CN1584672A - 电子部件的安装结构、安装方法、电光装置及电子设备 - Google Patents
电子部件的安装结构、安装方法、电光装置及电子设备 Download PDFInfo
- Publication number
- CN1584672A CN1584672A CNA2004100582422A CN200410058242A CN1584672A CN 1584672 A CN1584672 A CN 1584672A CN A2004100582422 A CNA2004100582422 A CN A2004100582422A CN 200410058242 A CN200410058242 A CN 200410058242A CN 1584672 A CN1584672 A CN 1584672A
- Authority
- CN
- China
- Prior art keywords
- mentioned
- bump electrode
- electronic unit
- elastic deformation
- resin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000009434 installation Methods 0.000 title claims description 28
- 238000000034 method Methods 0.000 title claims description 17
- 239000011347 resin Substances 0.000 claims abstract description 166
- 229920005989 resin Polymers 0.000 claims abstract description 166
- 239000000758 substrate Substances 0.000 claims abstract description 68
- 238000007789 sealing Methods 0.000 claims abstract description 56
- 230000005489 elastic deformation Effects 0.000 claims description 117
- 230000006835 compression Effects 0.000 claims description 24
- 238000007906 compression Methods 0.000 claims description 24
- 230000015572 biosynthetic process Effects 0.000 claims description 19
- 239000011521 glass Substances 0.000 claims description 14
- 229920001187 thermosetting polymer Polymers 0.000 claims description 11
- 230000005611 electricity Effects 0.000 claims description 9
- 238000010438 heat treatment Methods 0.000 claims description 9
- 238000002788 crimping Methods 0.000 claims description 8
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 6
- 239000010453 quartz Substances 0.000 claims description 4
- 239000012780 transparent material Substances 0.000 claims description 4
- 239000011248 coating agent Substances 0.000 abstract description 4
- 238000000576 coating method Methods 0.000 abstract description 4
- 239000004020 conductor Substances 0.000 abstract description 4
- 238000012856 packing Methods 0.000 abstract 1
- 239000004973 liquid crystal related substance Substances 0.000 description 41
- 239000010408 film Substances 0.000 description 20
- 238000005755 formation reaction Methods 0.000 description 16
- 230000000875 corresponding effect Effects 0.000 description 10
- 230000003321 amplification Effects 0.000 description 9
- 230000008859 change Effects 0.000 description 9
- 238000003199 nucleic acid amplification method Methods 0.000 description 9
- 239000002245 particle Substances 0.000 description 9
- 230000006378 damage Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 239000003822 epoxy resin Substances 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 229920000647 polyepoxide Polymers 0.000 description 4
- 208000034189 Sclerosis Diseases 0.000 description 3
- 238000004364 calculation method Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 235000012239 silicon dioxide Nutrition 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000001276 controlling effect Effects 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 230000002596 correlated effect Effects 0.000 description 2
- 238000001962 electrophoresis Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 230000008676 import Effects 0.000 description 2
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 2
- 239000012528 membrane Substances 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 239000009719 polyimide resin Substances 0.000 description 2
- 229920001296 polysiloxane Polymers 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- -1 acryl Chemical group 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 239000004411 aluminium Substances 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 239000007822 coupling agent Substances 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000003292 diminished effect Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 239000008393 encapsulating agent Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 239000010419 fine particle Substances 0.000 description 1
- 230000003760 hair shine Effects 0.000 description 1
- 238000007731 hot pressing Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 239000002689 soil Substances 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 229920001169 thermoplastic Polymers 0.000 description 1
- 239000004416 thermosoftening plastic Substances 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/325—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by abutting or pinching, i.e. without alloying process; mechanical auxiliary parts therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/20—Conductive material dispersed in non-conductive organic material
- H01B1/24—Conductive material dispersed in non-conductive organic material the conductive material comprising carbon-silicon compounds, carbon or silicon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49811—Additional leads joined to the metallisation on the insulating substrate, e.g. pins, bumps, wires, flat leads
- H01L23/49816—Spherical bumps on the substrate for external connection, e.g. ball grid arrays [BGA]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/29198—Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
