JP3917731B2 - レーザ走査顕微鏡 - Google Patents

レーザ走査顕微鏡 Download PDF

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Publication number
JP3917731B2
JP3917731B2 JP29410797A JP29410797A JP3917731B2 JP 3917731 B2 JP3917731 B2 JP 3917731B2 JP 29410797 A JP29410797 A JP 29410797A JP 29410797 A JP29410797 A JP 29410797A JP 3917731 B2 JP3917731 B2 JP 3917731B2
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Japan
Prior art keywords
coherent light
laser
light
scanning
specimen
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Expired - Lifetime
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JP29410797A
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Japanese (ja)
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JPH10206742A (ja
JPH10206742A5 (enExample
Inventor
伸悟 鹿島
陽介 岸
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Olympus Corp
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Olympus Corp
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Priority to JP29410797A priority Critical patent/JP3917731B2/ja
Priority to US08/972,591 priority patent/US6094300A/en
Publication of JPH10206742A publication Critical patent/JPH10206742A/ja
Publication of JPH10206742A5 publication Critical patent/JPH10206742A5/ja
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    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/16Microscopes adapted for ultraviolet illumination ; Fluorescence microscopes

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP29410797A 1996-11-21 1997-10-27 レーザ走査顕微鏡 Expired - Lifetime JP3917731B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP29410797A JP3917731B2 (ja) 1996-11-21 1997-10-27 レーザ走査顕微鏡
US08/972,591 US6094300A (en) 1996-11-21 1997-11-18 Laser scanning microscope

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP8-310889 1996-11-21
JP31088996 1996-11-21
JP29410797A JP3917731B2 (ja) 1996-11-21 1997-10-27 レーザ走査顕微鏡

Publications (3)

Publication Number Publication Date
JPH10206742A JPH10206742A (ja) 1998-08-07
JPH10206742A5 JPH10206742A5 (enExample) 2005-10-27
JP3917731B2 true JP3917731B2 (ja) 2007-05-23

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JP29410797A Expired - Lifetime JP3917731B2 (ja) 1996-11-21 1997-10-27 レーザ走査顕微鏡

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US (1) US6094300A (enExample)
JP (1) JP3917731B2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10281699B2 (en) 2016-08-29 2019-05-07 Olympus Corporation Microscope system configured to irradiate focused light onto an area of a specimen outside of an optical axis of an objective lens

