JPS57175247A - Radiation void factor meter - Google Patents

Radiation void factor meter

Info

Publication number
JPS57175247A
JPS57175247A JP56060601A JP6060181A JPS57175247A JP S57175247 A JPS57175247 A JP S57175247A JP 56060601 A JP56060601 A JP 56060601A JP 6060181 A JP6060181 A JP 6060181A JP S57175247 A JPS57175247 A JP S57175247A
Authority
JP
Japan
Prior art keywords
radiation beam
void factor
ray radiation
factor
constitution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP56060601A
Other languages
Japanese (ja)
Other versions
JPS6352697B2 (en
Inventor
Sunao Narabayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Tokyo Shibaura Electric Co Ltd filed Critical Toshiba Corp
Priority to JP56060601A priority Critical patent/JPS57175247A/en
Publication of JPS57175247A publication Critical patent/JPS57175247A/en
Publication of JPS6352697B2 publication Critical patent/JPS6352697B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/12—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a flowing fluid or a flowing granular solid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Toxicology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To measure the void factor of a double layer current in a quick and accurate way, by carrying out a radiation beam scan via plural slits provided on a rotary disk. CONSTITUTION:A cylindrical measuring part 1 of a pipe in which a double phase current of a vapor phase like the high temperature and high pressure steam of a reactor, a boiler, etc. and a liquid phase like water, etc. is irradiated by an X-ray radiation beam given from a radiation source 2. The X-ray radiation beam corresponding to the void factor corresponding to the ratio between the vapor phase the liquid phase is detected by a radiation detector 3 through a number of slits 10 on a disk 9 which turns in a constant speed. In such constitution, the section of the part 1 is scanned by the X-ray radiation beam from the lower part to the part. Thus a local factor distribution is measured in a quick and accurate way. As a result, the section mean void factor can be assuredly decided even in the high-speed transient mode.
JP56060601A 1981-04-23 1981-04-23 Radiation void factor meter Granted JPS57175247A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56060601A JPS57175247A (en) 1981-04-23 1981-04-23 Radiation void factor meter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56060601A JPS57175247A (en) 1981-04-23 1981-04-23 Radiation void factor meter

Publications (2)

Publication Number Publication Date
JPS57175247A true JPS57175247A (en) 1982-10-28
JPS6352697B2 JPS6352697B2 (en) 1988-10-19

Family

ID=13146922

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56060601A Granted JPS57175247A (en) 1981-04-23 1981-04-23 Radiation void factor meter

Country Status (1)

Country Link
JP (1) JPS57175247A (en)

Cited By (20)

* Cited by examiner, † Cited by third party
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US7512215B2 (en) 2003-04-25 2009-03-31 Rapiscan Systems, Inc. X-ray tube electron sources
US8085897B2 (en) 2003-04-25 2011-12-27 Rapiscan Systems, Inc. X-ray scanning system
US8824637B2 (en) 2008-09-13 2014-09-02 Rapiscan Systems, Inc. X-ray tubes
US8837669B2 (en) 2003-04-25 2014-09-16 Rapiscan Systems, Inc. X-ray scanning system
US8885794B2 (en) 2003-04-25 2014-11-11 Rapiscan Systems, Inc. X-ray tomographic inspection system for the identification of specific target items
US9001973B2 (en) 2003-04-25 2015-04-07 Rapiscan Systems, Inc. X-ray sources
US9020095B2 (en) 2003-04-25 2015-04-28 Rapiscan Systems, Inc. X-ray scanners
US9048061B2 (en) 2005-12-16 2015-06-02 Rapiscan Systems, Inc. X-ray scanners and X-ray sources therefor
US9208988B2 (en) 2005-10-25 2015-12-08 Rapiscan Systems, Inc. Graphite backscattered electron shield for use in an X-ray tube
US9263225B2 (en) 2008-07-15 2016-02-16 Rapiscan Systems, Inc. X-ray tube anode comprising a coolant tube
US9420677B2 (en) 2009-01-28 2016-08-16 Rapiscan Systems, Inc. X-ray tube electron sources
US9726619B2 (en) 2005-10-25 2017-08-08 Rapiscan Systems, Inc. Optimization of the source firing pattern for X-ray scanning systems
US9747705B2 (en) 2003-04-25 2017-08-29 Rapiscan Systems, Inc. Imaging, data acquisition, data transmission, and data distribution methods and systems for high data rate tomographic X-ray scanners
US9791590B2 (en) 2013-01-31 2017-10-17 Rapiscan Systems, Inc. Portable security inspection system
US10007019B2 (en) 2002-07-23 2018-06-26 Rapiscan Systems, Inc. Compact mobile cargo scanning system
US10098214B2 (en) 2008-05-20 2018-10-09 Rapiscan Systems, Inc. Detector support structures for gantry scanner systems
US10295483B2 (en) 2005-12-16 2019-05-21 Rapiscan Systems, Inc. Data collection, processing and storage systems for X-ray tomographic images
US10483077B2 (en) 2003-04-25 2019-11-19 Rapiscan Systems, Inc. X-ray sources having reduced electron scattering
US10585207B2 (en) 2008-02-28 2020-03-10 Rapiscan Systems, Inc. Scanning systems
US10591424B2 (en) 2003-04-25 2020-03-17 Rapiscan Systems, Inc. X-ray tomographic inspection systems for the identification of specific target items

