CN101523470A - 有机发光二极管亮度退化补偿 - Google Patents

有机发光二极管亮度退化补偿 Download PDF

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CN101523470A
CN101523470A CNA2007800372869A CN200780037286A CN101523470A CN 101523470 A CN101523470 A CN 101523470A CN A2007800372869 A CNA2007800372869 A CN A2007800372869A CN 200780037286 A CN200780037286 A CN 200780037286A CN 101523470 A CN101523470 A CN 101523470A
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阿罗基亚·内森
G·R·查吉
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Ignis Innovation Inc
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Abstract

本发明公开了用于确定像素电容的系统和方法。将像素电容与像素老化程度关联起来，以确定用于补偿像素驱动电流的电流校正因数，从而解决由于像素老化而造成的像素亮度退化的问题。

Description

有机发光二极管亮度退化补偿
技术领域
本发明涉及OLED显示器，更具体而言，涉及基于OLED电容对OLED的亮度退化进行的补偿。
背景技术
众所周知，有机发光二极管(“OLED”)用在显示器中有许多理想特性。例如，它们可产生明亮的显示，它们可制造在柔性衬底上，它们的功率需求低，并且它们不需要背光。OLED可被制造成发出不同颜色的光。这使得它们可用在全色显示器中。而且，它们的尺寸很小，这使得它们可用在高分辨率显示器中。
目前，在显示器中使用OLED尤其要受到OLED的寿命的限制。随着OLED显示器的使用，显示器的亮度会降低。为了制造出能够在一段时间内(例如，大于1000小时)反复生成同等质量的显示输出的显示器，有必要对这种亮度退化进行补偿。
确定亮度退化的一种方法是直接测量亮度退化。该方法测量在给定驱动电流的情况下像素的亮度。该技术需要每个像素的一部分都被亮度检测器所覆盖。这导致开口(aperture)和分辨率较低。
另一种技术是基于施加到像素上的累积驱动电流来预测亮度退化。此技术的问题在于，如果关于累积驱动电流的信息(例如因为电源故障)丢失或被破坏，就不能执行亮度校正。
因此，需要一种不会导致开口率、成品率(yield)或分辨率降低并且不依赖于关于OLED的以往操作的信息来补偿退化的用来确定OLED亮度退化的方法和相关系统。
发明内容
在一个实施例中，提供了一种补偿像素亮度退化的方法。该方法包括：确定像素的电容，以及将所确定的像素的电容与像素的电流校正因数关联起来。
在另一个实施例中，提供了一种使用已对像素的亮度退化进行补偿后的电流来驱动像素的方法。该方法包括：确定像素的电容，将所确定的像素的电容与像素的电流校正因数关联起来，根据电流校正因数补偿像素驱动电流，和用补偿后的电流来驱动像素。
在又一个实施例中，提供了一种在确定多个像素电路的像素电容时所使用的读取模块。这些像素电路以阵列的形式排列，从而形成显示器。读取模块包括多个读取模块元件。每个读取模块元件包括开关、运算放大器和读取电容器，开关用于将该读取模块元件电连接到多个像素电路中的一个像素电路和将该读取功能块元件从该像素电路上断开，运算放大器被电连接到开关，并且读取电容器与运算放大器并联连接。
在再另一个实施例中，提供了一种显示器，该显示器使用对亮度退化进行补偿后的电流来驱动多个像素电路的阵列。该显示器包括显示面板、列驱动器、读取模块和控制模块，其中，显示面板包括像素电路的阵列，这些像素电路排列成至少一行和多列，列驱动器使用驱动电流来驱动像素电路，读取模块用于确定像素电路的像素电容，并且控制模块用于控制列驱动器和读取模块的操作，控制模块可操作用来根据所确定的像素电容来确定电流校正因数，并基于电流校正因数来调整驱动电流。