Families Citing this family (117)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19531988A1 (de) * 1995-08-30 1997-03-06 Europaeische Kommission Fernmessung von U (Pu) in Gläsern
JP3411780B2 (ja) * 1997-04-07 2003-06-03 レーザーテック株式会社 レーザ顕微鏡及びこのレーザ顕微鏡を用いたパターン検査装置
US6383816B1 (en) * 1998-11-10 2002-05-07 University Of Delaware Probing of surface roughness
JP3283499B2 (ja) * 1999-03-18 2002-05-20 オリンパス光学工業株式会社 レーザ顕微鏡
DE19930532C2 (de) * 1999-06-30 2002-03-28 Zeiss Carl Jena Gmbh Anordnung zur Optimierung der Pulsform in einem Laser-Scanning-Mikroskop
JP4512219B2 (ja) * 1999-09-21 2010-07-28 オリンパス株式会社 光走査型顕微鏡
DE19954933A1 (de) * 1999-11-10 2001-05-17 Zeiss Carl Jena Gmbh Anordnung zur Einkopplung einer optischen Pinzette und/oder eines Bearbeitungsstrahles in ein Mikroskop
JP4671463B2 (ja) * 2000-03-24 2011-04-20 オリンパス株式会社 照明光学系及び照明光学系を備えた顕微鏡
DE10039520A1 (de) * 2000-08-08 2002-02-21 Leica Microsystems Vorrichtung zur Untersuchung und Manipulation von mikroskopischen Objekten
JP4653292B2 (ja) * 2000-08-09 2011-03-16 オリンパス株式会社 システム顕微鏡
US7383076B2 (en) 2000-11-27 2008-06-03 The General Hospital Corporation Fluorescence-mediated molecular tomography
US6615063B1 (en) * 2000-11-27 2003-09-02 The General Hospital Corporation Fluorescence-mediated molecular tomography
US6643049B2 (en) * 2001-02-01 2003-11-04 Kodak Polychrome Graphics Llc Compact imaging head and high speed multi-head laser imaging assembly and method
DE10105391B4 (de) * 2001-02-06 2004-11-25 Leica Microsystems Heidelberg Gmbh Scanmikroskop und Modul für ein Scanmikroskop
JP4804665B2 (ja) * 2001-08-09 2011-11-02 オリンパス株式会社 レーザ顕微鏡
US7196843B2 (en) 2002-03-27 2007-03-27 Olympus Optical Co., Ltd. Confocal microscope apparatus
JP4632634B2 (ja) * 2002-03-27 2011-02-16 オリンパス株式会社 共焦点顕微鏡装置及び共焦点顕微鏡装置を用いた観察方法
JP4242617B2 (ja) * 2002-08-28 2009-03-25 オリンパス株式会社 走査型レーザ顕微鏡システム
JP2004110017A (ja) * 2002-08-29 2004-04-08 Olympus Corp 走査型レーザ顕微鏡
US7223986B2 (en) * 2002-08-29 2007-05-29 Olympus Optical Co., Ltd. Laser scanning microscope
AU2002347689A1 (en) * 2002-09-27 2004-04-19 Wilson O. Garcia Two-color (two-photon) excitation with focused excitation beams and a raman shifter
JP4239166B2 (ja) * 2002-12-27 2009-03-18 関西ティー・エル・オー株式会社 多層観察型光学顕微鏡及び多層観察ユニット
JP2004317741A (ja) * 2003-04-15 2004-11-11 Olympus Corp 顕微鏡およびその光学調整方法
US7881502B2 (en) * 2003-06-30 2011-02-01 Weyerhaeuser Nr Company Method and system for three-dimensionally imaging an apical dome of a plant embryo
EP1668394A1 (de) * 2003-09-25 2006-06-14 Leica Microsystems Heidelberg GmbH Mikroskop mit evaneszenter beleuchtung
WO2005031428A1 (de) * 2003-09-25 2005-04-07 Leica Microsystems Heidelberg Gmbh Mikroskop mit evaneszenter probenbeleuchtung
JP4414722B2 (ja) * 2003-10-15 2010-02-10 オリンパス株式会社 レーザー顕微鏡
US7282716B2 (en) * 2003-11-10 2007-10-16 Technology Innovations, Llc Digital imaging assembly and methods thereof
US6971754B2 (en) * 2003-11-13 2005-12-06 Itt Manufacturing Enterprises, Inc. Lens cap retention arrangement
DE10356826B4 (de) * 2003-12-05 2021-12-02 Leica Microsystems Cms Gmbh Rastermikroskop
JP4468684B2 (ja) 2003-12-05 2010-05-26 オリンパス株式会社 走査型共焦点顕微鏡装置
JP4573524B2 (ja) * 2003-12-24 2010-11-04 オリンパス株式会社 走査型レーザー顕微鏡
US20050146784A1 (en) * 2004-01-06 2005-07-07 Vogt William I. Confocal microscope having multiple independent excitation paths
DE102004011770B4 (de) * 2004-03-09 2005-12-15 Leica Microsystems Heidelberg Gmbh Mikroskop
DE102004016253B4 (de) * 2004-04-02 2006-02-23 Leica Microsystems Cms Gmbh Rastermikroskop und Verfahren zur rastermikroskopischen Untersuchung einer Probe
JP4885429B2 (ja) * 2004-05-13 2012-02-29 オリンパス株式会社 光刺激装置および光走査型観察装置
JP4804726B2 (ja) * 2004-06-16 2011-11-02 オリンパス株式会社 走査型光学観察装置
JP4803974B2 (ja) * 2004-06-21 2011-10-26 オリンパス株式会社 共焦点観察システム、光照射方法、及び光照射プログラム
