TW275706B - - Google Patents
Info
- Publication number
- TW275706B TW275706B TW084104698A TW84104698A TW275706B TW 275706 B TW275706 B TW 275706B TW 084104698 A TW084104698 A TW 084104698A TW 84104698 A TW84104698 A TW 84104698A TW 275706 B TW275706 B TW 275706B
- Authority
- TW
- Taiwan
Links
Classifications
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/02—Arrangements of circuit components or wiring on supporting structure
- H05K7/10—Plug-in assemblages of components, e.g. IC sockets
- H05K7/1053—Plug-in assemblages of components, e.g. IC sockets having interior leads
- H05K7/1061—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting
- H05K7/1069—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting with spring contact pieces
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K1/00—Soldering, e.g. brazing, or unsoldering
- B23K1/0008—Soldering, e.g. brazing, or unsoldering specially adapted for particular articles or work
- B23K1/0016—Soldering of electronic components
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/1601—Process or apparatus
- C23C18/1603—Process or apparatus coating on selected surface areas
- C23C18/1607—Process or apparatus coating on selected surface areas by direct patterning
- C23C18/161—Process or apparatus coating on selected surface areas by direct patterning from plating step, e.g. inkjet
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
- C25D7/12—Semiconductors
- C25D7/123—Semiconductors first coated with a seed layer or a conductive layer
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistors
- H05K3/306—Assembling printed circuits with electric components, e.g. with resistors with lead-in-hole components
- H05K3/308—Adaptations of leads
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistors
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits
- H05K3/325—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits by abutting or pinching; Mechanical auxiliary parts therefor
- H05K3/326—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits by abutting or pinching; Mechanical auxiliary parts therefor the printed circuit having integral resilient or deformable parts, e.g. tabs or parts of flexible circuits
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistors
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits by soldering
- H05K3/341—Surface mounted components
- H05K3/3421—Leaded components
- H05K3/3426—Leaded components characterised by the leads
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/4007—Surface contacts, e.g. bumps
- H05K3/4015—Surface contacts, e.g. bumps using auxiliary conductive elements, e.g. pieces of metal foil, metallic spheres
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0448—Apparatus for applying a liquid, a resin, an ink or the like
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
- H10P74/23—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by multiple measurements, corrections, marking or sorting processes
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/01—Manufacture or treatment
- H10W70/05—Manufacture or treatment of insulating or insulated package substrates, or of interposers, or of redistribution layers
- H10W70/093—Connecting or disconnecting other interconnections thereto or therefrom, e.g. connecting bond wires or bumps
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/30—Die-attach connectors
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/01—Manufacture or treatment
- H10W74/012—Manufacture or treatment of encapsulations on active surfaces of flip-chip devices, e.g. forming underfills
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/15—Encapsulations, e.g. protective coatings characterised by their shape or disposition on active surfaces of flip-chip devices, e.g. underfills
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
- B23K2101/40—Semiconductor devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06755—Material aspects
- G01R1/06761—Material aspects related to layers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/50—Fixed connections
- H01R12/51—Fixed connections for rigid printed circuits or like structures
- H01R12/52—Fixed connections for rigid printed circuits or like structures connecting to other rigid printed circuits or like structures
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/14—Structural association of two or more printed circuits
- H05K1/141—One or more single auxiliary printed circuits mounted on a main printed circuit, e.g. modules, adapters
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/0332—Structure of the conductor
- H05K2201/0388—Other aspects of conductors
- H05K2201/0397—Tab
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/06—Thermal details
- H05K2201/068—Thermal details wherein the coefficient of thermal expansion is important
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10227—Other objects, e.g. metallic pieces
- H05K2201/1031—Surface mounted metallic connector elements
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10227—Other objects, e.g. metallic pieces
- H05K2201/1031—Surface mounted metallic connector elements
- H05K2201/10318—Surface mounted metallic pins
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10227—Other objects, e.g. metallic pieces
- H05K2201/10378—Interposers
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10621—Components characterised by their electrical contacts
- H05K2201/10719—Land grid array [LGA]
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10621—Components characterised by their electrical contacts
- H05K2201/10734—Ball grid array [BGA]; Bump grid array
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10742—Details of leads
- H05K2201/1075—Shape details
- H05K2201/10757—Bent leads
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10742—Details of leads
- H05K2201/1075—Shape details
- H05K2201/10878—Means for retention of a lead in a hole
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10742—Details of leads
- H05K2201/10886—Other details
- H05K2201/10909—Materials of terminal, e.g. of leads or electrodes of components
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10742—Details of leads
- H05K2201/10886—Other details
- H05K2201/10946—Leads attached onto leadless component after manufacturing the component
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistors
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistors electrically connecting electric components or wires to printed circuits by soldering
- H05K3/341—Surface mounted components
- H05K3/3421—Leaded components
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/36—Assembling printed circuits with other printed circuits
- H05K3/368—Assembling printed circuits with other printed circuits parallel to each other
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/4092—Integral conductive tabs, i.e. conductive parts partly detached from the substrate
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/01—Manufacture or treatment
- H10W20/031—Manufacture or treatment of conductive parts of the interconnections
- H10W20/069—Manufacture or treatment of conductive parts of the interconnections by forming self-aligned vias or self-aligned contact plugs
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/67—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their insulating layers or insulating parts
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- Engineering & Computer Science (AREA)
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- Metallurgy (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Mechanical Engineering (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Chemical & Material Sciences (AREA)
- General Engineering & Computer Science (AREA)
- Manufacturing Of Electrical Connectors (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Wire Bonding (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/152,812 US5476211A (en) | 1993-11-16 | 1993-11-16 | Method of manufacturing electrical contacts, using a sacrificial member |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW275706B true TW275706B (enFirst) | 1996-05-11 |
Family
ID=22544550
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW084104698A TW275706B (enFirst) | 1993-11-16 | 1995-07-10 |
Country Status (2)
| Country | Link |
|---|---|
| US (9) | US5476211A (enFirst) |
| TW (1) | TW275706B (enFirst) |
Families Citing this family (415)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5476211A (en) * | 1993-11-16 | 1995-12-19 | Form Factor, Inc. | Method of manufacturing electrical contacts, using a sacrificial member |
| US6043563A (en) * | 1997-05-06 | 2000-03-28 | Formfactor, Inc. | Electronic components with terminals and spring contact elements extending from areas which are remote from the terminals |
| US5917707A (en) * | 1993-11-16 | 1999-06-29 | Formfactor, Inc. | Flexible contact structure with an electrically conductive shell |
| US5829128A (en) * | 1993-11-16 | 1998-11-03 | Formfactor, Inc. | Method of mounting resilient contact structures to semiconductor devices |
| US20050062492A1 (en) * | 2001-08-03 | 2005-03-24 | Beaman Brian Samuel | High density integrated circuit apparatus, test probe and methods of use thereof |
| US6295729B1 (en) * | 1992-10-19 | 2001-10-02 | International Business Machines Corporation | Angled flying lead wire bonding process |
| US5371654A (en) * | 1992-10-19 | 1994-12-06 | International Business Machines Corporation | Three dimensional high performance interconnection package |
| US7368924B2 (en) * | 1993-04-30 | 2008-05-06 | International Business Machines Corporation | Probe structure having a plurality of discrete insulated probe tips projecting from a support surface, apparatus for use thereof and methods of fabrication thereof |
| US20030048108A1 (en) * | 1993-04-30 | 2003-03-13 | Beaman Brian Samuel | Structural design and processes to control probe position accuracy in a wafer test probe assembly |
| US5601740A (en) * | 1993-11-16 | 1997-02-11 | Formfactor, Inc. | Method and apparatus for wirebonding, for severing bond wires, and for forming balls on the ends of bond wires |
| US7064566B2 (en) * | 1993-11-16 | 2006-06-20 | Formfactor, Inc. | Probe card assembly and kit |
| US7073254B2 (en) | 1993-11-16 | 2006-07-11 | Formfactor, Inc. | Method for mounting a plurality of spring contact elements |
| US5832601A (en) * | 1993-11-16 | 1998-11-10 | Form Factor, Inc. | Method of making temporary connections between electronic components |
| US6727580B1 (en) * | 1993-11-16 | 2004-04-27 | Formfactor, Inc. | Microelectronic spring contact elements |
| US5772451A (en) | 1993-11-16 | 1998-06-30 | Form Factor, Inc. | Sockets for electronic components and methods of connecting to electronic components |
| US20020053734A1 (en) | 1993-11-16 | 2002-05-09 | Formfactor, Inc. | Probe card assembly and kit, and methods of making same |
| US6525555B1 (en) | 1993-11-16 | 2003-02-25 | Formfactor, Inc. | Wafer-level burn-in and test |
| US6336269B1 (en) * | 1993-11-16 | 2002-01-08 | Benjamin N. Eldridge | Method of fabricating an interconnection element |
| US7200930B2 (en) * | 1994-11-15 | 2007-04-10 | Formfactor, Inc. | Probe for semiconductor devices |
| US20070228110A1 (en) * | 1993-11-16 | 2007-10-04 | Formfactor, Inc. | Method Of Wirebonding That Utilizes A Gas Flow Within A Capillary From Which A Wire Is Played Out |
| US6836962B2 (en) | 1993-11-16 | 2005-01-04 | Formfactor, Inc. | Method and apparatus for shaping spring elements |
| US6442831B1 (en) * | 1993-11-16 | 2002-09-03 | Formfactor, Inc. | Method for shaping spring elements |
| US6184053B1 (en) * | 1993-11-16 | 2001-02-06 | Formfactor, Inc. | Method of making microelectronic spring contact elements |
| US7579269B2 (en) * | 1993-11-16 | 2009-08-25 | Formfactor, Inc. | Microelectronic spring contact elements |
| US5806181A (en) * | 1993-11-16 | 1998-09-15 | Formfactor, Inc. | Contact carriers (tiles) for populating larger substrates with spring contacts |
| US5983493A (en) * | 1993-11-16 | 1999-11-16 | Formfactor, Inc. | Method of temporarily, then permanently, connecting to a semiconductor device |
| US5912046A (en) * | 1993-11-16 | 1999-06-15 | Form Factor, Inc. | Method and apparatus for applying a layer of flowable coating material to a surface of an electronic component |
| US6741085B1 (en) * | 1993-11-16 | 2004-05-25 | Formfactor, Inc. | Contact carriers (tiles) for populating larger substrates with spring contacts |
