DK291184D0 - Fremgangsmaade og indretning til test af kredsloebsplader - Google Patents

Fremgangsmaade og indretning til test af kredsloebsplader

Info

Publication number
DK291184D0
DK291184D0 DK291184A DK291184A DK291184D0 DK 291184 D0 DK291184 D0 DK 291184D0 DK 291184 A DK291184 A DK 291184A DK 291184 A DK291184 A DK 291184A DK 291184 D0 DK291184 D0 DK 291184D0
Authority
DK
Denmark
Prior art keywords
testing circuit
circuit plates
plates
testing
circuit
Prior art date
Application number
DK291184A
Other languages
English (en)
Inventor
Allan Boeegh-Petersen
Original Assignee
Boeegh Petersen Allan
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Boeegh Petersen Allan filed Critical Boeegh Petersen Allan
Priority to DK291184A priority Critical patent/DK291184D0/da
Publication of DK291184D0 publication Critical patent/DK291184D0/da
Priority to DE8585902970T priority patent/DE3582417D1/de
Priority to JP60502685A priority patent/JPS61502432A/ja
Priority to AT85902970T priority patent/ATE62357T1/de
Priority to DE1985902970 priority patent/DE185714T1/de
Priority to EP85902970A priority patent/EP0185714B1/en
Priority to US06/770,867 priority patent/US4707657A/en
Priority to PCT/DK1985/000057 priority patent/WO1986000173A1/en
Priority to FI860562A priority patent/FI75240C/fi
Priority to DK70786A priority patent/DK70786A/da
Priority to US07/116,547 priority patent/US4833402A/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/71—Coupling devices for rigid printing circuits or like structures
    • H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
    • H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
DK291184A 1984-06-13 1984-06-13 Fremgangsmaade og indretning til test af kredsloebsplader DK291184D0 (da)

Priority Applications (11)

Application Number Priority Date Filing Date Title
DK291184A DK291184D0 (da) 1984-06-13 1984-06-13 Fremgangsmaade og indretning til test af kredsloebsplader
PCT/DK1985/000057 WO1986000173A1 (en) 1984-06-13 1985-06-12 A connector assembly for a circuit board testing machine, a circuit board testing machine, and a method of testing a circuit board by means of a circuit board testing machine
DE1985902970 DE185714T1 (de) 1984-06-13 1985-06-12 Verbinderzusammenbau fuer eine schaltungsplattenpruefmaschine, eine schaltungsplattenpruefmaschine und ein verfahren zum pruefen einer schaltungsplatte mittels einer schaltungsplattenpruefmaschine.
JP60502685A JPS61502432A (ja) 1984-06-13 1985-06-12 回路ボ−ド検査装置のためのコネクタ・アセンブリ、回路ボ−ド検査装置及び回路ボ−ド検査装置による回路ボ−ドを検査する方法
AT85902970T ATE62357T1 (de) 1984-06-13 1985-06-12 Verbinderanordnung fuer eine leiterplattenpruefmaschine, eine leiterplattenpruefmaschine und ein verfahren zum pruefen einer leiterplatte mittels einer leiterplattenpruefmaschine.
DE8585902970T DE3582417D1 (de) 1984-06-13 1985-06-12 Verbinderanordnung fuer eine leiterplattenpruefmaschine, eine leiterplattenpruefmaschine und ein verfahren zum pruefen einer leiterplatte mittels einer leiterplattenpruefmaschine.
EP85902970A EP0185714B1 (en) 1984-06-13 1985-06-12 A connector assembly for a circuit board testing machine, a circuit board testing machine, and a method of testing a circuit board by means of a circuit board testing machine
US06/770,867 US4707657A (en) 1984-06-13 1985-06-12 Connector assembly for a circuit board testing machine, a circuit board testing machine, and a method of testing a circuit board by means of a circuit board testing machine
FI860562A FI75240C (fi) 1984-06-13 1986-02-07 Kopplingsaggregat foer en testningsmaskin foer en kretsskiva, en testningsmaskin foer en kretsskiva, och ett foerfarande foer att testa en kretsskiva med hjaelp av kretsskivans testningsmaskin.
DK70786A DK70786A (da) 1984-06-13 1986-02-13 Konnektoraggregat til en kredsloebspladetestmaskine, en kredsloebspladetestmaskine samt en fremgangsmaade til at teste en kredsloebsplade ved hjaelp af en kredsloebspladetestmaskine
US07/116,547 US4833402A (en) 1984-06-13 1987-11-04 Connector assembly for a circuit board testing machine, a circuit board testing machine, and a method of testing a circuit board by means of a circuit board testing machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DK291184A DK291184D0 (da) 1984-06-13 1984-06-13 Fremgangsmaade og indretning til test af kredsloebsplader

Publications (1)

Publication Number Publication Date
DK291184D0 true DK291184D0 (da) 1984-06-13

Family

ID=8117032

Family Applications (1)

Application Number Title Priority Date Filing Date
DK291184A DK291184D0 (da) 1984-06-13 1984-06-13 Fremgangsmaade og indretning til test af kredsloebsplader

Country Status (7)

Country Link
US (2) US4707657A (da)
EP (1) EP0185714B1 (da)
JP (1) JPS61502432A (da)
DE (1) DE3582417D1 (da)
DK (1) DK291184D0 (da)
FI (1) FI75240C (da)
WO (1) WO1986000173A1 (da)

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US4707657A (en) 1987-11-17
FI860562A0 (fi) 1986-02-07
DE3582417D1 (de) 1991-05-08
EP0185714A1 (en) 1986-07-02
JPS61502432A (ja) 1986-10-23
US4833402A (en) 1989-05-23
EP0185714B1 (en) 1991-04-03
WO1986000173A1 (en) 1986-01-03
FI75240C (fi) 1988-05-09
FI860562A (fi) 1986-02-07
FI75240B (fi) 1988-01-29

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