DK285081A - Fremgangsmaade og apparat til detektering af fejl - Google Patents

Fremgangsmaade og apparat til detektering af fejl

Info

Publication number
DK285081A
DK285081A DK285081A DK285081A DK285081A DK 285081 A DK285081 A DK 285081A DK 285081 A DK285081 A DK 285081A DK 285081 A DK285081 A DK 285081A DK 285081 A DK285081 A DK 285081A
Authority
DK
Denmark
Prior art keywords
detecting errors
errors
detecting
Prior art date
Application number
DK285081A
Other languages
English (en)
Other versions
DK156283C (da
DK156283B (da
Inventor
T Miyazawa
Original Assignee
Kirin Brewery
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP8751080A external-priority patent/JPS5713341A/ja
Priority claimed from JP8751180A external-priority patent/JPS5713342A/ja
Application filed by Kirin Brewery filed Critical Kirin Brewery
Publication of DK285081A publication Critical patent/DK285081A/da
Publication of DK156283B publication Critical patent/DK156283B/da
Application granted granted Critical
Publication of DK156283C publication Critical patent/DK156283C/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents

Landscapes

  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
DK285081A 1980-06-27 1981-06-26 Fejldetektionsapparat til konstatering af skrammer, revner, brud eller indeslutninger i en genstand DK156283C (da)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP8751080A JPS5713341A (en) 1980-06-27 1980-06-27 Defect detector
JP8751180A JPS5713342A (en) 1980-06-27 1980-06-27 Defect detecting system
JP8751080 1980-06-27
JP8751180 1980-06-27

Publications (3)

Publication Number Publication Date
DK285081A true DK285081A (da) 1981-12-28
DK156283B DK156283B (da) 1989-07-24
DK156283C DK156283C (da) 1989-12-18

Family

ID=26428772

Family Applications (1)

Application Number Title Priority Date Filing Date
DK285081A DK156283C (da) 1980-06-27 1981-06-26 Fejldetektionsapparat til konstatering af skrammer, revner, brud eller indeslutninger i en genstand

Country Status (8)

Country Link
US (1) US4448526A (da)
AU (1) AU535792B2 (da)
CA (1) CA1175139A (da)
DE (1) DE3124949C2 (da)
DK (1) DK156283C (da)
FR (1) FR2485734B1 (da)
GB (1) GB2078948B (da)
NL (1) NL185368C (da)

