CN105070715B - 半导体装置 - Google Patents

半导体装置 Download PDF

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Publication number
CN105070715B
CN105070715B CN201510507640.6A CN201510507640A CN105070715B CN 105070715 B CN105070715 B CN 105070715B CN 201510507640 A CN201510507640 A CN 201510507640A CN 105070715 B CN105070715 B CN 105070715B
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Prior art keywords
layer
insulating layer
electrode
oxide semiconductor
transistor
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Chinese (zh)
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CN105070715A (zh
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山崎舜平
小山润
今井馨太郎
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Semiconductor Energy Laboratory Co Ltd
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Semiconductor Energy Laboratory Co Ltd
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D87/00Integrated devices comprising both bulk components and either SOI or SOS components on the same substrate
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/67Thin-film transistors [TFT]
    • H10D30/674Thin-film transistors [TFT] characterised by the active materials
    • H10D30/6755Oxide semiconductors, e.g. zinc oxide, copper aluminium oxide or cadmium stannate
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/01Manufacture or treatment
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/421Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs having a particular composition, shape or crystalline structure of the active layer
    • H10D86/423Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs having a particular composition, shape or crystalline structure of the active layer comprising semiconductor materials not belonging to the Group IV, e.g. InGaZnO
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/60Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D88/00Three-dimensional [3D] integrated devices

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  • Thin Film Transistor (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Dram (AREA)
  • Recrystallisation Techniques (AREA)
CN201510507640.6A 2009-10-21 2010-09-27 半导体装置 Active CN105070715B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2009242689 2009-10-21
JP2009-242689 2009-10-21
CN201080047028.0A CN102598248B (zh) 2009-10-21 2010-09-27 半导体器件

Related Parent Applications (1)

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CN201080047028.0A Division CN102598248B (zh) 2009-10-21 2010-09-27 半导体器件

Publications (2)

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CN105070715A CN105070715A (zh) 2015-11-18
CN105070715B true CN105070715B (zh) 2018-10-19

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CN201510507640.6A Active CN105070715B (zh) 2009-10-21 2010-09-27 半导体装置
CN201410074885.XA Expired - Fee Related CN103794612B (zh) 2009-10-21 2010-09-27 半导体装置
CN201080047028.0A Expired - Fee Related CN102598248B (zh) 2009-10-21 2010-09-27 半导体器件

Family Applications After (2)

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CN201410074885.XA Expired - Fee Related CN103794612B (zh) 2009-10-21 2010-09-27 半导体装置
CN201080047028.0A Expired - Fee Related CN102598248B (zh) 2009-10-21 2010-09-27 半导体器件

Country Status (7)

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US (5) US20110089417A1 (enExample)
EP (1) EP2491585B1 (enExample)
JP (15) JP5586412B2 (enExample)
KR (3) KR101996773B1 (enExample)
CN (3) CN105070715B (enExample)
TW (3) TWI570889B (enExample)
WO (1) WO2011048929A1 (enExample)

Families Citing this family (193)

* Cited by examiner, † Cited by third party
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