US7355702B2 (en) 2004-06-21 2008-04-08 Olympus Corporation Confocal observation system
JP4815349B2 (ja) * 2004-06-24 2011-11-16 オリンパス株式会社 蛍光相関分光装置
DE102004032952A1 (de) * 2004-07-07 2006-01-26 Leica Microsystems Cms Gmbh Rastermikroskop und Verfahren zur Untersuchung von biologischen Proben mit einem Rastermikroskop
DE102004034961A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Lichtrastermikroskop mit linienförmiger Abtastung und Verwendung
DE102004034983A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Lichtrastermikroskop
DE102004034987A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Lichtrastermikroskop und Verwendung
DE102004034968A1 (de) * 2004-07-16 2006-02-09 Carl Zeiss Jena Gmbh Lichtrastermikroskop mit linienförmiger Abtastung
JP2008507719A (ja) * 2004-07-23 2008-03-13 ジーイー・ヘルスケア・ナイアガラ・インク 共焦点蛍光顕微鏡法及び装置
JP2006078772A (ja) * 2004-09-09 2006-03-23 Yokogawa Electric Corp 共焦点顕微鏡
DE102004044626B4 (de) * 2004-09-13 2008-11-20 Leica Microsystems Cms Gmbh Verfahren zur Untersuchung von Transportprozessen
JP4605447B2 (ja) * 2004-09-17 2011-01-05 横河電機株式会社 3次元共焦点顕微鏡システム
JP2006119347A (ja) * 2004-10-21 2006-05-11 Olympus Corp レーザ走査型顕微鏡
DE102004054262B4 (de) * 2004-11-09 2016-08-18 Leica Microsystems Cms Gmbh Vorrichtung zur Untersuchung und Manipulation von mikroskopischen Objekten
US7345816B2 (en) * 2005-01-11 2008-03-18 Olympus Corporation Optical microscope
JP4792230B2 (ja) * 2005-02-10 2011-10-12 オリンパス株式会社 蛍光顕微鏡装置
EP1705509B1 (en) * 2005-03-23 2009-09-16 Olympus Corporation Scanning examination apparatus
DE102005013949A1 (de) * 2005-03-26 2006-09-28 Carl Zeiss Meditec Ag Scanvorrichtung
JP2006275917A (ja) * 2005-03-30 2006-10-12 Olympus Corp 多光子励起型観察装置および多光子励起型観察用光源装置
JP4685489B2 (ja) * 2005-03-30 2011-05-18 オリンパス株式会社 多光子励起型観察装置
JP4869734B2 (ja) * 2005-04-25 2012-02-08 オリンパス株式会社 多光子励起走査型レーザ顕微鏡
EP1744194B1 (en) * 2005-07-11 2017-05-10 Olympus Corporation Laser scanning microscope and image acquiring method of laser scanning microscope
DE102005046638C5 (de) * 2005-09-29 2024-02-15 Leica Microsystems Cms Gmbh Scanmikroskop und Verfahren zur Probenmanipulation mit einem Manipulationslichtstrahl in einem Scanmikroskop
DE102005046510B4 (de) 2005-09-29 2022-02-17 Leica Microsystems Cms Gmbh Mikroskopsystem für FCS-Messungen
JP5095935B2 (ja) * 2005-11-15 2012-12-12 オリンパス株式会社 顕微鏡装置
JP5132052B2 (ja) * 2005-11-30 2013-01-30 オリンパス株式会社 走査型レーザ顕微鏡の条件設定装置及び走査型レーザ顕微鏡システム
EP1970744A4 (en) * 2005-12-28 2010-12-01 Nikon Corp OPTICAL SCANNING DEVICE, OPTICAL SCAN TYPE MICROSCOPE, OBSERVATION PROCEDURE, CONTROL DEVICE AND CONTROL PROGRAM
JP4867354B2 (ja) * 2006-01-16 2012-02-01 横河電機株式会社 共焦点顕微鏡
JP4922628B2 (ja) * 2006-03-03 2012-04-25 オリンパス株式会社 走査型レーザ顕微鏡
JP4759425B2 (ja) * 2006-03-28 2011-08-31 オリンパス株式会社 多光子励起型観察装置
JP4912737B2 (ja) * 2006-05-11 2012-04-11 オリンパス株式会社 レーザ走査型顕微鏡および顕微鏡観察方法
JP4912738B2 (ja) * 2006-05-11 2012-04-11 オリンパス株式会社 レーザ走査型顕微鏡
JP5021233B2 (ja) * 2006-05-12 2012-09-05 オリンパス株式会社 レーザ走査型顕微鏡
US8040597B2 (en) * 2006-05-16 2011-10-18 Olympus Corporation Illuminating device
JP4855139B2 (ja) 2006-05-18 2012-01-18 オリンパス株式会社 顕微鏡装置および細胞観察方法
EP1862838B1 (en) 2006-05-29 2009-08-19 Olympus Corporation Laser scanning microscope and microscopic observing method
JP5133600B2 (ja) * 2006-05-29 2013-01-30 オリンパス株式会社 レーザ走査型顕微鏡および顕微鏡観察方法
US7838818B2 (en) 2006-06-22 2010-11-23 Olympus Corporation Light-stimulus illumination apparatus which scans light-stimulus laser light in a direction intersecting an optical axis
EP2033047B1 (en) 2006-06-29 2020-02-19 Agency for Science, Technology and Research Shg quantification of matrix-related tissue dynamic and disease
WO2008004336A1 (en) 2006-07-03 2008-01-10 Nikon Corporation Laser scanning microscope
DE102006034910B4 (de) * 2006-07-28 2019-05-02 Carl Zeiss Microscopy Gmbh Mikroskop umfassend einen Strahlvereiniger
