CN103293126B - 用于使用频域干涉测量法进行光学成像的方法和设备 - Google Patents
用于使用频域干涉测量法进行光学成像的方法和设备 Download PDFInfo
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Abstract
提供了一种设备和方法。具体而言,至少一个第一电磁辐射可以提供给样品并且至少一个第二电磁辐射可以提供给非反射的参考。所述第一和/或第二电磁辐射的频率随时间变化。在关联于所述第一电磁辐射的至少一个第三电磁辐射与关联于所述第二电磁辐射的至少一个第四电磁辐射之间检测干涉。可替换地,所述第一电磁辐射和/或第二电磁辐射具有随时间变化的谱。所述谱在特定时间可以包含多个频率。另外,有可能以第一偏振态检测所述第三电磁辐射与所述第四电磁辐射之间的干涉信号。此外,可以优选地以不同于所述第一偏振态的第二偏振态检测所述第三和第四电磁辐射之间的又一干涉信号。所述第一和/或第二电磁辐射可以具有中值频率以大于每毫秒100万亿赫兹的调谐速度随时间基本上连续变化的谱。
Description
对相关申请的交叉引用
本申请是中国专利申请第200480031773.0号(国际申请号为PCT/US2004/029148)的分案申请,其全部内容通过引用合并于此。本申请要求了提交于2003年10月23日的美国临时申请No.60/514,769的优先权,其全部公开通过引用结合于此。
技术领域
本发明总地涉及光学成像,且更具体地,涉及用于使用频域干涉测量法进行光学成像的方法和设备。
背景技术
如本领域中所公知的,光学干涉测量反射测量法是一种有力的工具,其用于进行非入侵的、高分辨率(~10μm)的生物学或其它样品的横截面成像,以使诸如反射、吸收、散射、衰减、双折射和光谱分析的微结构的光学特性可视化。存在许多本领域中公知的干涉测量成像技术。这些技术总体而言可划分为两个主要类别:(i)时域技术,和(ii)频域技术。
低相干干涉测量法(“LCI”)是时域技术之一。此技术使用扫描系统来改变参考臂长度并且在检测器处采集干涉信号。然后,对条纹图案解调以获得源互相关函数的相干包络。光学相干层析成像法(“OCT”)是一种用于使用LCI获得二或三维图像的技术。OCT在授予Swanson等人的美国专利No.5,321,501中描述。已描述了OCT技术的多个变形,但很多遭遇小于最佳的信噪比(“SNR”),导致非最佳的分辨率、低成像帧速率和不良的穿透深度。功率使用是这种成像技术中的一个因素。例如在眼科应用中,在热损坏可发生前,只有特定毫瓦数的功率是可容忍的。因此,在这样的环境中增加SNR,提升功率是不可行的。尽管如此,将值得期望的是,有一种具有优良的SNR而显著增加功率需求的成像方法。
不足的SNR亦可阻止以高的帧速率使用OCT技术,高的帧速率对于避免运动假象和克服例如可用于活体内血管成像的短测量时间窗是重要的。因此,期望一种改善SNR和成像速度(例如帧速率)的方法。
光谱干涉法或光谱雷达是频域成像技术之一。在光谱雷达中,样品和参考臂光的交叉谱密度的实部用光谱仪测量。深度分布信息可以依据交叉谱密度调制来编码。
前面已描述了用来增加LCI和OCT的SNR的光谱雷达概念的使用。此技术使用具有大数目的像素(1,000的量级)的电荷耦合器件(“CCD”)以达到毫米量级的扫描范围。CCD器件的快速读出使得高速成像成为可能。
然而,存在许多与使用CCD器件相关联的缺点。首先,与单元件光电接收器相比,CCD器件相对昂贵。其次,前面描述的方法使用单个CCD来采集数据。由于电荷存储容量是有限的,所以需要将参考臂功率减小到大约与样品臂功率相同的水平,引起了样品臂光上的自相关噪声。另外,由于没有生成载流子,所以在此系统中的噪声中,1/f噪声将起支配作用。第三,即使以现有CCD技术的短的积分时间,干涉计中的相位不稳定性仍减小交叉谱密度调制的条纹可见度。此缺陷使得该技术易受运动假象的影响。
相干的频率调制的连续波反射测量法(C-FWCW)是本领域中公知的另一频域技术。授予Swanson等人的美国专利No.5,956,355和6,160,826描述了使用此技术的光学成像方法和设备。前面描述的成像方法基于使用连续调谐的单频激光器作为光源。要求调谐波长范围为几十个纳米以实现小于100微米的测距分辩率(ranging resolution)。激光器的瞬时线宽必须小于约0.1nm以实现1.0mm量级的检测范围。调谐速率应大于10kHz以便高速(例如视频速率)成像。虽然外腔式半导体激光器可以配置成在几十个纳米上实现无跳模的单频调谐,但调谐速率由于机械稳定性的严格要求而已小于1Hz。克服此速度困难的方法是优选的。
因此,将值得期望的是,提供一种克服传统LCI和OCT的源可用性和扫描速度缺陷的系统和方法。
发明内容
根据本发明示例性的实施例,一种示例性的光学频域成像(“OFDI”)系统可包括多频率模(或多纵向或轴向模)波长扫描激光源(wavelength-swept laser sourse),其光耦合到包含所研究的样品的干涉计。该系统可进一步包括配置成产生从样品反射的光和参考光之间的正交的干涉测量信号的装置以及设置成接收所述干涉测量信号的检测器。
利用这样的示例性的特定装置,可以提供一种OFDI系统,该系统可以以与传统系统的源功率相比相对低的源功率来操作,并且/或者该系统以与传统系统的采集速率相比相对高的采集速率来操作。扫描源的使用导致具有减小的散粒噪声和其它形式的噪声的成像系统,其允许比传统系统低得多的源功率或高得多的采集速率。这可导致增加的检测灵敏度,从而导致提供实时成像的能力。这样的成像速度可帮助胃肠、眼科和动脉成像领域中的从业者,在这些成像领域中,运动假象是持续的问题。通过增加帧速率同时维持或改善信噪比,这样的假象可被最小化或在一些情况下被消除。本发明的示例性的实施例亦可利用OFDI实现对组织的大面积的筛选并且允许实现临床上可行的筛选协议的使用。
在本发明的一个示例性的实施例中,可以提供波长扫描激光器,其可以在激光腔中使用光学带通扫描滤波器来产生迅速扫描的多频率模式输出。通过在激光腔中使用光学带通扫描滤波器,不必要调谐激光腔长度以提供激光光谱的同步调谐。换言之,不需要以与激光器的中心波长相同的速率来调谐激光器的纵腔模。
在本发明的另一示例性的实施例中,检测器可以是双平衡接收器,其设置成接受干涉测量信号并且抑制干涉测量信号中的相对强度噪声。
通过进行傅立叶域中的信号处理,根据本发明的一个示例性实施例的信噪比(“SNR”)的增益优于诸如OCT的时域方法。SNR提高到N倍,N为深度范围与空间分辨率的比。提高倍数N可达到几百至几千。此SNR的增加使得能够成像得快到N倍,或可替换地允许以与具有低到1/N的功率的源相同的速度来成像。结果,本发明的该示例性的实施例克服了传统LCI和OCT的两个重要的缺陷,例如源可用性和扫描速度。因子N可达到大于1,000,并且允许构造OFDI系统,其可以自当前实践中的OCT和LCI技术改进三个数量级以上。
实现了SNR的增益是因为,例如,散粒噪声具有白噪声谱。频率ω(或波长λ)处的存在于检测器的信号强度只对频率ω处的信号有贡献,但是散粒噪声在所有频率处生成。通过使每个检测器的光学带宽变窄,可以减小每个频率处的散粒噪声贡献,同时信号成分保持相同。
与OCT相比,根据本发明的示例性的实施例改善了当前数据采集速度和源的可用性。散粒噪声归因于电流的统计波动,该统计波动归因于量子化的或离散的电荷。散粒噪声的减小允许低得多的源功率或高得多的采集速率。当前数据采集速率的限制(~4帧/秒)是由可用的源功率和用于扫描延迟的快速机制的可用性而施加的。检测灵敏度的到8倍的增加将允许以约每秒30帧的速度来实时成像。灵敏度的到约1,000-2,000倍的增加允许使用具有低得多的功率和高得多的谱带宽的源,其易于获得、生产较便宜并且可以生成较高分辨率的OFDI图像。
针对OFDI的眼科应用,有效的检测优选地允许显著增加采集速度。眼科应用的一个限制是根据ANSI标准允许进入眼睛的功率(在830nm处大约700微瓦)。眼科应用中的当前数据采集速度是每秒大约100-500个A-线。本发明的功率效率高的检测技术将允许每秒约100,000个A-线的量级的A-线采集速率,或以每个图像约3,000个A-线的视频速率成像。
为了实现至少一些本发明的目的,提供了根据本发明的一个示例性的实施例的设备和方法。具体而言,至少一个第一电磁辐射可以提供给样品,并且至少一个第二电磁辐射可以提供给非反射的参考。第一和/或第二电磁辐射的频率随着时间变化。在关联于第一电磁辐射的至少一个第三电磁辐射与关联于第二电磁辐射的至少一个第四电磁辐射之间检测干涉。可替换地,第一电磁辐射和/或第二电磁辐射具有随着时间变化的谱。所述谱在特定时间处可以包含多个频率。另外,有可能以第一偏振态检测第三电磁辐射与第四电磁辐射之间的干涉信号。此外,可以优选地以不同于第一偏振态的第二偏振态检测第三和第四电磁辐射之间的又一干涉信号。第一和/或第二电磁辐射可以具有中值频率以大于每毫秒100万亿赫兹(Tera Hertz)的调谐速度随时间基本上连续变化的谱。
在本发明的一个示例性的实施例中,第三电磁辐射可以是从样品返回的辐射,并且至少一个第四电磁辐射是从参考返回的辐射。第一、第二、第三和/或第四电磁辐射的频率可以移位。可基于所检测的干涉来生成图像。可以使用探头,其扫描样品的横向位置以生成扫描数据,并且将扫描数据提供给第三装置以便生成图像。扫描数据可以包括在样品上的多个横向位置获得的所检测的干涉。可以使用至少一个光电检测器和至少一个电滤波器,该电滤波器跟随着跟随有电滤波器的光电检测器。电滤波器可以是带通滤波器,其具有大约与通过频移装置的频移的量值相同的中心频率。电滤波器的传输特性(transmissionprofile)可基本上在其通带上变化。所述探头可包括旋转的接合和光纤导管。该导管可以以高于每秒30转的速度旋转。可以提供至少一个偏振调制器。
可以使用至少一个偏振分集(polarization diverse)接收和/或偏振分集和双平衡接收器。还有可能跟踪下列相位差:
·第一电磁辐射和第二电磁辐射之间,和/或
·第三电磁辐射和第四电磁辐射之间。
根据本发明的又另一示例性的实施例,可以发射第一和第二电磁辐射,它们中的至少一个具有中值频率以大于每毫秒100万亿赫兹的调谐速度随时间基本上连续变化的谱。
根据本发明的又一示例性的实施例,提供了一种设备。这样的设备包括至少一个第一装置,其将至少一个第一电磁辐射提供给样品并且将至少一个第二电磁辐射提供给参考。该设备还包括:至少一个第二装置,其适于移位第一电磁辐射和第二电磁辐射的频率;以及干涉计,其将第一和第二电磁辐射干涉以产生干涉信号。此外,该设备包括至少一个第二装置,该装置检测第一和第二电磁辐射之间的干涉。
此外,根据本发明的另一示例性的实施例,提供了一种系统、方法、软件设置(software arrangement)和存储介质以用于确定关联于组织的结构和组成中的至少一个的特定数据。具体而言,接收关联于干涉测量信号的信息,该信息形成自从样品获得的至少一个第一电磁辐射和从参考获得的至少一个第二电磁辐射。第一和/或第二电磁辐射被频移。采样该信息以生成第一格式的采样数据。此外,采样数据变换成第二格式的特定数据,第一和第二格式彼此不同。
附图说明
为了更全面地理解本发明及其优点,现在参考结合附图进行的下面的描述,其中:
图1是时域光学相干层析成像法(“OCT”)系统的块图;
图2是使用光谱雷达技术进行频域成像的系统的块图;
图3A是根据本发明的一个示例性的实施例使用相干单频调谐源进行频域成像的系统的块图;
图3B和3C是一起获取的波长相对于振幅的曲线图,其图示了由图3A的系统产生的频移的发生;
图3D是由图3A的系统生成的拍频信号(beat signal)的曲线图;
图4A是根据本发明的另一示例性的实施例的使用多纵模波长扫描源进行频域成像的系统的块图;
图4B和4C是一起获取的波长谱的曲线图,其图示了由图4A的系统生成的频移的发生;
图4D是由图4A的系统生成的拍频信号的曲线图;
图5是根据本发明的另一示例性的实施例的使用波长扫描源进行频域成像的系统的块图;
图6是根据本发明的一个示例性的实施例的光学波长可调谐滤波器装置的块图;
