KR940004346U - 반도체 테스트 장비의 테스트 보드장치 - Google Patents

반도체 테스트 장비의 테스트 보드장치

Info

Publication number
KR940004346U
KR940004346U KR2019920012728U KR920012728U KR940004346U KR 940004346 U KR940004346 U KR 940004346U KR 2019920012728 U KR2019920012728 U KR 2019920012728U KR 920012728 U KR920012728 U KR 920012728U KR 940004346 U KR940004346 U KR 940004346U
Authority
KR
South Korea
Prior art keywords
board device
test
semiconductor
equipment
test equipment
Prior art date
Application number
KR2019920012728U
Other languages
English (en)
Other versions
KR950009876Y1 (ko
Inventor
박용수
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR92012728U priority Critical patent/KR950009876Y1/ko
Publication of KR940004346U publication Critical patent/KR940004346U/ko
Application granted granted Critical
Publication of KR950009876Y1 publication Critical patent/KR950009876Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR92012728U 1992-07-10 1992-07-10 반도체 테스트 장비의 테스트 보드장치 KR950009876Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR92012728U KR950009876Y1 (ko) 1992-07-10 1992-07-10 반도체 테스트 장비의 테스트 보드장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR92012728U KR950009876Y1 (ko) 1992-07-10 1992-07-10 반도체 테스트 장비의 테스트 보드장치

Publications (2)

Publication Number Publication Date
KR940004346U true KR940004346U (ko) 1994-02-24
KR950009876Y1 KR950009876Y1 (ko) 1995-11-23

Family

ID=19336468

Family Applications (1)

Application Number Title Priority Date Filing Date
KR92012728U KR950009876Y1 (ko) 1992-07-10 1992-07-10 반도체 테스트 장비의 테스트 보드장치

Country Status (1)

Country Link
KR (1) KR950009876Y1 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100389909B1 (ko) * 1995-11-21 2003-08-30 삼성전자주식회사 웨이퍼 레벨 테스트에서 프로우브 카드와 테스트 장비간의 연결 방법

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100389909B1 (ko) * 1995-11-21 2003-08-30 삼성전자주식회사 웨이퍼 레벨 테스트에서 프로우브 카드와 테스트 장비간의 연결 방법

Also Published As

Publication number Publication date
KR950009876Y1 (ko) 1995-11-23

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