| US6835898B2 (en) * | 1993-11-16 | 2004-12-28 | Formfactor, Inc. | Electrical contact structures formed by configuring a flexible wire to have a springable shape and overcoating the wire with at least one layer of a resilient conductive material, methods of mounting the contact structures to electronic components, and applications for employing the contact structures |
| US7084656B1 (en) * | 1993-11-16 | 2006-08-01 | Formfactor, Inc. | Probe for semiconductor devices |
| US6624648B2 (en) | 1993-11-16 | 2003-09-23 | Formfactor, Inc. | Probe card assembly |
| US6246247B1 (en) * | 1994-11-15 | 2001-06-12 | Formfactor, Inc. | Probe card assembly and kit, and methods of using same |
| US6482013B2 (en) * | 1993-11-16 | 2002-11-19 | Formfactor, Inc. | Microelectronic spring contact element and electronic component having a plurality of spring contact elements |
| US5455390A (en) * | 1994-02-01 | 1995-10-03 | Tessera, Inc. | Microelectronics unit mounting with multiple lead bonding |
| US5983492A (en) * | 1996-11-27 | 1999-11-16 | Tessera, Inc. | Low profile socket for microelectronic components and method for making the same |
| EP0792519B1 (en) * | 1994-11-15 | 2003-03-26 | Formfactor, Inc. | Interconnection elements for microelectronic components |
| US6727579B1 (en) | 1994-11-16 | 2004-04-27 | Formfactor, Inc. | Electrical contact structures formed by configuring a flexible wire to have a springable shape and overcoating the wire with at least one layer of a resilient conductive material, methods of mounting the contact structures to electronic components, and applications for employing the contact structures |
| US6016852A (en) * | 1994-12-01 | 2000-01-25 | Intel Corporation | Leaded grid array IC package having coplanar bent leads for surface mount technology |
| US5842628A (en) * | 1995-04-10 | 1998-12-01 | Fujitsu Limited | Wire bonding method, semiconductor device, capillary for wire bonding and ball bump forming method |
| US6232789B1 (en) | 1997-05-28 | 2001-05-15 | Cascade Microtech, Inc. | Probe holder for low current measurements |
| US6150186A (en) * | 1995-05-26 | 2000-11-21 | Formfactor, Inc. | Method of making a product with improved material properties by moderate heat-treatment of a metal incorporating a dilute additive |
| AU6028796A (en) * | 1995-05-26 | 1996-12-11 | Formfactor, Inc. | Method and apparatus for shaping spring elements |
| EP0828582A4 (en) * | 1995-05-26 | 1999-02-03 | Formfactor Inc | FLAT TAPE CONNECTORS |
| US20100065963A1 (en) * | 1995-05-26 | 2010-03-18 | Formfactor, Inc. | Method of wirebonding that utilizes a gas flow within a capillary from which a wire is played out |
| EP1610132B1 (en) | 1995-05-26 | 2009-01-14 | FormFactor, Inc. | Fabricating interconnects using sacrificial substrates |
| DE69635083T2 (de) * | 1995-05-26 | 2006-05-18 | Formfactor, Inc., Livermore | Herstellung von verbindungen und ansatzstücken unter verwendung eines opfersubstrats |
| US6483328B1 (en) | 1995-11-09 | 2002-11-19 | Formfactor, Inc. | Probe card for probing wafers with raised contact elements |
| US5729150A (en) | 1995-12-01 | 1998-03-17 | Cascade Microtech, Inc. | Low-current probe card with reduced triboelectric current generating cables |
| DE19606116A1 (de) * | 1996-02-20 | 1997-08-21 | Berkenhoff Gmbh | Elektrische Kontaktelemente |
| US8033838B2 (en) | 1996-02-21 | 2011-10-11 | Formfactor, Inc. | Microelectronic contact structure |
| US5994152A (en) | 1996-02-21 | 1999-11-30 | Formfactor, Inc. | Fabricating interconnects and tips using sacrificial substrates |
| JP3079987B2 (ja) * | 1996-02-28 | 2000-08-21 | 日本電気株式会社 | 電界放出電子源およびその製造方法 |
| EP1468776A3 (en) * | 1996-05-17 | 2009-11-04 | FormFactor, Inc. | Microelectronics spring contact elements |
| JP3328135B2 (ja) * | 1996-05-28 | 2002-09-24 | 田中電子工業株式会社 | バンプ形成用金合金線及びバンプ形成方法 |
| US6429120B1 (en) | 2000-01-18 | 2002-08-06 | Micron Technology, Inc. | Methods and apparatus for making integrated-circuit wiring from copper, silver, gold, and other metals |
| US6020220A (en) * | 1996-07-09 | 2000-02-01 | Tessera, Inc. | Compliant semiconductor chip assemblies and methods of making same |
| US5914613A (en) | 1996-08-08 | 1999-06-22 | Cascade Microtech, Inc. | Membrane probing system with local contact scrub |
| EP0925509B1 (en) * | 1996-09-13 | 2005-09-07 | International Business Machines Corporation | Probe structure having a plurality of discrete insulated probe tips |
| DE69737621T2 (de) * | 1996-10-01 | 2007-12-20 | Matsushita Electric Industrial Co., Ltd., Kadoma | Halbleiterelement mit einer Höckerelektrode |
| SG71046A1 (en) | 1996-10-10 | 2000-03-21 | Connector Systems Tech Nv | High density connector and method of manufacture |
| US6104201A (en) * | 1996-11-08 | 2000-08-15 | International Business Machines Corporation | Method and apparatus for passive characterization of semiconductor substrates subjected to high energy (MEV) ion implementation using high-injection surface photovoltage |
| US6635514B1 (en) | 1996-12-12 | 2003-10-21 | Tessera, Inc. | Compliant package with conductive elastomeric posts |
| US6417029B1 (en) | 1996-12-12 | 2002-07-09 | Tessera, Inc. | Compliant package with conductive elastomeric posts |
| US5989939A (en) * | 1996-12-13 | 1999-11-23 | Tessera, Inc. | Process of manufacturing compliant wirebond packages |
| KR100214545B1 (ko) * | 1996-12-28 | 1999-08-02 | 구본준 | 칩 사이즈 반도체 패키지의 제조 방법 |
| US6690185B1 (en) | 1997-01-15 | 2004-02-10 | Formfactor, Inc. | Large contactor with multiple, aligned contactor units |
| US7063541B2 (en) | 1997-03-17 | 2006-06-20 | Formfactor, Inc. | Composite microelectronic spring structure and method for making same |
| US6449834B1 (en) * | 1997-05-02 | 2002-09-17 | Scilogy Corp. | Electrical conductor coils and methods of making same |
| US7714235B1 (en) | 1997-05-06 | 2010-05-11 | Formfactor, Inc. | Lithographically defined microelectronic contact structures |
| EP0985231A1 (en) * | 1997-05-15 | 2000-03-15 | Formfactor, Inc. | Lithographically defined microelectronic contact structures |
| US6525551B1 (en) * | 1997-05-22 | 2003-02-25 | International Business Machines Corporation | Probe structures for testing electrical interconnections to integrated circuit electronic devices |
| US6034533A (en) | 1997-06-10 | 2000-03-07 | Tervo; Paul A. | Low-current pogo probe card |
| US6082610A (en) | 1997-06-23 | 2000-07-04 | Ford Motor Company | Method of forming interconnections on electronic modules |
| US6010059A (en) * | 1997-09-30 | 2000-01-04 | Siemens Energy & Automation, Inc. | Method for ultrasonic joining of electrical parts using a brazing alloy |
| JP3262531B2 (ja) | 1997-10-02 | 2002-03-04 | インターナショナル・ビジネス・マシーンズ・コーポレーション | 曲げられたフライング・リード・ワイヤ・ボンデイング・プロセス |
| JP3455092B2 (ja) * | 1997-10-27 | 2003-10-06 | 株式会社新川 | 半導体装置及びワイヤボンディング方法 |
| JP3123483B2 (ja) * | 1997-10-28 | 2001-01-09 | 日本電気株式会社 | プローブカード及びプローブカード形成方法 |
| US6724203B1 (en) * | 1997-10-30 | 2004-04-20 | International Business Machines Corporation | Full wafer test configuration using memory metals |
| KR100244504B1 (ko) * | 1997-11-15 | 2000-02-01 | 김영환 | 칩 사이즈 반도체 패키지의 제조방법 |
| US6357112B1 (en) * | 1997-11-25 | 2002-03-19 | Tessera, Inc. | Method of making connection component |
| US6557253B1 (en) | 1998-02-09 | 2003-05-06 | Tessera, Inc. | Method of making components with releasable leads |
| US6720501B1 (en) | 1998-04-14 | 2004-04-13 | Formfactor, Inc. | PC board having clustered blind vias |
| DE19823623A1 (de) * | 1998-05-27 | 1999-12-02 | Bosch Gmbh Robert | Verfahren und Kontaktstelle zur Herstellung einer elektrischen Verbindung |
| SG108210A1 (en) * | 1998-06-19 | 2005-01-28 | Advantest Corp | Probe contactor formed by photolithography process |
| US6164523A (en) * | 1998-07-01 | 2000-12-26 | Semiconductor Components Industries, Llc | Electronic component and method of manufacture |
| US6705876B2 (en) * | 1998-07-13 | 2004-03-16 | Formfactor, Inc. | Electrical interconnect assemblies and methods |
| US6256882B1 (en) | 1998-07-14 | 2001-07-10 | Cascade Microtech, Inc. | Membrane probing system |
| US6509590B1 (en) * | 1998-07-20 | 2003-01-21 | Micron Technology, Inc. | Aluminum-beryllium alloys for air bridges |
| US6344752B1 (en) | 1998-08-12 | 2002-02-05 | Tokyo Electron Limited | Contactor and production method for contractor |
| US6169331B1 (en) | 1998-08-28 | 2001-01-02 | Micron Technology, Inc. | Apparatus for electrically coupling bond pads of a microelectronic device |
| JP2000077477A (ja) | 1998-09-02 | 2000-03-14 | Shinko Electric Ind Co Ltd | 半導体装置及びその製造方法並びにこれに用いる金属基板 |
| DE19841826B4 (de) * | 1998-09-12 | 2008-06-19 | Ceramtec Ag Innovative Ceramic Engineering | Verfahren zum Prüfen keramischer Pfanneneinsätze von Hüftgelenk-Endoprothesen |
| US6586845B1 (en) | 1998-10-28 | 2003-07-01 | Shinko Electric Industries Co., Ltd. | Semiconductor device module and a part thereof |
| JP3660814B2 (ja) * | 1998-10-28 | 2005-06-15 | 新光電気工業株式会社 | 半導体モジュールの製造方法及び半導体装置モジュール用部品の製造方法 |
| US6255126B1 (en) * | 1998-12-02 | 2001-07-03 | Formfactor, Inc. | Lithographic contact elements |
| US6644982B1 (en) * | 1998-12-04 | 2003-11-11 | Formfactor, Inc. | Method and apparatus for the transport and tracking of an electronic component |
| WO2000035262A2 (en) * | 1998-12-04 | 2000-06-15 | Formfactor, Inc. | Method for mounting an electronic component |
| US6456099B1 (en) | 1998-12-31 | 2002-09-24 | Formfactor, Inc. | Special contact points for accessing internal circuitry of an integrated circuit |
| US6183267B1 (en) * | 1999-03-11 | 2001-02-06 | Murray Hill Devices | Ultra-miniature electrical contacts and method of manufacture |
| US6259155B1 (en) * | 1999-04-12 | 2001-07-10 | International Business Machines Corporation | Polymer enhanced column grid array |
| US6812718B1 (en) | 1999-05-27 | 2004-11-02 | Nanonexus, Inc. | Massively parallel interface for electronic circuits |
| US6710609B2 (en) * | 2002-07-15 | 2004-03-23 | Nanonexus, Inc. | Mosaic decal probe |
| US7126220B2 (en) * | 2002-03-18 | 2006-10-24 | Nanonexus, Inc. | Miniaturized contact spring |
| US7382142B2 (en) | 2000-05-23 | 2008-06-03 | Nanonexus, Inc. | High density interconnect system having rapid fabrication cycle |
| US20070245553A1 (en) * | 1999-05-27 | 2007-10-25 | Chong Fu C | Fine pitch microfabricated spring contact structure & method |
| US7349223B2 (en) | 2000-05-23 | 2008-03-25 | Nanonexus, Inc. | Enhanced compliant probe card systems having improved planarity |
| US6799976B1 (en) | 1999-07-28 | 2004-10-05 | Nanonexus, Inc. | Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies |
| US7247035B2 (en) | 2000-06-20 | 2007-07-24 | Nanonexus, Inc. | Enhanced stress metal spring contactor |
| US6578264B1 (en) | 1999-06-04 | 2003-06-17 | Cascade Microtech, Inc. | Method for constructing a membrane probe using a depression |
| US7215131B1 (en) * | 1999-06-07 | 2007-05-08 | Formfactor, Inc. | Segmented contactor |
| JP2001044362A (ja) * | 1999-07-27 | 2001-02-16 | Mitsubishi Electric Corp | 半導体装置の実装構造および実装方法 |
| US6713374B2 (en) | 1999-07-30 | 2004-03-30 | Formfactor, Inc. | Interconnect assemblies and methods |
| US7435108B1 (en) | 1999-07-30 | 2008-10-14 | Formfactor, Inc. | Variable width resilient conductive contact structures |
| US7189077B1 (en) | 1999-07-30 | 2007-03-13 | Formfactor, Inc. | Lithographic type microelectronic spring structures with improved contours |
| US6468098B1 (en) * | 1999-08-17 | 2002-10-22 | Formfactor, Inc. | Electrical contactor especially wafer level contactor using fluid pressure |
| US6853067B1 (en) | 1999-10-12 | 2005-02-08 | Microassembly Technologies, Inc. | Microelectromechanical systems using thermocompression bonding |
| US6392428B1 (en) * | 1999-11-16 | 2002-05-21 | Eaglestone Partners I, Llc | Wafer level interposer |
| US6511463B1 (en) * | 1999-11-18 | 2003-01-28 | Jds Uniphase Corporation | Methods of fabricating microneedle arrays using sacrificial molds |
| US6380555B1 (en) * | 1999-12-24 | 2002-04-30 | Micron Technology, Inc. | Bumped semiconductor component having test pads, and method and system for testing bumped semiconductor components |
| US6827584B2 (en) * | 1999-12-28 | 2004-12-07 | Formfactor, Inc. | Interconnect for microelectronic structures with enhanced spring characteristics |
| US6464513B1 (en) | 2000-01-05 | 2002-10-15 | Micron Technology, Inc. | Adapter for non-permanently connecting integrated circuit devices to multi-chip modules and method of using same |
