WO1998040871A1 - Circuit pixel, afficheur, et equipement electronique a dispositif photoemetteur commande par courant - Google Patents
Circuit pixel, afficheur, et equipement electronique a dispositif photoemetteur commande par courant Download PDFInfo
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- WO1998040871A1 WO1998040871A1 PCT/JP1998/000971 JP9800971W WO9840871A1 WO 1998040871 A1 WO1998040871 A1 WO 1998040871A1 JP 9800971 W JP9800971 W JP 9800971W WO 9840871 A1 WO9840871 A1 WO 9840871A1
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- current
- emitting element
- voltage
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B44/00—Circuit arrangements for operating electroluminescent light sources
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
- G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
- G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
- G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
- G09G3/3225—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
- G09G3/3233—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix with pixel circuitry controlling the current through the light-emitting element
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/13—Active-matrix OLED [AMOLED] displays comprising photosensors that control luminance
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2300/00—Aspects of the constitution of display devices
- G09G2300/04—Structural and physical details of display devices
- G09G2300/0404—Matrix technologies
- G09G2300/0417—Special arrangements specific to the use of low carrier mobility technology
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2300/00—Aspects of the constitution of display devices
- G09G2300/08—Active matrix structure, i.e. with use of active elements, inclusive of non-linear two terminal elements, in the pixels together with light emitting or modulating elements
- G09G2300/0809—Several active elements per pixel in active matrix panels
- G09G2300/0819—Several active elements per pixel in active matrix panels used for counteracting undesired variations, e.g. feedback or autozeroing
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2300/00—Aspects of the constitution of display devices
- G09G2300/08—Active matrix structure, i.e. with use of active elements, inclusive of non-linear two terminal elements, in the pixels together with light emitting or modulating elements
- G09G2300/0809—Several active elements per pixel in active matrix panels
- G09G2300/0842—Several active elements per pixel in active matrix panels forming a memory circuit, e.g. a dynamic memory with one capacitor
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2300/00—Aspects of the constitution of display devices
- G09G2300/08—Active matrix structure, i.e. with use of active elements, inclusive of non-linear two terminal elements, in the pixels together with light emitting or modulating elements
- G09G2300/088—Active matrix structure, i.e. with use of active elements, inclusive of non-linear two terminal elements, in the pixels together with light emitting or modulating elements using a non-linear two-terminal element
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2320/00—Control of display operating conditions
- G09G2320/02—Improving the quality of display appearance
- G09G2320/0285—Improving the quality of display appearance using tables for spatial correction of display data
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2320/00—Control of display operating conditions
- G09G2320/02—Improving the quality of display appearance
- G09G2320/029—Improving the quality of display appearance by monitoring one or more pixels in the display panel, e.g. by monitoring a fixed reference pixel
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2320/00—Control of display operating conditions
- G09G2320/04—Maintaining the quality of display appearance
- G09G2320/043—Preventing or counteracting the effects of ageing
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2320/00—Control of display operating conditions
- G09G2320/04—Maintaining the quality of display appearance
- G09G2320/043—Preventing or counteracting the effects of ageing
- G09G2320/045—Compensation of drifts in the characteristics of light emitting or modulating elements
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
- G09G2330/02—Details of power systems and of start or stop of display operation
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
- G09G2330/02—Details of power systems and of start or stop of display operation
- G09G2330/028—Generation of voltages supplied to electrode drivers in a matrix display other than LCD
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2360/00—Aspects of the architecture of display systems
- G09G2360/14—Detecting light within display terminals, e.g. using a single or a plurality of photosensors
- G09G2360/145—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2360/00—Aspects of the architecture of display systems
- G09G2360/14—Detecting light within display terminals, e.g. using a single or a plurality of photosensors
- G09G2360/145—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen
- G09G2360/147—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen the originated light output being determined for each pixel
- G09G2360/148—Detecting light within display terminals, e.g. using a single or a plurality of photosensors the light originating from the display screen the originated light output being determined for each pixel the light being detected by light detection means within each pixel
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
- G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
- G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/121—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
- H10K59/1213—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements the pixel elements being TFTs
Definitions
- the present invention relates to a current-driven light-emitting element such as an organic electroluminescence element (hereinafter, referred to as an organic EL element), a pixel circuit including a driving element such as a thin-film transistor for driving the light-emitting element, and such a pixel circuit.
- a current-driven light-emitting element such as an organic electroluminescence element (hereinafter, referred to as an organic EL element)
- a pixel circuit including a driving element such as a thin-film transistor for driving the light-emitting element
- the present invention relates to the technical field of a display device configured with each pixel and an electronic device including the same, and in particular, a drive circuit and a display capable of correcting the influence of aging of a current-driven light-emitting element and a drive element.
- the present invention relates to a device and a technical field of an electronic device provided with the device. Background art
- a display device that drives a current-driven light-emitting element such as an organic EL element using a thin film transistor (hereinafter, referred to as a TFT) as a driving element is configured as follows, for example. . That is, a data signal and a scanning signal corresponding to an image to be displayed are supplied from the scanning line driving circuit and the signal line driving circuit to the signal lines and the scanning lines in the display area, respectively. On the other hand, from the common electrode driving circuit and the counter electrode driving circuit, between the pixel electrode and the counter electrode in each pixel via driving TFTs provided in each of a plurality of pixels defined in a matrix in the display area. Voltage is applied.
- the current driving type disposed between the pixel electrode and the counter electrode according to the voltage of the data signal supplied from the signal line. It is configured to control the current flowing through the light emitting element.
- each pixel is provided with a switching TFT, and when a scanning signal is supplied to the gate from a scanning line, a data signal from the signal line is transmitted through the source and drain to the driving TFT. Supply to the gate. The conductance between the source and the drain of the driving TFT is controlled (changed) according to the voltage of the data signal supplied to the gate (that is, the gate voltage). At this time, the gate P98 / 00971
- the voltage is held by the storage capacitor connected to the gate for a period longer than the period in which the data signal is supplied.
- Such organic EL devices equipped with a driving TFT are current-controlled light-emitting devices for realizing large, high-definition, wide viewing angle, and low power consumption display panels (hereinafter referred to as TFT-OE LDs). It is promising. Disclosure of the invention
- 05-019234 discloses that an EL element is used as a back light source (backlight) of a liquid crystal display panel, and the brightness of the entire liquid crystal display panel illuminated from behind by the EL element is reduced. There is disclosed a technique of detecting the luminance of the EL element so as not to prevent the deterioration of the entire rear light source. However, this 0 7
- This technology relates to a liquid crystal display panel, and an EL element is not provided in each pixel as a display element, but is simply used as a back light source, and is basically a technical field of the present invention. It concerns different technical fields.
- a display device including each pixel provided with a current-driven light-emitting element such as an organic EL element an effective technique for correcting the above-mentioned deterioration over time has not been proposed.
- the life of the display device is extended or the display quality is improved by compensating for the deterioration over time in the current-driven light-emitting element and the driving TFT.
- the technical problem itself of making this is not recognized by those skilled in the art.
- the present invention provides a method for correcting the aging of a current-driven light-emitting element when the aging deteriorates with a decrease in the amount of current or the amount of light emission, or when the aging deteriorates with variation. It is a technical object of the present invention to provide a pixel circuit and a display device including a current-driven light emitting element capable of reducing a reduction in image quality and screen unevenness, and an electronic apparatus including the same.
- the first display device of the present invention includes a current-driven light-emitting element provided for each pixel, and a current-driven light-emitting element provided for each pixel and flowing to the light-emitting element.
- a drive element for controlling a drive current in accordance with the voltage of the data signal; a power supply unit for supplying power for flowing the drive current to the light emitting element via the drive element via a power supply wiring;
- a signal wiring driving unit that supplies the data signal to the driving element via a signal wiring; and a driving current flowing through the light emitting element when a data signal of a predetermined voltage is supplied to the driving element via the signal wiring.
- the voltage of at least one of the power supply in the power supply unit and the data signal in the signal wiring drive unit is adjusted so that at least one of the current amount and the light emission amount of the light emitted from the light emitting element approaches a predetermined reference value.
- the drive current flows to the light emitting element through the drive element by the power supply from the power supply unit.
- a data signal is supplied to the driving element from the signal wiring driving unit via the signal wiring.
- the drive current is controlled by the drive element according to the voltage of the data signal.
- the current-driven light-emitting element emits light according to the voltage of the data signal by the drive current.
- the voltage adjusting unit determines the amount of driving current flowing through the light emitting element or the amount of light emitted from the light emitting element.
- the voltage of at least one of the power supply in the power supply unit and the data signal in the signal wiring drive unit is adjusted so as to approach a predetermined reference value (that is, the reference current amount or the reference light emission amount).
- the driving current hardly flows or the light emitting element hardly emits light.
- the amount or luminescence is almost constant. That is, a decrease in the amount of drive current or the amount of light emission due to the deterioration of the light emitting element or the drive element over time can be appropriately corrected by voltage adjustment by the voltage adjustment unit.
- the voltage adjustment by the voltage adjustment unit is individually performed on a plurality of pixels, even if the voltage-current characteristics and the current emission characteristics of the light-emitting element and the driving element vary among the plurality of pixels, the voltage adjustment is performed.
- the amount of drive current or the amount of emitted light in the light emitting elements of a plurality of pixels can be made substantially constant. That is, variations in the amount of drive current and the amount of light emission due to variations in the characteristics of the light emitting element and the drive element can be corrected as appropriate.
- the screen luminance is deteriorated due to aging of each element and variation in characteristics. It is possible to reduce deterioration and screen unevenness.
- the driving element may be configured such that the driving current is supplied to a gate through a source and a drain, the conductance of which is controlled by a gate voltage while the conductance is controlled by a gate voltage. It consists of a flowing thin film transistor.
- the conductance between the source and the drain is controlled (changed) by the gate voltage. Therefore, the drive current flowing through the light emitting element through between the source and the drain can be controlled according to the voltage of the data signal.
- the voltage adjustment unit may be a current amount measurement unit that measures a current amount of the drive current when the data signal of the predetermined voltage is supplied to the drive element. And a voltage controller for adjusting at least one of the voltages so that the measured current amount approaches a preset reference current amount. / JP
- the current amount of the drive current when the data signal of the predetermined voltage is supplied to the drive element is measured by the current amount measurement unit. Then, the voltage of the data signal or the power supply voltage of the drive current is adjusted by the voltage control unit such that the measured current amount approaches the preset reference current amount.
- the driving current in the light emitting element becomes substantially constant even if the driving current becomes difficult to flow. Further, even if the voltage-current characteristics of the light emitting element and the driving element vary among a plurality of pixels, if the voltage adjustment of the data signal is performed individually for each pixel, the light emitting element of the plurality of pixels can be controlled. The amount of drive current can be made substantially constant.
- the voltage adjustment unit may include a light emission amount measurement unit that measures the light emission amount when the data signal of the predetermined voltage is supplied to the drive element.
- a voltage controller that adjusts the at least one voltage so that the measured light emission amount approaches a preset reference light emission amount.
- the light emission amount of the light emitting element when the data signal of the predetermined voltage is supplied to the drive element is measured by the light emission amount measuring unit. Then, the voltage of the data signal or the power supply voltage of the drive current is adjusted by the voltage control unit such that the measured light emission amount approaches a preset reference light emission amount.
- the light emission amount of the light-emitting element is almost constant. Furthermore, even if the voltage-current characteristics and the current light-emitting characteristics of the light emitting element and the driving element vary among a plurality of pixels, the voltage adjustment of the data signal is performed individually for each pixel. The drive current amount in the light emitting element of the pixel can be made substantially constant.
- the display device further includes a controller that controls the voltage adjustment unit to adjust the at least one voltage during a non-display period prior to a display period.
- the voltage of the data signal or the power supply voltage of the drive current is adjusted by the voltage adjustment unit during the non-display period prior to the display period. Therefore, it is not necessary to occupy a part of the display period for measurement, T / JP98 / 00971
- the voltage adjustment is appropriately performed, and the adjustment operation does not adversely affect the image display during the display period.
- the power adjustment unit in view of the speed of deterioration of the light-emitting element and the driving element over time, it is often sufficient to perform the adjustment by the power adjustment unit every non-display period such as when the power is turned on.
- the second display device of the present invention includes a current-driven display light-emitting element provided for each pixel in a display area, and a light-emitting element for each pixel.
- a drive element for controlling a drive current flowing through the display light-emitting element in accordance with the voltage of the data signal; and a power supply wiring for supplying the drive current to the display light-emitting element via the drive element.
- a power supply unit for supplying the data signal to the drive element via a signal wiring; a signal line drive unit for providing the data signal to the drive element via a signal line; And a power supply in the power supply section and the signal wiring drive section such that at least one of the amount of current and the amount of light emission in the monitor light emitting element approaches a predetermined reference value.
- the drive current flows to the display light emitting element through the drive element by the power supply from the power supply unit.
- a data signal is supplied to the driving element from the signal wiring driving unit via the signal wiring.
- the driving element controls the driving current flowing through the display light emitting element according to the voltage of the data signal.
- the current-driven display light-emitting element emits light according to the voltage of the data signal by the drive current.
- the current adjusting type current monitor is driven by the voltage adjusting unit in the same manner as the display light emitting element.
- the voltage of at least one of the power supply in the power supply unit and the data signal in the signal wiring drive unit is adjusted such that the amount of current or light emission in the light emitting element approaches a predetermined reference value (that is, the reference current amount or reference light emission amount).
- a predetermined reference value that is, the reference current amount or reference light emission amount.
- the drive current amount or the light emission amount in the display light emitting element is substantially constant. That is, a decrease in the amount of drive current or light emission due to the deterioration of the display light emitting element or the drive element over time can be appropriately corrected by adjusting the voltage of the voltage adjusting unit based on the current amount or light emission amount in the monitor light emitting element.
- the voltage adjustment by the voltage adjustment unit is individually performed on a plurality of pixels, even if the voltage-current characteristics and the current emission characteristics of the light-emitting element and the driving element vary among the plurality of pixels, the voltage adjustment is performed.
- the amount of drive current or the amount of emitted light in the light emitting elements of a plurality of pixels can be made substantially constant. That is, it is possible to appropriately correct variations in the amount of driving current and the amount of light emission due to variations in the characteristics of the light emitting element and the driving element.
- the screen luminance is deteriorated due to deterioration with time and characteristic variation of each element. It is possible to reduce deterioration and screen unevenness.
- the drive current flows through a source and a drain, the conductance of which is controlled by a gate voltage while the gate is supplied with the data signal. It consists of a thin film transistor. According to this aspect, when a data signal is supplied to the gate of the thin film transistor, the conductance between the source and the drain is controlled (changed) by the gate voltage. Therefore, the driving current flowing through the light emitting element for display via the source and the drain can be controlled according to the voltage of the data signal.
- the voltage adjustment unit includes a current amount measurement unit that measures a current amount in the monitor light emitting element; and a reference current in which the measured current amount is set in advance.
- a voltage control unit that adjusts the at least one voltage to approach the amount.
- the amount of current in the light emitting element for monitoring is measured by the current amount measuring unit. Then, the voltage of the overnight signal or the power supply voltage of the drive current is adjusted by the voltage control unit such that the measured current amount approaches the preset reference current amount. Therefore, even if the resistance of the light emitting element or the driving element increases due to the deterioration of the light emitting element or the driving element with time, the driving current in the light emitting element becomes substantially constant even if the driving current becomes difficult to flow. Furthermore, even if the voltage-current characteristics of the light-emitting element and the driving element vary among a plurality of pixels, if the voltage adjustment is performed individually for each pixel, the driving current in the light-emitting element of the plurality of pixels can be improved. The volume can be almost constant.
- the voltage adjustment unit may include a light emission amount measurement unit that measures a light emission amount of the monitor light emitting element, and a reference light emission in which the measured light emission amount is set in advance.
- a voltage control unit that adjusts the at least one voltage to approach the amount.
- the light emission amount of the monitor light emitting element is measured by the light emission amount measurement unit. Then, the voltage of the data signal or the power supply voltage of the drive current is adjusted by the voltage control unit such that the measured light emission amount approaches the preset reference light emission amount.
- the light emission amount of the light emitting element is almost constant. Furthermore, even if the voltage-current characteristics and the current emission characteristics of the light-emitting element and the driving element vary among a plurality of pixels, the voltage adjustment of the data signal is performed individually for each pixel. The drive current amount of the light emitting element can be made substantially constant.
- the display device further includes a controller that controls the voltage adjustment unit to adjust the at least one voltage in a non-display period prior to a display period.
- the voltage of the data signal or the power supply voltage of the drive current is adjusted by the voltage adjustment unit during the non-display period prior to the display period. Therefore, even though the voltage is appropriately adjusted by the voltage adjusting unit, the adjusting operation does not adversely affect the image display in the display period.
- the display light emitting element and the monitor light emitting element are formed on the same substrate.
- the display light emitting element and the monitor light emitting element are similar or similar.
- the tendency of aging of both can be similar or similar. Therefore, it is possible to accurately adjust the voltage of the display light emitting element based on the amount of current and the amount of light emitted from the monitor light emitting element.
- the display light-emitting element and the monitor light-emitting element are formed by the same manufacturing process.
- the characteristics of the display light-emitting element and the characteristics of the monitor light-emitting element can be made similar or similar relatively easily. Therefore, the tendency of deterioration with time in both of them can be made similar or similar.
- the power supply unit supplies a power supply for supplying the driving current to both the display light emitting element and the monitor light emitting element during a display period.
- the tendency of the temporal deterioration in both of them can be made similar or similar.
- the pixel circuit of the present invention includes at least a signal wiring to which a data signal is supplied and a first and a second power supply line to which power for supplying a drive current are supplied.
- a pixel circuit provided in each of a plurality of pixels in a matrix forming a display area of the provided display device, wherein the current-driven light-emitting element is connected between the first and second power supply lines; Controlling a driving current flowing through the light emitting element via a source and a drain connected in series with the light emitting element between first and second power supply lines in accordance with a voltage of the data signal supplied to a gate; (1) a thin-film transistor (a thin-film transistor for current control), and a drive for increasing the drive current according to at least one of a decrease in the amount of the drive current and a decrease in the amount of light emitted from the light emitting element. Characterized by comprising a current compensator.
- the drive current flows to the light emitting element via the source and the drain of the first thin film transistor by the power supply from the first and second power supply lines.
- a data signal is supplied to the gate of the first thin film transistor via the signal wiring.
- a conductor between the source and the drain of the first thin film transistor is provided.
- the sense voltage is controlled (changed) by the gate voltage, and the drive current flowing through the light emitting element is controlled according to the data signal voltage.
- the current-driven light-emitting element emits light according to the voltage of the data signal by the drive current.
- the drive current flowing in this manner is increased by the drive current compensating element in accordance with a decrease in the amount of the drive current or the amount of light emitted from the light emitting element.
- the resistance of the light-emitting element or the first thin film transistor increases and the driving current hardly flows, or the light-emitting element hardly emits light.
- the amount of drive current or the amount of light emission is almost constant. That is, it is possible to automatically correct a decrease in the amount of drive current or light emission due to temporal deterioration of the light emitting element or the first thin film transistor by an action of increasing the drive current due to a decrease in resistance by the drive current compensating element.
- the plurality of pixels can be made substantially constant. That is, it is possible to automatically correct variations in the amount of drive current and the amount of light emission due to variations in the characteristics of the light emitting element and the first thin film transistor.
- the pixel circuit of the present invention in a pixel circuit in which a current-driven type light-emitting element such as an organic EL element is driven by the first thin film transistor, deterioration of the screen luminance due to deterioration with time and variation in characteristics of each element is prevented. Screen unevenness can be reduced.
- the signal wiring includes a signal line to which the data signal is supplied and a scanning line to which a scanning signal is supplied.
- the semiconductor device further includes a second thin film transistor (a thin film transistor for switching) connected so that the data signal is supplied to a gate of the first thin film transistor via a drain.
- the drive current compensating element may be configured such that the first power supply line and the second power supply line depend on a relationship between a voltage at both ends of the light emitting element and a current amount of the drive current. Adjust the resistance between the power supply line.
- the resistance between the first power supply line and the second power supply line is adjusted by the drive current compensation element depending on the relationship between the voltage at both ends of the light emitting element and the amount of drive current. Accordingly, the drive current is increased in accordance with the decrease in the amount of the drive current.
- the potential of the first power supply line is set to be higher than the potential of the second power supply line, and the drive current compensation is performed.
- the n-channel device has a gate connected to an electrode on the first power supply line side of the light emitting device, and a source and a drain connected in series with the light emitting device between the light emitting device and the second power supply line. It may be configured to include a first correction thin film transistor of the type.
- the resistance between the first power supply line and the second power supply line is adjusted by the n-channel type first correction thin film transistor, and the drive current increases as the amount of drive current decreases Let me do.
- the potential of the first power supply line is set to a lower potential than the second power supply line
- the dynamic current compensating element has a gate connected to the electrode on the first power supply line side of the light emitting element, and a source and a drain connected between the light emitting element and the second power supply line in series with the light emitting element. It may be configured to include a P-channel first correction thin film transistor.
- the resistance between the first power supply line and the second power supply line is adjusted by the p-channel type first correction thin film transistor, and the drive current increases as the amount of drive current decreases Let me do.
- the potential of the first power supply line is set to a higher potential than the second power supply line
- the dynamic current compensating element has a gate connected to the electrode on the second power supply line side of the light emitting element, and a source and a drain connected between the light emitting element and the first power supply line in series with the light emitting element.
- Configured to include a second P-channel correction thin film transistor May be.
- the resistance between the first power supply line and the second power supply line is adjusted by the p-channel type second correction thin film transistor, and the drive current increases as the amount of drive current decreases Let me do.
- the potential of the first power supply line is set to a lower potential than the second power supply line
- the dynamic current compensating element has a gate connected to the electrode on the second power supply line side of the light emitting element, and a source and a drain connected between the light emitting element and the first power supply line in series with the light emitting element. Further, it may be configured to include an n-channel type second correction thin film transistor.
- the resistance between the first power supply line and the second power supply line is adjusted by the n-channel type second correction thin film transistor, and the drive current increases as the amount of drive current decreases Let me do.
- the pixel circuit further includes a storage capacitor connected to a gate of the first thin film transistor and configured to hold a gate voltage of the first thin film transistor.
- the gate voltage of the first thin film transistor after the data signal is supplied is held by the holding capacitor. Therefore, the drive current can flow through the source and the drain of the first thin film transistor over a period longer than the period of providing the data signal.
- the drive current compensating element may be configured such that the first and second power supply lines depend on a relationship between a voltage across the light emitting element and a current amount of the drive current. May be configured to adjust the resistance between one of them and the storage capacitor. According to this aspect, the resistance between the first or second power supply line and the storage capacitor is adjusted by the drive current compensating element depending on the relationship between the voltage across the light emitting element and the amount of drive current. Accordingly, the drive current is increased in accordance with a decrease in the amount of the drive current.
- the potential of the first power supply line is set to a higher potential than the second power supply line
- the driving The current compensating element is the same as the first thin film transistor, wherein a gate is connected to the electrode on the first power supply line side of the light emitting element, and a source and a drain are connected between the storage capacitor and the first power supply line. It may be configured to include an n or p channel type third correction thin film transistor.
- the resistance between the first or second power supply line and the storage capacitor is adjusted by the same n- or p-channel third correction thin film transistor as the first thin-film transistor, and the resistance from the first power supply line to the third power supply line is adjusted.
- the drive current is increased in accordance with a decrease in the amount of the drive current flowing toward the power supply line.
- the potential of the first power supply line is set to a lower potential than the second power supply line
- the driving current compensating element wherein a gate is connected to the electrode on the first power supply line side of the light emitting element, and a source and a drain are connected between the storage capacitor and the first power supply line.
- a third correction thin film transistor of the same n or p channel type as the thin film transistor may be included.
- the resistance between the first or second power supply line and the storage capacitor is adjusted by the same n- or p-channel type third correction thin film transistor as in the first thin-film transistor, and the resistance from the second power supply line is adjusted.
