CN110619845A - 图像阵列中的局部化现象的修正 - Google Patents
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Abstract
本发明公开了补偿显示器件中的局部化现象的方法和系统。显示器包括像素阵列以及控制系统,控制系统用于调整像素阵列的内容数据信号,以补偿阵列中的像素的老化。控制系统经由至少一个像素的读输入部来测量阵列中的所述至少一个像素的参数。控制器通过使用参数确定局部化现象对像素的影响。经由至少一个像素的读输入部来测量阵列中至少一个像素的特性。调整所测量的特性以降低局部化现象的影响。控制器基于经过调整的所测量的特性来计算调整的老化补偿值。将老化补偿值应用至去往至少一个像素的数据内容信号。
Description
本申请是申请日为2014年12月06日、发明名称为“图像阵列中的局部化现象的修正”的申请号为201480074120.4专利申请的分案申请。
相关申请的交叉引用
本申请要求于2013年12月6日提交的美国临时专利申请61/912,926的权益,在这里将该在先申请的全部内容以引用的方式并入本文。
技术领域
本发明涉及诸如用于显示器面板中的半导体阵列之类的半导体阵列,且更具体地涉及用于补偿OLED显示器中的局部化现象的系统。
背景技术
可通过发光器件阵列来创建显示器,其中每个发光器件由各单独电路(即,像素电路)控制,这些单独电路具有晶体管以用于选择性地控制这些电路被编程有显示信息并根据显示信息发射光。可以将被制造于基板上的薄膜晶体管(TFT)组合到这类显示器中。TFT在显示面板中以及经过一段时间随着显示器的老化呈现出不均匀的性能。可以将补偿技术应用到这类显示器,以实现显示器上的图像一致性并消除显示器中的随着显示器老化的劣化。
在一些用于向显示器提供补偿以消除显示器面板中以及随时间的变化的方案中,利用监控系统来测量与像素电路的老化(即,劣化)相关的时间相关参数。接着,使用所测量的信息来通知像素电路的后续编程,以确保可通过对编程进行调整来消除任何所测量的劣化。这种被监控的像素电路可能需要使用额外的晶体管和/或线路以选择性地将像素电路连接到监控系统,并为信息的读取做准备。额外的晶体管和/或线路的组合可能不适宜地降低像素间距(即,像素密度)。
另一失真源可能是诸如由像素阵列显示的数据内容、温度影响、屏幕上的压力或入射光之类的局部化现象。例如,过高的局部化温度会导致补偿公式中出现失真的更高的输入数据,这会使对老化影响的修正发生失真。因此,在获得对这种像素的准确老化补偿时,用于像素的输入数据可能需要基于像素显示器上的局部化现象额外地补偿这些影响。
发明内容
一个公开示例为一种补偿显示器件中的局部化现象的方法,所述显示器件包括像素阵列以及控制器,所述控制器用于调整所述像素阵列的内容数据信号以补偿所述阵列中的像素的老化。测量所述阵列中的所述像素中的至少一者的参数。通过使用所述参数来确定局部化现象的影响。测量所述阵列中的所述像素中的至少一者的特性。调整所测量的特性以降低所述局部化现象的影响。基于经过调整的所测量的特性来计算调整的老化补偿值。将所述老化补偿值应用至去往所述像素中的至少一者的数据内容信号。
另一个公开示例为一种显示器件,所述显示器件包括显示器阵列,所述显示器阵列包括多个像素。所述多个像素均包括用于写入数据内容的写输入部以及读输入部。控制器连接至所述显示器阵列。所述控制器用于经由所述阵列中的所述像素中的至少一者的所述读输入部测量所述像素中的所述至少一者的参数。所述控制器用于通过使用所述参数来确定确定局部化现象对所述像素的影响。所述控制器用于经由所述阵列中的所述像素中的至少一者的读输入部测量所述像素中的所述至少一者的特性。所述控制器用于调整所测量的特性以降低所述局部化现象的影响。所述控制器用于基于经过调整的所测量的特性计算调整的老化补偿值。所述控制器用于将所述老化补偿值应用至去往所述像素中的至少一者的所述写输入部的数据内容信号。
