JP2010048829A - X線断層撮影検査システム - Google Patents
X線断層撮影検査システム Download PDFInfo
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- JP2010048829A JP2010048829A JP2009274526A JP2009274526A JP2010048829A JP 2010048829 A JP2010048829 A JP 2010048829A JP 2009274526 A JP2009274526 A JP 2009274526A JP 2009274526 A JP2009274526 A JP 2009274526A JP 2010048829 A JP2010048829 A JP 2010048829A
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Abstract
【解決手段】物品を検査するX線画像化検査システムは、撮像容積(16)の周りに延在し、放射されるX線が撮像容積を通過できるように配向された複数の点状放射源(14)を構成するX線放射源(10)を有する。X線検出器アレー(12)は同様に走査容積の周りに延在し、点状放射源からの撮像容積(16)を通過したX線を検出し、この検出されたX線に基づく出力信号を生成するように構成されている。コンベヤ(20)は撮像容積(16)を通過して物品が運ばれるように構成されている。
【選択図】図1
Description
nλ=2dsinθ
ここで、
nは整数、
λはX線の波長、
dは対象物内の原子間距離である。
8 走査部
10 多焦点X線放射源
11 放射源ユニット
12 X線検出器アレー
13 導電性金属製サプレッサ
14 点状放射源
15 エミッタ素子
16 走査領域
17 グリッドワイヤ
18 制御部
19 収束ワイヤ
20 コンベヤベルト
21 支持レール
22 X線散乱遮へい部
23 接続部材
24 鉛ゴム製のれん
25 電気的接続部材
26 物品
27 アノード
29 電気的接続部材
30 処理システム
32 電源
34 冷却ラック
40 仕分け装置
42 コンベヤ経路
44 コンベヤ経路
45 回線
46 制御線
47 画面
48 ワークステーション
49 使用者入力部
50 X線検出器
52 多重化ブロック
53 選択ブロック
54 逆投影加重処理エレメント
55 フォーマット処理ブロック
60 危険性検出プロセッサ
62 断層撮影画像データ
63 低レベルパラメータ抽出部
64 決定木
65 データベース検索部
70 RTT走査システム
72 RTT走査システム
74 コンベヤベルト
81b RTT走査装置
81c 中央ループ部
82 RTT走査システム
82b RTT走査装置
82c 各仕分け装置
83b RTT走査装置
83c 各仕分け装置
84 RTT走査システム
84b 仕分け装置
84c 各仕分け装置
85b 仕分け装置
85c RTT走査装置
86 第1の主搬入コンベヤ
86b 仕分け装置
86c RTT走査装置
87b 共通不合格経路コンベヤ
87c RTT走査装置
88 第1の仕分け装置
88b 共通合格経路コンベヤ
88c 共通搬出コンベヤ
89b 予備RTT走査装置
89c 仕分け装置
90 コンベヤ
90b 仕分け装置
92 コンベヤ
94 仕分け装置
96 仕分け装置
98 共通コンベヤ
100 コンベヤ
108 走査システム
109 リアルタイムディスクアレー
110 冗長ビデオ切換部
112 冗長イーサネット(登録商標)切換部
148 操作者用ワークステーション
160 コンベヤベルト
162 主散乱遮へい部
164 走査装置
208 走査ユニット
218 制御ラック
230 処理ラック
232 電源ラック
234 冷却ラック
300 X線ビーム
302 対象物
410 多焦点X線放射源
410a X線点状放射源
412 円状検出器アレー
420 コンベヤ
422 円筒状検出器アレー
422a 検出器
426 対象物
428 コリメータ
500 マルチチャンネルアナライザ
502 多重化処理部
504 参照テーブル
506 画像メモリ
508 メモリ領域
510 投影像シーケンス制御部
512 主RTTデータ取得システム
512a 検出器
512b 検出器
513 金属製フィルタ
602 ターゲット領域
604 ターゲット領域
606 母材
612 電極
614 電極
616 電子ビーム
710 検出器アレー
712 高解像度検出器アレー
714 線状アレー
716 線状アレー
718 検出器
750 積分器
750a 積分器
750b 積分器
752 増幅器
754 コンデンサ
756 入力スイッチ
758 リセットスイッチ
759 リセットスイッチ
760 マルチプレクシングスイッチ
760a 出力スイッチ
760b 出力スイッチ
812 高解像度アレー
818 検出器
Claims (15)
- 走査装置と処理手段を有するX線走査システムであって、前記走査装置は、2つの異なるエネルギースペクトルのX線を発生させるように構成された互いに異なる物質の2つのターゲット領域を備えたX線放射源と、各ターゲット領域からの前記X線を検出して2つの各走査装置出力を生成するように構成された検出器とを有し、前記走査装置は対象物の複数の領域を走査するように構成され、前記処理手段は前記検出器からの信号を処理して、複数の断層撮影画像データのセットを生成し、前記データのセットを合成して前記対象物の3次元画像を生成するように構成され、前記処理手段は前記2つの走査装置出力を合成して前記画像データのセットを生成するように構成されていることを特徴とするX線走査システム。
- 前記検出器はそれぞれのターゲット領域からのX線を検出するように構成された共通の検出器アレーによって構成されることを特徴とする請求項1に記載のX線走査システム。
- 前記検出器は2つの検出器アレーにより構成され、一方の検出器アレーは一方のターゲット領域からのX線を検出し他方の検出器アレーは他方のターゲット領域からのX線を検出することを特徴とする請求項1に記載のX線照射システム。
- 前記検出器や検出器アレーは円状検出器アレーであることを特徴とする請求項1乃至3のいずれか一に記載のX線照射システム。
- 前記ターゲット領域は円状のアレーを形成することを特徴とする請求項1乃至4のいずれか一に記載のX線照射システム。
- 前記ターゲット領域はアノードに沿って延在する平行な帯状のものとして形成される別々のターゲット領域であることを特徴とする請求項1乃至5のいずれか一に記載のX線照射システム。
- 前記X線放射源は独立して動作可能な複数の点状放射源を有する電子源を更に備えることを特徴とする請求項1乃至6のいずれか一に記載のX線照射システム。
- 前記電子源は電子ビームを発生させ、前記X線放射源は、電子ビームの軌道を挟んで対向して設けられる一対の電極を更に有し、制御により電界のオン・オフを行い電子ビームの軌道を制御して、ターゲット領域の一方または他方のいずれかに当たるように構成されていることを特徴とする請求項7に記載のX線照射システム。
- 前記検出器は走査体積の周りに延在し、前記放射源により前記X線は前記走査容積を通過することを特徴とする請求項1乃至9のいずれか一に記載のX線照射システム。
- 前記走査容積を通過して物品が運ばれるように構成されたコンベヤを更に備えることを特徴とする請求項9に記載のX線照射システム。
- 前記走査容積の複数の部分におけるX線の減衰レベルを示す減衰データを前記検出器出力信号から生成するように構成された処理手段を更に有する請求項1乃至10のいずれか一記載のシステム。
- 前記減衰データは走査された物品の画像を生成するのに適した画像データ形式であることを特徴とする請求項11に記載のシステム。
- 前記画像データは3次元断層撮影画像を生成するのに適していることを特徴とする請求項12に記載のシステム。
- 前記画像データから得られる画像を表示するように構成された表示手段を更に有することを特徴とする請求項12または13に記載のシステム。
- 前記減衰データを解析し、前記減衰データのパラメータに基づく出力信号を生成するように構成された解析手段を有することを特徴とする請求項11乃至14のいずれか一に記載のシステム。
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