图7是根据本发明的一个示例性的实施例的波长扫描激光器装置的块图;
图8A是在图7的波长扫描激光器装置的输出处测得的激光输出光谱的示例性的曲线图;
图8B是在图7的波长扫描激光器的输出处测得的激光输出的示例性的曲线图;
图9A是根据本发明的再一示例性的实施例的带有多面镜(polygonal mirror)的波长可调谐滤波器装置的块图;
图9B是根据本发明的又一示例性的实施例的具有反射盘(reflective disk)的波长可调谐滤波器装置的块图;
图10A是根据本发明的又一示例性的实施例的包括波长扫描激光器和偏振分集平衡检测(“PDBD”)回路的光学频域成像(“OFDI”)系统的块图;
图10B是图10A中所示的示例性的探头装置的块图;
图10C是图示了使用图10A的系统的载频外差检测(carrier-frequencyheterodyne detection)的示例性输出的多个曲线图;
图11是使用本发明的示例性的实施例获得的人指尖的示例性的活体内图像;
图12是根据本发明的一个示例性的实施例的相位跟踪器装置的块图;
图13是根据本发明的具有相位跟踪器的OFDI系统的一个示例性的实施例的块图;
图14A-14C是图示了根据本发明的用于相位跟踪器操作的示例性的技术的流程图;
图15是根据本发明的另一示例性的实施例的OFDI系统的简化图;
图16(a)和16(b)是根据本发明的频移的效应、即深度相对于信号频率的曲线图;
图17是根据本发明的又一示例性的实施例的采用两个声光频移器的OFDI系统的块图;
图18(a)和18(c)是根据本发明的不用映射过程测得的点扩展函数的曲线图;以及
图18(b)和18(d)是根据本发明的利用映射过程测得的点扩展函数的曲线图。
在全部附图中,除非另外声明,相同的参考数字和字符用来指示图示的实施例的类似的特征、元件、部件或部分。而且,尽管现在将参考附图详细描述本发明,其也是与说明性的实施例相结合来进行的。
具体实施方式
图1示出了示例性的现有技术的时域光学相干层析成像法(“OCT”)系统10,其包括将信号提供给二对二分光器14的第一臂14a的宽带源12。分光器分割在端口14a提供给它的信号,并且在耦合到参考臂16的端口14b提供该信号的第一部分。分光器14还在耦合到样品臂18的端口14c提供该信号的第二部分。
样品臂18终结于样品体积19,并且用于提供样品体积的侧向扫描的装置22被设置在样品体积19之前的样品臂18中。参考臂16终结于用于提供轴向扫描的装置20中。装置20和22的操作在本领域中众所周知。
从装置20和样品体积19分别沿着参考和样品臂16、18反射回的信号耦合回到分光器14的相应端口14b、14c,并耦合到产生轴向扫描数据26的检测器24,这是众所周知的。其全部公开通过引用结合于此的美国专利6,341,036描述了与以上所述并在图1中示出的系统相似的系统。
一般而言,在扫描参考臂路径长度16时,形成了干涉条纹,其对应于与到样品体积19中的三个结构19a、19b、19c的距离匹配的位置。单个检测器24用来检测干涉条纹。通过条纹图案的包络检测,构造了图像26,其将组织反射率映射到给定位置。
如将根据在此下面所描述的某些示例性实施例而显而易见的,本发明的一个示例性的实施例涉及一种系统,其利用了基于光谱雷达概念(又称为谱域OCT)的检测原理和/或谱域和时域OCT之间的混合方法,该方法优选地比当前现有时域OCT灵敏,从而允许采集速度与分辨率的比的基本增加。
先前已在相关出版物中描述了时域OCT中的信噪比(“SNR”)的分析。时域OCT中的干涉条纹峰值振幅由下面给出:
其中Pref、Psample分别是以瓦表示的参考和样品臂功率。就检测器处的电功率而言,以单位[A2]表示的信号定义为:
其中η是量子效率,e是电荷量子,Ev=hc/λ是光子能量。参考和样品臂功率由相应的反射光谱密度给出:
Pref,sample=∫Sref,sample(ω)dω. (3)
假定参考和样品谱密度等于源谱密度S(ω),其中样品臂谱密度被衰减大的倍数,即Sref(ω)=S(ω)、Ssample(ω)=αS(ω),其中α<<1,并且将参考和样品臂的上述表达式插入信号的原始定义,得到:
对OCT信号的总噪声的三个贡献是:(i)热噪声,(ii)散粒噪声和(iii)相对强度噪声。热噪声由反馈电阻生成,散粒噪声与导致电流的统计波动的电荷量子的有限性质相关,并且相对强度噪声与由于经典光源的混沌特性的时间波动相关。以单位[A2/Hz]表示的这三个对噪声强度的贡献由下面给出:
k是玻尔兹曼常数,T是以开尔文表示的温度,Rfb是反馈电阻的值,τcoh是源的相干时间。相干时间通过下面的关系:与高斯源的半最大值处的全谱宽Δλ相关。当方程(5)中的第二项支配其它噪声贡献时,实现了散粒噪声受限检测。
信噪比(SNR)由下面给出:
其中BW是信号带宽,参数S和Nnosie(f)如上所述。
使用光谱仪和CCD阵列检测器的谱域OCT
当噪声是散粒噪声受限时,获得了时域OCT系统的最佳信噪比性能。散粒噪声可通过将单元件检测器替换为多元件阵列检测器来显著地减小。当在阵列检测器上谱色散检测臂光时,阵列的每个元件检测源的谱宽的小波长部分。散粒噪声优选地减小一个倍数,该倍数等于阵列元件数。信噪比改善的原理基于散粒噪声的白噪声特性以及仅相同波长的电磁波产生干涉条纹的观测。
散粒噪声功率密度Nnoise(f)(以单位[W/Hz]、[A2/Hz]或[V2/Hz]表示)与在检测器中生成的电流(或等价地,光功率乘以量子效率)成比例。对于进入干涉计的波长λI的单色束,检测器处的条纹频率或载波f由镜的速度v确定,f1=2v/λ1。散粒噪声与波长λI处的功率(或谱密度S(ω))成比例。第二波长λ2优选地耦合到干涉计中。第二条纹频率或频率f2=2v/λ2处的载波同时存在。此第二频率处的散粒噪声优选地是由波长λ1和λ2处的光功率生成的散粒噪声之和。而且,在频率fl处,散粒噪声是由波长λl和λ2处的光功率生成的散粒噪声之和。因此,在两个频率处,交叉散粒噪声(cross-shot noise)项由检测器处两个波长的同时存在而生成。通过将每个波长谱色散到一个单独的检测器,可以消除交叉散粒噪声项。以此方式,谱域OCT提供了优于时域OCT系统的信噪比的显著改善。
OCT信号在空间域中最容易描述。对于样品臂中的单个目标,OCT信号的干涉项与源光谱S(ω)的傅立叶变换的实部成比例:
I(Δz)oc Re∫exp(ikΔz)S(k)dk (7)
其中Δz是样品和参考臂之间的路径长度差,k是波矢。作为时间的函数,OCT信号由下面给出:
I(t)oc Re∫exp(2iωrv/c)S(ω)dω (8)
其中v是参考臂镜速度。该信号的频谱由时域中的信号的傅立叶变换给出,从而得到复函数。此函数的绝对值等于谱密度:
|I(f)|=|∫I(t)e2iπftdt|=S(πfc/v) (9)
其示出了信号带宽与源谱宽度成正比并且随着参考臂镜速度、即成像速度线性缩放。方程(9)还优选地将频谱的绝对值|I(f)|与信号S直接相关(见图4)。方程(9)还说明,光源的每个角频率或等价地该源的每个波长,以测得的干涉测量信号中的其自身的频率来表示。深度分布信息I(t)可以由傅立叶变换从复交叉谱密度|I(f)|获得。
复交叉谱密度还可通过使用色散或干涉测量元件将信号I(t)分裂成若干谱带来获得。在每个检测器处,只确定复交叉谱密度的部分。将每个检测器的交叉谱密度组合,重新得到信号的全谱密度。因此,可通过将谱分量分离到各个检测器来获得相同的信息。以软件或硬件将所有检测器的信号组合将导致与利用单个检测器获得的信号相同的信号。
在检测臂中,光谱可以分裂成二等分,其中两个检测器各检测光谱的一半。根据方程(9),检测器1和2处的频谱由下面分别给出:对于f<f0,|I1(f)|=S(πfc/v),对于f>f0,I1(f)=0,并且对于f<f0,I2(f)=0,对于f>f0,|I2(f)|=S(πfc/v)。时域OCT中将由单个检测器采集的频谱由I1(f)和I2(f)之和I(f)=I1(f)+I2(f)给出。因此,在将光谱组合之后的信号S是相等的,然而对于f>f0,I1(f)=0,对于f>f0,I2(f)=0,每个检测器的带宽BW可以减小1/2。
噪声由检测器一和二处的散粒噪声贡献之和来确定。根据方程(5)和(6),每个检测器的散粒噪声与检测器处的参考臂功率和用于检测器的带宽之积成比例。由于光谱被分裂成二等分,所以检测器1和2处的参考功率分别是:
对于两个检测器的散粒噪声贡献之和是:
其可以与时域OCT中的单个检测器的散粒噪声相比较:
因此,通过在两个分离的检测器上谱色散检测和光,信号保持相同,但噪声减小1/2,导致2倍的净SNR增益。
扩展上面的分析,可证明散粒噪声贡献减小等于检测器数目的因子。N个检测器元件的散粒噪声之和由下面给出,其中每个检测器元件接收总的参考功率的N分之一:
信号与时域OCT中相同,且谱域OCT的SNR比由下面给出:
因此,依赖于检测器元件N的数目,谱域OCT实现了一百到一千倍的优于时域OCT的SNR的改善。将电荷耦合阵列或积分器件用作检测器,诸如但不限于线扫描相机,比率N/BCW由阵列的积分时间τi来替换,这导致:
图2示出了示例性的谱域OCT系统100,其包括干涉计102、包括多个检测器的检测器阵列114以及同样多个放大器116,其中干涉计102具有源臂104、样品臂106、参考臂108和具有光谱分离单元112的检测臂110。放大器116通过任选的模拟处理电子器件(未示出,但对于本领域的普通技术人员是公知的)和用于转换信号的A/D转换器(未示出,但对于本领域的技术人员是公知的)并且通过数字带通滤波(“BPF”)单元122耦合到处理和显示单元124。
处理和显示单元124执行数据处理和显示技术,并且可任选地包括数字带通滤波(“BPF”)单元122以及数字快速傅立叶变换(“DFFT”)回路(未示出),以便提供信号的相干组合以及执行数据处理和显示功能。检测器阵列114可以是:1×N,用于简单强度测距和成像和/或多普勒灵敏检测;2×N,用于双平衡检测;2×N,用于简单强度测距和/或偏振和/或多普勒灵敏检测,或4×N,用于组合的双平衡和偏振和/或多普勒灵敏检测。可替换地,可以针对任意数目“M”的检测器114使用M×N阵列以允许有关样品130的横向空间信息的检测。
电磁辐射(例如光)从源沿着源臂104传输到分裂单元通路(splitting unit via)并在参考臂108和样品臂106之间分裂。光沿着样品臂传播到组织样品130以及通过参考臂108传播到依赖于波长的相位装置。光从样品和依赖于波长的相位装置向着分裂单元反射回,在该分裂单元处,至少部分反射光导向谱分离单元112(其可例如提供为光栅)。检测臂光由谱分离单元112色散,并且谱被成像到检测器阵列114上。通过使参考臂108的长度跨过距离λ/8,可以确定参考臂108和参考臂106光的交叉谱密度。处理和显示单元接收馈送到它的信号并进行交叉谱密度的傅立叶变换以生成深度分布信息。
图3A示出了根据本发明的一个示例性的系统的块图,其图示了使用单频调谐源的相干频率调制连续波(“C-FMCW”)系统的基本原理。可操作为频率啁啾激光器的单色激光器光70将光信号提供给耦合器72的输入72a。耦合器72将光信号分割到终结于参考镜82的参考臂80和终结于样品86的样品臂84。光顺着路径80、84传播并从参考镜82和样品镜86反射以经由耦合器72提供由光电检测器88检测的干涉信号。
如图3B-3D的曲线图所示,当分别在两个反射光信号90(图3B)和92(图3C)之间存在光学延迟时,可以在光电检测器88处检测到具有频率f的拍频信号94(见图3D)。在沿轴在样品中有多个反射点的情况下,干涉由具有与样品和参考镜中的反射(散射)点之间的光学延迟差成比例的频率的拍音(beat note)组成。每个拍频分量的功率与散射的反射率成比例。由此,样品的图像可以通过干涉数据的傅立叶变换来构造。
现在参考图4A-4D,其中提供了在上面描述并在图3A-3D中示出的具有相同参考标记的类似元件,根据本发明的一个示例性的实施例的光学频域成像(“OFDI”)系统包括波长扫描激光源95(在此也称为频率扫描源95),其将包括多个纵模的激光输出光谱提供给耦合器72的输入。耦合器72将馈送到它的信号分割到终结于参考镜82的参考臂80和终结于样品86的样品臂84。光信号从参考镜82和样品86反射以经由耦合器72提供由光电检测器88检测的信号的谱。