附图说明
以下将参考附图来描述本发明的特征和实施例，在各附图中：
图1是示出有机发光二极管的结构的框图；
图2是示出OLED像素的电路模型的示意图；
图3a是示出可在显示器中使用的简化像素电路的示意图；
图3b是示出经过修改和简化的像素电路的示意图；
图3c是示出包括单个像素的显示器的示意图；
图4是示出用于使用补偿后的电流来驱动像素以解决像素的亮度退化问题的各步骤的流程图；
图5是示出利用读取模块电路模拟的读取电容器两端的电压的变化的曲线图；
图6是示出老化程度(age)不同的像素的电容与电压之间的关系的曲线图；
图7是示出像素的亮度与老化程度之间的关系的曲线图；
图8示出了显示器的框图；并且
图9是示出显示器的一个实施例的框图。
具体实施方式
图1以框图的形式示出了有机发光二极管(“OLED”)100的结构。OLED100可用作显示设备中的像素。以下描述称为像素，并且可以理解，该像素可以是OLED。OLED 100包括两个电极，即，阴极105和阳极110。夹在两个电极之间的是两种有机材料。与阴极105相连的有机材料是发射层，通常被称为空穴传输层115。与阳极110相连的有机材料是导电层，通常被称为电子传输层120。空穴和电子可在电极105、110处注入到有机材料中。空穴和电子在两种有机材料115、120的接合处重新结合，从而导致发光。
阳极110可由诸如氧化铟锡这样的透明材料制成。阴极105并不需要由透明材料制成。阴极通常位于显示面板的背面，并可称为背板电子装置(backplane electronics)。除了阴极105以外，背板电子装置还可包括晶体管和用于控制单个像素的功能的其他元件。
图2示意性地示出了OLED像素200的电路模型。可以用并联的理想二极管205和电容器210来模拟该像素，其中电容器210的电容为Coled。该电容是OLED的物理特征和电学特征的产物。当电流流经二极管205时，(如果二极管是LED)，则会发光。发出的光的强度(像素的亮度)至少取决于OLED的老化程度(age)和驱动OLED的电流。随着OLED的老化程度的增长，被电流驱动一段时间的结果是，产生指定亮度所需的电流的量会增加。
为了制造能够在一段时间内始终如一地再现输出的显示器，必须确定产生指定亮度所必需的驱动电流的量。这就需要解决由于像素老化而造成的亮度退化问题。例如，如果显示器需要产生亮度为X cd/m2的输出1000小时，则驱动显示器中每个像素所需电流的量值将随着显示器像素的老化而增大。在本文中，为产生指定亮度而必须使电流增加的量被称为电流校正因数。电流校正因数可以是：为了向像素提供补偿后的驱动电流而需要向信号电流增加的电流的绝对量。可替代地，电流校正因数可以是乘数。该乘数可表示，例如，信号电流被加倍以解决像素老化问题。可替代地，可以以类似于查找表的方式来使用电流校正因数，以将信号电流(或希望的亮度)与在老化像素中产生希望的亮度水平所必需的补偿后的驱动电流直接关联起来。
如本文中进一步描述的那样，可以利用像素的电容随时间的改变作为反馈信号，以稳定像素亮度的退化。
图3a示意性地示出了可用于驱动像素200的简化像素电路300。晶体管305充当用于接通(turn on)像素200(如图2中所示)的开关。驱动电流流过晶体管305，以驱动像素200的输出端。
图3b示意性地示出了根据本发明的方法修改后的简化像素电路301a。读取模块315通过开关310a连接到图3a的像素电路300。读取模块315使得能够确定像素200的电容210。读取模块315包括与读取模块电容器325并联的运算放大器(op amp)320。这种配置可被称为电荷放大器。该电路还具有固有寄生电容330。读取模块315的电路元件可被实现于显示器面板的背板电子装置中。可替代地，读取模块元件可被实施于显示面板以外。在一个实施例中，读取模块315被结合到显示器的列驱动电路中。
