KR100857504B1 - 연마 패드용 쿠션층 - Google Patents
연마 패드용 쿠션층 Download PDFInfo
- Publication number
- KR100857504B1 KR100857504B1 KR1020077026611A KR20077026611A KR100857504B1 KR 100857504 B1 KR100857504 B1 KR 100857504B1 KR 1020077026611 A KR1020077026611 A KR 1020077026611A KR 20077026611 A KR20077026611 A KR 20077026611A KR 100857504 B1 KR100857504 B1 KR 100857504B1
- Authority
- KR
- South Korea
- Prior art keywords
- polishing
- layer
- polishing pad
- resin
- acid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
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- H10P52/00—
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/22—Lapping pads for working plane surfaces characterised by a multi-layered structure
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
- B24D11/001—Manufacture of flexible abrasive materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
- B24D11/008—Finishing manufactured abrasive sheets, e.g. cutting, deforming
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
- B24D3/02—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
- B24D3/20—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
- B24D3/28—Resins or natural or synthetic macromolecular compounds
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Polishing Bodies And Polishing Tools (AREA)
- Manufacture Of Macromolecular Shaped Articles (AREA)
- Treatments Of Macromolecular Shaped Articles (AREA)
Abstract
Description
Claims (3)
- 연마층과 쿠션층으로 이루어지는 연마 패드에 포함되는 쿠션층으로서, 압축 회복률이 90% 이상인 것을 특징으로 하며,상기 압축 회복률은압축 회복률(%)=100(T3-T2)/(T1-T2)(T1: 무부하 상태로부터 30kPa(300g/㎠)의 응력 부하를 60초 유지했을 때의 시트의 두께T2: T1의 상태로부터 180kPa의 응력 부하를 60초 유지했을 때의 시트의 두께T3: T2의 상태로부터 하중을 제거하고 60초 방치 후, 다시, 30kPa의 응력 부하를 60초 유지했을 때의 시트의 두께)의 식으로 구해지는,연마 패드용 쿠션층.
- 제1항에 있어서,상기 쿠션층은,부타디엔 중합체, 이소프렌 중합체, 스티렌-부타디엔 공중합체, 스티렌이소프렌-스티렌블록 공중합체, 스티렌-부타디엔-스티렌블록 공중합체, 스티렌-에틸렌-부타디엔-스티렌블록 공중합체, 아크릴니트릴-부타디엔 공중합체, 우레탄 고무, 에피클로르히드린 고무, 염소화 폴리에틸렌, 실리콘 고무, 폴리에스테르계열 가소성 엘라스토머, 폴리아미드계열 가소성 엘라스토머, 우레탄계열 가소성 엘라스토머, 플루오르계열 가소성 엘라스토머 화합물로 이루어지는 군에서 선택되는 하나 이상의 물질을 포함하는 것을 특징으로 하는 연마 패드용 쿠션층.
- 제1항 또는 제2항에 있어서,표면에 요철 가공이 실시되어 있는 것을 특징으로 하는 연마 패드용 쿠션층.
Applications Claiming Priority (24)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2000-00367468 | 2000-12-01 | ||
| JP2000367469 | 2000-12-01 | ||
| JPJP-P-2000-00367469 | 2000-12-01 | ||
| JP2000367468 | 2000-12-01 | ||
| JPJP-P-2001-00013405 | 2001-01-22 | ||
| JP2001013405 | 2001-01-22 | ||
| JP2001061221 | 2001-03-06 | ||
| JPJP-P-2001-00061221 | 2001-03-06 | ||
| JP2001103699 | 2001-04-02 | ||
| JPJP-P-2001-00103699 | 2001-04-02 | ||
| JP2001225568 | 2001-07-26 | ||
| JPJP-P-2001-00225568 | 2001-07-26 | ||
| JPJP-P-2001-00234577 | 2001-08-02 | ||
| JP2001234577 | 2001-08-02 | ||
| JP2001269928 | 2001-09-06 | ||
| JPJP-P-2001-00269928 | 2001-09-06 | ||
| JPJP-P-2001-00274011 | 2001-09-10 | ||
| JP2001274011 | 2001-09-10 | ||
| JP2001302941 | 2001-09-28 | ||
| JPJP-P-2001-00302940 | 2001-09-28 | ||
| JP2001302940 | 2001-09-28 | ||
| JPJP-P-2001-00302939 | 2001-09-28 | ||
| JP2001302939 | 2001-09-28 | ||
| JPJP-P-2001-00302941 | 2001-09-28 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020037006642A Division KR100867339B1 (ko) | 2000-12-01 | 2001-11-28 | 연마 패드 및 그 제조 방법 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20070116694A KR20070116694A (ko) | 2007-12-10 |
| KR100857504B1 true KR100857504B1 (ko) | 2008-09-08 |
Family
ID=27583556
Family Applications (4)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020087008913A Expired - Lifetime KR100892924B1 (ko) | 2000-12-01 | 2001-11-28 | 연마 패드 |
| KR1020037006642A Expired - Lifetime KR100867339B1 (ko) | 2000-12-01 | 2001-11-28 | 연마 패드 및 그 제조 방법 |
| KR1020077026611A Expired - Lifetime KR100857504B1 (ko) | 2000-12-01 | 2001-11-28 | 연마 패드용 쿠션층 |
| KR1020077026612A Expired - Lifetime KR100905266B1 (ko) | 2000-12-01 | 2001-11-28 | 연마 패드 |