信号谱的中心(或中值)波长通过在该谱的前沿生成新的纵模和在该谱的后沿消除这些模在时间上加以调谐。
参考图3A-3D在上面描述的相同原理还可应用于使用波长扫描激光源95的OFDI技术。和C-FMCW系统(例如上面描述的图3A的系统)的情形相似,可以产生拍频信号94。在使用波长扫描激光源的OFDI系统的情形中,可以生成拍频信号94,其具有对应于分别来自参考和样品的光96和98的中心频率的差的拍频f。
纵模之间的频率间距应该基本上大于检测带宽。在数字化之前,模式拍频(相对强度噪声峰)可由诸如低通滤波器的适当电子滤波器去除。干涉信号94包含与光学延迟成比例的频率分量。而且,样品的图像可以通过数字化的干涉数据的傅立叶变换来构造。
在本发明的一个示例性的实施例中,可以提供波长扫描激光器95,其在激光腔内利用光学带通扫描滤波器来产生迅速扫描的多频率模式输出。结合图6和9A在下面描述根据本发明的示例性的滤波器。通过在激光腔内使用光学带通扫描滤波器,没有必要调谐激光腔长度来提供激光光谱的同步调谐。事实上,这样的装置不需要以与激光器的中心波长相同的速率来调谐激光器的纵腔模。
使用OFDI技术,图像的单个像素可以通过傅立叶变换从记录为一个A-扫描(A-scan)的持续时间内的时间的函数的信号来构造。这与TD OCT不同,在TD OCT中,单个像素从在一个A-扫描内的短时段测得的数据来构造。用来在相同的A-扫描时段内采集相同数目的数据的检测带宽对于TD和FD OCT二者大约是相同的。然而,与TD OCT相比,用于OFDI技术的傅立叶变换通过从在整个A-扫描时段内采集的很多数据构造单个像素而有效地改善了信噪比。此效应可导致“有效”检测带宽,该带宽是实际检测带宽的N倍。因此,可以将SNR提高到N倍,其中N是傅立叶变换中的(数字化的)数据点的数目。可示出散粒噪声受限情形中的SNR由下面给出:
然而,由于波长扫描源的窄带输出光谱,相对强度噪声(RIN)可显著地高于CW宽带光源的相对强度噪声。对于热光,RIN由1/Δv给出,其中Δv=c·Δλ/λ2是(瞬时)源输出的光学带宽。对于激光,RIN由不同的统计所引起并因此具有与热光不同的值。对于FD-OCT,具有低RIN水平的波长扫描激光器是优选的。具有多个纵模的激光可以具有与具有相同线宽的热光相似的RIN水平。在此情形中,抑制RIN的手段对于具有足够的SNR是关键的,如双平衡检测。
扫描源的使用导致具有减小的散粒噪声和其它形式的噪声的系统,该系统允许比当前的系统低得多的源功率或高得多的采集速率。增加的检测灵敏度允许实时成像。这样的成像速度可有助于诸如胃肠、眼科和动脉γ成像环境中的运动假象的问题。通过增加帧速率同时维持或改善信噪比,可使这样的假象最小化。本发明还使得人们能够利用OFDI技术筛选大面积的组织,并且允许使用此方法的临床上的可行筛选协议。
对于OFDI的眼科应用,有效的检测优选地允许采集速度的显著增加。眼科应用的一个可能限制是根据ANSI标准(在830nm处大约700微瓦)允许进入眼睛的功率。眼科应用中的当前数据采集速度是每秒大约100-500个A-线。功率效率高的检测将允许每秒约100,000个A-线的量级的A-线采集速率,或以每个图像约3,000个A-线的视频速率成像。
因为散粒噪声具有白噪声谱,所以实现了SNR的增益。频率ω(或波长λ)处的存在于检测器的信号强度只对频率ω处的信号有贡献,但是散粒噪声在所有频率处生成。通过使每个检测器的光学带宽变窄,可以减小每个频率处的散粒噪声贡献,同时信号成分保持相同。
图5示出了用于使用频域干涉测量法(“OFDI”)进行光学成像的系统99的一个示例性的实施例,系统99包括频率扫描源100,其发射窄带谱,该窄带谱的中心波长在源中的增益介质(gain medium)的带宽上、在时间上连续和重复调谐。瞬时发射谱由光源的多个频率模式组成。频率扫描源100可以以各种不同的方式提供,其中的一些在下面描述。例如,源100可提供自各种增益介质、可调谐波长滤波器、腔配置。器件和方法在本领域中是公知的,以提供迅速调谐的波长扫描激光源,诸如固态激光器、掺有活性离子的波导激光器和光纤激光器。还可使用模式锁定方案中的波长扫描激光器,其具有纵模拍频的谐波之间的频率区域中的较低相对强度噪声(RIN)的潜在优点。可在激光腔内或源的输出端口之后结合光学可饱和吸收器来降低RIN水平。
提供自扫描源100的光导向光纤耦合器102,光纤耦合器102将馈送到它的光分割到参考臂103和样品臂104中。在此示例性的实施例中,耦合器102具有90:10的功率分裂比,功率的90%导向样品臂。然而,本领域中的普通技术人员将理解还可以使用用于耦合器102的其它耦合比。在任何特定应用中使用的特定耦合比应选择为使得将一功率量提供给参考臂和样品臂二者以允许根据本发明的示例性系统的适当操作。
提供给样品臂的功率通过环行器111并照亮将通过横向扫描成像探头来成像的样品136。参考臂优选地提供固定的光学延迟。从参考镜124和从样品136中反射的光可通过相应的环行器110、111导向光纤分束器(或熔接耦合器(fused coupler))150并在彼此之间干涉以产生干涉信号。
理想的是,组合耦合器150在源的波长调谐范围上具有相等的分裂比,其具有最小的偏振依赖性和波长依赖性。与相等分裂的偏离导致双平衡检测的共模抑制比(“CMRR”)的减小。在一个实施例中,组合耦合器150优选地提供为体宽带分束器(bulk broadband beamsplitter)。本领域的普通技术人员将理解还可以使用其它类型的耦合器(包括但不限于波长平坦化光纤熔接耦合器)。
干涉信号由双平衡接收器151接收。接收器151的输出被提供到计算装置(例如数据采集板和计算机160),使得输出由计算机装置数字化并处理以产生图像。数据采集、横向扫描和波长调谐被同步控制。
图6示出了可以例如适于用作频率扫描源(诸如参考图5在上面描述的频率扫描源100)的示例性的光源100′,其提供自光学滤波器170,通过透镜172和光路174耦合到光源/控制器176(下文称为“光控制器176”)。光控制器176又可以耦合到一个或多个应用178。应用178可以例如对应于光学成像过程和/或光学成像系统、激光加工过程和系统、光刻法和光刻系统、激光地形系统、电信过程和系统。由此,提供自滤波器170和光控制器176的示例性的光源100′可以在多种不同应用中使用,在此描述其某些一般的实例。
如将在下面更详细地描述的,滤波器170允许光源100′操作为发射如此光谱的频率扫描源,该光谱的中心波长可在光控制器176的带宽上、在时间上连续和重复调谐。由此,光源100′可以具有包括光源/控制器176的多个频率模式的瞬时发射光谱。在此示例性的实施例中,光学波长滤波器170配置为反射型滤波器,其中输入和输出端口是相同的。由此,光路174可以例如提供为输入/输出光纤,并且透镜172可以对应于准直透镜。虽然示出图6中的滤波器170通过光控制器176耦合到一个或所有应用178,但是有可能将滤波器170直接耦合到一个或多个应用178。可替换地,有可能通过与光控制器不同的器件将滤波器170耦合到一个或多个应用178。
在根据本发明的该示例性的实施例中,光控制器176可包括许多专门适于传输具有宽频率(f)谱的光束(在一个实施例中,准直光束)的系统。具体而言,光束可包括可见光光谱(例如红、蓝、绿)内的多个波长。由光控制器提供的光束还可以包括限定在可见光光谱之外的多个波长(例如红外)。
如将参考图7在下面更详细地描述的,在本发明的一个示例性的实施例中,光控制器176可包括单向光传输环。在将在下面结合图9详细描述的另一示例性的实施例中,光控制器176可包括线性谐振器系统。滤波器170包括波长色散元件180,其适于从光控制器176接收光束以及将光束分离成多个不同波长的光,每个沿着一个光路导引,如所公知的。波长色散元件180可包括一个或多个元件,它们适于从光控制器176接收光束以及将光束分离成多个不同波长的光,每个沿着一个光路导引。波长色散元件180进一步操作成将多个波长的光以相对于光轴182的多个角方向或位移来导引。在本发明的一个示例性的实施例中,波长色散元件180可包括光色散元件,如反射光栅184。波长色散元件180可以可替换地提供为透射光栅(例如,诸如Dickson型全息光栅的透射型光栅)、棱镜、衍射光栅、声光衍射单元或一个或多个这些元件的组合。
波长色散元件180将每个波长的光沿着与光轴182成一角度的路径导向透镜系统186。每个角度由波长色散元件180来确定。透镜系统186可包括一个或多个光学元件,其适于从波长色散元件180接收分离波长的光以及将这些波长的光导引或指引和/或聚焦到位于束偏转器件188上的预定位置。可以控制束偏转器件188来接收一个或多个离散波长的光并选择性地将其沿着光轴182、通过透镜系统186重新导引会到波长色散元件180并回到光控制器176。此后,光控制器176可将接收的离散波长的光选择性地导向应用178的任何一个或多个。束偏转器件188可以以许多方式形成和/或设置。例如,束偏转器件188可提供自如此元件,其包括但不限于多面镜、设置在旋转轴上的平面镜、设置在检流计上的镜或声光调制器。
在图6中示出的示例性的实施例中,色散元件186包括衍射光栅184、透镜系统186(其具有用来形成望远镜193的第一和第二透镜190、192)和以多面镜扫描器194示出的束偏转器件188。望远镜193提供自具有4-f配置的第一和第二透镜190、192。望远镜193的第一和第二透镜190、192每个基本上以光轴182为中心。第一透镜190位于距波长色散元件180(例如衍射光栅184)的第一距离处,该距离大约等于第一透镜190的焦距F1。第二透镜192位于距第一透镜190的第二距离处,该距离大约等于第一透镜190的焦距F1与第二透镜192的焦距F2之和。在此示例性的设置中,第一透镜190可从波长色散元件180接收准直的离散波长的光,并且可以对准直的一个或多个离散波长的光中的每一个有效地进行傅立叶变换以提供投射到图像平面(见图6的标示的IP)的相等的一个或多个会聚束。图像平面IP位于第一和第二透镜之间并且位于距第一透镜的预定距离处,该预定距离由第一透镜的焦距F1来限定。在传播通过图像平面IP之后,会聚束(多个会聚束)形成由第二透镜接收的相等的一个或多个发散束。第二透镜操作成接收这一个或多个发散束以及提供具有相对于光轴182的预定角位移的相等数目的准直束,以便将准直束导引或指引到束偏转器件188的预定部分。
望远镜193配置成提供如上所述的许多特征,并且进一步配置成将来自光栅的发散角色散转换为第二透镜192之后的会聚角色散,这是滤波器170的适当操作所需要的。另外,望远镜193提供了有用的自由度,其控制调谐范围并减小了多面镜194处的束尺寸以避免削束(beam clipping)。
如图6中所示,多面镜194优选地根据相对于光轴的多面体的前镜面的角度仅反射回窄通带内的谱分量。所反射的窄带光由光纤174衍射和接收。
入射束相对于光轴的取向和多面镜194的旋转方向198确定波长调谐的方向:波长上(正)扫描或下(负)扫描。图6中的装置产生正的波长扫描。应当理解,尽管在图6中镜194示出为具有十二个面,也可以使用少于或多于十二个面。用于任何应用的特定数目的面依赖于特定应用的所需扫描速率和扫描范围。而且,镜的尺寸根据特定应用的需要来选择,这些需要考虑了包括但不限于镜194的可制造性和重量的因素。还应当理解,可提供具有不同焦距的透镜190、192。透镜190、192应选择为提供大约在镜194的中心点200处的焦点。
考虑从光纤准直器172入射到光栅的具有宽光谱的高斯束。众所周知的光栅方程表达为:λ=p·(sinα+sinβ),其中λ是光波长,p是光栅节距,α和β分别是该束相对于光栅的标称轴202的入射和衍射角。滤波器的调谐范围的中心波长由λ0=p·(sinα+sinβ0)给出,其中λ0是望远镜的光轴38和光栅法向轴之间的角度。可示出滤波器的FWHM带宽由(δλ)FWHM/λ0=A·(p/m)cosα/W给出,其中对于双通,m是衍射级,W是光纤准直器处的高斯束的1/e2-宽度。当确定了复光谱密度的实部时,测距深度z由定义。