| US6848942B1 (en) | 2000-01-12 | 2005-02-01 | Molex Incorporated | Connectors having supportive barrier components |
| US6420262B1 (en) | 2000-01-18 | 2002-07-16 | Micron Technology, Inc. | Structures and methods to enhance copper metallization |
| US7262130B1 (en) | 2000-01-18 | 2007-08-28 | Micron Technology, Inc. | Methods for making integrated-circuit wiring from copper, silver, gold, and other metals |
| US7211512B1 (en) | 2000-01-18 | 2007-05-01 | Micron Technology, Inc. | Selective electroless-plated copper metallization |
| US6657455B2 (en) * | 2000-01-18 | 2003-12-02 | Formfactor, Inc. | Predictive, adaptive power supply for an integrated circuit under test |
| US6250933B1 (en) | 2000-01-20 | 2001-06-26 | Advantest Corp. | Contact structure and production method thereof |
| US6838890B2 (en) | 2000-02-25 | 2005-01-04 | Cascade Microtech, Inc. | Membrane probing system |
| JP2001332658A (ja) | 2000-03-14 | 2001-11-30 | Hitachi Ltd | 半導体集積回路装置およびその製造方法 |
| US7262611B2 (en) | 2000-03-17 | 2007-08-28 | Formfactor, Inc. | Apparatuses and methods for planarizing a semiconductor contactor |
| JP4088015B2 (ja) * | 2000-03-24 | 2008-05-21 | 株式会社新川 | 湾曲状ワイヤの形成方法 |
| US6407566B1 (en) | 2000-04-06 | 2002-06-18 | Micron Technology, Inc. | Test module for multi-chip module simulation testing of integrated circuit packages |
| DE10017746B4 (de) * | 2000-04-10 | 2005-10-13 | Infineon Technologies Ag | Verfahren zur Herstellung eines elektronischen Bauteils mit mikroskopisch kleinen Kontaktflächen |
| US7458816B1 (en) | 2000-04-12 | 2008-12-02 | Formfactor, Inc. | Shaped spring |
| US6640432B1 (en) * | 2000-04-12 | 2003-11-04 | Formfactor, Inc. | Method of fabricating shaped springs |
| US7579848B2 (en) | 2000-05-23 | 2009-08-25 | Nanonexus, Inc. | High density interconnect system for IC packages and interconnect assemblies |
| US20050068054A1 (en) * | 2000-05-23 | 2005-03-31 | Sammy Mok | Standardized layout patterns and routing structures for integrated circuit wafer probe card assemblies |
| US7952373B2 (en) | 2000-05-23 | 2011-05-31 | Verigy (Singapore) Pte. Ltd. | Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies |
| US6674167B1 (en) | 2000-05-31 | 2004-01-06 | Micron Technology, Inc. | Multilevel copper interconnect with double passivation |
| US6423629B1 (en) | 2000-05-31 | 2002-07-23 | Kie Y. Ahn | Multilevel copper interconnects with low-k dielectrics and air gaps |
| US20020113322A1 (en) * | 2000-06-12 | 2002-08-22 | Shinichi Terashima | Semiconductor device and method to produce the same |
| JP2004501517A (ja) | 2000-06-20 | 2004-01-15 | ナノネクサス インコーポレイテッド | 集積回路をテスト及びパッケージングするためのシステム |
| US6537831B1 (en) * | 2000-07-31 | 2003-03-25 | Eaglestone Partners I, Llc | Method for selecting components for a matched set using a multi wafer interposer |
| US6822469B1 (en) | 2000-07-31 | 2004-11-23 | Eaglestone Partners I, Llc | Method for testing multiple semiconductor wafers |
| US6812048B1 (en) | 2000-07-31 | 2004-11-02 | Eaglestone Partners I, Llc | Method for manufacturing a wafer-interposer assembly |
| US6462575B1 (en) * | 2000-08-28 | 2002-10-08 | Micron Technology, Inc. | Method and system for wafer level testing and burning-in semiconductor components |
| DE10045534B4 (de) * | 2000-09-13 | 2005-03-17 | Infineon Technologies Ag | Elektronisches Bauteil mit Außenanschlußelementen ausgebildet als Kapillarelement, Verfahren zur Herstellung und Anordnung |
| US6589819B2 (en) * | 2000-09-29 | 2003-07-08 | Tessera, Inc. | Microelectronic packages having an array of resilient leads and methods therefor |
| US6815712B1 (en) | 2000-10-02 | 2004-11-09 | Eaglestone Partners I, Llc | Method for selecting components for a matched set from a wafer-interposer assembly |
| US6564449B1 (en) * | 2000-11-07 | 2003-05-20 | Advanced Semiconductor Engineering, Inc. | Method of making wire connection in semiconductor device |
| US6686657B1 (en) | 2000-11-07 | 2004-02-03 | Eaglestone Partners I, Llc | Interposer for improved handling of semiconductor wafers and method of use of same |
| US20020096421A1 (en) * | 2000-11-29 | 2002-07-25 | Cohn Michael B. | MEMS device with integral packaging |
| DE10143173A1 (de) | 2000-12-04 | 2002-06-06 | Cascade Microtech Inc | Wafersonde |
| US20020076854A1 (en) * | 2000-12-15 | 2002-06-20 | Pierce John L. | System, method and apparatus for constructing a semiconductor wafer-interposer using B-Stage laminates |
| US20020078401A1 (en) * | 2000-12-15 | 2002-06-20 | Fry Michael Andrew | Test coverage analysis system |
| US6524885B2 (en) * | 2000-12-15 | 2003-02-25 | Eaglestone Partners I, Llc | Method, apparatus and system for building an interposer onto a semiconductor wafer using laser techniques |
| US6529022B2 (en) | 2000-12-15 | 2003-03-04 | Eaglestone Pareners I, Llc | Wafer testing interposer for a conventional package |
| JP3486872B2 (ja) * | 2001-01-26 | 2004-01-13 | Necセミコンダクターズ九州株式会社 | 半導体装置及びその製造方法 |
| US6673653B2 (en) * | 2001-02-23 | 2004-01-06 | Eaglestone Partners I, Llc | Wafer-interposer using a ceramic substrate |
| US7010856B2 (en) * | 2001-03-16 | 2006-03-14 | Nihon Kohden Corporation | Lead wire attachment method, electrode, and spot welder |
| US7396236B2 (en) * | 2001-03-16 | 2008-07-08 | Formfactor, Inc. | Wafer level interposer |
| US6722896B2 (en) | 2001-03-22 | 2004-04-20 | Molex Incorporated | Stitched LGA connector |
| US6694609B2 (en) | 2001-03-22 | 2004-02-24 | Molex Incorporated | Method of making stitched LGA connector |
| JP2002353371A (ja) | 2001-05-25 | 2002-12-06 | Shinko Electric Ind Co Ltd | 半導体装置及びその製造方法 |
| US6545226B2 (en) * | 2001-05-31 | 2003-04-08 | International Business Machines Corporation | Printed wiring board interposer sub-assembly |
| US6585527B2 (en) | 2001-05-31 | 2003-07-01 | Samtec, Inc. | Compliant connector for land grid array |
| KR100422346B1 (ko) * | 2001-06-12 | 2004-03-12 | 주식회사 하이닉스반도체 | 칩크기 패키지 구조 및 그 제조방법 |
| US6729019B2 (en) | 2001-07-11 | 2004-05-04 | Formfactor, Inc. | Method of manufacturing a probe card |
| US7182672B2 (en) * | 2001-08-02 | 2007-02-27 | Sv Probe Pte. Ltd. | Method of probe tip shaping and cleaning |
| AU2002327490A1 (en) | 2001-08-21 | 2003-06-30 | Cascade Microtech, Inc. | Membrane probing system |
| US7045889B2 (en) | 2001-08-21 | 2006-05-16 | Micron Technology, Inc. | Device for establishing non-permanent electrical connection between an integrated circuit device lead element and a substrate |
| US20030038356A1 (en) * | 2001-08-24 | 2003-02-27 | Derderian James M | Semiconductor devices including stacking spacers thereon, assemblies including the semiconductor devices, and methods |
| US7153399B2 (en) * | 2001-08-24 | 2006-12-26 | Nanonexus, Inc. | Method and apparatus for producing uniform isotropic stresses in a sputtered film |
| US7049693B2 (en) | 2001-08-29 | 2006-05-23 | Micron Technology, Inc. | Electrical contact array for substrate assemblies |
| US6817052B2 (en) * | 2001-11-09 | 2004-11-16 | Formfactor, Inc. | Apparatuses and methods for cleaning test probes |
| US6798073B2 (en) * | 2001-12-13 | 2004-09-28 | Megic Corporation | Chip structure and process for forming the same |
| US7168160B2 (en) * | 2001-12-21 | 2007-01-30 | Formfactor, Inc. | Method for mounting and heating a plurality of microelectronic components |
| US20030116346A1 (en) * | 2001-12-21 | 2003-06-26 | Forster James Allam | Low cost area array probe for circuits having solder-ball contacts are manufactured using a wire bonding machine |
| US7064953B2 (en) * | 2001-12-27 | 2006-06-20 | Formfactor, Inc. | Electronic package with direct cooling of active electronic components |
| JP4484520B2 (ja) | 2001-12-27 | 2010-06-16 | フォームファクター, インコーポレイテッド | 能動電子部品の直接冷却をともなう冷却アセンブリ |
| US6891385B2 (en) * | 2001-12-27 | 2005-05-10 | Formfactor, Inc. | Probe card cooling assembly with direct cooling of active electronic components |
| JP2003198117A (ja) * | 2001-12-28 | 2003-07-11 | Matsushita Electric Ind Co Ltd | はんだ付け方法および接合構造体 |
| US7042084B2 (en) * | 2002-01-02 | 2006-05-09 | Intel Corporation | Semiconductor package with integrated heat spreader attached to a thermally conductive substrate core |
| US6977345B2 (en) * | 2002-01-08 | 2005-12-20 | International Business Machines Corporation | Vents with signal image for signal return path |
| US6860769B2 (en) * | 2002-01-12 | 2005-03-01 | Taiwan Semiconductor Manufacturing Co., Ltd | Cathode contact pin for an electroplating process |
| US6840374B2 (en) | 2002-01-18 | 2005-01-11 | Igor Y. Khandros | Apparatus and method for cleaning test probes |
| JP2003249607A (ja) * | 2002-02-26 | 2003-09-05 | Seiko Epson Corp | 半導体装置及びその製造方法、回路基板並びに電子機器 |
| DE10392441T5 (de) * | 2002-03-18 | 2005-07-07 | Nanonexus, Inc., Fremont | Eine miniaturisierte Kontaktfeder |
| US7010854B2 (en) * | 2002-04-10 | 2006-03-14 | Formfactor, Inc. | Re-assembly process for MEMS structures |
| US6866255B2 (en) * | 2002-04-12 | 2005-03-15 | Xerox Corporation | Sputtered spring films with low stress anisotropy |
| US20060051948A1 (en) * | 2003-02-04 | 2006-03-09 | Microfabrica Inc. | Microprobe tips and methods for making |
| US7265565B2 (en) | 2003-02-04 | 2007-09-04 | Microfabrica Inc. | Cantilever microprobes for contacting electronic components and methods for making such probes |
| US20060053625A1 (en) * | 2002-05-07 | 2006-03-16 | Microfabrica Inc. | Microprobe tips and methods for making |
| US7412767B2 (en) * | 2003-02-04 | 2008-08-19 | Microfabrica, Inc. | Microprobe tips and methods for making |
| US20050184748A1 (en) * | 2003-02-04 | 2005-08-25 | Microfabrica Inc. | Pin-type probes for contacting electronic circuits and methods for making such probes |
| US20060006888A1 (en) * | 2003-02-04 | 2006-01-12 | Microfabrica Inc. | Electrochemically fabricated microprobes |
| US7273812B2 (en) * | 2002-05-07 | 2007-09-25 | Microfabrica Inc. | Microprobe tips and methods for making |
| US20050104609A1 (en) * | 2003-02-04 | 2005-05-19 | Microfabrica Inc. | Microprobe tips and methods for making |
| US7363705B2 (en) * | 2003-02-04 | 2008-04-29 | Microfabrica, Inc. | Method of making a contact |
| US20060238209A1 (en) * | 2002-05-07 | 2006-10-26 | Microfabrica Inc. | Vertical microprobes for contacting electronic components and method for making such probes |
| US7138583B2 (en) * | 2002-05-08 | 2006-11-21 | Sandisk Corporation | Method and apparatus for maintaining a separation between contacts |
| JP2005527823A (ja) | 2002-05-23 | 2005-09-15 | カスケード マイクロテック インコーポレイテッド | デバイスのテスト用プローブ |
| US7011530B2 (en) * | 2002-05-24 | 2006-03-14 | Sitaraman Suresh K | Multi-axis compliance spring |
| US7032311B2 (en) * | 2002-06-25 | 2006-04-25 | Eli Razon | Stabilized wire bonded electrical connections and method of making same |
| US6787920B2 (en) * | 2002-06-25 | 2004-09-07 | Intel Corporation | Electronic circuit board manufacturing process and associated apparatus |
| KR20050054959A (ko) * | 2002-09-25 | 2005-06-10 | 코닌클리즈케 필립스 일렉트로닉스 엔.브이. | 커넥터, 칩 카드 판독기, 이동 전화기 및 pda |
| US6724205B1 (en) | 2002-11-13 | 2004-04-20 | Cascade Microtech, Inc. | Probe for combined signals |
| DE10255626A1 (de) * | 2002-11-28 | 2004-06-17 | Infineon Technologies Ag | Verfahren und Vorrichtung zum Anordnen von Kontaktierungselementen von Bauelementen eines integrierten Schaltkreises, Computerlesbares Speichermedium und Programm-Element |
| US7084650B2 (en) * | 2002-12-16 | 2006-08-01 | Formfactor, Inc. | Apparatus and method for limiting over travel in a probe card assembly |
| US7567089B2 (en) * | 2003-02-04 | 2009-07-28 | Microfabrica Inc. | Two-part microprobes for contacting electronic components and methods for making such probes |
| US10416192B2 (en) | 2003-02-04 | 2019-09-17 | Microfabrica Inc. | Cantilever microprobes for contacting electronic components |
| CA2418683C (en) * | 2003-02-11 | 2007-01-02 | Ibm Canada Limited - Ibm Canada Limitee | Area-array with low inductance connecting device |
| US7271497B2 (en) * | 2003-03-10 | 2007-09-18 | Fairchild Semiconductor Corporation | Dual metal stud bumping for flip chip applications |
| US6965245B2 (en) | 2003-05-01 | 2005-11-15 | K&S Interconnect, Inc. | Prefabricated and attached interconnect structure |
| US7057404B2 (en) | 2003-05-23 | 2006-06-06 | Sharp Laboratories Of America, Inc. | Shielded probe for testing a device under test |
| US7015584B2 (en) * | 2003-07-08 | 2006-03-21 | Xerox Corporation | High force metal plated spring structure |
| US6994565B2 (en) * | 2003-07-14 | 2006-02-07 | Fci Americas Technology, Inc. | Electrical contact assembly with insulative carrier, stapled contact attachment and fusible element |
