JP2011086921A - 半導体装置及び半導体装置の作製方法 - Google Patents

半導体装置及び半導体装置の作製方法 Download PDF

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Publication number
JP2011086921A
JP2011086921A JP2010205011A JP2010205011A JP2011086921A JP 2011086921 A JP2011086921 A JP 2011086921A JP 2010205011 A JP2010205011 A JP 2010205011A JP 2010205011 A JP2010205011 A JP 2010205011A JP 2011086921 A JP2011086921 A JP 2011086921A
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Prior art keywords
layer
electrode layer
oxide
oxide semiconductor
insulating layer
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Withdrawn
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JP2010205011A
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Japanese (ja)
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JP2011086921A5 (fr
Inventor
Shunpei Yamazaki
舜平 山崎
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Semiconductor Energy Laboratory Co Ltd
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Semiconductor Energy Laboratory Co Ltd
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Priority to JP2010205011A priority Critical patent/JP2011086921A/ja
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Publication of JP2011086921A5 publication Critical patent/JP2011086921A5/ja
Withdrawn legal-status Critical Current

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • H01L29/786Thin film transistors, i.e. transistors with a channel being at least partly a thin film
    • H01L29/7869Thin film transistors, i.e. transistors with a channel being at least partly a thin film having a semiconductor body comprising an oxide semiconductor material, e.g. zinc oxide, copper aluminium oxide, cadmium stannate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
    • H01L27/1214Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
    • H01L27/1222Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or crystalline structure of the active layer
    • H01L27/1225Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or crystalline structure of the active layer with semiconductor materials not belonging to the group IV of the periodic table, e.g. InGaZnO
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
    • H01L27/1214Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
    • H01L27/124Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Thin Film Transistor (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Electroluminescent Light Sources (AREA)
  • Manufacturing & Machinery (AREA)
  • Liquid Crystal (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Drying Of Semiconductors (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Weting (AREA)
  • Formation Of Insulating Films (AREA)
  • Recrystallisation Techniques (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Bipolar Transistors (AREA)
  • Noodles (AREA)
JP2010205011A 2009-09-16 2010-09-14 半導体装置及び半導体装置の作製方法 Withdrawn JP2011086921A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2010205011A JP2011086921A (ja) 2009-09-16 2010-09-14 半導体装置及び半導体装置の作製方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2009214485 2009-09-16
JP2010205011A JP2011086921A (ja) 2009-09-16 2010-09-14 半導体装置及び半導体装置の作製方法

Related Child Applications (1)

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JP2015173591A Division JP2016026386A (ja) 2009-09-16 2015-09-03 半導体装置

Publications (2)

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JP2011086921A true JP2011086921A (ja) 2011-04-28
JP2011086921A5 JP2011086921A5 (fr) 2013-10-31

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Family Applications (8)

Application Number Title Priority Date Filing Date
JP2010205011A Withdrawn JP2011086921A (ja) 2009-09-16 2010-09-14 半導体装置及び半導体装置の作製方法
JP2015173591A Withdrawn JP2016026386A (ja) 2009-09-16 2015-09-03 半導体装置
JP2017109991A Withdrawn JP2017152746A (ja) 2009-09-16 2017-06-02 半導体装置
JP2018187615A Active JP6758354B2 (ja) 2009-09-16 2018-10-02 半導体装置の作製方法
JP2020146728A Withdrawn JP2020194983A (ja) 2009-09-16 2020-09-01 半導体装置
JP2021190059A Withdrawn JP2022031780A (ja) 2009-09-16 2021-11-24 表示装置
JP2023185323A Pending JP2024016108A (ja) 2009-09-16 2023-10-30 表示装置
JP2023186247A Pending JP2024020259A (ja) 2009-09-16 2023-10-31 表示装置

Family Applications After (7)

Application Number Title Priority Date Filing Date
JP2015173591A Withdrawn JP2016026386A (ja) 2009-09-16 2015-09-03 半導体装置
JP2017109991A Withdrawn JP2017152746A (ja) 2009-09-16 2017-06-02 半導体装置
JP2018187615A Active JP6758354B2 (ja) 2009-09-16 2018-10-02 半導体装置の作製方法
JP2020146728A Withdrawn JP2020194983A (ja) 2009-09-16 2020-09-01 半導体装置
JP2021190059A Withdrawn JP2022031780A (ja) 2009-09-16 2021-11-24 表示装置
JP2023185323A Pending JP2024016108A (ja) 2009-09-16 2023-10-30 表示装置
JP2023186247A Pending JP2024020259A (ja) 2009-09-16 2023-10-31 表示装置

Country Status (5)

Country Link
US (5) US20110062433A1 (fr)
JP (8) JP2011086921A (fr)
KR (9) KR102246529B1 (fr)
TW (8) TWI488305B (fr)
WO (1) WO2011033915A1 (fr)

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013030730A (ja) * 2011-06-20 2013-02-07 Sony Corp 半導体素子およびその製造方法、表示装置ならびに電子機器
WO2013042696A1 (fr) * 2011-09-23 2013-03-28 Semiconductor Energy Laboratory Co., Ltd. Dispositif à semi-conducteurs
JP2013135003A (ja) * 2011-12-23 2013-07-08 Semiconductor Energy Lab Co Ltd 半導体装置、及び半導体装置の作製方法
JP2014103379A (ja) * 2012-11-20 2014-06-05 Samsung Display Co Ltd 表示装置
JP2014520396A (ja) * 2011-06-08 2014-08-21 シーブライト・インコーポレイテッド 改善されたソース/ドレイン接点を有する金属酸化物薄膜トランジスタ
JP2014199921A (ja) * 2013-03-14 2014-10-23 株式会社半導体エネルギー研究所 半導体装置およびその作製方法
JP2016072498A (ja) * 2014-09-30 2016-05-09 株式会社東芝 半導体装置
JPWO2015045213A1 (ja) * 2013-09-30 2017-03-09 株式会社Joled 薄膜トランジスタ基板及びその製造方法
JP2018046140A (ja) * 2016-09-14 2018-03-22 株式会社ジャパンディスプレイ 表示装置及びその製造方法
KR101908383B1 (ko) 2018-04-25 2018-12-11 삼성디스플레이 주식회사 유기발광표시장치 및 그 제조방법
JP2019054260A (ja) * 2012-12-25 2019-04-04 株式会社半導体エネルギー研究所 半導体装置の作製方法
JP2021505971A (ja) * 2017-12-19 2021-02-18 友達光電股▲ふん▼有限公司AU Optronics Corporation 金属構造、その作成方法及びそれを応用した表示パネル