对于本领域的普通技术人员来说,在阅读了各实施方式的详细说明之后,本发明的其它方面将变得更加清楚。上述详细说明是通过参照附图进行的,接下来将对这些附图进行简单说明。
附图说明
在阅读以下详细说明并参照附图之后,本发明的上述和其它优点将变得更加清楚。
图1示出了用于半导体显示器阵列的两种不同的像素架构。
图2是原始器件以及老化的且受温度影响的器件的电流与操作电压的关系曲线图。
图3是针对显示器内容中的局部化现象由参考像素的测量值之间的插值创建的参考图。
图4是示出了包括老化和局部化现象的影响的面板测量的原始结果的参考图。
图5是示出了在借助参考像素通过使用简单扣除方法从面板测量的原始结果中移除局部化现象的影响以消除局部化现象的影响之后的老化补偿结果的参考图。
图6示出了在半导体显示器阵列中使用的两种具有参考负载的变形像素结构,以用于修正局部化现象。
图7是示出了在借助参考负载从面板测量的原始结果中移除局部化现象的影响之后的老化补偿结果的参考图。
图8A是包括用于修正局部化现象的参考像素的显示器阵列的框图。
图8B是包括可用作参考像素的子像素的像素的框图。
图9是用于修正半导体阵列显示器中的局部化现象的方法的流程图。
虽然本发明可以容易地做出各种变形和替代形式,但在附图中以示例的方式示出了具体实施例并且在本文中详细说明了这些具体实施例。然而,应当理解,本发明不限于所披露的特定形式。相反,本发明覆盖了落入所附权利要求所限定的本发明的精神和范围内的所有变形、等同物和替代形式。
具体实施方式
图1示出了用于半导体显示器阵列(例如,OLED型显示器中使用的阵列)的两种像素架构。图1示出的第一像素架构100包括驱动电路102和串联连接在电压源(VDD)106与电压源(VSS)108之间的负载104。写入开关110允许来自输入线路112的数据被编程至驱动电路102。读取开关114允许监控线路116读取驱动电路102的输出。在本示例中,负载104是被像素驱动的负载或是使内部像素电路复位的负载。驱动电路102是向显示器阵列中的像素提供功率的电路的驱动部或放大部。
图1还示出的第二像素架构150包括驱动电路152和串联连接在电压源(VDD)156与电压源(VSS)158之间的负载154。写入开关160允许来自输入线路162的数据被编程至驱动电路152。读取开关164允许监控线路166读取驱动电路152的输出。在本示例中,负载154是被像素驱动的负载或是使内部像素电路复位的负载。驱动电路152是向显示器阵列中的像素提供功率的电路的驱动部或放大部。在像素架构100和150二者中,各个输入线路112和162和监控线路116和166连接至控制器,控制器通过由写入开关110和160控制的输入线路112、162对相应像素进行编程,并通过由读取开关114和164控制的监控线路116和166对相应像素进行监控。在本示例中,被驱动器102和152驱动的像素是有机发光器件(OLED),有机发光器件可以包括诸如具有可随时间变化的操作特性的薄膜晶体管之类的部件。
一种用于延长半导体阵列使用寿命和/或改善阵列一致性的方法是针对老化对OLED的影响进行外部补偿。在本示例中,通过控制器测量显示器阵列的底板和负载输入特性,并使用所述底板和负载特性数据来针对OLED的使用寿命和一致性进行补偿。
一些取决于由阵列显示的内容或取决于局部化环境问题的局部化现象影响可在基于所测量的输入特性数据的影响的老化补偿函数中引起偏差。例如,当将半导体阵列用于显示器件时,像素上所显示的内容能够影响整个显示器上的电压分布或局部化温度。因此,如果在显示不同内容期间测量底板和负载特性,所测量的特性会因局部化现象而出现差异。在这种情况下,补偿是以特性的累积变化为基础的,且因而补偿由于不同内容的局部化显示而随时间出现偏差并导致误差。局部化现象的另一示例可能是阵列中的某些像素的升高的温度,例如显示器的一部分暴露于日光。因日光而升高的温度可影响暴露于日光的区域中的像素的电压分布或局部化温度,并因此所测量的输入特性对于这些像素来说将出现差异。类似于内容影响,此补偿也是以特性的累积变化为基础的,且因此此补偿由于局部化温度影响而会随时间出现偏差并导致误差。