| US6859054B1 (en) * | 2003-08-13 | 2005-02-22 | Advantest Corp. | Probe contact system using flexible printed circuit board |
| US7261230B2 (en) * | 2003-08-29 | 2007-08-28 | Freescale Semiconductor, Inc. | Wirebonding insulated wire and capillary therefor |
| US7030632B2 (en) * | 2003-10-14 | 2006-04-18 | Micron Technology, Inc. | Compliant contract structures, contactor cards and test system including same |
| JP4427298B2 (ja) * | 2003-10-28 | 2010-03-03 | 富士通株式会社 | 多段バンプの形成方法 |
| JP4008408B2 (ja) * | 2003-11-07 | 2007-11-14 | 日本電子材料株式会社 | プローブカード |
| US20050108875A1 (en) * | 2003-11-26 | 2005-05-26 | Mathieu Gaetan L. | Methods for making vertical electric feed through structures usable to form removable substrate tiles in a wafer test system |
| US7024763B2 (en) * | 2003-11-26 | 2006-04-11 | Formfactor, Inc. | Methods for making plated through holes usable as interconnection wire or probe attachments |
| US7160121B2 (en) * | 2003-12-15 | 2007-01-09 | Palo Alto Research Center Incorporated | Stressed metal contact with enhanced lateral compliance |
| US7410590B2 (en) * | 2003-12-19 | 2008-08-12 | Palo Alto Research Center Incorporated | Transferable micro spring structure |
| DE202004021093U1 (de) | 2003-12-24 | 2006-09-28 | Cascade Microtech, Inc., Beaverton | Aktiver Halbleiterscheibenmessfühler |
| US20080108221A1 (en) * | 2003-12-31 | 2008-05-08 | Microfabrica Inc. | Microprobe Tips and Methods for Making |
| US7098544B2 (en) * | 2004-01-06 | 2006-08-29 | International Business Machines Corporation | Edge seal for integrated circuit chips |
| US7094117B2 (en) * | 2004-02-27 | 2006-08-22 | Micron Technology, Inc. | Electrical contacts with dielectric cores |
| US7282932B2 (en) * | 2004-03-02 | 2007-10-16 | Micron Technology, Inc. | Compliant contact pin assembly, card system and methods thereof |
| US7251884B2 (en) * | 2004-04-26 | 2007-08-07 | Formfactor, Inc. | Method to build robust mechanical structures on substrate surfaces |
| US8988091B2 (en) | 2004-05-21 | 2015-03-24 | Microprobe, Inc. | Multiple contact probes |
| US7659739B2 (en) | 2006-09-14 | 2010-02-09 | Micro Porbe, Inc. | Knee probe having reduced thickness section for control of scrub motion |
| US9476911B2 (en) | 2004-05-21 | 2016-10-25 | Microprobe, Inc. | Probes with high current carrying capability and laser machining methods |
| US7759949B2 (en) | 2004-05-21 | 2010-07-20 | Microprobe, Inc. | Probes with self-cleaning blunt skates for contacting conductive pads |
| US9097740B2 (en) | 2004-05-21 | 2015-08-04 | Formfactor, Inc. | Layered probes with core |
| USRE43503E1 (en) | 2006-06-29 | 2012-07-10 | Microprobe, Inc. | Probe skates for electrical testing of convex pad topologies |
| US20050277281A1 (en) * | 2004-06-10 | 2005-12-15 | Dubin Valery M | Compliant interconnect and method of formation |
| US7230437B2 (en) * | 2004-06-15 | 2007-06-12 | Formfactor, Inc. | Mechanically reconfigurable vertical tester interface for IC probing |
| JP4980903B2 (ja) | 2004-07-07 | 2012-07-18 | カスケード マイクロテック インコーポレイテッド | 膜懸垂プローブを具えるプローブヘッド |
| US7082684B2 (en) * | 2004-08-04 | 2006-08-01 | Palo Alto Research Center Incorporated | Intermetallic spring structure |
| JP4435167B2 (ja) * | 2004-08-05 | 2010-03-17 | セイコーエプソン株式会社 | ワイヤボンディング方法 |
| US20060030179A1 (en) * | 2004-08-05 | 2006-02-09 | Palo Alto Research Center, Incorporated | Transmission-line spring structure |
| US7750487B2 (en) * | 2004-08-11 | 2010-07-06 | Intel Corporation | Metal-metal bonding of compliant interconnect |
| US7459795B2 (en) * | 2004-08-19 | 2008-12-02 | Formfactor, Inc. | Method to build a wirebond probe card in a many at a time fashion |
| JP2008512680A (ja) | 2004-09-13 | 2008-04-24 | カスケード マイクロテック インコーポレイテッド | 両面プロービング構造体 |
| US20060055032A1 (en) * | 2004-09-14 | 2006-03-16 | Kuo-Chin Chang | Packaging with metal studs formed on solder pads |
| US7230440B2 (en) | 2004-10-21 | 2007-06-12 | Palo Alto Research Center Incorporated | Curved spring structure with elongated section located under cantilevered section |
| US8330485B2 (en) * | 2004-10-21 | 2012-12-11 | Palo Alto Research Center Incorporated | Curved spring structure with downturned tip |
| US7621044B2 (en) | 2004-10-22 | 2009-11-24 | Formfactor, Inc. | Method of manufacturing a resilient contact |
| US7292294B2 (en) * | 2004-11-03 | 2007-11-06 | Chunghwa Picture Tubes, Ltd. | Manufacturing method of color filter on TFT array and manufacturing method of LCD panel |
| WO2006052616A1 (en) | 2004-11-03 | 2006-05-18 | Tessera, Inc. | Stacked packaging improvements |
| US7523852B2 (en) * | 2004-12-05 | 2009-04-28 | International Business Machines Corporation | Solder interconnect structure and method using injection molded solder |
| US7771208B2 (en) * | 2004-12-16 | 2010-08-10 | International Business Machines Corporation | Metalized elastomeric electrical contacts |
| KR100968183B1 (ko) * | 2004-12-16 | 2010-07-05 | 인터내셔널 비지네스 머신즈 코포레이션 | 금속화 엘라스토머 프로브 구조 |
| DE102004062885B4 (de) * | 2004-12-27 | 2007-10-18 | Infineon Technologies Ag | Anordnung mit einer elektronischen Leiterplatte und mindestens einem Halbleiterbaustein und Verfahren |
| US7535247B2 (en) | 2005-01-31 | 2009-05-19 | Cascade Microtech, Inc. | Interface for testing semiconductors |
| US7656172B2 (en) | 2005-01-31 | 2010-02-02 | Cascade Microtech, Inc. | System for testing semiconductors |
| JP4797391B2 (ja) * | 2005-02-10 | 2011-10-19 | 東京エレクトロン株式会社 | インターポーザの製造方法 |
| US7160798B2 (en) * | 2005-02-24 | 2007-01-09 | Freescale Semiconductor, Inc. | Method of making reinforced semiconductor package |
| US7371676B2 (en) | 2005-04-08 | 2008-05-13 | Micron Technology, Inc. | Method for fabricating semiconductor components with through wire interconnects |
| US7692521B1 (en) | 2005-05-12 | 2010-04-06 | Microassembly Technologies, Inc. | High force MEMS device |
| US7393770B2 (en) | 2005-05-19 | 2008-07-01 | Micron Technology, Inc. | Backside method for fabricating semiconductor components with conductive interconnects |
| US7449899B2 (en) | 2005-06-08 | 2008-11-11 | Cascade Microtech, Inc. | Probe for high frequency signals |
| EP1932003A2 (en) | 2005-06-13 | 2008-06-18 | Cascade Microtech, Inc. | Wideband active-passive differential signal probe |
| US7637415B2 (en) * | 2005-10-31 | 2009-12-29 | General Electric Company | Methods and apparatus for assembling a printed circuit board |
| KR100722096B1 (ko) * | 2005-11-23 | 2007-05-25 | 삼성에스디아이 주식회사 | 휴대용 표시장치 |
| US7307348B2 (en) | 2005-12-07 | 2007-12-11 | Micron Technology, Inc. | Semiconductor components having through wire interconnects (TWI) |
| US7649367B2 (en) | 2005-12-07 | 2010-01-19 | Microprobe, Inc. | Low profile probe having improved mechanical scrub and reduced contact inductance |
| JP4654897B2 (ja) * | 2005-12-09 | 2011-03-23 | イビデン株式会社 | 部品実装用ピンを有するプリント配線板の製造方法 |
| JP2007165383A (ja) * | 2005-12-09 | 2007-06-28 | Ibiden Co Ltd | 部品実装用ピンを形成したプリント基板 |
| JP4848752B2 (ja) * | 2005-12-09 | 2011-12-28 | イビデン株式会社 | 部品実装用ピンを有するプリント配線板及びこれを使用した電子機器 |
| US8058101B2 (en) * | 2005-12-23 | 2011-11-15 | Tessera, Inc. | Microelectronic packages and methods therefor |
| US7494924B2 (en) * | 2006-03-06 | 2009-02-24 | Freescale Semiconductor, Inc. | Method for forming reinforced interconnects on a substrate |
| US8344524B2 (en) * | 2006-03-07 | 2013-01-01 | Megica Corporation | Wire bonding method for preventing polymer cracking |
| US7312617B2 (en) | 2006-03-20 | 2007-12-25 | Microprobe, Inc. | Space transformers employing wire bonds for interconnections with fine pitch contacts |
| US20070222087A1 (en) * | 2006-03-27 | 2007-09-27 | Sangdo Lee | Semiconductor device with solderable loop contacts |
| US20070235872A1 (en) * | 2006-03-28 | 2007-10-11 | Ping-Chang Wu | Semiconductor package structure |
| US7659612B2 (en) | 2006-04-24 | 2010-02-09 | Micron Technology, Inc. | Semiconductor components having encapsulated through wire interconnects (TWI) |
| US7444253B2 (en) * | 2006-05-09 | 2008-10-28 | Formfactor, Inc. | Air bridge structures and methods of making and using air bridge structures |
| DE102006023167B3 (de) * | 2006-05-17 | 2007-12-13 | Infineon Technologies Ag | Bonddraht, Herstellungsverfahren für einen Bonddraht und Wedge-Wedge-Drahtbondverfahren |
| US7952375B2 (en) * | 2006-06-06 | 2011-05-31 | Formfactor, Inc. | AC coupled parameteric test probe |
| US7609077B2 (en) | 2006-06-09 | 2009-10-27 | Cascade Microtech, Inc. | Differential signal probe with integral balun |
| US7403028B2 (en) | 2006-06-12 | 2008-07-22 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
| US7723999B2 (en) | 2006-06-12 | 2010-05-25 | Cascade Microtech, Inc. | Calibration structures for differential signal probing |
| US7764072B2 (en) | 2006-06-12 | 2010-07-27 | Cascade Microtech, Inc. | Differential signal probing system |
| US7443186B2 (en) | 2006-06-12 | 2008-10-28 | Cascade Microtech, Inc. | On-wafer test structures for differential signals |
| US7967062B2 (en) * | 2006-06-16 | 2011-06-28 | International Business Machines Corporation | Thermally conductive composite interface, cooled electronic assemblies employing the same, and methods of fabrication thereof |
| US8907689B2 (en) | 2006-10-11 | 2014-12-09 | Microprobe, Inc. | Probe retention arrangement |
| JP2008117888A (ja) * | 2006-11-02 | 2008-05-22 | Rohm Co Ltd | 電子部品、およびワイヤボンディング方法 |
| US7642793B2 (en) * | 2006-11-22 | 2010-01-05 | Taiwan Semiconductor Manufacturing Company, Ltd. | Ultra-fine pitch probe card structure |
| EP1930216A1 (en) * | 2006-12-07 | 2008-06-11 | Nederlandse Organisatie voor toegepast-natuurwetenschappelijk Onderzoek TNO | Wire beam |
| US7696766B2 (en) | 2007-01-31 | 2010-04-13 | Taiwan Semiconductor Manufacturing Company, Ltd. | Ultra-fine pitch probe card structure |
| KR100797682B1 (ko) * | 2007-02-07 | 2008-01-23 | 삼성전기주식회사 | 인쇄회로기판의 제조방법 |
| US7514948B2 (en) | 2007-04-10 | 2009-04-07 | Microprobe, Inc. | Vertical probe array arranged to provide space transformation |
| DE102007020067B4 (de) * | 2007-04-27 | 2013-07-18 | Osram Gmbh | Verfahren zur Herstellung einer Molybdänfolie für den Lampenbau und Molybdänfolie sowie Lampe mit Molybdänfolie |
| US8832936B2 (en) * | 2007-04-30 | 2014-09-16 | International Business Machines Corporation | Method of forming metallized elastomeric electrical contacts |
| US7733102B2 (en) * | 2007-07-10 | 2010-06-08 | Taiwan Semiconductor Manufacturing Company, Ltd. | Ultra-fine area array pitch probe card |
| US7572679B2 (en) * | 2007-07-26 | 2009-08-11 | Texas Instruments Incorporated | Heat extraction from packaged semiconductor chips, scalable with chip area |
| US7876114B2 (en) | 2007-08-08 | 2011-01-25 | Cascade Microtech, Inc. | Differential waveguide probe |
| US7888955B2 (en) * | 2007-09-25 | 2011-02-15 | Formfactor, Inc. | Method and apparatus for testing devices using serially controlled resources |
| US7977959B2 (en) * | 2007-09-27 | 2011-07-12 | Formfactor, Inc. | Method and apparatus for testing devices using serially controlled intelligent switches |
| TWI360182B (en) * | 2007-10-05 | 2012-03-11 | Ind Tech Res Inst | Method for making a conductive film |
| US8723546B2 (en) | 2007-10-19 | 2014-05-13 | Microprobe, Inc. | Vertical guided layered probe |
| US7964956B1 (en) * | 2007-12-10 | 2011-06-21 | Oracle America, Inc. | Circuit packaging and connectivity |
| US20090164931A1 (en) * | 2007-12-19 | 2009-06-25 | Formfactor, Inc. | Method and Apparatus for Managing Test Result Data Generated by a Semiconductor Test System |
| US20090224793A1 (en) * | 2008-03-07 | 2009-09-10 | Formfactor, Inc. | Method And Apparatus For Designing A Custom Test System |
| US8122309B2 (en) * | 2008-03-11 | 2012-02-21 | Formfactor, Inc. | Method and apparatus for processing failures during semiconductor device testing |
| TWI377624B (en) | 2008-05-13 | 2012-11-21 | Ind Tech Res Inst | Conducting film structure, fabrication method thereof, and conducting film type probe device for ic |
| US8230593B2 (en) | 2008-05-29 | 2012-07-31 | Microprobe, Inc. | Probe bonding method having improved control of bonding material |
| KR20100000328A (ko) * | 2008-06-24 | 2010-01-06 | 삼성전자주식회사 | 조인트 신뢰성이 향상된 반도체 패키지 및 그 제조방법 |
| US8095841B2 (en) * | 2008-08-19 | 2012-01-10 | Formfactor, Inc. | Method and apparatus for testing semiconductor devices with autonomous expected value generation |
| US7944225B2 (en) | 2008-09-26 | 2011-05-17 | Formfactor, Inc. | Method and apparatus for providing a tester integrated circuit for testing a semiconductor device under test |