- the drive current is increased in accordance with a decrease in the amount of the drive current flowing toward the first power supply line.
- the potential of the first power supply line is set to a higher potential than the second power supply line
- the drive current compensating element wherein a gate is connected to the electrode on the first power supply line side of the light emitting element, and a source and a drain are connected between the storage capacitor and the second power supply line; It may be configured to include an n- or p-channel type fourth correction thin film transistor opposite to the first thin film transistor.
- the resistance between the first or second power supply line and the storage capacitor is adjusted by the n- or p-channel type fourth correction thin film transistor opposite to the first thin-film transistor, and the first power supply is adjusted.
- the drive current is increased in accordance with a decrease in the amount of the drive current flowing from the electric wire toward the second power supply line.
- the resistance between the power supply line and the storage capacitor is adjusted.
- the potential of the first power supply line is set to be lower than the potential of the second power supply line, and the drive current compensating element has a gate connected to an electrode of the light emitting element on the first power supply line side.
- a source and a drain connected between the storage capacitor and the second power supply line, and configured to include an n- or p-channel type fourth correction thin-film transistor opposite to the first thin-film transistor. Is also good.
- the resistance between the first or second power supply line and the storage capacitor is adjusted by an n- or p-channel type fourth correction thin film transistor opposite to the first thin-film transistor, and the second supply voltage is adjusted.
- the drive current is increased in accordance with a decrease in the amount of the drive current flowing from the electric wire toward the first power supply line.
- the drive current compensating element may be configured such that the first power supply line and the second power supply line depend on a relationship between a voltage between both ends of the light emitting element and the light emission amount. Adjust the resistance between.
- the resistance between the first power supply line and the second power supply line is adjusted by the drive current compensation element depending on the relationship between the voltage at both ends of the light emitting element and the amount of light emission.
- the drive current is increased in accordance with a decrease in the light emission amount of the light emitting element.
- the drive current compensating element may be configured such that the first and second power supply lines depend on a relationship between a voltage between both ends of the light emitting element and the light emission amount. May be configured to adjust the resistance between one of them and the storage capacitor. According to this aspect, the resistance between the first or second power supply line and the storage capacitor is adjusted by the drive current compensating element depending on the relationship between the voltage at both ends of the light emitting element and the light emission amount. The drive current is increased in accordance with the decrease in the light emission amount.
- the potential of the first power supply line is higher than that of the second power supply line.
- the first thin film transistor is set to a high potential
- the first thin film transistor is a p-channel type
- the driving current compensation element is a first correction thin film connected between the storage capacitor and the first power supply line. It may be configured to include a photo diode.
- the resistance between the first or second power supply line and the storage capacitor is adjusted by the first correction thin-film photodiode, and the resistance from the first power supply line to the first p-channel thin film transistor is adjusted.
- the drive current flowing toward the power supply line Increased.
- the potential of the first power supply line is The first thin film transistor is a p-channel type, and the drive current compensation element has a source and a drain connected between the storage capacitor and the first power supply line. It may be configured to include a fifth correction thin film transistor.
- the resistance between the first or second power supply line and the storage capacitor is adjusted by the fifth correction thin film transistor, and the p-channel first thin film transistor is connected from the first power supply line to the second power supply line.
- the drive current flowing toward is increased as the light emission amount decreases.
- the potential of the first power supply line is equal to the second power supply.
- the first thin film transistor is an n-channel type
- the driving current compensating element is a first thin film transistor connected between the storage capacitor and the first power supply line. It may be configured to include a correction thin film photodiode.
- the resistance between the first or second power supply line and the storage capacitor is adjusted by the first correction thin-film photodiode, and the resistance from the second power supply line to the n-channel first thin film transistor is adjusted.
- the drive current flowing toward the power supply line is increased according to the decrease in the light emission amount.
- the potential of the first power supply line is equal to the second power supply.
- the first thin film transistor is an n-channel type, and the drive current compensation element has a source and a drain connected between the storage capacitor and the first power supply line. It may be configured to include a fifth correction thin film transistor.
- the resistance between the first or second power supply line and the storage capacitor is adjusted by the fifth correction thin film transistor, and the n-channel first thin film transistor is connected to the first power supply line from the second power supply line.
- the potential of the first power supply line is equal to the second power supply.
- a first thin film transistor is an n-channel type
- the drive current compensating element is a second thin film transistor connected between the storage capacitor and the second power supply line. It may be configured to include a correction thin film photodiode.
- the resistance between the first or second power supply line and the storage capacitor is adjusted by the second correction thin-film photodiode, and the resistance from the first power supply line to the second power supply line with respect to the n-channel first thin film transistor is adjusted.
- the drive current flowing toward the power supply line is increased according to the decrease in the light emission amount.
- the potential of the first power supply line is equal to the potential of the second power supply line.
- the first thin film transistor is an n-channel type, and a source and a drain of the drive current compensation element are connected between the storage capacitor and the second power supply line. It may be configured to include a sixth correction thin film transistor.
- the resistance between the first or second power supply line and the storage capacitor is adjusted by the sixth correction thin film transistor, and the n-channel first thin film transistor is connected from the first power supply line to the second power supply line.
- the drive current flowing toward is increased as the light emission amount decreases.
- the potential of the first power supply line is equal to the potential of the second power supply line.
- the first thin film transistor is a p-channel type
- the drive current compensation element is a second thin film transistor connected between the storage capacitor and the second power supply line. It may be configured to include a correction thin film photodiode.
- the resistance between the first or second power supply line and the storage capacitor is adjusted by the second correction thin-film photodiode, and the first power supply line is connected to the first p-channel thin film transistor by the second correction thin film photodiode.
- the drive current flowing toward the feed line is increased as the amount of light emission decreases.
- the potential of the first power supply line is equal to the potential of the second power supply line.
- the first thin film transistor is a p-channel type, and the drive current compensation element has a source and a drain connected between the storage capacitor and the second power supply line. It may be configured to include a sixth correction thin film transistor.
- the resistance between the first or second power supply line and the storage capacitor is adjusted by the sixth correction thin film transistor, and the p-channel first thin film transistor is connected from the second power supply line to the first power supply line.
- the drive current flowing toward is increased as the light emission amount decreases.
- the drive current compensation element includes a thin film transistor formed by the same manufacturing process as that of the first thin film transistor.
- the third display device of the present invention includes a current-driven light-emitting element provided for each pixel, and the light-emitting element provided for each pixel.
- a drive element for controlling a drive current flowing through the drive element in accordance with a voltage of a data signal a power supply unit for supplying power for flowing the drive current to the light emitting element via the drive element via a power supply wiring, and an image signal
- a signal line driving circuit for supplying a data signal having a voltage corresponding to an image signal input from a source to the driving element via a signal line; and a driving signal for supplying a data signal of a predetermined voltage via the signal line to the driving element.
- a measuring unit that measures at least one of a current amount of a driving current flowing through the light emitting element when supplied to the light emitting element and a light emission amount of light emitted from the light emitting element; and the image signal source and the signal line driving circuit. Intervening between A correction circuit that corrects the image signal so that at least one of the measured current amount and the light emission amount approaches a predetermined reference value and then inputs the corrected image signal to the signal line driving circuit.
- the drive current flows to the light emitting element through the drive element by the power supply from the power supply unit.
- the driving element receives a data signal input from the image signal source and having a voltage corresponding to the image signal from the signal line driving circuit via the signal line. Supplied.
- the driving element controls the driving current flowing through the light emitting element according to the voltage of the data signal.
- the current-driven light-emitting element emits light according to the voltage of the data signal by the drive current.
- the measuring unit detects the amount of driving current flowing through the light emitting element or the amount of light emission of the light emitting element. Measured.
- the image signal is corrected by the correction circuit so that the current amount or the light emission amount thus measured approaches a predetermined reference value (that is, the reference current amount or the reference light emission amount). Then, the corrected image signal is input to the signal line driving circuit. Therefore, a data signal having a voltage corresponding to the corrected image signal is supplied to the drive element from the signal line drive circuit via the signal line.
- the driving current hardly flows or the light emitting element hardly emits light.
- the amount or luminescence is almost constant.
- the correction by the correction circuit is performed individually for a plurality of pixels, even if the voltage-current characteristics and the current emission characteristics of the light-emitting element and the driving element vary among the plurality of pixels, the plurality of pixels can be used.
- the amount of drive current or the amount of light emission in the light emitting element of the pixel can be made substantially constant.
- the screen luminance is deteriorated due to aging of each element and variation in characteristics. It is possible to reduce deterioration and screen unevenness.
- the driving element is configured to supply the data signal to a gate and to control the driving via a source and a drain whose conductance is controlled by a gate voltage. It consists of a thin film transistor through which current flows. According to this aspect, when a data signal is supplied to the gate of the thin film transistor, the conductance between the source and the drain is controlled (changed) by the gate voltage. Therefore, the drive current flowing through the light emitting element through between the source and the drain can be controlled according to the voltage of the data signal.
- the display device further includes a memory device that stores at least one of the measured current amount and the measured light emission amount
- the correction circuit includes: The image signal is corrected based on at least one of the stored current amount and light emission amount.
- the measured current amount or light emission amount is stored in the memory device.
- the image signal is corrected by the correction circuit based on the stored current amount or light emission amount. Therefore, it is possible to perform correction in the display period by measuring in the non-display period that is temporally before and after the display period. Further, it is possible to perform correction for a plurality of pixels using the same measurement unit and correction circuit.
- the power supply line is provided corresponding to a pixel column, and the measuring unit measures a current amount of the drive current, and A switching switch connected to the power supply unit side during a display period and connected to the measurement unit side during a non-display period; a shift register for sequentially outputting pulses sequentially corresponding to each of the power supply wirings; A common line drive circuit including a transmission switch for sequentially controlling conduction between each of the power supply lines and the measurement unit in response to the sequential pulse during the non-display period.
- the power supply wiring is connected to the power supply unit side by the switching switch. Accordingly, the light-emitting element receives light from the power supply unit and emits light to perform a normal display operation.
- the power supply line is connected to the measurement unit side by the changeover switch. At this time, from the shift register, a pulse is sequentially output sequentially corresponding to each of the power supply wirings, and the transmission switch sequentially establishes conduction between each of the power supply wirings and the measuring unit according to the pulse. Then, the measuring section measures the amount of the drive current.
- the amount of current can be measured for each pixel column, and further, the light emitting element is driven for each row using a scanning signal. If this is adopted, it is possible to measure the amount of current for each pixel. As a result, correction can be performed for each pixel column or each pixel.
- the measurement unit measures the light emission amount, and is provided corresponding to a pixel column, and transmits an electric signal indicating the light emission amount to the measurement unit.
- a shift beam that sequentially outputs pulses sequentially corresponding to each of the inspection beams; and a continuity between each of the inspection beams and the measurement unit according to the sequential pulses during a non-display period.
- a light detection driving circuit including a transmission switch for controlling sequentially.
- the shift register sequentially outputs pulses sequentially in response to each of the inspection light beams, and sequentially transmits the pulses between each of the inspection light beams and the measurement unit according to the pulse by the transmission switch. Are sequentially conducted. Then, the light emission amount is measured by the measuring unit. Therefore, by sequentially selecting the inspection light beam provided corresponding to the pixel column as a measurement object, it becomes possible to measure the light emission amount for each pixel column, and further, to drive the light emitting elements for each row using the scanning signal. If is adopted, it becomes possible to measure the light emission amount for each pixel. As a result, correction can be performed for each pixel column or each pixel.
- the measuring unit measures the light emission amount by a photoexcitation current of a semiconductor element.
- the light emission amount of the light emitting element is measured by the measurement unit by the photoexcitation current of the semiconductor element, and correction is performed based on the measured light emission amount. Therefore, highly accurate measurement can be performed using a relatively simple element.
- the semiconductor element may be a PIN diode.
- the light emission amount of the light emitting element can be measured by the photoexcitation current at the PIN junction of the PIN diode.
- the semiconductor element may be a field-effect transistor.
- the light emission amount of the light emitting element can be measured by the photoexcitation current in the channel portion of the field effect transistor.
- the driving element includes a thin film transistor, and the thin film transistor and the semiconductor element are formed in the same process. May be.
- the driving element and the semiconductor element can be formed in the same step, which is advantageous in manufacturing.
- the driving element is formed of a polycrystalline silicon thin film transistor formed by a low temperature process at 600 ° C or lower.
- One driving element can be manufactured at low cost.
- the light-emitting element is an organic electroluminescence element formed by an inkjet process.
- a light-emitting element having high luminous efficiency and long life can be manufactured, and patterning on a substrate can be easily performed. Furthermore, since the amount of waste material during the process is small and the cost of the process equipment is relatively low, the cost of the display device can be reduced.
- the measuring unit measures at least one of the driving current and the light emission amount for each pixel, and the correction circuit performs the image processing for each pixel. Correct the signal.
- the measurement of the drive current or the light emission amount is performed for each pixel by the measurement unit, and the image signal is corrected for each pixel by the correction circuit. Therefore, even if the voltage-current characteristics and the current light-emitting characteristics of the light emitting element and the driving element vary among a plurality of pixels, such as the variation due to the difference in the degree of deterioration due to the manufacturing variation or the display history, the plurality of pixels may vary.
- the amount of drive current or the amount of light emission in the light emitting element of the pixel can be made substantially constant. As a result, it is possible to reduce the screen unevenness due to the characteristic variation of each element in detail.
- the measurement unit measures at least one of the drive current and the light emission amount for each predetermined unit including a plurality of pixels
- the correction circuit includes: The image signal is corrected for each predetermined unit.
- the measurement of the drive current or the light emission amount is performed by the measuring unit for each predetermined unit including a plurality of pixels, and the image signal is corrected by the correction circuit for each predetermined unit.
- the drive current amount or the light emission amount in the plurality of predetermined units of light emitting elements can be made substantially constant. As a result, it is possible to efficiently reduce the screen unevenness due to the characteristic variation of each element. Then, such measurement and correction are compared with the case where measurement and correction are performed for each pixel. Thus, it can be performed in a relatively short time and easily.
- the correction circuit corrects the image signal by converting a signal level of the image signal from a predetermined signal level to another predetermined signal level. I do.
- the signal level of the image signal is converted from the predetermined signal level to another predetermined signal level, so that the signal level different from the predetermined signal level is changed.
- the configuration of the signal line driver circuit can be simplified, and the number of types of power supplies required in the signal line driver circuit can be reduced.
- the circuit can be simplified, the operation can be speeded up, and the current consumption can be reduced.
- the fourth display device is characterized in that the pixel circuits according to the various aspects of the present invention described above are provided for each pixel in order to solve the above technical problem.
- the fourth display device since the pixel circuit of the present invention is provided for each pixel, a high-definition display device in which the luminance of the light-emitting element and the driving element deteriorates over time, and the screen luminance is reduced due to characteristic variations, and the screen unevenness is reduced. Image display becomes possible.
- an electronic device of the present invention is provided with any one of the first, second, and third display devices according to the various aspects of the present invention described above.
- the display device of the present invention since the display device of the present invention is provided, high-quality image display in which the screen luminance is reduced and the screen unevenness is reduced due to deterioration with time and characteristic variations in the light emitting element and the driving element is provided.
- Various possible electronic devices can be realized.
- FIG. 1 is a block diagram showing a basic overall configuration of a display device common to each embodiment of the present invention.
- FIG. 2 is a plan view of one pixel of the display device of FIG.
- FIG. 3 is a block diagram of the display device according to the first embodiment of the present invention.
- FIG. 4 is a characteristic diagram showing the relationship between the gradation level (D) of the image signal, the data signal voltage (V sig) and the drive current (Id) in the first embodiment, and a method for correcting temporal deterioration.
- FIG. 5 is a block diagram of a modification of the first embodiment.
- FIG. 6 is a block diagram of another modification of the first embodiment.
- FIG. 7 is a characteristic diagram showing a relationship between the data signal (V sig) and the drive current (I d) and a method of correcting temporal deterioration in the modification of FIG.
- FIG. 8 is a block diagram of a display device according to a second embodiment of the present invention.
- FIG. 9 is a block diagram of a display device according to a third embodiment of the present invention.
- FIG. 10 is a block diagram of a display device according to a fourth embodiment of the present invention.
- FIG. 11 is an equivalent circuit diagram of one pixel of the display device according to the fifth embodiment of the present invention.
- FIG. 12 is an equivalent circuit diagram of one pixel of the display device according to the sixth embodiment of the present invention.
- FIG. 13 is an equivalent circuit diagram of one pixel of the display device according to the seventh embodiment of the present invention.
- FIG. 14 is an equivalent circuit diagram of one pixel of the display device according to the eighth embodiment of the present invention.
- FIG. 15 is an equivalent circuit diagram of one pixel of the display device according to the ninth embodiment of the present invention.
- FIG. 16 is an equivalent circuit diagram of one pixel of the display device according to the tenth embodiment of the present invention.
- FIG. 17 is a block diagram showing the entire configuration of the display device according to the eleventh embodiment of the present invention, including a circuit diagram of one pixel.
- FIG. 18 is a circuit diagram of a common line driving circuit included in the display device of the eleventh embodiment.
- FIG. 19 is a block diagram showing the entire configuration of the display device according to the 12th embodiment of the present invention, including a circuit diagram of one pixel.
- FIG. 20 is a cross-sectional view of a TFT-OELD portion included in the display device of the 12th embodiment.
- FIG. 21 is a characteristic diagram illustrating a method for correcting temporal deterioration in the display device of the 12th embodiment.
- FIG. 22 is a characteristic diagram showing a method for correcting temporal deterioration in the display device according to the thirteenth embodiment of the present invention.
- FIG. 23 is a block diagram showing a schematic configuration of an electronic device according to an embodiment of the present invention.
- FIG. 24 is a front view showing a personal computer as an example of the electronic apparatus.
- FIG. 25 is a perspective view showing a liquid crystal device using TCP as another example of the electronic apparatus.
- FIG. 1 is a block diagram showing a basic overall configuration of the display device, and particularly includes a circuit diagram showing a basic circuit configuration of a pixel circuit provided in each of four adjacent pixels.
- FIG. 2 is a plan view of one pixel of the display device.
- the display device 100 includes a plurality of scanning lines 131 extending in the X direction and arranged in the Y direction on the TFT array substrate 1, and a plurality of scanning lines 131 extending in the Y direction and extending in the X direction.
- the drive circuit 12 includes a drive circuit 12 and a common line drive circuit 13 that supplies a positive power supply (or a negative power supply) having a predetermined potential to the common line 133.
- a display area 15 is provided in the center of the TFT array substrate 1, and a plurality of pixels 10 are defined in a matrix in the display area 15.
- each pixel 10 has a switching TFT 221 as an example of a second thin film transistor, and a second TFT which is controlled by the switching TFT 221 to control a current to each pixel.
- a pixel circuit including a TFT (hereinafter, referred to as a current TFT) 223 as an example of a thin film transistor, an organic EL element 224, and a storage capacitor 222 is provided.
- a pixel electrode 141 made of an ITO (Indium Tin Oxide) film or the like is connected to the drain of the current TFT 223 (see FIG. 2).
- An opposing electrode made of an aluminum film or the like is arranged to face each other. This counter electrode is, for example, grounded or connected to a negative power supply (or positive power supply) having a predetermined potential.
- the light emission operation in one pixel is performed as follows. That is, when a scanning signal is output from the scanning line driving circuit 11 to the scanning line 131 and a data signal is supplied from the signal line driving circuit 12 to the signal line 132, these scanning lines 131 and The switching TFT 221 in the pixel 10 corresponding to the signal line 132 is turned on, and the voltage (V sig) of the data signal supplied to the signal line 132 is applied to the gate of the current TFT 223. As a result, a drive current (Id) corresponding to the gate voltage flows from the common line drive circuit 13 to the drain and source of the current TFT 223 via the common line 133, and further flows to the pixel electrode 141 (see FIG. 2).
- the organic EL element 224 flows from the organic EL element 224 to the counter electrode, and emits light. Then, the charge charged in the storage capacitor 222 while the switching TFT 221 is on is discharged after the switching TFT 221 is turned off, and the current flowing through the organic EL element 224 is changed to the switching TFT 221. Even after is turned off, it continues to flow for a predetermined period.
- the current-driven light-emitting element that is current-driven in each pixel of the display device is an organic EL element.
- an organic EL element for example, an inorganic elector port is used.
- LED light emitting diode
- LEP light emitting polymer
- the display device may be configured.
- the driving element that controls the driving current of each current-driven light-emitting element is a current TFT.
- other driving elements such as FETs (field-effect transistors) and bipolar transistors are used. May be used to configure the display device.
- FIG. 3 is a block diagram of a display device including a TFT-OELD according to the first embodiment of the present invention.
- the common electrode driving circuit 13 is a circuit that supplies a power signal of a predetermined potential (for example, a positive potential) to the common line 133 (see FIGS. 1 and 2).
- the counter electrode drive circuit 14 is a circuit that supplies a power signal of a predetermined potential (for example, a ground potential) to a counter electrode that is disposed to face the pixel electrode 141 (see FIG. 2) with the organic EL element 224 interposed therebetween. .
- the organic EL element 224 In order to compensate for a decrease in drive current due to the temporal deterioration of the dent 223 (accordingly, a decrease in the light emission amount of the organic EL element 224), the current amount measurement device 16, the comparison circuit 21a, the voltage control circuit 22a and A controller 23 is provided. Note that at least one of the common electrode drive circuit 13, the counter electrode drive circuit 14, the current measuring device 16, the comparison circuit 21a, the voltage control circuit 22a, and the controller 23 is shown in FIG. It may be provided on the TFT array substrate 1, or may be configured as an external IC and externally attached to the TFT array substrate 1.
- the current amount measuring device 16 measures a driving current flowing from the common electrode driving circuit 13 to the display organic EL element 224 (see FIG. 1) in the display area 15.
- the comparison circuit 21a compares the measured current amount ID measured by the current amount measuring device 16 with a preset reference current amount Iref, and the voltage control circuit 22a determines the comparison result.
- the output voltage (V com) of the common electrode drive circuit 13 is adjusted so that the difference between the two current amounts becomes small based on the current value. That is, feedback is applied to the output voltage (Vcom) from the common electrode drive circuit 13 so that the measured current amount ID approaches the reference current amount Iref.
- the decrease in the drive current flowing through the organic EL element 224 due to the deterioration over time of the organic EL element 224 and the current TFT 223 is determined by the output voltage of the common electrode drive circuit 13 (V com ) Is corrected by the increase in drive current due to the increase in).
- the same drive current Idl as in the initial state can be obtained for the same gradation level D1 by using the common electrode.
- the output voltage (V com) from the drive circuit 13 is increased. That is, by increasing the output voltage (V com) from the common electrode drive circuit 13, the image signal of the gradation level D 1 has the voltage V 1 ′ higher than the voltage V 1 by AV 1.
- the same drive current Idl as when the overnight signal was supplied flows.
- the drive current Id flowing through the organic EL element 2 24 is increased by increasing the output voltage (V com) of the common electrode drive circuit 13 so that the current characteristic with respect to the image signal becomes the same as the initial state. It is corrected to. Therefore, when an image display is performed after the correction processing for such temporal deterioration (that is, the adjustment processing of the output voltage (V com) of the common electrode driving circuit 13), the organic EL element 224 and the current TFT 224 are displayed. Even when significant deterioration with time has occurred in 3, the decrease in the brightness (brightness) of the organic EL element 224 can be reduced.
- the controller 23 prevents such deterioration over time, for example, when the main power supply of the display device 100 is turned on before the display period or at regular intervals, independently of the normal display operation. Perform the correction process, and use the common electrode between one correction process and the next. It is configured to fix the output voltage value (V com) of the drive circuit 13 to the last corrected (adjusted) value. According to this configuration, there is obtained an advantage that the image quality of a display image is not adversely affected by the correction process, and that an operation speed and a refresh rate of the display device 100 are not reduced.