Families Citing this family (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4492476A (en) * 1981-02-20 1985-01-08 Kirin Beer Kabushiki Kaisha Defect detecting method and apparatus
JPS5821146A (ja) * 1981-07-30 1983-02-07 Kirin Brewery Co Ltd 欠陥検査方法および装置
US4488648A (en) * 1982-05-06 1984-12-18 Powers Manufacturing, Inc. Flaw detector
JPS60159637A (ja) * 1984-01-31 1985-08-21 Kirin Brewery Co Ltd 欠陥検出方法および装置
FR2564200B1 (fr) * 1984-05-11 1986-10-03 Inst Francais Du Petrole Procede pour acquerir des images d'echantillons geologiques en vue de leur analyse optique et dispositif pour sa mise en oeuvre
JPS61100604A (ja) * 1984-10-24 1986-05-19 Hajime Sangyo Kk 表面検査装置
JPS61193009A (ja) * 1985-02-22 1986-08-27 Toyo Glass Kk 容器の開口天面欠陥検査方法
JPS61207952A (ja) * 1985-03-12 1986-09-16 Hajime Sangyo Kk 透明材よりなるビンの欠陥検査方法
US4933983A (en) * 1986-02-14 1990-06-12 Canon Kabushiki Kaisha Image data reading apparatus
US4874940A (en) * 1988-01-11 1989-10-17 Brockway, Inc. (N.Y.) Method and apparatus for inspection of a transparent container
DE3809221A1 (de) * 1988-03-18 1989-09-28 Roth Electric Gmbh Verfahren zum detektieren von fehlstellen an pressteilen oder anderen werkstuecken und vorrichtung zur durchfuehrung des verfahrens
WO1989009931A1 (en) * 1988-04-13 1989-10-19 International Integrated Systems, Inc. System of fluid inspection and/or identification
US5002397A (en) * 1988-04-13 1991-03-26 International Integrated Systems, Inc. System of fluid inspection and/or identification
JPH0711494B2 (ja) * 1988-06-16 1995-02-08 松下電工株式会社 透光性容器の検査方法
US4914289A (en) * 1988-10-26 1990-04-03 Inex-Vistech Technologies Incorporated Article inspection system for analyzing end and adjacent sides
US4974261A (en) * 1988-11-15 1990-11-27 Matsushita Electric Works, Ltd. Optical surface inspection method
JPH0776759B2 (ja) * 1989-01-19 1995-08-16 ザ・コカ‐コーラ・カンパニー 回収容器選別方法
US5192692A (en) * 1989-07-25 1993-03-09 Olympus Optical Co., Ltd. Method of judging particle agglutination pattern
US5115127A (en) * 1990-01-03 1992-05-19 The United States Of America As Represented By The Secretary Of The Navy Optical fiber sensor for measuring physical properties of fluids
CH680820A5 (da) * 1990-07-13 1992-11-13 Elpatronic Ag
US5095204A (en) * 1990-08-30 1992-03-10 Ball Corporation Machine vision inspection system and method for transparent containers
JPH05126750A (ja) * 1991-11-01 1993-05-21 Fuji Electric Co Ltd 円形容器内面検査装置
DE4214958C2 (de) * 1992-05-11 1994-06-09 Kronseder Maschf Krones Kontinuierlich arbeitende Inspektionsmaschine für Gefäße
US5349435A (en) * 1993-06-08 1994-09-20 Emhart Glass Machinery Investments Inc. Machine for inspecting the bottom of glass containers
EP0669527A1 (de) * 1994-01-21 1995-08-30 Elpatronic Ag Verfahren zum Ausscheiden von Mehrwegflaschen aus dem Mehrweg-Umlauf
US5466927A (en) * 1994-04-08 1995-11-14 Owens-Brockway Glass Container Inc. Inspection of translucent containers
US5510610A (en) * 1994-10-07 1996-04-23 Emhart Glass Machinery Investments Inc. Apparatus for detecting defects on the bottom of bottles by manipulating an image to remove knurls
US5642198A (en) * 1995-04-03 1997-06-24 Long; William R. Method of inspecting moving material
ES2136808T3 (es) * 1995-06-07 1999-12-01 Inductotherm Corp Sistema de posicionamiento de video para un recipiente de vertido.
US5805279A (en) * 1996-01-11 1998-09-08 Alltrista Corporation Method and apparatus for illuminating and imaging a can end coated with sealing material
US6182266B1 (en) * 1997-09-12 2001-01-30 Lucent Technologies, Inc. Self-auditing protection method for sorted arrays
US6384421B1 (en) 1999-10-07 2002-05-07 Logical Systems Incorporated Vision system for industrial parts
BE1017422A3 (nl) * 2006-12-08 2008-09-02 Visys Nv Werkwijze en inrichting voor het inspecteren en sorteren van een productstroom.
US7800009B2 (en) 2007-10-30 2010-09-21 Logical Systems Incorporated Air separator conveyor and vision system
US9188545B2 (en) * 2011-10-28 2015-11-17 Owens-Brockway Glass Container Inc. Container inspection apparatus and method
US10802121B1 (en) 2019-10-09 2020-10-13 Ford Global Technologies, Llc Cleaning apparatus for sensor

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2649500A (en) * 1949-12-16 1953-08-18 Owens Illinois Glass Co Inspecting apparatus
US3411625A (en) * 1965-08-12 1968-11-19 Industrial Dynamics Co Pattern recognition device
US3529167A (en) * 1967-08-16 1970-09-15 Automatic Sprinkler Corp Container inspection apparatus with nutating instantaneous field of observation
US3877821A (en) * 1973-07-23 1975-04-15 Inex Inc Apparatus for detecting flaws using an array of photo sensitive devices
US3987244A (en) * 1975-12-31 1976-10-19 United Technologies Corporation Programmable image processor
GB1585919A (en) * 1977-08-11 1981-03-11 Ti Fords Ltd Bottle inspection apparatus
JPS5546172A (en) * 1978-09-29 1980-03-31 Kirin Brewery Co Ltd Detector for foreign material
DE2848316A1 (de) * 1978-11-07 1980-05-08 Siemens Ag Verfahren und schaltungsanordnung zum feststellen von flecken auf kreisfoermigen objekten
DE2910516A1 (de) * 1979-03-16 1980-09-18 Kirin Brewery Anordnung zur feststellung von fehlern in flaschen o.dgl.

Also Published As

Publication number Publication date
DE3124949A1 (de) 1982-03-18
DK156283C (da) 1989-12-18
FR2485734B1 (fr) 1985-07-05
AU535792B2 (en) 1984-04-05
US4448526A (en) 1984-05-15
DK156283B (da) 1989-07-24
CA1175139A (en) 1984-09-25
NL185368B (nl) 1989-10-16
GB2078948B (en) 1984-05-31
NL8102944A (nl) 1982-01-18
AU7199081A (en) 1982-01-07
DE3124949C2 (de) 1986-05-15
FR2485734A1 (fr) 1981-12-31
GB2078948A (en) 1982-01-13
NL185368C (nl) 1990-03-16

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