如果读取模块315电路被实施为独立于显示面板的背板电路，则开关310a可被实施于背板电子装置中。可替代地，开关310a也可以被实施在独立的读取模块315中。如果开关310a被实施在独立的读取模块315中，则需要在开关310a与像素电路300之间提供电连接。
图3c示意性地示出了显示器390，为了描述清楚的目的，显示器390包括单独的像素电路301b。显示器390包括行驱动器370、列驱动器360、控制模块380、显示面板350和读取模块315。读取模块315被示为独立的部件。如上所述，应理解，读取模块可并入到显示器390的其他部件中。
控制图3b所示的像素200的驱动的单个晶体管305被替换成两个晶体管。第一晶体管T1 335充当由行驱动器370控制的开关晶体管。第二晶体管T2 340充当向像素200供应适当电流的驱动晶体管。当T1 335导通时，其允许列驱动器360使用流过晶体管T2 340的(已对亮度退化进行补偿后的)驱动电流来驱动像素电路301b的像素。图3b中的开关310a已被替换成晶体管T3 310b。控制模块380控制晶体管T3 310b。晶体管T3 310b可被导通和关断，以将读取模块315电连接到像素电路。
行选择线353和读取选择线352可由行驱动器370来驱动。行选择线353控制一行像素何时被接通。读取选择线352控制开关(晶体管T3)310将读取模块315与像素连接起来。列驱动线361由列驱动器360来控制。列驱动线361提供用于驱动像素200发光的补偿后的驱动电流。像素电路还包括读取模块线356。像素电路由晶体管T3 310b连接到读取模块线356。读取模块线356将像素电路连接到读取模块315。
显示器390的控制模块控制显示器390不同模块来执行其功能。列驱动器360为像素200提供驱动电流。可理解，用于驱动像素200的电流决定了像素200的亮度。行驱动器370确定在特定时刻哪一行像素将被列驱动器360驱动。控制模块380协调列驱动器360和行驱动器370，使得在特定时刻一行像素被接通并被适当电流所驱动，从而产生希望的输出。通过控制行驱动器370和列驱动器360(例如，何时接通特定行和用什么样的电流来驱动该行中的每个像素)，控制模块380控制显示面板350的整体功能。
图3c中的显示器390可至少以两种模式工作。第一模式是标准显示模式，在这种模式中，控制模块380控制行驱动器370和列驱动器360来驱动像素200，以显示适当的输出。在这种显示模式中，当控制模块380控制晶体管T3 310b使得晶体管T3 310b关断时，读取模块315没有被电连接到像素电路。第二模式是读取模式，在这种模式中，控制模块380控制读取模块315来确定像素200的电容。在读取模式中，控制模块380按需要接通或关断晶体管T3 310b。
图4以流程图400的形式示出了使用补偿后的电流来驱动像素以解决像素亮度退化问题的各步骤。在步骤405中，确定像素的电容。然后，在步骤410中，将所确定的电容与电流校正因数关联起来。可以通过各种方式来完成这种关联，诸如，通过对该像素类型的老化用方程来建模并通过解方程来完成，或通过查找表的方式将电容与步骤415中的电流校正因数直接关联起来。
当确定图3c所示的显示器的像素的电容时，开关最初是闭合的(晶体管T3 310b是导通的)，将像素电路通过读取模块线356电连接到读取模块315，并且像素的电容210被充电到初始电压V1，该初始电压V1是由读取模块315(例如，电荷充电器)的偏置电压决定的。然后，开关打开(晶体管T3关断)，从而将像素电路从读取模块线356断开，并因此与读取模块315断开。然后，读取模块315(或读取模块线356)的寄生电容330被充电到另一电压V2，电压V2由读取模块315(例如，电荷充电器)的偏置电压决定。读取模块315(例如，电荷充电器)的偏置电压受控制模块380控制，因此可与用于对像素电容210进行充电的电压不同。最后，开关再次闭合，从而将读取模块315电连接到像素电路。然后，像素电容210被充电到V2。将Coled的电压从V1变成V2所需的电量被存储在读取电容器325中，该电量可被读取为电压。
