KR100897575B1 - 포토리소그래피용 스핀-온-글래스 무반사 코팅 - Google Patents
포토리소그래피용 스핀-온-글래스 무반사 코팅 Download PDFInfo
- Publication number
- KR100897575B1 KR100897575B1 KR1020047007490A KR20047007490A KR100897575B1 KR 100897575 B1 KR100897575 B1 KR 100897575B1 KR 1020047007490 A KR1020047007490 A KR 1020047007490A KR 20047007490 A KR20047007490 A KR 20047007490A KR 100897575 B1 KR100897575 B1 KR 100897575B1
- Authority
- KR
- South Korea
- Prior art keywords
- grams
- moles
- carboxy
- triethoxysilane
- acetone
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/075—Silicon-containing compounds
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/22—Absorbing filters
- G02B5/23—Photochromic filters
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C17/00—Surface treatment of glass, not in the form of fibres or filaments, by coating
- C03C17/006—Surface treatment of glass, not in the form of fibres or filaments, by coating with materials of composite character
- C03C17/008—Surface treatment of glass, not in the form of fibres or filaments, by coating with materials of composite character comprising a mixture of materials covered by two or more of the groups C03C17/02, C03C17/06, C03C17/22 and C03C17/28
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C17/00—Surface treatment of glass, not in the form of fibres or filaments, by coating
- C03C17/28—Surface treatment of glass, not in the form of fibres or filaments, by coating with organic material
- C03C17/30—Surface treatment of glass, not in the form of fibres or filaments, by coating with organic material with silicon-containing compounds
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G77/00—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
- C08G77/04—Polysiloxanes
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G77/00—Macromolecular compounds obtained by reactions forming a linkage containing silicon with or without sulfur, nitrogen, oxygen or carbon in the main chain of the macromolecule
- C08G77/04—Polysiloxanes
- C08G77/12—Polysiloxanes containing silicon bound to hydrogen
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K5/00—Use of organic ingredients
- C08K5/0008—Organic ingredients according to more than one of the "one dot" groups of C08K5/01 - C08K5/59
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D183/00—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers
- C09D183/04—Polysiloxanes
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D183/00—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers
- C09D183/04—Polysiloxanes
- C09D183/06—Polysiloxanes containing silicon bound to oxygen-containing groups
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D183/00—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers
- C09D183/04—Polysiloxanes
- C09D183/08—Polysiloxanes containing silicon bound to organic groups containing atoms other than carbon, hydrogen, and oxygen
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/091—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers characterised by antireflection means or light filtering or absorbing means, e.g. anti-halation, contrast enhancement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
- H01L21/0274—Photolithographic processes
- H01L21/0276—Photolithographic processes using an anti-reflective coating
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/31504—Composite [nonstructural laminate]
- Y10T428/31652—Of asbestos
- Y10T428/31663—As siloxane, silicone or silane
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Materials Engineering (AREA)
- Health & Medical Sciences (AREA)
- Medicinal Chemistry (AREA)
- Polymers & Plastics (AREA)
