JPS6352697B2 - - Google Patents
Info
- Publication number
- JPS6352697B2 JPS6352697B2 JP56060601A JP6060181A JPS6352697B2 JP S6352697 B2 JPS6352697 B2 JP S6352697B2 JP 56060601 A JP56060601 A JP 56060601A JP 6060181 A JP6060181 A JP 6060181A JP S6352697 B2 JPS6352697 B2 JP S6352697B2
- Authority
- JP
- Japan
- Prior art keywords
- radiation
- cylindrical measuring
- measuring section
- rotating disk
- void
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 230000005855 radiation Effects 0.000 claims description 39
- 239000011800 void material Substances 0.000 claims description 24
- 229910052790 beryllium Inorganic materials 0.000 claims description 3
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 claims description 3
- 229910052751 metal Inorganic materials 0.000 claims description 2
- 239000002184 metal Substances 0.000 claims description 2
- 238000001514 detection method Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 description 10
- 230000005514 two-phase flow Effects 0.000 description 8
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000001052 transient effect Effects 0.000 description 4
- 239000012071 phase Substances 0.000 description 3
- 239000012530 fluid Substances 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000002238 attenuated effect Effects 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 230000005251 gamma ray Effects 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000007791 liquid phase Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/12—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a flowing fluid or a flowing granular solid
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
Description
【発明の詳細な説明】
本発明は高温・高圧の蒸気及び水が流れる原子
炉やボイラー等の配管内の気体と液体の比率を測
定するボイド率計に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a void ratio meter that measures the ratio of gas to liquid in piping of nuclear reactors, boilers, etc. through which high-temperature, high-pressure steam and water flow.
蒸気と水の様に気相と液相の混合流体を二相流
と言い、配管断面内の二相流中の蒸気の比率をボ
イド率と言う。ボイド率は二相流を取り扱う原子
炉やボイラーでは重要な測定項目の１つとなつて
いる。 A mixed fluid of gas and liquid phases, such as steam and water, is called a two-phase flow, and the ratio of steam in the two-phase flow within a pipe cross section is called the void ratio. Void fraction is one of the important measurement items in nuclear reactors and boilers that handle two-phase flow.
従来の放射線を利用したボイド率計の構成は第
１図に示したようになつている。すなわち、円筒
状測定部１をはさんで、Ｘ線源２、及びＸ線検出
器３が配置され、Ｘ線ビーム４はコリメータ５に
よつて細い平行ビームになるように絞られてい
る。そして円筒状測定部１の中を透過してスリツ
ト６からＸ線検出器３に入射する。Ｘ線検出器３
からの出力信号は信号ケーブル７を通じて図示し
ない信号処理回路に送られる。なお、第１図中符
号８で示したものは、円筒状測定部１の中を流れ
ている液体中に混在している蒸気の泡である。 The configuration of a conventional void ratio meter using radiation is shown in FIG. That is, an X-ray source 2 and an X-ray detector 3 are placed with the cylindrical measuring section 1 in between, and the X-ray beam 4 is focused by a collimator 5 into a narrow parallel beam. The light then passes through the cylindrical measuring section 1 and enters the X-ray detector 3 through the slit 6. X-ray detector 3
The output signal is sent to a signal processing circuit (not shown) through a signal cable 7. Note that what is indicated by the reference numeral 8 in FIG. 1 is vapor bubbles mixed in the liquid flowing inside the cylindrical measuring section 1.
このように構成された従来のボイド率計におい
て、円筒状測定部１内が空の時及び水で満たされ
ている時のＸ線検出器の出力電圧をそれぞれ、IA
ボルト、IWボルト、また円筒状測定部内を測定す
べき二相流が流れている時のＸ線検出器の出力電
圧をIXとすると、ボイド率αは次式で与えられ
る。 In the conventional void ratio meter configured in this way, the output voltage of the X-ray detector when the cylindrical measuring section 1 is empty and when it is filled with water is expressed as I A
volt, I W volt, and the output voltage of the X-ray detector when the two-phase flow to be measured is flowing inside the cylindrical measuring section is I X , the void ratio α is given by the following equation.
α＝ρW／ρW′−ρV′・ln（IX／IW）／ln（IA／IW
）
−ρW−ρW′／ρW′−ρV′
ここでρWは水の密度、ρW′は高温水の密度、
ρV′は蒸気の密度である。 α＝ρ W ／ρ W ′−ρ V ′・ln(I X ／I W )／ln(I A ／I W
) −ρ W −ρ W ′/ρ W ′−ρ V ′ where ρ W is the density of water, ρ W ′ is the density of high-temperature water,
ρ V ′ is the vapor density.
