JP4878311B2 - マルチx線発生装置 - Google Patents
マルチx線発生装置 Download PDFInfo
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- JP4878311B2 JP4878311B2 JP2007050942A JP2007050942A JP4878311B2 JP 4878311 B2 JP4878311 B2 JP 4878311B2 JP 2007050942 A JP2007050942 A JP 2007050942A JP 2007050942 A JP2007050942 A JP 2007050942A JP 4878311 B2 JP4878311 B2 JP 4878311B2
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/16—Vessels; Containers; Shields associated therewith
- H01J35/18—Windows
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/06—Cathodes
- H01J35/065—Field emission, photo emission or secondary emission cathodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/08—Anodes; Anti cathodes
- H01J35/112—Non-rotating anodes
- H01J35/116—Transmissive anodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
- H01J35/08—Anodes; Anti cathodes
- H01J35/12—Cooling non-rotary anodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J35/00—X-ray tubes
- H01J35/02—Details
- H01J35/16—Vessels; Containers; Shields associated therewith
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/06—Cathode assembly
- H01J2235/062—Cold cathodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/06—Cathode assembly
- H01J2235/068—Multi-cathode assembly
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/16—Vessels
- H01J2235/165—Shielding arrangements
- H01J2235/166—Shielding arrangements against electromagnetic radiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2235/00—X-ray tubes
- H01J2235/16—Vessels
- H01J2235/165—Shielding arrangements
- H01J2235/168—Shielding arrangements against charged particles
Description
遮蔽材 82KeV 62KeV 50KeV
Ta 0.86 1.79 0.99
W 0.72 1.48 0.83
Pb 1.98 1.00 0.051
11 真空室
12 マルチ電子ビーム発生部
13 透過型ターゲット
13’ 反射型ターゲット
13a X線発生層
13b X線発生支持層
15 マルチ電子放出素子
16 素子アレイ
23 真空内X線遮蔽板
24 X線取出部
41 大気内X線遮蔽板
42 電子ビーム入射孔
43 X線・反射電子線遮蔽板
51 透過X線検出器
52 マルチX線強度測定部
53 X線検出部
56 制御部
Claims (6)
- 内部が減圧された外囲器と、該外囲器の内部に配置された複数の電子放出素子と、該複数の電子放出素子と対向して配置されたターゲットと、該ターゲットの前記電子放出素子側に配置された後方X線遮蔽体と、前記ターゲットの前記電子放出素子側とは反対側に配置された前方X線遮蔽体とを備えるマルチX線発生装置において、
前記ターゲットは、前記複数の電子放出素子に対応して、各々の電子放出素子から放出された電子ビームが照射されて発生するX線ビームを取り出す複数のX線発生領域を備え、
前記後方X線遮蔽体は、前記複数のX線発生領域に対応して設けられた前記電子ビームを通過させる複数の電子入射孔を備え、
前記前方X線遮蔽体は、前記複数のX線発生領域に対応して設けられた前記X線を取り出す複数の開口を備えることを特徴とするマルチX線発生装置。 - 前記複数の電子放出素子の各々は、冷陰極型電子放出素子からなり、電圧制御により複数の前記冷陰極型電子放出素子のそれぞれのオン/オフを個別に選択する駆動信号部を備えていることを特徴とする請求項1に記載のマルチX線発生装置。
- 前記後方X線遮蔽体と前記前方X線遮蔽体は、前記外囲器の内部に配置されており、前記外囲器は、前記後方X線遮蔽体及び前方X線遮蔽体とは別に、前記外囲器の外側に更なるX線遮蔽体を備えていることを特徴とする請求項1または2に記載のマルチX線発生装置。
- 前記ターゲットは、X線発生層を前記電子放出素子と対向する側に備え、該X線発生層を支持するX線発生支持層を前記電子放出素子と対向する側と反対側に備え、前記X線発生支持層はAl、AlN、SiCのいずれか、又はこれらを組合わせた材料からなることを特徴とする請求項1乃至3のいずれか1項に記載のマルチX線発生装置。
- 前記前方X線遮蔽体の前記開口が、X線ビームが取り出される向きに向かって、前記開口が拡大するようなテーパー状の窓からなる請求項1乃至4のいずれか1項に記載のマルチX線発生装置。
- 前記ターゲットは、複数のターゲットが配列して構成されている請求項1乃至5のいずれか1項に記載のマルチX線発生装置。
Priority Applications (14)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007050942A JP4878311B2 (ja) | 2006-03-03 | 2007-03-01 | マルチx線発生装置 |
BRPI0708509A BRPI0708509B8 (pt) | 2006-03-03 | 2007-03-02 | gerador de raios-x múltiplos, e, aparelho de formação de imagem de raios-x múltiplos |
KR1020087022668A KR101113092B1 (ko) | 2006-03-03 | 2007-03-02 | 멀티 x선 발생장치 및 멀티 x선 촬영장치 |