通过在寄生电容330被充电到V2的时刻与开关310被闭合以将读取模块315电连接到像素电路的时刻这两个时刻之间等待几微秒的时间，可提高该方法的精确度。在这几微秒内，可测量出读取电容器315的泄漏电流，并且可根据在读取电容器315两端看到的最终电压来确定和推导出合成的电压。
在开关310闭合时，测量读取电容器315两端的电压的变化。一旦像素电容210和寄生电容330被充电到相同的电压，读取电容器325两端的电压变化可用于确定像素200的电容210。读取电容器325两端的电压变化是根据以下等式而改变的：
Δ Vc read = - C oled C read ( V 1 - V 2 )
其中：
ΔVcread是从开关310闭合以将充电后的寄生电容330与像素电容210连接起来的时刻起，到这两个电容两端的电压相等的时刻，读取电容器325两端的电压变化；
Coled是像素(在此情况下，该像素是OLED)的电容210；
Cread是读取电容器325的电容；
V1是像素电容210最初被充电到的电压；并且
V2是在开关被打开时寄生电容330被充电到的电压。
电压V1和V2将是已知的，并且可由控制模块380控制，Cread是已知的，并且可被选择为满足特定电路设计要求所需要的那样。ΔVcread是从运算放大器320的输出端测量出的。根据以上等式，显然，随着Coled的减小，ΔVcread也会减小。此外，通过V1、V2和Cread确定增益。V1和V2的值可受控制模块380的控制(或者，控制该电压的电路随便在哪里都可以)。应理解，可通过利用本领域技术人员已知的技术将运算放大器320的模拟信号转变成数字信号来进行该测量。
图5以曲线图的形式示出了对利用上述读取模块315电路来模拟的读取电容器325两端的电压变化。根据该曲线图，很明显，读取模块315可用于基于所测量的读取电容器325两端的电压变化来确定像素200的电容210。
一旦像素200的电容210被确定，就可使用该电容值来确定像素200的老化程度。如上所述，可针对不同像素类型，通过对像素施加以给定电流并周期性测量像素电容，来用实验方法确定像素200的电容210与老化程度之间的关系。像素的电容与老化程度之间的特定关系将会因像素类型和尺寸的不同而不同，并且该特定关系可用实验方法来确定，以确保在像素的电容与老化程度之间构成适当的关联。
读取模块315可包含用于根据运算放大器320的输出来确定像素200的电容210的电路。然后，此信息被提供给控制模块380，以用来确定像素200的电流校正因数。可替代地，读取模块315的运算放大器320的输出可被提供回控制模块380。这种情况下，控制模块380应包含用于确定像素200的电容210以及可由此得出的电流校正因数所需的电路和逻辑。
图6以曲线图的形式示出了在像素老化以前和老化以后像素的电容与电压之间的关系。该老化是由于在一周的时间内对像素持续施加以20mA/cm2的恒定电流而造成的。电容可与老化程度线性相关。其他关系也是有可能的，诸如多项式关系。此外，该关系可能仅能够通过实验测量才能正确表示出来。这种情况下，需要进行额外的测量，以便确保对电容老化程度特性的建模是准确的。
图7以曲线图的形式示出了像素的亮度与老化程度之间的关系。当确定了像素的电容时，此关系可通过实验来确定。像素的老化程度与产生指定亮度所需的电流之间的关系也可通过实验来确定。然后，可利用所确定的像素的老化程度与产生指定亮度所需的电流之间的关系，来对显示器中像素的老化进行补偿。
电流校正因数可用于确定为了产生希望的亮度而在驱动像素时所需的适当电流。例如，用实验方法可确定，为了在已经老化的像素(例如，在两周时间内用15mA/cm2的电流来驱动像素)中产生与新像素相同的亮度，必须用1.5倍的电流来驱动已老化的像素。可以确定在两个不同老化程度产生指定亮度所需的电流，并可以假设该老化是线性关系。根据这一点，可以对不同的老化程度推断出电流校正因数。此外，可以假设对于给定老化程度的像素，不同亮度水平的电流校正因数是相同的。即，对于指定老化程度的像素，为了产生X cd/m2的亮度所需的电流校正因数为1.1，为了产生2X cd/m2的亮度所需的电流校正因数也是1.1。作出这些假设减少了用实验方法进行确定时所需的测量的数量。
