JP4239166B2 - 多層観察型光学顕微鏡及び多層観察ユニット - Google Patents
多層観察型光学顕微鏡及び多層観察ユニット Download PDFInfo
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- JP4239166B2 JP4239166B2 JP2003337105A JP2003337105A JP4239166B2 JP 4239166 B2 JP4239166 B2 JP 4239166B2 JP 2003337105 A JP2003337105 A JP 2003337105A JP 2003337105 A JP2003337105 A JP 2003337105A JP 4239166 B2 JP4239166 B2 JP 4239166B2
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Classifications
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
- G02B21/08—Condensers
- G02B21/14—Condensers affording illumination for phase-contrast observation
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/06—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the phase of light
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
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- Microscoopes, Condenser (AREA)
Description
2 二重回転円板式高速共焦点スキャナー
3 高速CCDカメラ
4、6 視準化レンズ
5 収束レンズ
7 多層観察ユニット (位相変更手段)
8 蛍光位相差顕微鏡ユニット
9 マイクロレンズアレーディスク
10 ニポウディスク
11 ダイクロイックミラー
12 凸レンズ
13 駆動用モーター
14 対物レンズ
15 細胞・組織試料
16 光路折り曲げ鏡
17 レーザービーム
18 走査線
19 焦点
Claims (5)
- 光源と、
前記光源からの照射光を被観察試料内に集光する対物レンズと、
前記光源から前記対物レンズに対し照射光線を入射させる光軸中に配置された収束/視準化レンズ対と、
前記収束/視準化レンズ対の間に配置され、透過光の位相を光軸横断面の所定範囲内で変化させることによって、前記対物レンズの観察面を段階的に深度調節するための位相変更手段と、
前記光源および前記収束/視準化レンズ対の間の光軸中に共焦点スキャナーと、を備え、
前記共焦点スキャナーは、
前記光源側に配置されたマイクロレンズアレーディスクと、
前記収束/視準化ディスク側に、前記マイクロレンズアレーディスクと同軸にこれに対向配置された複数のピンホールを有するニポウディスクと、
前記マイクロレンズアレーディスクおよび前記ニポウディスクの間に配置され、光源からの照射光を透過する一方、前記被観察試料から返ってきた蛍光を反射するダイクロイックミラーと、を備え、
前記位相変更手段が段階的に光学的特性の異なる複数の位相板セグメントを配列し、各セグメントが順次光軸を横切るように設置された回転板からなることを特徴とする多層観察型光学顕微鏡。 - 前記位相変更手段が各位相板セグメントの要素をなす等方性透明膜の厚さを段階的に変化させたことにより、それらの光学的特性を異ならしめたことを特徴とする請求項1に記載の多層観察型光学顕微鏡。
- 前記位相変更手段が各位相板セグメントの要素をなす等方性透明膜の屈折率を段階的に変化させたことにより、それらの光学的特性を異ならしめたことを特徴とする請求項1に記載の多層観察型光学顕微鏡。
- 光学顕微鏡の試料台の二次元走査と、前記位相変更手段の位相走査とを同期させることにより、被観察試料の三次元動態を観察できるようにしたことを特徴とする請求項1に記載の多層観察型光学顕微鏡。
- 前記位相変更手段は、表面上に複数の位相板セグメントを備えた回転板からなり、前記複数の位相板セグメントは、それぞれ、段階的に互いに異なる光学的特性を有するとともに、前記回転板の円周方向に順次隣接するように配列されていることを特徴とする請求項1に記載の多層観察型光学顕微鏡。
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003337105A JP4239166B2 (ja) | 2002-12-27 | 2003-09-29 | 多層観察型光学顕微鏡及び多層観察ユニット |
| US10/540,600 US7366394B2 (en) | 2002-12-27 | 2003-12-24 | Multilayer observation optical microscope and multilayer observation unit |
| PCT/JP2003/016641 WO2004061515A1 (ja) | 2002-12-27 | 2003-12-24 | 多層観察型光学顕微鏡及び多層観察ユニット |
| AU2003296100A AU2003296100A1 (en) | 2002-12-27 | 2003-12-24 | Multilayer observation optical microscope and multilayer observation unit |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002379869 | 2002-12-27 | ||
| JP2003337105A JP4239166B2 (ja) | 2002-12-27 | 2003-09-29 | 多層観察型光学顕微鏡及び多層観察ユニット |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2004219987A JP2004219987A (ja) | 2004-08-05 |
| JP4239166B2 true JP4239166B2 (ja) | 2009-03-18 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003337105A Expired - Fee Related JP4239166B2 (ja) | 2002-12-27 | 2003-09-29 | 多層観察型光学顕微鏡及び多層観察ユニット |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7366394B2 (ja) |
| JP (1) | JP4239166B2 (ja) |
| AU (1) | AU2003296100A1 (ja) |
| WO (1) | WO2004061515A1 (ja) |
Families Citing this family (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4797425B2 (ja) * | 2005-04-12 | 2011-10-19 | カシオ計算機株式会社 | 光源ユニット及び投影装置 |
| EP1889111A2 (en) * | 2005-05-25 | 2008-02-20 | Massachusetts Institute of Technology | Multifocal imaging systems and methods |
| DE102005036486A1 (de) * | 2005-07-20 | 2007-01-25 | Leica Microsystems (Schweiz) Ag | Optisches Gerät mit erhöhter Schärfentiefe |
