JP2008532228A5 - - Google Patents
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- JP2008532228A5 JP2008532228A5 JP2007557062A JP2007557062A JP2008532228A5 JP 2008532228 A5 JP2008532228 A5 JP 2008532228A5 JP 2007557062 A JP2007557062 A JP 2007557062A JP 2007557062 A JP2007557062 A JP 2007557062A JP 2008532228 A5 JP2008532228 A5 JP 2008532228A5
- Authority
- JP
- Japan
- Prior art keywords
- plasma source
- source material
- reservoir
- droplet generator
- supply
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/067,124 US7405416B2 (en) | 2005-02-25 | 2005-02-25 | Method and apparatus for EUV plasma source target delivery |
| US11/067,124 | 2005-02-25 | ||
| US11/088,475 US7122816B2 (en) | 2005-02-25 | 2005-03-23 | Method and apparatus for EUV light source target material handling |
| US11/088,475 | 2005-03-23 | ||
| PCT/US2006/005541 WO2006093687A1 (en) | 2005-02-25 | 2006-02-17 | Method and apparatus for euv light source target material handling |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2008532228A JP2008532228A (ja) | 2008-08-14 |
| JP2008532228A5 true JP2008532228A5 (enExample) | 2009-03-26 |
| JP5490362B2 JP5490362B2 (ja) | 2014-05-14 |
Family
ID=36931245
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007557062A Expired - Fee Related JP5490362B2 (ja) | 2005-02-25 | 2006-02-17 | Euv光源ターゲット材料を処理する方法及び装置 |
| JP2007557068A Expired - Fee Related JP5455308B2 (ja) | 2005-02-25 | 2006-02-17 | Euvプラズマ源ターゲット供給方法及び装置 |
| JP2012039168A Expired - Fee Related JP5643779B2 (ja) | 2005-02-25 | 2012-02-24 | Euvプラズマ源ターゲット供給システム |
Family Applications After (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007557068A Expired - Fee Related JP5455308B2 (ja) | 2005-02-25 | 2006-02-17 | Euvプラズマ源ターゲット供給方法及び装置 |
| JP2012039168A Expired - Fee Related JP5643779B2 (ja) | 2005-02-25 | 2012-02-24 | Euvプラズマ源ターゲット供給システム |
Country Status (5)
| Country | Link |
|---|---|
| US (3) | US7405416B2 (enExample) |
| EP (1) | EP1867218B1 (enExample) |
| JP (3) | JP5490362B2 (enExample) |
| KR (1) | KR101235023B1 (enExample) |
| WO (1) | WO2006093693A2 (enExample) |
Families Citing this family (181)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7856044B2 (en) * | 1999-05-10 | 2010-12-21 | Cymer, Inc. | Extendable electrode for gas discharge laser |
| US7378673B2 (en) * | 2005-02-25 | 2008-05-27 | Cymer, Inc. | Source material dispenser for EUV light source |
| US7928416B2 (en) * | 2006-12-22 | 2011-04-19 | Cymer, Inc. | Laser produced plasma EUV light source |
| US7372056B2 (en) * | 2005-06-29 | 2008-05-13 | Cymer, Inc. | LPP EUV plasma source material target delivery system |
| US7897947B2 (en) * | 2007-07-13 | 2011-03-01 | Cymer, Inc. | Laser produced plasma EUV light source having a droplet stream produced using a modulated disturbance wave |
| US7916388B2 (en) * | 2007-12-20 | 2011-03-29 | Cymer, Inc. | Drive laser for EUV light source |
| US8653437B2 (en) | 2010-10-04 | 2014-02-18 | Cymer, Llc | EUV light source with subsystem(s) for maintaining LPP drive laser output during EUV non-output periods |
| US7671349B2 (en) | 2003-04-08 | 2010-03-02 | Cymer, Inc. | Laser produced plasma EUV light source |
| US8654438B2 (en) | 2010-06-24 | 2014-02-18 | Cymer, Llc | Master oscillator-power amplifier drive laser with pre-pulse for EUV light source |
| WO2006075535A1 (ja) * | 2005-01-12 | 2006-07-20 | Nikon Corporation | レーザプラズマeuv光源、ターゲット部材、テープ部材、ターゲット部材の製造方法、ターゲットの供給方法、及びeuv露光装置 |
| JP4564369B2 (ja) * | 2005-02-04 | 2010-10-20 | 株式会社小松製作所 | 極端紫外光源装置 |
| US7718985B1 (en) * | 2005-11-01 | 2010-05-18 | University Of Central Florida Research Foundation, Inc. | Advanced droplet and plasma targeting system |
| JP4807560B2 (ja) * | 2005-11-04 | 2011-11-02 | 国立大学法人 宮崎大学 | 極端紫外光発生方法および極端紫外光発生装置 |
| EP1803567A1 (en) * | 2005-12-27 | 2007-07-04 | Nederlandse Organisatie voor toegepast-natuurwetenschappelijk Onderzoek TNO | Material jet system |
| JP5156192B2 (ja) * | 2006-01-24 | 2013-03-06 | ギガフォトン株式会社 | 極端紫外光源装置 |
| US8513629B2 (en) * | 2011-05-13 | 2013-08-20 | Cymer, Llc | Droplet generator with actuator induced nozzle cleaning |
| US8158960B2 (en) | 2007-07-13 | 2012-04-17 | Cymer, Inc. | Laser produced plasma EUV light source |
| US8829477B2 (en) * | 2010-03-10 | 2014-09-09 | Asml Netherlands B.V. | Droplet generator with actuator induced nozzle cleaning |
| JP4885587B2 (ja) * | 2006-03-28 | 2012-02-29 | 株式会社小松製作所 | ターゲット供給装置 |
| US20080035667A1 (en) * | 2006-06-07 | 2008-02-14 | Osg Norwich Pharmaceuticals, Inc. | Liquid delivery system |
| JP5162113B2 (ja) * | 2006-08-07 | 2013-03-13 | ギガフォトン株式会社 | 極端紫外光源装置 |
| US7696492B2 (en) * | 2006-12-13 | 2010-04-13 | Asml Netherlands B.V. | Radiation system and lithographic apparatus |
| JP2008193014A (ja) * | 2007-02-08 | 2008-08-21 | Komatsu Ltd | Lpp型euv光源装置用ターゲット物質供給装置及びシステム |
| JP5149520B2 (ja) * | 2007-03-08 | 2013-02-20 | ギガフォトン株式会社 | 極端紫外光源装置 |
| JP5426815B2 (ja) * | 2007-03-15 | 2014-02-26 | 株式会社ユメックス | 液滴生成装置および液滴生成方法 |