滤波器的调谐范围基本上由透镜1 20的有限数值孔径限制。无削束的透镜1的接受角由Δβ=(D1-Wcosβ0/cosα)/F1给出,其中D1和F1是透镜1的直径和焦距。其经由Δλ=pcosβ0·Δβ与滤波器调谐范围相关。源自多面镜的多面性质的滤波器的一个重要设计参数是自由谱范围,其将在下面描述。传播通过透镜1 20和透镜2 22之后的谱分量将具有以相对于光轴38的角度β′的束传播轴:β′=-(β-β0)·(F1/F2),其中F1和F2分别是透镜1和透镜2的焦距。多面体具有由θ=2π/N≈L/R给出的面对面的极角,其中L是面宽度,R是多面体的半径,N是面的数目。如果入射光谱的β′的范围大于面角,即Δβ′=Δβ·(F1/F2)>θ,则多面镜可在给定时间向后反射多于一个谱分量。同时被反射的多个谱分量的间距,或自由谱范围可示出为(Δλ)FSR=pcosβ0(F2/F1)·θ。
在作为腔内扫描滤波器的应用中,如果增益介质具有均匀展宽,则激光器的调谐范围不能超过自由谱范围,因为激光器选择最高增益的波长。如果满足以下两个必要条件,则通过滤波器的激光调谐的占空比在原则上可以是100%而没有由削束引起的过多损耗:
和
第一个方程根据透镜192之后的束宽度应小于面宽度的条件得到。第二个方程根据的是分别在调谐范围的最低和最高波长204、206处的两个束不应在多面镜处彼此重叠,方程(1)中的S指示透镜192和多面体的前镜之间的距离。
在一个实验中,选择了具有下列参数的光学部件:
W=1.9mm,p=1/1200mm,α=1.2rad,β0=0.71rad,m=1,
D1=D2=25mm,F1=100mm,F2=45mm,N=24,R=25mm,L=6.54,S=5mm,
θ=0.26rad,λ0=1320nm。根据这些参数,可以计算理论FWHM带宽、调谐范围和自由谱范围:(δλ)FWHM=0.09nm,Δλ=126nm and(Δλ)FSR=74nm。(1)中的两个条件都有裕度地得到满足。滤波器的特性使用来自半导体光放大器(SOA)和光谱分析器的宽带放大器自发发射光来测量。光谱分析器以峰保持模式记录归一化(nonnalized)通过量(反射)谱,同时多面镜以其15.7kHz的最大速度旋转。测得的调谐范围是90nm,这充分小于126nm的理论值。此差异归因于望远镜的象差,主要是与来自光栅的束的相对大的角发散相关联的场曲。预期将通过使用最优化的透镜来改善象差。自由谱范围是与理论计算一致的73.5nm。FWHM带宽测量为0.12nm。考虑光学元件的象差和缺陷,与0.11nm的理论极限的差异可能是合理的。
图7示出了根据本发明的一个示例性的实施例的扩展腔半导体激光器208,其可包括滤波器210,滤波器210可以例如相似于参考图6在上面描述的滤波器170。滤波器210通过光导引元件212和光路214耦合到法拉第环行器216。在此示例性的实施例中,滤波器210包括光栅232和多面镜236。由此,滤波器210可以对应于基于多面体的滤波器。马达234驱动该镜。
此示例性的实施例的法拉第环行器216通过偏振控制器220、222耦合到增益介质224,增益介质224在一个示例性的实施例中可以是半导体光学放大器(例如SOA,Philips,CQF 882/e),其耦合到电流源226,电流源226将注入电流提供给SOA 224。腔内元件可以由例如单模光纤连接。两个偏振控制器220、222可对准腔内光的偏振态以对准到光栅232的最大效率的轴和SOA 224的最大增益的轴。
激光输出228可通过光纤熔接耦合器230的90%端口来获得。为了生成对潜在应用有用的同步信号,激光输出的5%可通过具有0.12nm的带宽的可变波长滤波器237来耦合并且被导向光电检测器238。在一个示例性的实施例中,滤波器的中心波长可以固定在1290nm。当激光器的输出波长被扫描过固定波长滤波器的窄带通带时,检测器信号生成短脉冲。同步脉冲的时序通过改变滤波器的中心波长来控制。
图8A示出了当多面镜(即图7中的镜236)以15.7kHz的速率旋转时,如通过光谱分析器以峰保持模式所测得的参考图7在上面描述的类型的激光器的输出光谱的曲线图240。在等于滤波器自由谱范围的73nm-宽度上,沿到沿的扫描范围可以从1282nm到1355nm。测得的光谱的类高斯分布,而不是方形分布,可能是由于由滤波器的偏振敏感性以及腔内的双折射引起的依赖于偏振的腔损耗。优选地调节偏振控制器以获得最大扫描范围和输出功率。
图8B示出了时域中的激光输出的曲线242。上迹线244对应于通过固定波长滤波器获得的同步信号。从面到面的功率变化的幅度小于3.5%。峰值和平均输出功率分别是9mW和6mW。应当提及,曲线240的y轴刻度必须根据时域测量来校准,因为光谱分析器由于激光调谐速度比光谱分析器的扫描速度快得多而只记录时均谱。
作为带内四波混合现象的结果,随着光通过SOA增益介质(例如图7中的SOA 224),腔内激光的光谱的频率下移可上升。在频率下移存在时,正波长扫描可便于激光光谱的调谐,并由此产生较高的输出功率。激光输出的峰值功率可以根据调谐速度来测量。负的调谐速度可通过翻转准直器的位置和光栅相对于光轴(例如图6中的轴182)的取向来获得。优选地使滤波器的物理参数在两个调谐方向上近似相同。由此,自频移和正调谐的组合动作允许获得较高的输出并且使得激光器以较高的调谐速度操作。因此,正波长扫描可以是优选的操作。输出功率可以随着增加的调谐速度减小。由此,对于减小功率输出对调谐速度的敏感度,短的腔长度可能是理想的。在此情形中,自由空间激光腔是优选的。
图9A示出了根据本发明的一个示例性的实施例的自由空间扩展腔半导体可调谐激光器250的一个示例性的实施例,其包括在衬底芯片254上制造的半导体波导252,其通过准直透镜256耦合到多面体扫描滤波器255。前面258可以被抗反射地涂覆,并且输出面260被切割(cleaved)或优选地利用电介质涂覆以具有最佳的反射率。激光器的输出262通过输出耦合透镜264来获得。准直透镜256、264优选地以非球面透镜提供。
滤波器255包括波长色散元件180′,其适于接收从透镜256导向它的束。波长色散元件180′可以相似于参考图6在上面描述的波长色散元件180。透镜系统186′可布置在波长色散元件180′和束偏转器件188′之间。波长色散元件180′和束偏转器件188′可以相似于参考图6在上面描述的波长色散元件180和束偏转器件188。透镜系统186′包括一对透镜187a、187b,它们优选地提供为具有低象差的消色差透镜,尤其是场曲和彗差。
同步输出可通过使用透镜266、针孔268和位于向后反射自多面体扫描器272的光的0级衍射路径上的光电检测器270来获得。当特定波长的光束的焦点扫描过针孔268时,该检测器生成短脉冲。其它类型的增益介质可以包括但不限于掺入稀土离子的光纤、Ti:Al2O3和Cr4+:镁橄榄石。
图9B示出了根据本发明的波长可调谐滤波器280的另一示例性的实施例,其可包括耦合到输入准直透镜282的光纤281,光学地耦合到衍射光栅284的聚焦透镜286,以及旋转盘288。衍射光栅284可以由诸如棱镜的其它角色散元件来替换。在一个示例性的实施例中,衍射光栅284可具有凹曲率,其焦距选择为使得无需聚焦透镜286。
优选地,多于一个反射器290可沉积在旋转盘288的表面288a上。优选地,反射器290包括周期地和径向地图案化的多个窄条。用于反射器的材料优选地是金。盘288可由轻重量的塑料或硅衬底构成。代替沉积在盘的顶表面的反射器,盘可具有随后有附着到盘后表面的单个反射器的一系列通孔。从光纤281入射,不同波长的光束在由光栅衍射和由透镜286(在那些包括透镜286的系统中)聚焦之后可以在盘的表面上被照射成一个线。优选地,仅撞击旋转盘的反射器的束可以向后反射并由光纤281接收。镜292可以用来方便束达到盘上。
透镜286到盘288的反射器的距离等于透镜的焦距F。从光栅方程可以示出,滤波器的调谐范围由Δλ=pcosβ0(D/F)给出,其中D指示条之间的距离。条的宽度w优选地使得基本上等于盘表面处的束斑尺寸ws:其中z=πws 2/λ。这导致由以下给出的FWHM滤波器带宽:(δλ)FWHM/λ0=A·(p/m)cosα/W,其中对于w>ws,滤波器带宽变得较大,且对于w<ws,滤波器的效率(反射率)通过削束而减小。入射束294相对于透镜286的光轴的取向和旋转方向288优选地确定波长调谐的方向(sense)。正波长扫描是优选地,其通过使盘288以如图9B所示的顺时针方向旋转来实现。
a.干涉计
图10A示出了根据本发明的用于使用频域干涉测量法进行光学成像的OFDI系统300的一个示例性的实施例,其包括频率扫描源301,频率扫描源301发射具有包括光源的多个频率模式的瞬时发射谱的光信号。源301可以例如提供为参考图4A、5、6、7、9和9B在上面描述的源中的一个。来自源301的光可以被导向光纤耦合器302,其将馈送到其的光分割到参考臂303和样品臂304中。
参考臂303优选地包括偏振回路306和环行器308。由此,光从源301通过耦合器302、偏振回路306和环行器308传播到任选的运动假象回路309。任选的运动假象回路309可以提供自透镜310,其将光导向频移器311、相位跟踪器312和色散补偿器314。光通过任选回路309并入射到参考镜316上。应当理解,回路309起到去除和减少运动假象的作用。还应当理解,回路309可包括元件310-314的全部,和/或回路元件310-314中的一个或多个。
样品臂304可包括环行器318。由此,发射自源301的光信号从源301通过耦合器302和环行器308传播到透镜320,透镜320将光导向扫描镜322。扫描镜322可提供自多种光学元件,包括但不限于检流计、压电激励器或另一功能上等效的器件。横向扫描器324耦合到扫描镜322和数据采集板和计算机326。数据采集板和计算机326还耦合到频率扫描源301。
图10A中示出的OFDI系统300还可包括偏振分集平衡检测(“PDBD”)回路334,其配置成从参考臂303和/或样品臂304接收信号。具体而言,参考臂303通过环行器308和偏振控制回路330连接到PDBD回路334的参考端口。相似地,样品臂304通过环行器318和偏振控制回路332连接到PDBD回路334的样品端口。
b.干涉计
样品臂304收集反射自组织样品328的光并且在偏振分集平衡检测(PDBD)回路334中与来自参考臂303的光组合以形成干涉条纹。
例如,OFDI技术不需要在时间上扫描参考臂中的光路长度。由此,在本发明的某些示例性的实施例中,可以优选地将参考臂提供为固定延迟参考臂。这样的固定延迟参考臂可以具有为本领域的普通技术人员所公知的各种配置。
参考臂303可以是反射和/或透射型,并且可将光从镜316返回。返回的光经由环行器308导向偏振控制回路330。类似地,来自样品338的反射光可经由环行器318导向偏振控制回路332。参考臂也可以是透射而没有反射。偏振控制回路330可用来将参考臂光的偏振态与样品臂光的偏振态相匹配。应使干涉计中的总的双折射最小化以便不引起依赖于波长的双折射。偏振控制器可以包括但不限于基于弯曲引起的双折射或压缩(squeezing)的光纤偏振控制器。
优选地,在参考和样品臂之间,色度色散应基本上匹配。强色散失配的结果可能是轴向分辨率的损失。任何残余的色散都有可能由适当的信号处理来补偿,如基于傅立叶变换之前检测器数据的插值的非线性映射。此映射还可以至少部分地通过调节波长扫描源的光学布局来完成。在源301包括多面体扫描器和望远镜的一个实例中,可调节多面体扫描器和望远镜之间的距离以在傅立叶变换之前将波长空间转换成波矢空间。
c.样品臂
对于某些OFDI应用,样品臂可以终结于光学探头或自由空间束,该光学探头包括切割的(成角度的、平的或抛光的)光纤。透镜336(诸如但不限于非球面的、梯度折射率的、球面的、衍射的、球状的、鼓状的等等)可用来将束聚焦在样品上或样品内。在探头中还可包含束导引元件(诸如但不限于镜、棱镜、衍射光学元件等等)以将聚焦的束导向样品上的所需位置。束的位置可以根据时间在样品上变化,从而允许二维图像的重构。改变聚焦的束在样品上的位置可以通过扫描镜322来完成。扫描镜322可以提供自例如许多不同的器件,包括但不限于检流计、压电激励器、电光激励器等等。