可用实验方法来确定附加信息，这使得不必一定依赖于一样多的假设。例如，可在四个不同的像素老化程度处确定像素电容210(可理解，可在为了达到适当精确度所需要的那么多种的老化程度处来确定电容)。然后就可以更精确地对老化过程进行建模，并且由此推断出的老化程度可以更精确。此外，可以针对不同的亮度水平，来确定对于给定老化程度的像素的电流校正因数。并且，附加测量使得对老化和电流校正因数的建模更加精确。
可理解，可在进行测量所需的时间与测量提供的附加精确度之间权衡用实验方法获得的信息量。
图8以框图的形式显示了显示器395。显示器395包括显示面板350、行驱动器模块370、列驱动器模块360和控制模块380。显示面板350包括以行列形式排列的像素电路301b的阵列。图8中所示的显示面板350的像素电路301a被实现为如图3c所示的那样，上文已经对此进行了描述。在标准显示模式中，晶体管T3 310b被关断，并且控制模块380控制行驱动器360，使得读取选择线352被驱动，以便关断晶体管T3 310b。控制模块380控制行驱动器370，使得行驱动器370驱动适当行的行选择线353，以便导通像素行。然后，控制模块380控制列驱动器360，以便用适当的电流在像素的列驱动线361上进行驱动。控制模块380可周期性地刷新显示面板350的每一行，例如，每秒刷新60次。
当显示器395处于读取模式时，控制模块380控制行驱动器370，使得其驱动读取选择线352(以便导通和关断开关，即，晶体管T3 310)和读取模块315的偏置电压(因此还驱动读取模块线356的电压)，以便按需要将电容充电到V1和V2，从而按上述那样确定像素200的电容210。控制模块380执行读取操作，以确定特定行中的像素电路301b的每个像素200的电容210。然后，控制模块利用该信息来确定像素的老化程度，继而确定将要对驱动电流施加的电流校正因数。
除了用于控制驱动器360、370和读取模块315所需的逻辑外，控制模块380还包括用于根据电容210确定电流校正因数的逻辑，其中电容210是由读取模块315确定的。如上所述，可用不同的技术来确定电流校正因数。例如，如果测量像素以确定其初始电容和它经过一周的老化之后的电容，控制模块380可被适配成，通过求解线性方程来确定特定电容的老化程度，该线性方程是由两个测量得到的电容和老化程度定义的。如果在每个亮度水平处对单个亮度测量所需的电流校正因数，那么可利用查找表来为像素确定电流校正因数，其中查找表给出了用于特定像素老化程度的电流校正因数。控制模块380可从读取模块315接收像素电容210，并通过求解线性方程来确定像素的老化程度，该线性方程是由对像素的不同老化程度进行测量得到的两个电容定义的。根据所确定的老化程度，控制模块315使用查找表来确定像素的电流校正因数。
如果对像素老化过程进行了附加测量，那么确定像素的老化程度就不会只是求解线性方程这么简单。例如，如果在老化过程中选择了三个点P1、P2和P3，使得在点P1与P2之间的老化是线性的，但在点P2与P3之间老化是呈指数变化的或非线性的，则确定像素的老化程度可能需要首先确定电容在什么范围内(即，在P1与P2之间，还是在P2与P3之间)，然后确定恰当的老化程度。
控制模块380确定像素的老化程度所用的方法可能会根据显示器的需求而变。控制模块380如何确定像素老化程度以及这样做所需的信息应被编程到控制模块的逻辑中。所需的逻辑可以用硬件来实现，诸如ASIC(专用集成电路)，在这种情况下，可能更加难以改变控制模块380确定像素老化程度的方式。所需的逻辑也可以用硬件和软件的组合形式来实现，使得能够比较容易地修改控制模块380确定像素老化程度的方式。
除了将电容与老化程度关联起来的各种方式以外，控制模块380还可以通过各种方式来确定电流校正因数。如上所述，可以针对不同的亮度水平来确定电流校正因数。与将老化程度与电容关联起来的方法一样，特定亮度水平的电流校正因数可以从有效测量推断出来。与将电容与老化程度关联起来的方法相类似，关于控制模块380如何确定电流校正因数的具体细节可以有变化，并且确定电流校正因数所需的逻辑可以通过硬件或软件形式被编程到控制模块380中。