Families Citing this family (72)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101719493B (zh) 2008-10-08 2014-05-14 株式会社半导体能源研究所 显示装置
JP5361651B2 (ja) 2008-10-22 2013-12-04 株式会社半導体エネルギー研究所 半導体装置の作製方法
KR101667909B1 (ko) 2008-10-24 2016-10-28 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체장치의 제조방법
EP2180518B1 (fr) 2008-10-24 2018-04-25 Semiconductor Energy Laboratory Co, Ltd. Procédé de fabrication d'un dispositif semi-conducteur
JP5616012B2 (ja) * 2008-10-24 2014-10-29 株式会社半導体エネルギー研究所 半導体装置の作製方法
US8741702B2 (en) 2008-10-24 2014-06-03 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
KR101782176B1 (ko) 2009-07-18 2017-09-26 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 반도체 장치의 제조 방법
KR101823852B1 (ko) * 2009-09-16 2018-03-14 가부시키가이샤 한도오따이 에네루기 켄큐쇼 트랜지스터 및 표시 장치
KR102246529B1 (ko) * 2009-09-16 2021-04-30 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR102321565B1 (ko) * 2009-09-24 2021-11-05 가부시키가이샤 한도오따이 에네루기 켄큐쇼 산화물 반도체막 및 반도체 장치
WO2011043163A1 (fr) * 2009-10-05 2011-04-14 Semiconductor Energy Laboratory Co., Ltd. Dispositif à semi-conducteur et procédé de fabrication de celui-ci
CN102648524B (zh) 2009-10-08 2015-09-23 株式会社半导体能源研究所 半导体器件、显示装置和电子电器
EP2486594B1 (fr) 2009-10-08 2017-10-25 Semiconductor Energy Laboratory Co., Ltd. Dispositif à couche semi-conductrice à oxyde
KR101820972B1 (ko) 2009-10-09 2018-01-22 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제조 방법
EP2491594A4 (fr) 2009-10-21 2015-09-16 Semiconductor Energy Lab Dispositif d'affichage, et dispositif électronique comprenant un dispositif d'affichage
KR101803554B1 (ko) * 2009-10-21 2017-11-30 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 제작방법
SG188112A1 (en) 2009-10-30 2013-03-28 Semiconductor Energy Lab Logic circuit and semiconductor device
KR20120102653A (ko) 2009-10-30 2012-09-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 반도체 장치의 제작방법
KR102223595B1 (ko) 2009-11-06 2021-03-05 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
KR102378013B1 (ko) 2009-11-06 2022-03-24 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 반도체 장치의 제작 방법
KR101787353B1 (ko) 2009-11-13 2017-10-19 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
WO2011065362A1 (fr) * 2009-11-27 2011-06-03 シャープ株式会社 Dispositif à semi-conducteurs et son procédé de fabrication
KR20120099475A (ko) 2009-12-04 2012-09-10 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
KR101396102B1 (ko) 2009-12-04 2014-05-15 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
CN102648525B (zh) 2009-12-04 2016-05-04 株式会社半导体能源研究所 显示装置
WO2011077916A1 (fr) 2009-12-24 2011-06-30 Semiconductor Energy Laboratory Co., Ltd. Dispositif d'affichage
KR101921619B1 (ko) 2009-12-28 2018-11-26 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치의 제작 방법
US8552425B2 (en) 2010-06-18 2013-10-08 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
KR101995082B1 (ko) 2010-12-03 2019-07-02 가부시키가이샤 한도오따이 에네루기 켄큐쇼 산화물 반도체막 및 반도체 장치
CN102096228B (zh) * 2010-12-17 2012-07-04 湖南创图视维科技有限公司 一种显示系统和显示方法
US9911858B2 (en) 2010-12-28 2018-03-06 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
US8829512B2 (en) 2010-12-28 2014-09-09 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
CN102543860B (zh) * 2010-12-29 2014-12-03 京东方科技集团股份有限公司 一种低温多晶硅tft阵列基板的制造方法
TWI492368B (zh) 2011-01-14 2015-07-11 Semiconductor Energy Lab 半導體記憶裝置
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WO2012133103A1 (fr) * 2011-03-30 2012-10-04 シャープ株式会社 Substrat de matrice active, dispositif d'affichage, et procédé de fabrication de substrat de matrice active
TWI654762B (zh) 2011-05-05 2019-03-21 日商半導體能源研究所股份有限公司 半導體裝置及其製造方法
SG11201505088UA (en) 2011-09-29 2015-08-28 Semiconductor Energy Lab Semiconductor device
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KR20130040706A (ko) 2011-10-14 2013-04-24 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 반도체 장치의 제작 방법
DE112012004307B4 (de) 2011-10-14 2017-04-13 Semiconductor Energy Laboratory Co., Ltd. Halbleitervorrichtung
KR101975263B1 (ko) 2012-02-07 2019-05-08 삼성디스플레이 주식회사 박막트랜지스터 표시판과 이를 제조하는 방법
JP6220526B2 (ja) 2012-02-29 2017-10-25 株式会社半導体エネルギー研究所 半導体装置の作製方法
TWI681233B (zh) 2012-10-12 2020-01-01 日商半導體能源研究所股份有限公司 液晶顯示裝置、觸控面板及液晶顯示裝置的製造方法
JP6351947B2 (ja) * 2012-10-12 2018-07-04 株式会社半導体エネルギー研究所 液晶表示装置の作製方法
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KR102010789B1 (ko) * 2012-12-27 2019-10-21 엘지디스플레이 주식회사 투명 유기 발광 표시 장치 및 투명 유기 발광 표시 장치 제조 방법
US9153650B2 (en) 2013-03-19 2015-10-06 Semiconductor Energy Laboratory Co., Ltd. Oxide semiconductor
CN103219389B (zh) 2013-03-21 2016-03-16 京东方科技集团股份有限公司 一种薄膜晶体管及其制作方法、阵列基板和显示装置
TWI652822B (zh) 2013-06-19 2019-03-01 日商半導體能源研究所股份有限公司 氧化物半導體膜及其形成方法
KR102063983B1 (ko) * 2013-06-26 2020-02-11 엘지디스플레이 주식회사 금속 산화물 반도체를 포함하는 박막 트랜지스터 기판 및 그 제조 방법
TWI608523B (zh) 2013-07-19 2017-12-11 半導體能源研究所股份有限公司 Oxide semiconductor film, method of manufacturing oxide semiconductor film, and semiconductor device
US20150051882A1 (en) * 2013-08-16 2015-02-19 Technology S.G., Lp Artificially Simulating Emissions of a Chemical Compound
CN104460143B (zh) * 2013-09-17 2017-12-15 瀚宇彩晶股份有限公司 像素结构及其制造方法
US9590111B2 (en) * 2013-11-06 2017-03-07 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and display device including the semiconductor device
CN105849796B (zh) * 2013-12-27 2020-02-07 株式会社半导体能源研究所 发光装置
WO2015132697A1 (fr) 2014-03-07 2015-09-11 Semiconductor Energy Laboratory Co., Ltd. Dispositif à semi-conducteur
US10032924B2 (en) * 2014-03-31 2018-07-24 The Hong Kong University Of Science And Technology Metal oxide thin film transistor with channel, source and drain regions respectively capped with covers of different gas permeability
US10043913B2 (en) 2014-04-30 2018-08-07 Semiconductor Energy Laboratory Co., Ltd. Semiconductor film, semiconductor device, display device, module, and electronic device
TW201614850A (en) * 2014-10-01 2016-04-16 Chunghwa Picture Tubes Ltd Thin film transistor and manufacturing method thereof
WO2016063160A1 (fr) * 2014-10-20 2016-04-28 Semiconductor Energy Laboratory Co., Ltd. Dispositif à semi-conducteur, son procédé de fabrication, dispositif d'affichage et module d'affichage
CN104752489A (zh) * 2015-04-10 2015-07-01 深圳市华星光电技术有限公司 阵列基板、显示装置及用于制备阵列基板的方法
JP2017003976A (ja) * 2015-06-15 2017-01-05 株式会社半導体エネルギー研究所 表示装置
KR102556718B1 (ko) * 2015-06-19 2023-07-17 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 그 제작 방법, 및 전자 기기
US10504939B2 (en) 2017-02-21 2019-12-10 The Hong Kong University Of Science And Technology Integration of silicon thin-film transistors and metal-oxide thin film transistors
KR102455892B1 (ko) * 2017-12-29 2022-10-17 엘지디스플레이 주식회사 전자 기기
KR102530811B1 (ko) 2018-10-31 2023-05-09 엘지디스플레이 주식회사 표시 장치
TWI702154B (zh) * 2019-05-08 2020-08-21 謙華科技股份有限公司 熱印頭結構之製造方法
CN110571152A (zh) * 2019-08-14 2019-12-13 青岛佳恩半导体有限公司 一种igbt背面电极缓冲层的制备方法
US11430516B2 (en) * 2020-04-06 2022-08-30 Crossbar, Inc. Distinct chip identifier sequence utilizing unclonable characteristics of resistive memory on a chip
KR20230056695A (ko) * 2020-08-27 2023-04-27 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치의 제작 방법
CN113674623A (zh) * 2021-08-13 2021-11-19 Tcl华星光电技术有限公司 背光灯板、背光模组及显示装置