このボイド率αは、Ｘ線ビーム４が円筒状測定
部１内に存在する多数の蒸気泡８を横切る長さを
それぞれ、l1，l2，…li，…，lnとし円筒状測定部
１を横切るＸ線ビーム４の長さをlDとすると、次
式のαと等価である。 This void ratio α is determined by assuming that the lengths of the X-ray beam 4 across the large number of vapor bubbles 8 existing in the cylindrical measuring part 1 are l 1 , l 2 , ... li, ..., ln, respectively. Letting the length of the X-ray beam 4 that traverses l D be equivalent to α in the following equation.
α＝〔o
〓i=1
li〕／lD
つまりＸ線ボイド率計によつて測定されるガイ
ド率はＸ線ビームが横切る二相流体の長さlDに対
する蒸気泡を横切る長さの合計の比率である。こ
のようなガイド率を特に局所ボイド率と言う。 α=[ o 〓 i=1 li]/l D In other words, the guiding ratio measured by the X-ray void meter is the sum of the length across the vapor bubble relative to the length of the two-phase fluid traversed by the X-ray beam l D This is the ratio of Such a guide rate is particularly called a local void rate.
いまＸ線源２とＸ線検出器３、コリメータ５お
よびスリツト６を一体に動かせ円筒状測定部１の
中心軸に垂直な平面内で上下に、例えば第２図に
示すとうり上方に移動すると、Ｘ線ビーム４の高
さｘにおけるボイド率α（ｘ）が同様に得られる。
このα（ｘ）をビーム高さｘ＝−r0からｘ＝＋r0
まで次式でlD＝２√0 2−2の重みをつけて積分
し、円筒状測定部の断面積Ａ＝πr0 2で除すと、断
面内平均ボイド率が得られる。 Now, if the X-ray source 2, X-ray detector 3, collimator 5, and slit 6 are moved together up and down within a plane perpendicular to the central axis of the cylindrical measuring section 1, for example, upward as shown in FIG. , the void fraction α(x) at the height x of the X-ray beam 4 is similarly obtained.
This α(x) is calculated from the beam height x=-r 0 to x=+r 0
By integrating the following equation with a weight of l D =2√ 0 2 − 2 and dividing by the cross-sectional area A = πr 0 2 of the cylindrical measurement part, the average void fraction in the cross section can be obtained.
＝〔∫+r 0-r0２√0 2−2
・α（ｘ）dx〕／πr0 2
このようにすることによつて正確な断面内平均
ボイド率が得られるが、従来のボイド率計は第
３図に示す様に、固定１本ビームまたは第４図に
示す様に固定３本ビーム等のものが多く、また線
源も取扱いが不便で、線束の低いγ線源が用いら
れることが多かつた。固定３本ビーム程度では断
面内平均ガイド率は二相流の流動様式によつては
測定誤差が多い時には25％以上も生じるため、実
用上大きな問題となつていた。 = [∫ +r 0-r0 2√ 0 2 − 2・α(x)dx]/πr 0 2By doing this, an accurate average void fraction within the cross section can be obtained, but the conventional void fraction meter Most of them have one fixed beam as shown in Figure 3 or three fixed beams as shown in Figure 4, and the radiation source is also inconvenient to handle, so a gamma ray source with low flux is used. There were many. With three fixed beams, the average guide rate within the cross section can exceed 25% depending on the flow pattern of the two-phase flow and when there are many measurement errors, which has become a big problem in practice.
本発明は上記の点に鑑みてなされたもので、局
所ボイド率分布を求め、正確な断面内平均ボイド
率を高速過渡現象においても得ることができる
放射線ガイド率計を提供することにある。 The present invention has been made in view of the above points, and it is an object of the present invention to provide a radiation guide rate meter that can obtain a local void fraction distribution and obtain an accurate average void fraction within a cross section even in high-speed transient phenomena.
すなわち、本発明は円筒状測定部をはさんで配
置された放射線源及び放射線検出器において、円
筒状測定部と放射線検出器との間に複数個のスリ
ツト孔を有する回転円盤を配置し、回転円盤上の
スリツト孔によつて形成される放射線ビームが円
筒状測定部を下から上へ走査することにより局所
ガイド率分布を求め正確な断面内平均ボイド率を
高速過渡現象においても得ることができる放射線
ガイド率計である。 That is, in the present invention, in a radiation source and a radiation detector arranged with a cylindrical measurement part in between, a rotating disk having a plurality of slit holes is arranged between the cylindrical measurement part and the radiation detector, and the rotation By scanning the cylindrical measuring section from bottom to top with the radiation beam formed by the slit hole on the disk, the local guide rate distribution can be determined and accurate average void fraction within the cross section can be obtained even in high-speed transient phenomena. It is a radiation guided rate meter.