一旦为像素确定了电流校正因数，则可以按照需要使用该电流校正因数来调整驱动电流。
图9以框图的形式示出了显示器398的一个实施例。以上参考图8所说明的显示器390，可被修改成对像素类型共有的像素特性进行校正。例如，已知像素的特性取决于工作环境的温度。为了确定由于老化而导致的电容，显示器398设置有附加的像素396行。这些像素396被称为基准像素，它们不受显示器电流的驱动，因此它们并不会经历显示器像素所经历的老化。基准像素396可连接到读取模块315，以便确定这些像素的电容。控制模块380并不直接利用像素电容，而是利用像素电容210与基准电容之差作为在确定显示器像素的老化程度时所使用的电容。
这就使得能够容易地将不同的校正组合到一起。由于像素老化程度是基于电容被校正到达到(account for)基准像素电容的标准而确定的，所以老化校正因数并不包括对非老化程度因素的校正。例如，可以将电流校正因数确定为两个电流校正因数之和。第一个因数可以是上述的与老化程度有关的电流校正因数。第二个因数可以是与工作环境温度有关的校正因数。
控制模块380可以使用不同的频率来执行读取操作(即，以读取模式工作)。例如，每当刷新显示器的一帧时可以执行读取操作。可理解，执行读取操作所需的时间是由各部件确定的。例如，电容被充电到所需电压所需要的设置时间取决于电容的尺寸。如果与显示器的帧刷新率相比，该时间较大，则可以不在每次刷新一帧时执行一次读取操作。这种情况下，控制模块可以，例如，在显示器被打开或关闭时执行一次读取。如果读取时间与刷新速率相当，则可以每秒执行一次读取操作。这可以每60帧向显示中插入一个空白帧。然而，这并不会降低显示质量。读取操作的频率至少取决于构成显示器的部件和所要求的显示器特性(例如，帧率)。如果与刷新速率相比，读取时间较短，则可以在显示模式中在驱动像素之前执行读取。
以上将读取模块315描述为确定一行中单个像素200的电容210。可将单个读取模块315修改成确定一行中多个像素的电容。这可通过放入一个开关(未示出)来实现，该开关用来确定读取模块315被连到哪个像素电路310b上。该开关可由控制模块380来控制。此外，尽管描述了单个读取模块315，但单个显示器也可以具有多个读取模块。如果使用了多个读取模块，那么单个读取模块可以被称为读取模块元件，而多个读取模块元件构成的组可以被称为读取模块。
尽管以上描述了用于确定像素200的电容210的电路，但可理解，也可以用其他电路或方法来确定像素电容210。例如，可以用互阻放大器代替读取模块315的电压放大器配置，来确定像素电容。这种情况下，使用诸如斜波信号或正弦信号这样的变化的电压信号来对像素电容和寄生电容充电。可以测量由此产生的电流，从而可以确定电容。由于电容是寄生电容330和像素电容210的组合，所以为了确定像素电容210，寄生电容330必须是已知的。可以通过直接测量来确定寄生电容330。可替代地或附加地，可以使用互阻放大器配置读取模块来确定寄生电容330。开关可将像素电路从读取模块断开。然后，可通过用变化的电压信号对寄生电容330充电并测量由此产生的电流，来确定寄生电容330。
有利地，本文描述的用于补偿电气老化造成的像素亮度退化的各实施例可以被包括在显示面板中时，而不会降低显示器的成品率、开口率或分辨率。实现该技术所需的电子装置可以容易地被放入显示器所需的电子装置中，而不会显著增加显示器的尺寸或功率需求。
已通过举例的方式描述了一个或多个目前示出的实施例。对于本领域技术人员来说，显然可以在不脱离权利要求所限定的本发明的保护范围的情况下作出多种变形和修改。

Claims (19)

1.一种用于对像素的亮度退化进行补偿的方法，该方法包括：确定所述像素的电容；以及
将所确定的所述像素的电容与所述像素的电流校正因数关联起来。
2.如权利要求1所述的方法，其中确定所述像素的电容的步骤包括：将所述像素的电容充电到第一电压V1；
将寄生电容充电到第二电压V2；
将所述寄生电容和所述像素的电容电气并联连接；以及
测量电容为Cread的读取电容器两端的电压变化ΔV；
其中，所述像素的电容等于：
( ΔV ) ( C read ) V 2 - V 1 .