样品臂探头可以是具有内部运动元件的光纤探头,使得该运动在探头的近端启动,并且该运动通过运动转换装置(诸如但不限于线、引导线、速度计线缆、弹簧、光纤等等)传送到远端。光纤探头可以被封入光学透明的静止护套,其中光在远端退出探头。由此,扫描方式也可通过移动光纤来完成。例如,通过旋转光纤,或线性地平移光纤。图10B示出了探头359的一个示例性的实施例,其包括内线缆360(其可沿着探头的轴旋转或线性平移)、透明或半透明外护套362、远端光学器件364和转移的光(remitted light)366(其可以处于相对于导管的轴的任何角度)。
d.检测
PDBD回路334可以包括布置成提供双平衡检测的多个检测器370。在某些应用中,双平衡检测由于以下原因而可能是优选的。首先,大部分光源以相对低的频率生成1/f噪声(f=频率),并且平衡检测将消除1/f源噪声。其次,样品臂光与其自身的干涉项(即自相关项)可以出现在真信号项的顶部,其优选地是样品和参考臂之间的干涉。这样的自相关项可由差分技术来消除,并且平衡检测可以从测得的信号中消除此自相关项。第三,可减小RIN。
检测器370可以优选地包括光电二极管(诸如但不限于硅、InGaAs、延展(extended)InGaAs等等)。平衡检测可通过减去相对于最大和最小图案完全不同相的二极管信号来实施。两个检测器信号之间的差通过包括在PDBD回路334中的差动回路来获得并且通过跨阻放大器(“TIA”)360来放大。双平衡接收器可以进一步由低通或带通滤波器跟随以抑制检测带宽之外的噪声。
在本发明的此示例性的实施例中,双平衡检测可按如下实施。偏振分束器362从参考和样品臂接收信号并提供两个输出信号。这两个输出信号分别由两个非偏振分束器364a、364b进一步分裂。来自每个分束器364a、364b的输出由提供自四个检测器370的双平衡接收器来检测。而且,双平衡接收器的两个输出在计算机装置中数字化和处理以获得偏振分集。
接收器输出被提供给回路326,其采集馈送到其的信号并经由A/D转换器来数字化,并且在计算机中存储数字化的信号以便进一步的处理。TIA的带宽优选地与采样速率的一半匹配。TIA的增益优选地选择为使得最大接收器输出范围与A/D转换器的电压范围匹配。
e.处理
如果使用多于两个检测器,可选择性地减去信号并且可获得复谱密度。使用傅立叶变换,复交叉谱密度可转换为组织中的深度分布。用以处理复谱密度以获得深度分布信息的若干方法对于本领域的技术人员是公知的,这些方法诸如但不限于通过在参考臂中获得具有Pi/2相移的至少两个信号并然后通过这两个信号的某个线性组合重新连接复谱密度,或通过取谱密度的平方。
跟随着检测,模拟处理可包括跨阻放大器、低通(带通)滤波器和信号的数字化。然后此信号可通过傅立叶变换运算转换成作为深度的函数的反射率。数字处理包括数字化、频域或时域(FIR或IIR滤波器)的数字带通滤波以及用以恢复作为深度的函数的组织反射率的逆傅立叶变换。
在傅立叶变换之前,所检测的非线性波长坐标优选地转换成规则采样的波矢空间。典型地,利用重新采样的对信号零填充、傅立叶变换和逆傅立叶变换可用于重新映射。本领域中公知的其它插值方法,诸如数据的线性的、双线性的和三次样条插值也可用来将波长空间转换成规则采样的k空间。此映射也可部分地通过调节波长扫描源的光学布局来完成。在一个实例中,可调节多面体扫描器和望远镜之间的距离以在傅立叶变换之前将波长空间转换成波矢空间。
本发明的另一示例性的实施例可利用在下面描述的一个或多个技术来进一步增强成像的性能和功能性。这些技术并不限于使用多频率模式调谐源的OFDI技术,而可应用于使用单频调谐源的OFDI技术。
a.偏振分集
对于偏振衰落是问题的应用,可以使用偏振分集方案。用于偏振分集的各种配置在本领域中是公知的。
在图10A中示出的系统中,偏振分集回路按如下操作。偏振分束器362依赖于参考臂的光信号和样品臂光信号的偏振态来分离它们。优选地调节偏振控制器330,使得参考臂功率由偏振控制器以相等的量值来分裂。可假设样品臂功率的偏振态可由于探头或样品运动而随机地变化,因此通过偏振分光器的样品臂功率的分离比可随时间变化。然而,偏振分束器362的两个输出端口处的两个输出信号可由光电接收器检测,例如取平方或求和。所得到的信号独立于样品臂光的偏振态。
b.载频外差检测
光学频移器311可以处于参考臂303中以为载频外差检测而移位光学频率。结果,信号频带被移位该频移的量值。以此方式,可以避免DC周围的相对大的1/f噪声(f=频率)和RIN。频移器可以是但不限于声光频移器。在检测中,应使用合适的电子器件来解调载频。
使用频移器311的优势之一是,可以使有效测距深度加倍。这可以以电频域说明,如图10C中所示,在该图中曲线图380描绘了由源的瞬时输出谱给出的条纹可见度曲线。如果源的瞬时谱是高斯型的,则该可见度曲线具有高斯分布。曲线390描绘了电滤波器的传输效率分布,其针对定义为采样频率的一半的给定的Nyquist频率而最优化。图10C的(a)部分示出了一个典型的情况,其中在干涉计中没有频移器并且电滤波器是低通滤波器。因为正的和负的频带不可区分,所以分别与正的和负的频带关联的图像是重叠的。在此情况中,由于此模糊(ambiguity),仅一半的频率范围(零到fN)或(零到-fN)可使用。然而,使用频移器导致可见度曲线被移位fFS,如图10C的(b)部分中所示出的。利用带通滤波器(或低通滤波器),以fFS为中心的频带的两侧产生没有模糊的图像,导致与图10C的(a)部分相比两倍大的测距深度。
代替方顶带通滤波器,有可能使用斜率滤波器。在图10C的(c)部分中示出的实例中,滤波器390的传输效率曲线在其低频带具有指数上升(下降)的斜率。在衰减是显著的并且所得到的信号强度随深度衰退时,此滤波器可能是有用的。斜率滤波器可通过相对于较大深度处的信号有效地抑制来自表面的大信号来改善检测的动态范围。
c.参考臂延迟(相位跟踪和自动测距)
如上所述,OFDI技术不要求在时间上扫描参考臂中的光路长度。可以以本领域的普通技术人员所公知的各种配置来制作固定延迟的参考臂。参考臂可以是反射或透射型的。
在某些应用中,当需要较大的测距深度,而不增加数据采集速率或减小光源的瞬时线宽时,改变参考臂中的光学延迟的能力可能是有用的。这样的能力在距成像透镜和样品的前表面的距离可显著变化的临床研究中是有用的。这样的变化可由运动或由探测导管的不受控制的位置所引起。例如,血管内的旋转导管可具有在单个A-扫描上几个毫米的距离变化。
参考臂303中的机构可以允许扫描参考臂303的群延迟。此群延迟可由为本领域的普通技术人员所公知的许多技术中的任何一种来产生,诸如但不限于延伸光纤、使用压电变换器的自由空间平移扫描或经由基于光栅的脉冲整形光学延迟线。优选地,延迟可以由非机械的或无运动的装置引入。术语“非机械的”的意思是未利用机械上移动的部件。认为机械上移动的部件的不存在减少了使用机械器件以引入延迟的公知的不足。与传统LCI或OCT系统对比,根据本发明的一个示例性的实施例的参考臂303不必在样品中的全部测距深度上扫描,并且可优选地至少在与一比检测器数目(1/N)相等的一个分数的测距深度上扫描。此扫描特征不同于在公知的LCI和OCT系统中使用的传统的延迟扫描方案。参考臂303任选地具有相位调制器机构,诸如但不限于声光调制器、电光相位调制器等等,以便生成载频。
优选地进行相位跟踪以消除干涉计中的相位不稳定。相位不稳定可引起各个干涉测量条纹在位置上移位。如果检测相对于条纹的移位是慢的,则所得到的平均导致干涉信号的啁啾。10到40kHz的A-扫描速率导致100到25μs的有效积分时间。应该补偿在比该积分时间短的时帧上的相位不稳定。相位锁定回路常用于电子器件,且频繁地用于雷达和超声。主动相位跟踪可通过在波长的一部分上利用参考臂中的电光相位调制器以10MHz调制干涉计路径长度差来实施。通过以路径长度调制的频率解调干涉计的输出处的一个检测器所测得的强度,可生成误差信号,其指示相位调制器应在哪个方向上移位以锁定到条纹幅度最大值上。通过如由误差信号所确定地将偏移添加到相位调制器,相位跟踪器主动地锁定到条纹最大值上。
相位调制器可在几个波长上调制路径长度差。处理单元可确定相位调制器是否已达到其范围极限,并且跳跃同相的全波以维持锁定在不同的条纹最大值上。此方法利用了相位应该仅以模2π来控制的事实。另外,所述处理驱动较慢的部件(例如迅速扫描光学延迟(“RSOD”)线)以将相位调制器/RSOD组合的路径长度范围扩展于若干毫米上。相位锁定可基于在调制回路中进行的混合类型对条纹最大值、最小值或零交叉进行。
本发明的另一示例性的实施例还可使用自动测距技术和方法,包括在美国专利申请出版号2002/0198457中描述的处理技术,其公开整体地通过引用由此结合于此。在一个示例性的实施例中,自动测距机构可以包括处理器单元,用于:(a)获得第一扫描线;(b)定位样品的表面位置“S”;(c)定位样品的最优扫描范围“R”;(d)修改参考臂延迟波形以提供输出;(e)将该输出输出到参考臂;(f)确定图像是否完整;和/或(g)如果图像不完整则移动到下一扫描线或如果图像完整则使用存储在存储器存储器件中的表面S数据和波形数据来重新映射图像。
如果从样品返回的光信号具有低的振幅,则相位锁定由于噪声的存在而可能是不稳定的。在本发明的另一示例性的实施例中,单独的、优选地是单色的光源可发射到干涉计中。该单独源的波长可以在OFDI源的波长调谐范围内或可以以与OFDI源光谱不同的波长为中心。该单独源优选地具有较高的功率,并且可以与源臂组合(使用波分、复用器、光栅、棱镜、滤波器等等)行进到参考和样品臂并返回到束复合元件。然后,在通过束复合元件(即分束器输出)透射回之后,返回的单独源的光可与OFDI光分离。分离装置可通过色散元件进行谱分离,该色散元件诸如二向色镜、滤波器、光栅、棱镜、波分复用器等等。所述单独源将通过使用一个或多个检测器来与OFDI光分开检测。由该单独源提供的较高功率可使得能够检测较高幅度的干涉图案,并且向相位跟踪器提供改善的输入,由此使得能够进行较稳定的相位跟踪。
现在参考图11,使用根据本发明的系统和过程的示例性的实施例,示出了以15.7kHz的A-线扫描速率采集的受检者的指尖的活体内图像(300*500像素)。测得光学灵敏度为约-100dB。SNR优于相同A-线扫描速率的等效TD OCT。当存在来自组织表面的强的类似镜的反射时,垂直线噪声由于未最优化的检测而产生,但应优选地通过检测最优化和/或适当的信号处理来基本上消除。
图12示出了根据本发明的相位跟踪器系统的另一示例性的实施例600,其提供了扩展的相位锁定范围。这通过将用以在小的范围内调制路径长度差的快速元件602(其可以例如以电光(EO)相位调制器602来提供)与用以在扩展的范围上调制路径长度的较慢元件604(其可以例如以迅速扫描光学延迟(RSOD)线604来提供)组合来实现。检测器606信号可以通过混合器610与相位调制器调制频率608混合并且被低通滤波(滤波器未示出)以生成误差信号。处理单元612优选地处理该误差信号以生成偏移电压,并将此偏移电压加到调制信号608,以便生成用于相位调制器驱动器614的输出。另外,处理单元612可生成到RSOD604的信号以在若干毫米的距离上提供相位的扩展范围跟踪。示出了光源616、光纤分光器618、样品臂620和参考臂622,并在此描述。
条纹图案的单个振荡内的给定时刻的检测器处的强度I(t)由下面给出:
I(t)=cos[φ(t)]
其中相位给出条纹中的位置。对于信号处于条纹最大值,对于 信号处于条纹最小值。在任意的时刻t,相位由下面给出:
φ(t)=α+βsin(ωt)
其中α描述了条纹图案的单个振荡内的位置,β*sin(ωt)是由相位调制器引入的相位调制,其中β是相位调制的振幅,ω是相位调制信号的频率。光电检测器处的强度I(t)可以与频率ω和2ω的载波混合,导致混合器信号MixerC(t)、MixerS(t)、Mixer2ωC(t)和Mixer2ωS(t):
MixerC(t)=cos(ωt)*cos(α+βsin(ωt));
MixerS(t)=sin(ωt)*cos(α+βsin(ωt));
Mixer2ωC(t)=cos(2ωt)*cos(α+βsin(ωt));
Mixer2ωS(t)=sin(2ωt)*cos(α+βsin(ωt)).