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10107293A (ja) * 1996-10-02 1998-04-24 Semiconductor Energy Lab Co Ltd 半導体装置およびその作製方法および電子装置
JPH10209463A (ja) * 1997-01-27 1998-08-07 Matsushita Electric Ind Co Ltd 表示装置の配線形成方法、表示装置の製造方法、および表示装置
JP2000156504A (ja) * 1998-09-04 2000-06-06 Semiconductor Energy Lab Co Ltd 半導体素子からなる半導体回路を備えた半導体装置およびその作製方法
JP2002131783A (ja) * 2000-08-09 2002-05-09 Hitachi Ltd アクティブマトリクス型表示装置
JP2006215086A (ja) * 2005-02-01 2006-08-17 Sharp Corp アクティブマトリクス基板およびそれを備えた表示装置
JP2007115902A (ja) * 2005-10-20 2007-05-10 Canon Inc アモルファス酸化物を用いた電界効果型トランジスタ、及び該トランジスタを用いた表示装置
JP2007123861A (ja) * 2005-09-29 2007-05-17 Semiconductor Energy Lab Co Ltd 半導体装置及びその作製方法
JP2007134687A (ja) * 2005-10-14 2007-05-31 Semiconductor Energy Lab Co Ltd 半導体装置及びその作製方法
JP2008281988A (ja) * 2007-04-09 2008-11-20 Canon Inc 発光装置とその作製方法

