JPH07508831A - 分子検出の為の光学的および電気的方法ならびに装置 - Google Patents
分子検出の為の光学的および電気的方法ならびに装置Info
- Publication number
- JPH07508831A JPH07508831A JP5519396A JP51939693A JPH07508831A JP H07508831 A JPH07508831 A JP H07508831A JP 5519396 A JP5519396 A JP 5519396A JP 51939693 A JP51939693 A JP 51939693A JP H07508831 A JPH07508831 A JP H07508831A
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- test site
- test
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- probe
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Abstract
Description
Claims (77)
- 1.下記の工程を具備する分子構造を特定化する為の方法:a)テスト部位のア レーを形成し、各部位は特定の分子構造との結合の可能なプローブをその中に形 成され、各テスト部位でのプローブが他のテスト部位のプローブとは異なり;b )テスト部位に試料物質を供給し; c)テスト信号をテスト部位に送り;およびd)送られた信号から生じるテスト 部位の特性を検出することにより、何れのプローブが試料物質の分子構造に結合 したかを判定して、多数の分子構造を識別する。
- 2.請求項1の方法において、テスト信号が電磁信号であり、且つ上記アレーを 下記の工程で形成する: a)基板の上の第1の層を形成し; b)第1層の上に第2の層を形成し; c)第1層の一部を露出する為に第2層中に第1層への開口を形成し;および d)開口の中に1対の電極を形成して、この電極に上記テスト信号を送る。
- 3.請求項2の方法において、上記1対の電極を形成する際に、開口が形成され た後に第2層上にメタライジングを施し;上記のメタライジングは、開口間の第 2層の表面上に上部電極を、第1層の露出した部分に下部電極を形成する。
- 4.請求項3の方法において、基板はシリコンを使用し、第1及び第2層はシリ コンを主成分とする誘電体を使用する。
- 5.請求項4の方法において、第1及び第2層は夫々SiO2及びSi3N4で あり、且つメタライジングはAI、Ti、Pt、W、Ta、及びそれらのケイ化 物又はAuを用いる。
- 6.請求項1の方法において、上記検出の工程は、テスト部位の誘電体的特性を 検出することを含む。
- 7.請求項1の方法において、電気信号を送る工程は、パルス化された又は周波 数の変化する信号を送ることを含む。
- 8.請求項1の方法において、各テスト部位は、電気信号の周波数域内で共振性 を持つ共振構造を用いて形成される。
- 9.請求項8の方法において、上記検出工程は、Qに於ける変化又は共振構造の 共振周波数の変化の検出を含む。
- 10.請求項1の方法において、上記試料物質は溶液又はゲルの中に在る。
- 11.試料物質の中の分子構造を特定化する為の下記の要件を具備する装置: a)試料物質を受け入れる為の基板上に形成されたテスト部位、しかも各テスト 部位はその中に行及び列電極を形成されており、且つ各部位に於いてそれぞれの 電極に延びる行及び列リードを持つ構造である; b)分子構造に結合する為の上記テスト部位に形成されたプローブ;c)テスト 部位の電極に電子信号を送る為の回路;及びd)何れのプローブが試料物質の分 子構造に結合したかを断定する為に、テスト部位の電気的性質を検出する回路。
- 12.請求項11の装置において、テスト部位の下に形成された抵抗のアレーを 含む。
- 13.請求項11の装置において、上記電極は、ベースから延びる多数の導電性 フィンガを含む。
- 14.請求項13の装置において、上記フィンガの間の間隔は約30ミクロン未 満である。
- 15.請求項14の装置において、上記多数の電極フィンガの第1のものは、上 記基板の中に形成された多数の凹部の下部に配置され、上記多数の電極フィンガ の第2のものは、上記第1フィンガの上の基板上に配置されている。
- 16.請求項11の装置において、上記プローブが、細胞プローブ、抗体プロー ブ又はペプチドプローブを含む基からの分子プローブを含む。