为了改善老化补偿性能,可以从所提取的特性中移除不期望的局部化现象影响。用于通过利用阵列上的至少一个像素的至少一个参数来确定局部化现象影响的三个示例性技术可以包括:a)基于像素特性进行建模;b)使用参考像素;以及c)使用参考负载。一旦确定了局部化现象影响,则可以从被输入至像素的老化补偿公式中的特性中将其移除。下面将对这些用于确定局部化现象影响的技术进行说明。
一个示例性技术通过使用建模来确定局部化现象影响。在该技术中,在诸如不同输入电流值之类的多个点处测量像素特性。可以在充分考虑局部化现象影响的设备操作时间段期间获取多个点。基于测量点,计算不同参数的变化。这类参数可以包括迁移率、阈值电压、OLED电压以及OLED关断电流。使用参数的变化并基于简化的模型(例如,温度差异、电压分布等)来计算局部化现象影响。根据模型的结果为阵列器件提取用于局部化现象的补偿值。
使用诸如图1中的架构100或150之类的显示器电路的测量参数对所计算的局部化现象进行微调。在一个示例中,选取主要受局部化现象(例如,迁移率)影响的参数来估计局部化现象。接着,计算所估计的局部化现象对在不同点处测量的其它参数(例如,关断电压(阈值电压漂移))的影响。将所测量的点输入至模型中以确定局部化现象影响。
例如,一阶模型可表明器件的迁移率(增益)每10℃变化了5%。因此,如果像素特性中的两个点的测量结果显示出迁移率变化了10%,则可以估计出温度变化了20℃。另外,通过了解温度变化对其它参数(例如,阈值电压)的影响能够估计出所测量的参数变化在多大程度上是由温度变化(20℃)引起的且在多个程度上是由老化引起的。
在另一个示例中,可以使用参数的变化率来提取局部化现象影响。例如,在与温度差异和内容相关的电压再分布的情况下,参数的变化很快,而老化过程缓慢。在一种情况下,低通滤波器可以移除测量中的所有快速变化,以消除局部化参数的影响。接着,可以将滤波后的特性测量用作老化补偿算法的输入。在另一种情况下,可以对所提取的参数使用低通滤波器,以便消除如下局部化现象影响,用于指示该局部化现象影响的变化与作为老化的结果而逐渐发生的变化相比快速地发生。
在另一个示例中,可以使用参数的变化率以及参数的与局部化现象的相关性来提取局部化现象影响。可以基于微调的局部化现象来修正补偿值。在前面的步骤中对各参数的局部化现象影响进行估计之后,例如,可以通过将参数与所估计的影响相减或相除来从这些参数中移除该影响。接着,可以将所修改的参数用于生成补偿值。例如,用于阈值电压漂移的补偿值可以是所提取的参数的漂移与输入信号的简单加和。
可以改变上述步骤的顺序。可选地,可以仅依靠所测量的参数来计算局部化现象。
图2为原始器件以及老化的且受诸如温度之类的局部化现象影响的器件的电流与操作电压的关系曲线图200。第一条线202示出了原始器件的电流与操作电压的关系绘图。第二条线204示出了受老化和温度影响的器件的电流与操作电压的关系绘图。从图2的线204可以看出,老化和温度会使器件的操作特性发生扭曲。在本示例中,由于老化影响,器件关断电压增加了0.5V,且因温度局部化现象,其增益增加了25%。因此,由于温度影响,受影响的器件具有较高的电流。可以基于许多不同技术来补偿受影响的器件的输出。然而,仅对老化进行补偿依然会因诸如温度之类的局部化现象而导致相对于原始器件的偏差。
为了消除该影响,基于建模,可以针对器件测量两个点来提取温度影响。接着,可以根据建模的结果来调整器件特性的测量,以消除温度影响。接着,可以将经过调整的所测量的特性输入至老化补偿技术中。在本示例中,在第一电流(点A)210和第二电流(点B)212处测量诸如操作电压之类的参数。如果使用电流-电压特性的线性模型,则可以根据两个操作电压点将增益变化提取为19%,并将关断电压变化提取为0.22V。所确定的增益变化是基于局部化现象的,并于是可以在确定用于像素器件的老化的补偿时用于修正所测量的输入特性。