Family Cites Families (245)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US538304A (en) * 1895-04-30 Richard wagner
JPS60198861A (ja) 1984-03-23 1985-10-08 Fujitsu Ltd 薄膜トランジスタ
JPH0244256B2 (ja) 1987-01-28 1990-10-03 Kagaku Gijutsucho Mukizaishitsu Kenkyushocho Ingazn2o5deshimesarerurotsuhoshokeinosojokozoojusurukagobutsuoyobisonoseizoho
JPS63210023A (ja) 1987-02-24 1988-08-31 Natl Inst For Res In Inorg Mater InGaZn↓4O↓7で示される六方晶系の層状構造を有する化合物およびその製造法
JPH0244260B2 (ja) 1987-02-24 1990-10-03 Kagaku Gijutsucho Mukizaishitsu Kenkyushocho Ingazn5o8deshimesarerurotsuhoshokeinosojokozoojusurukagobutsuoyobisonoseizoho
JPH0244258B2 (ja) 1987-02-24 1990-10-03 Kagaku Gijutsucho Mukizaishitsu Kenkyushocho Ingazn3o6deshimesarerurotsuhoshokeinosojokozoojusurukagobutsuoyobisonoseizoho
JPH07101268B2 (ja) * 1987-02-25 1995-11-01 日本電信電話株式会社 薄膜トランジスタアレイ
JPH0244262B2 (ja) 1987-02-27 1990-10-03 Kagaku Gijutsucho Mukizaishitsu Kenkyushocho Ingazn6o9deshimesarerurotsuhoshokeinosojokozoojusurukagobutsuoyobisonoseizoho
JPH0244263B2 (ja) 1987-04-22 1990-10-03 Kagaku Gijutsucho Mukizaishitsu Kenkyushocho Ingazn7o10deshimesarerurotsuhoshokeinosojokozoojusurukagobutsuoyobisonoseizoho
JPH0213928A (ja) 1988-07-01 1990-01-18 Sharp Corp 薄膜トランジスタアレイ
EP0445535B1 (fr) 1990-02-06 1995-02-01 Sel Semiconductor Energy Laboratory Co., Ltd. Procédé de formation d'un film d'oxyde
JP2585118B2 (ja) 1990-02-06 1997-02-26 株式会社半導体エネルギー研究所 薄膜トランジスタの作製方法
KR960010723B1 (ko) * 1990-12-20 1996-08-07 가부시끼가이샤 한도오따이 에네루기 겐큐쇼 전기광학장치
JP2990232B2 (ja) 1990-12-20 1999-12-13 株式会社半導体エネルギー研究所 液晶電気光学装置
JPH05251705A (ja) 1992-03-04 1993-09-28 Fuji Xerox Co Ltd 薄膜トランジスタ
KR0139346B1 (ko) * 1994-03-03 1998-06-15 김광호 박막 트랜지스터 액정표시장치의 제조방법
JP3479375B2 (ja) 1995-03-27 2003-12-15 科学技術振興事業団 亜酸化銅等の金属酸化物半導体による薄膜トランジスタとpn接合を形成した金属酸化物半導体装置およびそれらの製造方法
JP3286152B2 (ja) * 1995-06-29 2002-05-27 シャープ株式会社 薄膜トランジスタ回路および画像表示装置
KR100394896B1 (ko) * 1995-08-03 2003-11-28 코닌클리케 필립스 일렉트로닉스 엔.브이. 투명스위칭소자를포함하는반도체장치
JP2001290172A (ja) 1995-08-11 2001-10-19 Sharp Corp 液晶表示装置
KR970011972A (ko) 1995-08-11 1997-03-29 쯔지 하루오 투과형 액정 표시 장치 및 그 제조 방법
US5847410A (en) 1995-11-24 1998-12-08 Semiconductor Energy Laboratory Co. Semiconductor electro-optical device
JP3625598B2 (ja) * 1995-12-30 2005-03-02 三星電子株式会社 液晶表示装置の製造方法
JP3488590B2 (ja) * 1997-03-03 2004-01-19 三洋電機株式会社 金属薄膜及び薄膜トランジスタの製造方法及び金属薄膜を用いた半導体装置
TWI226470B (en) * 1998-01-19 2005-01-11 Hitachi Ltd LCD device
US6784413B2 (en) * 1998-03-12 2004-08-31 Casio Computer Co., Ltd. Reading apparatus for reading fingerprint
JP3592535B2 (ja) * 1998-07-16 2004-11-24 株式会社半導体エネルギー研究所 半導体装置の作製方法
JP4170454B2 (ja) 1998-07-24 2008-10-22 Hoya株式会社 透明導電性酸化物薄膜を有する物品及びその製造方法
US6372558B1 (en) * 1998-08-18 2002-04-16 Sony Corporation Electrooptic device, driving substrate for electrooptic device, and method of manufacturing the device and substrate
JP2000150861A (ja) * 1998-11-16 2000-05-30 Tdk Corp 酸化物薄膜
JP3276930B2 (ja) * 1998-11-17 2002-04-22 科学技術振興事業団 トランジスタ及び半導体装置
JP3977974B2 (ja) * 1998-12-29 2007-09-19 株式会社半導体エネルギー研究所 半導体装置
US6380558B1 (en) 1998-12-29 2002-04-30 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method of fabricating the same
TW473783B (en) * 1999-08-13 2002-01-21 Semiconductor Energy Lab Laser apparatus, laser annealing method, and manufacturing method of a semiconductor device
TW460731B (en) 1999-09-03 2001-10-21 Ind Tech Res Inst Electrode structure and production method of wide viewing angle LCD
KR100661825B1 (ko) * 1999-12-28 2006-12-27 엘지.필립스 엘시디 주식회사 반사투과형 액정 표시장치의 어레이 기판 및 그의 제조방법
TWI245957B (en) 2000-08-09 2005-12-21 Hitachi Ltd Active matrix display device
JP4089858B2 (ja) 2000-09-01 2008-05-28 国立大学法人東北大学 半導体デバイス
KR20020038482A (ko) * 2000-11-15 2002-05-23 모리시타 요이찌 박막 트랜지스터 어레이, 그 제조방법 및 그것을 이용한표시패널
US7115453B2 (en) * 2001-01-29 2006-10-03 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method of the same
JP4410951B2 (ja) * 2001-02-27 2010-02-10 Nec液晶テクノロジー株式会社 パターン形成方法および液晶表示装置の製造方法
JP3997731B2 (ja) 2001-03-19 2007-10-24 富士ゼロックス株式会社 基材上に結晶性半導体薄膜を形成する方法
JP2002289859A (ja) 2001-03-23 2002-10-04 Minolta Co Ltd 薄膜トランジスタ
JP3696127B2 (ja) 2001-05-21 2005-09-14 シャープ株式会社 液晶用マトリクス基板の製造方法
JP2003005344A (ja) 2001-06-20 2003-01-08 Nec Corp ハーフトーン位相シフトマスク及びその製造方法
JP3925839B2 (ja) 2001-09-10 2007-06-06 シャープ株式会社 半導体記憶装置およびその試験方法
JP4090716B2 (ja) 2001-09-10 2008-05-28 雅司 川崎 薄膜トランジスタおよびマトリクス表示装置
EP1443130B1 (fr) * 2001-11-05 2011-09-28 Japan Science and Technology Agency Film mince monocristallin homologue a super-reseau naturel, procede de preparation et dispositif dans lequel est utilise ledit film mince monocristallin
JP4164562B2 (ja) 2002-09-11 2008-10-15 独立行政法人科学技術振興機構 ホモロガス薄膜を活性層として用いる透明薄膜電界効果型トランジスタ
JP4083486B2 (ja) * 2002-02-21 2008-04-30 独立行政法人科学技術振興機構 LnCuO(S,Se,Te)単結晶薄膜の製造方法
US7049190B2 (en) * 2002-03-15 2006-05-23 Sanyo Electric Co., Ltd. Method for forming ZnO film, method for forming ZnO semiconductor layer, method for fabricating semiconductor device, and semiconductor device
JP3933591B2 (ja) 2002-03-26 2007-06-20 淳二 城戸 有機エレクトロルミネッセント素子
US7411215B2 (en) * 2002-04-15 2008-08-12 Semiconductor Energy Laboratory Co., Ltd. Display device and method of fabricating the same
TW546853B (en) * 2002-05-01 2003-08-11 Au Optronics Corp Active type OLED and the fabrication method thereof
JP2003330388A (ja) 2002-05-15 2003-11-19 Semiconductor Energy Lab Co Ltd 半導体装置及びその作製方法
TW538541B (en) * 2002-05-15 2003-06-21 Au Optronics Corp Active matrix substrate of liquid crystal display device and the manufacturing method thereof
US7339187B2 (en) 2002-05-21 2008-03-04 State Of Oregon Acting By And Through The Oregon State Board Of Higher Education On Behalf Of Oregon State University Transistor structures
JP2004022625A (ja) * 2002-06-13 2004-01-22 Murata Mfg Co Ltd 半導体デバイス及び該半導体デバイスの製造方法
US7105868B2 (en) 2002-06-24 2006-09-12 Cermet, Inc. High-electron mobility transistor with zinc oxide
US7067843B2 (en) * 2002-10-11 2006-06-27 E. I. Du Pont De Nemours And Company Transparent oxide semiconductor thin film transistors
TW586144B (en) 2002-11-15 2004-05-01 Toppoly Optoelectronics Corp Method of forming a liquid crystal display
US7760921B2 (en) * 2002-12-19 2010-07-20 Casio Computer Co., Ltd. Pressure activated fingerprint input apparatus
AU2003286952A1 (en) * 2002-12-21 2004-07-14 Samsung Electronics Co., Ltd. Array substrate, liquid crystal display apparatus having the same and method for driving liquid crystal display apparatus
JP4166105B2 (ja) 2003-03-06 2008-10-15 シャープ株式会社 半導体装置およびその製造方法
JP2004273732A (ja) 2003-03-07 2004-09-30 Sharp Corp アクティブマトリクス基板およびその製造方法
JP4108633B2 (ja) 2003-06-20 2008-06-25 シャープ株式会社 薄膜トランジスタおよびその製造方法ならびに電子デバイス
US7262463B2 (en) * 2003-07-25 2007-08-28 Hewlett-Packard Development Company, L.P. Transistor including a deposited channel region having a doped portion
TWI221341B (en) * 2003-09-18 2004-09-21 Ind Tech Res Inst Method and material for forming active layer of thin film transistor
JP4671665B2 (ja) * 2003-11-14 2011-04-20 株式会社半導体エネルギー研究所 表示装置の作製方法
JP4831954B2 (ja) * 2003-11-14 2011-12-07 株式会社半導体エネルギー研究所 表示装置の作製方法
CN1906650B (zh) 2003-11-14 2012-05-09 株式会社半导体能源研究所 显示装置及其制造方法
US7439086B2 (en) 2003-11-14 2008-10-21 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing liquid crystal display device
US7691685B2 (en) * 2004-01-26 2010-04-06 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
US7371625B2 (en) * 2004-02-13 2008-05-13 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof, liquid crystal television system, and EL television system
US7394118B2 (en) * 2004-03-09 2008-07-01 University Of Southern California Chemical sensor using semiconducting metal oxide nanowires
US7145174B2 (en) 2004-03-12 2006-12-05 Hewlett-Packard Development Company, Lp. Semiconductor device
US7297977B2 (en) 2004-03-12 2007-11-20 Hewlett-Packard Development Company, L.P. Semiconductor device
EP1737044B1 (fr) 2004-03-12 2014-12-10 Japan Science and Technology Agency Oxyde amorphe et transistor film mince
US7282782B2 (en) 2004-03-12 2007-10-16 Hewlett-Packard Development Company, L.P. Combined binary oxide semiconductor device
US7129559B2 (en) * 2004-04-09 2006-10-31 Taiwan Semiconductor Manufacturing Company, Ltd. High voltage semiconductor device utilizing a deep trench structure
US7245297B2 (en) * 2004-05-22 2007-07-17 Semiconductor Energy Laboratory Co., Ltd. Display device and electronic device
US7494923B2 (en) * 2004-06-14 2009-02-24 Semiconductor Energy Laboratory Co., Ltd. Manufacturing method of wiring substrate and semiconductor device