在MixerC、MixerS、Mixer2ωC和Mixer2ωS的载频ω的单个振荡上的时间平均由下面给出: 其中J1(β)和J2(β)是第一类贝塞尔函数;其值依赖于β,相位调制的振幅。由此,信号和与分别与sin(α)和cos(α)成比例,其中α是条纹图案的单个振荡内的位置。混合器输出和Mixer2ωC(t)被用作用以生成偏移电压的误差信号以将相位调制器指引到使误差信号最小的新的中心位置,并且将干涉计输出分别锁定在条纹最大值、或最小值、或零交叉上。现在复谱密度可通过两个连续的调谐扫描来确定,这两个扫描一个使误差信号sin(α)最小,下一个使误差信号cos(α)最小,导致两个干涉图案之间的90度的相移。使用此混合装置,复谱密度可迅速获得并且无须借助于用于改变参考臂光的相位的附加机械装置。
图13示出了OFDI系统的又一示例性的实施例700,其包括用于根据本发明提供平衡检测的相位跟踪器。在此示例性的实施例中,源702提供通过分光器704的电磁辐射(例如光),分光器704将光的一部分发送到样品探头706并且将光的剩余部分发送到迅速扫描光学延迟(“RSOD”)线708。光从RSOD 708传递到相位调制器PM 710。来自相位调制器PM 710的光传输通过分光器712,并然后通过两个附加的分光器714和716,其输出的一部分作为平衡检测输出发送到谱检测单元(未示出,但这里如别处所描述的),并且输出的剩余部分发送到相位跟踪器组件720。在相位跟踪器组件720中,相位跟踪器检测器D1和D2,722和724接收分光器对714和716的部分输出,其又将信号发送到混合器726以生成误差信号。处理单元728处理误差信号,在该处偏移电压的总和生成,并且将其加到调制信号730以产生用于相位调制器驱动器732的输出。在框730示出的调制信号被转发到混合器726和处理单元726。另外,条纹幅度可能太小使相位跟踪器难以锁定。可替换地,具有较长相干长度的二次源可耦合到例如系统700以将较大的条纹幅度提供到相位跟踪器。
图14A-14C示出了成像系统中用于跟踪相位的方法的一个示例性实施例,根据本发明,其在处理块750和752开始于测量接收自样品臂的信号并然后增加信号的相位。然后此示例性的方法的处理前进到块754,在块754中,定义为x1的信号的第一信号分区被测量于至少一个信号峰。在决策块756中,确定定义为x1的信号是否已被测量于至少一个信号峰。如果在决策块756中,确定定义为x1的信号已被测量于至少一个信号峰,则处理返回到块754并且再次测量信号。
另一方面,如果在决策块756中,确定定义为x1的信号没有被测量于至少一个信号峰,则处理流向决策块758,在决策块758中,确定是否调节信号。调节可以例如是将信号相位增加或减小一渐进量(incremental amount),如块760和762中所示。不管是否作出信号相位的增加或减小,处理返回到处理块754,在块754中,信号的第二信号分区被测量于其峰处。然后对于这样的被测信号,重复块756-762。应当注意,块750-762的功能可以与其它成像过程并行地和/或串行地进行。
相位的调节可定义为A(x2-x1),其中“A”是常数,并且确定是否将信号的相位增加或减小一个渐进量的过程可进一步包括下列子步骤:(1)确定A(x2-x1)是否在相位调制器的范围之内;和(2)如果A(x2-x1)在该范围内则以等于A(x2-x1)的量来改变或者如果A(x2-x1)在该范围外则以等于A(x2-x1)-m2π的量来改变其中M是大于1的整数。该方法可任选地进一步包括重新测量信号x1的子步骤(3)。
d.数据处理
一般而言,在时间上由检测器记录的数据可不以光学频率ω或波数k的严格线性函数来采样。然而,傅立叶变换可链接z和k空间(或t和ω)。由于k中的非线性采样,采集的谱被插值以在k域中产生均匀间隔开的采样。可替换地,激光器的调谐斜率可以以这样的方式来调节,即光在k空间以相等的间隔采样,使得插值变得不需要。可替换地,检测时序可设计成对均匀扩展在k域中的光采样,使得插入变得不需要。为了实现最优的点扩散函数,应优选地平衡干涉计的样品和参考臂中的色散。色散不平衡也可由数字处理校正。由运动引起的相位啁啾也可由数字处理校正。对于运动假象校正,测量样品的轴向运动,并且可根据运动的速度计算适当的非线性映射。
对于本领域的普通技术人员,各种插值技术是公知的。这包括但不限于简单的两点插值、由两点插值跟随的FFT零填充,以及利用由Nyquist定理规定的sinc函数的严格插值。
本发明的一个示例性的实施例还可提供用于定位血管中的动脉粥样硬化斑块(atherosclerotic plaque)的探头,其包括:干涉计;将接收自干涉计的信号分裂成多个光学频率的谱分离单元;以及能够检测接收自谱分离单元的光学频率的至少一部分的检测器装置。
e.频移技术
对于高速OFDI技术,最大测距深度有可能受到激光输出的相干函数的有限宽度的限制,因为相干长度经常被折衷以获得较高的调谐速度、较高的输出功率或较宽的调谐范围。有限的相干长度可使干涉条纹的可见度随着干涉计的路径长度差的增加而减小。这导致SNR的降级,并因此限制了最大测距深度。而且,在传统的干涉测量法中,不能区分正的和负的电频率可导致正和负深度之间的模糊。为了避免成像折叠假象,应调节干涉计的参考延迟使得图像只存在于正或负深度。对于源的给定相干长度,这进一步可限制测距深度。
为了避免这样的可能限制,已基于使用压电激励器、双折射板或3×3耦合器的主动或被动相位偏置测量了正交干涉信号。这些技术可另外提供与正和负深度关联的重叠图像,但由于产生稳定正交信号的困难而趋向于留下显著的残余假象。在此文中,我们提出和证明了一种简单的技术,其有效地消除了正和负深度之间的模糊。
根据本发明的示例性实施例的示例性技术在干涉计中使用光学频移器以提供检测器信号的恒定频移。这允许无串扰地使用相干范围的两侧,并可使测距深度加倍。相同的概念已在上面在使用58Hz的旋转双折射板或再循环频移环的1维光学频域反射测量法的情形下得到描述。在此示例性的实施例中,使用声光频移器,并且该技术应用于具有快若干数量级的测距速度的高速OFDI。而且,提供根据本发明的又一示例性的实施例的信号处理技术以在频移技术中适应非线性调谐斜率。
A.原理
频移
图15示出了根据本发明的OFDI系统的高层级的图,其包括波长扫描源95、在参考臂80中采用光学频移器311的单模光纤干涉计、光电检测器88和信号处理器160。利用参考臂中的往返频移(roundtrip frequency shift)Δf,与参考和样品光之间的干涉相关联的光电流可表达为:
其中η指示检测器的量子效率,Pr(t)和Ps(t)分别是参考和样品臂光的光功率,R(z)是样品的反射率分布,G(|z|)是对应于条纹可见度的相干函数,c是光速,ν(t)是光学频率,是后散射的相位。在线性调谐的情况下,即v(t)=0-1t,检测器信号的频率由下面给出:
零信号频率对应于深度z=cΔf/(2v1)。因此,通过选择与扫描源的调谐方向相同的频移的方向,可使得零信号频率指向负深度。图16(a)和16(b)图示了频移的效果。条纹可见度或相干函数在零深度处具有峰值并且随着深度增加而减小。相干长度zc指示可见度下降到0.5并由此SNR下降6dB的深度。人们可以可论证地将有效测距深度定义为SNR损失小于6dB的最大深度跨度。例如,在图16(a)中,可由于信号频率(阴影区)的符号模糊(signambiguity)而使用相干范围的单侧。相对照,如图16(b)中所示,借助合适的频移,可利用从-zc到zc的相干范围的两侧,而没有负和正深度之间的任何图像串扰。
非线性调谐
ν(t)中相对于时间的非线性度导致恒定深度处的信号的频率啁啾并且引起轴向分辨率的降级。作为对此问题的解决方案,检测器信号可以以补偿频率啁啾的非线性时间间隔来采样。可替换地,检测器信号可以以恒定的时间间隔来采样,并然后通过离散傅立叶变换(“DFT”)之前的插值将采样的数据映射到均匀ν空间。两种方法都已证明得到变换限制(transform-limited)轴向分辨率。然而,这些方法不直接适用于频移技术。非线性采样和插值方法两者都可导致频移的人工啁啾,导致次优的轴向分辨率。由此,经修改的插值方法可用来在整个测距深度上实现接近变换极限的轴向分辨率。该示例性的技术可如下:
步骤1:在源的每个波长扫描期间以均匀的时间间隔获得信号的N个采样。
步骤2:在电频域中产生N个数据点的DFT。
步骤3:分别分离对应于负和正深度的Δf之下和之上的两个频带。
步骤4:移位每个频带,使得零深度对准于零电频率。
步骤5:将零填充应用于每个频带并且进行逆DFT,得到对于每个频带具有较小时间间隔的时域中的增加数目的采样的数组。
步骤6:使用由扫描源的非线性度给出的适当映射函数将时域中的每个数组插值到均匀的ν空间中。
步骤7:执行每个被插值的数组的DFT。
步骤8:通过移位数组索引(array index)来将两个数组(图像)组合。
结果,零深度处在电频率Δf。
B.实验
OFDI系统
图17描绘了根据本发明的一个示例性的实施例的采用两个声光频移器(FS1 800和FS2 802,Brimrose Inc.AMF-25-1.3)的一个示例性的OFDI系统的实验装置。这两个频移器可利用压控振荡器来驱动以产生Δf=FS2-FS1的净移位。两个频移器的使用自动地平衡了声光晶体的材料色散。包括光纤耦合的每个器件的插入损失可小于2.5dB。数字化器的采样速率可以是10MHz。扫描激光器100可构造成提供从1271nm到1379nm(ν1=135GHz/μs)居中扫描的108nm的调谐范围。虽然可实现高达36kHz的重复速率,该激光器以7kHz的减小的速率来操作,并且在单个波长扫描期间采集了1300个采样。这导致对应于5MHz的Nyquist频率的图像中的5.8mm的深度跨度。探头810可包括检流计镜和成像透镜,其产生具有1.1mm的共焦参数的探测束。光学分接耦合器820可与窄带滤波器830和光电检测器834相结合地使用以在电路836中生成TTL触发信号。该TTL信号可用作模拟到数字的转换中的触发。
干涉信号可使用双平衡接收器151来测量。检测器信号在数字化之前使用低通电滤波器840来进一步处理。其它类型的电滤波器诸如带通滤波器和斜率滤波器。斜率滤波器的传输在其低频带中可具有指数上升(下降)的斜率。在衰减是显著的并且所得到的信号强度随深度衰退时,此滤波器可能是有用的。斜率滤波器可通过相对于较大深度处的信号有效地抑制来自表面的大信号来改善检测的动态范围。