- 17.試料物質中の分子構造の存在を断定する為の下記の要件を具備する装置: a)試料物質を受け入れる為の基板上に形成されたテスト部位アレb)分子構造 に結合する為のテスト部位に形成されたプローブ;及び c)多数の検出器を持つ検出器アレーを備え、各検出器は該当のテスト部位に隣 接して配置され、しかも放射は上記テスト部位を通って伝播し、且つ結合された プローブを持つ部位ではプローブの結合されていないテスト部位とは異なった度 合いで吸収され、さらに、この吸収度合いの差異は上記検出器により感知されて 試料物質内の分子構造の存在を特定する為の信号を発信するために使用されてい る。
- 18.請求項17の装置において、上記テスト部位アレーは、検出器アレーとは 切り離すことの出来る使い捨ての可能なプレートを以って形成されている。
- 19.請求項17の装置において、テスト部位アレーが、検出器アレーと一体的 に形成されることにより、一体的な構造を形成する。
- 20.請求項18の装置において、使い捨てプレートは石英、ガラス、グラステ ックス、AIO3又はポリイミドにより形成されている。
- 21.請求項11の装置において、各テスト部位に於ける電極が、伝送ラインに より互いに接合されている。
- 22.試料物質の中に分子構造の存在することを決定する為の下記の要件を具備 する回路: a)基板; b)上記基板に形成されている多数のテスト部位;c)テスト部位の端々の中に 形成されている電極;d)電極の各々に延びるリード;及び e)該当のテスト部位に形成されるプローブを備え、各テスト部位の上記プロー ブが構造的に同じであり、且つ異なったテスト部位のプローブは該当の予め定め られた分子構造との結合の為に異なった構造である。
- 23.請求項11の装置において、更に、上記電極の一つにトランジスタスイッ チを介して接合されるアドレスリードを含む。
- 24.請求項17の装置において、放射が、テスト部位に於ける、放射性、蛍光 性又は化学発光性の標識により生成されている。
- 25.請求項17の装置において、放射が、テスト部位の光子照射により励起さ れた2次放射により生成されている。
- 26.請求項17の装置において、放射が赤外放射であり、且つ検出器は熱エネ ルギーを感知するものである。
- 27.必要な場所に分子プローブを合成する為の下記の要件を具備する装置: a)合成されるべき分子を含むテスト部位のアレー;b)選ばれた部位に光を照 射して、その選ばれた部位に於いて分子の合成を誘発させる光源。
- 28.請求項27の装置において、上記光が可視波長域に在り、且つ光化学合成 を生じさせるものである。
- 29.請求項27の装置において、上記光源が、テスト部位毎に走査されて局所 的な合成を誘発するさせるレーザである。
- 30.請求項27の装置において、上記光線が、選ばれたテスト部位の局所的な 加熱を誘発することにより、分子の熱合成を行わしめるものである。
- 31.請求項27の装置において、上記分子がオリゴヌクレオチド鎖を持つ。
- 32.必要な場所で分子プローブを合成する為の下記の要件を具備する装置: a)反応すべき前駆体分子を含むテスト部位のアレー;b)テスト部位アレーに 隣接する部位に配置され、且つ各抵抗を該当のテスト部位の近傍に持つ抵抗のア レー;およびc)各テスト部位に於いて、分子を合成する為の熱反応を誘発させ るために、各抵抗を加熱する電源に各抵抗を接続する接続手段。
- 33.請求項1の装置において、上記テスト部位アレー及び抵抗アレーが一体化 された構造として形成されている。
- 34.必要な場所に分子構造を合成する為の下記の要件を具備する装置: a)反応すべき前駆体分子を含むテスト部位のアレーを有し;b)各テスト部位 は、該当のテスト部位に於いて分子を合成する反応を誘発する為の電源に接続さ れた電極を含む。
- 35.請求項1の装置において、アレー及び電極は、一体化された構造として形 成されている。
- 36.物質中の分子構造の存在を決定する為の下記の要件を具備する装置: a)上記物質の供給源; b)各種の分子と特定の形で結合する既知の分子を含む溶液の多数の供給源; c)上記溶液の各々と上記物質とを選択的に混合する混合手段;および d)物質の中での既知の分子と分子構造との間の結合が、混合された溶液内で出 現するのを検出する検出器。
- 37.請求項36の装置において、検出器が光学的特性の変化を観察することに より結合を検出するものである。
- 38.請求項36の装置において、検出器が電気的特性の変化を観察することに より結合を検出するものである。