- Wood Science & Technology (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Geochemistry & Mineralogy (AREA)
- General Chemical & Material Sciences (AREA)
- Architecture (AREA)
- Structural Engineering (AREA)
- Composite Materials (AREA)
- Optics & Photonics (AREA)
- Silicon Polymers (AREA)
- Paints Or Removers (AREA)
- Materials For Photolithography (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Surface Treatment Of Optical Elements (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/001,143 | 2001-11-15 | ||
| US10/001,143 US6824879B2 (en) | 1999-06-10 | 2001-11-15 | Spin-on-glass anti-reflective coatings for photolithography |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20050042069A KR20050042069A (ko) | 2005-05-04 |
| KR100897575B1 true KR100897575B1 (ko) | 2009-05-15 |
Family
ID=21694597
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020047007490A Expired - Fee Related KR100897575B1 (ko) | 2001-11-15 | 2002-10-31 | 포토리소그래피용 스핀-온-글래스 무반사 코팅 |
| KR1020047007485A Withdrawn KR20050042068A (ko) | 2001-11-15 | 2002-10-31 | 포토리소그래피를 위한 비반사 스핀-온-글래스 코팅 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020047007485A Withdrawn KR20050042068A (ko) | 2001-11-15 | 2002-10-31 | 포토리소그래피를 위한 비반사 스핀-온-글래스 코팅 |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US6824879B2 (enExample) |
| EP (1) | EP1478683A4 (enExample) |
| JP (3) | JP2005509914A (enExample) |
| KR (2) | KR100897575B1 (enExample) |
| CN (2) | CN1615333A (enExample) |
| AU (1) | AU2002336709A1 (enExample) |
| TW (2) | TWI324626B (enExample) |
| WO (1) | WO2003044079A1 (enExample) |
Families Citing this family (88)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6824879B2 (en) * | 1999-06-10 | 2004-11-30 | Honeywell International Inc. | Spin-on-glass anti-reflective coatings for photolithography |
| WO2000077575A1 (en) | 1999-06-10 | 2000-12-21 | Alliedsignal Inc. | Spin-on-glass anti-reflective coatings for photolithography |
| KR20040075866A (ko) * | 2001-11-15 | 2004-08-30 | 허니웰 인터내셔날 인코포레이티드 | 포토리소그래피용 스핀-온 무반사 코팅 |
| DE10227807A1 (de) * | 2002-06-21 | 2004-01-22 | Honeywell Specialty Chemicals Seelze Gmbh | Silylalkylester von Anthracen- und Phenanthrencarbonsäuren |
| CN1774673B (zh) * | 2003-04-17 | 2010-09-29 | 日产化学工业株式会社 | 多孔质下层膜和用于形成多孔质下层膜的形成下层膜的组合物 |
| ATE377036T1 (de) * | 2003-05-23 | 2007-11-15 | Dow Corning | Siloxan-harz basierte anti- reflektionsbeschichtung mit hoher nassätzgeschwindigkeit |
| JP4700929B2 (ja) * | 2003-06-03 | 2011-06-15 | 信越化学工業株式会社 | 反射防止膜材料、これを用いた反射防止膜及びパターン形成方法 |
| KR20060131735A (ko) * | 2003-10-07 | 2006-12-20 | 허니웰 인터내셔날 인코포레이티드 | 집적 회로 장치를 위한 코팅 및 하드 마스크 조성물, 생산방법 및 이들의 용도 |
| US8053159B2 (en) * | 2003-11-18 | 2011-11-08 | Honeywell International Inc. | Antireflective coatings for via fill and photolithography applications and methods of preparation thereof |
| JP5102428B2 (ja) * | 2003-11-25 | 2012-12-19 | ローム・アンド・ハース・エレクトロニック・マテリアルズ,エル.エル.シー. | 導波路組成物およびこれから形成された導波路 |
| US8901268B2 (en) | 2004-08-03 | 2014-12-02 | Ahila Krishnamoorthy | Compositions, layers and films for optoelectronic devices, methods of production and uses thereof |
| US7507521B2 (en) * | 2004-08-09 | 2009-03-24 | Intel Corporation | Silicon based optically degraded arc for lithographic patterning |
| US7687225B2 (en) * | 2004-09-29 | 2010-03-30 | Intel Corporation | Optical coatings |
| US8025927B2 (en) * | 2004-12-17 | 2011-09-27 | Dow Corning Corporation | Method for forming anti-reflective coating |
| ATE400672T1 (de) | 2004-12-17 | 2008-07-15 | Dow Corning | Verfahren zur ausbildung einer antireflexionsbeschichtung |
| KR101191098B1 (ko) * | 2004-12-17 | 2012-10-15 | 다우 코닝 코포레이션 | 실록산 수지 피복물 |
| JP4832955B2 (ja) * | 2005-06-07 | 2011-12-07 | 信越化学工業株式会社 | レジスト下層膜材料並びにそれを用いたパターン形成方法 |