- the controller 23 performs image display of a predetermined pattern in the display area 15 such as, for example, supplying a defocus signal for causing all the organic EL elements 222 to emit light to the maximum extent
- the voltage control circuit 22a is configured to perform the correction process. With this configuration, the amount of current can be measured with high accuracy, and the effect of aging can be accurately corrected.
- the voltage applied to the common line 13 33 that is, the voltage applied to the pixel electrode 14 1, corresponding to the measured current amount ID flowing through the organic EL element 2 4 It is configured to adjust.
- the scanning line 131, the signal line 132 correspond to the measured current amount ID measured in this manner. May be collectively referred to as a “bus wiring”) or a voltage applied to a counter electrode (the pixel electrode 141 and the counter electrode may be collectively referred to as an “electrode”) may be adjusted. .
- the measured current amount ID compared with the comparison circuit 21 a matches the reference current amount I ref. Even if the voltage control circuit 22b for adjusting the voltage of the counter electrode drive circuit 14 is provided, the same effect as in the first embodiment can be obtained. However, in this case, it goes without saying that it does not function if the counter electrode is grounded.
- the measured current amount ID and the reference current amount Iref that are compared in the comparison circuit 21a match. Even if the voltage control circuit 22c for adjusting the voltage of the signal line drive circuit 12 is provided, the same effect as in the first embodiment can be obtained.
- the correction processing (the voltage control circuit 2 When performing the voltage adjustment process using 2a or the like, the predetermined pattern displayed in the display area 15 may be, for example, a data signal that causes all the organic EL elements 224 to emit light to the maximum as described above.
- One type of pattern may be used.
- the measured current amount ID for a plurality of patterns is compared with a reference current amount I ref set in advance for each pattern.
- the voltage may be adjusted by the voltage control circuit 22a or the like so that the sum of the differences between the two patterns is minimized.
- FIG. 8 is a block diagram of a display device having a TFT-OLED according to a second embodiment of the present invention. 8, the same components as those in the first embodiment shown in FIG. 3 are denoted by the same reference numerals, and description thereof will be omitted.
- the monitor in the current monitor area 17 provided adjacent to the display area 15 The voltage between the common electrode and the counter electrode is applied to the organic EL element 17a for the monitor, and the display period is almost the same as that of the organic EL element 224 for display (see Fig. 1).
- the monitor organic EL element 17a is driven by current.
- the current amount measuring device 16 measures the current Idm flowing through the monitor organic EL element 17a.
- the comparison circuit 21a, the voltage control circuit 22a, and the controller 23 are connected so that the measured current ID, which is the measured value of the current Idm by the current measuring device 16, matches the reference current Iref.
- the output voltage (V com) of the common electrode drive circuit 13 is adjusted.
- Other configurations are the same as those in the first embodiment.
- the second embodiment when the amount of current of the organic EL element 224 or the current TFT 223 (see FIGS. 1 and 2) decreases, the deterioration with time occurs. However, it is possible to correct the current drop due to the temporary deterioration and reduce the drop in the screen brightness in the display area 15.
- the organic EL element 224 for display and the EL element 17a for monitoring are formed on the same TFT array substrate 1 by the same manufacturing process. Therefore, there is no need to provide a separate step for forming the monitor organic EL element 17a.
- the current-driven organic EL element for display 2 224 and the organic EL element for monitor 1 ⁇ a can be made to have similar aging characteristics, and the current I dm flowing through the organic EL element 1 ⁇ a for monitor can be similar. Based on the above, it is possible to fairly appropriately correct the deterioration over time in the organic EL element 224 for display.
- the correction processing for the aging deterioration is performed, for example, when the main power supply of the display device 100 is turned on or at regular intervals before the display period. Or in real time.
- the output voltage in the scanning line driving circuit 11, the signal line driving circuit 12, or the counter electrode driving circuit 14 is adjusted in accordance with the measured current amount ID thus measured. It may be configured as follows. In particular, in the case of a modified example in which the output voltage of the signal line drive circuit 12 is adjusted, under the control of the controller 23, a plurality of displays having different brightnesses are displayed in the current monitor area 17 so as to be displayed in the current monitor area 17.
- the measured current amount ID obtained for each brightness is adjusted to match the corresponding reference current amount I ref.
- V sig of the data signal By adjusting the voltage V sig of the data signal, it is possible to cope with a case where a complicated change occurs in the current-voltage characteristic due to aging.
- FIG. 9 is a block diagram of a display device including a TFT-OELD according to the third embodiment of the present invention. 9, the same components as those of the first embodiment shown in FIG. 3 are denoted by the same reference numerals, and description thereof will be omitted.
- a light emitting amount measuring device for measuring the light emitting amount of the display organic EL element 2 24 (see FIG. 1) in the display area 15.
- the scanning signal of the predetermined voltage from the scanning line driving circuit 11, the data signal of the predetermined voltage from the signal line driving circuit 12, the common electrode driving circuit 13 and the counter electrode driving circuit A power signal of a predetermined voltage from 14 is applied.
- the luminescence measuring device 18 detects the light emitted from the organic EL element 224 that emits light in response thereto.
- the comparison circuit 21b compares the measured light emission amount LD with a preset reference light emission amount Lref.
- the output voltage of the common electrode drive circuit 13 is adjusted by the comparison circuit 21b, the voltage control circuit 22a, and the controller 23 so that the light emission amount LD to be compared and the reference light emission amount Lref coincide with each other. It is configured to adjust.
- Other configurations are the same as those in the first embodiment.
- the drain current (drive current) with respect to the gate voltage is reduced with time, and the organic EL element is deteriorated.
- the amount of current with respect to the voltage at 224 decreases, and the deterioration occurs with time, and the amount of light emission with respect to the drive current at the organic EL element 224 decreases with time.
- the amount decreases the amount of decrease in the amount of light emission due to the deterioration over time is corrected by increasing the voltage applied to the organic EL element 224 to prevent a decrease in the screen brightness in the display area 15. It will be possible.
- the correction for the aging deterioration can be performed, for example, when the main power of the display device 100 is turned on or at regular intervals before the display period. Yes, or in real time.
- the scanning line driving circuit 11 and the signal line driving circuit correspond to the measured light emission amount LD measured in this manner.
- the output voltage of the circuit 12 or the counter electrode drive circuit 14 may be adjusted, and the predetermined pattern for correcting the aging degradation may be one type or a plurality of types.
- the measured light emission amounts LD for a plurality of predetermined patterns are respectively associated with the corresponding reference light emission amounts L ref.
- FIG. 10 is a block diagram of a display device including a TFT-OELD according to a fourth embodiment of the present invention. 10, the same components as those in the first and third embodiments shown in FIGS. 3 and 9 are denoted by the same reference numerals, and the description thereof will be omitted.
- the voltage between the common electrode and the counter electrode is applied to the monitor organic EL element 19a in the light emission monitor area 19 provided adjacent to the display area 15, During the period, the monitor organic EL element 19a is driven by current under substantially the same conditions as the display organic EL element 222 (see FIG. 1). Then, when correcting for the deterioration over time, the luminescence measuring device 18 measures the luminescence of the monitor organic EL element 19a.
- the comparison circuit 21b, the voltage control circuit 22a, and the controller 23 adjust the measured light emission amount LD, which is the measured value of light emission by the light emission amount measuring device 18, to the reference light emission amount Lref.
- the configuration is such that the output voltage of the common electrode drive circuit 13 is adjusted.
- the fourth embodiment configured as described above, as in the case of the third embodiment, the voltage with respect to the voltage of the current TFT 223 (see FIGS. 1 and 2) and the voltage of the organic EL element 224 is reduced.
- the amount of electric current decreases with time, or the amount of light emission with respect to the drive current in the organic EL element 224 decreases with time, and the amount of light emission in the organic EL element 224 finally decreases.
- the correction for the deterioration with time can be performed, for example, when the main power of the display device 100 is turned on or at regular intervals before the display period. Yes, or in real time.
- the output voltage of the scanning line driving circuit 11, the signal line driving circuit 12 or the counter electrode driving circuit 14 may be adjusted in accordance with the measured light emission LD measured as described above, One or a plurality of predetermined patterns may be used when correcting for deterioration.
- the measured light emission amounts LD for a plurality of predetermined patterns are respectively associated with the corresponding reference light emission amounts L ref.
- the display organic EL element 224 and the monitor organic EL element 19a are formed on the same TFT array substrate 1 by the same manufacturing process. Therefore, there is no need to separately provide a step for forming the monitor EL element 19a.
- the current-driven display organic EL element 2 24 and the monitor organic EL element 19 a can have similar aging characteristics over time, and are emitted from the monitor EL element 19 a. It is possible to accurately correct the deterioration over time in the display organic EL element 224 based on the light.
- the fifth to tenth embodiments described below are different from the first to fourth embodiments described above in that the organic EL elements 224 and the current TFTs generated for each pixel are different from the first to fourth embodiments.
- the present invention relates to a pixel circuit that corrects a decrease in drive current amount due to temporal deterioration or a decrease in light emission amount of the organic EL element 224 in a unit of each pixel.
- the configuration of a display device including a plurality of pixel circuits for each pixel is the same as that shown in FIG. 1, and a description thereof will be omitted. .
- FIG. 11 is an equivalent circuit diagram of a pixel circuit including a TFT-OELD according to the fifth embodiment of the present invention.
- the same components as those shown in the circuit diagram of each pixel 10 in FIG. 1 are denoted by the same reference numerals, and the description thereof will be omitted.
- the first power supply line 2 1 3 depends on the relationship between the voltage between both ends of the organic EL element 2 24 and the amount of drive current Id flowing through the organic EL element 2 4. And the resistance of 2 15 between the second power supply lines is changed.
- the first power supply line 213 is a common line portion in each pixel connected to the pixel electrode to which a power supply signal of a predetermined potential is supplied from the common line driving circuit.
- the portion between the second power supply lines 2 15 is a power supply line portion in each pixel connected to the counter electrode to which a power signal of a predetermined potential is supplied from the counter electrode driving circuit.
- the potential of the first feed line (common electrode) 2 13 is higher than the potential of the second feed line (counter electrode) 2 15 (that is, positive power is supplied to the common electrode).
- the first correction TFT 231 of the n-channel type has the gate electrode of the organic EL element 224 And the source electrode and the drain electrode are added between the organic EL element 224 and the second power supply line 215 so as to be connected in series with the organic EL element 222.
- the gate voltage of the first correction TFT 231 increases, and the resistance between the source electrode and the drain electrode decreases.
- the organic EL element 24 even if the resistance of the organic EL element 224 increases due to aging, even if the resistance between the source and the drain of the first correction TFT 231 decreases, the organic EL element 24, it is possible to correct a decrease in the amount of drive current Id due to an increase in resistance, and to reduce a decrease in screen luminance.
- since such correction is performed on a pixel-by-pixel basis, there is a variation in current-voltage characteristics when temporal deterioration occurs with a variation among a plurality of pixels, or between a plurality of pixels in an initial state. Sometimes, it is possible to prevent screen unevenness.
- the potential of the first feed line 213 is lower than the potential of the second feed line 215 (that is, a negative power is supplied to the common electrode and In the case where the positive power is supplied), the first correction TFT 231 is a p-channel type, and its gate electrode is connected to the electrode on the first power supply line side of the organic EL element 224, The source electrode and the drain electrode may be connected between the organic EL element 224 and the second power supply line 215 in series with the organic EL element 224. According to this configuration, when the resistance of the organic EL element 224 increases, the gate voltage of the first correction TFT 231 drops, the resistance between the source electrode and the drain electrode decreases, and Correction is made You.
- the switching TFT 221, the current TFT 223, and the first correction TFT 231 are formed on the same TFT array substrate by the same manufacturing process. According to this configuration, it is possible to correct a decrease in the drive current Id due to aging degradation for each pixel without adding a manufacturing process.
- FIG. 12 is an equivalent circuit diagram of a pixel circuit including a TFT-OELD according to the sixth embodiment of the present invention.
- the same components as those shown in FIGS. 1 and 11 are denoted by the same reference numerals, and description thereof will be omitted.
- the first power supply line 2 13 and the first power supply line 2 13 depend on the relationship between the voltage across the organic EL element 224 and the amount of drive current Id flowing therethrough. Change the resistance of 2 15 between the two feeding lines.
- the p-channel type second correction TFT 232 has a gate electrode connected to the electrode on the second power supply line side of the organic EL element 221 and a source electrode and a drain electrode connected in series with the organic EL element 224 between the organic EL element 224 and the first power supply line. It is added as follows. According to this configuration, when the resistance of the organic EL element 224 increases, the gate voltage of the second correction TFT 232 decreases, and the resistance between the source electrode and the drain electrode decreases.
- the resistance of the organic EL element 224 increases due to aging, even if the resistance between the source and the drain of the second correction TFT 232 decreases, the resistance of the organic EL element 224 increases. It is possible to correct the reduction in the amount of drive current Id and reduce the reduction in screen brightness. In addition, since such correction is performed on a pixel-by-pixel basis, there is a variation in current-voltage characteristics when temporal deterioration occurs with a variation among a plurality of pixels, or between a plurality of pixels in an initial state. Sometimes, it is possible to prevent screen unevenness.
- the second correction TFT 232 is an n-channel TFT.
- the gate electrode is connected to the electrode on the second power supply line side of the organic EL element 224,
- the source electrode and the drain electrode may be connected in series with the organic EL element 224 between the organic EL element 224 and the first power supply line.
- the switching TFT 221, the current TFT 223, and the second correction TFT 232 are formed on the same TFT array substrate by the same manufacturing process. According to this configuration, it is possible to correct a decrease in the drive current Id due to aging degradation for each pixel without increasing the number of manufacturing steps.
- FIG. 13 is an equivalent circuit diagram of a pixel circuit including a TFT- ⁇ E LD according to the seventh embodiment of the present invention.
- the same components as those shown in FIGS. 1 and 11 are denoted by the same reference numerals, and description thereof will be omitted.
- the storage capacitor 222 and the first power supply line 2 13 depend on the relationship between the voltage across the organic EL element 224 and the amount of drive current Id flowing therethrough. Change the resistance between them.
- the gate electrode is connected to the electrode on the first power supply line side of the organic EL element 224, and the source electrode and the drain electrode are connected between the storage capacitor 222 and the first power supply line 213.
- the gate voltage of the third correction TFT 233 increases, and the resistance between the source electrode and the drain electrode decreases. Therefore, the gate voltage of the current TFT 223 increases, and the resistance between the source electrode and the drain electrode decreases.
- the seventh embodiment even if the resistance of the organic EL element 224 increases due to aging, even if the resistance between the source and the drain of the third correction TFT 233 decreases, the resistance of the organic EL element 224 increases. It is possible to correct the reduction in the amount of drive current Id and reduce the reduction in screen brightness. In addition, since such correction is performed on a pixel-by-pixel basis, it is assumed that deterioration over time has occurred with variation among a plurality of pixels. When the current-voltage characteristics vary among a plurality of pixels in the initial state or in the initial state, it is possible to prevent screen unevenness.
- the current TFT 223 when the potential of the first power supply line 213 is higher than that of the second power supply line, the current TFT 223 is set to a p-channel type,
- the TFT 233 is a p-channel type, its gate electrode is connected to the electrode on the first power supply line side of the organic EL element 224, and its source and drain electrodes are connected between the storage capacitor 222 and the first power supply line 213 May be configured.
- the gate voltage of the third correction TFT 233 increases, and the resistance between the source electrode and the drain electrode increases. For this reason, the gate voltage of the rent TFT 223 decreases, the resistance between the source electrode and the drain electrode decreases, and the correction is automatically performed.
- the current TFT 223 is an n-channel type
- the TFT 233 for correction of Step 3 is an n-channel type
- its gate electrode is connected to the electrode on the first power supply line side of the organic EL element 224
- the source and drain electrodes are connected to the storage capacitor 222 and the first power supply line 2 1 3 You may comprise so that it may be connected between them.
- the gate voltage of the third correction TFT 233 decreases, and the resistance between the source electrode and the drain electrode increases. For this reason, the gate voltage of the current TFT 223 increases, the resistance between the source electrode and the drain electrode decreases, and the correction is automatically performed.
- the current TFT 223 is set to a p-channel type
- the TFT 233 for correction of the P-channel type is connected to the gate electrode of the organic EL element 224 on the first power supply line side, and the source electrode and the drain electrode are connected between the storage capacitor 222 and the first power supply line 213. May be configured to be connected. According to this configuration, when the resistance of the organic EL element 224 increases, the gate voltage of the third correction TFT 233 decreases, and the resistance between the source electrode and the drain electrode decreases.
- the gate voltage of the current TFT 223 decreases, the resistance between the source electrode and the drain electrode decreases, and the correction is automatically performed.
- the switching TFT 221, the current TFT 223, and the third correction TFT 233 are formed on the same TFT array substrate by the same manufacturing process. According to this configuration, it is possible to correct a decrease in the drive current Id due to aging degradation for each pixel without increasing the number of manufacturing steps.
- FIG. 14 is an equivalent circuit diagram of a pixel circuit including a TFT-OE LD according to the eighth embodiment of the present invention. Note that, in FIG. 14, the same components as those shown in FIGS. 1 and 11 are denoted by the same reference numerals, and description thereof will be omitted.
- the storage capacitor 222 and the second power supply line 21 depend on the relationship between the voltage across the organic EL element 224 and the amount of drive current Id flowing therethrough. Change the resistance between the five.
- the fourth correction TFT 234 of the P-channel type has a gate electrode connected to the electrode on the first power supply line side of the organic EL element 224, and a source electrode and a drain electrode connected to the holding capacity 222 and the second power supply line 2. It is added so that it is connected between 15 and 15.
- the gate voltage of the fourth correction TFT 234 increases, and the resistance between the source electrode and the drain electrode increases. Therefore, the gate voltage of the current TFT 223 increases, and the resistance between the source electrode and the drain electrode decreases.
- the eighth embodiment even if the resistance of the organic EL element 224 increases due to aging, even if the resistance between the source and the drain of the fourth correction TFT 234 increases, the resistance of the organic EL element 224 increases. It is possible to correct the reduction in the amount of drive current Id and reduce the reduction in screen brightness. In addition, since such correction is performed on a pixel basis, when time-dependent deterioration occurs among a plurality of pixels or when current-voltage characteristics vary among a plurality of pixels in an initial state. In addition, it is possible to prevent screen unevenness.
- the current TFT 223 is set to a p-channel type
- the n-channel TFT is used for the correction TFT of 4
- its gate electrode is connected to the electrode on the first power supply line side of the organic EL element 224
- the source and drain electrodes are connected to the storage capacitor 222 and the second power supply line 2 15 You may comprise so that it may be connected between them.
- the gate voltage of the current TFT 223 decreases, the resistance between the source electrode and the drain electrode decreases, and the correction is automatically performed.
- the n-channel type current TFT 223 when the potential of the first power supply line 213 is lower than the potential of the second power supply line 215, the n-channel type current TFT 223
- the fourth correction TFT is a p-channel type, its gate electrode is connected to the electrode on the first power supply line side of the organic EL element 224, and the source and drain electrodes are connected to the storage capacitor 222 and the second power supply line 21. You may comprise so that it may connect between five.
- the gate voltage of the current TFT 223 increases, the resistance between the source electrode and the drain electrode decreases, and the correction is automatically performed.
- the current TFT 223 is a p-channel type
- the correction TFT 234 in (4) is an n-channel type and its gate electrode is connected to the electrode on the first power supply line side of the organic EL element 224, and the source electrode and the drain electrode are connected to the storage capacitor 222 and the second power supply line 2 It may be configured to be connected between 15 and 15.
- the gate voltage of the fourth correction TFT 234 decreases, and the resistance between the source electrode and the drain electrode increases. For this reason, the gate voltage of the current TFT 223 decreases, the resistance between the source electrode and the drain electrode decreases, and the correction is automatically performed.
- the switching TFT 221, the current TFT 223, and the fourth correction TFT 234 are formed on the same TFT array substrate by the same manufacturing process. According to this configuration, it is possible to correct a decrease in the drive current Id due to aging degradation for each pixel without increasing the number of manufacturing steps.
- FIG. 15 is an equivalent circuit diagram of a pixel circuit including a TFT-OELD according to the ninth embodiment of the present invention.
- the same components as those shown in FIGS. 1 and 11 are denoted by the same reference numerals, and description thereof will be omitted.
- the first correction thin-film photodiode 241 provided in the pixel circuit of this embodiment has a property of being reduced in resistance when irradiated with light.
- the resistance between the storage capacitor 222 and the first power supply line 212 is changed depending on the relationship between the voltage at both ends of the organic EL element 222 and the amount of light emission.
- the first correction thin-film photodiode 2 41 is connected between the storage capacitor 2 2 and the first power supply line 2 13. According to this configuration, when the emission of the organic EL element 224 decreases, the resistance of the first correction thin-film photodiode 241 increases. As a result, the gate voltage of the current TFT2 23 drops, and the resistance between the source electrode and the drain electrode decreases.
- the ninth embodiment even if the light emission amount of the organic EL element 224 decreases due to the deterioration over time, the resistance of the first correction thin-film photodiode 241 increases, and the organic EL element 224 decreases. It is possible to correct the decrease in the amount of light emission in 224. In addition, since such correction is performed on a pixel basis, when deterioration over time occurs with variations among a plurality of pixels, or when variations in light emission characteristics exist between a plurality of organic EL elements in an initial state. In addition, it is possible to prevent screen unevenness.
- a fifth correction TFT (not shown) is connected between its storage electrode 222 and its first power supply line 212 with its source electrode and drain electrode connected. It may be provided as follows.
- the current TFT 223 is an n-channel type.
- the first correction thin-film photodiode 241 may be connected between the storage capacitor 222 and the first power supply line 213.
- a fifth correction TFT (not shown) is further connected between its source electrode and drain electrode between the storage capacitor and the first power supply line. It may be provided to continue.
- the resistance of the first correction thin-film photodiode 241 increases, and further, the gate voltage of the active TFT 223 increases, and the source electrode and the drain electrode thereof increase. The resistance between them decreases, and the correction is automatically performed.
- the switching TFT 221, the current TFT 223, and the first correction thin film photodiode 241 are formed on the same TFT array substrate by the same manufacturing process. According to this configuration, it is possible to correct a decrease in the drive current Id due to aging degradation for each pixel without increasing the number of manufacturing steps.
- FIG. 16 is an equivalent circuit diagram of a pixel circuit including a TFT-OELD according to the tenth embodiment of the present invention. Note that, in FIG. 16, the same components as those shown in FIGS. 1 and 11 are denoted by the same reference numerals, and description thereof will be omitted.
- the second correction thin-film photodiode 242 provided in the pixel circuit of this embodiment has a property of being reduced in resistance when irradiated with light.
- the resistance between the storage capacitor 222 and the second power supply line 215 is changed depending on the relationship between the voltage at both ends of the organic EL element 224 and the amount of light emission.
- a second correction thin film photodiode 242 is connected between the storage capacitor 222 and the second power supply line 215. According to this configuration, when the light emission amount of the organic EL element 224 decreases, the resistance of the second correction thin-film photodiode 242 increases. As a result, the gate voltage of the current TFT 223 is increased, and the resistance between the source electrode and the drain electrode is reduced.
- the decrease in the light emission amount of the organic EL element 224 is corrected by the increase in the resistance of the second correction thin film photodiode 242. It is possible to do. Further, since such correction is performed on a pixel-by-pixel basis, when the temporal deterioration occurs with variation among a plurality of pixels, or between a plurality of organic EL elements in an initial state, light emission characteristics are deteriorated. When there are variations in the characteristics, it is possible to prevent screen unevenness.
- a sixth correction TFT (not shown) is provided so that its source electrode and drain electrode are connected between the storage capacitor and the second power supply line 215. You may.
- the second correction thin film photodiode 242 may be configured to be connected between the storage capacitor 222 and the second power supply line 215.
- a sixth correction TFT (not shown) may be further provided such that its source electrode and drain electrode are connected between the storage capacitor 222 and the second power supply line 215.