| JP5428057B2 (ja) * | 2007-07-12 | 2014-02-26 | イマジニアリング株式会社 | 圧縮着火内燃機関、グロープラグ及びインジェクタ |
| US8227771B2 (en) * | 2007-07-23 | 2012-07-24 | Asml Netherlands B.V. | Debris prevention system and lithographic apparatus |
| JP5234448B2 (ja) * | 2007-08-09 | 2013-07-10 | 国立大学法人東京工業大学 | 放射線源用ターゲット、その製造方法及び放射線発生装置 |
| US7655925B2 (en) * | 2007-08-31 | 2010-02-02 | Cymer, Inc. | Gas management system for a laser-produced-plasma EUV light source |
| US7812329B2 (en) * | 2007-12-14 | 2010-10-12 | Cymer, Inc. | System managing gas flow between chambers of an extreme ultraviolet (EUV) photolithography apparatus |
| US20090095924A1 (en) * | 2007-10-12 | 2009-04-16 | International Business Machines Corporation | Electrode design for euv discharge plasma source |
| JP5280066B2 (ja) * | 2008-02-28 | 2013-09-04 | ギガフォトン株式会社 | 極端紫外光源装置 |
| US7872245B2 (en) * | 2008-03-17 | 2011-01-18 | Cymer, Inc. | Systems and methods for target material delivery in a laser produced plasma EUV light source |
| US20090250637A1 (en) * | 2008-04-02 | 2009-10-08 | Cymer, Inc. | System and methods for filtering out-of-band radiation in EUV exposure tools |
| EP2298041B1 (en) * | 2008-07-07 | 2015-09-09 | Philips Deutschland GmbH | Extreme uv radiation generating device comprising a corrosion-resistant material |
| ATE528694T1 (de) * | 2008-07-18 | 2011-10-15 | Koninkl Philips Electronics Nv | Vorrichtung zur erzeugung von extremer uv- strahlung mit einem kontaminationsfänger und verfahren zur reinigung von zinn in einer solchen vorrichtung |
| US8198612B2 (en) * | 2008-07-31 | 2012-06-12 | Cymer, Inc. | Systems and methods for heating an EUV collector mirror |
| JP2010062141A (ja) * | 2008-08-04 | 2010-03-18 | Komatsu Ltd | 極端紫外光源装置 |
| US8519366B2 (en) * | 2008-08-06 | 2013-08-27 | Cymer, Inc. | Debris protection system having a magnetic field for an EUV light source |
| US7641349B1 (en) | 2008-09-22 | 2010-01-05 | Cymer, Inc. | Systems and methods for collector mirror temperature control using direct contact heat transfer |
| JP5362515B2 (ja) * | 2008-10-17 | 2013-12-11 | ギガフォトン株式会社 | 極端紫外光源装置のターゲット供給装置及びその製造方法 |
| JP5486795B2 (ja) * | 2008-11-20 | 2014-05-07 | ギガフォトン株式会社 | 極端紫外光源装置及びそのターゲット供給システム |
| US8283643B2 (en) * | 2008-11-24 | 2012-10-09 | Cymer, Inc. | Systems and methods for drive laser beam delivery in an EUV light source |
| JP5486797B2 (ja) * | 2008-12-22 | 2014-05-07 | ギガフォトン株式会社 | 極端紫外光源装置 |
| JP5739099B2 (ja) * | 2008-12-24 | 2015-06-24 | ギガフォトン株式会社 | ターゲット供給装置、その制御システム、その制御装置およびその制御回路 |
| JP5455661B2 (ja) * | 2009-01-29 | 2014-03-26 | ギガフォトン株式会社 | 極端紫外光源装置 |
| JP5670619B2 (ja) * | 2009-02-06 | 2015-02-18 | ギガフォトン株式会社 | 極端紫外光源装置 |
| US8969838B2 (en) * | 2009-04-09 | 2015-03-03 | Asml Netherlands B.V. | Systems and methods for protecting an EUV light source chamber from high pressure source material leaks |
| US8304752B2 (en) * | 2009-04-10 | 2012-11-06 | Cymer, Inc. | EUV light producing system and method utilizing an alignment laser |
| DE102009020776B4 (de) * | 2009-05-08 | 2011-07-28 | XTREME technologies GmbH, 37077 | Anordnung zur kontinuierlichen Erzeugung von flüssigem Zinn als Emittermaterial in EUV-Strahlungsquellen |
| WO2010137625A1 (ja) * | 2009-05-27 | 2010-12-02 | ギガフォトン株式会社 | ターゲット出力装置及び極端紫外光源装置 |
| WO2011013779A1 (ja) * | 2009-07-29 | 2011-02-03 | 株式会社小松製作所 | 極端紫外光源装置、極端紫外光源装置の制御方法、およびそのプログラムを記録した記録媒体 |
| US9113540B2 (en) | 2010-02-19 | 2015-08-18 | Gigaphoton Inc. | System and method for generating extreme ultraviolet light |
| US9265136B2 (en) | 2010-02-19 | 2016-02-16 | Gigaphoton Inc. | System and method for generating extreme ultraviolet light |
| JP5687488B2 (ja) | 2010-02-22 | 2015-03-18 | ギガフォトン株式会社 | 極端紫外光生成装置 |
| JP5702164B2 (ja) * | 2010-03-18 | 2015-04-15 | ギガフォトン株式会社 | 極端紫外光源装置、極端紫外光源装置の制御方法及びターゲット供給装置 |
| US8263953B2 (en) * | 2010-04-09 | 2012-09-11 | Cymer, Inc. | Systems and methods for target material delivery protection in a laser produced plasma EUV light source |
| US9066412B2 (en) | 2010-04-15 | 2015-06-23 | Asml Netherlands B.V. | Systems and methods for cooling an optic |
| JP5726587B2 (ja) * | 2010-10-06 | 2015-06-03 | ギガフォトン株式会社 | チャンバ装置 |
| US8462425B2 (en) | 2010-10-18 | 2013-06-11 | Cymer, Inc. | Oscillator-amplifier drive laser with seed protection for an EUV light source |
| JP2012103553A (ja) * | 2010-11-11 | 2012-05-31 | Nippon Sheet Glass Co Ltd | 正立等倍レンズアレイプレート、光走査ユニットおよび画像読取装置 |
| US8810902B2 (en) | 2010-12-29 | 2014-08-19 | Asml Netherlands B.V. | Multi-pass optical apparatus |
| JP5961871B2 (ja) * | 2011-01-28 | 2016-08-02 | イマジニアリング株式会社 | 内燃機関の制御装置 |
| JP5816440B2 (ja) | 2011-02-23 | 2015-11-18 | ギガフォトン株式会社 | 光学装置、レーザ装置および極端紫外光生成装置 |
| JP5921876B2 (ja) * | 2011-02-24 | 2016-05-24 | ギガフォトン株式会社 | 極端紫外光生成装置 |
| US8633459B2 (en) | 2011-03-02 | 2014-01-21 | Cymer, Llc | Systems and methods for optics cleaning in an EUV light source |
| US8604452B2 (en) | 2011-03-17 | 2013-12-10 | Cymer, Llc | Drive laser delivery systems for EUV light source |
