KR940010725U - 내부회로 테스트 장치 - Google Patents

내부회로 테스트 장치

Info

Publication number
KR940010725U
KR940010725U KR2019920018971U KR920018971U KR940010725U KR 940010725 U KR940010725 U KR 940010725U KR 2019920018971 U KR2019920018971 U KR 2019920018971U KR 920018971 U KR920018971 U KR 920018971U KR 940010725 U KR940010725 U KR 940010725U
Authority
KR
South Korea
Prior art keywords
test device
internal circuit
circuit test
internal
test
Prior art date
Application number
KR2019920018971U
Other languages
English (en)
Other versions
KR960010315Y1 (ko
Inventor
이재철
Original Assignee
엘지산전 주식회사
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 엘지산전 주식회사 filed Critical 엘지산전 주식회사
Priority to KR92018971U priority Critical patent/KR960010315Y1/ko
Publication of KR940010725U publication Critical patent/KR940010725U/ko
Application granted granted Critical
Publication of KR960010315Y1 publication Critical patent/KR960010315Y1/ko

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3187Built-in tests

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
KR92018971U 1992-10-05 1992-10-05 내부회로 테스트 장치 KR960010315Y1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR92018971U KR960010315Y1 (ko) 1992-10-05 1992-10-05 내부회로 테스트 장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR92018971U KR960010315Y1 (ko) 1992-10-05 1992-10-05 내부회로 테스트 장치

Publications (2)

Publication Number Publication Date
KR940010725U true KR940010725U (ko) 1994-05-23
KR960010315Y1 KR960010315Y1 (ko) 1996-12-06

Family

ID=19341214

Family Applications (1)

Application Number Title Priority Date Filing Date
KR92018971U KR960010315Y1 (ko) 1992-10-05 1992-10-05 내부회로 테스트 장치

Country Status (1)

Country Link
KR (1) KR960010315Y1 (ko)

Also Published As

Publication number Publication date
KR960010315Y1 (ko) 1996-12-06

Similar Documents

Publication Publication Date Title
DE69219612D1 (de) Prüfungsvorrichtung
DE69315918D1 (de) Elektronisches Gerät
DE69521964D1 (de) Schaltungsvorrichtung
DE69331042D1 (de) Kompaktes elektronisches Gerät
DE69123407D1 (de) Elektronisches Gerät
DE69032214D1 (de) Kompaktes elektronisches Gerät
KR950701761A (ko) 검사 장치
DE69025110D1 (de) Testgerät
DE69331573D1 (de) Blutabnahme-vorrichtung
DE69319168D1 (de) Elektronischer Messapparat
DE19680290T1 (de) Schaltungstestvorrichtung
DE69421984D1 (de) Elektronisches Gerät
KR930015989U (ko) 메모리 장치의 테스트 모드회로
DE69405998D1 (de) Elektrisches testgerät
NO960149D0 (no) Testanordning
DE69032019D1 (de) Elektronisches Gerät
DE69127149D1 (de) Schaltungsprüf-Verfahren
ATA39392A (de) Wegmesseinrichtung
DK0592007T3 (da) Omskifterapparat
FI931411A (fi) Testningsapparat foer bromssystem
KR960009601A (ko) 소자회로
DE69210039D1 (de) Verbrennungsvorrichtung
DE59207010D1 (de) Messeinrichtung
KR940010725U (ko) 내부회로 테스트 장치
DE69302684D1 (de) Testvorrichtung

Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
REGI Registration of establishment
LAPS Lapse due to unpaid annual fee