- the switching TFT 221, the current TFT 223, and the second thin-film photodiode 242 for correction are formed on the same TFT array substrate by the same manufacturing process. According to this configuration, it is possible to correct a decrease in the drive current Id due to aging degradation for each pixel without increasing the number of manufacturing steps.
- FIG. 17 is a block diagram of a display device including a TFT-OELD according to the first embodiment
- FIG. 18 is a block diagram of a common line driving circuit 13 provided in the display device.
- a pixel circuit for only one pixel is illustrated in the display area 115, but a similar pixel circuit is provided for each pixel.
- the display device 200a of the present embodiment is capable of separately supplying a power signal to each of a plurality of common lines 133 in addition to the scanning line driving circuit 11 and the signal line driving circuit 12.
- the configured common line drive circuit 13 ', the common line power supply 205 for supplying power to the common line drive circuit 13', and the display area 15 measured by the current measurement circuit 16 ' A frame memory 207 for storing a measured current amount ID mn (m: signal line number (1 to M), n: signal line number (1 to N)) for each of a plurality of pixels 10 in the It further comprises a deterioration correction circuit 209 interposed between the image signal source 208 and the signal line drive circuit 12.
- the deterioration correction circuit 209 performs the gradation (gradation) of the image signal input from the image signal source 208 in order to correct a decrease in the amount of the drive current Id due to the deterioration with time in each of the plurality of pixels 10.
- the luminance is corrected for each pixel 10 according to each measured current amount IDn stored in the frame memory 207, and then output to the signal line driving circuit 12.
- At least one of the common line driving circuit 13 ′, the common line power supply 205, the current measuring circuit 16 ′, the frame memory 207, and the deterioration correction circuit 209 has a display area 1 1 at the center. It may be formed on a TFT array substrate provided with 5 (see FIG. 1), or may be configured as an external IC and externally attached to the TFT array substrate.
- the common line driving circuit 13 includes a switching switch 301, a shift register 302, and a transmission switch 303.
- the switching switch 301 supplies a power supply signal of a predetermined potential to a plurality of common lines 133 through the wiring 310 at the time of normal display operation (that is, all common lines). (The potentials of the lines 13 and 13 are made equal.) The power is switched to the side of the power supply line 310 connected to the common line power supply 205 under the control of the controller. On the other hand, when the switching switch 301 corrects for aging degradation (adjustment of the voltage of the power supply signal supplied to each common line 133) as described later, a plurality of common switches are connected via the wiring 320.
- the power supply signal for measurement In order for the power supply signal for measurement to be supplied sequentially to the line 13 3, it is switched to the side of the wiring 3 20 connected to the current measuring circuit 16 ′ via the transmission switch 303. It is configured.
- the power supply signal for measurement may be supplied from the power supply incorporated in the current measuring circuit 16 ′ via the wiring 320, or the power supply signal of the common line power supply 205 may be used to supply the wiring 320. It may be supplied via
- the transmission switch 303 transmits a power supply signal for measurement to the switching switch 301 in accordance with a transfer signal sequentially output from the shift register 302 when correcting for deterioration over time, and the switching switch 301 Supplies this to each pixel circuit via the common line 133.
- the shift register 302 is controlled by a controller (not shown).
- the transfer signal is sequentially output in correspondence with each of the plurality of common lines 133.
- a plurality of common lines are transmitted via each transmission switch 303 which can be transmitted according to the transfer signal sequentially output from the shift register 302.
- a power supply signal for measurement is sequentially supplied to 133.
- the amount of current of the measurement power supply signal is measured for each common line 133.
- the scanning signals are sequentially supplied to the pixels 10 from the scanning line driving circuit 11, the power signal is supplied to the pixels 10 from the pixel column supplied from one common line 133.
- a power supply signal for measurement flows as drive current to the organic EL element 224 via the current TFT 223 for each of the pixels.
- each pixel 1 The drive current I d for each 0 is measured in a point-sequential manner by the current amount measurement circuit 16,. Then, the measured current amount I Dmn is stored in the frame memory 207.
- the image signal from the image signal source 208 is sent to the deterioration correction circuit 209.
- the deterioration correction circuit 209 determines the time-dependent deterioration determined based on the current amount ID mn of each pixel 10 stored in the frame memory 207 (that is, the degree of decrease in the measured driving current amount with respect to the reference current amount). Then, the gradation level of the image signal is corrected for each pixel 10 and output to the signal line drive circuit 12 so as to correct the current drop due to the deterioration with time. As a result, the change in the light emission amount of the organic EL element 224 in each pixel 10 is corrected by the change in the gradation level by the deterioration correction circuit 209.
- the switching switch 301 of the common line driving circuit 203 is switched to the common line power supply 205 side, and a predetermined potential is applied to the common line 103. Supplied.
- the current amount is separately measured for all the pixels 10 and the measured value ID mn is stored in the frame memory 207.
- the current amount may be measured for 10 or for a set of pixel blocks, and the measured value may be stored.
- all pixels Although different amounts of correction have been applied to each of the 10 pixels, the correction may be performed on the entire pixel proc- ess panel after appropriate processing.
- each TFT in each drive circuit and each TFT in the pixel circuit are, for example, polycrystalline silicon TFTs formed by a low-temperature process of 600 ° C. or less, and each organic EL element 2 24 is formed, for example, by an inkjet process.
- FIG. 19 is a block diagram of a display device including the TFT-OLED according to the 12th embodiment
- FIG. 20 is a cross-sectional view of a pixel circuit provided for each pixel of the display device.
- a circuit for only one pixel is shown in the display area 115.
- a similar circuit is provided for each pixel.
- the same components as those in the first embodiment shown in FIG. 17 are denoted by the same reference numerals, and the description thereof will be omitted.
- the display device 20 Ob of the present embodiment includes a common line for supplying a power supply signal of a predetermined potential to the scanning line driving circuit 11, the signal line driving circuit 12, and the common line 13 3 at a time. It comprises a power supply 205, a current measurement circuit 16 ", a frame memory 207 and a deterioration correction circuit 209.
- the display device 200b particularly has one end connected to the common line 133.
- Each pixel circuit has a PIN diode 110 as an example of a semiconductor device for measuring the amount of emitted light, and the other end of each PIN diode 110 is supplied with a measuring current to the PIN diode 110.
- An analysis light beam 104 for flowing is provided in parallel with the signal line 132 and the common line 1333.
- the display device 200b further includes each pixel via each analysis light beam 104. And a current measuring circuit 16 ′′ is driven by the light detecting drive circuit 204.
- the configuration is such that the measurement current flowing through the PIN diode 110 being operated is measured for each pixel 10.
- At least one of the light detection driving circuit 204, the common line power supply 205, the current measuring circuit 16 ", the frame memory 207, and the deterioration correction circuit 209 has a display area 1 15 in the center. (See FIG. 1), or may be configured as an external IC and attached externally to the TFT array substrate.
- Alternative semiconductor elements for measuring light emission Another example of the element is a field effect transistor in which a photoexcitation current flows when light enters the channel portion.
- the PIN diode 110 is formed by using the same film as the semiconductor film used for forming the switching TFT 21 and the current TFT 23. It is formed on the array substrate 1 and has a PIN junction formed by impurity doping. Then, a reverse bias voltage is applied to the PIN junction so that a photoexcitation current flows when light enters the PIN junction from the organic EL element 222 through the interlayer insulating film 251-253. It is configured to be supplied from the inspection light drive circuit 204 via the.
- the gate and scanning line 13 1 of each TFT are made of a metal film such as Ta or a low-resistance polysilicon film, and the signal line 13 2, common line 13 3 , A1 or the like.
- the driving current is configured to flow from the pixel electrode 141 made of ITO or the like to the counter electrode 105 (upper electrode) via the EL element 224 via the current TFT 223.
- the counter electrode 105 is made of a transparent material such as ITO, the upper surface of the display device 200a in FIG. 20 can be used as the display surface.
- the counter electrode 105 is made of a light-reflective or light-blocking metal material such as A1, etc.
- the lower surface of the display device 200a in FIG. 20 can be used as the display surface. it can.
- the counter electrode 105 is composed mainly of A1.
- the scanning line driving circuit 11 and the signal line driving circuit 12 supply a scanning signal and a data signal for displaying a predetermined pattern, so that the organic EL element 2 Flash 4 4
- the counter electrode 105 is a material mainly composed of A1
- light is reflected and radiated downward through the pixel electrode 141.
- the PIN diode 110 which is reverse-biased by the light beam 104, is disposed in a part of the optical path, a photoexcitation current is generated in the PIN diode 110, and the light beam 10 The light beam reaches the light detection drive circuit 204 through 4.
- the light detection driving circuit 204 includes a plurality of transmission switches, and detects the reverse bias power supply to the PIN diode 110 by the light detection circuit 204. 4 to the PIN diode 1 1 0
- the current is sequentially supplied to the current measuring circuit 16 ".
- the current measuring circuit 16" measures such a measuring current for each pixel 10 in a point-sequential manner. It should be noted that the light emission amount of the organic EL element 224 provided in each pixel 10 almost increases in accordance with the increase of the measurement current amount I Dmn ′ of the measurement current.
- the storage by the frame memory 207 and the correction by the deterioration correction circuit 209 corresponding to the measured current amount I Dmn ′ (measured light emission amount) are also performed in the same manner as in the eleventh embodiment. More specifically, as shown in FIG. 21, the deterioration correction method in the first embodiment is performed.
- the signal line driving circuit 12 outputs data signals of signal levels VI, V2,..., V6.
- This data signal is applied from the signal line drive circuit 12 to the gate electrode of the current TFT 223 by the signal line 132, the switching TFT 221 and the storage capacitor 222.
- the light emission level L 1 by the organic EL element 224 corresponds to the light emission characteristic curve 405 showing the relationship between the potential applied to the gate electrode of the current TFT 223 and the light emission amount of the organic EL element 224.
- L 2,..., V 6 are obtained.
- the organic EL element 224 starts to emit light after the signal level Vb exceeds a certain threshold voltage.
- the light emission characteristic curve 405 changes as shown in FIG. 21 (b).
- the light emission characteristic curve 405 is obtained by measuring the light emission amount using the light beam driving circuit 204, the current measurement circuit 16 ", and the like in the above-described correction processing.
- the deterioration correction circuit 209 is based on the light emission characteristic curve 405.
- an appropriate signal conversion curve 404 is set, and in the normal display period, the gradation level D l, D 2,. , D6 are adjusted for each gradation level so that image signals of signal levels VI, V2, '..., V6 are output from the signal line drive circuit 12. Therefore, in each pixel 10,
- the same light emission amount as before deterioration can be obtained after deterioration according to the light emission characteristic curve 405 after deterioration. Degradation is also taken into account.
- the driving current amount is measured. It is possible to more accurately correct a decrease in the amount of light emission due to deterioration than in the case of (1).
- the light emission amount was measured for all the pixels 10 and the measured value was stored in the frame memory 207.
- the light emission amount may be measured for a group of pixel blocks, and the measured value may be stored.
- different correction amounts are applied to all the pixels 10 here, the correction may be applied to a group of pixel blocks or the entire panel after appropriate processing.
- the PIN diode 110 is used as the monitoring light receiving element for generating the photoexcitation current, but a semiconductor element such as a field effect transistor may be used.
- a semiconductor element such as a field effect transistor may be used.
- a potential that effectively generates a photoexcitation current is selected.
- a suitable configuration is used from a top gate type, a normal gate type, a reverse stagger type, a channel etch type, a channel stopper type, and the like. Electrodes may also be formed of ITO.
- TFTs formed in each drive circuit and each pixel circuit and a PIN diode as a semiconductor element for generating a photoexcitation current are formed in the same step. This is advantageous because a separate step for forming the PIN diode is not required.
- FIG. 22 shows a method of correcting deterioration in a display device including the TFT-OLED according to the thirteenth embodiment of the present invention.
- the hardware configuration of the display device according to the thirteenth embodiment is the same as that of the eleventh embodiment or the twelveth embodiment, and a description thereof will be omitted.
- the method of setting the signal conversion curve 404 based on the luminescence characteristic curve 405 obtained by the luminescence amount measurement in the deterioration correction circuit 209 described with reference to FIG. This is different from the case of the first and second embodiments.
- the adjustment of the voltage value of the data signal is performed by converting a predetermined signal level to another predetermined signal level. That is, in FIG. 21B corresponding to the case where the organic EL element 224 deteriorates and the light emission amount decreases, the signal levels V 1, V 2,. Is selected from the discretized potentials determined in advance by the constraints of the power supply and the like of the signal line drive circuit 12 to set the signal conversion curve 404 for the light emission characteristic curve 405. As a result, the linearity of the light emission amount is impaired, but no gradation inversion occurs, so that good gradation can be obtained with the naked eye.
- the signal line drive circuit 12 it is possible to perform correction for a decrease in the amount of light emission due to deterioration with time, using a power supply of a limited type of potential.
- the pixel circuit is configured with the switching TFT.
- the scanning signal is supplied directly to the gate of the driving TFT from the scanning line, and the data signal is supplied to the gate of the driving TFT.
- the data signal is supplied to the organic EL element through the source and drain of the driving TFT to drive the organic EL element. Is also good. That is, in this case as well, it is possible to correct a decrease in the drive current or the light emission amount due to the deterioration with time in the organic EL element or the driving TFT provided in each pixel by the present invention.
- the switching TFT provided in each pixel circuit may be composed of an n-channel TFT or a p-channel TFT as long as the voltage polarity of the scanning signal marked on the gate is matched. You may.
- FIG. 23 shows a schematic configuration of an electronic apparatus including the display device as described above.
- the electronic device includes a display information output source 1000, a display information processing circuit 1002, a driving circuit 1004, a display panel 1006, a clock generation circuit 1108, and It is configured to include a power supply circuit 110.
- the display device in each of the above-described embodiments is the same as the display panel 100 in the present embodiment.
- the driving circuit 100 4. Therefore, the driver circuit 104 may be mounted on the TFT array substrate constituting the display panel 106, and the display information processing circuit 1002 may be mounted thereon.
- the driving circuit 1004 may be externally attached to a TFT array substrate on which the display panel 1006 is mounted.
- the display information output source 100 0 0 includes a ROM (Read Only Memory), a RAM (Random Access Memory), a memory such as an optical disk device, a tuning circuit for tuning and outputting a TV signal, and the like, and a clock generation circuit 100 Based on the clock signal from 08, display information such as an image signal of a predetermined format is output to the display information processing circuit 1002.
- the display information processing circuit 1002 includes various known processing circuits such as an amplification / polarity inversion circuit, a phase expansion circuit, a rotation circuit, a gamma correction circuit, and a clamp circuit, and is configured based on a clock signal.
- a digital signal is sequentially generated from the input display information and output to the drive circuit 104 together with the clock signal CLK.
- the drive circuit 100 4 drives the display panel 200.
- the power supply circuit 110 supplies a predetermined power supply to each of the above circuits.
- FIGS. 24 to 25 show specific examples of the electronic device configured as described above.
- a live-type personal computer (PC) 1200 corresponding to multimedia which is another example of electronic equipment, has the display panel 200 described above in a top cover case 126.
- IC 1 3 2 4 including 100 2 is mounted on a polyimide carrier 1 3 2 2 TCP (Tape Carrier Package) 1 3 2 0 and anisotropic circuit provided on the periphery of TFT array substrate 1 It is also possible to physically, electrically connect via a conductive film to produce, sell, use, etc. as a display panel.