| JP5662214B2 (ja) | 2011-03-18 | 2015-01-28 | ギガフォトン株式会社 | ターゲット供給装置 |
| JP5921879B2 (ja) * | 2011-03-23 | 2016-05-24 | ギガフォトン株式会社 | ターゲット供給装置及び極端紫外光生成装置 |
| US9029813B2 (en) | 2011-05-20 | 2015-05-12 | Asml Netherlands B.V. | Filter for material supply apparatus of an extreme ultraviolet light source |
| US9516730B2 (en) | 2011-06-08 | 2016-12-06 | Asml Netherlands B.V. | Systems and methods for buffer gas flow stabilization in a laser produced plasma light source |
| KR20140052012A (ko) | 2011-08-05 | 2014-05-02 | 에이에스엠엘 네델란즈 비.브이. | 리소그래피 장치에 대한 방법 및 방사선 소스 및 디바이스 제조 방법 |
| CN103765997B (zh) * | 2011-09-02 | 2016-08-10 | Asml荷兰有限公司 | 用于器件制造的光刻设备的辐射源以及方法 |
| NL2009257A (en) * | 2011-09-02 | 2013-03-05 | Asml Netherlands Bv | Radiation source and lithographic apparatus. |
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| NL2009358A (en) * | 2011-09-23 | 2013-03-26 | Asml Netherlands Bv | Radiation source. |
| JP6081711B2 (ja) * | 2011-09-23 | 2017-02-15 | エーエスエムエル ネザーランズ ビー.ブイ. | 放射源 |
| JP5881353B2 (ja) * | 2011-09-27 | 2016-03-09 | ギガフォトン株式会社 | ターゲット供給装置、極端紫外光生成装置 |
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| US8816305B2 (en) * | 2011-12-20 | 2014-08-26 | Asml Netherlands B.V. | Filter for material supply apparatus |
| JP6134130B2 (ja) | 2012-01-23 | 2017-05-24 | ギガフォトン株式会社 | ターゲット生成条件判定装置及びターゲット生成システム |
| JP6077822B2 (ja) * | 2012-02-10 | 2017-02-08 | ギガフォトン株式会社 | ターゲット供給装置、および、ターゲット供給方法 |
| JP5946649B2 (ja) | 2012-02-14 | 2016-07-06 | ギガフォトン株式会社 | ターゲット供給装置 |
| JP2013201118A (ja) | 2012-02-23 | 2013-10-03 | Gigaphoton Inc | ターゲット物質精製装置、および、ターゲット供給装置 |
| JP2013175402A (ja) * | 2012-02-27 | 2013-09-05 | Gigaphoton Inc | 極端紫外光生成装置及びターゲット物質供給方法 |
| SG11201404756VA (en) * | 2012-03-07 | 2014-10-30 | Asml Netherlands Bv | Radiation source and lithographic apparatus |
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| US9648714B2 (en) | 2012-03-27 | 2017-05-09 | Asml Netherlands B.V. | Fuel system for lithographic apparatus, EUV source, lithographic apparatus and fuel filtering method |
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| JP6099241B2 (ja) * | 2012-06-28 | 2017-03-22 | ギガフォトン株式会社 | ターゲット供給装置 |
| JP2014032778A (ja) | 2012-08-01 | 2014-02-20 | Gigaphoton Inc | ターゲット供給装置、および、ターゲット供給方法 |
| JP6068044B2 (ja) | 2012-08-09 | 2017-01-25 | ギガフォトン株式会社 | ターゲット供給装置の制御方法、および、ターゲット供給装置 |
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| JP6058324B2 (ja) | 2012-09-11 | 2017-01-11 | ギガフォトン株式会社 | ターゲット供給装置の制御方法、および、ターゲット供給装置 |
| KR20140036538A (ko) * | 2012-09-17 | 2014-03-26 | 삼성전자주식회사 | 극자외선 생성 장치, 이를 포함하는 노광 장치 및 이러한 노광 장치를 사용해서 제조된 전자 디바이스 |
| US9392678B2 (en) | 2012-10-16 | 2016-07-12 | Asml Netherlands B.V. | Target material supply apparatus for an extreme ultraviolet light source |
| JP2014102980A (ja) * | 2012-11-20 | 2014-06-05 | Gigaphoton Inc | ターゲット供給装置 |
| JP6103894B2 (ja) * | 2012-11-20 | 2017-03-29 | ギガフォトン株式会社 | ターゲット供給装置 |
| WO2014082811A1 (en) | 2012-11-30 | 2014-06-05 | Asml Netherlands B.V. | Droplet generator, euv radiation source, lithographic apparatus, method for generating droplets and device manufacturing method |
| US9277634B2 (en) * | 2013-01-17 | 2016-03-01 | Kla-Tencor Corporation | Apparatus and method for multiplexed multiple discharge plasma produced sources |
| JP2014143150A (ja) | 2013-01-25 | 2014-08-07 | Gigaphoton Inc | ターゲット供給装置およびeuv光生成チャンバ |
| JP6151525B2 (ja) | 2013-02-05 | 2017-06-21 | ギガフォトン株式会社 | ガスロック装置及び極端紫外光生成装置 |
| JP6151926B2 (ja) | 2013-02-07 | 2017-06-21 | ギガフォトン株式会社 | ターゲット供給装置 |
| JP6166551B2 (ja) | 2013-02-25 | 2017-07-19 | ギガフォトン株式会社 | ターゲット供給装置及び極端紫外光生成装置 |
| JP6168797B2 (ja) | 2013-03-08 | 2017-07-26 | ギガフォトン株式会社 | 極端紫外光生成装置 |
| US9699876B2 (en) | 2013-03-14 | 2017-07-04 | Asml Netherlands, B.V. | Method of and apparatus for supply and recovery of target material |
| KR102115543B1 (ko) * | 2013-04-26 | 2020-05-26 | 삼성전자주식회사 | 극자외선 광원 장치 |
| JP5662515B2 (ja) * | 2013-05-13 | 2015-01-28 | ギガフォトン株式会社 | 極端紫外光源装置及びそのターゲット供給システム |
| WO2014189055A1 (ja) * | 2013-05-21 | 2014-11-27 | ギガフォトン株式会社 | 極端紫外光生成装置 |
| WO2015015922A1 (ja) | 2013-08-01 | 2015-02-05 | ギガフォトン株式会社 | フィルタ、および、ターゲット供給装置 |
| US9846365B2 (en) | 2013-08-02 | 2017-12-19 | Asml Netherlands B.V. | Component for a radiation source, associated radiation source and lithographic apparatus |
| JP6275731B2 (ja) * | 2013-09-17 | 2018-02-07 | ギガフォトン株式会社 | ターゲット供給装置およびeuv光生成装置 |
| WO2015068230A1 (ja) * | 2013-11-07 | 2015-05-14 | ギガフォトン株式会社 | 極端紫外光生成装置及び極端紫外光生成装置の制御方法 |
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| US9271381B2 (en) | 2014-02-10 | 2016-02-23 | Asml Netherlands B.V. | Methods and apparatus for laser produced plasma EUV light source |
| WO2016001973A1 (ja) * | 2014-06-30 | 2016-01-07 | ギガフォトン株式会社 | ターゲット供給装置、ターゲット物質の精製方法、ターゲット物質の精製プログラム、ターゲット物質の精製プログラムを記録した記録媒体、および、ターゲット生成器 |
| US9301381B1 (en) | 2014-09-12 | 2016-03-29 | International Business Machines Corporation | Dual pulse driven extreme ultraviolet (EUV) radiation source utilizing a droplet comprising a metal core with dual concentric shells of buffer gas |