3.如权利要求2所述的方法，其中，在将所述像素的电容充电到V1期间，所述像素的电容与所述寄生电容被电气并联连接，在将所述寄生电容充电到V2期间，所述像素的电容与所述寄生电容被电气断开连接。
4.如权利要求3所述的方法，进一步包括：
在测量ΔV之前，确定所述读取电容器的泄漏电流；
基于所述泄漏电流，确定合成的电压；以及
从ΔV推导出所述合成的电压。
5.如权利要求1所述的方法，其中，所述像素是以阵列形式排列从而形成显示器的多个像素之中的一个像素。
6.一种使用对于像素的亮度退化进行补偿后的电流来驱动该像素的方法，该方法包括：
确定所述像素的电容；
将所确定的所述像素的电容与该像素的电流校正因数关联起来；
根据所述电流校正因数来补偿像素驱动电流；以及
用补偿后的电流来驱动所述像素。
7.如权利要求6所述的方法，其中，确定所述像素的电容的步骤包括：
将所述像素的电容充电到第一电压V1；
将寄生电容充电到第二电压V2；
将所述寄生电容和所述像素的电容电气并联连接；以及
测量电容为Cread的读取电容器两端的电压变化ΔV；
其中，所述像素的电容等于：
( ΔV ) ( C read ) V 2 - V 1 .
8.一种在确定多个像素电路的像素电容时所使用的读取模块，所述像素电路以阵列的形式排列从而形成显示器，所述读取模块包括：
多个读取模块元件，每个读取模块元件包括：
开关，其用于将该读取模块元件电连接到所述多个像素电路之中的一个像素电路，和将所述读取模块元件从该像素电路上断开；
电连接到所述开关的运算放大器；以及
与所述运算放大器并联连接的读取电容器。
9.如权利要求8所述的读取模块，其中所述读取模块元件具有寄生电容，当所述开关将所述读取模块元件电连接到所述像素电路时，该寄生电容与所述像素电路的像素电容并联连接。
10.如权利要求9所述的读取模块，其中，所述开关是晶体管。
11.一种使用对于亮度退化进行补偿后的电流来驱动多个像素电路的阵列的显示器，该显示器包括：
显示面板，其包括所述多个像素电路的阵列，所述多个像素电路以至少一行和多列的形式排列；
列驱动器，其用于使用驱动电流来驱动所述像素电路；
读取模块，其用于确定所述像素电路的像素电容；以及
控制模块，其用于控制所述列驱动器和所述读取模块的操作，所述控制模块用来根据所确定的像素电容来确定电流校正因数，并基于所述电流校正因数来调整所述驱动电流。
12.如权利要求11所述的显示器，进一步包括：
至少两行像素电路；以及
行驱动器，其用于选择将被所述列驱动器驱动的像素电路行。
13.如权利要求11所述的显示器，其中每个像素电路包括：
晶体管，其用于控制来自所述列驱动器的驱动电流；以及像素，其基于所述驱动电流来发光。
14.如权利要求12所述的显示器，其中每个像素电路包括：
像素，其基于所述驱动电流来发光；以及
开关晶体管，由所述行驱动器控制该开关晶体管，以对驱动晶体管进行控制，所述驱动晶体管用于基于所述驱动电流来驱动所述像素。
15.如权利要求13所述的显示器，其中所述像素是有机发光二极管。
16.如权利要求13所述的显示器，其中所述读取模块包括：
多个读取模块元件，每个读取模块元件包括：
开关，其用于将该读取模块元件电连接到所述多个像素电路之中的一个像素电路，和将所述读取模块元件从该像素电路上断开；
电连接到所述开关的运算放大器；以及
与所述运算放大器并联连接的读取电容器。
17.如权利要求11所述的显示器，其中所述控制模块以至少两种模式之中的一种模式来操作所述显示器，所述至少两种模式为：
显示模式，在这种模式下，所述控制模块控制所述电流驱动器，以使用基于显示信号和所述电流校正因数的电流来驱动所述多个像素电路以使其发光；以及
读取模式，在这种模式下，所述控制模块控制所述读取模块，以确定所述多个像素电路之中的一个像素电路的像素电容，所述控制模块基于所述像素电路的像素电容来确定所述电流校正因数。
18.如权利要求14所述的显示器，其中，所述像素是有机发光二极管。
19.如权利要求14所述的显示器，其中所述读取模块包括：
多个读取模块元件，每个读取模块元件包括：
开关，其用于将该读取模块元件电连接到所述多个像素电路之中的一个像素电路，和将所述读取模块元件从该像素电路上断开；
电连接到所述开关的运算放大器；以及
与所述运算放大器并联连接的读取电容器。
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