- TCP Transmission Carrier Package
- high-quality image display can be achieved without adversely affecting the display over time in current-driven light-emitting elements such as organic EL elements and driving elements such as current TFTs. Can be realized for a long period of time.
- a display device includes a display device including various current-driven light-emitting elements such as an organic EL element, an inorganic EL element, a light-emitting polymer, and an LED, and a driving element such as a TFT that drives the light-emitting element.
- the pixel circuit according to the present invention can be used for various active matrix drive type display devices.
- the electronic device according to the present invention is configured using such a pixel circuit or a display device, and can be used as an electronic device capable of displaying high-quality images for a long period of time.
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- Microelectronics & Electronic Packaging (AREA)
- Optics & Photonics (AREA)
- Computer Hardware Design (AREA)
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- Theoretical Computer Science (AREA)
- Control Of El Displays (AREA)
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Description
Claims
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP98905827A EP0923067B1 (en) | 1997-03-12 | 1998-03-06 | Pixel circuit, display device and electronic equipment having current-driven light-emitting device |
DE69825402T DE69825402T2 (de) | 1997-03-12 | 1998-03-06 | Pixelschaltung, anzeigevorrichtung und elektronische apparatur mit stromgesteuerter lichtemittierender vorrichtung |
JP53136198A JP3887826B2 (ja) | 1997-03-12 | 1998-03-06 | 表示装置及び電子機器 |
US09/171,526 US6518962B2 (en) | 1997-03-12 | 1998-03-06 | Pixel circuit display apparatus and electronic apparatus equipped with current driving type light-emitting device |
US10/314,303 US7362322B2 (en) | 1997-03-12 | 2002-12-09 | Pixel circuit, display apparatus and electronic apparatus equipped with current driving type light-emitting device |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9/57858 | 1997-03-12 | ||
JP5785897 | 1997-03-12 | ||
JP23310897 | 1997-08-28 | ||
JP9/233108 | 1997-08-28 |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US09/171,526 A-371-Of-International US6518962B2 (en) | 1997-03-12 | 1998-03-06 | Pixel circuit display apparatus and electronic apparatus equipped with current driving type light-emitting device |
US10/314,303 Division US7362322B2 (en) | 1997-03-12 | 2002-12-09 | Pixel circuit, display apparatus and electronic apparatus equipped with current driving type light-emitting device |
Publications (1)
Publication Number | Publication Date |
---|---|
WO1998040871A1 true WO1998040871A1 (fr) | 1998-09-17 |
Family
ID=26398949
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP1998/000971 WO1998040871A1 (fr) | 1997-03-12 | 1998-03-06 | Circuit pixel, afficheur, et equipement electronique a dispositif photoemetteur commande par courant |
Country Status (6)
Country | Link |
---|---|
US (2) | US6518962B2 (ja) |
EP (1) | EP0923067B1 (ja) |
JP (1) | JP3887826B2 (ja) |
DE (1) | DE69825402T2 (ja) |
TW (1) | TW397965B (ja) |
WO (1) | WO1998040871A1 (ja) |
Cited By (142)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10319908A (ja) * | 1997-04-14 | 1998-12-04 | Sarnoff Corp | アクティブマトリックス有機発光ダイオード(amoled)の表示ピクセル構造とそのためのデータロード/発光回路 |
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JPWO2002077957A1 (ja) * | 2001-03-22 | 2004-07-15 | 三菱電機株式会社 | 自発光型表示装置 |
JP2004246385A (ja) * | 2004-05-14 | 2004-09-02 | Pioneer Electronic Corp | アクティブマトリクス型表示装置 |
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JP2004287345A (ja) * | 2003-03-25 | 2004-10-14 | Casio Comput Co Ltd | 表示駆動装置及び表示装置並びにその駆動制御方法 |
US6806497B2 (en) | 2002-03-29 | 2004-10-19 | Seiko Epson Corporation | Electronic device, method for driving the electronic device, electro-optical device, and electronic equipment |
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JPWO2003023752A1 (ja) * | 2001-09-07 | 2004-12-24 | 松下電器産業株式会社 | El表示装置とel表示装置の駆動回路および画像表示装置 |
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JP2007047721A (ja) * | 2005-08-10 | 2007-02-22 | Samsung Sdi Co Ltd | データ駆動回路とこれを利用した発光表示装置及びその駆動方法 |
US7221338B2 (en) | 2000-04-18 | 2007-05-22 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
JP2007140325A (ja) * | 2005-11-22 | 2007-06-07 | Seiko Epson Corp | 発光制御装置、表示装置、電子機器、および発光装置の制御方法 |
JP2007514966A (ja) * | 2003-11-25 | 2007-06-07 | イーストマン コダック カンパニー | 経年劣化補償を備えたoledディスプレイ |
JP2007517245A (ja) * | 2003-12-10 | 2007-06-28 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | ビデオデータ信号補正 |
US7253813B2 (en) | 2002-02-01 | 2007-08-07 | Seiko Epson Corporation | Electro-optical device, driving method thereof, and electronic apparatus |
US7268499B2 (en) | 2000-09-19 | 2007-09-11 | Semiconductor Energy Laboratory Co., Ltd. | Self light emitting device and method of driving thereof |
JP2007240803A (ja) * | 2006-03-08 | 2007-09-20 | Sony Corp | 自発光表示装置、黒レベル補正装置及びプログラム |
JP2007240802A (ja) * | 2006-03-08 | 2007-09-20 | Sony Corp | 自発光表示装置、ホワイトバランス調整装置及びプログラム |
JP2007240799A (ja) * | 2006-03-08 | 2007-09-20 | Sony Corp | 自発光表示装置、ホワイトバランス調整装置及びプログラム |
JP2007256958A (ja) * | 2002-04-26 | 2007-10-04 | Toshiba Matsushita Display Technology Co Ltd | El表示パネルの駆動方法 |
JP2007264631A (ja) * | 2006-03-28 | 2007-10-11 | Toppoly Optoelectronics Corp | 有機エレクトロルミネセンス素子およびその製造方法 |
JP2007286341A (ja) * | 2006-04-17 | 2007-11-01 | Eastman Kodak Co | 表示装置 |
US7298347B2 (en) | 2000-06-13 | 2007-11-20 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
JP2007310033A (ja) * | 2006-05-16 | 2007-11-29 | Eastman Kodak Co | 有機el表示装置およびその製造方法 |
US7319444B2 (en) | 2003-03-31 | 2008-01-15 | Seiko Epson Corporation | Pixel circuit, electro-optical device, and electronic apparatus |
JP2008052289A (ja) * | 2001-09-07 | 2008-03-06 | Semiconductor Energy Lab Co Ltd | 発光装置及び電子機器 |
JP2008076757A (ja) * | 2006-09-21 | 2008-04-03 | Sanyo Electric Co Ltd | エレクトロルミネッセンス表示装置及びエレクトロルミネッセンス表示装置の表示ばらつき補正方法 |
JP2008077110A (ja) * | 2004-02-12 | 2008-04-03 | Canon Inc | 駆動回路及びそれを用いた画像形成装置 |
US7397064B2 (en) | 2000-01-11 | 2008-07-08 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor display device |
JP2008176341A (ja) * | 2001-02-08 | 2008-07-31 | Semiconductor Energy Lab Co Ltd | 発光装置及び電子機器 |
JP2008225415A (ja) * | 2007-03-16 | 2008-09-25 | Hitachi Displays Ltd | 画像表示装置 |
US7442956B2 (en) | 2004-04-26 | 2008-10-28 | Seiko Epson Corporation | Organic EL device and electronic apparatus |
JP2008262191A (ja) * | 2008-03-31 | 2008-10-30 | Semiconductor Energy Lab Co Ltd | 表示装置 |
US7502000B2 (en) | 2004-02-12 | 2009-03-10 | Canon Kabushiki Kaisha | Drive circuit and image forming apparatus using the same |
JP2009086673A (ja) * | 2001-09-07 | 2009-04-23 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
JP2009110007A (ja) * | 2008-11-14 | 2009-05-21 | Hitachi Displays Ltd | 表示装置の駆動方法 |
JP2009151218A (ja) * | 2007-12-21 | 2009-07-09 | Eastman Kodak Co | 表示装置および画素電流測定方法 |
JP2009169372A (ja) * | 2008-01-18 | 2009-07-30 | Samsung Mobile Display Co Ltd | 有機電界発光表示装置及びその駆動方法 |
US7616423B2 (en) | 2002-04-23 | 2009-11-10 | Seiko Epson Corporation | Electronic equipment, driving method thereof and method of driving electronic circuit |
US7737924B2 (en) | 2001-12-07 | 2010-06-15 | Semiconductor Energy Laboratory Co., Ltd. | Display device and electric equipment using the same |
JP2011008272A (ja) * | 2010-07-14 | 2011-01-13 | Semiconductor Energy Lab Co Ltd | El表示装置 |
US7880690B2 (en) | 2002-08-30 | 2011-02-01 | Seiko Epson Corporation | Electronic circuit, method of driving electronic circuit, electro-optical device, method of driving electro-optical device, and electronic apparatus |
US7893895B2 (en) | 2004-07-05 | 2011-02-22 | Sony Corporation | Pixel circuit, display device, driving method of pixel circuit, and driving method of display device |
JP2011508260A (ja) * | 2007-12-21 | 2011-03-10 | グローバル オーエルイーディー テクノロジー リミティド ライアビリティ カンパニー | アナログトランジスタ駆動信号により補償されるエレクトロルミネセント・ディスプレイ |
JP2011048037A (ja) * | 2009-08-26 | 2011-03-10 | Hitachi Displays Ltd | 表示装置 |
WO2011086597A1 (ja) * | 2010-01-13 | 2011-07-21 | パナソニック株式会社 | 表示装置及びその駆動方法 |
US8013809B2 (en) | 2004-06-29 | 2011-09-06 | Semiconductor Energy Laboratory Co., Ltd. | Display device and driving method of the same, and electronic apparatus |
JP2012027481A (ja) * | 2003-01-31 | 2012-02-09 | Global Oled Technology Llc | 有機発光ダイオード(oled)表示装置 |
US8194006B2 (en) | 2004-08-23 | 2012-06-05 | Semiconductor Energy Laboratory Co., Ltd. | Display device, driving method of the same, and electronic device comprising monitoring elements |
US8254865B2 (en) | 2006-04-07 | 2012-08-28 | Belair Networks | System and method for frequency offsetting of information communicated in MIMO-based wireless networks |
US8280337B2 (en) | 2006-04-07 | 2012-10-02 | Belair Networks Inc. | System and method for zero intermediate frequency filtering of information communicated in wireless networks |
JP2012191216A (ja) * | 1999-02-23 | 2012-10-04 | Semiconductor Energy Lab Co Ltd | El表示装置 |
WO2013008271A1 (ja) * | 2011-07-12 | 2013-01-17 | パナソニック株式会社 | 表示装置 |
WO2013008272A1 (ja) * | 2011-07-12 | 2013-01-17 | パナソニック株式会社 | 表示装置および表示装置の駆動方法 |
JP2013101364A (ja) * | 2012-12-19 | 2013-05-23 | Semiconductor Energy Lab Co Ltd | 表示装置及び電子機器 |
US8456459B2 (en) | 2000-01-31 | 2013-06-04 | Semiconductor Energy Laboratory Co., Ltd. | Adhesion type area sensor and display device having adhesion type area sensor |
JP2013122619A (ja) * | 2000-04-26 | 2013-06-20 | Semiconductor Energy Lab Co Ltd | 表示装置 |
US8542166B2 (en) | 2006-12-22 | 2013-09-24 | Sanyo Semiconductor Co., Ltd. | Electroluminescence display apparatus with video signal rewriting |
US8558767B2 (en) | 2007-08-23 | 2013-10-15 | Samsung Display Co., Ltd. | Organic light emitting display and driving method thereof |
JP2014056245A (ja) * | 2013-10-04 | 2014-03-27 | Semiconductor Energy Lab Co Ltd | El表示装置 |
US8743028B2 (en) | 2000-01-17 | 2014-06-03 | Semiconductor Energy Laboratory Co., Ltd. | Display system and electrical appliance |
WO2014188813A1 (ja) * | 2013-05-23 | 2014-11-27 | ソニー株式会社 | 映像信号処理回路、映像信号処理方法、及び、表示装置 |
JP2014238589A (ja) * | 2014-07-09 | 2014-12-18 | 株式会社半導体エネルギー研究所 | 表示装置及び電子機器 |
US8952952B2 (en) | 2011-06-16 | 2015-02-10 | Panasonic Corporation | Display device |
JP2015129945A (ja) * | 2015-01-20 | 2015-07-16 | 株式会社半導体エネルギー研究所 | El表示装置 |
US9185751B2 (en) | 2011-06-16 | 2015-11-10 | Joled Inc. | Display device |
JP2016021067A (ja) * | 2015-07-24 | 2016-02-04 | 株式会社半導体エネルギー研究所 | 表示装置及び電子機器 |
US9275572B2 (en) | 2011-06-23 | 2016-03-01 | Joled Inc. | Display device and display device driving method for causing reduction in power consumption |
JP2016075940A (ja) * | 2015-12-11 | 2016-05-12 | 株式会社半導体エネルギー研究所 | El表示装置 |
JP2016186633A (ja) * | 2016-04-25 | 2016-10-27 | 株式会社半導体エネルギー研究所 | 半導体装置及び電子機器 |
JP2017013315A (ja) * | 2015-06-30 | 2017-01-19 | 京セラディスプレイ株式会社 | 発光装置 |
JP2017083813A (ja) * | 2015-10-28 | 2017-05-18 | 三星ディスプレイ株式會社Samsung Display Co.,Ltd. | 表示装置 |
US9812065B2 (en) | 2005-08-10 | 2017-11-07 | Samsung Display Co., Ltd. | Data driver, organic light emitting display device using the same, and method of driving the organic light emitting display device |
US9837451B2 (en) | 1999-04-27 | 2017-12-05 | Semiconductor Energy Laboratory Co., Ltd. | Electronic device and electronic apparatus |
CN109767725A (zh) * | 2019-03-19 | 2019-05-17 | 京东方科技集团股份有限公司 | 一种像素驱动电路及其驱动方法、显示装置 |
Families Citing this family (293)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6462722B1 (en) * | 1997-02-17 | 2002-10-08 | Seiko Epson Corporation | Current-driven light-emitting display apparatus and method of producing the same |
TW578130B (en) * | 1997-02-17 | 2004-03-01 | Seiko Epson Corp | Display unit |
US6518962B2 (en) * | 1997-03-12 | 2003-02-11 | Seiko Epson Corporation | Pixel circuit display apparatus and electronic apparatus equipped with current driving type light-emitting device |
US6207842B1 (en) * | 1997-10-09 | 2001-03-27 | Mars Incorporated | Process for preparing procyanidin(4-6 or 4-8) oligomers and their derivatives |
JP3305283B2 (ja) * | 1998-05-01 | 2002-07-22 | キヤノン株式会社 | 画像表示装置及び前記装置の制御方法 |
JP4092827B2 (ja) * | 1999-01-29 | 2008-05-28 | セイコーエプソン株式会社 | 表示装置 |
US6677613B1 (en) * | 1999-03-03 | 2004-01-13 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method of fabricating the same |
JP2001042827A (ja) * | 1999-08-03 | 2001-02-16 | Pioneer Electronic Corp | ディスプレイ装置及びディスプレイパネルの駆動回路 |
US6344641B1 (en) * | 1999-08-11 | 2002-02-05 | Agilent Technologies, Inc. | System and method for on-chip calibration of illumination sources for an integrated circuit display |
GB9919536D0 (en) | 1999-08-19 | 1999-10-20 | Koninkl Philips Electronics Nv | Active matrix electroluminescent display device |
EP1079361A1 (en) * | 1999-08-20 | 2001-02-28 | Harness System Technologies Research, Ltd. | Driver for electroluminescent elements |
JP2003509728A (ja) | 1999-09-11 | 2003-03-11 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | アクティブマトリックスelディスプレイ装置 |
US6876145B1 (en) * | 1999-09-30 | 2005-04-05 | Semiconductor Energy Laboratory Co., Ltd. | Organic electroluminescent display device |
JP2001110565A (ja) * | 1999-10-04 | 2001-04-20 | Auto Network Gijutsu Kenkyusho:Kk | 表示素子駆動装置 |
US6392617B1 (en) * | 1999-10-27 | 2002-05-21 | Agilent Technologies, Inc. | Active matrix light emitting diode display |
US6580094B1 (en) | 1999-10-29 | 2003-06-17 | Semiconductor Energy Laboratory Co., Ltd. | Electro luminescence display device |
ATE302429T1 (de) * | 2000-03-14 | 2005-09-15 | Koninkl Philips Electronics Nv | Flüssigkristallanzeigevorrichtung mit mitteln zur temperaturkompensation der betriebsspannung |
US6873310B2 (en) * | 2000-03-30 | 2005-03-29 | Seiko Epson Corporation | Display device |
GB2360870A (en) * | 2000-03-31 | 2001-10-03 | Seiko Epson Corp | Driver circuit for organic electroluminescent device |
EP1158483A3 (en) | 2000-05-24 | 2003-02-05 | Eastman Kodak Company | Solid-state display with reference pixel |
TW538246B (en) * | 2000-06-05 | 2003-06-21 | Semiconductor Energy Lab | Display panel, display panel inspection method, and display panel manufacturing method |
US6995753B2 (en) * | 2000-06-06 | 2006-02-07 | Semiconductor Energy Laboratory Co., Ltd. | Display device and method of manufacturing the same |
JP2002072963A (ja) * | 2000-06-12 | 2002-03-12 | Semiconductor Energy Lab Co Ltd | 発光モジュールおよびその駆動方法並びに光センサ |
GB0014962D0 (en) * | 2000-06-20 | 2000-08-09 | Koninkl Philips Electronics Nv | Matrix array display devices with light sensing elements and associated storage capacitors |
GB0014961D0 (en) * | 2000-06-20 | 2000-08-09 | Koninkl Philips Electronics Nv | Light-emitting matrix array display devices with light sensing elements |
JP2002032058A (ja) * | 2000-07-18 | 2002-01-31 | Nec Corp | 表示装置 |
US6828950B2 (en) | 2000-08-10 | 2004-12-07 | Semiconductor Energy Laboratory Co., Ltd. | Display device and method of driving the same |
US7030551B2 (en) | 2000-08-10 | 2006-04-18 | Semiconductor Energy Laboratory Co., Ltd. | Area sensor and display apparatus provided with an area sensor |
US7053874B2 (en) * | 2000-09-08 | 2006-05-30 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and driving method thereof |
US6320325B1 (en) * | 2000-11-06 | 2001-11-20 | Eastman Kodak Company | Emissive display with luminance feedback from a representative pixel |
TW525216B (en) | 2000-12-11 | 2003-03-21 | Semiconductor Energy Lab | Semiconductor device, and manufacturing method thereof |
US6747290B2 (en) | 2000-12-12 | 2004-06-08 | Semiconductor Energy Laboratory Co., Ltd. | Information device |
SG111923A1 (en) | 2000-12-21 | 2005-06-29 | Semiconductor Energy Lab | Light emitting device and method of manufacturing the same |
JP2002215063A (ja) * | 2001-01-19 | 2002-07-31 | Sony Corp | アクティブマトリクス型表示装置 |
SG111928A1 (en) * | 2001-01-29 | 2005-06-29 | Semiconductor Energy Lab | Light emitting device |
SG107573A1 (en) * | 2001-01-29 | 2004-12-29 | Semiconductor Energy Lab | Light emitting device |
US7569849B2 (en) | 2001-02-16 | 2009-08-04 | Ignis Innovation Inc. | Pixel driver circuit and pixel circuit having the pixel driver circuit |
JP4831874B2 (ja) * | 2001-02-26 | 2011-12-07 | 株式会社半導体エネルギー研究所 | 発光装置及び電子機器 |
JP2002251167A (ja) | 2001-02-26 | 2002-09-06 | Sanyo Electric Co Ltd | 表示装置 |
JP3612494B2 (ja) | 2001-03-28 | 2005-01-19 | 株式会社日立製作所 | 表示装置 |
EP1393293B1 (de) * | 2001-04-04 | 2010-11-17 | Siemens Aktiengesellschaft | Alterungskopensation bei oled-displays |
TW580668B (en) * | 2001-05-09 | 2004-03-21 | Clare Micronix Integrated Syst | Method and system for current balancing in visual display devices |
US6963321B2 (en) * | 2001-05-09 | 2005-11-08 | Clare Micronix Integrated Systems, Inc. | Method of providing pulse amplitude modulation for OLED display drivers |
KR100746279B1 (ko) * | 2001-05-14 | 2007-08-03 | 삼성전자주식회사 | 유기 전계발광 디바이스 및 이의 제조방법 |
US20020171611A1 (en) * | 2001-05-15 | 2002-11-21 | Eastman Kodak Company | Active matrix organic light emitting diode flat-panel display |
CN1249446C (zh) * | 2001-05-15 | 2006-04-05 | 皇家菲利浦电子有限公司 | 包括多个发光二极管的显示装置和测定方法 |
JP2002351417A (ja) * | 2001-05-24 | 2002-12-06 | Internatl Business Mach Corp <Ibm> | 表示装置に使用されるドライバ回路の駆動電源電圧とそのドライバ回路内で階調電圧生成のために用いられる基準電圧とを生成する駆動電源回路、それら駆動電源電圧と基準電圧を生成するドライバ回路用電圧生成方法およびその駆動電源回路を備えた表示装置 |
GB0113331D0 (en) * | 2001-06-01 | 2001-07-25 | Printable Field Emitters Ltd | Drive electronics for display devices |
US6501230B1 (en) * | 2001-08-27 | 2002-12-31 | Eastman Kodak Company | Display with aging correction circuit |
SG120888A1 (en) * | 2001-09-28 | 2006-04-26 | Semiconductor Energy Lab | A light emitting device and electronic apparatus using the same |
SG120889A1 (en) * | 2001-09-28 | 2006-04-26 | Semiconductor Energy Lab | A light emitting device and electronic apparatus using the same |
GB2381644A (en) * | 2001-10-31 | 2003-05-07 | Cambridge Display Tech Ltd | Display drivers |
JP2003150107A (ja) * | 2001-11-09 | 2003-05-23 | Sharp Corp | 表示装置およびその駆動方法 |
KR100940342B1 (ko) | 2001-11-13 | 2010-02-04 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시장치 및 그 구동방법 |
US7071932B2 (en) * | 2001-11-20 | 2006-07-04 | Toppoly Optoelectronics Corporation | Data voltage current drive amoled pixel circuit |
JP3852916B2 (ja) | 2001-11-27 | 2006-12-06 | パイオニア株式会社 | ディスプレイ装置 |
US7274363B2 (en) | 2001-12-28 | 2007-09-25 | Pioneer Corporation | Panel display driving device and driving method |
JP2003273749A (ja) | 2002-03-18 | 2003-09-26 | Seiko Epson Corp | 信号伝送装置及び信号伝送方法、電子装置並びに電子機器 |
JP4027691B2 (ja) * | 2002-03-18 | 2007-12-26 | 株式会社日立製作所 | 液晶表示装置 |
US6911781B2 (en) | 2002-04-23 | 2005-06-28 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and production system of the same |
JP3861743B2 (ja) * | 2002-05-01 | 2006-12-20 | ソニー株式会社 | 電界発光素子の駆動方法 |
US7307607B2 (en) * | 2002-05-15 | 2007-12-11 | Semiconductor Energy Laboratory Co., Ltd. | Passive matrix light emitting device |
TWI360098B (en) | 2002-05-17 | 2012-03-11 | Semiconductor Energy Lab | Display apparatus and driving method thereof |
TWI345211B (en) * | 2002-05-17 | 2011-07-11 | Semiconductor Energy Lab | Display apparatus and driving method thereof |
US7474285B2 (en) * | 2002-05-17 | 2009-01-06 | Semiconductor Energy Laboratory Co., Ltd. | Display apparatus and driving method thereof |
US7184034B2 (en) * | 2002-05-17 | 2007-02-27 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
GB2389952A (en) * | 2002-06-18 | 2003-12-24 | Cambridge Display Tech Ltd | Driver circuits for electroluminescent displays with reduced power consumption |