| JP2007079278A (ja) * | 2005-09-15 | 2007-03-29 | Univ Of Tokyo | 物質状態測定装置 |
| WO2007043314A1 (ja) * | 2005-10-13 | 2007-04-19 | Nikon Corporation | 顕微鏡装置 |
| US8537461B2 (en) * | 2007-11-26 | 2013-09-17 | Carl Zeiss Microimaging Gmbh | Method and configuration for the optical detection of an illuminated specimen |
| CN101903761B (zh) * | 2007-12-19 | 2015-04-22 | 皇家飞利浦电子股份有限公司 | 检测系统和方法 |
| JP5242304B2 (ja) * | 2008-09-04 | 2013-07-24 | オリンパスメディカルシステムズ株式会社 | 観測システム |
| JP5504881B2 (ja) * | 2009-12-25 | 2014-05-28 | ソニー株式会社 | 演算装置、演算方法、演算プログラム及び顕微鏡 |
| JP5056871B2 (ja) * | 2010-03-02 | 2012-10-24 | 横河電機株式会社 | 共焦点顕微鏡システム |
| JP5221614B2 (ja) * | 2010-09-17 | 2013-06-26 | 独立行政法人科学技術振興機構 | 3次元共焦点観察用装置及び観察焦点面変位・補正ユニット |
| ITTO20110298A1 (it) * | 2011-04-01 | 2012-10-02 | St Microelectronics Srl | Rilevatore ottico confocale, schiera di rilevatori e relativo procedimento di fabbricazione |
| US9104027B2 (en) * | 2012-04-27 | 2015-08-11 | Manufacturing Techniques, Inc. | Optical instrument for the simulation of atmospheric turbulence |
| US9696264B2 (en) * | 2013-04-03 | 2017-07-04 | Kla-Tencor Corporation | Apparatus and methods for determining defect depths in vertical stack memory |
| JP6318358B2 (ja) * | 2013-04-08 | 2018-05-09 | 株式会社ニューフレアテクノロジー | 照明装置および検査装置 |
| WO2015164844A1 (en) * | 2014-04-24 | 2015-10-29 | Vutara, Inc. | Super resolution microscopy |
| CN104101993B (zh) * | 2014-07-10 | 2017-04-19 | 深圳职业技术学院 | 傅立叶显微镜装置及信息共享系统及其信息共享方法 |
| US10317597B2 (en) * | 2014-08-26 | 2019-06-11 | The Board Of Trustees Of The Leland Stanford Junior University | Light-field microscopy with phase masking |
| EP3268715B1 (en) | 2015-03-11 | 2024-09-25 | TissueVision, Inc. | System and methods for serial staining and imaging |
| US10495446B2 (en) * | 2015-06-29 | 2019-12-03 | Kla-Tencor Corporation | Methods and apparatus for measuring height on a semiconductor wafer |
| EP3542142A1 (en) | 2016-11-18 | 2019-09-25 | Tissuevision, Inc. | Automated tissue section capture, indexing and storage system and methods |
| KR101900254B1 (ko) * | 2017-04-25 | 2018-09-19 | 충북대학교 산학협력단 | 홀로그램 광학소자 마이크로 렌즈 어레이를 이용한 집적영상 현미경 시스템 |
| CN115437134A (zh) * | 2022-08-30 | 2022-12-06 | 宁波礼达先导生物技术有限公司 | 一种全自动智能显微镜及图像处理方法 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08136810A (ja) | 1994-11-08 | 1996-05-31 | Hamamatsu Photonics Kk | 共焦点顕微鏡 |
| US5952562A (en) * | 1995-11-22 | 1999-09-14 | Olympus Optical Co., Ltd. | Scanning probe microscope incorporating an optical microscope |
| JP3917731B2 (ja) * | 1996-11-21 | 2007-05-23 | オリンパス株式会社 | レーザ走査顕微鏡 |
| JPH1138324A (ja) | 1997-07-23 | 1999-02-12 | Nikon Corp | レーザ走査顕微鏡 |
| JP4481397B2 (ja) * | 1999-09-07 | 2010-06-16 | オリンパス株式会社 | 光学装置及び顕微鏡 |
| DE10105391B4 (de) | 2001-02-06 | 2004-11-25 | Leica Microsystems Heidelberg Gmbh | Scanmikroskop und Modul für ein Scanmikroskop |
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2003
- 2003-09-29 JP JP2003337105A patent/JP4239166B2/ja not_active Expired - Fee Related
- 2003-12-24 AU AU2003296100A patent/AU2003296100A1/en not_active Abandoned
- 2003-12-24 US US10/540,600 patent/US7366394B2/en not_active Expired - Fee Related
- 2003-12-24 WO PCT/JP2003/016641 patent/WO2004061515A1/ja not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| WO2004061515A1 (ja) | 2004-07-22 |
| AU2003296100A1 (en) | 2004-07-29 |
| JP2004219987A (ja) | 2004-08-05 |
| US20060147176A1 (en) | 2006-07-06 |
| US7366394B2 (en) | 2008-04-29 |
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