KR910018712U - 테스트 보드의 접속핀 접속장치 - Google Patents

테스트 보드의 접속핀 접속장치

Info

Publication number
KR910018712U
KR910018712U KR2019900004507U KR900004507U KR910018712U KR 910018712 U KR910018712 U KR 910018712U KR 2019900004507 U KR2019900004507 U KR 2019900004507U KR 900004507 U KR900004507 U KR 900004507U KR 910018712 U KR910018712 U KR 910018712U
Authority
KR
South Korea
Prior art keywords
test board
connection
connection device
connection pin
pin connection
Prior art date
Application number
KR2019900004507U
Other languages
English (en)
Other versions
KR930001586Y1 (ko
Inventor
곽덕주
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019900004507U priority Critical patent/KR930001586Y1/ko
Publication of KR910018712U publication Critical patent/KR910018712U/ko
Application granted granted Critical
Publication of KR930001586Y1 publication Critical patent/KR930001586Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
KR2019900004507U 1990-04-13 1990-04-13 테스트 보드의 접속핀 접속장치 KR930001586Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019900004507U KR930001586Y1 (ko) 1990-04-13 1990-04-13 테스트 보드의 접속핀 접속장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019900004507U KR930001586Y1 (ko) 1990-04-13 1990-04-13 테스트 보드의 접속핀 접속장치

Publications (2)

Publication Number Publication Date
KR910018712U true KR910018712U (ko) 1991-11-29
KR930001586Y1 KR930001586Y1 (ko) 1993-04-03

Family

ID=19297620

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019900004507U KR930001586Y1 (ko) 1990-04-13 1990-04-13 테스트 보드의 접속핀 접속장치

Country Status (1)

Country Link
KR (1) KR930001586Y1 (ko)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101277787B1 (ko) * 2011-11-21 2013-06-24 바이옵트로 주식회사 통전 검사 장치 및 연결 장치

Also Published As

Publication number Publication date
KR930001586Y1 (ko) 1993-04-03

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