KR910020706U - Ic 테스터의 간이 테스트 장치 - Google Patents

Ic 테스터의 간이 테스트 장치

Info

Publication number
KR910020706U
KR910020706U KR2019900006040U KR900006040U KR910020706U KR 910020706 U KR910020706 U KR 910020706U KR 2019900006040 U KR2019900006040 U KR 2019900006040U KR 900006040 U KR900006040 U KR 900006040U KR 910020706 U KR910020706 U KR 910020706U
Authority
KR
South Korea
Prior art keywords
test device
simple test
tester simple
tester
test
Prior art date
Application number
KR2019900006040U
Other languages
English (en)
Other versions
KR930000952Y1 (ko
Inventor
김재달
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR2019900006040U priority Critical patent/KR930000952Y1/ko
Publication of KR910020706U publication Critical patent/KR910020706U/ko
Application granted granted Critical
Publication of KR930000952Y1 publication Critical patent/KR930000952Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
KR2019900006040U 1990-05-09 1990-05-09 Ic 테스터의 간이 테스트 장치 KR930000952Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR2019900006040U KR930000952Y1 (ko) 1990-05-09 1990-05-09 Ic 테스터의 간이 테스트 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR2019900006040U KR930000952Y1 (ko) 1990-05-09 1990-05-09 Ic 테스터의 간이 테스트 장치

Publications (2)

Publication Number Publication Date
KR910020706U true KR910020706U (ko) 1991-12-20
KR930000952Y1 KR930000952Y1 (ko) 1993-03-02

Family

ID=19298490

Family Applications (1)

Application Number Title Priority Date Filing Date
KR2019900006040U KR930000952Y1 (ko) 1990-05-09 1990-05-09 Ic 테스터의 간이 테스트 장치

Country Status (1)

Country Link
KR (1) KR930000952Y1 (ko)

Also Published As

Publication number Publication date
KR930000952Y1 (ko) 1993-03-02

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