然而,基于两个测量的电流-电压特性的更复杂的非线性模型的使用导致将增益变化确定为24.9%,并且将关断电压变化确定为0.502V。因此,取决于所需要的精度和可用的计算能力,可以使用不同模型来确定局部化现象影响,并从而确定老化补偿技术的所测量的输入特性的调整精度。为了建模结果的更高精度,可以在器件的多于两个的参数点上获得模型输出。至于对模型的输入,可以测量阵列上的每个像素的多个参数点,或者可以测量阵列中的相隔预定间隔的某些被选定的像素的多个参数点。
在确定局部化现象影响的第二种技术中,可以使用参考像素。图8A示出了面板显示器件800,该面板显示器件包括被控制器804控制的像素阵列802。控制器804经由地址驱动器806访问各个像素。经由数据驱动器808在像素阵列802上显示内容。通过电流供给和读出单元810供给并读取电流。供应电压控制部812调整被施加至像素阵列802中的像素的电压。
如图8A所示,面板显示器件800可以包括分布在像素阵列802中的普通像素820和一些参考像素830。普通像素820接收来自数据驱动器808的内容数据输入,并显示内容。参考像素830的结构与普通像素820相同。然而,由于参考像素830不与来自控制器804的数据输入连接,因此这种像素的状态保持不变。因此,由于参考像素830不与内容数据信号连接,因此它们不会老化,或者会以已知状态老化。在本示例中,经由电流读出单元810以相同方式测量普通像素820和参考像素830二者的参数。在参考像素830和靠近参考像素830的普通像素820之间测量的参数值的差值与局部化现象影响相关。例如,参考像素和普通像素的参数值之间的差值表示老化影响,这是由于普通像素会受老化影响,而参考像素却不会。在消除普通像素的参数值的差值之后得到的绝对参数值表示局部化现象影响,这是由于局部化现象会影响普通像素和非常靠近普通像素的参考像素二者。
基于对像素阵列802中的参考像素830的测量,可以制作用于整个像素阵列802的参考图。接着,可以使用参考图来针对像素阵列802中的各像素820确定局部化现象影响。
在一个示例中,参考图是基于参考像素测量值对所有其它像素的测量值的插值。在这种情况下,其它像素的测量值是通过使用与该像素相关的参考值来修正的(例如,对两个值进行相减或相除)。使用所得到的修正值来调整所测量的特性,其中所测量的特性被用于计算阵列中的像素的经过调整的老化补偿值。
在另一个示例中,参考图是基于参考像素参数对其它像素的提取参数的插值。每个像素的基于其自身的测量数据提取的参数是通过参考参数图调整的(例如,可以使用模型从所提取的参数中消除不期望的影响)。
可以在显示器件800在线或离线时对参考像素830进行参考测量。通常,由于参考像素不与内容数据输入连接,因此参考像素数量少于普通像素。因此,参考像素的数量限制了阵列中像素的显示区域。在本示例中,虽然每一个参考像素830对应四个普通像素820,但是也可以使用其它比例。将参考像素测量应用至靠近参考像素830的普通像素820的补偿。
为了代替与阵列中的参考像素相关的内容丢失,可以使用相邻像素来生成参考像素中丢失的内容。在图8B示出的一个示例中,像素阵列802可以包括多个像素单元,像素单元例如是均包含多个子像素的参考像素单元830。如上所说明,除参考像素830中的某些或所有子像素不与内容数据信号连接之外,参考像素单元830与普通像素单元820相同。图8A中的示例像素阵列802中的诸如像素单元830之类的每个像素单元具有诸如红色像素840a、绿色像素840b、蓝色像素840c以及白色像素840d之类的不同子像素。可以使用子像素840a-840d来生成来自普通像素单元820的彩色输出。在本示例中,如图8A所示,像素阵列802中的一些像素为参考像素。在诸如图8B示出的参考像素830之类的这类参考像素中,一个或多个子像素被用作参考像素,且如果像素单元正常操作,其它子像素可以生成将会在参考子像素上输出的内容。在这种情况下,参考像素可以是一个诸如白色像素840d之类的子像素。红色像素840a、绿色像素840b和蓝色像素840c可以生成被用作参考像素且因而不发射任何光的白色像素840d的白色内容。