US7211825B2 (en) * 2004-06-14 2007-05-01 Yi-Chi Shih Indium oxide-based thin film transistors and circuits
JP2006100760A (ja) * 2004-09-02 2006-04-13 Casio Comput Co Ltd 薄膜トランジスタおよびその製造方法
US7285501B2 (en) * 2004-09-17 2007-10-23 Hewlett-Packard Development Company, L.P. Method of forming a solution processed device
CN101044597B (zh) * 2004-10-20 2012-11-28 株式会社半导体能源研究所 激光照射方法、激光照射装置和制造半导体器件的方法
US7298084B2 (en) * 2004-11-02 2007-11-20 3M Innovative Properties Company Methods and displays utilizing integrated zinc oxide row and column drivers in conjunction with organic light emitting diodes
US7829444B2 (en) * 2004-11-10 2010-11-09 Canon Kabushiki Kaisha Field effect transistor manufacturing method
CN101057333B (zh) * 2004-11-10 2011-11-16 佳能株式会社 发光器件
US7868326B2 (en) * 2004-11-10 2011-01-11 Canon Kabushiki Kaisha Field effect transistor
US7863611B2 (en) * 2004-11-10 2011-01-04 Canon Kabushiki Kaisha Integrated circuits utilizing amorphous oxides
US7453065B2 (en) * 2004-11-10 2008-11-18 Canon Kabushiki Kaisha Sensor and image pickup device
US7791072B2 (en) * 2004-11-10 2010-09-07 Canon Kabushiki Kaisha Display
EP1812969B1 (fr) * 2004-11-10 2015-05-06 Canon Kabushiki Kaisha Transistor a effet de champ comprenant un oxyde amorphe
US7582904B2 (en) * 2004-11-26 2009-09-01 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, display device and method for manufacturing thereof, and television device
JP2006201217A (ja) * 2005-01-18 2006-08-03 Seiko Epson Corp 配線基板、電気光学装置及び電子機器
US7579224B2 (en) * 2005-01-21 2009-08-25 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing a thin film semiconductor device
TWI562380B (en) * 2005-01-28 2016-12-11 Semiconductor Energy Lab Co Ltd Semiconductor device, electronic device, and method of manufacturing semiconductor device
US7608531B2 (en) * 2005-01-28 2009-10-27 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, electronic device, and method of manufacturing semiconductor device
US7858451B2 (en) * 2005-02-03 2010-12-28 Semiconductor Energy Laboratory Co., Ltd. Electronic device, semiconductor device and manufacturing method thereof
US7948171B2 (en) * 2005-02-18 2011-05-24 Semiconductor Energy Laboratory Co., Ltd. Light emitting device
US20060197092A1 (en) 2005-03-03 2006-09-07 Randy Hoffman System and method for forming conductive material on a substrate
US8681077B2 (en) 2005-03-18 2014-03-25 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, and display device, driving method and electronic apparatus thereof
WO2006105077A2 (fr) 2005-03-28 2006-10-05 Massachusetts Institute Of Technology Transistor organique/transparent souple a basse tension pour la detection de gaz selective, la photodetection et des applications de dispositifs cmos
US7645478B2 (en) 2005-03-31 2010-01-12 3M Innovative Properties Company Methods of making displays
US8300031B2 (en) 2005-04-20 2012-10-30 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device comprising transistor having gate and drain connected through a current-voltage conversion element
JP2006344849A (ja) * 2005-06-10 2006-12-21 Casio Comput Co Ltd 薄膜トランジスタ
US7402506B2 (en) * 2005-06-16 2008-07-22 Eastman Kodak Company Methods of making thin film transistors comprising zinc-oxide-based semiconductor materials and transistors made thereby
US7691666B2 (en) 2005-06-16 2010-04-06 Eastman Kodak Company Methods of making thin film transistors comprising zinc-oxide-based semiconductor materials and transistors made thereby
US7507618B2 (en) 2005-06-27 2009-03-24 3M Innovative Properties Company Method for making electronic devices using metal oxide nanoparticles
US7737442B2 (en) * 2005-06-28 2010-06-15 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
KR100711890B1 (ko) * 2005-07-28 2007-04-25 삼성에스디아이 주식회사 유기 발광표시장치 및 그의 제조방법
JP2007059128A (ja) * 2005-08-23 2007-03-08 Canon Inc 有機el表示装置およびその製造方法
JP5116225B2 (ja) * 2005-09-06 2013-01-09 キヤノン株式会社 酸化物半導体デバイスの製造方法
JP4850457B2 (ja) * 2005-09-06 2012-01-11 キヤノン株式会社 薄膜トランジスタ及び薄膜ダイオード
JP2007073705A (ja) * 2005-09-06 2007-03-22 Canon Inc 酸化物半導体チャネル薄膜トランジスタおよびその製造方法
JP4280736B2 (ja) * 2005-09-06 2009-06-17 キヤノン株式会社 半導体素子
JP5078246B2 (ja) 2005-09-29 2012-11-21 株式会社半導体エネルギー研究所 半導体装置、及び半導体装置の作製方法
EP3614442A3 (fr) 2005-09-29 2020-03-25 Semiconductor Energy Laboratory Co., Ltd. Dispositif de semiconducteur disposant d'une couche de semiconducteur d'oxyde et son procédé de fabrication
US8149346B2 (en) * 2005-10-14 2012-04-03 Semiconductor Energy Laboratory Co., Ltd. Display device and manufacturing method thereof
EP1935027B1 (fr) * 2005-10-14 2017-06-28 Semiconductor Energy Laboratory Co., Ltd. Dispositif a semi-conducteurs et son procede de fabrication
US8217572B2 (en) 2005-10-18 2012-07-10 Semiconductor Energy Laboratory Co., Ltd. Display device with prism layer
JP5250196B2 (ja) 2005-10-18 2013-07-31 株式会社半導体エネルギー研究所 表示装置及び電子機器
KR101117948B1 (ko) * 2005-11-15 2012-02-15 가부시키가이샤 한도오따이 에네루기 켄큐쇼 액정 디스플레이 장치 제조 방법
US7998372B2 (en) * 2005-11-18 2011-08-16 Idemitsu Kosan Co., Ltd. Semiconductor thin film, method for manufacturing the same, thin film transistor, and active-matrix-driven display panel
JP5376750B2 (ja) 2005-11-18 2013-12-25 出光興産株式会社 半導体薄膜、及びその製造方法、並びに薄膜トランジスタ、アクティブマトリックス駆動表示パネル
JP5250929B2 (ja) * 2005-11-30 2013-07-31 凸版印刷株式会社 トランジスタおよびその製造方法
TWI292281B (en) * 2005-12-29 2008-01-01 Ind Tech Res Inst Pixel structure of active organic light emitting diode and method of fabricating the same
KR100768199B1 (ko) * 2006-01-02 2007-10-17 삼성에스디아이 주식회사 유기 박막 트랜지스터 및 이를 구비한 유기 발광 표시 장치
US7867636B2 (en) * 2006-01-11 2011-01-11 Murata Manufacturing Co., Ltd. Transparent conductive film and method for manufacturing the same
JP4977478B2 (ja) * 2006-01-21 2012-07-18 三星電子株式会社 ZnOフィルム及びこれを用いたTFTの製造方法
US7576394B2 (en) * 2006-02-02 2009-08-18 Kochi Industrial Promotion Center Thin film transistor including low resistance conductive thin films and manufacturing method thereof
US7977169B2 (en) * 2006-02-15 2011-07-12 Kochi Industrial Promotion Center Semiconductor device including active layer made of zinc oxide with controlled orientations and manufacturing method thereof
JP5110803B2 (ja) * 2006-03-17 2012-12-26 キヤノン株式会社 酸化物膜をチャネルに用いた電界効果型トランジスタ及びその製造方法
US20070231974A1 (en) 2006-03-30 2007-10-04 Hsien-Kun Chiu Thin film transistor having copper line and fabricating method thereof
KR20070101595A (ko) * 2006-04-11 2007-10-17 삼성전자주식회사 ZnO TFT
US20070252928A1 (en) 2006-04-28 2007-11-01 Toppan Printing Co., Ltd. Structure, transmission type liquid crystal display, reflection type display and manufacturing method thereof
KR101227142B1 (ko) 2006-05-17 2013-01-28 엘지디스플레이 주식회사 전계발광소자 및 그 제조방법
JP5069950B2 (ja) * 2006-06-02 2012-11-07 株式会社半導体エネルギー研究所 半導体装置、表示装置、液晶表示装置、表示モジュール及び電子機器
US7443202B2 (en) 2006-06-02 2008-10-28 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and electronic apparatus having the same
JP5028033B2 (ja) 2006-06-13 2012-09-19 キヤノン株式会社 酸化物半導体膜のドライエッチング方法
US8570468B2 (en) * 2006-06-30 2013-10-29 Lg Display Co., Ltd. Liquid crystal display device and method of fabricating the same
JP5328083B2 (ja) * 2006-08-01 2013-10-30 キヤノン株式会社 酸化物のエッチング方法
US20080032431A1 (en) 2006-08-03 2008-02-07 Tpo Displays Corp. Method for fabricating a system for displaying images
JP4999400B2 (ja) * 2006-08-09 2012-08-15 キヤノン株式会社 酸化物半導体膜のドライエッチング方法
JP4609797B2 (ja) * 2006-08-09 2011-01-12 Nec液晶テクノロジー株式会社 薄膜デバイス及びその製造方法
JP4404881B2 (ja) 2006-08-09 2010-01-27 日本電気株式会社 薄膜トランジスタアレイ、その製造方法及び液晶表示装置
WO2008029060A2 (fr) * 2006-09-07 2008-03-13 Saint-Gobain Glass France Substrat pour dispositif electroluminescent organique, utilisation et procede de fabrication de ce substrat, ainsi que dispositif electroluminescent organique.
JP4179393B2 (ja) * 2006-09-14 2008-11-12 エプソンイメージングデバイス株式会社 表示装置及びその製造方法
JP4332545B2 (ja) * 2006-09-15 2009-09-16 キヤノン株式会社 電界効果型トランジスタ及びその製造方法
JP4274219B2 (ja) * 2006-09-27 2009-06-03 セイコーエプソン株式会社 電子デバイス、有機エレクトロルミネッセンス装置、有機薄膜半導体装置
JP5164357B2 (ja) * 2006-09-27 2013-03-21 キヤノン株式会社 半導体装置及び半導体装置の製造方法
US7622371B2 (en) * 2006-10-10 2009-11-24 Hewlett-Packard Development Company, L.P. Fused nanocrystal thin film semiconductor and method
JP5116290B2 (ja) 2006-11-21 2013-01-09 キヤノン株式会社 薄膜トランジスタの製造方法
US7772021B2 (en) * 2006-11-29 2010-08-10 Samsung Electronics Co., Ltd. Flat panel displays comprising a thin-film transistor having a semiconductive oxide in its channel and methods of fabricating the same for use in flat panel displays
JP2008140684A (ja) * 2006-12-04 2008-06-19 Toppan Printing Co Ltd カラーelディスプレイおよびその製造方法
