 제작 방법
JP2013042117A (ja) 2011-07-15 2013-02-28 Semiconductor Energy Lab Co Ltd 半導体装置
US8847220B2 (en) 2011-07-15 2014-09-30 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US8643008B2 (en) * 2011-07-22 2014-02-04 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US8718224B2 (en) 2011-08-05 2014-05-06 Semiconductor Energy Laboratory Co., Ltd. Pulse signal output circuit and shift register
JP6231880B2 (ja) * 2011-08-11 2017-11-15 出光興産株式会社 薄膜トランジスタ
JP6006572B2 (ja) 2011-08-18 2016-10-12 株式会社半導体エネルギー研究所 半導体装置
JP6128775B2 (ja) * 2011-08-19 2017-05-17 株式会社半導体エネルギー研究所 半導体装置
WO2013039126A1 (en) 2011-09-16 2013-03-21 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US9082663B2 (en) 2011-09-16 2015-07-14 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
WO2013042562A1 (en) 2011-09-22 2013-03-28 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US8841675B2 (en) 2011-09-23 2014-09-23 Semiconductor Energy Laboratory Co., Ltd. Minute transistor
JP2013084333A (ja) 2011-09-28 2013-05-09 Semiconductor Energy Lab Co Ltd シフトレジスタ回路
US8716708B2 (en) 2011-09-29 2014-05-06 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
KR102304125B1 (ko) 2011-09-29 2021-09-17 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
US8736315B2 (en) 2011-09-30 2014-05-27 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US20130087784A1 (en) 2011-10-05 2013-04-11 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
US10014068B2 (en) 2011-10-07 2018-07-03 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP6022880B2 (ja) 2011-10-07 2016-11-09 株式会社半導体エネルギー研究所 半導体装置及び半導体装置の作製方法
JP2013093561A (ja) * 2011-10-07 2013-05-16 Semiconductor Energy Lab Co Ltd 酸化物半導体膜及び半導体装置
US9018629B2 (en) 2011-10-13 2015-04-28 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing semiconductor device
JP6026839B2 (ja) 2011-10-13 2016-11-16 株式会社半導体エネルギー研究所 半導体装置
US9117916B2 (en) 2011-10-13 2015-08-25 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device comprising oxide semiconductor film
JP5912394B2 (ja) 2011-10-13 2016-04-27 株式会社半導体エネルギー研究所 半導体装置
KR101976212B1 (ko) * 2011-10-24 2019-05-07 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 반도체 장치의 제작 방법
JP6226518B2 (ja) 2011-10-24 2017-11-08 株式会社半導体エネルギー研究所 半導体装置
KR20140086954A (ko) 2011-10-28 2014-07-08 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
KR102012981B1 (ko) 2011-11-09 2019-08-21 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
JP2013104079A (ja) * 2011-11-11 2013-05-30 Solar Applied Materials Technology Corp ターゲット、CoベースのまたはFeベースの磁気記録媒体のための下層材料および磁気記録媒体
JP6076038B2 (ja) 2011-11-11 2017-02-08 株式会社半導体エネルギー研究所 表示装置の作製方法
JP6122275B2 (ja) 2011-11-11 2017-04-26 株式会社半導体エネルギー研究所 表示装置
US8878177B2 (en) 2011-11-11 2014-11-04 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing semiconductor device
US8796682B2 (en) 2011-11-11 2014-08-05 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing a semiconductor device
US8772094B2 (en) 2011-11-25 2014-07-08 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
US8951899B2 (en) 2011-11-25 2015-02-10 Semiconductor Energy Laboratory Method for manufacturing semiconductor device
US9057126B2 (en) 2011-11-29 2015-06-16 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing sputtering target and method for manufacturing semiconductor device
US20130137232A1 (en) 2011-11-30 2013-05-30 Semiconductor Energy Laboratory Co., Ltd. Method for forming oxide semiconductor film and method for manufacturing semiconductor device
US9076871B2 (en) 2011-11-30 2015-07-07 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
TWI639150B (zh) 2011-11-30 2018-10-21 日商半導體能源研究所股份有限公司 半導體顯示裝置
JP6147992B2 (ja) 2011-11-30 2017-06-14 株式会社半導体エネルギー研究所 半導体装置
JP2013137853A (ja) 2011-12-02 2013-07-11 Semiconductor Energy Lab Co Ltd 記憶装置および記憶装置の駆動方法
WO2013089115A1 (en) 2011-12-15 2013-06-20 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
JP2013149953A (ja) * 2011-12-20 2013-08-01 Semiconductor Energy Lab Co Ltd 半導体装置及び半導体装置の作製方法
US8785258B2 (en) 2011-12-20 2014-07-22 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
KR102100425B1 (ko) 2011-12-27 2020-04-13 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 반도체 장치의 제작 방법
TWI584383B (zh) 2011-12-27 2017-05-21 半導體能源研究所股份有限公司 半導體裝置及其製造方法
US9099560B2 (en) 2012-01-20 2015-08-04 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
KR102034911B1 (ko) 2012-01-25 2019-10-21 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 반도체 장치의 제작 방법
TWI642193B (zh) 2012-01-26 2018-11-21 半導體能源研究所股份有限公司 半導體裝置及半導體裝置的製造方法
US8956912B2 (en) 2012-01-26 2015-02-17 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
US9419146B2 (en) 2012-01-26 2016-08-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
US9196741B2 (en) 2012-02-03 2015-11-24 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US8916424B2 (en) 2012-02-07 2014-12-23 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
US9859114B2 (en) 2012-02-08 2018-01-02 Semiconductor Energy Laboratory Co., Ltd. Oxide semiconductor device with an oxygen-controlling insulating layer
US9112037B2 (en) 2012-02-09 2015-08-18 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US20130207111A1 (en) 2012-02-09 2013-08-15 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, display device including semiconductor device, electronic device including semiconductor device, and method for manufacturing semiconductor device
