KR900006789A - 전자장치를 시험하는 시험장치 및 방법과 시험장치를 갖춘 반도체장치 - Google Patents

전자장치를 시험하는 시험장치 및 방법과 시험장치를 갖춘 반도체장치

Info

Publication number
KR900006789A
KR900006789A KR1019890015564A KR890015564A KR900006789A KR 900006789 A KR900006789 A KR 900006789A KR 1019890015564 A KR1019890015564 A KR 1019890015564A KR 890015564 A KR890015564 A KR 890015564A KR 900006789 A KR900006789 A KR 900006789A
Authority
KR
South Korea
Prior art keywords
test equipment
methods
testing electronic
electronic devices
semiconductor devices
Prior art date
Application number
KR1019890015564A
Other languages
English (en)
Other versions
KR930001547B1 (ko
Inventor
고오이찌로오 우에다
Original Assignee
후지쓰 가부시끼가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 후지쓰 가부시끼가이샤 filed Critical 후지쓰 가부시끼가이샤
Publication of KR900006789A publication Critical patent/KR900006789A/ko
Application granted granted Critical
Publication of KR930001547B1 publication Critical patent/KR930001547B1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
KR1019890015564A 1988-10-28 1989-10-28 전자장치를 시험하는 시험장치 및 방법과 시험장치를 갖춘 반도체장치 KR930001547B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP63272166A JPH02118474A (ja) 1988-10-28 1988-10-28 伝播遅延時間の試験装置
JP88-272166 1988-10-28

Publications (2)

Publication Number Publication Date
KR900006789A true KR900006789A (ko) 1990-05-08
KR930001547B1 KR930001547B1 (ko) 1993-03-04

Family

ID=17510001

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019890015564A KR930001547B1 (ko) 1988-10-28 1989-10-28 전자장치를 시험하는 시험장치 및 방법과 시험장치를 갖춘 반도체장치

Country Status (5)

Country Link
US (1) US5053698A (ko)
EP (1) EP0366553B1 (ko)
JP (1) JPH02118474A (ko)
KR (1) KR930001547B1 (ko)
DE (1) DE68927147T2 (ko)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3253296B2 (ja) * 1989-12-20 2002-02-04 セイコーエプソン株式会社 記憶装置及びデータ処理装置
JPH045583A (ja) * 1990-04-23 1992-01-09 Ando Electric Co Ltd データログ回路
US5550845A (en) * 1990-08-03 1996-08-27 Siemens Aktiengesellschaft Method for dynamic testing of digital logic circuits
US5258986A (en) * 1990-09-19 1993-11-02 Vlsi Technology, Inc. Tightly coupled, low overhead RAM built-in self-test logic with particular applications for embedded memories
JP2765771B2 (ja) * 1991-08-07 1998-06-18 ローム株式会社 半導体記憶装置の試験方法
US5457695A (en) * 1992-02-27 1995-10-10 Texas Instruments Incorporated Method and system for screening logic circuits
JPH063424A (ja) * 1992-06-22 1994-01-11 Mitsubishi Electric Corp 集積回路装置、および集積回路装置に組込まれるテストデータ発生回路
US5477160A (en) * 1992-08-12 1995-12-19 Fujitsu Limited Module test card
US5363038A (en) * 1992-08-12 1994-11-08 Fujitsu Limited Method and apparatus for testing an unpopulated chip carrier using a module test card
US5528602A (en) * 1992-12-30 1996-06-18 International Business Machines Corporation Method for determining computer subsystem property
US5381419A (en) * 1993-03-01 1995-01-10 At&T Corp. Method and apparatus for detecting retention faults in memories
US5956280A (en) * 1998-03-02 1999-09-21 Tanisys Technology, Inc. Contact test method and system for memory testers
JP2000021193A (ja) * 1998-07-01 2000-01-21 Fujitsu Ltd メモリ試験方法及び装置並びに記憶媒体
DE19845409A1 (de) * 1998-10-02 2000-04-20 Ibm Schnelle Bestimmung des Flush-Delays bei Chips mit LSSD-Design
JP4130801B2 (ja) * 2001-06-13 2008-08-06 株式会社アドバンテスト 半導体デバイス試験装置、及び半導体デバイス試験方法
US7385385B2 (en) * 2001-10-03 2008-06-10 Nextest Systems Corporation System for testing DUT and tester for use therewith
US6868212B2 (en) * 2003-03-06 2005-03-15 Evans & Sutherland Computer Corporation Method and apparatus for controlling wavelength and dominant mode in fiber lasers
US7461304B1 (en) 2003-07-07 2008-12-02 Marvell Israel (M.I.S.L.) Ltd. Integrated circuit test using clock signal modification
JP2007010606A (ja) * 2005-07-04 2007-01-18 Matsushita Electric Ind Co Ltd Ｌｓｉ検査モジュール、ｌｓｉ検査モジュールの制御方法、ｌｓｉ検査モジュールとｌｓｉ検査装置との通信方法、およびｌｓｉ検査方法
EP2104930A2 (en) 2006-12-12 2009-09-30 Evans & Sutherland Computer Corporation System and method for aligning rgb light in a single modulator projector
US8358317B2 (en) 2008-05-23 2013-01-22 Evans & Sutherland Computer Corporation System and method for displaying a planar image on a curved surface
US8702248B1 (en) 2008-06-11 2014-04-22 Evans & Sutherland Computer Corporation Projection method for reducing interpixel gaps on a viewing surface
US8077378B1 (en) 2008-11-12 2011-12-13 Evans & Sutherland Computer Corporation Calibration system and method for light modulation device
DE102009010886B4 (de) * 2009-02-27 2013-06-20 Advanced Micro Devices, Inc. Erkennung der Verzögerungszeit in einem eingebauten Speicherselbsttest unter Anwendung eines Ping-Signals
US9641826B1 (en) 2011-10-06 2017-05-02 Evans & Sutherland Computer Corporation System and method for displaying distant 3-D stereo on a dome surface

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1278694A (en) * 1969-07-04 1972-06-21 Sperry Rand Corp Improvements in or relating to apparatus for testing electronic circuits
JPS5832178A (ja) * 1981-08-19 1983-02-25 Advantest Corp Ｉｃテスタ
JPS59176892A (ja) * 1983-03-26 1984-10-06 富士ファコム制御株式会社 アナログデ−タ収集方式
US4710932A (en) * 1986-01-15 1987-12-01 Kashiwagi Hiroshi Method of and apparatus for fault detection in digital circuits by comparison of test signals applied to a test circuit and a faultless reference circuit
JPS647400A (en) * 1987-06-29 1989-01-11 Hitachi Ltd Ic tester

Also Published As

Publication number Publication date
EP0366553A3 (en) 1991-10-23
EP0366553A2 (en) 1990-05-02
EP0366553B1 (en) 1996-09-11
US5053698A (en) 1991-10-01
DE68927147D1 (de) 1996-10-17
JPH02118474A (ja) 1990-05-02
DE68927147T2 (de) 1997-01-23
KR930001547B1 (ko) 1993-03-04

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E902 Notification of reason for refusal
G160 Decision to publish patent application
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