CN2007800070290A CN101395691B (zh) | 2006-03-03 | 2007-03-02 | 多x射线发生器以及多x射线摄影设备 |
US12/281,453 US7873146B2 (en) | 2006-03-03 | 2007-03-02 | Multi X-ray generator and multi X-ray imaging apparatus |
RU2008139289/28A RU2388103C1 (ru) | 2006-03-03 | 2007-03-02 | Многолучевой генератор рентгеновского излучения и устройство многолучевой рентгенографии |
KR1020107026906A KR101113093B1 (ko) | 2006-03-03 | 2007-03-02 | 멀티 x선 발생장치 및 멀티 x선 촬영장치 |
CN2011100280278A CN102129948B (zh) | 2006-03-03 | 2007-03-02 | 多x射线发生器以及多x射线摄影设备 |
EP07715172.8A EP1995757B1 (en) | 2006-03-03 | 2007-03-02 | Multi x-ray generator and multi-radiography system |
PCT/JP2007/054090 WO2007100105A1 (ja) | 2006-03-03 | 2007-03-02 | マルチx線発生装置およびマルチx線撮影装置 |
EP12005367.3A EP2573791B1 (en) | 2006-03-03 | 2007-03-02 | Multi X-ray generator and multi X-ray imaging apparatus |
US12/875,745 US7889844B2 (en) | 2006-03-03 | 2010-09-03 | Multi X-ray generator and multi X-ray imaging apparatus |
US12/971,849 US8139716B2 (en) | 2006-03-03 | 2010-12-17 | Multi X-ray generator and multi X-ray imaging apparatus |
US13/370,478 US8861682B2 (en) | 2006-03-03 | 2012-02-10 | Multi X-ray generator and multi X-ray imaging apparatus |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006057846 | 2006-03-03 | ||
JP2006057846 | 2006-03-03 | ||
JP2007050942A JP4878311B2 (ja) | 2006-03-03 | 2007-03-01 | マルチx線発生装置 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011242580A Division JP5312555B2 (ja) | 2006-03-03 | 2011-11-04 | マルチx線発生装置 |
Publications (3)
Publication Number | Publication Date |
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JP2007265981A JP2007265981A (ja) | 2007-10-11 |
JP2007265981A5 JP2007265981A5 (ja) | 2011-09-22 |
JP4878311B2 true JP4878311B2 (ja) | 2012-02-15 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2007050942A Active JP4878311B2 (ja) | 2006-03-03 | 2007-03-01 | マルチx線発生装置 |
Country Status (8)
Country | Link |
---|---|
US (4) | US7873146B2 (ja) |
EP (2) | EP2573791B1 (ja) |
JP (1) | JP4878311B2 (ja) |
KR (2) | KR101113092B1 (ja) |
CN (2) | CN102129948B (ja) |
BR (1) | BRPI0708509B8 (ja) |
RU (1) | RU2388103C1 (ja) |
WO (1) | WO2007100105A1 (ja) |
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Also Published As
Publication number | Publication date |
---|---|
EP1995757A1 (en) | 2008-11-26 |
EP2573791A2 (en) | 2013-03-27 |
BRPI0708509B8 (pt) | 2021-07-27 |
KR20110005726A (ko) | 2011-01-18 |
US7889844B2 (en) | 2011-02-15 |
KR101113093B1 (ko) | 2012-03-13 |
RU2388103C1 (ru) | 2010-04-27 |
BRPI0708509B1 (pt) | 2019-04-02 |
WO2007100105A1 (ja) | 2007-09-07 |
US7873146B2 (en) | 2011-01-18 |
JP2007265981A (ja) | 2007-10-11 |
KR20080095295A (ko) | 2008-10-28 |
EP1995757A4 (en) | 2010-04-14 |
EP2573791B1 (en) | 2016-03-02 |
CN102129948A (zh) | 2011-07-20 |
US20100329429A1 (en) | 2010-12-30 |
US20090316860A1 (en) | 2009-12-24 |
BRPI0708509A2 (pt) | 2011-05-31 |
EP2573791A3 (en) | 2013-07-31 |
US20120140895A1 (en) | 2012-06-07 |
EP1995757B1 (en) | 2013-06-19 |
CN101395691A (zh) | 2009-03-25 |
US20110085641A1 (en) | 2011-04-14 |
CN101395691B (zh) | 2011-03-16 |
US8861682B2 (en) | 2014-10-14 |
CN102129948B (zh) | 2013-02-13 |
KR101113092B1 (ko) | 2012-03-14 |
US8139716B2 (en) | 2012-03-20 |
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