KR101303578B1 (ko) * 2007-01-05 2013-09-09 삼성전자주식회사 박막 식각 방법
US8207063B2 (en) * 2007-01-26 2012-06-26 Eastman Kodak Company Process for atomic layer deposition
TWI478347B (zh) * 2007-02-09 2015-03-21 Idemitsu Kosan Co A thin film transistor, a thin film transistor substrate, and an image display device, and an image display device, and a semiconductor device
KR100858088B1 (ko) * 2007-02-28 2008-09-10 삼성전자주식회사 박막 트랜지스터 및 그 제조 방법
KR100851215B1 (ko) 2007-03-14 2008-08-07 삼성에스디아이 주식회사 박막 트랜지스터 및 이를 이용한 유기 전계 발광표시장치
WO2008126879A1 (fr) * 2007-04-09 2008-10-23 Canon Kabushiki Kaisha Appareil électroluminescent et son procédé de production
US7795613B2 (en) 2007-04-17 2010-09-14 Toppan Printing Co., Ltd. Structure with transistor
KR101325053B1 (ko) 2007-04-18 2013-11-05 삼성디스플레이 주식회사 박막 트랜지스터 기판 및 이의 제조 방법
KR20080094300A (ko) 2007-04-19 2008-10-23 삼성전자주식회사 박막 트랜지스터 및 그 제조 방법과 박막 트랜지스터를포함하는 평판 디스플레이
KR101334181B1 (ko) 2007-04-20 2013-11-28 삼성전자주식회사 선택적으로 결정화된 채널층을 갖는 박막 트랜지스터 및 그제조 방법
US8274078B2 (en) * 2007-04-25 2012-09-25 Canon Kabushiki Kaisha Metal oxynitride semiconductor containing zinc
JP5044273B2 (ja) * 2007-04-27 2012-10-10 三菱電機株式会社 薄膜トランジスタアレイ基板、その製造方法、及び表示装置
KR101345376B1 (ko) 2007-05-29 2013-12-24 삼성전자주식회사 ZnO 계 박막 트랜지스터 및 그 제조방법
CN101681928B (zh) * 2007-05-31 2012-08-29 佳能株式会社 使用氧化物半导体的薄膜晶体管的制造方法
JP4462293B2 (ja) * 2007-06-01 2010-05-12 エプソンイメージングデバイス株式会社 液晶表示装置、電子機器及び前記液晶表示装置の照光手段の明るさを制御する方法
US7935964B2 (en) * 2007-06-19 2011-05-03 Samsung Electronics Co., Ltd. Oxide semiconductors and thin film transistors comprising the same
US8354674B2 (en) 2007-06-29 2013-01-15 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device wherein a property of a first semiconductor layer is different from a property of a second semiconductor layer
US8921858B2 (en) * 2007-06-29 2014-12-30 Semiconductor Energy Laboratory Co., Ltd. Light-emitting device
KR20090002841A (ko) * 2007-07-04 2009-01-09 삼성전자주식회사 산화물 반도체, 이를 포함하는 박막 트랜지스터 및 그 제조방법
KR101270172B1 (ko) * 2007-08-29 2013-05-31 삼성전자주식회사 산화물 박막 트랜지스터 및 그 제조 방법
JP5388500B2 (ja) * 2007-08-30 2014-01-15 株式会社半導体エネルギー研究所 半導体装置の作製方法
JP5480480B2 (ja) * 2007-09-03 2014-04-23 株式会社半導体エネルギー研究所 半導体装置の作製方法
US7972898B2 (en) 2007-09-26 2011-07-05 Eastman Kodak Company Process for making doped zinc oxide
JP5213421B2 (ja) * 2007-12-04 2013-06-19 キヤノン株式会社 酸化物半導体薄膜トランジスタ
US8426937B2 (en) * 2007-12-11 2013-04-23 Sony Corporation Light sensor and display
WO2009075161A1 (fr) * 2007-12-12 2009-06-18 Idemitsu Kosan Co., Ltd. Couche mince semi-conductrice cristalline gravée, procédé de production de transistor à couches minces et transistor à effet de champ
CN103258857B (zh) * 2007-12-13 2016-05-11 出光兴产株式会社 使用了氧化物半导体的场效应晶体管及其制造方法
JP5215158B2 (ja) * 2007-12-17 2013-06-19 富士フイルム株式会社 無機結晶性配向膜及びその製造方法、半導体デバイス
KR20090069806A (ko) * 2007-12-26 2009-07-01 삼성전자주식회사 표시 기판, 이를 포함하는 표시 장치 및 표시 기판의 제조방법
US20100295042A1 (en) * 2008-01-23 2010-11-25 Idemitsu Kosan Co., Ltd. Field-effect transistor, method for manufacturing field-effect transistor, display device using field-effect transistor, and semiconductor device
JP4626659B2 (ja) 2008-03-13 2011-02-09 ソニー株式会社 表示装置
JP2009267399A (ja) * 2008-04-04 2009-11-12 Fujifilm Corp 半導体装置,半導体装置の製造方法,表示装置及び表示装置の製造方法
KR101461127B1 (ko) * 2008-05-13 2014-11-14 삼성디스플레이 주식회사 반도체 장치 및 이의 제조 방법
KR100982311B1 (ko) * 2008-05-26 2010-09-15 삼성모바일디스플레이주식회사 박막트랜지스터, 그의 제조방법 및 이를 포함하는유기전계발광표시장치
JP5234333B2 (ja) * 2008-05-28 2013-07-10 Nltテクノロジー株式会社 ゲート線駆動回路、アクティブマトリクス基板及び液晶表示装置
KR100958006B1 (ko) * 2008-06-18 2010-05-17 삼성모바일디스플레이주식회사 박막 트랜지스터, 그의 제조 방법 및 박막 트랜지스터를구비하는 평판 표시 장치
KR100963027B1 (ko) * 2008-06-30 2010-06-10 삼성모바일디스플레이주식회사 박막 트랜지스터, 그의 제조 방법 및 박막 트랜지스터를구비하는 평판 표시 장치
KR100963026B1 (ko) * 2008-06-30 2010-06-10 삼성모바일디스플레이주식회사 박막 트랜지스터, 그의 제조 방법 및 박막 트랜지스터를구비하는 평판 표시 장치
JP5511157B2 (ja) 2008-07-03 2014-06-04 キヤノン株式会社 発光表示装置
KR100963104B1 (ko) * 2008-07-08 2010-06-14 삼성모바일디스플레이주식회사 박막 트랜지스터, 그의 제조 방법 및 박막 트랜지스터를구비하는 평판 표시 장치
TWI469354B (zh) * 2008-07-31 2015-01-11 Semiconductor Energy Lab 半導體裝置及其製造方法
KR100975204B1 (ko) * 2008-08-04 2010-08-10 삼성모바일디스플레이주식회사 박막 트랜지스터, 그의 제조 방법 및 박막 트랜지스터를구비하는 평판 표시 장치
JP5216716B2 (ja) * 2008-08-20 2013-06-19 株式会社半導体エネルギー研究所 発光装置及びその作製方法
JP5627071B2 (ja) * 2008-09-01 2014-11-19 株式会社半導体エネルギー研究所 半導体装置の作製方法
US9082857B2 (en) * 2008-09-01 2015-07-14 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device comprising an oxide semiconductor layer
KR101489652B1 (ko) * 2008-09-02 2015-02-06 삼성디스플레이 주식회사 박막 트랜지스터 기판 및 이의 제조 방법
JP5207885B2 (ja) * 2008-09-03 2013-06-12 キヤノン株式会社 画素回路、発光表示装置及びそれらの駆動方法
US9306078B2 (en) * 2008-09-08 2016-04-05 Cbrite Inc. Stable amorphous metal oxide semiconductor
WO2010029866A1 (fr) * 2008-09-12 2010-03-18 Semiconductor Energy Laboratory Co., Ltd. Dispositif d'affichage
KR101722913B1 (ko) * 2008-09-12 2017-04-05 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
JP4623179B2 (ja) * 2008-09-18 2011-02-02 ソニー株式会社 薄膜トランジスタおよびその製造方法
KR102094683B1 (ko) * 2008-09-19 2020-03-30 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시장치
KR101827333B1 (ko) * 2008-09-19 2018-02-09 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체장치
EP2172977A1 (fr) * 2008-10-03 2010-04-07 Semiconductor Energy Laboratory Co., Ltd. Dispositif d'affichage
KR101435501B1 (ko) 2008-10-03 2014-08-29 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시장치
JP5451280B2 (ja) * 2008-10-09 2014-03-26 キヤノン株式会社 ウルツ鉱型結晶成長用基板およびその製造方法ならびに半導体装置
JP2011003522A (ja) * 2008-10-16 2011-01-06 Semiconductor Energy Lab Co Ltd フレキシブル発光装置、電子機器及びフレキシブル発光装置の作製方法
JP5361651B2 (ja) * 2008-10-22 2013-12-04 株式会社半導体エネルギー研究所 半導体装置の作製方法
KR101667909B1 (ko) * 2008-10-24 2016-10-28 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체장치의 제조방법
US8741702B2 (en) * 2008-10-24 2014-06-03 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
EP2180518B1 (fr) * 2008-10-24 2018-04-25 Semiconductor Energy Laboratory Co, Ltd. Procédé de fabrication d'un dispositif semi-conducteur
JP5616012B2 (ja) * 2008-10-24 2014-10-29 株式会社半導体エネルギー研究所 半導体装置の作製方法
WO2010047288A1 (fr) * 2008-10-24 2010-04-29 Semiconductor Energy Laboratory Co., Ltd. Procédé de fabrication d’un dispositif semi-conducteur
KR102149626B1 (ko) * 2008-11-07 2020-08-28 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치의 제작 방법
KR20100062544A (ko) 2008-12-02 2010-06-10 삼성전자주식회사 박막 트랜지스터 기판의 제조 방법
WO2010070832A1 (fr) * 2008-12-15 2010-06-24 出光興産株式会社 Oxyde complexe fritté et cible de pulvérisation à base de celui-ci.
US8114720B2 (en) * 2008-12-25 2012-02-14 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
KR101552975B1 (ko) * 2009-01-09 2015-09-15 삼성전자주식회사 산화물 반도체 및 이를 포함하는 박막 트랜지스터
KR101034686B1 (ko) * 2009-01-12 2011-05-16 삼성모바일디스플레이주식회사 유기전계발광 표시 장치 및 그의 제조 방법
KR101048996B1 (ko) 2009-01-12 2011-07-12 삼성모바일디스플레이주식회사 박막 트랜지스터 및 그를 구비하는 평판 표시 장치
JP4923069B2 (ja) * 2009-01-14 2012-04-25 三菱電機株式会社 薄膜トランジスタ基板、及び半導体装置
KR100993416B1 (ko) * 2009-01-20 2010-11-09 삼성모바일디스플레이주식회사 박막 트랜지스터, 그의 제조 방법 및 박막 트랜지스터를 구비하는 평판 표시 장치
US7977151B2 (en) * 2009-04-21 2011-07-12 Cbrite Inc. Double self-aligned metal oxide TFT
JP5564331B2 (ja) 2009-05-29 2014-07-30 株式会社半導体エネルギー研究所 半導体装置の作製方法
JP4415062B1 (ja) * 2009-06-22 2010-02-17 富士フイルム株式会社 薄膜トランジスタ及び薄膜トランジスタの製造方法
CN102473733B (zh) * 2009-07-18 2015-09-30 株式会社半导体能源研究所 半导体装置以及制造半导体装置的方法
WO2011010542A1 (fr) * 2009-07-23 2011-01-27 Semiconductor Energy Laboratory Co., Ltd. Dispositif à semi-conducteurs et son procédé de fabrication
CN102473734B (zh) * 2009-07-31 2015-08-12 株式会社半导体能源研究所 半导体装置及其制造方法
JP2011066375A (ja) 2009-08-18 2011-03-31 Fujifilm Corp 非晶質酸化物半導体材料、電界効果型トランジスタ及び表示装置
CN102484135B (zh) * 2009-09-04 2016-01-20 株式会社东芝 薄膜晶体管及其制造方法
KR102246529B1 (ko) * 2009-09-16 2021-04-30 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR101823852B1 (ko) * 2009-09-16 2018-03-14 가부시키가이샤 한도오따이 에네루기 켄큐쇼 트랜지스터 및 표시 장치
JP2011066243A (ja) * 2009-09-17 2011-03-31 Panasonic Corp 結晶シリコン膜の形成方法、それを用いた薄膜トランジスタおよび表示装置
CN102648524B (zh) 2009-10-08 2015-09-23 株式会社半导体能源研究所 半导体器件、显示装置和电子电器
SG188112A1 (en) * 2009-10-30 2013-03-28 Semiconductor Energy Lab Logic circuit and semiconductor device
KR101073272B1 (ko) * 2009-11-04 2011-10-12 삼성모바일디스플레이주식회사 유기전계발광 표시 장치의 제조 방법
KR101093424B1 (ko) * 2009-11-10 2011-12-14 삼성모바일디스플레이주식회사 유기전계발광 표시 장치 및 그의 제조 방법
KR101087506B1 (ko) * 2009-11-18 2011-11-29 한국과학기술연구원 폴리메틸메타크릴레이트 유도체 박막을 게이트 절연층 및 유기 보호층으로 이용하는 트랜지스터 및 그 제조방법
KR101097322B1 (ko) * 2009-12-15 2011-12-23 삼성모바일디스플레이주식회사 산화물 반도체 박막 트랜지스터, 그 제조방법 및 산화물 반도체 박막 트랜지스터를 구비한 유기전계 발광소자