图3-5示出了具有某个局部化现象的面板的老化算法的结果以及使用参考像素来最小化局部化现象影响的结果。在左上角处有意地使用散热器来冷却面板以模拟局部化现象,并且在面板上显示影响电压再分布的几幅图像。图3是针对显示器内容的局部化现象由参考像素的测量值之间的插值生成的参考图300。参考图300包括由靠近显示器的散热器的温度生成的局部化现象区域302。
图4是示出了包括老化和局部化现象影响(温度、电压再分布等)的面板测量的原始结果的参考图400。在本示例中,原始结果包括区域402中的温度局部化现象。
图5是示出了通过使用用于消除局部化现象影响的简单差分方法并借助参考像素(例如图8A-8B示出的参考像素)将局部化现象影响从面板测量的原始结果中移除之后的老化补偿结果的参考图500。可以将图5的区域502和图4中参考图400的区域402进行对比,从而显示出与局部化现象相关的影响已经被消除。
在用于确定局部化现象影响的第三种技术中,向阵列中的至少一些像素添加负载元件,以根据参考负载的测量来提取局部化现象。在该技术中,参考负载元件不因内容压力而老化,但像素架构的其它部件会基于被写入像素的内容数据而老化。将参考负载的特性与像素负载的特性进行对比。因此,可以将参考负载和像素负载之间的特性差值与局部化现象(例如,电压再分布、温度差异等)相关联。
图6示出了使用额外负载元件来补偿局部化现象的两种像素结构。图6示出了示例参考负载像素架构600和可选的参考负载像素架构650。第一参考负载像素架构600包括驱动电路602和串联连接在电压源(VDD)606与电压源(VSS)608之间的像素负载604。写入开关610允许来自输入线路612的数据被编程至驱动电路602。读取开关614允许监控线路616读取驱动电路602的输出。在本示例中,像素负载604是被像素驱动的负载或是使内部像素电路复位的负载。驱动电路602是向显示器阵列中的像素提供功率的电路的驱动部或放大部。参考负载620还连接至电压接地608并经由参考开关622连接至监控线路616。参考开关622可以由与控制写入开关610或读取开关614的信号相同的信号控制。可选地,可以使用单独的测量线路来控制参考开关622,以测量参考负载620。
可选的参考负载像素架构650包括驱动电路652和串联连接在电压源656与电压接地658之间的像素负载654。写入开关610允许来自输入线路662的数据被编程至驱动电路652。读取开关644允许监控线路666读取驱动电路652的输出。在本示例中,负载654是被像素驱动的负载或是使内部像素电路复位的负载。驱动电路652是向显示器阵列中的像素提供功率的电路的驱动部或放大部。参考负载670还连接至电压源656并经由参考开关672连接至监控线路616。参考开关672可以由与控制写入开关660或读取开关664的信号相同的信号控制。可选地,可以将单独的测量线路用于参考负载670。
在一个示例中,被施加至开关622或开关672的参考信号可以是分别被施加至读取开关614或664以对各像素驱动器602和652进行读取的读取信号。测量参考负载620或670的参数或特性,以将参数或特性与像素驱动器中的元素(element)进行比较。在本示例中,参考负载可以包括与显示器的实际像素(诸如驱动晶体管或像素电路)类似的部件。然而,参考负载并不包括实际像素架构的每个部件,因此不会如前述示例中那样,占据参考像素的空间。在对参考负载620或670的进行特性测量的过程中,像素自身可以被编程有信号截止状态,或者如果像素内容对参考负载的测量产生可忽略的影响,像素可被编程有其内容,并且由于各读取开关614和664处于打开状态,读取信号截止。