JP6108858B2 (ja) 2012-02-17 2017-04-05 株式会社半導体エネルギー研究所 p型半導体材料および半導体装置
KR101963226B1 (ko) * 2012-02-29 2019-04-01 삼성전자주식회사 트랜지스터와 그 제조방법 및 트랜지스터를 포함하는 전자소자
JP6075922B2 (ja) * 2012-02-29 2017-02-08 株式会社半導体エネルギー研究所 表示装置
JP6220526B2 (ja) 2012-02-29 2017-10-25 株式会社半導体エネルギー研究所 半導体装置の作製方法
JP2013183001A (ja) 2012-03-01 2013-09-12 Semiconductor Energy Lab Co Ltd 半導体装置
US9735280B2 (en) 2012-03-02 2017-08-15 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, method for manufacturing semiconductor device, and method for forming oxide film
US8754693B2 (en) 2012-03-05 2014-06-17 Semiconductor Energy Laboratory Co., Ltd. Latch circuit and semiconductor device
US9058892B2 (en) 2012-03-14 2015-06-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and shift register
JP6168795B2 (ja) 2012-03-14 2017-07-26 株式会社半導体エネルギー研究所 半導体装置の作製方法
US9349849B2 (en) 2012-03-28 2016-05-24 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and electronic device including the semiconductor device
US8941113B2 (en) 2012-03-30 2015-01-27 Semiconductor Energy Laboratory Co., Ltd. Semiconductor element, semiconductor device, and manufacturing method of semiconductor element
US8901556B2 (en) 2012-04-06 2014-12-02 Semiconductor Energy Laboratory Co., Ltd. Insulating film, method for manufacturing semiconductor device, and semiconductor device
JP6059566B2 (ja) 2012-04-13 2017-01-11 株式会社半導体エネルギー研究所 半導体装置の作製方法
JP6128906B2 (ja) 2012-04-13 2017-05-17 株式会社半導体エネルギー研究所 半導体装置
KR20230004930A (ko) 2012-04-13 2023-01-06 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
JP6143423B2 (ja) 2012-04-16 2017-06-07 株式会社半導体エネルギー研究所 半導体装置の製造方法
US9219164B2 (en) 2012-04-20 2015-12-22 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device with oxide semiconductor channel
CN102683424B (zh) * 2012-04-28 2013-08-07 京东方科技集团股份有限公司 显示装置、阵列基板、薄膜晶体管及其制作方法
US9048323B2 (en) 2012-04-30 2015-06-02 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
CN107403840B (zh) * 2012-05-10 2021-05-11 株式会社半导体能源研究所 半导体装置
WO2013168624A1 (en) 2012-05-10 2013-11-14 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
KR102082793B1 (ko) 2012-05-10 2020-02-28 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치 및 그 제작 방법
KR102087443B1 (ko) 2012-05-11 2020-03-10 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 구동 방법
JP6174899B2 (ja) 2012-05-11 2017-08-02 株式会社半導体エネルギー研究所 半導体装置
WO2013180040A1 (en) 2012-05-31 2013-12-05 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US8995607B2 (en) 2012-05-31 2015-03-31 Semiconductor Energy Laboratory Co., Ltd. Pulse signal output circuit and shift register
US8901557B2 (en) 2012-06-15 2014-12-02 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US9059219B2 (en) 2012-06-27 2015-06-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing semiconductor device
CN104395991B (zh) 2012-06-29 2017-06-20 株式会社半导体能源研究所 半导体装置
KR102161077B1 (ko) 2012-06-29 2020-09-29 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
US8873308B2 (en) 2012-06-29 2014-10-28 Semiconductor Energy Laboratory Co., Ltd. Signal processing circuit
DE112013003041T5 (de) 2012-06-29 2015-03-12 Semiconductor Energy Laboratory Co., Ltd. Halbleitervorrichtung
CN104685633B (zh) * 2012-07-03 2018-08-03 Imec 非营利协会 制作薄膜晶体管的方法
KR102099262B1 (ko) 2012-07-11 2020-04-09 가부시키가이샤 한도오따이 에네루기 켄큐쇼 액정 표시 장치, 및 액정 표시 장치의 구동 방법
JP2014032399A (ja) * 2012-07-13 2014-02-20 Semiconductor Energy Lab Co Ltd 液晶表示装置
JP6006558B2 (ja) 2012-07-17 2016-10-12 株式会社半導体エネルギー研究所 半導体装置及びその製造方法
KR102282866B1 (ko) 2012-07-20 2021-07-27 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치, 및 표시 장치를 포함하는 전자 장치
KR102644240B1 (ko) 2012-07-20 2024-03-07 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
JP2014042004A (ja) 2012-07-26 2014-03-06 Semiconductor Energy Lab Co Ltd 半導体装置及びその作製方法
JP6224931B2 (ja) 2012-07-27 2017-11-01 株式会社半導体エネルギー研究所 半導体装置
KR20150040873A (ko) 2012-08-03 2015-04-15 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
SG11201505225TA (en) 2012-08-03 2015-08-28 Semiconductor Energy Lab Oxide semiconductor stacked film and semiconductor device
TWI581404B (zh) 2012-08-10 2017-05-01 半導體能源研究所股份有限公司 半導體裝置以及該半導體裝置的驅動方法
US9929276B2 (en) 2012-08-10 2018-03-27 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
US8937307B2 (en) 2012-08-10 2015-01-20 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
KR102099261B1 (ko) 2012-08-10 2020-04-09 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
JP2014057296A (ja) 2012-08-10 2014-03-27 Semiconductor Energy Lab Co Ltd 半導体装置の駆動方法
JP2014057298A (ja) 2012-08-10 2014-03-27 Semiconductor Energy Lab Co Ltd 半導体装置の駆動方法
JP2014199899A (ja) 2012-08-10 2014-10-23 株式会社半導体エネルギー研究所 半導体装置
US9245958B2 (en) 2012-08-10 2016-01-26 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
KR102100290B1 (ko) * 2012-08-14 2020-05-27 삼성디스플레이 주식회사 박막 트랜지스터 및 그 제조 방법과 상기 박막 트랜지스터를 포함하는 표시 장치
KR20140026257A (ko) 2012-08-23 2014-03-05 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
KR102161078B1 (ko) 2012-08-28 2020-09-29 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치 및 그 제작 방법
US9625764B2 (en) 2012-08-28 2017-04-18 Semiconductor Energy Laboratory Co., Ltd. Display device and electronic device