| US8148646B2 (en) * | 2008-09-29 | 2012-04-03 | Formfactor, Inc. | Process of positioning groups of contact structures |
| US7888957B2 (en) | 2008-10-06 | 2011-02-15 | Cascade Microtech, Inc. | Probing apparatus with impedance optimized interface |
| US8410806B2 (en) | 2008-11-21 | 2013-04-02 | Cascade Microtech, Inc. | Replaceable coupon for a probing apparatus |
| TWI399812B (zh) * | 2008-12-29 | 2013-06-21 | Ind Tech Res Inst | 導電膜結構及其製法與導電膜式積體電路針測裝置 |
| WO2010108011A2 (en) * | 2009-03-18 | 2010-09-23 | 1/2Interplex Industries, Inc. | Planar contact with solder |
| TW201039383A (en) * | 2009-04-17 | 2010-11-01 | Arima Optoelectronics Corp | Semiconductor chip electrode structure and manufacturing method thereof |
| US8531042B2 (en) * | 2009-06-30 | 2013-09-10 | Oracle America, Inc. | Technique for fabricating microsprings on non-planar surfaces |
| JP5597385B2 (ja) * | 2009-11-19 | 2014-10-01 | 株式会社日本マイクロニクス | 電気的試験用プローブ、それを用いた電気的接続装置、及びプローブの製造方法 |
| US8407888B2 (en) | 2010-05-07 | 2013-04-02 | Oracle International Corporation | Method of assembling a circuit board assembly |
| US20130142566A1 (en) * | 2010-06-08 | 2013-06-06 | Min-Feng Yu | Electrochemical methods for wire bonding |
| US8482111B2 (en) | 2010-07-19 | 2013-07-09 | Tessera, Inc. | Stackable molded microelectronic packages |
| US9159708B2 (en) | 2010-07-19 | 2015-10-13 | Tessera, Inc. | Stackable molded microelectronic packages with area array unit connectors |
| JP5713598B2 (ja) | 2010-07-20 | 2015-05-07 | 新光電気工業株式会社 | ソケット及びその製造方法 |
| US8191246B1 (en) * | 2010-11-11 | 2012-06-05 | Qi Luo | Method of manufacturing a plurality of miniaturized spring contacts |
| KR101075241B1 (ko) | 2010-11-15 | 2011-11-01 | 테세라, 인코포레이티드 | 유전체 부재에 단자를 구비하는 마이크로전자 패키지 |
| US8133061B1 (en) * | 2010-11-29 | 2012-03-13 | International Business Machines Corporation | Removable and replaceable dual-sided connector pin interposer |
| US20120146206A1 (en) | 2010-12-13 | 2012-06-14 | Tessera Research Llc | Pin attachment |
| MX2013008837A (es) | 2011-01-31 | 2013-11-20 | American Bank Note Co | Tarjeta inteligente de doble interfaz. |
| KR101128063B1 (ko) | 2011-05-03 | 2012-04-23 | 테세라, 인코포레이티드 | 캡슐화 층의 표면에 와이어 본드를 구비하는 패키지 적층형 어셈블리 |
| US8618659B2 (en) | 2011-05-03 | 2013-12-31 | Tessera, Inc. | Package-on-package assembly with wire bonds to encapsulation surface |
| US9117811B2 (en) * | 2011-06-13 | 2015-08-25 | Tessera, Inc. | Flip chip assembly and process with sintering material on metal bumps |
| JP2013033656A (ja) * | 2011-08-02 | 2013-02-14 | Yazaki Corp | 端子 |
| US9105483B2 (en) | 2011-10-17 | 2015-08-11 | Invensas Corporation | Package-on-package assembly with wire bond vias |
| US9105552B2 (en) | 2011-10-31 | 2015-08-11 | Taiwan Semiconductor Manufacturing Company, Ltd. | Package on package devices and methods of packaging semiconductor dies |
| WO2013070201A1 (en) | 2011-11-09 | 2013-05-16 | Advantest America, Inc. | Fine pitch microelectronic contact array and method of making same |
| EP2785446B1 (en) | 2011-11-30 | 2023-04-19 | Corning Incorporated | Methods of forming complex structures in refractory bodies |
| US8823180B2 (en) | 2011-12-28 | 2014-09-02 | Taiwan Semiconductor Manufacturing Company, Ltd. | Package on package devices and methods of packaging semiconductor dies |
| US8946757B2 (en) | 2012-02-17 | 2015-02-03 | Invensas Corporation | Heat spreading substrate with embedded interconnects |
| US8372741B1 (en) | 2012-02-24 | 2013-02-12 | Invensas Corporation | Method for package-on-package assembly with wire bonds to encapsulation surface |
| US9349706B2 (en) | 2012-02-24 | 2016-05-24 | Invensas Corporation | Method for package-on-package assembly with wire bonds to encapsulation surface |
| US8835228B2 (en) | 2012-05-22 | 2014-09-16 | Invensas Corporation | Substrate-less stackable package with wire-bond interconnect |
| US9171790B2 (en) * | 2012-05-30 | 2015-10-27 | Taiwan Semiconductor Manufacturing Company, Ltd. | Package on package devices and methods of packaging semiconductor dies |
| US9391008B2 (en) | 2012-07-31 | 2016-07-12 | Invensas Corporation | Reconstituted wafer-level package DRAM |
| US9502390B2 (en) | 2012-08-03 | 2016-11-22 | Invensas Corporation | BVA interposer |
| JP6108164B2 (ja) * | 2012-11-07 | 2017-04-05 | 日本電産株式会社 | 半田接合構造および半田接合方法 |
| US8975738B2 (en) | 2012-11-12 | 2015-03-10 | Invensas Corporation | Structure for microelectronic packaging with terminals on dielectric mass |
| JP2014103183A (ja) * | 2012-11-19 | 2014-06-05 | Mitsubishi Electric Corp | 電子回路、その製造方法、および電子部品 |
| US8878353B2 (en) | 2012-12-20 | 2014-11-04 | Invensas Corporation | Structure for microelectronic packaging with bond elements to encapsulation surface |
| US9136254B2 (en) | 2013-02-01 | 2015-09-15 | Invensas Corporation | Microelectronic package having wire bond vias and stiffening layer |
| US9023691B2 (en) | 2013-07-15 | 2015-05-05 | Invensas Corporation | Microelectronic assemblies with stack terminals coupled by connectors extending through encapsulation |
| US9034696B2 (en) | 2013-07-15 | 2015-05-19 | Invensas Corporation | Microelectronic assemblies having reinforcing collars on connectors extending through encapsulation |
| US8883563B1 (en) | 2013-07-15 | 2014-11-11 | Invensas Corporation | Fabrication of microelectronic assemblies having stack terminals coupled by connectors extending through encapsulation |
| US9167710B2 (en) | 2013-08-07 | 2015-10-20 | Invensas Corporation | Embedded packaging with preformed vias |
| US9685365B2 (en) | 2013-08-08 | 2017-06-20 | Invensas Corporation | Method of forming a wire bond having a free end |
| US20150076714A1 (en) | 2013-09-16 | 2015-03-19 | Invensas Corporation | Microelectronic element with bond elements to encapsulation surface |
| US9082753B2 (en) | 2013-11-12 | 2015-07-14 | Invensas Corporation | Severing bond wire by kinking and twisting |
| US9087815B2 (en) | 2013-11-12 | 2015-07-21 | Invensas Corporation | Off substrate kinking of bond wire |
| US9583456B2 (en) | 2013-11-22 | 2017-02-28 | Invensas Corporation | Multiple bond via arrays of different wire heights on a same substrate |
| US9263394B2 (en) | 2013-11-22 | 2016-02-16 | Invensas Corporation | Multiple bond via arrays of different wire heights on a same substrate |
| US9379074B2 (en) | 2013-11-22 | 2016-06-28 | Invensas Corporation | Die stacks with one or more bond via arrays of wire bond wires and with one or more arrays of bump interconnects |
| US9583411B2 (en) | 2014-01-17 | 2017-02-28 | Invensas Corporation | Fine pitch BVA using reconstituted wafer with area array accessible for testing |
| US9214454B2 (en) | 2014-03-31 | 2015-12-15 | Invensas Corporation | Batch process fabrication of package-on-package microelectronic assemblies |
| US10381326B2 (en) | 2014-05-28 | 2019-08-13 | Invensas Corporation | Structure and method for integrated circuits packaging with increased density |
| US9646917B2 (en) | 2014-05-29 | 2017-05-09 | Invensas Corporation | Low CTE component with wire bond interconnects |
| US9412714B2 (en) | 2014-05-30 | 2016-08-09 | Invensas Corporation | Wire bond support structure and microelectronic package including wire bonds therefrom |
| JP2016028417A (ja) | 2014-07-11 | 2016-02-25 | ローム株式会社 | 電子装置 |
| US9735084B2 (en) | 2014-12-11 | 2017-08-15 | Invensas Corporation | Bond via array for thermal conductivity |
| JP6332043B2 (ja) * | 2015-01-09 | 2018-05-30 | 株式会社オートネットワーク技術研究所 | コネクタ用端子対 |
| US9888579B2 (en) | 2015-03-05 | 2018-02-06 | Invensas Corporation | Pressing of wire bond wire tips to provide bent-over tips |
| US9502372B1 (en) | 2015-04-30 | 2016-11-22 | Invensas Corporation | Wafer-level packaging using wire bond wires in place of a redistribution layer |
| US9761554B2 (en) | 2015-05-07 | 2017-09-12 | Invensas Corporation | Ball bonding metal wire bond wires to metal pads |
| US10685943B2 (en) * | 2015-05-14 | 2020-06-16 | Mediatek Inc. | Semiconductor chip package with resilient conductive paste post and fabrication method thereof |
| US10490528B2 (en) | 2015-10-12 | 2019-11-26 | Invensas Corporation | Embedded wire bond wires |
| US9490222B1 (en) | 2015-10-12 | 2016-11-08 | Invensas Corporation | Wire bond wires for interference shielding |
| US10332854B2 (en) | 2015-10-23 | 2019-06-25 | Invensas Corporation | Anchoring structure of fine pitch bva |
| US10181457B2 (en) | 2015-10-26 | 2019-01-15 | Invensas Corporation | Microelectronic package for wafer-level chip scale packaging with fan-out |
| US9911718B2 (en) | 2015-11-17 | 2018-03-06 | Invensas Corporation | ‘RDL-First’ packaged microelectronic device for a package-on-package device |
| US9659848B1 (en) | 2015-11-18 | 2017-05-23 | Invensas Corporation | Stiffened wires for offset BVA |
| US9984992B2 (en) | 2015-12-30 | 2018-05-29 | Invensas Corporation | Embedded wire bond wires for vertical integration with separate surface mount and wire bond mounting surfaces |
| DE202017001425U1 (de) | 2016-03-18 | 2017-07-06 | Apple Inc. | Kontakte aus Edelmetallegierungen |
| US10998657B2 (en) | 2016-03-18 | 2021-05-04 | Apple Inc. | Precious-metal-alloy contacts |
| US9935075B2 (en) | 2016-07-29 | 2018-04-03 | Invensas Corporation | Wire bonding method and apparatus for electromagnetic interference shielding |
| DE102016115221A1 (de) * | 2016-08-17 | 2018-02-22 | Karlsruher Institut für Technologie | Verfahren zum Verbinden von mindestens zwei Substraten zur Bildung eines Moduls |
| US10299368B2 (en) | 2016-12-21 | 2019-05-21 | Invensas Corporation | Surface integrated waveguides and circuit structures therefor |
| US9947634B1 (en) * | 2017-06-13 | 2018-04-17 | Northrop Grumman Systems Corporation | Robust mezzanine BGA connector |
| US20190103693A1 (en) * | 2017-09-29 | 2019-04-04 | Apple Inc. | Electrical contacts having sacrificial layer for corrosion protection |
| US10734579B2 (en) | 2018-01-03 | 2020-08-04 | International Business Machines Corporation | Protuberant contacts for resistive switching devices |
| TWI655891B (zh) * | 2018-03-08 | 2019-04-01 | 綠點高新科技股份有限公司 | 電子模組及其製造方法及電子裝置的殼體及其製造方法 |
| US11973301B2 (en) | 2018-09-26 | 2024-04-30 | Microfabrica Inc. | Probes having improved mechanical and/or electrical properties for making contact between electronic circuit elements and methods for making |
| US11262383B1 (en) | 2018-09-26 | 2022-03-01 | Microfabrica Inc. | Probes having improved mechanical and/or electrical properties for making contact between electronic circuit elements and methods for making |
| US11811182B2 (en) * | 2018-10-11 | 2023-11-07 | Intel Corporation | Solderless BGA interconnect |
| US12181493B2 (en) | 2018-10-26 | 2024-12-31 | Microfabrica Inc. | Compliant probes including dual independently operable probe contact elements including at least one flat extension spring, methods for making, and methods for using |
| US12078657B2 (en) | 2019-12-31 | 2024-09-03 | Microfabrica Inc. | Compliant pin probes with extension springs, methods for making, and methods for using |
| KR101944693B1 (ko) * | 2018-12-04 | 2019-02-01 | 황동원 | 반도체 소자 테스트용 bga 소켓장치 |
| US12000865B2 (en) | 2019-02-14 | 2024-06-04 | Microfabrica Inc. | Multi-beam vertical probes with independent arms formed of a high conductivity metal for enhancing current carrying capacity and methods for making such probes |
| US12048092B2 (en) | 2019-05-06 | 2024-07-23 | 3M Innovative Properties Company | Patterned conductive article |
| KR102708517B1 (ko) * | 2019-10-15 | 2024-09-24 | 에스케이하이닉스 주식회사 | 적층 반도체 칩을 포함하는 반도체 패키지 |
| US12196781B2 (en) | 2019-12-31 | 2025-01-14 | Microfabrica Inc. | Probes with planar unbiased spring elements for electronic component contact, methods for making such probes, and methods for using such probes |
| US11802891B1 (en) | 2019-12-31 | 2023-10-31 | Microfabrica Inc. | Compliant pin probes with multiple spring segments and compression spring deflection stabilization structures, methods for making, and methods for using |
| US11761982B1 (en) | 2019-12-31 | 2023-09-19 | Microfabrica Inc. | Probes with planar unbiased spring elements for electronic component contact and methods for making such probes |
| US12196782B2 (en) | 2019-12-31 | 2025-01-14 | Microfabrica Inc. | Probes with planar unbiased spring elements for electronic component contact, methods for making such probes, and methods for using such probes |
| US11171103B2 (en) | 2020-01-06 | 2021-11-09 | International Business Machines Corporation | Solder ball dimension management |
