KR880700275A - 전자 장치 테스트 방법 및 테스트용 집적 회로 테스터 - Google Patents

전자 장치 테스트 방법 및 테스트용 집적 회로 테스터

Info

Publication number
KR880700275A
KR880700275A KR1019860700322A KR860700322A KR880700275A KR 880700275 A KR880700275 A KR 880700275A KR 1019860700322 A KR1019860700322 A KR 1019860700322A KR 860700322 A KR860700322 A KR 860700322A KR 880700275 A KR880700275 A KR 880700275A
Authority
KR
South Korea
Prior art keywords
testing
electronic device
integrated circuit
circuit testers
methods
Prior art date
Application number
KR1019860700322A
Other languages
English (en)
Other versions
KR930000546B1 (ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of KR880700275A publication Critical patent/KR880700275A/ko
Application granted granted Critical
Publication of KR930000546B1 publication Critical patent/KR930000546B1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31919—Storing and outputting test patterns
    • G01R31/31921—Storing and outputting test patterns using compression techniques, e.g. patterns sequencer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G01R31/3191—Calibration

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
KR1019860700322A 1984-10-01 1985-09-09 전자 장치 테스트 방법 및 테스트용 집적 회로 테스터 KR930000546B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US06/656,812 US4604744A (en) 1984-10-01 1984-10-01 Automated circuit tester
PCT/US1985/001711 WO1986002166A1 (en) 1984-10-01 1985-09-09 Automated circuit tester
US656812 1991-02-15

Publications (2)

Publication Number Publication Date
KR880700275A true KR880700275A (ko) 1988-02-22
KR930000546B1 KR930000546B1 (ko) 1993-01-25

Family

ID=24634673

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019860700322A KR930000546B1 (ko) 1984-10-01 1985-09-09 전자 장치 테스트 방법 및 테스트용 집적 회로 테스터

Country Status (9)

Country Link
US (1) US4604744A (ko)
EP (1) EP0197051B1 (ko)
JP (1) JP2543675B2 (ko)
KR (1) KR930000546B1 (ko)
DE (1) DE3585525D1 (ko)
HK (1) HK85695A (ko)
MY (1) MY100894A (ko)
SG (1) SG22995G (ko)
WO (1) WO1986002166A1 (ko)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4692921A (en) * 1985-08-22 1987-09-08 American Telephone And Telegraph Company, At&T Bell Laboratories Method for generating verification tests
US4707834A (en) * 1985-09-17 1987-11-17 Tektronix, Inc. Computer-based instrument system
US4856001A (en) * 1987-05-29 1989-08-08 Zehntel, Inc. Digital in-circuit tester having channel-memory earse-preventer
US5265101A (en) * 1987-09-14 1993-11-23 Texas Instruments Incorporated Function array sequencing for VLSI test system
US4858208A (en) * 1988-07-11 1989-08-15 Motorola, Inc. Apparatus and method for testing semiconductor devices
US5369593A (en) * 1989-05-31 1994-11-29 Synopsys Inc. System for and method of connecting a hardware modeling element to a hardware modeling system
JP2842004B2 (ja) * 1992-02-03 1998-12-24 日本電気株式会社 回路のテスト方式
US5659555A (en) * 1993-08-19 1997-08-19 Lucent Technologies Inc. Method and apparatus for testing protocols
US5617430A (en) * 1993-12-22 1997-04-01 International Business Machines Corporation Testing system interconnections using dynamic configuration and test generation
US5459738A (en) * 1994-01-26 1995-10-17 Watari; Hiromichi Apparatus and method for digital circuit testing
JPH0887462A (ja) * 1994-09-20 1996-04-02 Fujitsu Ltd ステートマシン及び通信制御方式
JPH08184648A (ja) * 1994-12-28 1996-07-16 Advantest Corp 半導体試験装置用テストパターンの高速転送装置
US5546405A (en) * 1995-07-17 1996-08-13 Advanced Micro Devices, Inc. Debug apparatus for an automated semiconductor testing system
US6317638B1 (en) * 1997-08-22 2001-11-13 Honeywell Inc. Multi-layer state machine for a hybrid real-time control system and method of operation thereof
GB0123614D0 (en) * 2001-10-02 2001-11-21 Ibm On-chip diagnostic system, integrated circuit and method
TWI226557B (en) * 2003-09-09 2005-01-11 Taiwan Semiconductor Mfg System and method of real-time statistical bin control