KR20140029202A (ko) 2012-08-28 2014-03-10 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
DE102013216824B4 (de) 2012-08-28 2024-10-17 Semiconductor Energy Laboratory Co., Ltd. Halbleitervorrichtung
TWI611511B (zh) 2012-08-31 2018-01-11 半導體能源研究所股份有限公司 半導體裝置
US8981372B2 (en) 2012-09-13 2015-03-17 Semiconductor Energy Laboratory Co., Ltd. Display device and electronic appliance
CN104620390A (zh) 2012-09-13 2015-05-13 株式会社半导体能源研究所 半导体装置
US9018624B2 (en) 2012-09-13 2015-04-28 Semiconductor Energy Laboratory Co., Ltd. Display device and electronic appliance
KR102226090B1 (ko) 2012-10-12 2021-03-09 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치의 제작 방법 및 반도체 장치의 제조 장치
JP6021586B2 (ja) 2012-10-17 2016-11-09 株式会社半導体エネルギー研究所 半導体装置
JP5951442B2 (ja) 2012-10-17 2016-07-13 株式会社半導体エネルギー研究所 半導体装置
WO2014061535A1 (en) 2012-10-17 2014-04-24 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
KR102220279B1 (ko) 2012-10-19 2021-02-24 가부시키가이샤 한도오따이 에네루기 켄큐쇼 산화물 반도체막을 포함하는 다층막 및 반도체 장치의 제작 방법
KR102279459B1 (ko) 2012-10-24 2021-07-19 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
US9287411B2 (en) 2012-10-24 2016-03-15 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
TWI782259B (zh) 2012-10-24 2022-11-01 日商半導體能源研究所股份有限公司 半導體裝置及其製造方法
JP6219562B2 (ja) * 2012-10-30 2017-10-25 株式会社半導体エネルギー研究所 表示装置及び電子機器
JP6317059B2 (ja) 2012-11-16 2018-04-25 株式会社半導体エネルギー研究所 半導体装置及び表示装置
JP6285150B2 (ja) * 2012-11-16 2018-02-28 株式会社半導体エネルギー研究所 半導体装置
TWI600157B (zh) 2012-11-16 2017-09-21 半導體能源研究所股份有限公司 半導體裝置
KR102148549B1 (ko) 2012-11-28 2020-08-26 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
US9412764B2 (en) 2012-11-28 2016-08-09 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, display device, and electronic device
US9153649B2 (en) 2012-11-30 2015-10-06 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for evaluating semiconductor device
US9594281B2 (en) 2012-11-30 2017-03-14 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device
US9246011B2 (en) 2012-11-30 2016-01-26 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US9349593B2 (en) 2012-12-03 2016-05-24 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
KR102207028B1 (ko) 2012-12-03 2021-01-22 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
JP5995698B2 (ja) * 2012-12-06 2016-09-21 富士フイルム株式会社 薄膜トランジスタ及びその製造方法、結晶性酸化物半導体薄膜及びその製造方法、表示装置、並びにx線センサ
CN104885230B (zh) 2012-12-25 2018-02-23 株式会社半导体能源研究所 半导体装置
US9905585B2 (en) 2012-12-25 2018-02-27 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device comprising capacitor
KR102241249B1 (ko) 2012-12-25 2021-04-15 가부시키가이샤 한도오따이 에네루기 켄큐쇼 저항 소자, 표시 장치, 및 전자기기
KR101395906B1 (ko) * 2012-12-26 2014-05-19 중앙대학교 산학협력단 박막 트랜지스터 및 그 제조방법
CN104904018B (zh) 2012-12-28 2019-04-09 株式会社半导体能源研究所 半导体装置及半导体装置的制造方法
TWI607510B (zh) 2012-12-28 2017-12-01 半導體能源研究所股份有限公司 半導體裝置及半導體裝置的製造方法
US9391096B2 (en) 2013-01-18 2016-07-12 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
TWI614813B (zh) 2013-01-21 2018-02-11 半導體能源研究所股份有限公司 半導體裝置的製造方法
US8981374B2 (en) 2013-01-30 2015-03-17 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP2014154714A (ja) * 2013-02-08 2014-08-25 Nippon Hoso Kyokai <Nhk> 有機電界発光素子、表示装置および有機電界発光素子の製造方法
TWI618252B (zh) 2013-02-12 2018-03-11 半導體能源研究所股份有限公司 半導體裝置
TWI611567B (zh) 2013-02-27 2018-01-11 半導體能源研究所股份有限公司 半導體裝置、驅動電路及顯示裝置
KR102153110B1 (ko) 2013-03-06 2020-09-07 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체막 및 반도체 장치
US9269315B2 (en) 2013-03-08 2016-02-23 Semiconductor Energy Laboratory Co., Ltd. Driving method of semiconductor device
JP6355374B2 (ja) 2013-03-22 2018-07-11 株式会社半導体エネルギー研究所 半導体装置の作製方法
US10347769B2 (en) 2013-03-25 2019-07-09 Semiconductor Energy Laboratory Co., Ltd. Thin film transistor with multi-layer source/drain electrodes
JP6376788B2 (ja) 2013-03-26 2018-08-22 株式会社半導体エネルギー研究所 半導体装置およびその作製方法
JP6395409B2 (ja) 2013-03-27 2018-09-26 株式会社半導体エネルギー研究所 半導体装置およびその作製方法
JP6211287B2 (ja) * 2013-04-04 2017-10-11 株式会社半導体エネルギー研究所 半導体装置の作製方法
JP6224338B2 (ja) 2013-04-11 2017-11-01 株式会社半導体エネルギー研究所 半導体装置、表示装置及び半導体装置の作製方法
JP6198434B2 (ja) 2013-04-11 2017-09-20 株式会社半導体エネルギー研究所 表示装置及び電子機器
US10304859B2 (en) 2013-04-12 2019-05-28 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device having an oxide film on an oxide semiconductor film
US9915848B2 (en) 2013-04-19 2018-03-13 Semiconductor Energy Laboratory Co., Ltd. Display device and electronic device
US9893192B2 (en) 2013-04-24 2018-02-13 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP6401483B2 (ja) 2013-04-26 2018-10-10 株式会社半導体エネルギー研究所 半導体装置の作製方法
TWI631711B (zh) 2013-05-01 2018-08-01 半導體能源研究所股份有限公司 半導體裝置
US9231002B2 (en) 2013-05-03 2016-01-05 Semiconductor Energy Laboratory Co., Ltd. Display device and electronic device
US9704894B2 (en) 2013-05-10 2017-07-11 Semiconductor Energy Laboratory Co., Ltd. Display device including pixel electrode including oxide
US9647125B2 (en) 2013-05-20 2017-05-09 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
SG10201601511RA (en) 2013-05-20 2016-03-30 Semiconductor Energy Lab Semiconductor device
TWI664731B (zh) 2013-05-20 2019-07-01 半導體能源研究所股份有限公司 半導體裝置
US9343579B2 (en) 2013-05-20 2016-05-17 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
WO2014192210A1 (ja) * 2013-05-29 2014-12-04 パナソニック株式会社 薄膜トランジスタ装置とその製造方法、および表示装置
TWI624936B (zh) 2013-06-05 2018-05-21 半導體能源研究所股份有限公司 顯示裝置