| US9544983B2 (en) * | 2014-11-05 | 2017-01-10 | Asml Netherlands B.V. | Apparatus for and method of supplying target material |
| JP6421196B2 (ja) * | 2014-11-05 | 2018-11-07 | ギガフォトン株式会社 | ターゲット生成装置およびフィルタ構造体の製造方法 |
| KR102336300B1 (ko) * | 2014-11-17 | 2021-12-07 | 삼성전자주식회사 | 극자외선 광원 장치 및 극자외선 광 발생 방법 |
| WO2016084167A1 (ja) | 2014-11-26 | 2016-06-02 | ギガフォトン株式会社 | 加振ユニット、ターゲット供給装置および極端紫外光生成システム |
| JP5964400B2 (ja) * | 2014-12-04 | 2016-08-03 | ギガフォトン株式会社 | 極端紫外光源装置及びそのターゲット供給システム |
| WO2016103456A1 (ja) | 2014-12-26 | 2016-06-30 | ギガフォトン株式会社 | 極端紫外光生成装置 |
| JP6513106B2 (ja) | 2015-01-28 | 2019-05-15 | ギガフォトン株式会社 | ターゲット供給装置 |
| US10217625B2 (en) * | 2015-03-11 | 2019-02-26 | Kla-Tencor Corporation | Continuous-wave laser-sustained plasma illumination source |
| WO2016182600A1 (en) * | 2015-05-09 | 2016-11-17 | Brilliant Light Power, Inc. | Ultraviolet electrical power generation systems and methods regarding same |
| KR102366807B1 (ko) * | 2015-08-11 | 2022-02-23 | 삼성전자주식회사 | 자기장을 이용하여 드롭릿 포지션을 컨트롤할 수 있는 드롭릿 발생부를 가진 euv 광 발생 장치 |
| JP6637155B2 (ja) * | 2016-02-26 | 2020-01-29 | ギガフォトン株式会社 | 極端紫外光生成装置 |
| US10455680B2 (en) * | 2016-02-29 | 2019-10-22 | Asml Netherlands B.V. | Method and apparatus for purifying target material for EUV light source |
| JP6237825B2 (ja) * | 2016-05-27 | 2017-11-29 | ウシオ電機株式会社 | 高温プラズマ原料供給装置および極端紫外光光源装置 |
| JP6715332B2 (ja) * | 2016-09-02 | 2020-07-01 | ギガフォトン株式会社 | ターゲット生成装置及び極端紫外光生成装置 |
| JP6266817B2 (ja) * | 2017-02-20 | 2018-01-24 | ギガフォトン株式会社 | ターゲット供給装置 |
| US10585215B2 (en) | 2017-06-29 | 2020-03-10 | Cymer, Llc | Reducing optical damage on an optical element |
| US10495974B2 (en) | 2017-09-14 | 2019-12-03 | Taiwan Semiconductor Manufacturing Co., Ltd. | Target feeding system |
| US10437162B2 (en) * | 2017-09-21 | 2019-10-08 | Asml Netherlands B.V. | Methods and apparatuses for protecting a seal in a pressure vessel of a photolithography system |
| US10331035B2 (en) * | 2017-11-08 | 2019-06-25 | Taiwan Semiconductor Manufacturing Co., Ltd. | Light source for lithography exposure process |
| WO2019092831A1 (ja) * | 2017-11-09 | 2019-05-16 | ギガフォトン株式会社 | 極端紫外光生成装置及び電子デバイスの製造方法 |
| JP6513237B2 (ja) * | 2018-01-10 | 2019-05-15 | ギガフォトン株式会社 | ターゲット供給装置 |
| TWI821231B (zh) | 2018-01-12 | 2023-11-11 | 荷蘭商Asml荷蘭公司 | 用於控制在液滴串流中液滴聚結之裝置與方法 |
| KR102746923B1 (ko) | 2018-03-28 | 2024-12-24 | 에이에스엠엘 네델란즈 비.브이. | 액적 생성기 성능을 모니터링 및 제어하는 장치 및 방법 |
| JP7393417B2 (ja) | 2018-09-18 | 2023-12-06 | エーエスエムエル ネザーランズ ビー.ブイ. | 高圧接続用装置 |
| NL2023879A (en) | 2018-09-26 | 2020-05-01 | Asml Netherlands Bv | Apparatus for and method of controlling introduction of euv target material into an euv chamber |
| US11134558B2 (en) * | 2018-09-28 | 2021-09-28 | Taiwan Semiconductor Manufacturing Co., Ltd. | Droplet generator assembly and method for using the same and radiation source apparatus |
| US10880980B2 (en) | 2018-09-28 | 2020-12-29 | Taiwan Semiconductor Manufacturing Co., Ltd. | EUV light source and apparatus for EUV lithography |
| NL2024077A (en) | 2018-10-25 | 2020-05-13 | Asml Netherlands Bv | Target material supply apparatus and method |
| JP6676127B2 (ja) * | 2018-10-26 | 2020-04-08 | ギガフォトン株式会社 | ターゲット供給装置、極端紫外光生成装置及び電子デバイスの製造方法 |
| TWI826559B (zh) | 2018-10-29 | 2023-12-21 | 荷蘭商Asml荷蘭公司 | 延長靶材輸送系統壽命之裝置及方法 |
| CA3116907A1 (en) * | 2018-11-02 | 2020-05-07 | Bionaut Labs Ltd. | Propelling devices for propelling through a medium, using external magnetic stimuli applied thereon |
| NL2024324A (en) | 2018-12-31 | 2020-07-10 | Asml Netherlands Bv | Apparatus for controlling introduction of euv target material into an euv chamber |
| US11963285B2 (en) | 2019-03-15 | 2024-04-16 | Asml Netherlands B.V. | Target material control in an EUV light source |
| US11032897B2 (en) * | 2019-08-22 | 2021-06-08 | Taiwan Semiconductor Manufacturing Co., Ltd. | Refill and replacement method for droplet generator |
| KR20220119034A (ko) | 2019-12-20 | 2022-08-26 | 에이에스엠엘 네델란즈 비.브이. | 소스 재료 전달 시스템, euv 방사선 시스템, 리소그래피 장치 및 그 방법 |
| JP7491737B2 (ja) | 2020-05-21 | 2024-05-28 | ギガフォトン株式会社 | ターゲット供給装置、ターゲット供給方法、及び電子デバイスの製造方法 |
| IL297926A (en) | 2020-05-22 | 2023-01-01 | Asml Netherlands Bv | Hybrid droplet generator for extreme ultraviolet light sources in lithographic radiation systems |
| KR20230017773A (ko) | 2020-05-29 | 2023-02-06 | 에이에스엠엘 네델란즈 비.브이. | 계측 방사선 시스템 내의 고압 및 진공 레벨 센서 |
| TW202209933A (zh) | 2020-06-29 | 2022-03-01 | 荷蘭商Asml荷蘭公司 | 在euv源之液滴產生器中加速液滴之方法及其設備 |
| TW202218486A (zh) * | 2020-07-15 | 2022-05-01 | 荷蘭商Asml荷蘭公司 | 用於保護在euv源中之流體管線之設備 |
| CN116097169A (zh) | 2020-09-10 | 2023-05-09 | Asml控股股份有限公司 | 用于光刻装置的盒输送系统和方法 |
| US12135269B2 (en) * | 2020-10-19 | 2024-11-05 | University Of Florida Research Foundation, Incorporated | System and method for measuring surface tension of a levitated sample |
| US12063734B2 (en) * | 2021-04-16 | 2024-08-13 | Taiwan Semiconductor Manufacturing Co., Ltd. | Droplet generator assembly and method of replacing components |