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4863405A (en) * 1988-04-20 1989-09-05 Outboard Marine Corporation Outboard motor tilt lock device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3350564A (en) * 1964-12-23 1967-10-31 Charles F Bonilla Void detection utilizing neutron attenuation
JPS49108896A (en) * 1973-01-05 1974-10-16

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3350564A (en) * 1964-12-23 1967-10-31 Charles F Bonilla Void detection utilizing neutron attenuation
JPS49108896A (en) * 1973-01-05 1974-10-16

Cited By (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10670769B2 (en) 2002-07-23 2020-06-02 Rapiscan Systems, Inc. Compact mobile cargo scanning system
US10007019B2 (en) 2002-07-23 2018-06-26 Rapiscan Systems, Inc. Compact mobile cargo scanning system
US7512215B2 (en) 2003-04-25 2009-03-31 Rapiscan Systems, Inc. X-ray tube electron sources
US8085897B2 (en) 2003-04-25 2011-12-27 Rapiscan Systems, Inc. X-ray scanning system
US8837669B2 (en) 2003-04-25 2014-09-16 Rapiscan Systems, Inc. X-ray scanning system
US8885794B2 (en) 2003-04-25 2014-11-11 Rapiscan Systems, Inc. X-ray tomographic inspection system for the identification of specific target items
US9001973B2 (en) 2003-04-25 2015-04-07 Rapiscan Systems, Inc. X-ray sources
US9020095B2 (en) 2003-04-25 2015-04-28 Rapiscan Systems, Inc. X-ray scanners
US10175381B2 (en) 2003-04-25 2019-01-08 Rapiscan Systems, Inc. X-ray scanners having source points with less than a predefined variation in brightness
US7903789B2 (en) 2003-04-25 2011-03-08 Rapiscan Systems, Inc. X-ray tube electron sources
US10901112B2 (en) 2003-04-25 2021-01-26 Rapiscan Systems, Inc. X-ray scanning system with stationary x-ray sources
US11796711B2 (en) 2003-04-25 2023-10-24 Rapiscan Systems, Inc. Modular CT scanning system
US9618648B2 (en) 2003-04-25 2017-04-11 Rapiscan Systems, Inc. X-ray scanners
US10591424B2 (en) 2003-04-25 2020-03-17 Rapiscan Systems, Inc. X-ray tomographic inspection systems for the identification of specific target items
US9675306B2 (en) 2003-04-25 2017-06-13 Rapiscan Systems, Inc. X-ray scanning system
US10483077B2 (en) 2003-04-25 2019-11-19 Rapiscan Systems, Inc. X-ray sources having reduced electron scattering
US9747705B2 (en) 2003-04-25 2017-08-29 Rapiscan Systems, Inc. Imaging, data acquisition, data transmission, and data distribution methods and systems for high data rate tomographic X-ray scanners
US9726619B2 (en) 2005-10-25 2017-08-08 Rapiscan Systems, Inc. Optimization of the source firing pattern for X-ray scanning systems
US9208988B2 (en) 2005-10-25 2015-12-08 Rapiscan Systems, Inc. Graphite backscattered electron shield for use in an X-ray tube
US9048061B2 (en) 2005-12-16 2015-06-02 Rapiscan Systems, Inc. X-ray scanners and X-ray sources therefor
US10295483B2 (en) 2005-12-16 2019-05-21 Rapiscan Systems, Inc. Data collection, processing and storage systems for X-ray tomographic images
US9638646B2 (en) 2005-12-16 2017-05-02 Rapiscan Systems, Inc. X-ray scanners and X-ray sources therefor
US10976271B2 (en) 2005-12-16 2021-04-13 Rapiscan Systems, Inc. Stationary tomographic X-ray imaging systems for automatically sorting objects based on generated tomographic images
US11275194B2 (en) 2008-02-28 2022-03-15 Rapiscan Systems, Inc. Scanning systems
US11768313B2 (en) 2008-02-28 2023-09-26 Rapiscan Systems, Inc. Multi-scanner networked systems for performing material discrimination processes on scanned objects
US10585207B2 (en) 2008-02-28 2020-03-10 Rapiscan Systems, Inc. Scanning systems
US10098214B2 (en) 2008-05-20 2018-10-09 Rapiscan Systems, Inc. Detector support structures for gantry scanner systems
US9263225B2 (en) 2008-07-15 2016-02-16 Rapiscan Systems, Inc. X-ray tube anode comprising a coolant tube
US8824637B2 (en) 2008-09-13 2014-09-02 Rapiscan Systems, Inc. X-ray tubes
US9420677B2 (en) 2009-01-28 2016-08-16 Rapiscan Systems, Inc. X-ray tube electron sources
US11550077B2 (en) 2013-01-31 2023-01-10 Rapiscan Systems, Inc. Portable vehicle inspection portal with accompanying workstation
US9791590B2 (en) 2013-01-31 2017-10-17 Rapiscan Systems, Inc. Portable security inspection system
US10317566B2 (en) 2013-01-31 2019-06-11 Rapiscan Systems, Inc. Portable security inspection system

Also Published As

Publication number Publication date
JPS6352697B2 (en) 1988-10-19

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