JP6374221B2 (ja) 2013-06-05 2018-08-15 株式会社半導体エネルギー研究所 半導体装置
TWI649606B (zh) 2013-06-05 2019-02-01 日商半導體能源研究所股份有限公司 顯示裝置及電子裝置
US9773915B2 (en) 2013-06-11 2017-09-26 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
JP6018607B2 (ja) 2013-07-12 2016-11-02 株式会社半導体エネルギー研究所 半導体装置
JP2015036797A (ja) 2013-08-15 2015-02-23 ソニー株式会社 表示装置および電子機器
JP6329843B2 (ja) 2013-08-19 2018-05-23 株式会社半導体エネルギー研究所 半導体装置
KR102232133B1 (ko) 2013-08-22 2021-03-24 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
US9443987B2 (en) 2013-08-23 2016-09-13 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
TWI741298B (zh) 2013-10-10 2021-10-01 日商半導體能源研究所股份有限公司 半導體裝置
WO2015060133A1 (en) 2013-10-22 2015-04-30 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US9276128B2 (en) 2013-10-22 2016-03-01 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, method for manufacturing the same, and etchant used for the same
DE102014220672A1 (de) 2013-10-22 2015-05-07 Semiconductor Energy Laboratory Co., Ltd. Halbleitervorrichtung
JP2015179247A (ja) * 2013-10-22 2015-10-08 株式会社半導体エネルギー研究所 表示装置
US9583516B2 (en) 2013-10-25 2017-02-28 Semiconductor Energy Laboratory Co., Ltd. Display device
JP6440457B2 (ja) 2013-11-07 2018-12-19 株式会社半導体エネルギー研究所 半導体装置
WO2015079360A1 (en) 2013-11-29 2015-06-04 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, method for manufacturing the same, and display device
US20150155313A1 (en) 2013-11-29 2015-06-04 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US9882014B2 (en) 2013-11-29 2018-01-30 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
JP2016001712A (ja) 2013-11-29 2016-01-07 株式会社半導体エネルギー研究所 半導体装置の作製方法
WO2015083034A1 (en) 2013-12-02 2015-06-11 Semiconductor Energy Laboratory Co., Ltd. Display device
US9601634B2 (en) 2013-12-02 2017-03-21 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US9991392B2 (en) 2013-12-03 2018-06-05 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
JP2016027597A (ja) * 2013-12-06 2016-02-18 株式会社半導体エネルギー研究所 半導体装置
US9349751B2 (en) 2013-12-12 2016-05-24 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
TWI642186B (zh) 2013-12-18 2018-11-21 日商半導體能源研究所股份有限公司 半導體裝置
US9379192B2 (en) 2013-12-20 2016-06-28 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP6444714B2 (ja) 2013-12-20 2018-12-26 株式会社半導体エネルギー研究所 半導体装置の作製方法
KR102283814B1 (ko) 2013-12-25 2021-07-29 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
JP6402017B2 (ja) 2013-12-26 2018-10-10 株式会社半導体エネルギー研究所 半導体装置
KR20160101904A (ko) 2013-12-26 2016-08-26 아사히 가라스 가부시키가이샤 반도체 장치 및 반도체 장치의 제조 방법
KR102472875B1 (ko) 2013-12-26 2022-12-02 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR102529174B1 (ko) 2013-12-27 2023-05-08 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
WO2015156891A2 (en) 2014-01-23 2015-10-15 Arizona Board Of Regents, Acting For And On Behalf Of Arizona State University Method of providing a flexible semiconductor device and flexible semiconductor device thereof
US10381224B2 (en) 2014-01-23 2019-08-13 Arizona Board Of Regents On Behalf Of Arizona State University Method of providing an electronic device and electronic device thereof
WO2017034644A2 (en) 2015-06-09 2017-03-02 ARIZONA BOARD OF REGENTS a body corporate for THE STATE OF ARIZONA for and on behalf of ARIZONA STATE UNIVERSITY Method of providing an electronic device and electronic device thereof
KR102306200B1 (ko) 2014-01-24 2021-09-30 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
WO2015114476A1 (en) 2014-01-28 2015-08-06 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
KR102325158B1 (ko) 2014-01-30 2021-11-10 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 전자 기기, 및 반도체 장치의 제작 방법
US9929279B2 (en) 2014-02-05 2018-03-27 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
TWI702187B (zh) 2014-02-21 2020-08-21 日商半導體能源研究所股份有限公司 半導體膜、電晶體、半導體裝置、顯示裝置以及電子裝置
US10325937B2 (en) 2014-02-24 2019-06-18 Lg Display Co., Ltd. Thin film transistor substrate with intermediate insulating layer and display using the same
US10985196B2 (en) 2014-02-24 2021-04-20 Lg Display Co., Ltd. Thin film transistor substrate with intermediate insulating layer and display using the same
US10096489B2 (en) 2014-03-06 2018-10-09 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
JP6545976B2 (ja) 2014-03-07 2019-07-17 株式会社半導体エネルギー研究所 半導体装置
US9653611B2 (en) 2014-03-07 2017-05-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
KR102450562B1 (ko) 2014-03-13 2022-10-07 가부시키가이샤 한도오따이 에네루기 켄큐쇼 촬상 장치
KR102252213B1 (ko) 2014-03-14 2021-05-14 가부시키가이샤 한도오따이 에네루기 켄큐쇼 회로 시스템
JP2015176965A (ja) * 2014-03-14 2015-10-05 株式会社日本製鋼所 酸化物系材料の製造方法
JP2016027608A (ja) 2014-03-14 2016-02-18 株式会社半導体エネルギー研究所 半導体装置
WO2015140656A1 (en) 2014-03-18 2015-09-24 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
KR102400212B1 (ko) 2014-03-28 2022-05-23 가부시키가이샤 한도오따이 에네루기 켄큐쇼 트랜지스터 및 반도체 장치
JP6541398B2 (ja) 2014-04-11 2019-07-10 株式会社半導体エネルギー研究所 半導体装置
WO2015159179A1 (en) 2014-04-18 2015-10-22 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and electronic device
KR102380829B1 (ko) 2014-04-23 2022-03-31 가부시키가이샤 한도오따이 에네루기 켄큐쇼 촬상 장치
JP6486712B2 (ja) 2014-04-30 2019-03-20 株式会社半導体エネルギー研究所 酸化物半導体膜
US10043913B2 (en) 2014-04-30 2018-08-07 Semiconductor Energy Laboratory Co., Ltd. Semiconductor film, semiconductor device, display device, module, and electronic device