以下、第１図と同一部分は同一符号で示す第５
図を参照して本発明の一実施例を説明する。 Hereinafter, parts that are the same as those in Figure 1 are designated by the same reference numerals.
An embodiment of the present invention will be described with reference to the drawings.
本発明の放射線ボイド率計は円筒状測定部１を
はさんで配置された放射線源２及び放射線検出器
３において円筒状測定部１と放射線検出器３との
間に回転円盤９を配置している。ここで放射線源
２はＸ線であつてもガンマ線であつてもあるいは
他の放射線であつても円筒状測定部を透過できる
放射線源であれば良い。また放射線検出器３は放
射線源２から出る放射線を検出できるものであれ
ば良い。回転円盤９には同一円周上に等間隔に複
数個のスリツト孔１０があけてあり、放射線源２
から出た放射線はスリツト孔１０を通過したもの
のみが細い放射線ビーム４となり、放射線検出器
３に到達する。この放射線ビームは円筒状測定部
１を通過する際に円筒状測定部内の二相流の局所
ガイド率に応じて減衰する。回転円盤９が回転す
るのに応じてスリツト孔１０を通過する放射線ビ
ーム４は、第６図に示す通り、円筒状測定部１の
下端から上端へと走査される。回転円盤９は第７
図に示すように同一円周上に等間隔に複数個のス
リツト孔１０があけてあり、１つのスリツト孔が
円筒状測定部１を走査し終わると次に次のスリツ
ト孔が走査を始めるように間隔が選定してある。
回転円盤９は直接駆動電動機１１によつて回転さ
れ、直接駆動電動機１１は位相ロツクループ制御
回路１２により一定の回転速度で回るように制御
される。また、回転円盤９の外周部は、つば状に
薄くなつており一定の間隔をおいて複数個の小孔
１３があいており、光センサー１４により、小孔
を通過する光のパルスを電気信号に変換し、パル
スカウント回路１５により、回転円盤の回転角を
測定できるようになつている。なお、カウントし
た回転角に対応する信号は、360゜回転するごとに
リセツトしてゼロにもどすように構成されてい
る。また円筒状測定部１は金属ベリリウムを使用
している。金属ベリリウムは放射線の減衰が少な
いのでこれを用いると円筒状測定部１内の二相流
の状況が測定しやすく、測定精度が向上する。ま
た、走査時間も短くて済むので高速の過渡現象に
おいても局所ガイド率分布を求め、正確な断面内
平均ガイド率を得ることができるので好都合であ
る。さらに、本発明の放射線ガイド率計では、回
転円盤を用いて放射線ビームの走査を行なつてい
るため、機械的な振動の発生が少なく高速な走査
が可能である。むしろ現在の技術レベルでは走査
速度の最大値は放射線検出器３の応答速度によつ
て制限されているのが現状である。放射線検出器
３としては、NaI（Tl）シンチレーターと光電子
増倍管を一体に構成したものを使用する。なおシ
ンチレーターの外径は円筒状測定部の内径より大
きいことが測定原理上必要である。 The radiation void rate meter of the present invention has a radiation source 2 and a radiation detector 3 arranged with a cylindrical measuring part 1 in between, and a rotating disk 9 is arranged between the cylindrical measuring part 1 and the radiation detector 3. There is. Here, the radiation source 2 may be X-rays, gamma rays, or other radiation as long as it can pass through the cylindrical measuring section. Further, the radiation detector 3 may be of any type as long as it can detect radiation emitted from the radiation source 2. A plurality of slit holes 10 are formed in the rotating disk 9 at equal intervals on the same circumference, and the radiation source 2
Only the radiation that passes through the slit hole 10 becomes a narrow radiation beam 4 and reaches the radiation detector 3. As this radiation beam passes through the cylindrical measuring section 1, it is attenuated depending on the local guidance rate of the two-phase flow within the cylindrical measuring section. As the rotary disk 9 rotates, the radiation beam 4 passing through the slit hole 10 is scanned from the lower end to the upper end of the cylindrical measuring section 1, as shown in FIG. Rotating disk 9 is the seventh
As shown in the figure, a plurality of slit holes 10 are drilled at equal intervals on the same circumference, and when one slit hole finishes scanning the cylindrical measuring part 1, the next slit hole starts scanning. The interval is selected.
