KR940017900U - 테스트 시스템의 하이-픽스 보드 접속용 연결장치 - Google Patents

테스트 시스템의 하이-픽스 보드 접속용 연결장치

Info

Publication number
KR940017900U
KR940017900U KR2019920026461U KR920026461U KR940017900U KR 940017900 U KR940017900 U KR 940017900U KR 2019920026461 U KR2019920026461 U KR 2019920026461U KR 920026461 U KR920026461 U KR 920026461U KR 940017900 U KR940017900 U KR 940017900U
Authority
KR
South Korea
Prior art keywords
connection
test system
fix board
connection device
board connection
Prior art date
Application number
KR2019920026461U
Other languages
English (en)
Other versions
KR960003260Y1 (ko
Inventor
김진주
김도균
김영삼
Original Assignee
금성일렉트론 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 금성일렉트론 주식회사 filed Critical 금성일렉트론 주식회사
Priority to KR92026461U priority Critical patent/KR960003260Y1/ko
Publication of KR940017900U publication Critical patent/KR940017900U/ko
Application granted granted Critical
Publication of KR960003260Y1 publication Critical patent/KR960003260Y1/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Tests Of Electronic Circuits (AREA)
KR92026461U 1992-12-24 1992-12-24 테스트 시스템의 하이-픽스 보드 접속용 연결장치 KR960003260Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR92026461U KR960003260Y1 (ko) 1992-12-24 1992-12-24 테스트 시스템의 하이-픽스 보드 접속용 연결장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR92026461U KR960003260Y1 (ko) 1992-12-24 1992-12-24 테스트 시스템의 하이-픽스 보드 접속용 연결장치

Publications (2)

Publication Number Publication Date
KR940017900U true KR940017900U (ko) 1994-07-28
KR960003260Y1 KR960003260Y1 (ko) 1996-04-19

Family

ID=19347572

Family Applications (1)

Application Number Title Priority Date Filing Date
KR92026461U KR960003260Y1 (ko) 1992-12-24 1992-12-24 테스트 시스템의 하이-픽스 보드 접속용 연결장치

Country Status (1)

Country Link
KR (1) KR960003260Y1 (ko)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100433739B1 (ko) * 2002-03-27 2004-06-04 주식회사 테스트이엔지 반도체 테스트기에 설치된 하이픽스의 교체방법 및 그 장치
KR100873728B1 (ko) * 2007-05-21 2008-12-12 주식회사 아이티엔티 반도체 디바이스 테스트 시스템의 커넥팅 장치

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100853402B1 (ko) * 2006-12-27 2008-08-21 주식회사 아이티엔티 반도체디바이스 테스트시스템의 커넥팅 장치

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100433739B1 (ko) * 2002-03-27 2004-06-04 주식회사 테스트이엔지 반도체 테스트기에 설치된 하이픽스의 교체방법 및 그 장치
KR100873728B1 (ko) * 2007-05-21 2008-12-12 주식회사 아이티엔티 반도체 디바이스 테스트 시스템의 커넥팅 장치

Also Published As

Publication number Publication date
KR960003260Y1 (ko) 1996-04-19

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