TWI686899B (zh) 2014-05-02 2020-03-01 日商半導體能源研究所股份有限公司 半導體裝置、觸控感測器、顯示裝置
JP6537341B2 (ja) 2014-05-07 2019-07-03 株式会社半導体エネルギー研究所 半導体装置
TWI695502B (zh) 2014-05-09 2020-06-01 日商半導體能源研究所股份有限公司 半導體裝置
EP3143641A4 (en) 2014-05-13 2018-01-17 Arizona Board of Regents, a Body Corporate of the State of Arizona acting for and on behalf of Arizona State University Method of providing an electronic device and electronic device thereof
TWI672804B (zh) 2014-05-23 2019-09-21 日商半導體能源研究所股份有限公司 半導體裝置的製造方法
US9874775B2 (en) 2014-05-28 2018-01-23 Semiconductor Energy Laboratory Co., Ltd. Liquid crystal display device and electronic device
TWI646658B (zh) 2014-05-30 2019-01-01 日商半導體能源研究所股份有限公司 半導體裝置
KR20170013240A (ko) 2014-05-30 2017-02-06 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 이를 제조하기 위한 방법
KR20250019744A (ko) 2014-05-30 2025-02-10 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 발광 장치
US9881954B2 (en) 2014-06-11 2018-01-30 Semiconductor Energy Laboratory Co., Ltd. Imaging device
WO2015189731A1 (en) 2014-06-13 2015-12-17 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and electronic device including the semiconductor device
KR20150146409A (ko) 2014-06-20 2015-12-31 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 표시 장치, 입출력 장치, 및 전자 기기
US9722090B2 (en) 2014-06-23 2017-08-01 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device including first gate oxide semiconductor film, and second gate
US9461179B2 (en) 2014-07-11 2016-10-04 Semiconductor Energy Laboratory Co., Ltd. Thin film transistor device (TFT) comprising stacked oxide semiconductor layers and having a surrounded channel structure
US10147747B2 (en) 2014-08-21 2018-12-04 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, manufacturing method thereof, and electronic device
US10559667B2 (en) 2014-08-25 2020-02-11 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for measuring current of semiconductor device
US9766517B2 (en) 2014-09-05 2017-09-19 Semiconductor Energy Laboratory Co., Ltd. Display device and display module
WO2016046685A1 (en) 2014-09-26 2016-03-31 Semiconductor Energy Laboratory Co., Ltd. Imaging device
US9450581B2 (en) 2014-09-30 2016-09-20 Semiconductor Energy Laboratory Co., Ltd. Logic circuit, semiconductor device, electronic component, and electronic device
JP6392061B2 (ja) * 2014-10-01 2018-09-19 東京エレクトロン株式会社 電子デバイス、その製造方法、及びその製造装置
JP6570417B2 (ja) 2014-10-24 2019-09-04 株式会社半導体エネルギー研究所 撮像装置および電子機器
WO2016067144A1 (en) 2014-10-28 2016-05-06 Semiconductor Energy Laboratory Co., Ltd. Display device, manufacturing method of display device, and electronic device
CN107111972B (zh) 2014-10-28 2020-04-28 株式会社半导体能源研究所 功能面板、功能面板的制造方法、模块、数据处理装置
US9761730B2 (en) 2014-10-29 2017-09-12 Semiconductor Energy Laboratory Co., Ltd. Imaging device and electronic device
TWI711165B (zh) 2014-11-21 2020-11-21 日商半導體能源研究所股份有限公司 半導體裝置及電子裝置
KR102456654B1 (ko) 2014-11-26 2022-10-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치 및 전자 기기
JP6647841B2 (ja) 2014-12-01 2020-02-14 株式会社半導体エネルギー研究所 酸化物の作製方法
US9773832B2 (en) 2014-12-10 2017-09-26 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and electronic device
US9741742B2 (en) 2014-12-22 2017-08-22 Arizona Board Of Regents, A Body Corporate Of The State Of Arizona, Acting For And On Behalf Of Arizona State University Deformable electronic device and methods of providing and using deformable electronic device
US10446582B2 (en) 2014-12-22 2019-10-15 Arizona Board Of Regents On Behalf Of Arizona State University Method of providing an imaging system and imaging system thereof
JP5859632B2 (ja) * 2014-12-22 2016-02-10 株式会社半導体エネルギー研究所 表示装置
US10522693B2 (en) 2015-01-16 2019-12-31 Semiconductor Energy Laboratory Co., Ltd. Memory device and electronic device
US9647132B2 (en) 2015-01-30 2017-05-09 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and memory device
TWI792065B (zh) 2015-01-30 2023-02-11 日商半導體能源研究所股份有限公司 成像裝置及電子裝置
TWI732383B (zh) 2015-02-06 2021-07-01 日商半導體能源研究所股份有限公司 裝置及其製造方法以及電子裝置
CN112768511A (zh) 2015-02-06 2021-05-07 株式会社半导体能源研究所 半导体装置及其制造方法
US9685560B2 (en) 2015-03-02 2017-06-20 Semiconductor Energy Laboratory Co., Ltd. Transistor, method for manufacturing transistor, semiconductor device, and electronic device
WO2016139828A1 (ja) * 2015-03-03 2016-09-09 株式会社 東芝 半導体装置
TWI686870B (zh) 2015-03-03 2020-03-01 日商半導體能源研究所股份有限公司 半導體裝置、顯示裝置及使用該顯示裝置之電子裝置
JP6765199B2 (ja) 2015-03-17 2020-10-07 株式会社半導体エネルギー研究所 タッチパネル
CN107430461B (zh) 2015-03-17 2022-01-28 株式会社半导体能源研究所 触摸屏
JP6662665B2 (ja) 2015-03-19 2020-03-11 株式会社半導体エネルギー研究所 液晶表示装置及び該液晶表示装置を用いた電子機器
US9634048B2 (en) 2015-03-24 2017-04-25 Semiconductor Energy Laboratory Co., Ltd. Imaging device and electronic device
US10429704B2 (en) 2015-03-26 2019-10-01 Semiconductor Energy Laboratory Co., Ltd. Display device, display module including the display device, and electronic device including the display device or the display module
TWI723984B (zh) 2015-03-27 2021-04-11 日商半導體能源研究所股份有限公司 觸控面板
US9716852B2 (en) 2015-04-03 2017-07-25 Semiconductor Energy Laboratory Co., Ltd. Broadcast system
US9685476B2 (en) 2015-04-03 2017-06-20 Semiconductor Energy Laboratory Co., Ltd. Imaging device and electronic device