DE102006034914A1 (de) * 2006-07-28 2008-01-31 Carl Zeiss Microimaging Gmbh Verfahren und Anordnung zur Ansteuerung eines Mikroskops, insbesondere eines Laser-Scanning-Mikroskopes
DE102006034906A1 (de) 2006-07-28 2008-01-31 Carl Zeiss Microimaging Gmbh Laser-Scanning-Mikroskop und Verfahren zu seinem Betrieb
JP4885685B2 (ja) * 2006-11-06 2012-02-29 オリンパス株式会社 光学装置および顕微鏡
EP2434325A1 (en) * 2006-12-22 2012-03-28 Nikon Corporation Laser scan confocal microscope
JP4891057B2 (ja) 2006-12-27 2012-03-07 オリンパス株式会社 共焦点レーザー走査型顕微鏡
ATE455312T1 (de) 2007-02-05 2010-01-15 Olympus Corp Laser-scanning-mikroskop
JP5058625B2 (ja) 2007-02-19 2012-10-24 オリンパス株式会社 レーザ顕微鏡
JP5058624B2 (ja) * 2007-02-19 2012-10-24 オリンパス株式会社 レーザ顕微鏡
JP2008225095A (ja) * 2007-03-13 2008-09-25 Olympus Corp 光走査型観察装置
JP5354938B2 (ja) * 2007-05-02 2013-11-27 オリンパス株式会社 蛍光顕微鏡装置
US8068899B2 (en) * 2007-07-03 2011-11-29 The Board Of Trustees Of The Leland Stanford Junior University Method and system of using intrinsic-based photosensing with high-speed line scanning for characterization of biological thick tissue including muscle
KR100988471B1 (ko) * 2007-07-06 2010-10-18 전자부품연구원 실시간 세포 분석 장치 및 이를 이용한 세포의 대사 측정방법
EP2042907A1 (en) * 2007-09-26 2009-04-01 Koninklijke Philips Electronics N.V. Device and method for optical micromanipulation
JP2009109787A (ja) * 2007-10-31 2009-05-21 Olympus Corp レーザー走査型顕微鏡
DE102007055530A1 (de) * 2007-11-21 2009-05-28 Carl Zeiss Ag Laserstrahlbearbeitung
KR100937219B1 (ko) * 2007-12-14 2010-01-20 광주과학기술원 외부 자극에 의한 광학적 분자 영상 시스템
US7834259B2 (en) * 2008-04-10 2010-11-16 Ego Industries, Inc. Adjustable folding leg for bass drum
JP2010286799A (ja) * 2008-11-21 2010-12-24 Nikon Corp 走査型顕微鏡
WO2010095263A1 (ja) * 2009-02-23 2010-08-26 オリンパス株式会社 レーザ顕微鏡
US9060687B2 (en) 2009-10-02 2015-06-23 Sharp Kabushiki Kaisha Device for monitoring blood vessel conditions and method for monitoring same
JP5554965B2 (ja) 2009-11-06 2014-07-23 オリンパス株式会社 位相変調型空間光変調器を用いたレーザ顕微鏡
JP5591007B2 (ja) * 2009-11-20 2014-09-17 オリンパス株式会社 顕微鏡装置
WO2011114578A1 (ja) * 2010-03-19 2011-09-22 シャープ株式会社 測定装置および測定方法、ならびに、測定結果処理装置、測定システム、測定結果処理方法、制御プログラムおよび記録媒体
JP5555061B2 (ja) 2010-06-09 2014-07-23 オリンパス株式会社 観察装置および観察方法
WO2012002542A1 (ja) * 2010-07-01 2012-01-05 株式会社ニコン 光学部材および顕微鏡
JP5616824B2 (ja) 2011-03-10 2014-10-29 オリンパス株式会社 顕微鏡装置
EP3640701B1 (en) 2011-10-25 2022-06-15 Daylight Solutions Inc. Infrared imaging microscope using tunable laser radiation
WO2014013912A1 (ja) * 2012-07-19 2014-01-23 株式会社ニコン 光学素子、光学装置、計測装置、及びスクリーニング装置
JP6006053B2 (ja) * 2012-09-06 2016-10-12 アストロデザイン株式会社 レーザー走査蛍光顕微鏡装置
JP6146985B2 (ja) * 2012-10-30 2017-06-14 オリンパス株式会社 顕微鏡装置
US9823451B2 (en) 2013-04-12 2017-11-21 Daylight Solutions, Inc. Infrared refractive objective lens assembly
DE112015001154T5 (de) * 2014-04-24 2016-12-08 Olympus Corporation Mikroskop und Mikroskopie-Verfahren
WO2016105693A1 (en) * 2014-11-17 2016-06-30 Bae Systems Information And Electronic Systems Integration Inc. Hybrid laser countermeasure line replaceable unit and method of upgrading therewith
WO2017046863A1 (ja) 2015-09-15 2017-03-23 オリンパス株式会社 顕微鏡および顕微鏡観察方法
JP6961603B2 (ja) * 2016-02-12 2021-11-05 マサチューセッツ インスティテュート オブ テクノロジー 切断されていない組織検体を撮像するための方法及び装置
US10394008B2 (en) 2016-10-19 2019-08-27 Cornell University Hyperspectral multiphoton microscope for biomedical applications
WO2018089839A1 (en) 2016-11-10 2018-05-17 The Trustees Of Columbia University In The City Of New York Rapid high-resolution imaging methods for large samples
JP7344281B2 (ja) 2019-03-28 2023-09-13 浜松ホトニクス株式会社 共焦点顕微鏡ユニット及び共焦点顕微鏡
DE102020006975A1 (de) * 2020-11-11 2022-05-12 Carl Zeiss Microscopy Gmbh Laser-Scanning-Mikroskop und Verfahren zum Justieren eines Laser-Scanning-Mikroskops