| CN117441411A (zh) | 2021-06-25 | 2024-01-23 | Asml荷兰有限公司 | 用于在euv源中产生目标材料微滴的装置和方法 |
| KR20240107136A (ko) * | 2021-11-22 | 2024-07-08 | 에이에스엠엘 네델란즈 비.브이. | 액체 타겟 재료를 방사선 소스에 공급하기 위한 장치 |
| CN118339927A (zh) * | 2021-11-22 | 2024-07-12 | Asml荷兰有限公司 | 液体目标材料供应装置、燃料发射器、辐射源、光刻装置和液体目标材料供应方法 |
| EP4457567A1 (en) | 2021-12-28 | 2024-11-06 | ASML Netherlands B.V. | Lithographic apparatus, illumination system, and connection sealing device with protective shield |
| JP2023120533A (ja) * | 2022-02-18 | 2023-08-30 | ギガフォトン株式会社 | ターゲット供給システム、極端紫外光生成装置、及び電子デバイスの製造方法 |
| JP2024020968A (ja) * | 2022-08-02 | 2024-02-15 | ギガフォトン株式会社 | 極端紫外光生成装置、及び電子デバイスの製造方法 |
| JP2024064515A (ja) * | 2022-10-28 | 2024-05-14 | ウシオ電機株式会社 | 原料供給装置及び光源装置 |
| KR20250107826A (ko) | 2022-11-16 | 2025-07-14 | 에이에스엠엘 네델란즈 비.브이. | 액적 스트림 정렬 메커니즘 및 그 방법 |
| JP2024106191A (ja) | 2023-01-26 | 2024-08-07 | ギガフォトン株式会社 | ターゲット供給装置、及び電子デバイスの製造方法 |
| KR20250151386A (ko) | 2023-02-17 | 2025-10-21 | 에이에스엠엘 네델란즈 비.브이. | Euv 방사선 소스를 위한 타겟 재료 저장 및 전달 시스템 |
| JP2024150856A (ja) | 2023-04-11 | 2024-10-24 | ウシオ電機株式会社 | 回転体及び光源装置 |
| WO2025056269A1 (en) * | 2023-09-14 | 2025-03-20 | Asml Netherlands B.V. | Molten metal transfer line |
| WO2025140811A1 (en) | 2023-12-29 | 2025-07-03 | Asml Netherlands B.V. | Extreme ultraviolet light generation sequence for an extreme ultraviolet light source |
| WO2025140805A1 (en) | 2023-12-29 | 2025-07-03 | Asml Netherlands B.V. | Systems and methods of laser-to-droplet positioning with tilt range keep assist during extreme ultraviolet radiation generation |
| WO2025153240A1 (en) | 2024-01-16 | 2025-07-24 | Asml Netherlands B.V. | Gas flow reallocation in light source |
| WO2025153242A1 (en) | 2024-01-17 | 2025-07-24 | Asml Netherlands B.V. | Method and device for tuning flow velocity profile |
| WO2025153241A1 (en) | 2024-01-17 | 2025-07-24 | Asml Netherlands B.V. | Modular gas purification system for radiation source |
| WO2025186108A1 (en) | 2024-03-05 | 2025-09-12 | Asml Netherlands B.V. | Method and system for euv energy adjustment via rarefaction pulse adjustment |
| WO2025229431A1 (en) | 2024-05-01 | 2025-11-06 | Cymer, Llc | Systems and methods for predicting a next pulse in a light source |
Family Cites Families (126)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2759106A (en) * | 1951-05-25 | 1956-08-14 | Wolter Hans | Optical image-forming mirror system providing for grazing incidence of rays |
| US3279176A (en) * | 1959-07-31 | 1966-10-18 | North American Aviation Inc | Ion rocket engine |
| US3150483A (en) * | 1962-05-10 | 1964-09-29 | Aerospace Corp | Plasma generator and accelerator |
| US3232046A (en) * | 1962-06-06 | 1966-02-01 | Aerospace Corp | Plasma generator and propulsion exhaust system |
| US3322046A (en) * | 1965-01-14 | 1967-05-30 | Greif Bros Cooperage Corp | Paperboard drums and a method and apparatus for mounting the end closures thereon |
| US3746870A (en) * | 1970-12-21 | 1973-07-17 | Gen Electric | Coated light conduit |
| US3969628A (en) * | 1974-04-04 | 1976-07-13 | The United States Of America As Represented By The Secretary Of The Army | Intense, energetic electron beam assisted X-ray generator |
| US4042848A (en) * | 1974-05-17 | 1977-08-16 | Ja Hyun Lee | Hypocycloidal pinch device |
| US3946332A (en) * | 1974-06-13 | 1976-03-23 | Samis Michael A | High power density continuous wave plasma glow jet laser system |
| US3961197A (en) * | 1974-08-21 | 1976-06-01 | The United States Of America As Represented By The United States Energy Research And Development Administration | X-ray generator |
| US3960473A (en) * | 1975-02-06 | 1976-06-01 | The Glastic Corporation | Die structure for forming a serrated rod |
| US4162160A (en) * | 1977-08-25 | 1979-07-24 | Fansteel Inc. | Electrical contact material and method for making the same |
| US4143275A (en) * | 1977-09-28 | 1979-03-06 | Battelle Memorial Institute | Applying radiation |
| US4203393A (en) * | 1979-01-04 | 1980-05-20 | Ford Motor Company | Plasma jet ignition engine and method |
| JPS5756668A (en) * | 1980-09-18 | 1982-04-05 | Nissan Motor Co Ltd | Plasma igniter |
| US4364342A (en) * | 1980-10-01 | 1982-12-21 | Ford Motor Company | Ignition system employing plasma spray |
| USRE34806E (en) | 1980-11-25 | 1994-12-13 | Celestech, Inc. | Magnetoplasmadynamic processor, applications thereof and methods |
| US4538291A (en) * | 1981-11-09 | 1985-08-27 | Kabushiki Kaisha Suwa Seikosha | X-ray source |
| US4504964A (en) * | 1982-09-20 | 1985-03-12 | Eaton Corporation | Laser beam plasma pinch X-ray system |
| US4536884A (en) * | 1982-09-20 | 1985-08-20 | Eaton Corporation | Plasma pinch X-ray apparatus |
| US4633492A (en) * | 1982-09-20 | 1986-12-30 | Eaton Corporation | Plasma pinch X-ray method |
| US4618971A (en) * | 1982-09-20 | 1986-10-21 | Eaton Corporation | X-ray lithography system |