US10389961B2 (en) 2015-04-09 2019-08-20 Semiconductor Energy Laboratory Co., Ltd. Imaging device and electronic device
US10372274B2 (en) 2015-04-13 2019-08-06 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and touch panel
US9848146B2 (en) 2015-04-23 2017-12-19 Semiconductor Energy Laboratory Co., Ltd. Imaging device and electronic device
DE102016206922A1 (de) 2015-05-08 2016-11-10 Semiconductor Energy Laboratory Co., Ltd. Touchscreen
US9912897B2 (en) 2015-05-11 2018-03-06 Semiconductor Energy Laboratory Co., Ltd. Imaging device and electronic device
US10684500B2 (en) 2015-05-27 2020-06-16 Semiconductor Energy Laboratory Co., Ltd. Touch panel
US10139663B2 (en) 2015-05-29 2018-11-27 Semiconductor Energy Laboratory Co., Ltd. Input/output device and electronic device
KR102553553B1 (ko) 2015-06-12 2023-07-10 가부시키가이샤 한도오따이 에네루기 켄큐쇼 촬상 장치, 및 그 동작 방법 및 전자 기기
KR102619052B1 (ko) 2015-06-15 2023-12-29 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
WO2017006419A1 (ja) * 2015-07-06 2017-01-12 堺ディスプレイプロダクト株式会社 表示装置
TWI738569B (zh) 2015-07-07 2021-09-01 日商半導體能源研究所股份有限公司 成像裝置及其運作方法
US9887218B2 (en) 2015-07-16 2018-02-06 Semiconductor Energy Laboratory Co., Ltd. Imaging device, operating method thereof, and electronic device
US9876946B2 (en) 2015-08-03 2018-01-23 Semiconductor Energy Laboratory Co., Ltd. Imaging device and electronic device
US10373991B2 (en) 2015-08-19 2019-08-06 Semiconductor Energy Laboratory Co., Ltd. Imaging device, operating method thereof, and electronic device
US10090344B2 (en) 2015-09-07 2018-10-02 Semiconductor Energy Laboratory Co., Ltd. Imaging device, method for operating the same, module, and electronic device
WO2017042658A1 (en) 2015-09-10 2017-03-16 Semiconductor Energy Laboratory Co., Ltd. Imaging device, module, electronic device, and method of operating the imaging device
US10896923B2 (en) 2015-09-18 2021-01-19 Semiconductor Energy Laboratory Co., Ltd. Method of operating an imaging device with global shutter system
JP2017063420A (ja) 2015-09-25 2017-03-30 株式会社半導体エネルギー研究所 半導体装置
KR20180063084A (ko) 2015-09-30 2018-06-11 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 전자 기기
US10109667B2 (en) 2015-10-09 2018-10-23 Semiconductor Energy Laboratory Co., Ltd. Imaging device, module, and electronic device
JP6864456B2 (ja) 2015-10-15 2021-04-28 株式会社半導体エネルギー研究所 半導体装置
JP6917700B2 (ja) 2015-12-02 2021-08-11 株式会社半導体エネルギー研究所 半導体装置
US20170168333A1 (en) 2015-12-11 2017-06-15 Semiconductor Energy Laboratory Co., Ltd. Display device and separation method
JP6907512B2 (ja) * 2015-12-15 2021-07-21 株式会社リコー 電界効果型トランジスタの製造方法
CN106887436B (zh) * 2015-12-16 2019-10-25 鸿富锦精密工业(深圳)有限公司 薄膜晶体管阵列基板及其制备方法
US10114263B2 (en) 2015-12-18 2018-10-30 Semiconductor Energy Laboratory Co., Ltd. Display device
US10020336B2 (en) 2015-12-28 2018-07-10 Semiconductor Energy Laboratory Co., Ltd. Imaging device and electronic device using three dimentional (3D) integration
KR102617041B1 (ko) 2015-12-28 2023-12-26 가부시키가이샤 한도오따이 에네루기 켄큐쇼 장치, 텔레비전 시스템, 및 전자 기기
US9806179B2 (en) * 2016-01-14 2017-10-31 Hon Hai Precision Industry Co., Ltd. Method for fabricating conducting structure and thin film transistor array panel
US10027896B2 (en) 2016-01-15 2018-07-17 Semiconductor Energy Laboratory Co., Ltd. Image display system, operation method of the same, and electronic device
JP6676990B2 (ja) * 2016-02-01 2020-04-08 株式会社リコー 電界効果型トランジスタの製造方法
US9947700B2 (en) 2016-02-03 2018-04-17 Semiconductor Energy Laboratory Co., Ltd. Imaging device and electronic device
US10115741B2 (en) 2016-02-05 2018-10-30 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and electronic device
KR20170096956A (ko) 2016-02-17 2017-08-25 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 전자 기기
US10347681B2 (en) 2016-02-19 2019-07-09 Semiconductor Energy Laboratory Co., Ltd. Imaging device
US10573621B2 (en) 2016-02-25 2020-02-25 Semiconductor Energy Laboratory Co., Ltd. Imaging system and manufacturing apparatus
US10263114B2 (en) 2016-03-04 2019-04-16 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, method for manufacturing the same, or display device including the same
US9882064B2 (en) 2016-03-10 2018-01-30 Semiconductor Energy Laboratory Co., Ltd. Transistor and electronic device
US10014325B2 (en) 2016-03-10 2018-07-03 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and electronic device
KR20170106200A (ko) 2016-03-11 2017-09-20 가부시키가이샤 한도오따이 에네루기 켄큐쇼 입출력 패널, 입출력 장치
WO2017158464A1 (en) 2016-03-15 2017-09-21 Semiconductor Energy Laboratory Co., Ltd. Display device, module, and electronic device
US10333004B2 (en) 2016-03-18 2019-06-25 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, semiconductor wafer, module and electronic device
US10096720B2 (en) 2016-03-25 2018-10-09 Semiconductor Energy Laboratory Co., Ltd. Transistor, semiconductor device, and electronic device
JP6863803B2 (ja) 2016-04-07 2021-04-21 株式会社半導体エネルギー研究所 表示装置
WO2017175095A1 (en) 2016-04-08 2017-10-12 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
US10032918B2 (en) 2016-04-22 2018-07-24 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
JP6968567B2 (ja) 2016-04-22 2021-11-17 株式会社半導体エネルギー研究所 半導体装置の作製方法
US10008502B2 (en) 2016-05-04 2018-06-26 Semiconductor Energy Laboratory Co., Ltd. Memory device