JP2004086146A (ja) * | 2002-06-27 | 2004-03-18 | Fujitsu Display Technologies Corp | 液晶表示装置の駆動方法及び駆動制御回路、及びそれを備えた液晶表示装置 |
JP4115763B2 (ja) | 2002-07-10 | 2008-07-09 | パイオニア株式会社 | 表示装置及び表示方法 |
EP1383103B1 (fr) * | 2002-07-19 | 2012-03-21 | St Microelectronics S.A. | Adaption automatique de la tension d'alimentation d'un ecran electroluminescent en fonction de la luminance souhaitee |
US6821808B2 (en) * | 2002-08-23 | 2004-11-23 | Micron Technology, Inc. | CMOS APS with stacked avalanche multiplication layer which provides linear and logarithmic photo-conversion characteristics |
AU2003255995A1 (en) * | 2002-09-04 | 2004-03-29 | Koninklijke Philips Electronics N.V. | Electroluminescent display devices |
GB0220614D0 (en) * | 2002-09-05 | 2002-10-16 | Koninkl Philips Electronics Nv | Electroluminescent display devices |
US7385572B2 (en) * | 2002-09-09 | 2008-06-10 | E.I Du Pont De Nemours And Company | Organic electronic device having improved homogeneity |
JP2004146082A (ja) * | 2002-10-21 | 2004-05-20 | Semiconductor Energy Lab Co Ltd | 表示装置 |
JP2004138958A (ja) * | 2002-10-21 | 2004-05-13 | Semiconductor Energy Lab Co Ltd | 表示装置 |
EP2437246A1 (en) | 2002-10-31 | 2012-04-04 | Semiconductor Energy Laboratory Co., Ltd. | Display device and controlling method thereof |
JP4423848B2 (ja) | 2002-10-31 | 2010-03-03 | ソニー株式会社 | 画像表示装置、および、その色バランス調整方法 |
CN100440287C (zh) | 2002-11-04 | 2008-12-03 | 伊菲雷知识产权公司 | 用于对电致发光显示器进行灰阶伽马校正的方法和设备 |
JP4211368B2 (ja) * | 2002-11-25 | 2009-01-21 | 沖電気工業株式会社 | 表示駆動回路の試験方法 |
JP2006509232A (ja) * | 2002-12-04 | 2006-03-16 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 有機ledディスプレイ装置及びそのような装置を駆動するための方法 |
JP4497874B2 (ja) * | 2002-12-13 | 2010-07-07 | 株式会社ルネサステクノロジ | 半導体集積回路及びicカード |
CN100334613C (zh) * | 2002-12-16 | 2007-08-29 | 黄志伟 | 电致发光冷光片的驱动晶片 |
JP2006519463A (ja) | 2003-02-06 | 2006-08-24 | セイックス テクノロジーズ、インク | バックライト制御装置及びバックライト制御方法 |
CA2419704A1 (en) | 2003-02-24 | 2004-08-24 | Ignis Innovation Inc. | Method of manufacturing a pixel with organic light-emitting diode |
US7612749B2 (en) | 2003-03-04 | 2009-11-03 | Chi Mei Optoelectronics Corporation | Driving circuits for displays |
DE10314166A1 (de) * | 2003-03-28 | 2004-10-14 | Siemens Ag | Screensaver für organische Displays |
FR2854252B1 (fr) * | 2003-04-25 | 2005-08-05 | Thales Sa | Dispositif d'asservissement de parametres photo colorimetriques pour boite a lumiere a leds colorees |
JP5121114B2 (ja) * | 2003-05-29 | 2013-01-16 | 三洋電機株式会社 | 画素回路および表示装置 |
US20040257352A1 (en) * | 2003-06-18 | 2004-12-23 | Nuelight Corporation | Method and apparatus for controlling |
JP4235045B2 (ja) * | 2003-06-24 | 2009-03-04 | 株式会社 日立ディスプレイズ | 表示装置の駆動方法 |
GB0315929D0 (en) * | 2003-07-08 | 2003-08-13 | Koninkl Philips Electronics Nv | Display device |
GB0320503D0 (en) * | 2003-09-02 | 2003-10-01 | Koninkl Philips Electronics Nv | Active maxtrix display devices |
US8537081B2 (en) * | 2003-09-17 | 2013-09-17 | Hitachi Displays, Ltd. | Display apparatus and display control method |
CA2443206A1 (en) | 2003-09-23 | 2005-03-23 | Ignis Innovation Inc. | Amoled display backplanes - pixel driver circuits, array architecture, and external compensation |
JP4804711B2 (ja) * | 2003-11-21 | 2011-11-02 | 株式会社 日立ディスプレイズ | 画像表示装置 |
US7224332B2 (en) * | 2003-11-25 | 2007-05-29 | Eastman Kodak Company | Method of aging compensation in an OLED display |
US8040341B2 (en) * | 2004-01-09 | 2011-10-18 | O2Micro Inc | Brightness control system |
GB0401035D0 (en) * | 2004-01-17 | 2004-02-18 | Koninkl Philips Electronics Nv | Active matrix display devices |
US7027044B2 (en) * | 2004-02-20 | 2006-04-11 | Au Optronics Corporation | Power line arrangement for electroluminescence display devices |
CN1957471A (zh) * | 2004-04-06 | 2007-05-02 | 彩光公司 | 在平板显示器中与传感器阵列集成的彩色滤波器 |
CN1981318A (zh) | 2004-04-12 | 2007-06-13 | 彩光公司 | 用于有源矩阵发光显示器的低功耗电路及其控制方法 |
US20050248515A1 (en) * | 2004-04-28 | 2005-11-10 | Naugler W E Jr | Stabilized active matrix emissive display |
WO2005114630A1 (en) | 2004-05-21 | 2005-12-01 | Semiconductor Energy Laboratory Co., Ltd. | Display device and electronic device |
US7245297B2 (en) * | 2004-05-22 | 2007-07-17 | Semiconductor Energy Laboratory Co., Ltd. | Display device and electronic device |
TWI238374B (en) * | 2004-06-17 | 2005-08-21 | Au Optronics Corp | Organic light emitting diode display, display luminance compensating device thereof, and compensating method thereof |
US20050285822A1 (en) | 2004-06-29 | 2005-12-29 | Damoder Reddy | High-performance emissive display device for computers, information appliances, and entertainment systems |
CA2472671A1 (en) * | 2004-06-29 | 2005-12-29 | Ignis Innovation Inc. | Voltage-programming scheme for current-driven amoled displays |
KR20060001372A (ko) * | 2004-06-30 | 2006-01-06 | 삼성에스디아이 주식회사 | 배경휘도 저감형 전자 방출 장치 |
JP4705764B2 (ja) * | 2004-07-14 | 2011-06-22 | 株式会社半導体エネルギー研究所 | ビデオデータ補正回路及び表示装置の制御回路並びにそれを内蔵した表示装置・電子機器 |
TWI231154B (en) * | 2004-08-03 | 2005-04-11 | Au Optronics Corp | Top emitting OLED structure and fabrication method thereof |
US20060044299A1 (en) * | 2004-08-31 | 2006-03-02 | Jian Wang | System and method for compensating for a fabrication artifact in an electronic device |
US20060103643A1 (en) * | 2004-09-27 | 2006-05-18 | Mithran Mathew | Measuring and modeling power consumption in displays |
US7343080B2 (en) * | 2004-09-27 | 2008-03-11 | Idc, Llc | System and method of testing humidity in a sealed MEMS device |
US7453579B2 (en) * | 2004-09-27 | 2008-11-18 | Idc, Llc | Measurement of the dynamic characteristics of interferometric modulators |
US7359066B2 (en) * | 2004-09-27 | 2008-04-15 | Idc, Llc | Electro-optical measurement of hysteresis in interferometric modulators |
US7289256B2 (en) * | 2004-09-27 | 2007-10-30 | Idc, Llc | Electrical characterization of interferometric modulators |
US7415186B2 (en) * | 2004-09-27 | 2008-08-19 | Idc, Llc | Methods for visually inspecting interferometric modulators for defects |
US20060176487A1 (en) * | 2004-09-27 | 2006-08-10 | William Cummings | Process control monitors for interferometric modulators |
WO2006043687A1 (en) * | 2004-10-22 | 2006-04-27 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
JP2006133307A (ja) * | 2004-11-02 | 2006-05-25 | Matsushita Toshiba Picture Display Co Ltd | 自発光型表示装置 |
FR2879008A1 (fr) * | 2004-12-06 | 2006-06-09 | St Microelectronics Sa | Adaptation automatique de la tension d'alimentation d'un ecran electroluminescent en fonction de la luminance souhaitee |
US7812794B2 (en) * | 2004-12-06 | 2010-10-12 | Semiconductor Energy Laboratory Co., Ltd. | Display device and driving method thereof |
CA2490858A1 (en) | 2004-12-07 | 2006-06-07 | Ignis Innovation Inc. | Driving method for compensated voltage-programming of amoled displays |
US20140111567A1 (en) | 2005-04-12 | 2014-04-24 | Ignis Innovation Inc. | System and method for compensation of non-uniformities in light emitting device displays |
US10013907B2 (en) | 2004-12-15 | 2018-07-03 | Ignis Innovation Inc. | Method and system for programming, calibrating and/or compensating, and driving an LED display |
US10012678B2 (en) | 2004-12-15 | 2018-07-03 | Ignis Innovation Inc. | Method and system for programming, calibrating and/or compensating, and driving an LED display |
US20060170623A1 (en) * | 2004-12-15 | 2006-08-03 | Naugler W E Jr | Feedback based apparatus, systems and methods for controlling emissive pixels using pulse width modulation and voltage modulation techniques |
US8576217B2 (en) | 2011-05-20 | 2013-11-05 | Ignis Innovation Inc. | System and methods for extraction of threshold and mobility parameters in AMOLED displays |
US9171500B2 (en) | 2011-05-20 | 2015-10-27 | Ignis Innovation Inc. | System and methods for extraction of parasitic parameters in AMOLED displays |
KR20070101275A (ko) | 2004-12-15 | 2007-10-16 | 이그니스 이노베이션 인크. | 발광 소자를 프로그래밍하고, 교정하고, 구동시키기 위한방법 및 시스템 |
US9799246B2 (en) | 2011-05-20 | 2017-10-24 | Ignis Innovation Inc. | System and methods for extraction of threshold and mobility parameters in AMOLED displays |
US9280933B2 (en) | 2004-12-15 | 2016-03-08 | Ignis Innovation Inc. | System and methods for extraction of threshold and mobility parameters in AMOLED displays |
US8599191B2 (en) | 2011-05-20 | 2013-12-03 | Ignis Innovation Inc. | System and methods for extraction of threshold and mobility parameters in AMOLED displays |
US9275579B2 (en) | 2004-12-15 | 2016-03-01 | Ignis Innovation Inc. | System and methods for extraction of threshold and mobility parameters in AMOLED displays |
KR100613093B1 (ko) * | 2004-12-24 | 2006-08-16 | 삼성에스디아이 주식회사 | 데이터 집적회로 및 이를 이용한 발광 표시장치 |
US20060180890A1 (en) * | 2005-01-18 | 2006-08-17 | Naugler W E Jr | Top emission flat panel display with sensor feedback stabilization |
CA2495726A1 (en) | 2005-01-28 | 2006-07-28 | Ignis Innovation Inc. | Locally referenced voltage programmed pixel for amoled displays |
CA2496642A1 (en) | 2005-02-10 | 2006-08-10 | Ignis Innovation Inc. | Fast settling time driving method for organic light-emitting diode (oled) displays based on current programming |
EP1729280B1 (en) * | 2005-03-31 | 2013-10-30 | Semiconductor Energy Laboratory Co., Ltd. | Display device, display module, electronic apparatus and driving method of the display device |
US7595778B2 (en) * | 2005-04-15 | 2009-09-29 | Semiconductor Energy Laboratory Co., Ltd. | Display device and electronic device using the same |
JP2006301220A (ja) * | 2005-04-20 | 2006-11-02 | Hitachi Displays Ltd | 表示装置及びその駆動方法 |
EP1886298A2 (en) * | 2005-05-19 | 2008-02-13 | Koninklijke Philips Electronics N.V. | Electroluminescent display devices |
JP4400588B2 (ja) * | 2005-06-02 | 2010-01-20 | エプソンイメージングデバイス株式会社 | 電気光学装置、電気光学装置の駆動方法、および、電子機器 |
EP1904995A4 (en) | 2005-06-08 | 2011-01-05 | Ignis Innovation Inc | METHOD AND SYSTEM FOR CONTROLLING A LIGHT EMITTING DEVICE DISPLAY |
US20070109284A1 (en) * | 2005-08-12 | 2007-05-17 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
KR20070029020A (ko) * | 2005-09-08 | 2007-03-13 | 삼성에스디아이 주식회사 | 전자방출표시소자 및 그의 구동방법 |
CA2518276A1 (en) | 2005-09-13 | 2007-03-13 | Ignis Innovation Inc. | Compensation technique for luminance degradation in electro-luminance devices |
JP2007121988A (ja) * | 2005-09-30 | 2007-05-17 | Seiko Epson Corp | 表示方法、表示装置及び電子機器 |
JP2007141799A (ja) * | 2005-11-22 | 2007-06-07 | Nec Lcd Technologies Ltd | 面照明光源、該面照明光源に用いられる輝度補正回路及び輝度補正方法 |
EP1792563A1 (de) * | 2005-12-02 | 2007-06-06 | F.Hoffmann-La Roche Ag | Analysesystem mit organischer Leuchtdiodenanzeige |
EP1796070A1 (en) | 2005-12-08 | 2007-06-13 | Thomson Licensing | Luminous display and method for controlling the same |
TWI320163B (en) * | 2005-12-23 | 2010-02-01 | Circuit and method of adjusting voltage of liquid crystal display panel | |
US7449697B2 (en) * | 2006-01-04 | 2008-11-11 | Tpo Displays Corp. | Organic electroluminescent devices and fabrication methods thereof |
KR101238721B1 (ko) * | 2006-01-07 | 2013-03-06 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시장치 및 그 제조방법 |
TW200729139A (en) * | 2006-01-16 | 2007-08-01 | Au Optronics Corp | Driving method capable improving display uniformity |
DE102006008018A1 (de) * | 2006-02-21 | 2007-08-23 | Osram Opto Semiconductors Gmbh | Beleuchtungseinrichtung |
JP4360375B2 (ja) * | 2006-03-20 | 2009-11-11 | セイコーエプソン株式会社 | 電気光学装置、電子機器、及び駆動方法 |
JP2007264088A (ja) | 2006-03-27 | 2007-10-11 | Funai Electric Co Ltd | 表示装置、焼き付き補正システム及び焼き付き補正方法 |
KR100759682B1 (ko) * | 2006-03-30 | 2007-09-17 | 삼성에스디아이 주식회사 | 유기 전계 발광표시장치 |
US20090117859A1 (en) * | 2006-04-07 | 2009-05-07 | Belair Networks Inc. | System and method for frequency offsetting of information communicated in mimo based wireless networks |
EP2008264B1 (en) | 2006-04-19 | 2016-11-16 | Ignis Innovation Inc. | Stable driving scheme for active matrix displays |
DE602006018423D1 (de) | 2006-05-02 | 2011-01-05 | Chimei Innolux Corp | Organische Elektrolumineszenzvorrichtung und Herstellungsverfahren |
US7397065B2 (en) | 2006-05-02 | 2008-07-08 | Tpo Displays Corp. | Organic electroluminescent device and fabrication methods thereof |
KR100776498B1 (ko) * | 2006-06-09 | 2007-11-16 | 삼성에스디아이 주식회사 | 유기 전계 발광표시장치 및 그의 제조방법 |
US20080135614A1 (en) * | 2006-06-30 | 2008-06-12 | The Penn State Research Foundation | Passive detection of analytes |
JP4935979B2 (ja) | 2006-08-10 | 2012-05-23 | カシオ計算機株式会社 | 表示装置及びその駆動方法、並びに、表示駆動装置及びその駆動方法 |
CA2556961A1 (en) | 2006-08-15 | 2008-02-15 | Ignis Innovation Inc. | Oled compensation technique based on oled capacitance |
JP4860701B2 (ja) * | 2006-09-06 | 2012-01-25 | シャープ株式会社 | 照明装置、バックライト装置、液晶表示装置、照明装置の制御方法、液晶表示装置の制御方法 |
TWI348677B (en) * | 2006-09-12 | 2011-09-11 | Ind Tech Res Inst | System for increasing circuit reliability and method thereof |
TWI453711B (zh) * | 2007-03-21 | 2014-09-21 | Semiconductor Energy Lab | 顯示裝置 |
KR100884791B1 (ko) * | 2007-04-06 | 2009-02-23 | 삼성모바일디스플레이주식회사 | 유기 발광 디스플레이 장치 및 이의 구동 방법 |
KR100914118B1 (ko) * | 2007-04-24 | 2009-08-27 | 삼성모바일디스플레이주식회사 | 유기 전계 발광 표시 장치 및 그 구동 방법 |
KR101526475B1 (ko) * | 2007-06-29 | 2015-06-05 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시 장치 및 그 구동 방법 |
FR2918449B1 (fr) * | 2007-07-02 | 2010-05-21 | Ulis | Dispositif de detection de rayonnement infrarouge a detecteurs bolometriques |
JP2009025735A (ja) * | 2007-07-23 | 2009-02-05 | Hitachi Displays Ltd | 画像表示装置 |
KR100885966B1 (ko) * | 2007-07-27 | 2009-02-26 | 삼성에스디아이 주식회사 | 유기 발광 표시 장치 및 그 구동 방법 |
JP5164987B2 (ja) * | 2007-07-30 | 2013-03-21 | エルジー ディスプレイ カンパニー リミテッド | 画像表示装置、画像表示装置の制御方法、画像表示装置の調整システム |
KR100884458B1 (ko) * | 2007-09-14 | 2009-02-20 | 삼성모바일디스플레이주식회사 | 유기전계발광장치 및 그의 제조 방법 |
GB2453373A (en) * | 2007-10-05 | 2009-04-08 | Cambridge Display Tech Ltd | Voltage controlled display driver for an electroluminescent display |
GB2453374A (en) | 2007-10-05 | 2009-04-08 | Cambridge Display Tech Ltd | Matching multiple current sources/sinks |
JP4386128B2 (ja) * | 2007-11-15 | 2009-12-16 | ソニー株式会社 | 有機電界発光表示装置 |
JP2009151293A (ja) | 2007-11-30 | 2009-07-09 | Semiconductor Energy Lab Co Ltd | 表示装置及び表示装置の作製方法、並びに電子機器 |
US8823630B2 (en) * | 2007-12-18 | 2014-09-02 | Cree, Inc. | Systems and methods for providing color management control in a lighting panel |
JP2009198691A (ja) * | 2008-02-20 | 2009-09-03 | Eastman Kodak Co | 有機el表示モジュールおよびその製造方法 |
US9570004B1 (en) * | 2008-03-16 | 2017-02-14 | Nongqiang Fan | Method of driving pixel element in active matrix display |
JP2009237200A (ja) * | 2008-03-27 | 2009-10-15 | Hitachi Displays Ltd | 画像表示装置 |
JP5142791B2 (ja) * | 2008-04-01 | 2013-02-13 | 株式会社ジャパンディスプレイイースト | 表示装置 |
JP5250493B2 (ja) | 2008-07-16 | 2013-07-31 | 株式会社半導体エネルギー研究所 | 発光装置 |
JP5277926B2 (ja) * | 2008-12-15 | 2013-08-28 | ソニー株式会社 | 表示装置及びその駆動方法と電子機器 |
JP5509589B2 (ja) * | 2008-12-17 | 2014-06-04 | ソニー株式会社 | 表示装置および電子機器 |
US8217928B2 (en) * | 2009-03-03 | 2012-07-10 | Global Oled Technology Llc | Electroluminescent subpixel compensated drive signal |
US8194063B2 (en) * | 2009-03-04 | 2012-06-05 | Global Oled Technology Llc | Electroluminescent display compensated drive signal |
US8427170B2 (en) * | 2009-03-05 | 2013-04-23 | Casio Computer Co., Ltd. | Drive circuit array substrate and production and test methods thereof |
JP5384184B2 (ja) | 2009-04-23 | 2014-01-08 | グローバル・オーエルイーディー・テクノロジー・リミテッド・ライアビリティ・カンパニー | 表示装置 |
US9384698B2 (en) | 2009-11-30 | 2016-07-05 | Ignis Innovation Inc. | System and methods for aging compensation in AMOLED displays |
US9311859B2 (en) | 2009-11-30 | 2016-04-12 | Ignis Innovation Inc. | Resetting cycle for aging compensation in AMOLED displays |
US10319307B2 (en) | 2009-06-16 | 2019-06-11 | Ignis Innovation Inc. | Display system with compensation techniques and/or shared level resources |
CA2669367A1 (en) | 2009-06-16 | 2010-12-16 | Ignis Innovation Inc | Compensation technique for color shift in displays |
CA2688870A1 (en) | 2009-11-30 | 2011-05-30 | Ignis Innovation Inc. | Methode and techniques for improving display uniformity |
TWI496042B (zh) * | 2009-07-02 | 2015-08-11 | Semiconductor Energy Lab | 觸控面板及其驅動方法 |
KR101178910B1 (ko) * | 2009-07-30 | 2012-09-03 | 삼성디스플레이 주식회사 | 유기전계발광 표시장치 및 이의 구동전압 설정방법 |
KR20110026749A (ko) * | 2009-09-08 | 2011-03-16 | 삼성전자주식회사 | 백라이트 장치 및 이를 포함한 디스플레이 장치 |
US8497828B2 (en) | 2009-11-12 | 2013-07-30 | Ignis Innovation Inc. | Sharing switch TFTS in pixel circuits |
US10996258B2 (en) | 2009-11-30 | 2021-05-04 | Ignis Innovation Inc. | Defect detection and correction of pixel circuits for AMOLED displays |
US8803417B2 (en) | 2009-12-01 | 2014-08-12 | Ignis Innovation Inc. | High resolution pixel architecture |
CA2687631A1 (en) | 2009-12-06 | 2011-06-06 | Ignis Innovation Inc | Low power driving scheme for display applications |
JP5502899B2 (ja) * | 2009-12-24 | 2014-05-28 | パナソニック株式会社 | 画像表示装置および画像表示方法 |
JP5240581B2 (ja) * | 2009-12-28 | 2013-07-17 | カシオ計算機株式会社 | 画素駆動装置、発光装置及びその駆動制御方法、並びに、電子機器 |
JP5146521B2 (ja) * | 2009-12-28 | 2013-02-20 | カシオ計算機株式会社 | 画素駆動装置、発光装置及びその駆動制御方法、並びに、電子機器 |
US10176736B2 (en) | 2010-02-04 | 2019-01-08 | Ignis Innovation Inc. | System and methods for extracting correlation curves for an organic light emitting device |
US20140313111A1 (en) | 2010-02-04 | 2014-10-23 | Ignis Innovation Inc. | System and methods for extracting correlation curves for an organic light emitting device |
US10089921B2 (en) | 2010-02-04 | 2018-10-02 | Ignis Innovation Inc. | System and methods for extracting correlation curves for an organic light emitting device |
CA2692097A1 (en) | 2010-02-04 | 2011-08-04 | Ignis Innovation Inc. | Extracting correlation curves for light emitting device |
US9881532B2 (en) | 2010-02-04 | 2018-01-30 | Ignis Innovation Inc. | System and method for extracting correlation curves for an organic light emitting device |
US10163401B2 (en) | 2010-02-04 | 2018-12-25 | Ignis Innovation Inc. | System and methods for extracting correlation curves for an organic light emitting device |
KR101094303B1 (ko) * | 2010-03-15 | 2011-12-19 | 삼성모바일디스플레이주식회사 | 표시 패널의 테스트 장치 및 테스트 방법 |
CA2696778A1 (en) | 2010-03-17 | 2011-09-17 | Ignis Innovation Inc. | Lifetime, uniformity, parameter extraction methods |
US8907991B2 (en) | 2010-12-02 | 2014-12-09 | Ignis Innovation Inc. | System and methods for thermal compensation in AMOLED displays |
CN109272933A (zh) | 2011-05-17 | 2019-01-25 | 伊格尼斯创新公司 | 操作显示器的方法 |
US9606607B2 (en) | 2011-05-17 | 2017-03-28 | Ignis Innovation Inc. | Systems and methods for display systems with dynamic power control |
US9530349B2 (en) | 2011-05-20 | 2016-12-27 | Ignis Innovations Inc. | Charged-based compensation and parameter extraction in AMOLED displays |
US9466240B2 (en) | 2011-05-26 | 2016-10-11 | Ignis Innovation Inc. | Adaptive feedback system for compensating for aging pixel areas with enhanced estimation speed |
JP2014517940A (ja) | 2011-05-27 | 2014-07-24 | イグニス・イノベイション・インコーポレーテッド | Amoledディスプレイにおけるエージング補償ためのシステムおよび方法 |
JP5834237B2 (ja) * | 2011-06-15 | 2015-12-16 | パナソニックIpマネジメント株式会社 | 照明装置 |
KR101829398B1 (ko) * | 2011-06-30 | 2018-02-20 | 삼성디스플레이 주식회사 | 유기전계발광 표시장치 및 그의 구동방법 |
US9070775B2 (en) | 2011-08-03 | 2015-06-30 | Ignis Innovations Inc. | Thin film transistor |
US8901579B2 (en) | 2011-08-03 | 2014-12-02 | Ignis Innovation Inc. | Organic light emitting diode and method of manufacturing |
JP5814705B2 (ja) * | 2011-09-06 | 2015-11-17 | キヤノン株式会社 | 表示装置 |
US10089924B2 (en) | 2011-11-29 | 2018-10-02 | Ignis Innovation Inc. | Structural and low-frequency non-uniformity compensation |
US9385169B2 (en) | 2011-11-29 | 2016-07-05 | Ignis Innovation Inc. | Multi-functional active matrix organic light-emitting diode display |
US9324268B2 (en) | 2013-03-15 | 2016-04-26 | Ignis Innovation Inc. | Amoled displays with multiple readout circuits |