The rotating disk 9 is rotated by a direct drive motor 11, and the direct drive motor 11 is controlled by a phase lock loop control circuit 12 to rotate at a constant rotation speed. The outer periphery of the rotating disk 9 is thin like a brim and has a plurality of small holes 13 at regular intervals, and an optical sensor 14 converts pulses of light passing through the holes into electrical signals. The rotation angle of the rotating disk can be measured by the pulse count circuit 15. Note that the signal corresponding to the counted rotation angle is configured to be reset and returned to zero every time it rotates 360 degrees. Further, the cylindrical measuring section 1 uses metal beryllium. Since metallic beryllium has little attenuation of radiation, its use makes it easy to measure the state of the two-phase flow within the cylindrical measuring section 1, improving measurement accuracy. In addition, since the scanning time is short, it is possible to determine the local guide rate distribution even in high-speed transient phenomena and obtain an accurate average guide rate within the cross section, which is advantageous. Furthermore, since the radiation guide rate meter of the present invention uses a rotating disk to scan the radiation beam, high-speed scanning is possible with less mechanical vibration. Rather, at the current state of the art, the maximum value of the scanning speed is currently limited by the response speed of the radiation detector 3. As the radiation detector 3, one in which a NaI (Tl) scintillator and a photomultiplier tube are integrated is used. Note that it is necessary for the measurement principle that the outer diameter of the scintillator is larger than the inner diameter of the cylindrical measuring section.
以上に説明したように本発明の放射線ボイド率
計は、円筒状測定部内の二相流の局所ガイド率分
布や断面内平均ガイド率を高速過渡現象において
も精度良く測定することができる。また、回転円
盤を用いているため、振動が少なくなめらかに走
査を行なうことができる。また機構上の難点も少
ないので、実施も容易である。なおこの実施例で
は円筒状の測定部を用いたが本発明はこれに限定
されるものではなく角筒等の筒状であつても、ま
た箱型であつても良く特に形状に限定されること
はない。 As explained above, the radiation void rate meter of the present invention can accurately measure the local guide rate distribution and the cross-sectional average guide rate of the two-phase flow in the cylindrical measuring section even in high-speed transient phenomena. Furthermore, since a rotating disk is used, scanning can be performed smoothly with little vibration. Furthermore, since there are few mechanical difficulties, it is easy to implement. Although a cylindrical measuring section was used in this embodiment, the present invention is not limited to this, and may be a square tube or other cylindrical shape, or a box-like shape, and is particularly limited to the shape. Never.
第１図は従来のボイド率計の原理を示す概略構
成図、第２図はＸ線ビームの高さｘにおける局所
ガイド率α（ｘ）の測定原理を示す概略構成図、
第３図は従来の１ビームガイド率計を示す概略構
成図、第４図は従来の３ビームガイド率計を示す
概略構成図、第５図は本発明の一実施例を示す斜
視図、第６図は本発明の測定原理を示す縦断面
図、第７図は本発明に係る回転円盤部位の構成を
Ｘ線検出器側から示す正面図である。
１…円筒状測定部、２…放射線源、３…放射線
検出器、６…放射線ビーム、５…コリメータ、６
…スリツト、７…信号ケーブル、８…蒸気泡、９
…回転円盤、１０…スリツト孔、１１…直接駆動
電動機、１２…位相ロツクループ制御回路、１３
…小孔、１４…光センサー、１５…パルスカウン
ト回路、１６…配管取付用フランジ、１７…高圧
ケーブル、１８…外枠。
FIG. 1 is a schematic configuration diagram showing the principle of a conventional void rate meter, FIG. 2 is a schematic configuration diagram showing the measurement principle of the local guide rate α(x) at the height x of the X-ray beam,
FIG. 3 is a schematic configuration diagram showing a conventional one-beam guide rate meter, FIG. 4 is a schematic configuration diagram showing a conventional three-beam guide rate meter, and FIG. 5 is a perspective view showing an embodiment of the present invention. FIG. 6 is a longitudinal sectional view showing the measurement principle of the present invention, and FIG. 7 is a front view showing the configuration of the rotating disk portion according to the present invention from the X-ray detector side. DESCRIPTION OF SYMBOLS 1... Cylindrical measurement part, 2... Radiation source, 3... Radiation detector, 6... Radiation beam, 5... Collimator, 6
...Slit, 7...Signal cable, 8...Steam bubble, 9
... Rotating disc, 10... Slit hole, 11... Direct drive motor, 12... Phase lock loop control circuit, 13
...small hole, 14...optical sensor, 15...pulse count circuit, 16...flange for piping installation, 17...high voltage cable, 18...outer frame.