| JP2021120924A (ja) * | 2020-01-30 | 2021-08-19 | 株式会社ヨコオ | 検査用ソケット |
| US11774467B1 (en) | 2020-09-01 | 2023-10-03 | Microfabrica Inc. | Method of in situ modulation of structural material properties and/or template shape |
| US12146898B2 (en) | 2020-10-02 | 2024-11-19 | Microfabrica Inc. | Multi-beam probes with decoupled structural and current carrying beams and methods of making |
| TWI755919B (zh) * | 2020-11-03 | 2022-02-21 | 中華精測科技股份有限公司 | 板狀連接器與其雙環式串接件、及晶圓測試組件 |
| US20240342455A1 (en) * | 2021-10-15 | 2024-10-17 | Uti Limited Partnership | Microneedle and array and method of fabricating same |
| US12160061B2 (en) * | 2022-02-23 | 2024-12-03 | Te Connectivity Solutions Gmbh | Metal composite for use with separable electrical interfaces |
| USD1037522S1 (en) | 2022-11-30 | 2024-07-30 | Eaton Intelligent Power Limited | Floodlight |
| CN116100111B (zh) * | 2023-04-13 | 2023-06-13 | 微网优联科技(成都)有限公司 | 一种用于摄像头模组与电路板的高精密焊接装置及方法 |
| CN116230654B (zh) * | 2023-05-10 | 2023-07-21 | 之江实验室 | 晶上系统组装结构及其组装方法 |
Family Cites Families (293)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US518020A (en) * | 1894-04-10 | John carnes | ||
| US3258736A (en) * | 1966-06-28 | Electrical connector | ||
| US3302067A (en) * | 1967-01-31 | Modular circuit package utilizing solder coated | ||
| US2429222A (en) * | 1943-06-05 | 1947-10-21 | Bell Telephone Labor Inc | Method of making contact wires |
| DE1026876B (de) | 1953-06-17 | 1958-03-27 | Telefunken Gmbh | Verfahren zur Herstellung von p-n-UEbergaengen bestimmter Sperrschichtgroesse |
| US2869040A (en) | 1954-01-11 | 1959-01-13 | Sylvania Electric Prod | Solder-dipped stamped wiring |
| US2923859A (en) * | 1955-07-20 | 1960-02-02 | Philco Corp | Manufacture of electrical appliances with printed wiring panels |
| US2824269A (en) * | 1956-01-17 | 1958-02-18 | Bell Telephone Labor Inc | Silicon translating devices and silicon alloys therefor |
| BE555318A (enFirst) | 1956-03-07 | |||
| US3119172A (en) * | 1959-05-15 | 1964-01-28 | Jerome J M Mazenko | Method of making an electrical connection |
| US3087239A (en) * | 1959-06-19 | 1963-04-30 | Western Electric Co | Methods of bonding leads to semiconductive devices |
| US3075282A (en) * | 1959-07-24 | 1963-01-29 | Bell Telephone Labor Inc | Semiconductor device contact |
| NL113528C (enFirst) | 1959-08-27 | |||
| US3202489A (en) * | 1959-12-01 | 1965-08-24 | Hughes Aircraft Co | Gold-aluminum alloy bond electrode attachment |
| US2967216A (en) * | 1960-03-08 | 1961-01-03 | Henry S Zablocki | Contact making assembly |
| US3047683A (en) * | 1961-03-22 | 1962-07-31 | Jr Bernard Edward Shlesinger | Multiple contact switch |
| US3227933A (en) * | 1961-05-17 | 1966-01-04 | Fairchild Camera Instr Co | Diode and contact structure |
| US3189799A (en) | 1961-06-14 | 1965-06-15 | Microwave Ass | Semiconductor devices and method of fabricating them |
| US3241011A (en) | 1962-12-26 | 1966-03-15 | Hughes Aircraft Co | Silicon bonding technology |
| GB1064290A (en) * | 1963-01-14 | 1967-04-05 | Motorola Inc | Method of making semiconductor devices |
| US3296692A (en) * | 1963-09-13 | 1967-01-10 | Bell Telephone Labor Inc | Thermocompression wire attachments to quartz crystals |
| DE1514304A1 (de) | 1964-04-03 | 1969-05-14 | Philco Ford Corp | Halbleiteranordnung und Herstellungsverfahren hierfuer |
| US3381081A (en) * | 1965-04-16 | 1968-04-30 | Cts Corp | Electrical connection and method of making the same |
| US3429040A (en) * | 1965-06-18 | 1969-02-25 | Ibm | Method of joining a component to a substrate |
| US3373481A (en) * | 1965-06-22 | 1968-03-19 | Sperry Rand Corp | Method of electrically interconnecting conductors |
| FR1483574A (enFirst) * | 1965-06-24 | 1967-09-06 | ||
| US3368114A (en) * | 1965-07-06 | 1968-02-06 | Radiation Inc | Microelectronic circuit packages with improved connection structure |
| US3460328A (en) | 1965-10-06 | 1969-08-12 | William S Lee | Fruit picker |
| US3445770A (en) * | 1965-12-27 | 1969-05-20 | Philco Ford Corp | Microelectronic test probe with defect marker access |
| US3390308A (en) * | 1966-03-31 | 1968-06-25 | Itt | Multiple chip integrated circuit assembly |
| US3426252A (en) * | 1966-05-03 | 1969-02-04 | Bell Telephone Labor Inc | Semiconductive device including beam leads |
| US3517438A (en) * | 1966-05-12 | 1970-06-30 | Ibm | Method of packaging a circuit module and joining same to a circuit substrate |
| DE1539692A1 (de) * | 1966-06-23 | 1969-10-16 | Blume & Redecker Gmbh | Umklebevorrichtung fuer Spulen |
| US3460238A (en) * | 1967-04-20 | 1969-08-12 | Motorola Inc | Wire severing in wire bonding machines |
| US3490141A (en) * | 1967-10-02 | 1970-01-20 | Motorola Inc | High voltage rectifier stack and method for making same |
| US3495170A (en) * | 1967-11-24 | 1970-02-10 | James R Biard | Method for the indirect measurement of resistivities and impurity concentrations in a semiconductor body including an epitaxial film |
| US3519890A (en) * | 1968-04-01 | 1970-07-07 | North American Rockwell | Low stress lead |
| US3509270A (en) * | 1968-04-08 | 1970-04-28 | Ney Co J M | Interconnection for printed circuits and method of making same |
| FR1569990A (enFirst) * | 1968-04-23 | 1969-06-06 | ||
| NL6907704A (enFirst) * | 1968-05-30 | 1969-12-02 | ||
| US3567846A (en) * | 1968-05-31 | 1971-03-02 | Gen Cable Corp | Metallic sheathed cables with roam cellular polyolefin insulation and method of making |
| US3590480A (en) * | 1968-10-03 | 1971-07-06 | Theodore H Johnson Jr | Method of manufacturing a pulse transformer package |
| GB1292459A (en) * | 1968-12-09 | 1972-10-11 | Ericsson Telefon Ab L M | Wire |
| US3555477A (en) * | 1969-01-21 | 1971-01-12 | Standard Int Corp | Electrical inductor and method of making the same |
| US3826984A (en) * | 1969-02-28 | 1974-07-30 | Licentia Gmbh | Measuring device for the dynamic measurement of semiconductor parameters and method of making such a device |
| US3673681A (en) * | 1969-04-01 | 1972-07-04 | Inforex | Electrical circuit board wiring |
| US3591839A (en) * | 1969-08-27 | 1971-07-06 | Siliconix Inc | Micro-electronic circuit with novel hermetic sealing structure and method of manufacture |
| US3569610A (en) * | 1969-10-15 | 1971-03-09 | Gen Cable Corp | Ethylene-propylene rubber insulated cable with cross-linked polyethylene strand shielding |
| US3623127A (en) * | 1969-11-03 | 1971-11-23 | Ashley C Glenn | Electrical printed circuit switching device |
| JPS4919634B1 (enFirst) * | 1969-12-29 | 1974-05-18 | ||
| US3676776A (en) * | 1970-01-19 | 1972-07-11 | Siemens Ag | Testing probe construction |
| US3616532A (en) * | 1970-02-02 | 1971-11-02 | Sperry Rand Corp | Multilayer printed circuit electrical interconnection device |
| US3662454A (en) * | 1970-03-18 | 1972-05-16 | Rca Corp | Method of bonding metals together |
| DE2119567C2 (de) * | 1970-05-05 | 1983-07-14 | International Computers Ltd., London | Elektrische Verbindungsvorrichtung und Verfahren zu ihrer Herstellung |
| US3663920A (en) * | 1970-07-27 | 1972-05-16 | Burndy Corp | Mounting for integrated circuits |
| US3680037A (en) * | 1970-11-05 | 1972-07-25 | Tech Wire Prod Inc | Electrical interconnector |
| US3844909A (en) * | 1970-11-12 | 1974-10-29 | Gen Electric | Magnetic film plated wire and substrates therefor |
| US3753665A (en) * | 1970-11-12 | 1973-08-21 | Gen Electric | Magnetic film plated wire |
| US3779804A (en) | 1970-12-30 | 1973-12-18 | Nat Lead Co | Electrodes for ceramic bodies |
| DE2104207C3 (de) * | 1971-01-29 | 1974-04-11 | Licentia Patent-Verwaltungs-Gmbh, 6000 Frankfurt | Verfahren zum Verbinden eines Kontaktierungsdrahtes |
| US3724068A (en) * | 1971-02-25 | 1973-04-03 | Du Pont | Semiconductor chip packaging apparatus and method |
| US3734386A (en) * | 1971-06-30 | 1973-05-22 | Ibm | Wiring apparatus with wire path forming means |
| US3747198A (en) * | 1971-08-19 | 1973-07-24 | Gen Electric | Tailless wedge bonding of gold wire to palladium-silver cermets |
| US3719981A (en) * | 1971-11-24 | 1973-03-13 | Rca Corp | Method of joining solder balls to solder bumps |
| US3714384A (en) * | 1971-11-24 | 1973-01-30 | Exxon Production Research Co | Subsea electric connector system and procedure for use |
| CA954635A (en) * | 1972-06-06 | 1974-09-10 | Microsystems International Limited | Mounting leads and method of fabrication |
| US3849872A (en) * | 1972-10-24 | 1974-11-26 | Ibm | Contacting integrated circuit chip terminal through the wafer kerf |
| US3811186A (en) * | 1972-12-11 | 1974-05-21 | Ibm | Method of aligning and attaching circuit devices on a substrate |
| US3806801A (en) * | 1972-12-26 | 1974-04-23 | Ibm | Probe contactor having buckling beam probes |
| US3842189A (en) * | 1973-01-08 | 1974-10-15 | Rca Corp | Contact array and method of making the same |
| US3795884A (en) * | 1973-03-06 | 1974-03-05 | Amp Inc | Electrical connector formed from coil spring |
| US3849728A (en) * | 1973-08-21 | 1974-11-19 | Wentworth Labor Inc | Fixed point probe card and an assembly and repair fixture therefor |
| US3924918A (en) * | 1973-10-09 | 1975-12-09 | Du Pont | Daughter board contact |
| US4038599A (en) * | 1974-12-30 | 1977-07-26 | International Business Machines Corporation | High density wafer contacting and test system |
| JPS5626446Y2 (enFirst) | 1975-08-22 | 1981-06-23 | ||
| US3982811A (en) * | 1975-09-22 | 1976-09-28 | Rockwell International Corporation | Electrical terminal |
| US4085502A (en) | 1977-04-12 | 1978-04-25 | Advanced Circuit Technology, Inc. | Jumper cable |
| US4067104A (en) * | 1977-02-24 | 1978-01-10 | Rockwell International Corporation | Method of fabricating an array of flexible metallic interconnects for coupling microelectronics components |
| EP0002166A3 (fr) | 1977-11-18 | 1979-08-08 | International Business Machines Corporation | Support pour microplaquettes de circuits intégrés, et son procédé de fabrication |
| JPS54146581U (enFirst) | 1978-03-31 | 1979-10-12 | ||
| JPS54146581A (en) | 1978-05-09 | 1979-11-15 | Mitsubishi Electric Corp | Electric chracteristic measuring device for semiconductor chip |
| JPS5555985U (enFirst) * | 1978-10-12 | 1980-04-16 | ||
| JPS568081U (enFirst) * | 1979-06-29 | 1981-01-23 | ||
| JPS5626446A (en) | 1979-08-09 | 1981-03-14 | Nec Corp | Semiconductor device |
| DE2936248A1 (de) | 1979-09-07 | 1981-03-19 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zum betrieb eines ringinterferometers als rotationssensor |
| US4332341A (en) * | 1979-12-26 | 1982-06-01 | Bell Telephone Laboratories, Incorporated | Fabrication of circuit packages using solid phase solder bonding |
| SU1003396A1 (ru) | 1980-02-08 | 1983-03-07 | Институт коллоидной химии и химии воды АН УССР | Электрический соединитель |
| US4523144A (en) * | 1980-05-27 | 1985-06-11 | Japan Electronic Materials Corp. | Complex probe card for testing a semiconductor wafer |
| JPS5728337A (en) | 1980-07-28 | 1982-02-16 | Hitachi Ltd | Connecting constructin of semiconductor element |
| US4303291A (en) * | 1980-11-24 | 1981-12-01 | Western Electric Company, Inc. | Method of seating connector terminals on circuit board contact pads |
| US4418857A (en) * | 1980-12-31 | 1983-12-06 | International Business Machines Corp. | High melting point process for Au:Sn:80:20 brazing alloy for chip carriers |
| US4385341A (en) * | 1981-03-19 | 1983-05-24 | Northern Telecom Limited | Strain relief member for flat flexible cables |
| DE3176140D1 (en) * | 1981-10-30 | 1987-05-27 | Ibm Deutschland | Contact device for the detachable connection of electrical components |
| US4532152A (en) * | 1982-03-05 | 1985-07-30 | Elarde Vito D | Fabrication of a printed circuit board with metal-filled channels |
| JPS59195856A (ja) * | 1983-04-20 | 1984-11-07 | Fujitsu Ltd | 半導体装置及びその製造方法 |
| US4664309A (en) * | 1983-06-30 | 1987-05-12 | Raychem Corporation | Chip mounting device |
| US4705205A (en) * | 1983-06-30 | 1987-11-10 | Raychem Corporation | Chip carrier mounting device |
| US4553192A (en) * | 1983-08-25 | 1985-11-12 | International Business Machines Corporation | High density planar interconnected integrated circuit package |
| JPS6089494A (ja) | 1983-10-20 | 1985-05-20 | Shimadzu Corp | Dνa等合成装置 |
| US4615573A (en) * | 1983-10-28 | 1986-10-07 | Honeywell Inc. | Spring finger interconnect for IC chip carrier |
| US4545610A (en) * | 1983-11-25 | 1985-10-08 | International Business Machines Corporation | Method for forming elongated solder connections between a semiconductor device and a supporting substrate |