JP2017203983A (ja) * 2016-05-06 2017-11-16 株式会社半導体エネルギー研究所 半導体装置、システム、及び動作方法
JP7109887B2 (ja) 2016-05-20 2022-08-01 株式会社半導体エネルギー研究所 表示システム
US10078243B2 (en) 2016-06-03 2018-09-18 Semiconductor Energy Laboratory Co., Ltd. Display device
TWI712029B (zh) 2016-06-17 2020-12-01 日商半導體能源研究所股份有限公司 顯示裝置,及顯示裝置的驅動方法
KR102330605B1 (ko) 2016-06-22 2021-11-24 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
JP2016174186A (ja) * 2016-06-27 2016-09-29 株式会社半導体エネルギー研究所 半導体装置の作製方法
TWI709952B (zh) 2016-07-01 2020-11-11 日商半導體能源研究所股份有限公司 電子裝置、電子裝置的驅動方法
TWI737665B (zh) 2016-07-01 2021-09-01 日商半導體能源硏究所股份有限公司 半導體裝置以及半導體裝置的製造方法
TWI720097B (zh) 2016-07-11 2021-03-01 日商半導體能源硏究所股份有限公司 濺射靶材及濺射靶材的製造方法
KR20190032414A (ko) 2016-07-26 2019-03-27 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR102446134B1 (ko) 2016-07-29 2022-09-21 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 표시 시스템, 및 전자 기기
DE112017003898B4 (de) 2016-08-03 2024-07-18 Semiconductor Energy Laboratory Co., Ltd. Abbildungsvorrichtungen und Bildsensor
KR20180016271A (ko) 2016-08-05 2018-02-14 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
US10678078B2 (en) 2016-08-05 2020-06-09 Semiconductor Energy Laboratory Co., Ltd. Display device and method for manufacturing the display device
US10141544B2 (en) 2016-08-10 2018-11-27 Semiconductor Energy Laboratory Co., Ltd. Electroluminescent display device and manufacturing method thereof
KR102393565B1 (ko) 2016-08-17 2022-05-04 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
JP2018032018A (ja) 2016-08-17 2018-03-01 株式会社半導体エネルギー研究所 半導体装置、表示モジュール及び電子機器
TWI718330B (zh) 2016-08-24 2021-02-11 日商半導體能源硏究所股份有限公司 半導體裝置及其製造方法
WO2018042285A1 (en) 2016-08-30 2018-03-08 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, display device, and electronic device
US9978879B2 (en) 2016-08-31 2018-05-22 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
WO2018051208A1 (en) 2016-09-14 2018-03-22 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method of the same
KR102372150B1 (ko) 2016-09-30 2022-03-07 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 시스템 및 전자 기기
KR20180037105A (ko) 2016-10-03 2018-04-11 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치, 표시 모듈, 및 표시 장치의 제작 방법
US10411003B2 (en) 2016-10-14 2019-09-10 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
WO2018073689A1 (en) 2016-10-21 2018-04-26 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
KR20180048327A (ko) 2016-11-01 2018-05-10 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 및 반도체 장치의 제작 방법
KR102490188B1 (ko) 2016-11-09 2023-01-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치, 표시 모듈, 전자 기기, 및 표시 장치의 제작 방법
DE112017005659T5 (de) 2016-11-10 2019-08-22 Semiconductor Energy Laboratory Co., Ltd. Anzeigevorrichtung und Betriebsverfahren der Anzeigevorrichtung
US10790318B2 (en) 2016-11-22 2020-09-29 Semiconductor Energy Laboratory Co., Ltd. Display device, method for manufacturing the same, and electronic device
JP7050460B2 (ja) 2016-11-22 2022-04-08 株式会社半導体エネルギー研究所 表示装置
US20180145096A1 (en) 2016-11-23 2018-05-24 Semiconductor Energy Laboratory Co., Ltd. Display device and electronic device
WO2018096425A1 (ja) 2016-11-23 2018-05-31 株式会社半導体エネルギー研究所 表示装置、表示モジュール、及び電子機器
US10756118B2 (en) 2016-11-30 2020-08-25 Semiconductor Energy Laboratory Co., Ltd. Display device, display module, and electronic device
WO2018104824A1 (en) 2016-12-07 2018-06-14 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, display system, and electronic device
US10147681B2 (en) 2016-12-09 2018-12-04 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
JP2018098313A (ja) * 2016-12-12 2018-06-21 株式会社ブイ・テクノロジー 酸化物半導体装置の製造方法
US10319743B2 (en) 2016-12-16 2019-06-11 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, display system, and electronic device
CN108307131B (zh) 2016-12-27 2021-08-03 株式会社半导体能源研究所 摄像装置及电子设备
CN110100203B (zh) 2017-01-11 2023-04-21 株式会社半导体能源研究所 显示装置
DE112018000392T5 (de) 2017-01-16 2019-09-26 Semiconductor Energy Laboratory Co., Ltd. Halbleitervorrichtung
CN110178170B (zh) 2017-01-16 2021-12-07 株式会社半导体能源研究所 显示装置
TWI748035B (zh) 2017-01-20 2021-12-01 日商半導體能源硏究所股份有限公司 顯示系統及電子裝置
KR20190104394A (ko) 2017-01-24 2019-09-09 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치 및 전자 기기
WO2018138619A1 (en) 2017-01-30 2018-08-02 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US10608017B2 (en) 2017-01-31 2020-03-31 Semiconductor Energy Laboratory Co., Ltd. Display device, display module, and electronic device
US10504470B2 (en) 2017-02-07 2019-12-10 Semiconductor Energy Laboratory Co., Ltd. Driving method of display device
CN110402497B (zh) 2017-03-29 2024-08-06 株式会社半导体能源研究所 半导体装置、半导体装置的制造方法
JP6498715B2 (ja) * 2017-04-05 2019-04-10 三星ディスプレイ株式會社Samsung Display Co.,Ltd. 表示装置
DE112018002191T5 (de) 2017-04-28 2020-01-09 Semiconductor Energy Laboratory Co., Ltd. Halbleitervorrichtung und Herstellungsverfahren der Halbleitervorrichtung
KR102674906B1 (ko) 2017-06-27 2024-06-12 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 시스템 및 데이터 처리 방법
WO2019003045A1 (ja) 2017-06-27 2019-01-03 株式会社半導体エネルギー研究所 記憶装置
WO2019021098A1 (en) 2017-07-26 2019-01-31 Semiconductor Energy Laboratory Co., Ltd. SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
KR102472837B1 (ko) 2017-08-11 2022-11-30 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치 및 전자 기기