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10107293A (ja) * 1996-10-02 1998-04-24 Semiconductor Energy Lab Co Ltd 半導体装置およびその作製方法および電子装置
JPH10209463A (ja) * 1997-01-27 1998-08-07 Matsushita Electric Ind Co Ltd 表示装置の配線形成方法、表示装置の製造方法、および表示装置
JP2000156504A (ja) * 1998-09-04 2000-06-06 Semiconductor Energy Lab Co Ltd 半導体素子からなる半導体回路を備えた半導体装置およびその作製方法
JP2002131783A (ja) * 2000-08-09 2002-05-09 Hitachi Ltd アクティブマトリクス型表示装置
JP2006215086A (ja) * 2005-02-01 2006-08-17 Sharp Corp アクティブマトリクス基板およびそれを備えた表示装置
JP2007123861A (ja) * 2005-09-29 2007-05-17 Semiconductor Energy Lab Co Ltd 半導体装置及びその作製方法
JP2007134687A (ja) * 2005-10-14 2007-05-31 Semiconductor Energy Lab Co Ltd 半導体装置及びその作製方法
JP2007115902A (ja) * 2005-10-20 2007-05-10 Canon Inc アモルファス酸化物を用いた電界効果型トランジスタ、及び該トランジスタを用いた表示装置
JP2008281988A (ja) * 2007-04-09 2008-11-20 Canon Inc 発光装置とその作製方法

