JP4199699B2 - リソグラフィ装置及びデバイス製造方法 - Google Patents

リソグラフィ装置及びデバイス製造方法 Download PDF

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Publication number
JP4199699B2
JP4199699B2 JP2004169275A JP2004169275A JP4199699B2 JP 4199699 B2 JP4199699 B2 JP 4199699B2 JP 2004169275 A JP2004169275 A JP 2004169275A JP 2004169275 A JP2004169275 A JP 2004169275A JP 4199699 B2 JP4199699 B2 JP 4199699B2
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Japan
Prior art keywords
sensor
substrate
liquid
substrate table
projection system
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Expired - Lifetime
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JP2004169275A
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Japanese (ja)
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JP2005005707A (ja
JP2005005707A5 (enExample
Inventor
ロフ ジョエリ
バトラー ハンス
ニコラース ラムベルツス ドンダース スジョルド
コレスニーチェンコ アレクセイ
ロエロフ ロープシュトラ エリック
ヨハネス マリア マイヤー ヘンドリクス
カタリヌス ヒューバーツ ムルケンス ヨハネス
アイルコ シーブラント リツェマ ロエロフ
ファン シュアイク フランク
フランシスクス サンジェル ティモテオス
シモン クラウス
セオドア デ スミト ヨハネ
シュトラーイユエル アレクサンダー
シュトレーフケルク ボブ
セオドルス マリア ビユラールト エリック
アレクサンダー ホーゲンダム クリスティアーン
ファン サンテン ヘルマー
アドリアヌス ファン デ ケルクフォフ マルクス
クローン マルク
ジェフリー デン ボエフ アリー
ジェローン オッテンス ヨーシュト
ヨハネス ソフィア マリア メルテンス ジェローン
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エーエスエムエル ネザーランズ ビー．ブイ．
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Priority claimed from EP03257068.1A external-priority patent/EP1429188B1/en
Application filed by エーエスエムエル ネザーランズ ビー．ブイ． filed Critical エーエスエムエル ネザーランズ ビー．ブイ．
Publication of JP2005005707A publication Critical patent/JP2005005707A/ja
Publication of JP2005005707A5 publication Critical patent/JP2005005707A5/ja
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    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058—Mask illumination systems
    • G03F7/70141—Illumination system adjustment, e.g. adjustments during exposure or alignment during assembly of illumination system
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216—Mask projection systems
    • G03F7/70341—Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20—Exposure; Apparatus therefor
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/7085—Detection arrangement, e.g. detectors of apparatus alignment possibly mounted on wafers, exposure dose, photo-cleaning flux, stray light, thermal load
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
    • G03F7/70883—Environment aspects, e.g. pressure of beam-path gas, temperature of optical system

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Atmospheric Sciences (AREA)
  • Toxicology (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
JP2004169275A 2003-06-09 2004-06-08 リソグラフィ装置及びデバイス製造方法 Expired - Lifetime JP4199699B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP03253636 2003-06-09
EP03255395 2003-08-29
EP03257068.1A EP1429188B1 (en) 2002-11-12 2003-11-10 Lithographic projection apparatus

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2007159104A Division JP4558762B2 (ja) 2003-06-09 2007-06-15 リソグラフィ装置及びデバイス製造方法

Publications (3)

Publication Number Publication Date
JP2005005707A JP2005005707A (ja) 2005-01-06
JP2005005707A5 JP2005005707A5 (enExample) 2007-08-02
JP4199699B2 true JP4199699B2 (ja) 2008-12-17

Family

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Family Applications (7)

Application Number Title Priority Date Filing Date
JP2004169275A Expired - Lifetime JP4199699B2 (ja) 2003-06-09 2004-06-08 リソグラフィ装置及びデバイス製造方法
JP2007159104A Expired - Lifetime JP4558762B2 (ja) 2003-06-09 2007-06-15 リソグラフィ装置及びデバイス製造方法
JP2010097301A Expired - Lifetime JP5130314B2 (ja) 2003-06-09 2010-04-20 リソグラフィ装置
JP2011243513A Pending JP2012054601A (ja) 2003-06-09 2011-11-07 リソグラフィ装置
JP2011243516A Expired - Fee Related JP5270743B2 (ja) 2003-06-09 2011-11-07 露光装置
JP2012066780A Pending JP2012114484A (ja) 2003-06-09 2012-03-23 リソグラフィ装置及びデバイス製造方法
JP2012066781A Expired - Fee Related JP5602174B2 (ja) 2003-06-09 2012-03-23 リソグラフィ装置及びデバイス製造方法

Family Applications After (6)

Application Number Title Priority Date Filing Date
JP2007159104A Expired - Lifetime JP4558762B2 (ja) 2003-06-09 2007-06-15 リソグラフィ装置及びデバイス製造方法
JP2010097301A Expired - Lifetime JP5130314B2 (ja) 2003-06-09 2010-04-20 リソグラフィ装置
JP2011243513A Pending JP2012054601A (ja) 2003-06-09 2011-11-07 リソグラフィ装置
JP2011243516A Expired - Fee Related JP5270743B2 (ja) 2003-06-09 2011-11-07 露光装置
JP2012066780A Pending JP2012114484A (ja) 2003-06-09 2012-03-23 リソグラフィ装置及びデバイス製造方法
JP2012066781A Expired - Fee Related JP5602174B2 (ja) 2003-06-09 2012-03-23 リソグラフィ装置及びデバイス製造方法

Country Status (6)

Country Link
US (8) US7213963B2 (enExample)
JP (7) JP4199699B2 (enExample)
KR (1) KR100683263B1 (enExample)
CN (2) CN102147574B (enExample)
SG (2) SG152931A1 (enExample)
TW (2) TWI304159B (enExample)

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* Cited by examiner, † Cited by third party
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US20190250518A1 (en) 2019-08-15
US7213963B2 (en) 2007-05-08
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US20110279800A1 (en) 2011-11-17
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US9152058B2 (en) 2015-10-06
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