US8937632B2 (en) | 2012-02-03 | 2015-01-20 | Ignis Innovation Inc. | Driving system for active-matrix displays |
KR101918185B1 (ko) * | 2012-03-14 | 2018-11-14 | 삼성디스플레이 주식회사 | 어레이 검사 방법 및 어레이 검사 장치 |
CN104170000B (zh) * | 2012-04-04 | 2018-09-07 | 赛诺菲-安万特德国有限公司 | 用于检测数字显示器的方法和装置 |
US9747834B2 (en) | 2012-05-11 | 2017-08-29 | Ignis Innovation Inc. | Pixel circuits including feedback capacitors and reset capacitors, and display systems therefore |
US8922544B2 (en) | 2012-05-23 | 2014-12-30 | Ignis Innovation Inc. | Display systems with compensation for line propagation delay |
KR101905793B1 (ko) * | 2012-06-04 | 2018-10-11 | 삼성디스플레이 주식회사 | 터치 스크린 패널 일체형 유기전계 발광 표시장치 |
US8907935B2 (en) | 2012-06-08 | 2014-12-09 | Apple Inc. | Backlight calibration and control |
CN104520918B (zh) * | 2012-08-02 | 2016-08-31 | 夏普株式会社 | 显示装置和其驱动方法 |
EP2701140B1 (en) * | 2012-08-23 | 2015-12-09 | BlackBerry Limited | Organic light emitting diode based display aging monitoring |
US8922599B2 (en) | 2012-08-23 | 2014-12-30 | Blackberry Limited | Organic light emitting diode based display aging monitoring |
US9786223B2 (en) | 2012-12-11 | 2017-10-10 | Ignis Innovation Inc. | Pixel circuits for AMOLED displays |
US9336717B2 (en) | 2012-12-11 | 2016-05-10 | Ignis Innovation Inc. | Pixel circuits for AMOLED displays |
US9171504B2 (en) | 2013-01-14 | 2015-10-27 | Ignis Innovation Inc. | Driving scheme for emissive displays providing compensation for driving transistor variations |
US9830857B2 (en) | 2013-01-14 | 2017-11-28 | Ignis Innovation Inc. | Cleaning common unwanted signals from pixel measurements in emissive displays |
US20140218331A1 (en) * | 2013-02-07 | 2014-08-07 | Au Optronics Corporation | Dynamic power adjustment of level shift for noise rejection in capacitance touch system |
US9721505B2 (en) | 2013-03-08 | 2017-08-01 | Ignis Innovation Inc. | Pixel circuits for AMOLED displays |
EP3043338A1 (en) | 2013-03-14 | 2016-07-13 | Ignis Innovation Inc. | Re-interpolation with edge detection for extracting an aging pattern for amoled displays |
US9952698B2 (en) | 2013-03-15 | 2018-04-24 | Ignis Innovation Inc. | Dynamic adjustment of touch resolutions on an AMOLED display |
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US9437137B2 (en) | 2013-08-12 | 2016-09-06 | Ignis Innovation Inc. | Compensation accuracy |
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US9741282B2 (en) | 2013-12-06 | 2017-08-22 | Ignis Innovation Inc. | OLED display system and method |
US9761170B2 (en) | 2013-12-06 | 2017-09-12 | Ignis Innovation Inc. | Correction for localized phenomena in an image array |
US9502653B2 (en) | 2013-12-25 | 2016-11-22 | Ignis Innovation Inc. | Electrode contacts |
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CN104867443A (zh) * | 2014-02-21 | 2015-08-26 | 群创光电股份有限公司 | 有机发光显示器 |
US10997901B2 (en) | 2014-02-28 | 2021-05-04 | Ignis Innovation Inc. | Display system |
US10176752B2 (en) | 2014-03-24 | 2019-01-08 | Ignis Innovation Inc. | Integrated gate driver |
DE102015206281A1 (de) | 2014-04-08 | 2015-10-08 | Ignis Innovation Inc. | Anzeigesystem mit gemeinsam genutzten Niveauressourcen für tragbare Vorrichtungen |
CN104036721B (zh) * | 2014-05-15 | 2017-01-18 | 京东方科技集团股份有限公司 | 有机发光二极管显示面板及其驱动方法、显示装置 |
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CA2872563A1 (en) | 2014-11-28 | 2016-05-28 | Ignis Innovation Inc. | High pixel density array architecture |
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CA2879462A1 (en) | 2015-01-23 | 2016-07-23 | Ignis Innovation Inc. | Compensation for color variation in emissive devices |
CA2889870A1 (en) | 2015-05-04 | 2016-11-04 | Ignis Innovation Inc. | Optical feedback system |
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KR102393410B1 (ko) * | 2015-07-06 | 2022-05-03 | 삼성디스플레이 주식회사 | 전류 센서 및 그를 포함하는 유기전계발광 표시장치 |
US10373554B2 (en) | 2015-07-24 | 2019-08-06 | Ignis Innovation Inc. | Pixels and reference circuits and timing techniques |
CA2898282A1 (en) | 2015-07-24 | 2017-01-24 | Ignis Innovation Inc. | Hybrid calibration of current sources for current biased voltage progra mmed (cbvp) displays |
US10657895B2 (en) | 2015-07-24 | 2020-05-19 | Ignis Innovation Inc. | Pixels and reference circuits and timing techniques |
CA2900170A1 (en) | 2015-08-07 | 2017-02-07 | Gholamreza Chaji | Calibration of pixel based on improved reference values |
CA2909813A1 (en) | 2015-10-26 | 2017-04-26 | Ignis Innovation Inc | High ppi pattern orientation |
CN105957466B (zh) * | 2016-04-25 | 2019-08-09 | Oppo广东移动通信有限公司 | 一种发光元件的老化确定方法、装置及移动终端 |
JP2017212533A (ja) * | 2016-05-24 | 2017-11-30 | 株式会社ジャパンディスプレイ | 撮像表示システム及び撮像装置 |
DE102017222059A1 (de) | 2016-12-06 | 2018-06-07 | Ignis Innovation Inc. | Pixelschaltungen zur Minderung von Hysterese |
CN108630147A (zh) * | 2017-03-17 | 2018-10-09 | 昆山工研院新型平板显示技术中心有限公司 | 有源矩阵有机发光显示器及其驱动方法 |
EP3389039A1 (en) | 2017-04-13 | 2018-10-17 | Samsung Electronics Co., Ltd. | Display panel and driving method of display panel |
US10714018B2 (en) | 2017-05-17 | 2020-07-14 | Ignis Innovation Inc. | System and method for loading image correction data for displays |
US11025899B2 (en) | 2017-08-11 | 2021-06-01 | Ignis Innovation Inc. | Optical correction systems and methods for correcting non-uniformity of emissive display devices |
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US10971078B2 (en) | 2018-02-12 | 2021-04-06 | Ignis Innovation Inc. | Pixel measurement through data line |
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US12106712B2 (en) * | 2021-10-05 | 2024-10-01 | Wuhan Tianma Micro-Electronics Co., Ltd. | Display device |
KR20230139635A (ko) * | 2022-03-28 | 2023-10-05 | 엘지전자 주식회사 | 영상표시장치 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6145281A (ja) * | 1984-08-10 | 1986-03-05 | 富士通機電株式会社 | 大画面映像装置用輝度補正装置 |
JPH04269790A (ja) * | 1991-02-26 | 1992-09-25 | Matsushita Electric Ind Co Ltd | 情報表示装置 |
JPH0854835A (ja) * | 1994-08-09 | 1996-02-27 | Nec Corp | アクティブマトリクス型電流制御型発光素子の駆動回路 |
JPH08227276A (ja) * | 1995-02-21 | 1996-09-03 | Pioneer Electron Corp | 有機エレクトロルミネッセンスディスプレイパネルとその製造方法 |
JPH0964365A (ja) * | 1995-08-21 | 1997-03-07 | Matsushita Electric Ind Co Ltd | 薄膜トランジスタの製造方法 |
Family Cites Families (67)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5528247A (en) * | 1978-08-21 | 1980-02-28 | Hitachi Ltd | El element drive circuit |
US4700390A (en) | 1983-03-17 | 1987-10-13 | Kenji Machida | Signal synthesizer |
JPS59181882A (ja) * | 1983-03-31 | 1984-10-16 | Toshiba Electric Equip Corp | 映像表示装置 |
JPS60198872A (ja) | 1984-03-23 | 1985-10-08 | Seiko Instr & Electronics Ltd | Led駆動用mos集積回路 |
DE3726243A1 (de) * | 1987-08-07 | 1989-02-16 | Kabelmetal Electro Gmbh | Schaltungsanordnung zur regelung der leistung einer laserdiode |
JPH01193797A (ja) * | 1988-01-28 | 1989-08-03 | Deikushii Kk | 自発光型表示装置 |
US5093654A (en) | 1989-05-17 | 1992-03-03 | Eldec Corporation | Thin-film electroluminescent display power supply system for providing regulated write voltages |
JP2616153B2 (ja) * | 1990-06-20 | 1997-06-04 | 富士ゼロックス株式会社 | El発光装置 |
JPH0467689A (ja) | 1990-07-06 | 1992-03-03 | Hitachi Cable Ltd | トンネル接合発光素子 |
US5583528A (en) * | 1990-07-13 | 1996-12-10 | Citizen Watch Co., Ltd. | Electrooptical display device |
EP0466506B1 (en) * | 1990-07-13 | 1996-05-29 | Citizen Watch Co., Ltd. | Electrooptical display device |
JPH0482331A (ja) * | 1990-07-24 | 1992-03-16 | Mitsubishi Electric Corp | 携帯電話機 |
JPH0467689U (ja) * | 1990-10-23 | 1992-06-16 | ||
JPH04161984A (ja) | 1990-10-26 | 1992-06-05 | Opt Tec Corp | 多重グレイレベルを有する大型映像表示ボードシステム |
US5235253A (en) * | 1990-11-27 | 1993-08-10 | Fuji Xerox Co., Ltd. | Thin-film electroluminescent device drive circuit |
US6313815B1 (en) * | 1991-06-06 | 2001-11-06 | Canon Kabushiki Kaisha | Electron source and production thereof and image-forming apparatus and production thereof |
US5489918A (en) * | 1991-06-14 | 1996-02-06 | Rockwell International Corporation | Method and apparatus for dynamically and adjustably generating active matrix liquid crystal display gray level voltages |
JPH0519234A (ja) | 1991-07-08 | 1993-01-29 | Ricoh Co Ltd | 背面光源付き液晶表示器の輝度制御装置 |
JPH0535207A (ja) * | 1991-08-02 | 1993-02-12 | Fuji Xerox Co Ltd | El駆動装置 |
JPH0574569A (ja) | 1991-09-09 | 1993-03-26 | Fuji Xerox Co Ltd | 薄膜elの駆動装置およびその駆動方法 |
US5262698A (en) * | 1991-10-31 | 1993-11-16 | Raytheon Company | Compensation for field emission display irregularities |
JPH05158433A (ja) * | 1991-12-03 | 1993-06-25 | Rohm Co Ltd | 表示装置 |
JP3268001B2 (ja) * | 1992-03-25 | 2002-03-25 | シャープ株式会社 | Ledドットマトリックス型表示装置 |
JPH05281923A (ja) * | 1992-03-31 | 1993-10-29 | Toshiba Corp | 表示装置の輝度調整装置 |
US5581159A (en) * | 1992-04-07 | 1996-12-03 | Micron Technology, Inc. | Back-to-back diode current regulator for field emission display |
US5323408A (en) | 1992-07-21 | 1994-06-21 | Alcatel N.V. | Regulation of preconduction current of a laser diode using the third derivative of the output signal |
KR950004977B1 (ko) | 1992-10-28 | 1995-05-16 | 현대전자산업주식회사 | 반도체 소자의 감광막 미세 패턴 형성방법 |
US5361017A (en) * | 1993-02-01 | 1994-11-01 | Astronics Corporation | Instrument panel and EL lamp thereof |
JPH06236161A (ja) * | 1993-02-09 | 1994-08-23 | Sony Corp | カラー画像表示装置 |
JP2508965B2 (ja) * | 1993-05-13 | 1996-06-19 | 日本電気株式会社 | 大型カラ―動画表示装置 |
US5594463A (en) * | 1993-07-19 | 1997-01-14 | Pioneer Electronic Corporation | Driving circuit for display apparatus, and method of driving display apparatus |
JP3313830B2 (ja) * | 1993-07-19 | 2002-08-12 | パイオニア株式会社 | 表示装置の駆動回路 |
JP3390214B2 (ja) * | 1993-07-19 | 2003-03-24 | パイオニア株式会社 | 表示装置の駆動回路 |
JP3389653B2 (ja) * | 1993-10-22 | 2003-03-24 | 三菱化学株式会社 | 有機電界発光パネル |
JPH07253594A (ja) * | 1994-03-15 | 1995-10-03 | Fujitsu Ltd | 表示装置 |
JPH0844314A (ja) * | 1994-07-28 | 1996-02-16 | Toshiba Lighting & Technol Corp | 大形表示装置 |
US5463279A (en) * | 1994-08-19 | 1995-10-31 | Planar Systems, Inc. | Active matrix electroluminescent cell design |
GB2294172A (en) * | 1994-10-14 | 1996-04-17 | Ibm | Moire interference detection for raster-scanned CRT displays |
US5493183A (en) * | 1994-11-14 | 1996-02-20 | Durel Corporation | Open loop brightness control for EL lamp |
GB2295756A (en) * | 1994-12-02 | 1996-06-05 | Ibm | Cathode ray tube display apparatus |
JPH08234690A (ja) * | 1994-12-28 | 1996-09-13 | Canon Inc | 電子発生装置と画像表示装置、それらの駆動方法および駆動回路 |
JP3299096B2 (ja) * | 1995-01-13 | 2002-07-08 | キヤノン株式会社 | 電子源及び画像形成装置の製造方法、並びに電子源の活性化処理方法 |
JP3688757B2 (ja) * | 1995-06-29 | 2005-08-31 | Tdk株式会社 | 画像表示装置およびその駆動方法 |
JP3636777B2 (ja) | 1995-07-04 | 2005-04-06 | Tdk株式会社 | 画像表示装置 |
JPH09115673A (ja) * | 1995-10-13 | 1997-05-02 | Sony Corp | 発光素子又は装置、及びその駆動方法 |
JPH09148630A (ja) * | 1995-11-21 | 1997-06-06 | Rohm Co Ltd | 光量調整回路及びこれを用いた光応用装置 |
JP3517503B2 (ja) * | 1995-12-21 | 2004-04-12 | 株式会社日立製作所 | Tft液晶ディスプレイの駆動回路 |
JPH09198007A (ja) * | 1996-01-16 | 1997-07-31 | Mitsubishi Electric Corp | 表示装置、輝度調整装置、輝度調整方法、及び輝度調整システム |
JP3349031B2 (ja) * | 1996-02-23 | 2002-11-20 | ユニデン株式会社 | 電池残量表示手段および電池残量表示方法 |
JP3106953B2 (ja) * | 1996-05-16 | 2000-11-06 | 富士電機株式会社 | 表示素子駆動方法 |
US5693931A (en) * | 1996-08-20 | 1997-12-02 | Intermec Corporation | Self-calibrating label gap sensor circuit with a current regulator |
JP4059537B2 (ja) * | 1996-10-04 | 2008-03-12 | 三菱電機株式会社 | 有機薄膜el表示装置及びその駆動方法 |
JPH10145706A (ja) * | 1996-11-08 | 1998-05-29 | Seiko Epson Corp | クランプ・ガンマ補正回路並びにそれを用いた画像表示装置及び電子機器 |
US5783909A (en) * | 1997-01-10 | 1998-07-21 | Relume Corporation | Maintaining LED luminous intensity |
TW578130B (en) * | 1997-02-17 | 2004-03-01 | Seiko Epson Corp | Display unit |
JPH10254410A (ja) * | 1997-03-12 | 1998-09-25 | Pioneer Electron Corp | 有機エレクトロルミネッセンス表示装置及びその駆動方法 |
JP3988707B2 (ja) | 1997-03-12 | 2007-10-10 | セイコーエプソン株式会社 | 画素回路、表示装置及び電子機器 |
US6518962B2 (en) * | 1997-03-12 | 2003-02-11 | Seiko Epson Corporation | Pixel circuit display apparatus and electronic apparatus equipped with current driving type light-emitting device |
US5962845A (en) * | 1997-08-19 | 1999-10-05 | Clarostat Sensors And Controls, Inc. | Drive circuit for photoelectric sensor |
JP3629939B2 (ja) * | 1998-03-18 | 2005-03-16 | セイコーエプソン株式会社 | トランジスタ回路、表示パネル及び電子機器 |
US6473065B1 (en) * | 1998-11-16 | 2002-10-29 | Nongqiang Fan | Methods of improving display uniformity of organic light emitting displays by calibrating individual pixel |
US6404136B1 (en) * | 2000-07-05 | 2002-06-11 | Motorola Inc. | Method and circuit for controlling an emission current |
TW550530B (en) * | 2000-10-27 | 2003-09-01 | Semiconductor Energy Lab | Display device and method of driving the same |
JP2005501273A (ja) * | 2001-08-23 | 2005-01-13 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 有機電界発光素子における色補正のための方法および駆動手段 |
EP1430468A2 (en) * | 2001-09-18 | 2004-06-23 | Pioneer Corporation | Driving circuit for light emitting elements |
JP4467909B2 (ja) * | 2002-10-04 | 2010-05-26 | シャープ株式会社 | 表示装置 |
JP2005031629A (ja) * | 2003-06-19 | 2005-02-03 | Sharp Corp | 表示素子および表示装置 |
-
1998
- 1998-03-06 US US09/171,526 patent/US6518962B2/en not_active Expired - Lifetime
- 1998-03-06 DE DE69825402T patent/DE69825402T2/de not_active Expired - Lifetime
- 1998-03-06 EP EP98905827A patent/EP0923067B1/en not_active Expired - Lifetime
- 1998-03-06 JP JP53136198A patent/JP3887826B2/ja not_active Expired - Lifetime
- 1998-03-06 WO PCT/JP1998/000971 patent/WO1998040871A1/ja active IP Right Grant
- 1998-03-09 TW TW087103403A patent/TW397965B/zh not_active IP Right Cessation
-
2002
- 2002-12-09 US US10/314,303 patent/US7362322B2/en not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6145281A (ja) * | 1984-08-10 | 1986-03-05 | 富士通機電株式会社 | 大画面映像装置用輝度補正装置 |
JPH04269790A (ja) * | 1991-02-26 | 1992-09-25 | Matsushita Electric Ind Co Ltd | 情報表示装置 |
JPH0854835A (ja) * | 1994-08-09 | 1996-02-27 | Nec Corp | アクティブマトリクス型電流制御型発光素子の駆動回路 |
JPH08227276A (ja) * | 1995-02-21 | 1996-09-03 | Pioneer Electron Corp | 有機エレクトロルミネッセンスディスプレイパネルとその製造方法 |
JPH0964365A (ja) * | 1995-08-21 | 1997-03-07 | Matsushita Electric Ind Co Ltd | 薄膜トランジスタの製造方法 |
Non-Patent Citations (1)
Title |
---|
See also references of EP0923067A4 * |
Cited By (225)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004038210A (ja) * | 1997-03-12 | 2004-02-05 | Seiko Epson Corp | 表示装置及び電子機器 |
JPH10319908A (ja) * | 1997-04-14 | 1998-12-04 | Sarnoff Corp | アクティブマトリックス有機発光ダイオード(amoled)の表示ピクセル構造とそのためのデータロード/発光回路 |
JP2010092067A (ja) * | 1997-04-14 | 2010-04-22 | Transpacific Infinity Llc | アクティブマトリックス有機発光ダイオード(amoled)の表示ピクセル構造とそのためのデータロード/発光回路 |
US9910334B2 (en) | 1999-02-23 | 2018-03-06 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and fabrication method thereof |
EP2284605A3 (en) * | 1999-02-23 | 2017-10-18 | Semiconductor Energy Laboratory Co, Ltd. | Semiconductor device and fabrication method thereof |
JP2015038612A (ja) * | 1999-02-23 | 2015-02-26 | 株式会社半導体エネルギー研究所 | 液晶表示装置 |
JP2018200467A (ja) * | 1999-02-23 | 2018-12-20 | 株式会社半導体エネルギー研究所 | 液晶表示装置 |
JP2012191216A (ja) * | 1999-02-23 | 2012-10-04 | Semiconductor Energy Lab Co Ltd | El表示装置 |
US9837451B2 (en) | 1999-04-27 | 2017-12-05 | Semiconductor Energy Laboratory Co., Ltd. | Electronic device and electronic apparatus |
JP4627822B2 (ja) * | 1999-06-23 | 2011-02-09 | 株式会社半導体エネルギー研究所 | 表示装置 |
JP2001005426A (ja) * | 1999-06-23 | 2001-01-12 | Semiconductor Energy Lab Co Ltd | El表示装置及び電子装置 |
JP2003503747A (ja) * | 1999-06-25 | 2003-01-28 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 能動マトリクス・エレクトロルミネセンス表示デバイス |
JP2003503748A (ja) * | 1999-06-25 | 2003-01-28 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 能動マトリクス・エレクトロルミネセンス表示デバイス |
JP2001092413A (ja) * | 1999-09-24 | 2001-04-06 | Semiconductor Energy Lab Co Ltd | El表示装置および電子装置 |
US8436790B2 (en) | 1999-09-24 | 2013-05-07 | Semiconductor Energy Laboratory Co., Ltd. | EL display device and electronic device |
US7786958B1 (en) | 1999-09-24 | 2010-08-31 | Semiconductor Energy Laboratory Co., Ltd. | EL display device and electronic device |
JP4681785B2 (ja) * | 1999-10-02 | 2011-05-11 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | アクティブマトリクスエレクトロルミネッセンス表示装置 |
JP2003511724A (ja) * | 1999-10-02 | 2003-03-25 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | アクティブマトリクスエレクトロルミネッセンス表示装置 |
JP2001109432A (ja) * | 1999-10-06 | 2001-04-20 | Pioneer Electronic Corp | アクティブマトリックス型発光パネルの駆動装置 |
JP2003518772A (ja) * | 1999-12-28 | 2003-06-10 | サーノフ コーポレイション | トランジスタ閾値電圧の変化への敏感度を低減した薄膜トランジスタ回路 |
US7397064B2 (en) | 2000-01-11 | 2008-07-08 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor display device |
US7629610B2 (en) | 2000-01-11 | 2009-12-08 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor display device |
JP2001195026A (ja) * | 2000-01-14 | 2001-07-19 | Victor Co Of Japan Ltd | マトリクス型表示装置 |
US10467961B2 (en) | 2000-01-17 | 2019-11-05 | Semiconductor Energy Laboratory Co., Ltd. | Display system and electrical appliance |
US8743028B2 (en) | 2000-01-17 | 2014-06-03 | Semiconductor Energy Laboratory Co., Ltd. | Display system and electrical appliance |
US9087476B2 (en) | 2000-01-17 | 2015-07-21 | Semiconductor Energy Laboratory Co., Ltd. | Display system and electrical appliance |
US10522076B2 (en) | 2000-01-17 | 2019-12-31 | Semiconductor Energy Laboratory Co., Ltd. | Display system and electrical appliance |
JP2001272968A (ja) * | 2000-01-17 | 2001-10-05 | Semiconductor Energy Lab Co Ltd | 表示システム及び電気器具 |
US6704008B2 (en) | 2000-01-26 | 2004-03-09 | Seiko Epson Corporation | Non-uniformity correction for displayed images |
JP2005101621A (ja) * | 2000-01-31 | 2005-04-14 | Semiconductor Energy Lab Co Ltd | 表示装置の作製方法 |
US8456459B2 (en) | 2000-01-31 | 2013-06-04 | Semiconductor Energy Laboratory Co., Ltd. | Adhesion type area sensor and display device having adhesion type area sensor |
US8830217B2 (en) | 2000-01-31 | 2014-09-09 | Semiconductor Energy Laboratory Co., Ltd. | Adhesion type area sensor and display device having adhesion type area sensor |
JP2003524804A (ja) * | 2000-02-22 | 2003-08-19 | サーノフ コーポレイション | ディスプレィ装置を校正して及び時間にわたってそれらの効率で自動的に減失を補償するための方法及び器具 |
JP2003527630A (ja) * | 2000-03-14 | 2003-09-16 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 経時及び周囲光に依存して輝度補正するエレクトロルミネッセント表示装置 |
US8194008B2 (en) | 2000-04-18 | 2012-06-05 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
US7221338B2 (en) | 2000-04-18 | 2007-05-22 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
US9196663B2 (en) | 2000-04-18 | 2015-11-24 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
US7990348B2 (en) | 2000-04-18 | 2011-08-02 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
US7623100B2 (en) | 2000-04-18 | 2009-11-24 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
US8400379B2 (en) | 2000-04-18 | 2013-03-19 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
US7623099B2 (en) | 2000-04-18 | 2009-11-24 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
CN100416643C (zh) * | 2000-04-18 | 2008-09-03 | 株式会社半导体能源研究所 | 显示器件 |
US7623098B2 (en) | 2000-04-18 | 2009-11-24 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
US6642950B2 (en) | 2000-04-19 | 2003-11-04 | Nec Corporation | Optical printer head and driving method thereof |
JP2013122619A (ja) * | 2000-04-26 | 2013-06-20 | Semiconductor Energy Lab Co Ltd | 表示装置 |
US7298347B2 (en) | 2000-06-13 | 2007-11-20 | Semiconductor Energy Laboratory Co., Ltd. | Display device |
US20080170007A1 (en) * | 2000-09-19 | 2008-07-17 | Semiconductor Energy Laboratory Co., Ltd. | Self Light Emitting Device and Method of Driving Thereof |
JP2005099828A (ja) * | 2000-09-19 | 2005-04-14 | Semiconductor Energy Lab Co Ltd | 自発光装置、電子機器 |
US8686928B2 (en) * | 2000-09-19 | 2014-04-01 | Semiconductor Energy Laboratory Co., Ltd. | Self light emitting device and method of driving thereof |