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3728018A (en) * 1969-11-14 1973-04-17 Xerox Corp Imaging apparatus
JPS57175093A (en) * 1981-04-20 1982-10-27 Toshiba Corp Laser working device
US4498766A (en) * 1982-03-25 1985-02-12 Becton, Dickinson And Company Light beam focal spot elongation in flow cytometry devices
US4734578A (en) * 1985-03-27 1988-03-29 Olympus Optical Co., Ltd. Two-dimensional scanning photo-electric microscope
US5034613A (en) * 1989-11-14 1991-07-23 Cornell Research Foundation, Inc. Two-photon laser microscopy
US5386112A (en) * 1990-06-29 1995-01-31 Dixon; Arthur E. Apparatus and method for transmitted-light and reflected-light imaging
JP2989330B2 (ja) * 1991-07-17 1999-12-13 レーザーテック株式会社 顕微鏡観察装置
JPH05134186A (ja) * 1991-11-13 1993-05-28 Olympus Optical Co Ltd 共焦点光学系
US5225923A (en) * 1992-07-09 1993-07-06 General Scanning, Inc. Scanning microscope employing improved scanning mechanism
US5535052A (en) * 1992-07-24 1996-07-09 Carl-Zeiss-Stiftung Laser microscope
JPH06160724A (ja) * 1992-11-17 1994-06-07 Nikon Corp フラッシュフォトリシス用顕微鏡
JP3326881B2 (ja) * 1993-06-25 2002-09-24 株式会社ニコン 走査型光学顕微鏡
JPH07199079A (ja) * 1993-12-29 1995-08-04 Olympus Optical Co Ltd 顕微測光装置
JPH07333511A (ja) * 1994-06-08 1995-12-22 Nikon Corp 顕微鏡
JPH07333515A (ja) * 1994-06-13 1995-12-22 Olympus Optical Co Ltd 走査型レーザ顕微鏡用照明装置
JP3114533B2 (ja) * 1994-11-24 2000-12-04 住友重機械工業株式会社 レーザ穴あけ加工装置及びレーザ穴あけ加工方法
US5880880A (en) * 1995-01-13 1999-03-09 The General Hospital Corp. Three-dimensional scanning confocal laser microscope

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10281699B2 (en) 2016-08-29 2019-05-07 Olympus Corporation Microscope system configured to irradiate focused light onto an area of a specimen outside of an optical axis of an objective lens

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Publication number Publication date
JPH10206742A (ja) 1998-08-07
US6094300A (en) 2000-07-25

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