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3969618A (en) * 1974-11-29 1976-07-13 Xerox Corporation On line PROM handling system
US4293950A (en) * 1978-04-03 1981-10-06 Nippon Telegraph And Telephone Public Corporation Test pattern generating apparatus
JPS5585265A (en) * 1978-12-23 1980-06-27 Toshiba Corp Function test evaluation device for integrated circuit
US4348759A (en) * 1979-12-17 1982-09-07 International Business Machines Corporation Automatic testing of complex semiconductor components with test equipment having less channels than those required by the component under test
GB2070300B (en) * 1980-02-27 1984-01-25 Racal Automation Ltd Electrical testing apparatus and methods
JPS56140439A (en) * 1980-04-03 1981-11-02 Minatoerekutoronikusu Kk Pattern generator
JPS57111471A (en) * 1980-12-29 1982-07-10 Advantest Corp Test-pattern generator
US4439858A (en) * 1981-05-28 1984-03-27 Zehntel, Inc. Digital in-circuit tester
US4517661A (en) * 1981-07-16 1985-05-14 International Business Machines Corporation Programmable chip tester having plural pin unit buffers which each store sufficient test data for independent operations by each pin unit
US4450560A (en) * 1981-10-09 1984-05-22 Teradyne, Inc. Tester for LSI devices and memory devices
US4493079A (en) * 1982-08-18 1985-01-08 Fairchild Camera & Instrument Corp. Method and system for selectively loading test data into test data storage means of automatic digital test equipment

Also Published As

Publication number Publication date
EP0197051A1 (en) 1986-10-15
EP0197051A4 (en) 1989-08-16
MY100894A (en) 1991-05-16
EP0197051B1 (en) 1992-03-04
SG22995G (en) 1995-08-18
US4604744A (en) 1986-08-05
JP2543675B2 (ja) 1996-10-16
JPS62500320A (ja) 1987-02-05
DE3585525D1 (de) 1992-04-09
KR930000546B1 (ko) 1993-01-25
WO1986002166A1 (en) 1986-04-10
HK85695A (en) 1995-06-09

Similar Documents

Publication Publication Date Title
EP0202905A3 (en) Semiconductor integrated circuit (ic) including circuit elements for evaluating the ic and means for testing the circuit elements
KR900006789A (ko) 전자장치를 시험하는 시험장치 및 방법과 시험장치를 갖춘 반도체장치
DK291184D0 (da) Fremgangsmaade og indretning til test af kredsloebsplader
DE3564039D1 (en) Testing method and tester for electrical devices
EP0408299A3 (en) Semiconductor integrated circuit device and test method therefor
DE69019402D1 (de) Prüfverfahren und -gerät für integrierte Schaltungen.
DE59007516D1 (de) Prüfvorrichtung zum prüfen von elektrischen oder elektronischen prüflingen.
DE3677034D1 (de) Methode und geraet zum testen eines integrierten elektronischen bauteils.
NO172707C (no) Analytisk testanordning i form av en teststrimmel
DE3587858D1 (de) IC-Testvorrichtung.
EP0223714A3 (en) Semiconductor integrated circuit device with test circuit
KR880700275A (ko) 전자 장치 테스트 방법 및 테스트용 집적 회로 테스터
DE3582752D1 (de) Testeinrichtung fuer integrierte schaltungen.
DE69026899D1 (de) Integriertes Halbleiterschaltungsgerät mit Prüfschaltung
ES527904A0 (es) Dispositivo indicador de prueba de abuso de drogas y su metodo de fabricacion
KR880701967A (ko) 제거가능한 중첩층을 사용하여 전자회로 및 집적회로 칩을 시험하는 방법 및 구성
FR2604260B1 (fr) Testeur de circuits electroniques
EP0152904A3 (en) Method and device for the testing of, and/or the measuring at electrically conductive test pieces
GB2207301B (en) Probe for testing electronic components
FR2633055B2 (fr) Perfectionnements aux testeurs de circuits
NO176197C (no) Målemetode og testsett
JPS57103399A (en) Device for mounting and inspecting leadless electronic part
FR2548382B1 (fr) Dispositif de test de circuit numerique
GB2149130B (en) Testing electronic circuits
FR2617290B1 (fr) Dispositif de test de circuit integre

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
G160 Decision to publish patent application
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 19951228

Year of fee payment: 4

LAPS Lapse due to unpaid annual fee