| US4751199A (en) * | 1983-12-06 | 1988-06-14 | Fairchild Semiconductor Corporation | Process of forming a compliant lead frame for array-type semiconductor packages |
| JPS60150657U (ja) | 1984-03-14 | 1985-10-07 | シチズン時計株式会社 | フロツピデイスクドライブにおけるデイスク検出機構 |
| US4667219A (en) * | 1984-04-27 | 1987-05-19 | Trilogy Computer Development Partners, Ltd. | Semiconductor chip interface |
| US4548451A (en) | 1984-04-27 | 1985-10-22 | International Business Machines Corporation | Pinless connector interposer and method for making the same |
| US4697143A (en) * | 1984-04-30 | 1987-09-29 | Cascade Microtech, Inc. | Wafer probe |
| DK291184D0 (da) | 1984-06-13 | 1984-06-13 | Boeegh Petersen Allan | Fremgangsmaade og indretning til test af kredsloebsplader |
| DE3577371D1 (de) | 1984-07-27 | 1990-05-31 | Toshiba Kawasaki Kk | Apparat zum herstellen einer halbleiteranordnung. |
| DE3536908A1 (de) * | 1984-10-18 | 1986-04-24 | Sanyo Electric Co., Ltd., Moriguchi, Osaka | Induktivitaetselement und verfahren zur herstellung desselben |
| DE3442131A1 (de) * | 1984-11-17 | 1986-05-22 | Messerschmitt-Bölkow-Blohm GmbH, 8012 Ottobrunn | Verfahren zum einkapseln von mikroelektronischen halbleiter- und schichtschaltungen |
| US4634199A (en) | 1985-01-22 | 1987-01-06 | Itt Corporation | Connector assembly for making multiple connections in a thin space |
| JPS61170054U (enFirst) | 1985-04-11 | 1986-10-22 | ||
| JPH0763083B2 (ja) | 1985-04-22 | 1995-07-05 | 日本特殊陶業株式会社 | 端子接続構造およびその接続方法 |
| US4642889A (en) * | 1985-04-29 | 1987-02-17 | Amp Incorporated | Compliant interconnection and method therefor |
| US4724383A (en) | 1985-05-03 | 1988-02-09 | Testsystems, Inc. | PC board test fixture |
| US4757256A (en) | 1985-05-10 | 1988-07-12 | Micro-Probe, Inc. | High density probe card |
| JPS61287155A (ja) * | 1985-06-14 | 1986-12-17 | Hitachi Ltd | 半導体装置及び半導体装置の製造方法 |
| JPS61287254A (ja) | 1985-06-14 | 1986-12-17 | Hitachi Device Eng Co Ltd | 半導体装置 |
| US4780836A (en) * | 1985-08-14 | 1988-10-25 | Kabushiki Kaisha Toshiba | Method of testing semiconductor devices using a probe card |
| US4746857A (en) * | 1985-09-13 | 1988-05-24 | Danippon Screen Mfg. Co. Ltd. | Probing apparatus for measuring electrical characteristics of semiconductor device formed on wafer |
| US5829128A (en) * | 1993-11-16 | 1998-11-03 | Formfactor, Inc. | Method of mounting resilient contact structures to semiconductor devices |
| US5917707A (en) * | 1993-11-16 | 1999-06-29 | Formfactor, Inc. | Flexible contact structure with an electrically conductive shell |
| US5476211A (en) | 1993-11-16 | 1995-12-19 | Form Factor, Inc. | Method of manufacturing electrical contacts, using a sacrificial member |
| AT385932B (de) | 1985-12-13 | 1988-06-10 | Neumayer Karl | Band- bzw. drahtfoermiges material |
| US4727319A (en) * | 1985-12-24 | 1988-02-23 | Hughes Aircraft Company | Apparatus for on-wafer testing of electrical circuits |
| US4793814A (en) * | 1986-07-21 | 1988-12-27 | Rogers Corporation | Electrical circuit board interconnect |
| FR2594603B1 (fr) * | 1986-02-14 | 1988-10-14 | Radiotechnique Compelec | Connecteur pour bus informatique |
| JPS62165994U (enFirst) | 1986-04-11 | 1987-10-21 | ||
| JPS62253807A (ja) | 1986-04-23 | 1987-11-05 | ショーボンド建設株式会社 | 床版下面のコンクリ−ト落下防護方法 |
| US4878611A (en) * | 1986-05-30 | 1989-11-07 | American Telephone And Telegraph Company, At&T Bell Laboratories | Process for controlling solder joint geometry when surface mounting a leadless integrated circuit package on a substrate |
| US4728751A (en) * | 1986-10-06 | 1988-03-01 | International Business Machines Corporation | Flexible electrical connection and method of making same |
| US4777564A (en) * | 1986-10-16 | 1988-10-11 | Motorola, Inc. | Leadform for use with surface mounted components |
| US4764723A (en) * | 1986-11-10 | 1988-08-16 | Cascade Microtech, Inc. | Wafer probe |
| US4764848A (en) * | 1986-11-24 | 1988-08-16 | International Business Machines Corporation | Surface mounted array strain relief device |
| US4955523A (en) * | 1986-12-17 | 1990-09-11 | Raychem Corporation | Interconnection of electronic components |
| US5189507A (en) * | 1986-12-17 | 1993-02-23 | Raychem Corporation | Interconnection of electronic components |
| JP2533511B2 (ja) * | 1987-01-19 | 1996-09-11 | 株式会社日立製作所 | 電子部品の接続構造とその製造方法 |
| US5086337A (en) * | 1987-01-19 | 1992-02-04 | Hitachi, Ltd. | Connecting structure of electronic part and electronic device using the structure |
| US4983907A (en) * | 1987-05-14 | 1991-01-08 | Intel Corporation | Driven guard probe card |
| US5045975A (en) * | 1987-05-21 | 1991-09-03 | Cray Computer Corporation | Three dimensionally interconnected module assembly |
| US5195237A (en) * | 1987-05-21 | 1993-03-23 | Cray Computer Corporation | Flying leads for integrated circuits |
| DE3856562T2 (de) * | 1987-07-03 | 2004-08-05 | Sumitomo Electric Industries, Ltd. | Verbindungsstruktur zwischen Bauelementen für Halbleiterapparat |
| US5198752A (en) * | 1987-09-02 | 1993-03-30 | Tokyo Electron Limited | Electric probing-test machine having a cooling system |
| US4870356A (en) * | 1987-09-30 | 1989-09-26 | Digital Equipment Corporation | Multi-component test fixture |
| US5014111A (en) * | 1987-12-08 | 1991-05-07 | Matsushita Electric Industrial Co., Ltd. | Electrical contact bump and a package provided with the same |
| US4918032A (en) | 1988-04-13 | 1990-04-17 | General Motors Corporation | Method for fabricating three-dimensional microstructures and a high-sensitivity integrated vibration sensor using such microstructures |
| US5103557A (en) | 1988-05-16 | 1992-04-14 | Leedy Glenn J | Making and testing an integrated circuit using high density probe points |
| US4899099A (en) * | 1988-05-19 | 1990-02-06 | Augat Inc. | Flex dot wafer probe |
| JPH01313969A (ja) * | 1988-06-13 | 1989-12-19 | Hitachi Ltd | 半導体装置 |
| US5059143A (en) * | 1988-09-08 | 1991-10-22 | Amp Incorporated | Connector contact |
| US4899107A (en) * | 1988-09-30 | 1990-02-06 | Micron Technology, Inc. | Discrete die burn-in for nonpackaged die |
| US4998062A (en) * | 1988-10-25 | 1991-03-05 | Tokyo Electron Limited | Probe device having micro-strip line structure |
| DE3838413A1 (de) | 1988-11-12 | 1990-05-17 | Mania Gmbh | Adapter fuer elektronische pruefvorrichtungen fuer leiterplatten und dergl. |
| US4996629A (en) * | 1988-11-14 | 1991-02-26 | International Business Machines Corporation | Circuit board with self-supporting connection between sides |
| JP3151203B2 (ja) * | 1988-11-23 | 2001-04-03 | テキサス インスツルメンツ インコーポレイテツド | 集積回路の自己検査装置 |
| US5037023A (en) * | 1988-11-28 | 1991-08-06 | Hitachi, Ltd. | Method and apparatus for wire bonding |
| JPH07114227B2 (ja) * | 1989-01-07 | 1995-12-06 | 三菱電機株式会社 | ウエハ試験用探触板 |
| US5214375A (en) * | 1989-02-06 | 1993-05-25 | Giga Probe, Inc. | Multi-point probe assembly for testing electronic device |
| US4985676A (en) * | 1989-02-17 | 1991-01-15 | Tokyo Electron Limited | Method and apparatus of performing probing test for electrically and sequentially testing semiconductor device patterns |
| FR2643753A1 (fr) | 1989-02-28 | 1990-08-31 | Commissariat Energie Atomique | Procede d'interconnexion de composants electriques au moyen d'elements conducteurs, deformables et sensiblement spheriques |
| JPH02237047A (ja) * | 1989-03-09 | 1990-09-19 | Mitsubishi Electric Corp | 半導体試験装置 |
| DE69016315T2 (de) | 1989-03-28 | 1995-08-17 | Nippon Steel Corp | Harzbeschichteter verbindungsdraht, verfahren zur herstellung und halbleiteranordnung. |
| US5073117A (en) * | 1989-03-30 | 1991-12-17 | Texas Instruments Incorporated | Flip-chip test socket adaptor and method |
| JP2810101B2 (ja) | 1989-04-17 | 1998-10-15 | 日本エー・エム・ピー株式会社 | 電気ピンおよびその製造方法 |
| US4914814A (en) * | 1989-05-04 | 1990-04-10 | International Business Machines Corporation | Process of fabricating a circuit package |
| JP2598129B2 (ja) * | 1989-05-18 | 1997-04-09 | 三菱電機株式会社 | 半導体装置 |
| US5060843A (en) | 1989-06-07 | 1991-10-29 | Nec Corporation | Process of forming bump on electrode of semiconductor chip and apparatus used therefor |
| US5007872A (en) * | 1989-06-12 | 1991-04-16 | Babcock Display Products, Inc. | Screened interconnect system |
| US5366380A (en) | 1989-06-13 | 1994-11-22 | General Datacomm, Inc. | Spring biased tapered contact elements for electrical connectors and integrated circuit packages |
| US5349495A (en) | 1989-06-23 | 1994-09-20 | Vlsi Technology, Inc. | System for securing and electrically connecting a semiconductor chip to a substrate |
| US5047711A (en) * | 1989-08-23 | 1991-09-10 | Silicon Connections Corporation | Wafer-level burn-in testing of integrated circuits |
| US5055778A (en) * | 1989-10-02 | 1991-10-08 | Nihon Denshizairyo Kabushiki Kaisha | Probe card in which contact pressure and relative position of each probe end are correctly maintained |
| US5156983A (en) * | 1989-10-26 | 1992-10-20 | Digtial Equipment Corporation | Method of manufacturing tape automated bonding semiconductor package |
| US4998885A (en) | 1989-10-27 | 1991-03-12 | International Business Machines Corporation | Elastomeric area array interposer |
| JPH03142847A (ja) | 1989-10-30 | 1991-06-18 | Hitachi Ltd | 半導体集積回路装置 |
| US5399982A (en) | 1989-11-13 | 1995-03-21 | Mania Gmbh & Co. | Printed circuit board testing device with foil adapter |
| CA2004436C (en) * | 1989-12-01 | 1999-06-29 | Alain Comeau | Test chip for use in semiconductor fault analysis |
| US5095187A (en) * | 1989-12-20 | 1992-03-10 | Raychem Corporation | Weakening wire supplied through a wire bonder |
| US5007576A (en) | 1989-12-26 | 1991-04-16 | Hughes Aircraft Company | Testable ribbon bonding method and wedge bonding tool for microcircuit device fabrication |
| JPH03212006A (ja) * | 1990-01-17 | 1991-09-17 | Sony Corp | 高周波回路用パッケージ |
| US4989069A (en) * | 1990-01-29 | 1991-01-29 | Motorola, Inc. | Semiconductor package having leads that break-away from supports |
| US5066907A (en) | 1990-02-06 | 1991-11-19 | Cerprobe Corporation | Probe system for device and circuit testing |
| US5123850A (en) | 1990-04-06 | 1992-06-23 | Texas Instruments Incorporated | Non-destructive burn-in test socket for integrated circuit die |
| US5071359A (en) | 1990-04-27 | 1991-12-10 | Rogers Corporation | Array connector |
| US5070297A (en) * | 1990-06-04 | 1991-12-03 | Texas Instruments Incorporated | Full wafer integrated circuit testing device |
| US5130779A (en) * | 1990-06-19 | 1992-07-14 | International Business Machines Corporation | Solder mass having conductive encapsulating arrangement |
| JP3068163B2 (ja) | 1990-07-18 | 2000-07-24 | 株式会社東芝 | スペースダイバーシティ制御装置 |
| US5187020A (en) * | 1990-07-31 | 1993-02-16 | Texas Instruments Incorporated | Compliant contact pad |
| JP3208734B2 (ja) | 1990-08-20 | 2001-09-17 | 東京エレクトロン株式会社 | プローブ装置 |
| US5140405A (en) * | 1990-08-30 | 1992-08-18 | Micron Technology, Inc. | Semiconductor assembly utilizing elastomeric single axis conductive interconnect |
| US5136367A (en) | 1990-08-31 | 1992-08-04 | Texas Instruments Incorporated | Low cost erasable programmable read only memory package |
| JPH04139850A (ja) | 1990-10-01 | 1992-05-13 | Matsushita Electric Ind Co Ltd | 半導体集積回路装置及びその検査方法 |
| US5166774A (en) * | 1990-10-05 | 1992-11-24 | Motorola, Inc. | Selectively releasing conductive runner and substrate assembly having non-planar areas |
| US5325052A (en) * | 1990-11-30 | 1994-06-28 | Tokyo Electron Yamanashi Limited | Probe apparatus |
| US5154341A (en) * | 1990-12-06 | 1992-10-13 | Motorola Inc. | Noncollapsing multisolder interconnection |
| US5163834A (en) * | 1990-12-17 | 1992-11-17 | International Business Machines Corporation | High density connector |
| EP0494782B1 (en) | 1991-01-11 | 1997-04-23 | Texas Instruments Incorporated | Wafer burn-in and test system and method of making the same |
| JPH04240570A (ja) | 1991-01-24 | 1992-08-27 | Shimadzu Corp | マイクロ・プローブ・ボード |
| US5097100A (en) * | 1991-01-25 | 1992-03-17 | Sundstrand Data Control, Inc. | Noble metal plated wire and terminal assembly, and method of making the same |
| US5148968A (en) * | 1991-02-11 | 1992-09-22 | Motorola, Inc. | Solder bump stretch device |
| US5157325A (en) | 1991-02-15 | 1992-10-20 | Compaq Computer Corporation | Compact, wireless apparatus for electrically testing printed circuit boards |
| JPH04264758A (ja) | 1991-02-20 | 1992-09-21 | Nec Corp | 半導体チップキャリア |
| DE4109908C2 (de) * | 1991-03-26 | 1994-05-05 | Erich Reitinger | Anordnung zur Prüfung von Halbleiter-Wafern |