Claims (1)
れぞれ配置された放射線源及び放射線検出器と、
前記筒状測定部と前記放射線検出器との間に配置
された複数のスリツト孔を有する回転円盤とを具
備してなる放射線ボイド率計において、前記スリ
ツト孔は前記回転円盤に円周等配に設けられ、前
記回転円盤は一定速度で回転するための制御装置
および回転角の検知手段を備え、さらに前記放射
線検出器からの出力信号を取り込み局所ボイド率
分布および断面内平均ボイド率を演算する信号処
理回路を備えたことを特徴とする放射線ボイド率
計。 ２ 前記筒状測定部は金属ベリリウムで形成され
てなる特許請求の範囲第１項記載の放射線ボイド
率計。[Claims] 1. A cylindrical measuring section, a radiation source and a radiation detector respectively arranged across the cylindrical measuring section,
In the radiation void rate meter comprising a rotating disk having a plurality of slit holes disposed between the cylindrical measuring section and the radiation detector, the slit holes are arranged at equal intervals on the circumference of the rotating disk. The rotating disk is provided with a control device for rotating at a constant speed and a rotation angle detection means, and further includes a signal for receiving an output signal from the radiation detector and calculating a local void fraction distribution and an average void fraction in the cross section. A radiation void rate meter characterized by being equipped with a processing circuit. 2. The radiation void rate meter according to claim 1, wherein the cylindrical measuring section is made of metal beryllium.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56060601A JPS57175247A (en) | 1981-04-23 | 1981-04-23 | Radiation void factor meter |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP56060601A JPS57175247A (en) | 1981-04-23 | 1981-04-23 | Radiation void factor meter |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS57175247A JPS57175247A (en) | 1982-10-28 |
| JPS6352697B2 true JPS6352697B2 (en) | 1988-10-19 |
Family
ID=13146922
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP56060601A Granted JPS57175247A (en) | 1981-04-23 | 1981-04-23 | Radiation void factor meter |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS57175247A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01311989A (en) * | 1988-04-20 | 1989-12-15 | Outboard Marine Corp | Titling fixture for outboard motor |
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|---|---|---|---|---|
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| US8451974B2 (en) | 2003-04-25 | 2013-05-28 | Rapiscan Systems, Inc. | X-ray tomographic inspection system for the identification of specific target items |
| US7949101B2 (en) | 2005-12-16 | 2011-05-24 | Rapiscan Systems, Inc. | X-ray scanners and X-ray sources therefor |
| US8804899B2 (en) | 2003-04-25 | 2014-08-12 | Rapiscan Systems, Inc. | Imaging, data acquisition, data transmission, and data distribution methods and systems for high data rate tomographic X-ray scanners |
| US8094784B2 (en) | 2003-04-25 | 2012-01-10 | Rapiscan Systems, Inc. | X-ray sources |
| GB0309379D0 (en) | 2003-04-25 | 2003-06-04 | Cxr Ltd | X-ray scanning |
| US8243876B2 (en) | 2003-04-25 | 2012-08-14 | Rapiscan Systems, Inc. | X-ray scanners |
| US9046465B2 (en) | 2011-02-24 | 2015-06-02 | Rapiscan Systems, Inc. | Optimization of the source firing pattern for X-ray scanning systems |
| GB0803644D0 (en) | 2008-02-28 | 2008-04-02 | Rapiscan Security Products Inc | Scanning systems |
| GB0809110D0 (en) | 2008-05-20 | 2008-06-25 | Rapiscan Security Products Inc | Gantry scanner systems |
| GB0816823D0 (en) | 2008-09-13 | 2008-10-22 | Cxr Ltd | X-ray tubes |
| GB0901338D0 (en) | 2009-01-28 | 2009-03-11 | Cxr Ltd | X-Ray tube electron sources |
| US9791590B2 (en) | 2013-01-31 | 2017-10-17 | Rapiscan Systems, Inc. | Portable security inspection system |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3350564A (en) * | 1964-12-23 | 1967-10-31 | Charles F Bonilla | Void detection utilizing neutron attenuation |
| JPS49108896A (en) * | 1973-01-05 | 1974-10-16 |
-
1981
- 1981-04-23 JP JP56060601A patent/JPS57175247A/en active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3350564A (en) * | 1964-12-23 | 1967-10-31 | Charles F Bonilla | Void detection utilizing neutron attenuation |
| JPS49108896A (en) * | 1973-01-05 | 1974-10-16 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01311989A (en) * | 1988-04-20 | 1989-12-15 | Outboard Marine Corp | Titling fixture for outboard motor |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57175247A (en) | 1982-10-28 |
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