FR2621131B1 - Dispositif de connexion par carte pour systeme de test et carte mere pour un tel dispositif - Google Patents

Dispositif de connexion par carte pour systeme de test et carte mere pour un tel dispositif

Info

Publication number
FR2621131B1
FR2621131B1 FR8713287A FR8713287A FR2621131B1 FR 2621131 B1 FR2621131 B1 FR 2621131B1 FR 8713287 A FR8713287 A FR 8713287A FR 8713287 A FR8713287 A FR 8713287A FR 2621131 B1 FR2621131 B1 FR 2621131B1
Authority
FR
France
Prior art keywords
card
test system
mother
connection device
card connection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
FR8713287A
Other languages
English (en)
Other versions
FR2621131A1 (fr
Inventor
Michel Raskin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thales SA
Original Assignee
Thomson CSF SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thomson CSF SA filed Critical Thomson CSF SA
Priority to FR8713287A priority Critical patent/FR2621131B1/fr
Publication of FR2621131A1 publication Critical patent/FR2621131A1/fr
Application granted granted Critical
Publication of FR2621131B1 publication Critical patent/FR2621131B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/0266—Marks, test patterns or identification means
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/11—Printed elements for providing electric connections to or between printed circuits
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00—Printed circuits
    • H05K1/02—Details
    • H05K1/14—Structural association of two or more printed circuits
    • H05K1/141—One or more single auxiliary printed circuits mounted on a main printed circuit, e.g. modules, adapters

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
FR8713287A 1987-09-25 1987-09-25 Dispositif de connexion par carte pour systeme de test et carte mere pour un tel dispositif Expired - Lifetime FR2621131B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR8713287A FR2621131B1 (fr) 1987-09-25 1987-09-25 Dispositif de connexion par carte pour systeme de test et carte mere pour un tel dispositif

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR8713287A FR2621131B1 (fr) 1987-09-25 1987-09-25 Dispositif de connexion par carte pour systeme de test et carte mere pour un tel dispositif

Publications (2)

Publication Number Publication Date
FR2621131A1 FR2621131A1 (fr) 1989-03-31
FR2621131B1 true FR2621131B1 (fr) 1990-03-09

Family

ID=9355229

Family Applications (1)

Application Number Title Priority Date Filing Date
FR8713287A Expired - Lifetime FR2621131B1 (fr) 1987-09-25 1987-09-25 Dispositif de connexion par carte pour systeme de test et carte mere pour un tel dispositif

Country Status (1)

Country Link
FR (1) FR2621131B1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07244116A (ja) * 1994-03-07 1995-09-19 Hitachi Chem Co Ltd 半導体特性測定用治具とその製造法並びにその使用方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DK291184D0 (da) * 1984-06-13 1984-06-13 Boeegh Petersen Allan Fremgangsmaade og indretning til test af kredsloebsplader
NL8503573A (nl) * 1985-12-24 1987-07-16 Nederlanden Staat Inrichting voor het meten van een in werking zijnde prentplaat.

Also Published As

Publication number Publication date
FR2621131A1 (fr) 1989-03-31

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Legal Events

Date Code Title Description
ST Notification of lapse