| US4507588A (en) * | 1983-02-28 | 1985-03-26 | Board Of Trustees Operating Michigan State University | Ion generating apparatus and method for the use thereof |
| DE3332711A1 (de) * | 1983-09-10 | 1985-03-28 | Fa. Carl Zeiss, 7920 Heidenheim | Vorrichtung zur erzeugung einer plasmaquelle mit hoher strahlungsintensitaet im roentgenbereich |
| JPS60175351A (ja) * | 1984-02-14 | 1985-09-09 | Nippon Telegr & Teleph Corp <Ntt> | X線発生装置およびx線露光法 |
| US4561406A (en) * | 1984-05-25 | 1985-12-31 | Combustion Electromagnetics, Inc. | Winged reentrant electromagnetic combustion chamber |
| US4837794A (en) * | 1984-10-12 | 1989-06-06 | Maxwell Laboratories Inc. | Filter apparatus for use with an x-ray source |
| JPS61153935A (ja) * | 1984-12-26 | 1986-07-12 | Toshiba Corp | プラズマx線発生装置 |
| US4626193A (en) * | 1985-08-02 | 1986-12-02 | Itt Corporation | Direct spark ignition system |
| US4774914A (en) * | 1985-09-24 | 1988-10-04 | Combustion Electromagnetics, Inc. | Electromagnetic ignition--an ignition system producing a large size and intense capacitive and inductive spark with an intense electromagnetic field feeding the spark |
| CA1239487A (en) * | 1985-10-03 | 1988-07-19 | National Research Council Of Canada | Multiple vacuum arc derived plasma pinch x-ray source |
| CA1239486A (en) * | 1985-10-03 | 1988-07-19 | Rajendra P. Gupta | Gas discharge derived annular plasma pinch x-ray source |
| US4928020A (en) * | 1988-04-05 | 1990-05-22 | The United States Of America As Represented By The United States Department Of Energy | Saturable inductor and transformer structures for magnetic pulse compression |
| USRE35806E (en) * | 1988-11-16 | 1998-05-26 | Sgs-Thomson Microelectronics S.R.L. | Multipurpose, internally configurable integrated circuit for driving a switching mode external inductive loads according to a selectable connection scheme |
| GB8918429D0 (en) * | 1989-08-12 | 1989-09-20 | Lucas Ind Plc | Fuel pumping apparatus |
| DE3927089C1 (enExample) * | 1989-08-17 | 1991-04-25 | Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung Ev, 8000 Muenchen, De | |
| US5102776A (en) * | 1989-11-09 | 1992-04-07 | Cornell Research Foundation, Inc. | Method and apparatus for microlithography using x-pinch x-ray source |
| US5027076A (en) * | 1990-01-29 | 1991-06-25 | Ball Corporation | Open cage density sensor |
| US5226948A (en) * | 1990-08-30 | 1993-07-13 | University Of Southern California | Method and apparatus for droplet stream manufacturing |
| US5171360A (en) * | 1990-08-30 | 1992-12-15 | University Of Southern California | Method for droplet stream manufacturing |
| US5259593A (en) * | 1990-08-30 | 1993-11-09 | University Of Southern California | Apparatus for droplet stream manufacturing |
| US5175755A (en) * | 1990-10-31 | 1992-12-29 | X-Ray Optical System, Inc. | Use of a kumakhov lens for x-ray lithography |
| US5126638A (en) * | 1991-05-13 | 1992-06-30 | Maxwell Laboratories, Inc. | Coaxial pseudospark discharge switch |
| US5142166A (en) * | 1991-10-16 | 1992-08-25 | Science Research Laboratory, Inc. | High voltage pulsed power source |
| JPH0816720B2 (ja) * | 1992-04-21 | 1996-02-21 | 日本航空電子工業株式会社 | 軟x線多層膜反射鏡 |
| US5411224A (en) * | 1993-04-08 | 1995-05-02 | Dearman; Raymond M. | Guard for jet engine |
| US5313481A (en) * | 1993-09-29 | 1994-05-17 | The United States Of America As Represented By The United States Department Of Energy | Copper laser modulator driving assembly including a magnetic compression laser |
| US5448580A (en) * | 1994-07-05 | 1995-09-05 | The United States Of America As Represented By The United States Department Of Energy | Air and water cooled modulator |
| US5504795A (en) * | 1995-02-06 | 1996-04-02 | Plex Corporation | Plasma X-ray source |
| CA2186899C (en) * | 1995-02-17 | 2010-04-20 | Daniel L. Birx | Pulse power generating circuit with energy recovery |
| US5938102A (en) * | 1995-09-25 | 1999-08-17 | Muntz; Eric Phillip | High speed jet soldering system |
| US5894980A (en) * | 1995-09-25 | 1999-04-20 | Rapid Analysis Development Comapny | Jet soldering system and method |
| US6276589B1 (en) * | 1995-09-25 | 2001-08-21 | Speedline Technologies, Inc. | Jet soldering system and method |
| US5894985A (en) * | 1995-09-25 | 1999-04-20 | Rapid Analysis Development Company | Jet soldering system and method |
| US6186192B1 (en) * | 1995-09-25 | 2001-02-13 | Rapid Analysis And Development Company | Jet soldering system and method |
| US5830336A (en) * | 1995-12-05 | 1998-11-03 | Minnesota Mining And Manufacturing Company | Sputtering of lithium |
| SE510133C2 (sv) * | 1996-04-25 | 1999-04-19 | Jettec Ab | Laser-plasma röntgenkälla utnyttjande vätskor som strålmål |
| JP2000511464A (ja) * | 1997-02-06 | 2000-09-05 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 液体滴下装置 |
| US6224180B1 (en) * | 1997-02-21 | 2001-05-01 | Gerald Pham-Van-Diep | High speed jet soldering system |
| US5963616A (en) * | 1997-03-11 | 1999-10-05 | University Of Central Florida | Configurations, materials and wavelengths for EUV lithium plasma discharge lamps |