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| EP1788436B1 (en) * | 2005-11-16 | 2013-01-09 | Shin-Etsu Chemical Company, Ltd. | Rework process for photoresist film |
| EP1989593A2 (en) * | 2006-02-13 | 2008-11-12 | Dow Corning Corporation | Antireflective coating material |
| JP2008026500A (ja) * | 2006-07-20 | 2008-02-07 | Dainippon Printing Co Ltd | 高ドライエッチング耐性ポリマー層を付加したフォトマスクブランクスおよびそれを用いたフォトマスクの製造方法 |
| WO2008099904A1 (en) | 2007-02-09 | 2008-08-21 | Nippon Shokubai Co., Ltd. | Silane compound, production method thereof, and resin composition containing silane compound |
| US8026040B2 (en) | 2007-02-20 | 2011-09-27 | Az Electronic Materials Usa Corp. | Silicone coating composition |
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| KR20100126295A (ko) | 2008-01-08 | 2010-12-01 | 다우 코닝 도레이 캄파니 리미티드 | 실세스퀴옥산 수지 |
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| KR20100134578A (ko) * | 2008-03-04 | 2010-12-23 | 다우 코닝 코포레이션 | 실세스퀴옥산 수지 |
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| US10429745B2 (en) | 2016-02-19 | 2019-10-01 | Osaka University | Photo-sensitized chemically amplified resist (PS-CAR) simulation |
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| US7270931B2 (en) | 2003-10-06 | 2007-09-18 | International Business Machines Corporation | Silicon-containing compositions for spin-on ARC/hardmask materials |
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-
2001
- 2001-11-15 US US10/001,143 patent/US6824879B2/en not_active Expired - Lifetime
-
2002
- 2002-10-31 EP EP02773961A patent/EP1478683A4/en not_active Withdrawn
- 2002-10-31 CN CNA028271661A patent/CN1615333A/zh active Pending
- 2002-10-31 JP JP2003545713A patent/JP2005509914A/ja active Pending
- 2002-10-31 KR KR1020047007490A patent/KR100897575B1/ko not_active Expired - Fee Related
- 2002-10-31 KR KR1020047007485A patent/KR20050042068A/ko not_active Withdrawn
- 2002-10-31 AU AU2002336709A patent/AU2002336709A1/en not_active Abandoned
- 2002-10-31 WO PCT/US2002/035101 patent/WO2003044079A1/en not_active Ceased
- 2002-11-12 CN CNA028271505A patent/CN1615332A/zh active Pending
- 2002-11-12 JP JP2003545712A patent/JP2005509913A/ja active Pending
- 2002-11-12 US US10/495,686 patent/US9069133B2/en not_active Expired - Lifetime
- 2002-11-15 TW TW091133495A patent/TWI324626B/zh not_active IP Right Cessation
- 2002-11-15 TW TW091133515A patent/TWI308585B/zh not_active IP Right Cessation
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2009
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JPH0656560A (ja) * | 1992-08-10 | 1994-03-01 | Sony Corp | Sog組成物及びそれを用いた半導体装置の製造方法 |
| US6174631B1 (en) * | 1997-02-10 | 2001-01-16 | E. I. Du Pont De Nemours And Company | Attenuating phase shift photomasks |
| WO2000077575A1 (en) * | 1999-06-10 | 2000-12-21 | Alliedsignal Inc. | Spin-on-glass anti-reflective coatings for photolithography |
Also Published As
| Publication number | Publication date |
|---|---|
| US6824879B2 (en) | 2004-11-30 |
| JP4703745B2 (ja) | 2011-06-15 |
| KR20050042069A (ko) | 2005-05-04 |
| TW200302259A (en) | 2003-08-01 |
| AU2002336709A1 (en) | 2003-06-10 |
| JP2009282524A (ja) | 2009-12-03 |
| TW200306342A (en) | 2003-11-16 |
| JP2005509913A (ja) | 2005-04-14 |
| KR20050042068A (ko) | 2005-05-04 |
| CN1615332A (zh) | 2005-05-11 |
| US20020095018A1 (en) | 2002-07-18 |
| TWI324626B (en) | 2010-05-11 |
| EP1478683A1 (en) | 2004-11-24 |
| TWI308585B (en) | 2009-04-11 |
| WO2003044079A1 (en) | 2003-05-30 |
| EP1478683A4 (en) | 2005-06-15 |
| CN1615333A (zh) | 2005-05-11 |
| US9069133B2 (en) | 2015-06-30 |
| US20140227538A1 (en) | 2014-08-14 |
| JP2005509914A (ja) | 2005-04-14 |
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