- 39.請求項35の装置において、多数の供給源が該当の毛細管に含まれ、しか も各毛細管は該当の供給源を上記物質の法れに接続するパルプを持つ。
- 40.請求項39の装置において、上記毛細管およびバルブはシリコン中に形成 され、且つ1から10ミクロンの範囲の直径を持つ。
- 41.分子構造を合成する為の下記の要件を具備する装置:a)テスト部位のア レー; b)テスト部位の近傍に配置された化学反応体の供給源;c)該当のテスト部位 に付随する電極;およびd)上記化学物質を該当のテスト部位に吸引する為に、 電圧を該当の電極に印加する手段。
- 42.合成されたプローブとターゲット分子との間のハイブリッド化を増やす為 の下記の要件を具備する装置:a)多数の上記プローブを含むテスト部位のアレ ー;b)上記部位に付随する電極; c)上記部位に与えられたターゲット分子の供給源;およびd)上記ターゲット 分子を上記プローブに吸引する為に、該当の電極に筆圧を印加する電圧源。
- 43.請求項11の装置において、テスト部位が、基板の中に形成された凹部を 含む。
- 44.請求項43の装置において、凹部が、肌理を持つ表面を以って形成されて いる。
- 45.請求項44の装置において、肌理を持つ表面が、波形である。
- 46.請求項45の装置において、電極の表面も波形である。
- 47.請求項15の装置において、下部に於ける電極フィンガと上部に於ける電 極フィンガとの間の間隔は、ターゲットDNA分子の溶液中の直径のオーダー( order)である。
- 48.請求項6の方法において、誘電体特性が誘電率である。
- 49.請求項37の方法において、電気的特性が誘電率である。
- 50.請求項1の方法において、試料物質が固体である。
- 51.請求項8の装置において、共振構造は伝送ラインであり、且つライン上を 伝播する信号の位相又は振幅に於ける変化が検出されるように構成されている。
- 52.試料物質の中の分子構造の存在を決定する為の下記の工程を具備する方法 : a)特定の分子構造に結合するプローブが形成されているテスト部位のアレーを 形成し; b)試料物質をテスト部位に供給し; c)テスト部位を通過する放射を発し;およびd)プローブに結合する分子構造 の存在を決定する為に、該当のテスト部位により吸収される放射の差異を検出す る。
- 53.請求項52の方法において、上記差異が、電荷結合素子(CCD)によっ て形成された検出器のアレーにより検出される。
- 54.請求項53の方法において、検出器のアレーが、テスト部位のアレーと一 体的に形成される。
- 55.請求項53の方法において、検出器のアレーは、テスト部位のアレーから 切り離して形成される。
- 56.請求項55の方法において、上記検出器のアレーが上記テスト部位のアレ ーと整合し、且つ放射がテスト部位を通過して検出器アレーに向かう。
- 57.請求項56の方法において、放射が、光子、又は放射性の素粒子の放射で ある。
- 58.請求項52の方法において、放射が、テスト部位の中で、放射性、化学的 、熱的、化学発光性又は蛍光性反応により生成される。
- 59.請求項52の方法において、検出器は、結合反応が生じる際の熱エネルギ ーを検出する。
- 60.請求項18の装置において、テスト部位が、プレートに形成された凹部の 中に形成された電極を含む。
- 61.請求項60の装置において、上記凹部の表面が肌理を持つ。
- 62.請求項61の装置において、肌理が波形を持つ。
- 63.請求項60の装置において、電極の表面が肌理を持つ。
- 64.請求項63の装置において、肌理が波形である。
- 65.基板の中に形成されたテスト部位へのプローブの取り付けの為の下記の工 程を具備する方法: a)基板の中にテスト部位を形成し; b)上記プローブを接着する為の接着材料を上記テスト部位に形成し;および c)上記プローブを上記接着材料に接触させる。
- 66.請求項65の方法において、不活性化層が接着材料を覆い、且つ不活性化 層の一部分が選択的に除去されることにより、プローブと接着材料との間の接触 を選ばれた部位に起こす。
- 67.請求項66の方法において、選択的に除去される部分がレーザ剥離により 除去される。
- 68.基板の中に形成されたテスト部位にプローブを付着する為の下記の工程を 具備する方法: a)基板の中にテスト部位を形成し; b)プローブをテスト部位に付着させることの出来る接着材料をテスト部位に形 成し; c)接着材料の上に保護コーティングを形成し;d)選ばれた部位に於ける保護 コーティングを除去する反応を、選ばれた部位に於いて起こさせながら、保護除 去剤をコーティングに接触させ;および e)保護を除去された部位にプローブを接触せしめて、プローブを接着材料に接 着する。