| US6031241A (en) * | 1997-03-11 | 2000-02-29 | University Of Central Florida | Capillary discharge extreme ultraviolet lamp source for EUV microlithography and other related applications |
| JP3385898B2 (ja) * | 1997-03-24 | 2003-03-10 | 安藤電気株式会社 | 可変波長半導体レーザ光源 |
| US5936988A (en) * | 1997-12-15 | 1999-08-10 | Cymer, Inc. | High pulse rate pulse power system |
| US5866871A (en) * | 1997-04-28 | 1999-02-02 | Birx; Daniel | Plasma gun and methods for the use thereof |
| US6172324B1 (en) * | 1997-04-28 | 2001-01-09 | Science Research Laboratory, Inc. | Plasma focus radiation source |
| US6586757B2 (en) * | 1997-05-12 | 2003-07-01 | Cymer, Inc. | Plasma focus light source with active and buffer gas control |
| US6566668B2 (en) * | 1997-05-12 | 2003-05-20 | Cymer, Inc. | Plasma focus light source with tandem ellipsoidal mirror units |
| US6744060B2 (en) * | 1997-05-12 | 2004-06-01 | Cymer, Inc. | Pulse power system for extreme ultraviolet and x-ray sources |
| US6815700B2 (en) * | 1997-05-12 | 2004-11-09 | Cymer, Inc. | Plasma focus light source with improved pulse power system |
| US6452199B1 (en) * | 1997-05-12 | 2002-09-17 | Cymer, Inc. | Plasma focus high energy photon source with blast shield |
| US5763930A (en) * | 1997-05-12 | 1998-06-09 | Cymer, Inc. | Plasma focus high energy photon source |
| US6566667B1 (en) * | 1997-05-12 | 2003-05-20 | Cymer, Inc. | Plasma focus light source with improved pulse power system |
| US6064072A (en) * | 1997-05-12 | 2000-05-16 | Cymer, Inc. | Plasma focus high energy photon source |
| JPH11283900A (ja) * | 1998-03-27 | 1999-10-15 | Nikon Corp | 露光装置 |
| US6580517B2 (en) * | 2000-03-01 | 2003-06-17 | Lambda Physik Ag | Absolute wavelength calibration of lithography laser using multiple element or tandem see through hollow cathode lamp |
| JP2000091096A (ja) | 1998-09-14 | 2000-03-31 | Nikon Corp | X線発生装置 |
| US6285743B1 (en) * | 1998-09-14 | 2001-09-04 | Nikon Corporation | Method and apparatus for soft X-ray generation |
| US6031598A (en) * | 1998-09-25 | 2000-02-29 | Euv Llc | Extreme ultraviolet lithography machine |
| AU1454100A (en) * | 1998-10-27 | 2000-05-15 | Jmar Research, Inc. | Shaped source of soft x-ray, extreme ultraviolet and ultraviolet radiation |
| US6493323B1 (en) * | 1999-05-14 | 2002-12-10 | Lucent Technologies Inc. | Asynchronous object oriented configuration control system for highly reliable distributed systems |
| US6228512B1 (en) | 1999-05-26 | 2001-05-08 | The Regents Of The University Of California | MoRu/Be multilayers for extreme ultraviolet applications |
| TW561279B (en) | 1999-07-02 | 2003-11-11 | Asml Netherlands Bv | Reflector for reflecting radiation in a desired wavelength range, lithographic projection apparatus containing the same and method for their preparation |
| US6317448B1 (en) * | 1999-09-23 | 2001-11-13 | Cymer, Inc. | Bandwidth estimating technique for narrow band laser |
| JP2001108799A (ja) * | 1999-10-08 | 2001-04-20 | Nikon Corp | X線発生装置、x線露光装置及び半導体デバイスの製造方法 |
| US6377651B1 (en) * | 1999-10-11 | 2002-04-23 | University Of Central Florida | Laser plasma source for extreme ultraviolet lithography using a water droplet target |
| US6831963B2 (en) * | 2000-10-20 | 2004-12-14 | University Of Central Florida | EUV, XUV, and X-Ray wavelength sources created from laser plasma produced from liquid metal solutions |
| FR2799667B1 (fr) * | 1999-10-18 | 2002-03-08 | Commissariat Energie Atomique | Procede et dispositif de generation d'un brouillard dense de gouttelettes micrometriques et submicrometriques, application a la generation de lumiere dans l'extreme ultraviolet notamment pour la lithographie |
| TWI246872B (en) * | 1999-12-17 | 2006-01-01 | Asml Netherlands Bv | Radiation source for use in lithographic projection apparatus |
| TW502559B (en) | 1999-12-24 | 2002-09-11 | Koninkl Philips Electronics Nv | Method of generating extremely short-wave radiation, method of manufacturing a device by means of said radiation, extremely short-wave radiation source unit and lithographic projection apparatus provided with such a radiation source unit |
| US6195272B1 (en) * | 2000-03-16 | 2001-02-27 | Joseph E. Pascente | Pulsed high voltage power supply radiography system having a one to one correspondence between low voltage input pulses and high voltage output pulses |
| DE10016008A1 (de) | 2000-03-31 | 2001-10-11 | Zeiss Carl | Villagensystem und dessen Herstellung |
| US6647086B2 (en) * | 2000-05-19 | 2003-11-11 | Canon Kabushiki Kaisha | X-ray exposure apparatus |
| US6520402B2 (en) * | 2000-05-22 | 2003-02-18 | The Regents Of The University Of California | High-speed direct writing with metallic microspheres |
| US6562099B2 (en) * | 2000-05-22 | 2003-05-13 | The Regents Of The University Of California | High-speed fabrication of highly uniform metallic microspheres |