US7268499B2 (en) | 2000-09-19 | 2007-09-11 | Semiconductor Energy Laboratory Co., Ltd. | Self light emitting device and method of driving thereof |
JP2002169511A (ja) * | 2000-09-19 | 2002-06-14 | Semiconductor Energy Lab Co Ltd | 自発光装置およびその駆動方法 |
JP2012198575A (ja) * | 2000-09-29 | 2012-10-18 | Global Oled Technology Llc | 発光フィードバックのフラットパネルディスプレイ |
JP2012235138A (ja) * | 2000-09-29 | 2012-11-29 | Global Oled Technology Llc | 発光フィードバックのフラットパネルディスプレイ |
JP2002162934A (ja) * | 2000-09-29 | 2002-06-07 | Eastman Kodak Co | 発光フィードバックのフラットパネルディスプレイ |
JP2002132218A (ja) * | 2000-10-26 | 2002-05-09 | Sony Corp | 表示装置、輝度制限回路及び表示装置の駆動方法 |
JP2002169509A (ja) * | 2000-11-30 | 2002-06-14 | Sanyo Electric Co Ltd | 平面表示パネルの駆動方法及び有機エレクトロルミネッセンス表示パネルの駆動方法 |
JP2002304155A (ja) * | 2001-01-29 | 2002-10-18 | Semiconductor Energy Lab Co Ltd | 発光装置 |
JP2002304156A (ja) * | 2001-01-29 | 2002-10-18 | Semiconductor Energy Lab Co Ltd | 発光装置 |
JP2002229513A (ja) * | 2001-02-06 | 2002-08-16 | Tohoku Pioneer Corp | 有機el表示パネルの駆動装置 |
JP2008176341A (ja) * | 2001-02-08 | 2008-07-31 | Semiconductor Energy Lab Co Ltd | 発光装置及び電子機器 |
JP2011180601A (ja) * | 2001-02-08 | 2011-09-15 | Semiconductor Energy Lab Co Ltd | 発光装置及び電子機器 |
JP2014160266A (ja) * | 2001-02-08 | 2014-09-04 | Semiconductor Energy Lab Co Ltd | 発光装置 |
US7960917B2 (en) | 2001-02-08 | 2011-06-14 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and electronic equipment using the same |
JP2002311898A (ja) * | 2001-02-08 | 2002-10-25 | Semiconductor Energy Lab Co Ltd | 発光装置及びそれを用いた電子機器 |
US8680772B2 (en) | 2001-02-08 | 2014-03-25 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and electronic equipment using the same |
US9041299B2 (en) | 2001-02-08 | 2015-05-26 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and electronic equipment using the same |
JPWO2002075711A1 (ja) * | 2001-03-19 | 2004-07-08 | 三菱電機株式会社 | 自発光型表示装置 |
WO2002075711A1 (fr) * | 2001-03-19 | 2002-09-26 | Mitsubishi Denki Kabushiki Kaisha | Ecran auto-lumineux |
JP2008181158A (ja) * | 2001-03-19 | 2008-08-07 | Mitsubishi Electric Corp | 自発光型表示装置 |
WO2002075712A1 (fr) * | 2001-03-21 | 2002-09-26 | Mitsubishi Denki Kabushiki Kaisha | Ecran auto-lumineux |
JPWO2002077957A1 (ja) * | 2001-03-22 | 2004-07-15 | 三菱電機株式会社 | 自発光型表示装置 |
US7009590B2 (en) | 2001-05-15 | 2006-03-07 | Sharp Kabushiki Kaisha | Display apparatus and display method |
JP2002351399A (ja) * | 2001-05-28 | 2002-12-06 | Pioneer Electronic Corp | 発光パネルの駆動装置及び発光パネルを備えた携帯端末装置 |
JP2003043998A (ja) * | 2001-07-30 | 2003-02-14 | Pioneer Electronic Corp | ディスプレイ装置 |
JP2012234186A (ja) * | 2001-09-07 | 2012-11-29 | Semiconductor Energy Lab Co Ltd | 発光装置及び電子機器 |
JP2017201419A (ja) * | 2001-09-07 | 2017-11-09 | 株式会社半導体エネルギー研究所 | 発光装置 |
US7528812B2 (en) | 2001-09-07 | 2009-05-05 | Panasonic Corporation | EL display apparatus, driving circuit of EL display apparatus, and image display apparatus |
US8947328B2 (en) | 2001-09-07 | 2015-02-03 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device and method of driving the same |
JP2009086673A (ja) * | 2001-09-07 | 2009-04-23 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
JP2010061147A (ja) * | 2001-09-07 | 2010-03-18 | Semiconductor Energy Lab Co Ltd | 発光装置 |
JP2010160497A (ja) * | 2001-09-07 | 2010-07-22 | Semiconductor Energy Lab Co Ltd | 発光装置及び電子機器 |
JP2008052289A (ja) * | 2001-09-07 | 2008-03-06 | Semiconductor Energy Lab Co Ltd | 発光装置及び電子機器 |
JPWO2003023752A1 (ja) * | 2001-09-07 | 2004-12-24 | 松下電器産業株式会社 | El表示装置とel表示装置の駆動回路および画像表示装置 |
JP2013242582A (ja) * | 2001-09-07 | 2013-12-05 | Semiconductor Energy Lab Co Ltd | 発光装置、電子機器 |
JP2015099372A (ja) * | 2001-09-07 | 2015-05-28 | 株式会社半導体エネルギー研究所 | 発光装置、表示モジュール、電子機器 |
JP2003122305A (ja) * | 2001-10-10 | 2003-04-25 | Sony Corp | 有機el表示装置およびその制御方法 |
JP2005506563A (ja) * | 2001-10-11 | 2005-03-03 | インテル コーポレイション | 放射型ディスプレイの輝度補正 |
JP2005507511A (ja) * | 2001-10-31 | 2005-03-17 | ケンブリッジ ディスプレイ テクノロジー リミテッド | 光集積回路内に提供される光増幅機構およびその機構を集積した増幅装置 |
US7737924B2 (en) | 2001-12-07 | 2010-06-15 | Semiconductor Energy Laboratory Co., Ltd. | Display device and electric equipment using the same |
JP2003202837A (ja) * | 2001-12-28 | 2003-07-18 | Pioneer Electronic Corp | 表示パネルの駆動装置及び駆動方法 |
JP2003202836A (ja) * | 2001-12-28 | 2003-07-18 | Pioneer Electronic Corp | 表示パネルの駆動装置及び駆動方法 |
US8026879B2 (en) | 2001-12-31 | 2011-09-27 | Intel Corporation | Energy sensing light emitting diode display |
US8963817B2 (en) | 2001-12-31 | 2015-02-24 | Intel Corporation | Energy sensing light emitting diode display |
US9665211B2 (en) | 2001-12-31 | 2017-05-30 | Intel Corporation | Energy sensing light emitting diode display |
JP2005539247A (ja) * | 2001-12-31 | 2005-12-22 | インテル コーポレイション | エネルギをセンスする発光ダイオード・ディスプレイ |
US7253813B2 (en) | 2002-02-01 | 2007-08-07 | Seiko Epson Corporation | Electro-optical device, driving method thereof, and electronic apparatus |
US7123221B2 (en) | 2002-02-01 | 2006-10-17 | Seiko Epson Corporation | Electro-optical apparatus, driving method thereof, and electronic device |
US7593008B2 (en) | 2002-02-01 | 2009-09-22 | Seiko Epson Corporation | Electro-optical apparatus, driving method thereof, and electronic device |
JP2003282273A (ja) * | 2002-03-20 | 2003-10-03 | Seiko Epson Corp | 表示装置とその製造方法及び電子機器 |
US6806497B2 (en) | 2002-03-29 | 2004-10-19 | Seiko Epson Corporation | Electronic device, method for driving the electronic device, electro-optical device, and electronic equipment |
US7616423B2 (en) | 2002-04-23 | 2009-11-10 | Seiko Epson Corporation | Electronic equipment, driving method thereof and method of driving electronic circuit |
JP2007256958A (ja) * | 2002-04-26 | 2007-10-04 | Toshiba Matsushita Display Technology Co Ltd | El表示パネルの駆動方法 |
JP2003330418A (ja) * | 2002-05-14 | 2003-11-19 | Sony Corp | 表示装置およびその駆動方法 |
JP2005530200A (ja) * | 2002-06-18 | 2005-10-06 | ケンブリッジ ディスプレイ テクノロジー リミテッド | ディスプレイドライバ回路 |
JP4942930B2 (ja) * | 2002-06-18 | 2012-05-30 | ケンブリッジ ディスプレイ テクノロジー リミテッド | ディスプレイドライバ回路 |
JP2004045648A (ja) * | 2002-07-10 | 2004-02-12 | Pioneer Electronic Corp | 表示パネルの駆動装置及び駆動方法 |
JP2004094236A (ja) * | 2002-08-09 | 2004-03-25 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
JP4651922B2 (ja) * | 2002-08-09 | 2011-03-16 | 株式会社半導体エネルギー研究所 | El表示装置 |
US7924275B2 (en) | 2002-08-30 | 2011-04-12 | Seiko Epson Corporation | Electronic module, methods of manufacturing and driving the same, and electronic instrument |
US7880690B2 (en) | 2002-08-30 | 2011-02-01 | Seiko Epson Corporation | Electronic circuit, method of driving electronic circuit, electro-optical device, method of driving electro-optical device, and electronic apparatus |
US6946802B2 (en) | 2002-08-30 | 2005-09-20 | Seiko Epson Corporation | Electronic module, methods of manufacturing and driving the same, and electronic instrument |
US7327090B2 (en) | 2002-08-30 | 2008-02-05 | Seiko Epson Corporation | Electronic module, methods of manufacturing and driving the same, and electronic instrument |
US8432382B2 (en) | 2002-08-30 | 2013-04-30 | Seiko Epson Corporation | Electronic module, methods of manufacturing and driving the same, and electronic instrument |
JP2006507524A (ja) * | 2002-11-21 | 2006-03-02 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 表示装置の出力の均一性を改善する方法 |
JP2012027481A (ja) * | 2003-01-31 | 2012-02-09 | Global Oled Technology Llc | 有機発光ダイオード(oled)表示装置 |
JP2004271755A (ja) * | 2003-03-06 | 2004-09-30 | Kodak Kk | 有機el表示装置 |
JP4534031B2 (ja) * | 2003-03-06 | 2010-09-01 | グローバル・オーエルイーディー・テクノロジー・リミテッド・ライアビリティ・カンパニー | 有機el表示装置 |
JP2004287345A (ja) * | 2003-03-25 | 2004-10-14 | Casio Comput Co Ltd | 表示駆動装置及び表示装置並びにその駆動制御方法 |
JP2004294752A (ja) * | 2003-03-27 | 2004-10-21 | Toshiba Matsushita Display Technology Co Ltd | El表示装置 |
US7319444B2 (en) | 2003-03-31 | 2008-01-15 | Seiko Epson Corporation | Pixel circuit, electro-optical device, and electronic apparatus |
JP2004348044A (ja) * | 2003-05-26 | 2004-12-09 | Seiko Epson Corp | 表示装置、表示方法及び表示装置の製造方法 |
JP2006528788A (ja) * | 2003-07-24 | 2006-12-21 | ペリコン リミテッド | エレクトロルミネセントディスプレイの制御 |
JP2005070761A (ja) * | 2003-08-07 | 2005-03-17 | Canon Inc | 画像表示装置とその製造方法 |
US7812349B2 (en) | 2003-08-07 | 2010-10-12 | Canon Kabushiki Kaisha | Display apparatus |
JP2005084260A (ja) * | 2003-09-05 | 2005-03-31 | Agilent Technol Inc | 表示パネルの変換データ決定方法および測定装置 |
JP2005140827A (ja) * | 2003-11-04 | 2005-06-02 | Tohoku Pioneer Corp | 発光表示パネルの駆動装置 |
JP2007514966A (ja) * | 2003-11-25 | 2007-06-07 | イーストマン コダック カンパニー | 経年劣化補償を備えたoledディスプレイ |
JP2007517245A (ja) * | 2003-12-10 | 2007-06-28 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | ビデオデータ信号補正 |
JP2005189497A (ja) * | 2003-12-25 | 2005-07-14 | Toshiba Matsushita Display Technology Co Ltd | 電流出力型半導体回路の駆動方法 |
JP4533423B2 (ja) * | 2004-02-12 | 2010-09-01 | キヤノン株式会社 | 駆動回路及びそれを用いた画像形成装置 |
JP2008077110A (ja) * | 2004-02-12 | 2008-04-03 | Canon Inc | 駆動回路及びそれを用いた画像形成装置 |
US7502000B2 (en) | 2004-02-12 | 2009-03-10 | Canon Kabushiki Kaisha | Drive circuit and image forming apparatus using the same |
JP2005258427A (ja) * | 2004-02-12 | 2005-09-22 | Canon Inc | 駆動回路及びそれを用いた画像形成装置 |
US7442956B2 (en) | 2004-04-26 | 2008-10-28 | Seiko Epson Corporation | Organic EL device and electronic apparatus |
JP2005321786A (ja) * | 2004-05-04 | 2005-11-17 | Au Optronics Corp | 有機発光ディスプレイ及びその色ずれ補償方法 |
JP2005321780A (ja) * | 2004-05-06 | 2005-11-17 | Au Optronics Corp | 発光装置の駆動装置、駆動方法及び駆動システム |
JP4570150B2 (ja) * | 2004-05-06 | 2010-10-27 | 友達光電股▲ふん▼有限公司 | 発光装置の駆動装置 |
JP2004246385A (ja) * | 2004-05-14 | 2004-09-02 | Pioneer Electronic Corp | アクティブマトリクス型表示装置 |
JP2006047984A (ja) * | 2004-05-21 | 2006-02-16 | Semiconductor Energy Lab Co Ltd | 表示装置及びそれを用いた電子機器 |
JP4539963B2 (ja) * | 2004-06-10 | 2010-09-08 | 東北パイオニア株式会社 | アクティブ駆動型発光表示装置および同表示装置を搭載した電子機器 |
JP2005352148A (ja) * | 2004-06-10 | 2005-12-22 | Tohoku Pioneer Corp | アクティブ駆動型発光表示装置および同表示装置を搭載した電子機器 |
US8274456B2 (en) | 2004-06-29 | 2012-09-25 | Semiconductor Energy Laboratory Co., Ltd. | Display device and driving method of the same, and electronic apparatus |
US8013809B2 (en) | 2004-06-29 | 2011-09-06 | Semiconductor Energy Laboratory Co., Ltd. | Display device and driving method of the same, and electronic apparatus |
US8791888B2 (en) | 2004-07-05 | 2014-07-29 | Sony Corporation | Pixel circuit, display device, driving method of pixel circuit, and driving method of display device |
US7893895B2 (en) | 2004-07-05 | 2011-02-22 | Sony Corporation | Pixel circuit, display device, driving method of pixel circuit, and driving method of display device |
JP2006018167A (ja) * | 2004-07-05 | 2006-01-19 | Sony Corp | 画素回路及び表示装置とこれらの駆動方法 |
US9208726B2 (en) | 2004-07-05 | 2015-12-08 | Sony Corporation | Pixel circuit, display device, driving method of pixel circuit, and driving method of display device |
KR101141772B1 (ko) * | 2004-07-05 | 2012-05-03 | 소니 주식회사 | 화소회로 및 표시장치와 이러한 구동방법 |
US8564508B2 (en) | 2004-07-05 | 2013-10-22 | Sony Corporation | Pixel circuit, display device, driving method of pixel circuit, and driving method of display device |
US9530351B2 (en) | 2004-07-05 | 2016-12-27 | Sony Corporation | Pixel circuit, display device, driving method of pixel circuit, and driving method of display device |
US8552939B2 (en) | 2004-07-05 | 2013-10-08 | Sony Corporation | Pixel circuit, display device, driving method of pixel circuit, and driving method of display device |
JP2006091850A (ja) * | 2004-07-22 | 2006-04-06 | Toshiba Matsushita Display Technology Co Ltd | El表示装置およびel表示パネルの検査装置 |
JP2006038965A (ja) * | 2004-07-23 | 2006-02-09 | Sony Corp | 画素回路及び表示装置とこれらの駆動方法 |
JP2006038964A (ja) * | 2004-07-23 | 2006-02-09 | Sony Corp | 画素回路及び表示装置とこれらの駆動方法 |
JP2006038963A (ja) * | 2004-07-23 | 2006-02-09 | Sony Corp | 画素回路及び表示装置とこれらの駆動方法 |
JP2006047578A (ja) * | 2004-08-03 | 2006-02-16 | Tohoku Pioneer Corp | 発光表示パネルの駆動装置 |
JP4539967B2 (ja) * | 2004-08-03 | 2010-09-08 | 東北パイオニア株式会社 | 発光パネルの駆動装置 |
US8194006B2 (en) | 2004-08-23 | 2012-06-05 | Semiconductor Energy Laboratory Co., Ltd. | Display device, driving method of the same, and electronic device comprising monitoring elements |
US8576147B2 (en) | 2004-08-23 | 2013-11-05 | Semiconductor Energy Laboratory Co., Ltd. | Display device and electronic device |
JP2006071686A (ja) * | 2004-08-31 | 2006-03-16 | Tohoku Pioneer Corp | 発光表示パネルの駆動装置 |
JP2006201751A (ja) * | 2004-12-21 | 2006-08-03 | Seiko Epson Corp | 発光装置、画像形成装置、表示装置、及び発光素子の駆動方法 |
JP2006184847A (ja) * | 2004-12-24 | 2006-07-13 | Samsung Sdi Co Ltd | データ集積回路およびこれを用いる発光表示装置とその駆動方法 |
JP2006184848A (ja) * | 2004-12-24 | 2006-07-13 | Samsung Sdi Co Ltd | データ集積回路およびこれを用いる発光表示装置とその駆動方法 |
JP2006184906A (ja) * | 2004-12-24 | 2006-07-13 | Samsung Sdi Co Ltd | データ集積回路,発光表示装置および発光表示装置の駆動方法 |
JP4535442B2 (ja) * | 2004-12-24 | 2010-09-01 | 三星モバイルディスプレイ株式會社 | データ集積回路およびこれを用いる発光表示装置とその駆動方法 |
JP4535441B2 (ja) * | 2004-12-24 | 2010-09-01 | 三星モバイルディスプレイ株式會社 | データ集積回路およびこれを用いる発光表示装置とその駆動方法 |
JP2006276713A (ja) * | 2005-03-30 | 2006-10-12 | Toshiba Matsushita Display Technology Co Ltd | El表示装置の電源回路 |
WO2006121137A1 (ja) * | 2005-05-10 | 2006-11-16 | Pioneer Corporation | 表示装置及び表示パネルの駆動方法 |
JP2006337456A (ja) * | 2005-05-31 | 2006-12-14 | Tohoku Pioneer Corp | 発光装置およびその検査方法 |
US9812065B2 (en) | 2005-08-10 | 2017-11-07 | Samsung Display Co., Ltd. | Data driver, organic light emitting display device using the same, and method of driving the organic light emitting display device |
JP2007047721A (ja) * | 2005-08-10 | 2007-02-22 | Samsung Sdi Co Ltd | データ駆動回路とこれを利用した発光表示装置及びその駆動方法 |
US10192491B2 (en) | 2005-08-10 | 2019-01-29 | Samsung Display Co., Ltd. | Data driver, organic light emitting display device using the same, and method of driving the organic light emitting display device |
JP2007140325A (ja) * | 2005-11-22 | 2007-06-07 | Seiko Epson Corp | 発光制御装置、表示装置、電子機器、および発光装置の制御方法 |
JP2007240803A (ja) * | 2006-03-08 | 2007-09-20 | Sony Corp | 自発光表示装置、黒レベル補正装置及びプログラム |
JP2007240802A (ja) * | 2006-03-08 | 2007-09-20 | Sony Corp | 自発光表示装置、ホワイトバランス調整装置及びプログラム |
JP2007240799A (ja) * | 2006-03-08 | 2007-09-20 | Sony Corp | 自発光表示装置、ホワイトバランス調整装置及びプログラム |
JP2007264631A (ja) * | 2006-03-28 | 2007-10-11 | Toppoly Optoelectronics Corp | 有機エレクトロルミネセンス素子およびその製造方法 |
US8447232B2 (en) | 2006-04-07 | 2013-05-21 | Belair Networks Inc. | System and method for frequency offsetting of information communicated in MIMO-based wireless networks |
US8280337B2 (en) | 2006-04-07 | 2012-10-02 | Belair Networks Inc. | System and method for zero intermediate frequency filtering of information communicated in wireless networks |
US8583066B2 (en) | 2006-04-07 | 2013-11-12 | Belair Networks Inc. | System and method for frequency offsetting of information communicated in MIMO-based wireless networks |
US8433254B2 (en) | 2006-04-07 | 2013-04-30 | Belair Networks Inc. | System and method for frequency offsetting of information communicated in MIMO-based wireless networks |
US8254865B2 (en) | 2006-04-07 | 2012-08-28 | Belair Networks | System and method for frequency offsetting of information communicated in MIMO-based wireless networks |
JP2007286341A (ja) * | 2006-04-17 | 2007-11-01 | Eastman Kodak Co | 表示装置 |
JP2007310033A (ja) * | 2006-05-16 | 2007-11-29 | Eastman Kodak Co | 有機el表示装置およびその製造方法 |
JP2008076757A (ja) * | 2006-09-21 | 2008-04-03 | Sanyo Electric Co Ltd | エレクトロルミネッセンス表示装置及びエレクトロルミネッセンス表示装置の表示ばらつき補正方法 |
US8339335B2 (en) | 2006-09-21 | 2012-12-25 | Semiconductor Components Industries, Llc | Electroluminescence display apparatus and method of correcting display variation for electroluminescence display apparatus |
US8542166B2 (en) | 2006-12-22 | 2013-09-24 | Sanyo Semiconductor Co., Ltd. | Electroluminescence display apparatus with video signal rewriting |
US8605069B2 (en) | 2007-03-16 | 2013-12-10 | Hitachi Displays, Ltd. | Image display device |
JP2008225415A (ja) * | 2007-03-16 | 2008-09-25 | Hitachi Displays Ltd | 画像表示装置 |
US8558767B2 (en) | 2007-08-23 | 2013-10-15 | Samsung Display Co., Ltd. | Organic light emitting display and driving method thereof |
JP2011508260A (ja) * | 2007-12-21 | 2011-03-10 | グローバル オーエルイーディー テクノロジー リミティド ライアビリティ カンパニー | アナログトランジスタ駆動信号により補償されるエレクトロルミネセント・ディスプレイ |
JP2009151218A (ja) * | 2007-12-21 | 2009-07-09 | Eastman Kodak Co | 表示装置および画素電流測定方法 |
US8242989B2 (en) | 2008-01-18 | 2012-08-14 | Samsung Mobile Display Co., Ltd. | Organic light emitting display and driving method thereof |
JP2009169372A (ja) * | 2008-01-18 | 2009-07-30 | Samsung Mobile Display Co Ltd | 有機電界発光表示装置及びその駆動方法 |
JP2008262191A (ja) * | 2008-03-31 | 2008-10-30 | Semiconductor Energy Lab Co Ltd | 表示装置 |
JP2009110007A (ja) * | 2008-11-14 | 2009-05-21 | Hitachi Displays Ltd | 表示装置の駆動方法 |
JP2011048037A (ja) * | 2009-08-26 | 2011-03-10 | Hitachi Displays Ltd | 表示装置 |
WO2011086597A1 (ja) * | 2010-01-13 | 2011-07-21 | パナソニック株式会社 | 表示装置及びその駆動方法 |
US9058772B2 (en) | 2010-01-13 | 2015-06-16 | Joled Inc. | Display device and driving method thereof |
CN102203845A (zh) * | 2010-01-13 | 2011-09-28 | 松下电器产业株式会社 | 显示装置以及其驱动方法 |
JP2011008272A (ja) * | 2010-07-14 | 2011-01-13 | Semiconductor Energy Lab Co Ltd | El表示装置 |
US8952952B2 (en) | 2011-06-16 | 2015-02-10 | Panasonic Corporation | Display device |
US9185751B2 (en) | 2011-06-16 | 2015-11-10 | Joled Inc. | Display device |
US9275572B2 (en) | 2011-06-23 | 2016-03-01 | Joled Inc. | Display device and display device driving method for causing reduction in power consumption |
WO2013008271A1 (ja) * | 2011-07-12 | 2013-01-17 | パナソニック株式会社 | 表示装置 |
US8803869B2 (en) | 2011-07-12 | 2014-08-12 | Panasonic Corporation | Display device and method of driving display device |
CN103038809B (zh) * | 2011-07-12 | 2016-01-06 | 株式会社日本有机雷特显示器 | 显示装置 |
JPWO2013008272A1 (ja) * | 2011-07-12 | 2015-02-23 | パナソニック株式会社 | 表示装置および表示装置の駆動方法 |
JPWO2013008271A1 (ja) * | 2011-07-12 | 2015-02-23 | パナソニック株式会社 | 表示装置 |
US9105231B2 (en) | 2011-07-12 | 2015-08-11 | Joled Inc. | Display device |
CN103038809A (zh) * | 2011-07-12 | 2013-04-10 | 松下电器产业株式会社 | 显示装置 |
WO2013008272A1 (ja) * | 2011-07-12 | 2013-01-17 | パナソニック株式会社 | 表示装置および表示装置の駆動方法 |
JP2013101364A (ja) * | 2012-12-19 | 2013-05-23 | Semiconductor Energy Lab Co Ltd | 表示装置及び電子機器 |
WO2014188813A1 (ja) * | 2013-05-23 | 2014-11-27 | ソニー株式会社 | 映像信号処理回路、映像信号処理方法、及び、表示装置 |
JPWO2014188813A1 (ja) * | 2013-05-23 | 2017-02-23 | 株式会社Joled | 映像信号処理回路、映像信号処理方法、及び、表示装置 |
US10354586B2 (en) | 2013-05-23 | 2019-07-16 | Joled Inc. | Image signal processing circuit, image signal processing method, and display unit with pixel degradation correction |
JP2014056245A (ja) * | 2013-10-04 | 2014-03-27 | Semiconductor Energy Lab Co Ltd | El表示装置 |
JP2014238589A (ja) * | 2014-07-09 | 2014-12-18 | 株式会社半導体エネルギー研究所 | 表示装置及び電子機器 |
JP2015129945A (ja) * | 2015-01-20 | 2015-07-16 | 株式会社半導体エネルギー研究所 | El表示装置 |
JP2017013315A (ja) * | 2015-06-30 | 2017-01-19 | 京セラディスプレイ株式会社 | 発光装置 |
JP2016021067A (ja) * | 2015-07-24 | 2016-02-04 | 株式会社半導体エネルギー研究所 | 表示装置及び電子機器 |
JP2017083813A (ja) * | 2015-10-28 | 2017-05-18 | 三星ディスプレイ株式會社Samsung Display Co.,Ltd. | 表示装置 |
JP2016075940A (ja) * | 2015-12-11 | 2016-05-12 | 株式会社半導体エネルギー研究所 | El表示装置 |
JP2016186633A (ja) * | 2016-04-25 | 2016-10-27 | 株式会社半導体エネルギー研究所 | 半導体装置及び電子機器 |
CN109767725A (zh) * | 2019-03-19 | 2019-05-17 | 京东方科技集团股份有限公司 | 一种像素驱动电路及其驱动方法、显示装置 |
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EP0923067B1 (en) | 2004-08-04 |
EP0923067A4 (en) | 2000-02-23 |
DE69825402D1 (de) | 2004-09-09 |
DE69825402T2 (de) | 2005-08-04 |
EP0923067A1 (en) | 1999-06-16 |
JP3887826B2 (ja) | 2007-02-28 |
TW397965B (en) | 2000-07-11 |
US20030063081A1 (en) | 2003-04-03 |
US7362322B2 (en) | 2008-04-22 |
US20020180721A1 (en) | 2002-12-05 |
US6518962B2 (en) | 2003-02-11 |
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