Cited By (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014520396A (ja) * 2011-06-08 2014-08-21 シーブライト・インコーポレイテッド 改善されたソース/ドレイン接点を有する金属酸化物薄膜トランジスタ
JP2013030730A (ja) * 2011-06-20 2013-02-07 Sony Corp 半導体素子およびその製造方法、表示装置ならびに電子機器
WO2013042696A1 (fr) * 2011-09-23 2013-03-28 Semiconductor Energy Laboratory Co., Ltd. Dispositif à semi-conducteurs
JP2013135003A (ja) * 2011-12-23 2013-07-08 Semiconductor Energy Lab Co Ltd 半導体装置、及び半導体装置の作製方法
JP2014103379A (ja) * 2012-11-20 2014-06-05 Samsung Display Co Ltd 表示装置
US10672913B2 (en) 2012-12-25 2020-06-02 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
JP2019054260A (ja) * 2012-12-25 2019-04-04 株式会社半導体エネルギー研究所 半導体装置の作製方法
US11049974B2 (en) 2012-12-25 2021-06-29 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
US11705522B2 (en) 2012-12-25 2023-07-18 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
US9991395B2 (en) 2013-03-14 2018-06-05 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method thereof
JP2014199921A (ja) * 2013-03-14 2014-10-23 株式会社半導体エネルギー研究所 半導体装置およびその作製方法
JPWO2015045213A1 (ja) * 2013-09-30 2017-03-09 株式会社Joled 薄膜トランジスタ基板及びその製造方法
JP2016072498A (ja) * 2014-09-30 2016-05-09 株式会社東芝 半導体装置
JP2018046140A (ja) * 2016-09-14 2018-03-22 株式会社ジャパンディスプレイ 表示装置及びその製造方法
JP2021505971A (ja) * 2017-12-19 2021-02-18 友達光電股▲ふん▼有限公司AU Optronics Corporation 金属構造、その作成方法及びそれを応用した表示パネル
US11556036B2 (en) 2017-12-19 2023-01-17 Au Optronics Corporation Metal structure and method for fabricating same and display panel using same
KR101908383B1 (ko) 2018-04-25 2018-12-11 삼성디스플레이 주식회사 유기발광표시장치 및 그 제조방법

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