| US6491737B2 (en) * | 2000-05-22 | 2002-12-10 | The Regents Of The University Of California | High-speed fabrication of highly uniform ultra-small metallic microspheres |
| US6904073B2 (en) * | 2001-01-29 | 2005-06-07 | Cymer, Inc. | High power deep ultraviolet laser with long life optics |
| JP2002006096A (ja) * | 2000-06-23 | 2002-01-09 | Nikon Corp | 電磁波発生装置、これを用いた半導体製造装置並びに半導体デバイスの製造方法 |
| JPWO2002041375A1 (ja) * | 2000-11-15 | 2004-03-25 | 株式会社ニコン | 搬送方法及びその装置、露光方法及びその装置、並びにデバイスの製造方法 |
| US6576912B2 (en) * | 2001-01-03 | 2003-06-10 | Hugo M. Visser | Lithographic projection apparatus equipped with extreme ultraviolet window serving simultaneously as vacuum window |
| US6804327B2 (en) * | 2001-04-03 | 2004-10-12 | Lambda Physik Ag | Method and apparatus for generating high output power gas discharge based source of extreme ultraviolet radiation and/or soft x-rays |
| FR2823949A1 (fr) * | 2001-04-18 | 2002-10-25 | Commissariat Energie Atomique | Procede et dispositif de generation de lumiere dans l'extreme ultraviolet notamment pour la lithographie |
| US6396900B1 (en) * | 2001-05-01 | 2002-05-28 | The Regents Of The University Of California | Multilayer films with sharp, stable interfaces for use in EUV and soft X-ray application |
| US7378673B2 (en) * | 2005-02-25 | 2008-05-27 | Cymer, Inc. | Source material dispenser for EUV light source |
| US20030008148A1 (en) | 2001-07-03 | 2003-01-09 | Sasa Bajt | Optimized capping layers for EUV multilayers |
| DE10151080C1 (de) * | 2001-10-10 | 2002-12-05 | Xtreme Tech Gmbh | Einrichtung und Verfahren zum Erzeugen von extrem ultravioletter (EUV-)Strahlung auf Basis einer Gasentladung |
| JP4111487B2 (ja) | 2002-04-05 | 2008-07-02 | ギガフォトン株式会社 | 極端紫外光源装置 |
| US6855943B2 (en) * | 2002-05-28 | 2005-02-15 | Northrop Grumman Corporation | Droplet target delivery method for high pulse-rate laser-plasma extreme ultraviolet light source |
| US6744851B2 (en) * | 2002-05-31 | 2004-06-01 | Northrop Grumman Corporation | Linear filament array sheet for EUV production |
| JP4088485B2 (ja) * | 2002-07-04 | 2008-05-21 | オムロンレーザーフロント株式会社 | 光波発生装置及び光波発生方法 |
| SG129259A1 (en) * | 2002-10-03 | 2007-02-26 | Asml Netherlands Bv | Radiation source lithographic apparatus, and device manufacturing method |
| DE10260376A1 (de) * | 2002-12-13 | 2004-07-15 | Forschungsverbund Berlin E.V. | Vorrichtung und Verfahren zur Erzeugung eines Tröpfchen-Targets |
| GB0301975D0 (en) | 2003-01-29 | 2003-02-26 | Rhodia Cons Spec Ltd | Treating slurries |
| JP4264505B2 (ja) * | 2003-03-24 | 2009-05-20 | 独立行政法人産業技術総合研究所 | レーザープラズマ発生方法及び装置 |
| DE10326279A1 (de) * | 2003-06-11 | 2005-01-05 | MAX-PLANCK-Gesellschaft zur Förderung der Wissenschaften e.V. | Plasma-basierte Erzeugung von Röntgenstrahlung mit einem schichtförmigen Targetmaterial |
| US6933515B2 (en) * | 2003-06-26 | 2005-08-23 | University Of Central Florida Research Foundation | Laser-produced plasma EUV light source with isolated plasma |
| JP2005032510A (ja) * | 2003-07-10 | 2005-02-03 | Nikon Corp | Euv光源、露光装置及び露光方法 |
| DE10350614B4 (de) * | 2003-10-30 | 2007-11-29 | Bruker Daltonik Gmbh | Dispenser |
| JP2005216983A (ja) * | 2004-01-28 | 2005-08-11 | Nikon Corp | 超音波アクチュエータ及びeuv露光装置 |
| US7087914B2 (en) * | 2004-03-17 | 2006-08-08 | Cymer, Inc | High repetition rate laser produced plasma EUV light source |
| DE102004036441B4 (de) * | 2004-07-23 | 2007-07-12 | Xtreme Technologies Gmbh | Vorrichtung und Verfahren zum Dosieren von Targetmaterial für die Erzeugung kurzwelliger elektromagnetischer Strahlung |
| JP4578883B2 (ja) * | 2004-08-02 | 2010-11-10 | 株式会社小松製作所 | 極端紫外光源装置 |
| US7122791B2 (en) * | 2004-09-03 | 2006-10-17 | Agilent Technologies, Inc. | Capillaries for mass spectrometry |
| US7141807B2 (en) * | 2004-10-22 | 2006-11-28 | Agilent Technologies, Inc. | Nanowire capillaries for mass spectrometry |
| US7637403B2 (en) * | 2004-10-25 | 2009-12-29 | Plex Llc | Liquid metal droplet generator |
| US7060975B2 (en) * | 2004-11-05 | 2006-06-13 | Agilent Technologies, Inc. | Electrospray devices for mass spectrometry |
| US7449703B2 (en) * | 2005-02-25 | 2008-11-11 | Cymer, Inc. | Method and apparatus for EUV plasma source target delivery target material handling |
-
2005
- 2005-02-25 US US11/067,124 patent/US7405416B2/en not_active Expired - Fee Related
- 2005-03-23 US US11/088,475 patent/US7122816B2/en not_active Expired - Lifetime
-
2006
- 2006-02-17 JP JP2007557062A patent/JP5490362B2/ja not_active Expired - Fee Related
- 2006-02-17 EP EP06720851.2A patent/EP1867218B1/en not_active Not-in-force
- 2006-02-17 JP JP2007557068A patent/JP5455308B2/ja not_active Expired - Fee Related
- 2006-02-17 KR KR1020077021532A patent/KR101235023B1/ko not_active Expired - Fee Related
- 2006-02-17 WO PCT/US2006/005647 patent/WO2006093693A2/en not_active Ceased
-
2008
- 2008-07-25 US US12/220,560 patent/US7838854B2/en not_active Expired - Fee Related
-
2012
- 2012-02-24 JP JP2012039168A patent/JP5643779B2/ja not_active Expired - Fee Related
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