- 69.請求項68の方法において、プローブが予め合成され且つテスト部位が凹 部から成り、接着材料はエポキシであり、保護コーティングはエポキシを加水分 解することにより形成され、保護除去剤はアセテートのアルコール溶液であり、 且つ反応は予め選ばれた部位に於いて部位を加熱することにより起きる。
- 70.請求項68の方法において、反応は、選ばれたテスト部位を加熱する為に テスト部位に隣接して形成される抵抗に選択的に通電することにより、起きる。
- 71.請求項70の方法において、選ばれないテスト部位は、所望の反応温度以 上の温度に維持される。
- 72.請求項68の方法において、上記反応が、選ばれた部位を光を用いて照射 することにより起きる。
- 73.請求項72の方法において、上記光線が可視光線又は紫外線であり、且つ 光化学反応が起きる。
- 74.請求項72の方法において、上記光線が、テスト部位毎に走査されて反応 を引き起こすレーザから発している。
- 75.請求項72の方法において、上記光線が、テスト部位の局所的な加熱を誘 発することにより反応を引き起こす。
- 76.請求項72の方法において、上記光線は、選ばれた部位に光を投射する光 弁により生成される。
- 77.請求項27の装置において、光源が、選ばれた部位へ光を投射する光弁で ある。
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WO2002056011A1 (fr) * | 2001-01-12 | 2002-07-18 | Toray Industries, Inc. | Fibre d'immobilisation de substances selectivement hybridables, reseau de fibres comprenant un faisceau desdites fibres, procede d'hybridation selective, dispositif associe et base |
JP2002202303A (ja) * | 2000-12-27 | 2002-07-19 | Nikon Corp | 有機分子検出用半導体素子、有機分子検出用半導体装置及びこれを用いた有機分子の測定方法 |
JP2002522749A (ja) * | 1998-07-31 | 2002-07-23 | コミツサリア タ レネルジー アトミーク | 化学的または生物学的分析マルチポイントマイクロシステム |
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Also Published As
Publication number | Publication date |
---|---|
EP1143014A3 (en) | 2003-11-12 |
US5653939A (en) | 1997-08-05 |
EP0638173A1 (en) | 1995-02-15 |
WO1993022678A2 (en) | 1993-11-11 |
JP3711122B2 (ja) | 2005-10-26 |
DE69333687D1 (de) | 2004-12-16 |
EP1143016A2 (en) | 2001-10-10 |
WO1993022678A3 (en) | 1994-02-03 |
EP1143015A2 (en) | 2001-10-10 |
EP1143014B9 (en) | 2007-10-10 |
EP1143014A2 (en) | 2001-10-10 |
DE69333687T2 (de) | 2005-10-27 |
EP0638173B1 (en) | 2004-11-10 |
DE69334108T2 (de) | 2007-08-09 |
JP2003185662A (ja) | 2003-07-03 |
JP2004004064A (ja) | 2004-01-08 |
JP3447055B2 (ja) | 2003-09-16 |
US5846708A (en) | 1998-12-08 |
EP1143015A3 (en) | 2008-07-09 |
EP1143016A3 (en) | 2003-11-12 |
EP1143014B1 (en) | 2007-01-17 |
DE69334108D1 (de) | 2007-03-08 |
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