因此,在本示例中,可以经由各读取线路616和666来提取参考负载620或670的特性。在这种情况下,电源线(例如,VSS或VDD)的任何变化都将成为参考负载的测量数据的一部分。在本示例中,可以通过各读取线路616和666来提取像素负载604或654的特性。在提取过程中,参考开关622或672打开,因此不会读取参考负载620和670。将参考负载和像素负载的读取特性进行比较以确定局部化现象影响。
此外,如果任何其它局部化现象对参考负载造成影响,那么可以测量这些局部化现象。为了改善对局部化现象在像素和负载604或654的特性上的影响的修正,可以使用不同的参考负载元件。一些参考负载元件可以与负载604或654匹配,而另一些参考负载可以与像素驱动电路602或652匹配。在另一个示例中,可以使用不同的参考负载来测量不同局部化现象影响。取决于所需的精度和处理成本,显示器阵列中的一些或全部像素可以具有参考负载元件。可以在显示器件在线或离线时对参考负载元件进行参考测量。
图7是示出了在借助参考负载(例如图6中的结构600和650)将局部化现象影响从面板测量的原始结果中移除之后的老化结果的参考图700。参考图700示出了在与图6的架构中表示的面板相同的面板上使用参考负载的结果。由图7可以看出,由于参考负载的数量可以更多,因此该结果可具有更高的分辨率以及更小的插值误差,这与由相对数量少的参考像素限制的更少数量的数据相比导致更多的输入数据,而不会影响图像质量。
图9是补偿显示器阵列中老化以及局部化现象的方法的流程图。最初,采集相关的输入参数(900)。相关的输入参数可以是像素特性的点或者参考像素或参考负载的特性的测量的点。基于相关的输入参数或多个参数来确定局部化现象影响(902)。接着,测量阵列中的至少一个像素的特性,以用于老化补偿(904)。接着,对像素的测量特性进行调整,以降低局部化现象影响(906)。接着,将所调整的测量特性输入至补偿公式中,以计算调整的老化补偿值(908)。接着,应用补偿值来调整像素的数据内容信号,以补偿老化的影响(910)。
虽然已经图示和说明了本发明的特定实施例和应用,但应当理解的是,本发明不限于本文中所披露的精确的构造和组成,且在不偏离如所附的权利要求所限定的本发明的精神和范围的情况下,各种修改、改变和变化从前文的说明中是显见的。
Claims (15)
1.一种补偿显示器件中的局部化现象的方法,所述显示器件包括像素阵列和控制器,所述控制器用于调整所述像素阵列的内容数据信号以补偿所述阵列中的像素的老化,所述方法包括:
在第一时间测量所述阵列中的所述像素中的至少一个第一像素的至少一个特性;
在第二时间测量所述至少一个第一像素的所述至少一个特性;
使用在所述第一时间和所述第二时间测量的所述至少一个像素的所述至少一个特性来确定所述局部化现象对所述至少一个第一像素的影响;
基于所确定的所述局部化现象的影响来计算调整的老化补偿值;并且
将所述老化补偿值应用至去往所述像素中的所述至少一个第一像素的数据内容信号。
2.如权利要求1所述的方法,其中,基于所确定的所述局部化现象的影响来计算所述调整的老化补偿值的步骤包括从确定所述老化补偿值的输入特性中消除所确定的所述局部化现象的影响。
3.如权利要求1所述的方法,其中,确定所述局部化现象对所述至少一个第一像素的影响的步骤包括使用在所述第一时间和所述第二时间测量的所述至少一个像素的所述至少一个特性来确定所述至少一个第一像素的至少一个参数的变化。
4.如权利要求3所述的方法,其中,使用在所述第一时间和所述第二时间测量的所述至少一个像素的所述至少一个特性来确定所述至少一个第一像素的至少一个参数的变化的步骤包括将在所述第一时间和所述第二时间测量的所述至少一个像素的所述至少一个特性输入至所述至少一个第一像素的特性的模型。
5.如权利要求4所述的方法,其中,所述至少一个第一像素的所述特性的模型为非线性模型。
6.一种补偿显示器件中的局部化现象的方法,所述显示器件包括像素阵列和控制器,所述控制器用于调整所述像素阵列的内容数据信号以补偿所述阵列中的像素的老化,所述方法包括:
测量所述阵列中的所述像素的至少一个第一像素的至少一个元件的至少一个特性,所述至少一个第一像素包括至少一个参考元件,所述至少一个参考元件不参与所述像素的发光操作;