| KR920022482A (ko) * | 1991-05-09 | 1992-12-19 | 가나이 쯔도무 | 전자부품 탑재모듈 |
| US5559444A (en) | 1991-06-04 | 1996-09-24 | Micron Technology, Inc. | Method and apparatus for testing unpackaged semiconductor dice |
| US5296744A (en) * | 1991-07-12 | 1994-03-22 | Vlsi Technology, Inc. | Lead frame assembly and method for wiring same |
| US5173055A (en) * | 1991-08-08 | 1992-12-22 | Amp Incorporated | Area array connector |
| FR2680284B1 (fr) | 1991-08-09 | 1993-12-03 | Thomson Csf | Dispositif de connexion a tres faible pas et procede de fabrication. |
| JPH0548000A (ja) | 1991-08-13 | 1993-02-26 | Fujitsu Ltd | 半導体装置 |
| WO1993004375A1 (en) | 1991-08-23 | 1993-03-04 | Nchip, Inc. | Burn-in technologies for unpackaged integrated circuits |
| JP2967621B2 (ja) | 1991-08-27 | 1999-10-25 | 日本電気株式会社 | 半導体装置用パッケージの製造方法 |
| JP2511621B2 (ja) | 1991-09-03 | 1996-07-03 | エイ・ティ・アンド・ティ・コーポレーション | ウェ―ハ検査装置 |
| US5139427A (en) | 1991-09-23 | 1992-08-18 | Amp Incorporated | Planar array connector and flexible contact therefor |
| JPH0754868B2 (ja) * | 1991-09-30 | 1995-06-07 | 松下電器産業株式会社 | 高周波モジュール基板 |
| AU661867B2 (en) * | 1991-09-30 | 1995-08-10 | General Dynamics Information Systems, Inc. | Plated compliant lead |
| EP0540319B1 (en) | 1991-10-29 | 2000-02-09 | Sumitomo Wiring Systems, Ltd. | A wire harness |
| JPH05129357A (ja) | 1991-11-01 | 1993-05-25 | Tanaka Denshi Kogyo Kk | ボンデイング用ワイヤ |
| US5391984A (en) | 1991-11-01 | 1995-02-21 | Sgs-Thomson Microelectronics, Inc. | Method and apparatus for testing integrated circuit devices |
| US5199889A (en) * | 1991-11-12 | 1993-04-06 | Jem Tech | Leadless grid array socket |
| US5350947A (en) | 1991-11-12 | 1994-09-27 | Nec Corporation | Film carrier semiconductor device |
| EP0544957B1 (en) | 1991-12-06 | 1995-05-17 | Sigmatech Co. Ltd. | Apparatus for inspecting internal circuit of semiconductor device |
| US5230632A (en) * | 1991-12-19 | 1993-07-27 | International Business Machines Corporation | Dual element electrical contact and connector assembly utilizing same |
| JP2606554Y2 (ja) | 1992-01-17 | 2000-11-27 | 株式会社東京精密 | プロービング装置 |
| US5279975A (en) | 1992-02-07 | 1994-01-18 | Micron Technology, Inc. | Method of testing individual dies on semiconductor wafers prior to singulation |
| US5299939A (en) * | 1992-03-05 | 1994-04-05 | International Business Machines Corporation | Spring array connector |
| US5440241A (en) | 1992-03-06 | 1995-08-08 | Micron Technology, Inc. | Method for testing, burning-in, and manufacturing wafer scale integrated circuits and a packaged wafer assembly produced thereby |
| US5254939A (en) | 1992-03-20 | 1993-10-19 | Xandex, Inc. | Probe card system |
| US5424651A (en) | 1992-03-27 | 1995-06-13 | Green; Robert S. | Fixture for burn-in testing of semiconductor wafers, and a semiconductor wafer |
| US5247250A (en) * | 1992-03-27 | 1993-09-21 | Minnesota Mining And Manufacturing Company | Integrated circuit test socket |
| US5457400A (en) | 1992-04-10 | 1995-10-10 | Micron Technology, Inc. | Semiconductor array having built-in test circuit for wafer level testing |
| US5266889A (en) * | 1992-05-29 | 1993-11-30 | Cascade Microtech, Inc. | Wafer probe station with integrated environment control enclosure |
| US5479109A (en) | 1992-06-03 | 1995-12-26 | Trw Inc. | Testing device for integrated circuits on wafer |
| US5336992A (en) | 1992-06-03 | 1994-08-09 | Trw Inc. | On-wafer integrated circuit electrical testing |
| JPH05340964A (ja) | 1992-06-05 | 1993-12-24 | Mitsubishi Electric Corp | ウエハ及びチップの試験装置 |
| US5345170A (en) | 1992-06-11 | 1994-09-06 | Cascade Microtech, Inc. | Wafer probe station having integrated guarding, Kelvin connection and shielding systems |
| US5228861A (en) | 1992-06-12 | 1993-07-20 | Amp Incorporated | High density electrical connector system |
| US5397967A (en) | 1992-06-30 | 1995-03-14 | Sgs-Thomson Microelectronics, Inc. | Slew rate circuit for high side driver for a polyphase DC motor |
| US5442282A (en) | 1992-07-02 | 1995-08-15 | Lsi Logic Corporation | Testing and exercising individual, unsingulated dies on a wafer |
| US5915752A (en) | 1992-07-24 | 1999-06-29 | Tessera, Inc. | Method of making connections to a semiconductor chip assembly |
| JP3135378B2 (ja) | 1992-08-10 | 2001-02-13 | ローム株式会社 | 半導体試験装置 |
| US5363038A (en) | 1992-08-12 | 1994-11-08 | Fujitsu Limited | Method and apparatus for testing an unpopulated chip carrier using a module test card |
| KR970010656B1 (ko) | 1992-09-01 | 1997-06-30 | 마쯔시다 덴기 산교 가부시끼가이샤 | 반도체 테스트 장치, 반도체 테스트 회로칩 및 프로브 카드 |
| US5731633A (en) | 1992-09-16 | 1998-03-24 | Gary W. Hamilton | Thin multichip module |
| JPH06230086A (ja) | 1992-09-22 | 1994-08-19 | Nec Corp | Lsiのテスト回路 |
| US5297967A (en) * | 1992-10-13 | 1994-03-29 | International Business Machines Corporation | Electrical interconnector with helical contacting portion and assembly using same |
| US5371654A (en) | 1992-10-19 | 1994-12-06 | International Business Machines Corporation | Three dimensional high performance interconnection package |
| US5479108A (en) | 1992-11-25 | 1995-12-26 | David Cheng | Method and apparatus for handling wafers |
| US5334804A (en) * | 1992-11-17 | 1994-08-02 | Fujitsu Limited | Wire interconnect structures for connecting an integrated circuit to a substrate |
| US5656830A (en) | 1992-12-10 | 1997-08-12 | International Business Machines Corp. | Integrated circuit chip composite having a parylene coating |
| US5389743A (en) | 1992-12-21 | 1995-02-14 | Hughes Aircraft Company | Rivet design for enhanced copper thick-film I/O pad adhesion |
| US5386344A (en) | 1993-01-26 | 1995-01-31 | International Business Machines Corporation | Flex circuit card elastomeric cable connector assembly |
| CA2110472C (en) | 1993-03-01 | 1999-08-10 | Anilkumar Chinuprasad Bhatt | Method and apparatus for in-situ testing of integrated circuit chips |
| EP0615131A1 (en) | 1993-03-10 | 1994-09-14 | Co-Operative Facility For Aging Tester Development | Prober for semiconductor integrated circuit element wafer |
| JPH0792479B2 (ja) | 1993-03-18 | 1995-10-09 | 東京エレクトロン株式会社 | プローブ装置の平行度調整方法 |
| US5303938A (en) * | 1993-03-25 | 1994-04-19 | Miller Donald C | Kelvin chuck apparatus and method of manufacture |
| US5414298A (en) | 1993-03-26 | 1995-05-09 | Tessera, Inc. | Semiconductor chip assemblies and components with pressure contact |
| JP3115155B2 (ja) | 1993-05-28 | 2000-12-04 | 株式会社東芝 | 半導体装置およびその製造方法 |
| US5510724A (en) | 1993-05-31 | 1996-04-23 | Tokyo Electron Limited | Probe apparatus and burn-in apparatus |
| US5559446A (en) | 1993-07-19 | 1996-09-24 | Tokyo Electron Kabushiki Kaisha | Probing method and device |
| US5550482A (en) | 1993-07-20 | 1996-08-27 | Tokyo Electron Kabushiki Kaisha | Probe device |
| DE4325235C2 (de) | 1993-07-28 | 1995-08-31 | Junker Filter Gmbh | Filterelement für ein Kammer-, Membranfilter oder dergleichen sowie Verfahren zu seiner Herstellung |
| US5621263A (en) | 1993-08-09 | 1997-04-15 | Murata Manufacturing Co., Ltd. | Piezoelectric resonance component |
| US5570032A (en) | 1993-08-17 | 1996-10-29 | Micron Technology, Inc. | Wafer scale burn-in apparatus and process |
| JPH07115113A (ja) | 1993-08-25 | 1995-05-02 | Nec Corp | 半導体ウエハの試験装置および試験方法 |
| US5488292A (en) | 1993-10-04 | 1996-01-30 | Tokyo Seimitsu Co., Ltd. | Wafer inspecting system |
| US5410162A (en) | 1993-10-15 | 1995-04-25 | Texas Instruments Incorporated | Apparatus for and method of rapid testing of semiconductor components at elevated temperature |
| US6023103A (en) * | 1994-11-15 | 2000-02-08 | Formfactor, Inc. | Chip-scale carrier for semiconductor devices including mounted spring contacts |
| US5832601A (en) * | 1993-11-16 | 1998-11-10 | Form Factor, Inc. | Method of making temporary connections between electronic components |
| US6246247B1 (en) * | 1994-11-15 | 2001-06-12 | Formfactor, Inc. | Probe card assembly and kit, and methods of using same |
| US7073254B2 (en) * | 1993-11-16 | 2006-07-11 | Formfactor, Inc. | Method for mounting a plurality of spring contact elements |
| US6336269B1 (en) * | 1993-11-16 | 2002-01-08 | Benjamin N. Eldridge | Method of fabricating an interconnection element |
| US6835898B2 (en) | 1993-11-16 | 2004-12-28 | Formfactor, Inc. | Electrical contact structures formed by configuring a flexible wire to have a springable shape and overcoating the wire with at least one layer of a resilient conductive material, methods of mounting the contact structures to electronic components, and applications for employing the contact structures |
| US6624648B2 (en) * | 1993-11-16 | 2003-09-23 | Formfactor, Inc. | Probe card assembly |
| US5983493A (en) * | 1993-11-16 | 1999-11-16 | Formfactor, Inc. | Method of temporarily, then permanently, connecting to a semiconductor device |
| US5601740A (en) | 1993-11-16 | 1997-02-11 | Formfactor, Inc. | Method and apparatus for wirebonding, for severing bond wires, and for forming balls on the ends of bond wires |
| JP2967798B2 (ja) | 1993-12-16 | 1999-10-25 | 株式会社東京精密 | ウエハプローバ |
| US5585737A (en) | 1993-12-27 | 1996-12-17 | Tokyo Electron Kabushiki Kaisha | Semiconductor wafer probing method including arranging index regions that include all chips and minimize the occurrence of non-contact between a chip and a probe needle during chip verification |
| US5455390A (en) | 1994-02-01 | 1995-10-03 | Tessera, Inc. | Microelectronics unit mounting with multiple lead bonding |
| JP3256367B2 (ja) | 1994-03-10 | 2002-02-12 | 新日本製鐵株式会社 | 樹脂被覆絶縁ボンディングワイヤ |
| US5534784A (en) | 1994-05-02 | 1996-07-09 | Motorola, Inc. | Method for probing a semiconductor wafer |
| JP2565660B2 (ja) * | 1994-05-31 | 1996-12-18 | バンドー化学株式会社 | 繊維補強弾性体及びそれを用いた伝動ベルト |
| US5518964A (en) | 1994-07-07 | 1996-05-21 | Tessera, Inc. | Microelectronic mounting with multiple lead deformation and bonding |
| US5590460A (en) | 1994-07-19 | 1997-01-07 | Tessera, Inc. | Method of making multilayer circuit |
| KR960014952A (ko) | 1994-10-14 | 1996-05-22 | 가즈오 가네코 | 반도체 웨이퍼의 번인 및 테스트방법과 그것에 사용되는 번인보드 |
| JP2632136B2 (ja) | 1994-10-17 | 1997-07-23 | 日本電子材料株式会社 | 高温測定用プローブカード |
| US5495667A (en) | 1994-11-07 | 1996-03-05 | Micron Technology, Inc. | Method for forming contact pins for semiconductor dice and interconnects |
| US6727579B1 (en) * | 1994-11-16 | 2004-04-27 | Formfactor, Inc. | Electrical contact structures formed by configuring a flexible wire to have a springable shape and overcoating the wire with at least one layer of a resilient conductive material, methods of mounting the contact structures to electronic components, and applications for employing the contact structures |
| US5557501A (en) | 1994-11-18 | 1996-09-17 | Tessera, Inc. | Compliant thermal connectors and assemblies incorporating the same |
| WO1996019829A1 (en) | 1994-12-22 | 1996-06-27 | Pace Benedict G | Device for superheating steam |
| US5613861A (en) | 1995-06-07 | 1997-03-25 | Xerox Corporation | Photolithographically patterned spring contact |
| KR0156334B1 (ko) | 1995-10-14 | 1998-10-15 | 김광호 | 차폐 본딩 와이어를 구비하는 고주파, 고밀도용 반도체 칩 패키지 |
| JP3809727B2 (ja) * | 1998-06-17 | 2006-08-16 | 富士ゼロックス株式会社 | 情報処理システム、回路情報管理方法および回路情報記憶装置 |
| JP3142847B2 (ja) | 2000-01-01 | 2001-03-07 | 株式会社ソフィア | パチンコ遊技機 |
-
1993
- 1993-11-16 US US08/152,812 patent/US5476211A/en not_active Expired - Lifetime
-
1995
- 1995-06-01 US US08/457,479 patent/US6049976A/en not_active Expired - Fee Related
- 1995-07-10 TW TW084104698A patent/TW275706B/zh active
- 1995-12-11 US US08/570,230 patent/US5852871A/en not_active Expired - Fee Related
-
1999
- 1999-02-05 US US09/245,779 patent/US6215670B1/en not_active Expired - Lifetime
- 1999-09-16 US US09/397,779 patent/US6252175B1/en not_active Expired - Lifetime
-
2001
- 2001-05-04 US US09/848,854 patent/US6538214B2/en not_active Expired - Fee Related
-
2002
- 2002-11-07 US US10/290,639 patent/US6818840B2/en not_active Expired - Fee Related
-
2004
- 2004-09-10 US US10/938,267 patent/US7082682B2/en not_active Expired - Fee Related
-
2006
- 2006-08-01 US US11/461,749 patent/US20060286828A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| US5476211A (en) | 1995-12-19 |
| US7082682B2 (en) | 2006-08-01 |
| US20020023773A1 (en) | 2002-02-28 |
| US20030062398A1 (en) | 2003-04-03 |
| US6049976A (en) | 2000-04-18 |
| US20060286828A1 (en) | 2006-12-21 |
| US6538214B2 (en) | 2003-03-25 |
| US6252175B1 (en) | 2001-06-26 |
| US6818840B2 (en) | 2004-11-16 |
| US6215670B1 (en) | 2001-04-10 |
| US5852871A (en) | 1998-12-29 |
| US20050028363A1 (en) | 2005-02-10 |