US11296231B2 (en) 2017-08-25 2022-04-05 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing semiconductor device
EP3676822A4 (en) 2017-08-31 2021-08-04 Semiconductor Energy Laboratory Co., Ltd. DISPLAY DEVICE AND ELECTRONIC DEVICE
JP7146778B2 (ja) 2017-09-05 2022-10-04 株式会社半導体エネルギー研究所 表示システム
KR20230170155A (ko) 2017-09-15 2023-12-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치 및 전자 기기
KR102597945B1 (ko) 2017-09-15 2023-11-02 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
JP2019066517A (ja) * 2017-09-28 2019-04-25 株式会社ジャパンディスプレイ 表示装置
WO2019087023A1 (ja) 2017-11-02 2019-05-09 株式会社半導体エネルギー研究所 表示装置および電子機器
CN115359757B (zh) 2017-11-09 2025-05-27 株式会社半导体能源研究所 显示装置及其工作方法以及电子设备
CN111448608B (zh) 2017-12-22 2025-07-08 株式会社半导体能源研究所 显示装置及电子设备
CN111542780B (zh) 2018-01-05 2023-11-21 株式会社半导体能源研究所 显示装置、显示模块及电子设备
JP7267212B2 (ja) 2018-02-09 2023-05-01 株式会社半導体エネルギー研究所 液晶表示装置
WO2019193454A1 (ja) 2018-04-06 2019-10-10 株式会社半導体エネルギー研究所 表示装置、表示装置の動作方法および電子機器
KR20240091114A (ko) 2018-04-26 2024-06-21 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치 및 전자 기기
US12118333B2 (en) 2018-04-26 2024-10-15 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
KR20210009326A (ko) 2018-05-17 2021-01-26 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
WO2019224655A1 (ja) 2018-05-25 2019-11-28 株式会社半導体エネルギー研究所 表示装置および電子機器
WO2019234543A1 (ja) 2018-06-06 2019-12-12 株式会社半導体エネルギー研究所 表示装置、表示モジュール、及び電子機器
US11521569B2 (en) 2018-07-05 2022-12-06 Semiconductor Energy Laboratory Co., Ltd. Display apparatus and electronic device
KR20250069696A (ko) 2018-08-21 2025-05-19 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치 및 전자 기기
WO2020058798A1 (ja) 2018-09-21 2020-03-26 株式会社半導体エネルギー研究所 表示装置および電子機器
US12278223B2 (en) 2018-09-28 2025-04-15 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing display device and display device manufacturing apparatus
CN112970053A (zh) 2018-11-02 2021-06-15 株式会社半导体能源研究所 显示装置、显示模块及电子设备
JP7441176B2 (ja) 2018-11-09 2024-02-29 株式会社半導体エネルギー研究所 表示装置および電子機器
JP6715312B2 (ja) * 2018-12-04 2020-07-01 三星ディスプレイ株式會社Samsung Display Co.,Ltd. 表示装置
WO2020128721A1 (ja) 2018-12-19 2020-06-25 株式会社半導体エネルギー研究所 表示装置および電子機器
KR102019935B1 (ko) * 2018-12-21 2019-11-04 엘지디스플레이 주식회사 박막트랜지스터를 구비한 엑스레이 검출기
US11373610B2 (en) 2018-12-26 2022-06-28 Semiconductor Energy Laboratory Co., Ltd. Display apparatus including circuit and pixel
KR20210116657A (ko) 2019-02-05 2021-09-27 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치 및 전자 기기
KR101987800B1 (ko) * 2019-02-08 2019-10-01 삼성디스플레이 주식회사 박막 트랜지스터 표시판 및 박막 트랜지스터 표시판 제조 방법
WO2020229911A1 (ja) 2019-05-10 2020-11-19 株式会社半導体エネルギー研究所 表示装置および電子機器
JP7356815B2 (ja) * 2019-05-14 2023-10-05 トライベイル テクノロジーズ, エルエルシー 薄膜トランジスタ基板及び表示装置
CN113841253A (zh) * 2019-05-30 2021-12-24 株式会社半导体能源研究所 显示装置及电子设备
WO2020254914A1 (ja) 2019-06-21 2020-12-24 株式会社半導体エネルギー研究所 酸化物半導体を用いる記憶回路
US11711922B2 (en) 2019-07-12 2023-07-25 Semiconductor Energy Laboratory Co., Ltd. Memory device with memory cells comprising multiple transistors
WO2021033075A1 (ja) 2019-08-22 2021-02-25 株式会社半導体エネルギー研究所 メモリセルおよび記憶装置
US12132057B2 (en) 2019-09-09 2024-10-29 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device with transistors including oxide semiconductors and capacitor elements
US11210048B2 (en) 2019-10-04 2021-12-28 Semiconductor Energy Laboratory Co., Ltd. Display device, display module, and electronic device
JP7510431B2 (ja) 2019-10-11 2024-07-03 株式会社半導体エネルギー研究所 記憶装置
JP7682886B2 (ja) 2020-07-09 2025-05-26 株式会社半導体エネルギー研究所 表示装置
TW202211195A (zh) 2020-08-12 2022-03-16 日商半導體能源研究所股份有限公司 顯示裝置、其工作方法以及電子裝置
US12355019B2 (en) 2020-10-01 2025-07-08 Semiconductor Energy Laboratory Co., Ltd. Display apparatus and electronic device
US12009432B2 (en) 2021-03-05 2024-06-11 Semiconductor Energy Laboratory Co., Ltd. Transistor and display device
TW202320033A (zh) 2021-11-05 2023-05-16 日商半導體能源研究所股份有限公司 顯示裝置及電子裝置
WO2023094937A1 (ja) 2021-11-26 2023-06-01 株式会社半導体エネルギー研究所 表示装置および電子機器
TW202329259A (zh) 2021-12-16 2023-07-16 日商半導體能源研究所股份有限公司 顯示裝置及電子裝置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3402030B2 (ja) * 1995-11-10 2003-04-28 ソニー株式会社 薄膜半導体装置製造方法
JP4326604B2 (ja) * 1997-09-29 2009-09-09 株式会社半導体エネルギー研究所 半導体装置の作製方法
JP4164562B2 (ja) * 2002-09-11 2008-10-15 独立行政法人科学技術振興機構 ホモロガス薄膜を活性層として用いる透明薄膜電界効果型トランジスタ
WO2003098699A1 (fr) * 2002-05-22 2003-11-27 Sharp Kabushiki Kaisha Dispositif semiconducteur et afficheur comprenant ce dispositif
JP2004235180A (ja) * 2003-01-28 2004-08-19 Sanyo Electric Co Ltd 半導体装置及びその製造方法
JP4118706B2 (ja) * 2003-02-25 2008-07-16 株式会社半導体エネルギー研究所 液晶表示装置の作製方法
JP2004273732A (ja) * 2003-03-07 2004-09-30 Sharp Corp アクティブマトリクス基板およびその製造方法
JP2004311702A (ja) * 2003-04-07 2004-11-04 Sumitomo Heavy Ind Ltd 薄膜トランジスタの製造方法および薄膜トランジスタ
JP4108633B2 (ja) * 2003-06-20 2008-06-25 シャープ株式会社 薄膜トランジスタおよびその製造方法ならびに電子デバイス
US7642573B2 (en) * 2004-03-12 2010-01-05 Hewlett-Packard Development Company, L.P. Semiconductor device
CN101057333B (zh) * 2004-11-10 2011-11-16 佳能株式会社 发光器件

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101680047B1 (ko) 2009-10-14 2016-11-28 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
KR101515543B1 (ko) * 2013-08-12 2015-05-11 동의대학교 산학협력단 박막 트랜지스터 및 그 제조 방법

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