Family Applications Before (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020087008913A Expired - Lifetime KR100892924B1 (ko) | 2000-12-01 | 2001-11-28 | 연마 패드 |
| KR1020037006642A Expired - Lifetime KR100867339B1 (ko) | 2000-12-01 | 2001-11-28 | 연마 패드 및 그 제조 방법 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020077026612A Expired - Lifetime KR100905266B1 (ko) | 2000-12-01 | 2001-11-28 | 연마 패드 |
Country Status (5)
| Country | Link |
|---|---|
| US (4) | US7192340B2 (ko) |
| JP (4) | JP4177100B2 (ko) |
| KR (4) | KR100892924B1 (ko) |
| CN (4) | CN100379522C (ko) |
| WO (1) | WO2002043921A1 (ko) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102198769B1 (ko) * | 2020-03-17 | 2021-01-05 | 에스케이씨 주식회사 | 연마패드 및 이를 이용한 반도체 소자의 제조방법 |
| KR102206485B1 (ko) * | 2020-03-17 | 2021-01-22 | 에스케이씨 주식회사 | 연마패드 및 이를 이용한 반도체 소자의 제조방법 |
| US11534887B2 (en) | 2020-03-17 | 2022-12-27 | Skc Solmics Co., Ltd. | Polishing pad and method for preparing semiconductor device using same |
| KR102801064B1 (ko) * | 2024-09-03 | 2025-04-30 | 엔펄스 주식회사 | 재생 연마패드 및 이의 제조방법 |
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| JP2004167605A (ja) * | 2002-11-15 | 2004-06-17 | Rodel Nitta Co | 研磨パッドおよび研磨装置 |
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| DE10255652B4 (de) * | 2002-11-28 | 2005-07-14 | Infineon Technologies Ag | Schleifkissen, Vorrichtung zum chemisch-mechanischen Polieren und Verfahren zum nasschemischen Schleifen einer Substratoberfläche |
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| JP2004235446A (ja) * | 2003-01-30 | 2004-08-19 | Toyobo Co Ltd | 研磨パッド |
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| WO2004068570A1 (ja) * | 2003-01-31 | 2004-08-12 | Hitachi Chemical Co., Ltd. | Cmp研磨剤及び研磨方法 |
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- 2001-11-28 KR KR1020077026612A patent/KR100905266B1/ko not_active Expired - Lifetime
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- 2001-11-28 CN CNB2005100543795A patent/CN100496896C/zh not_active Expired - Lifetime
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| Publication number | Priority date | Publication date | Assignee | Title |
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| KR102198769B1 (ko) * | 2020-03-17 | 2021-01-05 | 에스케이씨 주식회사 | 연마패드 및 이를 이용한 반도체 소자의 제조방법 |
| KR102206485B1 (ko) * | 2020-03-17 | 2021-01-22 | 에스케이씨 주식회사 | 연마패드 및 이를 이용한 반도체 소자의 제조방법 |
| KR20210116209A (ko) * | 2020-03-17 | 2021-09-27 | 에스케이씨솔믹스 주식회사 | 연마패드 및 이를 이용한 반도체 소자의 제조방법 |
| KR102362791B1 (ko) * | 2020-03-17 | 2022-02-15 | 에스케이씨솔믹스 주식회사 | 연마패드 및 이를 이용한 반도체 소자의 제조방법 |
| US11534887B2 (en) | 2020-03-17 | 2022-12-27 | Skc Solmics Co., Ltd. | Polishing pad and method for preparing semiconductor device using same |
| KR102801064B1 (ko) * | 2024-09-03 | 2025-04-30 | 엔펄스 주식회사 | 재생 연마패드 및 이의 제조방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP4757891B2 (ja) | 2011-08-24 |
| WO2002043921A1 (en) | 2002-06-06 |
| KR20080040054A (ko) | 2008-05-07 |
| US20040055223A1 (en) | 2004-03-25 |
| US20060148392A1 (en) | 2006-07-06 |
| KR20070114852A (ko) | 2007-12-04 |
| KR100867339B1 (ko) | 2008-11-06 |
| KR20070116694A (ko) | 2007-12-10 |
| KR100892924B1 (ko) | 2009-04-09 |
| CN1651193A (zh) | 2005-08-10 |
| US7762870B2 (en) | 2010-07-27 |
| JP2008168433A (ja) | 2008-07-24 |
| JPWO2002043921A1 (ja) | 2004-04-02 |
| US7192340B2 (en) | 2007-03-20 |
| JP5105559B2 (ja) | 2012-12-26 |
| US20060148391A1 (en) | 2006-07-06 |
| US20060148393A1 (en) | 2006-07-06 |
| JP2011067946A (ja) | 2011-04-07 |
| CN1651192A (zh) | 2005-08-10 |
| US7641540B2 (en) | 2010-01-05 |
| CN1224499C (zh) | 2005-10-26 |
| CN100484718C (zh) | 2009-05-06 |
| JP2008213140A (ja) | 2008-09-18 |
| JP4177100B2 (ja) | 2008-11-05 |
| US7329170B2 (en) | 2008-02-12 |
| CN1669739A (zh) | 2005-09-21 |
| KR100905266B1 (ko) | 2009-06-29 |
| KR20030062343A (ko) | 2003-07-23 |
| CN100379522C (zh) | 2008-04-09 |
| CN1476367A (zh) | 2004-02-18 |
| CN100496896C (zh) | 2009-06-10 |
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