测量所述至少一个第一像素的所述至少一个参考元件的所述至少一个特性;
使用所述至少一个第一像素的所述至少一个元件的所述至少一个特性的测量结果和所述至少一个第一像素的所述至少一个参考元件的所述至少一个特性的测量结果,确定所述局部化现象对所述至少一个第一像素的影响;
基于所确定的所述局部化像素的影响来计算调整的老化补偿值;并且
将所述老化补偿值应用至去往所述像素中的所述至少一个第一像素的数据内容信号。
7.如权利要求6所述的方法,其中,基于所确定的所述局部化现象的影响来计算所述调整的老化补偿值的步骤包括从确定所述老化补偿值的输入特性中消除所确定的所述局部化现象的影响。
8.如权利要求6所述的方法,其中,所述至少一个第一像素的所述至少一个参考元件不因内容压力而老化,且所述至少一个第一像素的所述至少一个元件因内容压力而老化。
9.如权利要求6所述的方法,其中,确定所述局部化现象对所述至少一个第一像素的影响的步骤包括将所述至少一个第一像素的所述至少一个元件的所述至少一个特性的测量结果与所述至少一个第一像素的所述至少一个参考元件的所述至少一个特性的测量结果进行比较。
10.如权利要求6所述的方法,其中,所述至少一个第一像素的所述至少一个参考元件和所述至少一个第一像素的所述至少一个元件被制造为最初具有类似特性。
11.一种补偿显示器件中的局部化现象的方法,所述显示器件包括像素阵列和控制器,所述控制器用于调整所述像素阵列的内容数据信号以补偿所述阵列中的像素的老化,所述方法包括:
测量所述阵列中的所述像素的至少一个第一像素的至少一个特性;
测量所述阵列中的所述像素的所述至少一个参考像素的所述至少一个特性,所述至少一个参考像素靠近所述至少一个第一像素;
使用所述至少一个第一像素的所述至少一个特性的测量结果和所述至少一个参考像素的所述至少一个特性的测量结果,确定所述局部化现象对所述至少一个第一像素的影响;
基于所确定的所述局部化现象的影响来计算调整的老化补偿值;并且
将所述老化补偿值应用至去往所述像素中的所述至少一个第一像素的数据内容信号。
12.如权利要求11所述的方法,其中,基于所确定的所述局部化现象的影响来计算所述调整的老化补偿值的步骤包括从确定所述老化补偿值的输入特性中消除所确定的所述局部化现象的影响。
13.如权利要求11所述的方法,其中,所述至少一个参考元件不因内容压力而老化,且所述至少一个第一像素因内容压力而老化。
14.如权利要求11所述的方法,其中,确定所述局部化现象对所述至少一个第一像素的影响的步骤包括将所述至少一个第一像素的所述至少一个特性的测量结果与所述至少一个参考像素的所述至少一个特性的测量结果进行比较。
15.如权利要求11所述的方法,其中,所述至少一个参考元件和所述至少一个第一像素被制造为最初具有类似特性。
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US10755627B2 (en) | 2020-08-25 |
CN105934789B (zh) | 2019-09-24 |
DE112014005536T5 (de) | 2016-09-15 |
US20150161942A1 (en) | 2015-06-11 |
US10186190B2 (en) | 2019-01-22 |
US9761170B2 (en) | 2017-09-12 |
WO2015083138A1 (en) | 2015-06-11 |
US20190122606A1 (en) | 2019-04-25 |
CN105934789A (zh) | 2016-09-07 |
US20170345364A1 (en) | 2017-11-30 |
CN110619845B (zh) | 2023-10-31 |
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