为了表征扫描激光器100的相干函数,系统的点扩展函数可以在参考镜的各个位置利用部分反射器在Δf=0(FS1=-25MHz,FS2=-25MHz)处测量。为进行比较,在每个深度处采集的采样数据利用和不用映射过程来处理。图18(a)和18(b)示出了示例性的结果,其中y轴表示归一化于零频率处的值的DFT振幅的平方,且底部和顶部x轴分别表示信号频率和深度z。不用映射,由于我们的扫描激光器的非线性(见图18(a)),随着深度增加,点扩展函数遭受显著的加宽和大的峰值功率降级。然而,利用映射过程,扩展函数展现了如图18(b)中所示的接近变换极限的轴向分辨率。激光输出的有限相干长度是信号功率深度减小的原因。在5.8mm的整个深度跨度上,SNR减小了11dB以上。根据早先引入的用于有效测距深度的准则,对应于相干长度的深度可以仅为2.9mm,图像中总量的一半。利用Δf=-2.5MHz(FS1=-22.5MHz,FS2=-25MHz)的非零频移进行了相同的实验。图18(c)和18(d)分别示出了利用和不用映射过程测量的点扩展函数。如这些图中所示,发生于存在于2.5MHz频率的零深度处的信号功率的峰值至少大约等于净声光频移。在图18(d)中观测到的接近变换极限的轴向分辨率验证了映射技术。信号功率的减小在5.8mm的整个深度跨度上小于5dB,就扩展测距深度而言证明了频移技术的优势。
图像
利用OFDI系统进行了活体外(ex vivo)人肺组织的示例性的成像。图19描绘了两个图像,A和B,它们在除了对于A,Δf=0且对于B,Δf=-2.5MHz之外相同的实验条件下获得。每个图像使用上述的映射技术来获得。组织的表面以相对于探测束轴的一角度放置,且参考镜设置成使得信号存在于图像中的正和负深度。在A中,组织图像包含在2.8mm的有效测距深度中,即总深度跨度的顶部的一半。然而,样品位置的相对大的变化导致成像折叠假象。相对照,在B中,利用通过频移技术的增加到5.8mm的测距深度,可无模糊地显示整个正和负深度。
前面仅说明了本发明的原理。考虑这里的教导,对所描述的实施例的各种修改和变更将对于本领域的技术人员是明显的。由此应当理解,本领域的技术人员将能够设计这里未明确示出或描述的许多系统、装置和方法,实施本发明的原理,并由此在本发明的精神和范畴之内。
另外,下面的配置也在本发明的保护范围以内:
1.一种设备,包括:
至少一个第一装置,其将至少一个第一电磁辐射提供给样品并且将至少一个第二电磁辐射提供给非反射参考,其中由所述至少一个第一装置提供的辐射的频率随时间变化;以及
至少一个第二装置,其检测关联于所述至少一个第一电磁辐射的至少一个第三电磁辐射与关联于所述至少一个第二电磁辐射的至少一个第四电磁辐射之间的干涉。
2.根据附记1的设备,其中所述至少一个第三电磁辐射是从所述样品返回的辐射,并且所述至少一个第四电磁辐射是从所述参考返回的辐射。
3.根据附记1的设备,进一步包括至少一个第三装置,其用于移位所述至少一个第一电磁辐射、所述至少一个第二电磁辐射、所述至少一个第三电磁辐射或所述至少一个第四电磁辐射中的至少一个的频率。
4.根据附记1的设备,进一步包括至少一个第三装置,其基于所检测的干涉生成图像。
5.根据附记4的设备,进一步包括探头,其扫描所述样品的横向位置以生成扫描数据,并且其将所述扫描数据提供给所述第三装置以便生成所述图像。
6.根据附记5的设备,其中所述扫描数据包括在所述样品上的多个横向位置获得的所检测的干涉。
7.根据附记1的设备,其中至少一个第二装置包括至少一个光电检测器和跟随着所述至少一个光电检测器的至少一个电滤波器。
8.根据附记3的设备,其中至少一个第二装置包括至少一个光电检测器和跟随着所述至少一个光电检测器的至少一个电滤波器。
9.根据附记8的设备,其中所述至少一个电滤波器是带通滤波器,其具有与通过所述频移装置的频移的量值大约相同的中心频率。
10.根据附记9的设备,其中所述电滤波器的传输特性基本上在其通带上变化。
11.根据附记5的设备,其中所述探头包括旋转接合和光纤导管。
12.根据附记11的设备,其中所述导管以高于每秒30转的速度旋转。
13.根据附记1的设备,进一步包括至少一个偏振调制器。
14.根据附记1的设备,其中所述至少一个第二装置能够检测所述第一和第二电磁辐射中的至少一个的偏振态。
15.根据附记1的设备,其中所述至少一个第二装置包括至少一个双平衡接收器。
16.根据附记1的设备,其中所述至少一个第二装置包括至少一个偏振分集接收器。
17.根据附记1的设备,其中所述至少一个第二装置包括至少一个偏振分集和双平衡接收器。
18.根据附记1的设备,进一步包括至少一个第三装置,用于跟踪至少下列之一之间的相位差:
·所述至少一个第一电磁辐射与所述至少一个第二电磁辐射,以及
·所述至少一个第三电磁辐射与所述至少一个第四电磁辐射。
19.根据附记1的设备,进一步包括发射特定辐射的装置,当所述至少一个第一装置基于所述特定辐射提供所述第一和第二电磁辐射时,所述特定辐射被提供给所述至少一个第一装置,其中所述第一和第二电磁辐射中的至少一个具有中值频率以大于每毫秒100万亿赫兹的调谐速度随时间基本上连续变化的谱。
20.一种方法,包括下列步骤:
将至少一个第一电磁辐射提供给样品并且将至少一个第二电磁辐射提供给非反射参考,其中所述第一和第二电磁辐射中的至少一个的频率随时间变化;以及
检测关联于所述至少一个第一电磁辐射的至少一个第三电磁辐射与关联于所述至少一个第二电磁辐射的至少一个第四电磁辐射之间的干涉。
21.一种设备,包括:
至少一个第一装置,其将至少一个第一电磁辐射提供给样品并且将至少一个第二电磁辐射提供给参考,其中所述第一和第二电磁辐射的至少一个具有随时间变化的谱,所述谱包含多个不同的纵模;以及
至少一个第二装置,其检测关联于所述至少一个第一电磁辐射的至少一个第三电磁辐射与关联于所述至少一个第二电磁辐射的至少一个第四电磁辐射之间的干涉。
22.根据附记21的设备,其中所述至少一个第三电磁辐射是从所述样品返回的辐射,并且所述至少一个第四电磁辐射是从所述参考返回的辐射。
23.根据附记21的设备,进一步包括至少一个第三装置,其用于移位所述至少一个第一电磁辐射、所述至少一个第二电磁辐射、所述至少一个第三电磁辐射和所述至少一个第四电磁辐射中的至少一个的频率。
24.根据附记21的设备,进一步包括至少一个第三装置,其基于所检测的干涉生成图像。
25.根据附记24的设备,进一步包括探头,其扫描所述样品的横向位置以生成扫描数据,并且其将所述扫描数据提供给所述第三装置以便生成所述图像。
26.根据附记25的设备,其中所述扫描数据包括在所述样品上的多个横向位置获得的所检测的干涉。
27.根据附记21的设备,其中所述参考是非反射的。
28.根据附记21的设备,其中所述谱的中值基本上线性地随时间变化。
29.根据附记28的设备,其中所述谱的中值的变化速率是至少1000nm/msec。
30.根据附记21的设备,其中所述谱以至少10kHz的重复速率重复地随时间变化。
31.根据附记21的设备,其中所述至少一个第一装置包括用以随时间改变所述谱的谱滤波器。
32.根据附记31的设备,其中所述谱滤波器包括随时间改变所述谱的多面体扫描器和谱分离装置。
33.根据附记21的设备,其中所述至少一个第一装置包括半导体增益介质,用于至少生成和放大电磁辐射之一。
34.根据附记23的设备,其中至少一个第二装置包括至少一个光电检测器和跟随着所述至少一个光电检测器的至少一个电滤波器。
35.根据附记34的设备,其中所述至少一个电滤波器是带通滤波器,其具有与通过所述频移装置的频移的量值大约相同的中心频率。
36.根据附记35的设备,其中所述电滤波器的传输特性基本上在其通带上变化。
37.根据附记25的设备,其中所述探头包括旋转接合和光纤导管。
38.根据附记37的设备,其中所述导管以高于每秒30转的速度旋转。
39.根据附记21的设备,进一步包括至少一个偏振调制器。
40.根据附记21的设备,其中所述至少一个第二装置能够检测所述第一和第二电磁辐射中的至少一个的偏振态。
41.根据附记21的设备,其中所述至少一个第二装置包括至少一个双平衡接收器。
42.根据附记21的设备,其中所述至少一个第二装置包括至少一个偏振分集接收器。
43.根据附记21的设备,其中所述至少一个第二装置包括至少一个偏振分集和双平衡接收器。
44.根据附记21的设备,进一步包括至少一个第三装置,用于跟踪至少下列之一之间的相位差:
·所述至少一个第一电磁辐射与所述至少一个第二电磁辐射,以及
·所述至少一个第三电磁辐射与所述至少一个第四电磁辐射。
45.一种方法,包括下列步骤:
将至少一个第一电磁辐射提供给样品并且将至少一个第二电磁辐射提供给参考,其中所述第一和第二电磁辐射中的至少一个具有随时间变化的谱,所述谱包含多个不同的纵模;以及
检测关联于所述至少一个第一电磁辐射的至少一个第三电磁辐射与关联于所述至少一个第二电磁辐射的至少一个第四电磁辐射之间的干涉。
46.一种设备,包括:
至少一个第一装置,其将至少一个第一电磁辐射提供给样品并且将至少一个第二电磁辐射提供给参考,其中由所述至少一个第一装置提供的辐射的频率随时间变化;
至少一个第二装置,其以第一偏振态检测关联于所述至少一个第一电磁辐射的至少一个第三电磁辐射与关联于所述至少一个第二电磁辐射的至少一个第四电磁辐射之间的第一干涉信号;以及
至少一个第三装置,其以第二偏振态检测所述第三和第四电磁辐射之间的第二干涉信号,其中所述第一和第二偏振态彼此不同。
47.根据附记46的设备,其中所述至少一个第三电磁辐射是从所述样品返回的辐射,并且所述至少一个第四电磁辐射是从所述参考返回的辐射。
48.根据附记46的设备,进一步包括至少一个第四装置,其配置成移位所述至少一个第一电磁辐射、所述至少一个第二电磁辐射、所述至少一个第三电磁辐射和所述至少一个第四电磁辐射中的至少一个的频率。
49.根据附记46的设备,进一步包括至少一个第四装置,其基于所检测的干涉生成图像。
50.根据附记49的设备,进一步包括探头,其扫描所述样品的横向位置以生成扫描数据,并且其将所述扫描数据提供给所述第四装置以便生成所述图像。
51.根据附记50的设备,其中所述扫描数据包括在所述样品上的多个横向位置获得的所检测的干涉。
52.根据附记46的设备,其中所述参考是非反射的。
53.根据附记46的设备,其中所述谱的中值基本上线性地随着间变化。
54.根据附记46的设备,其中所述至少一个第一装置包括用以随时间改变所述谱的谱滤波器。
55.根据附记54的设备,其中所述谱滤波器包括随时间改变所述谱的多面体扫描器和谱分离装置。
56.根据附记46的设备,其中所述至少一个第一装置包括半导体增益介质,用于至少生成和放大电磁辐射之一。
57.根据附记46的设备,进一步包括至少一个第四装置,其基于所检测的干涉生成图像,其中所述第一和第二偏振态彼此近似正交。
58.根据附记48的设备,其中至少一个第二装置包括至少一个光电检测器和跟随着所述至少一个光电检测器的至少一个电滤波器。
59.根据附记58的设备,其中所述至少一个电滤波器是带通滤波器,其具有与通过所述频移装置的频移的量值大约相同的中心频率。
60.根据附记59的设备,其中所述电滤波器的传输特性基本上在其通带上变化。
61.根据附记50的设备,其中所述探头包括旋转接合和光纤导管。
62.根据附记62的设备,其中所述导管以高于每秒30转的速度旋转。
63.根据附记46的设备,进一步包括至少一个偏振调制器。
64.根据附记46的设备,其中所述至少一个第二装置能够检测所述第一和第二电磁辐射中的至少一个的偏振态。
65.根据附记46的设备,其中所述至少一个第二装置包括至少一个双平衡接收器。
66.根据附记46的设备,其中所述至少一个第二装置包括至少一个偏振分集接收器。
67.根据附记46的设备,其中所述至少一个第二装置包括至少一个偏振分集和双平衡接收器。
68.根据附记46的设备,进一步包括至少一个第三装置,用于跟踪至少下列之一之间的相位差:
·所述至少一个第一电磁辐射与所述至少一个第二电磁辐射,以及
·所述至少一个第三电磁辐射与所述至少一个第四电磁辐射。
69.一种方法,包括下列步骤:
将至少一个第一电磁辐射提供给样品并且将至少一个第二电磁辐射提供给参考,其中所述第一和第二电磁辐射中的至少一个的频率随时间变化;
以第一偏振态检测关联于所述至少一个第一电磁辐射的至少一个第三电磁辐射与关联于所述至少一个第二电磁辐射的至少一个第四电磁辐射之间的第一干涉信号;以及
以第二偏振态检测所述第三和第四电磁辐射之间的第二干涉信号,其中所述第一和第二偏振态彼此不同。
70.根据附记69的方法,其中所述至少一个第三电磁辐射是从所述样品返回的辐射,并且所述至少一个第四电磁辐射是从所述参考返回的辐射。
71.一种设备,包括:
至少一个第一装置,其将至少一个第一电磁辐射提供给样品并且将至少一个第二电磁辐射提供给参考,其中所述第一和第二电磁辐射中的至少一个具有中值频率以大于每毫秒100万亿赫兹的调谐速度随时间基本上连续变化的谱;以及
至少一个第二装置,其检测关联于所述至少一个第一电磁辐射的至少一个第三电磁辐射与关联于所述至少一个第二电磁辐射的至少一个第四电磁辐射之间的干涉。
72.根据附记71的设备,其中所述中值频率以大于5千赫兹的重复率率重复地变化。
73.根据附记71的设备,其中所述中值频率在大于10万亿赫兹的范围内变化。
74.根据附记71的设备,其中所述谱具有小于100吉赫的瞬时线宽。
75.根据附记71的设备,进一步包括具有短于5m的往返长度的激光腔。
76.根据附记73的设备,所述谱的调谐范围的中心标称地以1300nm为中心。
77.根据附记73的设备,所述谱的调谐范围的中心标称地以850nm为中心。
78.根据附记73的设备,所述谱的调谐范围的中心标称地以1700nm为中心。
79.一种方法,包括下列步骤:
将至少一个第一电磁辐射提供给样品并且将至少一个第二电磁辐射提供给参考,其中所述第一和第二电磁辐射中的至少一个具有中值频率以大于每毫秒100万亿赫兹的调谐速度随时间基本上连续变化的谱;以及
检测关联于所述至少一个第一电磁辐射的至少一个第三电磁辐射与关联于所述至少一个第二电磁辐射的至少一个第四电磁辐射之间的干涉。
80.一种设备,包括:
至少一个第一装置,其将至少一个第一电磁辐射提供给样品并且将至少一个第二电磁辐射提供给参考,其中由所述至少一个第一装置提供的辐射的频率随时间变化;
至少一个第二装置,其适于移位所述至少一个第一电磁辐射和所述至少一个第二电磁辐射的频率;
干涉计,其将所述第一和第二电磁辐射干涉以产生干涉信号;以及
至少一个第二装置,其检测所述第一和第二电磁辐射之间的干涉。
81.一种用于确定关联于组织结构和组成中的至少一个的特定数据的系统,其包括:
处理装置,当执行预定技术时其配置成:
a)接收关联于干涉测量信号的信息,该干涉测量信号根据从样品获得的至少一个第一电磁辐射和从参考获得的至少一个第二电磁辐射来形成,其中所述第一和第二电磁辐射中的至少一个被频移,
b)对所述信息采样以生成第一格式的采样数据,以及
c)将所述采样数据变换为第二格式的特定数据,所述第一和第二格式彼此不同。
82.根据附记81的系统,其中所述第二格式具有表示基本上相同的电磁频率差的至少两个采样间隔。
83.根据附记82的系统,其中所述采样间隔的每个表示基本上相同的电磁频率差。
84.根据附记81的系统,其中步骤(c)包括对所述采样数据进行插值。
85.根据附记84的系统,其中所述第一和第二电磁辐射中的至少一个被频移一特定频率,以及其中所述插值包括将所述采样数据傅立叶变换为频域中的数组并且基于所述特定频率将该数组分离为至少两个频带。
86.根据附记85的系统,其中所述插值包括将所述采样数据傅立叶变换为频域中的数组,以及增加该数组的大小并将预定值插入所述数组的增加部分的每个元素中。
87.根据附记81的系统,其中所述处理装置进一步配置成基于所述特定数据生成所述组织的至少一个部分的图像。
88.根据附记87的系统,其中所述图像具有特定分辨率,其中关联于所述采样数据的电磁频率的谱与所述特定分辨率相关,以及其中所述特定分辨率基本上接近于所述电磁频率的谱的傅立叶变换极限。
89.根据附记85的系统,其中所述第二格式具有表示基本上相同的电磁频率差的至少两个采样间隔,以及其中所述特定频率的量值大于大约所述采样间隔中的至少一个的倒数的四分之一。
90.根据附记87的系统,其中所述第二格式是图像格式,以及其中所述图像基于经变换的采样数据。
91.根据附记84的系统,其中所述第二格式是包括近似恒定的k空间间隔的格式。
92.一种用于确定关联于组织结构和组成中的至少一个的特定数据的方法,包括下列步骤:
接收关联于干涉测量信号的信息,该干涉测量信号根据从样品获得的至少一个第一电磁辐射和从参考获得的至少一个第二电磁辐射来形成,其中所述第一和第二电磁辐射中的至少一个被频移;
对所述信息采样以生成第一格式的采样数据;以及
将所述采样数据变换为第二格式的特定数据,所述第一和第二格式彼此不同。
93.用于确定关联于组织结构和组成中的至少一个的特定数据的存储介质,所述存储介质维护其上的程序,该程序当由处理装置执行时配置成执行指令,包括:
接收关联于干涉测量信号的信息,该干涉测量信号根据从样品获得的至少一个第一电磁辐射和从参考获得的至少一个第二电磁辐射来生成,其中所述第一和第二电磁辐射中的至少一个被频移;
对所述信息采样以生成第一格式的采样数据;以及
将所述采样数据变换为第二格式的特定数据,所述第一和第二格式彼此不同。
94.一种设备,包括:
至少一个第一装置,其将至少一个第一电磁辐射提供给样品并且将至少一个第二电磁辐射提供给参考,其中所述第一和第二电磁辐射中的至少一个具有中值频率以大约15.7K赫兹的重复速率基本上连续变化的谱;以及
至少一个第二装置,其检测关联于所述至少一个第一电磁辐射的至少一个第三电磁辐射与关联于所述至少一个第二电磁辐射的至少一个第四电磁辐射之间的干涉。
95.一种方法,包括下列步骤:
将至少一个第一电磁辐射提供给样品并且将至少一个第二电磁辐射提供给参考,其中所述第一和第二电磁辐射中的至少一个具有中值频率以大约15.7K赫兹的重复速率基本上连续变化的谱;以及
检测关联于所述至少一个第一电磁辐射的至少一个第三电磁辐射与关联于所述至少一个第二电磁辐射的至少一个第四电磁辐射之间的干涉。
Claims (20)
1.一种设备,包括:
至少一个第一装置,其将至少一个第一电磁辐射提供给样品并且将至少一个第二电磁辐射提供给透射参考,其中由所述至少一个第一装置提供的辐射的频率随时间变化;以及
至少一个第二装置,其检测关联于所述至少一个第一电磁辐射的至少一个第三电磁辐射与关联于所述至少一个第二电磁辐射的至少一个第四电磁辐射之间的干涉。
2.根据权利要求1的设备,其中所述至少一个第三电磁辐射是从所述样品返回的辐射,并且所述至少一个第四电磁辐射是从所述参考传递的辐射。
3.根据权利要求1的设备,进一步包括至少一个第三装置,其用于移位所述至少一个第一电磁辐射、所述至少一个第二电磁辐射、所述至少一个第三电磁辐射或所述至少一个第四电磁辐射中的至少一个的频率,其中所述至少一个第三装置利用所述样品内的正负深度而没有串扰。
4.根据权利要求1的设备,进一步包括至少一个第三装置,其基于所检测的干涉生成图像。
5.根据权利要求4的设备,进一步包括探头,其扫描所述样品的横向位置以生成扫描数据,并且其将所述扫描数据提供给所述第三装置以便生成所述图像。
6.根据权利要求5的设备,其中所述扫描数据包括在所述样品上的多个横向位置获得的所检测的干涉。
7.根据权利要求1的设备,其中至少一个第二装置包括至少一个光电检测器和跟随着所述至少一个光电检测器的至少一个电滤波器。
8.根据权利要求3的设备,其中至少一个第二装置包括至少一个光电检测器和跟随着所述至少一个光电检测器的至少一个电滤波器。
9.根据权利要求8的设备,其中所述至少一个电滤波器是带通滤波器,其具有与通过频移装置的频移的量值相同的中心频率。
10.根据权利要求9的设备,其中所述电滤波器的传输特性在其通带上变化。
11.根据权利要求5的设备,其中所述探头包括旋转接合和光纤导管。
12.根据权利要求11的设备,其中所述导管以高于每秒30转的速度旋转。
13.根据权利要求1的设备,进一步包括至少一个偏振调制器。
14.根据权利要求1的设备,其中所述至少一个第二装置能够检测所述第一和第二电磁辐射中的至少一个的偏振态。
15.根据权利要求1的设备,其中所述至少一个第二装置包括至少一个双平衡接收器。
16.根据权利要求1的设备,其中所述至少一个第二装置包括至少一个偏振分集接收器。
17.根据权利要求1的设备,其中所述至少一个第二装置包括至少一个偏振分集和双平衡接收器。
18.根据权利要求1的设备,进一步包括至少一个第三装置,用于跟踪至少下列之一之间的相位差:
·所述至少一个第一电磁辐射与所述至少一个第二电磁辐射,以及
·所述至少一个第三电磁辐射与所述至少一个第四电磁辐射。
19.根据权利要求1的设备,进一步包括发射特定辐射的装置,当所述至少一个第一装置基于所述特定辐射提供所述第一和第二电磁辐射时,所述特定辐射被提供给所述至少一个第一装置,其中所述第一和第二电磁辐射中的至少一个具有中值频率以大于每毫秒100万亿赫兹的调谐速度随时间基本上连续变化的谱。
20.一种方法,包括下列步骤:
将至少一个第一电磁辐射提供给样品并且将至少一个第二电磁辐射提供给透射参考,其中所述第一和第二电磁辐射中的至少一个的频率随时间变化;以及
检测关联于所述至少一个第一电磁辐射的至少一个第三电磁辐射与关联于所述至少一个第二电磁辐射的至少一个第四电磁辐射之间的干涉。
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