- H01L2224/29199—Material of the matrix
- H01L2224/2929—Material of the matrix with a principal constituent of the material being a polymer, e.g. polyester, phenolic based polymer, epoxy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/29198—Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
- H01L2224/29298—Fillers
- H01L2224/29299—Base material
- H01L2224/293—Base material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73203—Bump and layer connectors
- H01L2224/73204—Bump and layer connectors the bump connector being embedded into the layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/8385—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
- H01L2224/83851—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester being an anisotropic conductive adhesive
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/06—Polymers
- H01L2924/078—Adhesive characteristics other than chemical
- H01L2924/0781—Adhesive characteristics other than chemical being an ohmic electrical conductor
- H01L2924/07811—Extrinsic, i.e. with electrical conductive fillers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/12—Passive devices, e.g. 2 terminal devices
- H01L2924/1204—Optical Diode
- H01L2924/12044—OLED
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/01—Dielectrics
- H05K2201/0104—Properties and characteristics in general
- H05K2201/0133—Elastomeric or compliant polymer
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10621—Components characterised by their electrical contacts
- H05K2201/10674—Flip chip
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10954—Other details of electrical connections
- H05K2201/10977—Encapsulated connections
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/303—Surface mounted components, e.g. affixing before soldering, aligning means, spacing means
- H05K3/305—Affixing by adhesive
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Metallurgy (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Dispersion Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Wire Bonding (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Non-Metallic Protective Coatings For Printed Circuits (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
Abstract
Description
树脂名 | 弹性模数[Mpa] |
硅树脂 | 100-1000 |
聚酰亚胺树脂 | 2000-3000 |
丙烯酸类树脂 | 2000-3000 |
环氧树脂 | 3000-4000 |
环氧(加入氧化硅填料)树脂 | 3000-15000 |
参考计算条件 | 说明 |
W’=20μm | 凸点顶部的宽(直径) |
t’=20μm | 内部树脂的初始高度 |
α’=60ppm/℃ | 密封树脂的热膨胀系数 |
δT=120℃ | 使用环境的温度范围的幅度 |
使用树脂的弹性模数E | 弹性变形量上限值 | 弹性变形量 | 弹性变形量下限值 |
100MPa | 20μm以上 | Δt=t’-t | 0.144μm |
2000Mpa | 2μm | ||
4000Mpa | 1μm | ||
15000MPa | 0.267μm |
Claims (22)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003297654 | 2003-08-21 | ||
JP297654/2003 | 2003-08-21 | ||
JP184946/2004 | 2004-06-23 | ||
JP2004184946A JP2005101527A (ja) | 2003-08-21 | 2004-06-23 | 電子部品の実装構造、電気光学装置、電子機器及び電子部品の実装方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1584672A true CN1584672A (zh) | 2005-02-23 |
CN100338738C CN100338738C (zh) | 2007-09-19 |
Family
ID=34315609
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2004100582422A Expired - Lifetime CN100338738C (zh) | 2003-08-21 | 2004-08-17 | 电子部件的安装结构、安装方法、电光装置及电子设备 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7122896B2 (zh) |
JP (1) | JP2005101527A (zh) |
KR (1) | KR100639452B1 (zh) |
CN (1) | CN100338738C (zh) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7544598B2 (en) | 2005-07-19 | 2009-06-09 | Seiko Epson Corporation | Semiconductor device and method of manufacturing the same |
CN101414809B (zh) * | 2007-10-19 | 2011-04-06 | 精工爱普生株式会社 | 电子部件及其安装结构以及安装方法 |
CN101577261B (zh) * | 2008-05-09 | 2011-05-11 | 台湾薄膜电晶体液晶显示器产业协会 | 接点结构与其形成方法及其接合结构 |
CN102157472A (zh) * | 2007-08-13 | 2011-08-17 | 精工爱普生株式会社 | 电子设备 |
US8215969B2 (en) | 2008-03-27 | 2012-07-10 | Taiwan Tft Lcd Association | Contact structure and forming method thereof and connecting structure thereof |
CN108878637A (zh) * | 2017-05-09 | 2018-11-23 | 精工爱普生株式会社 | 安装结构体、超声波器件、超声波探头及超声波装置 |
CN109314827A (zh) * | 2016-04-27 | 2019-02-05 | 精工爱普生株式会社 | 安装结构体、超声波器件、超声波检测头、超声波装置以及电子设备 |
US11917922B2 (en) | 2016-04-27 | 2024-02-27 | Seiko Epson Corporation | Mounting structure, ultrasonic device, ultrasonic probe, ultrasonic apparatus, and electronic apparatus |
Families Citing this family (58)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004247373A (ja) | 2003-02-12 | 2004-09-02 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
DE102004003275B4 (de) * | 2004-01-21 | 2007-04-19 | Infineon Technologies Ag | Halbleiterbauteil mit Verbindungselementen auf Halbleiterchips und Verfahren zur Herstellung derselben |
US7253089B2 (en) * | 2004-06-14 | 2007-08-07 | Micron Technology, Inc. | Microfeature devices and methods for manufacturing microfeature devices |
JP4207004B2 (ja) | 2005-01-12 | 2009-01-14 | セイコーエプソン株式会社 | 半導体装置の製造方法 |
JP4142041B2 (ja) | 2005-03-23 | 2008-08-27 | セイコーエプソン株式会社 | 半導体装置の製造方法 |
JP4595694B2 (ja) * | 2005-06-16 | 2010-12-08 | セイコーエプソン株式会社 | 半導体装置の製造方法 |
JP4654790B2 (ja) * | 2005-06-20 | 2011-03-23 | セイコーエプソン株式会社 | 半導体装置及びその製造方法 |
JP4221606B2 (ja) | 2005-06-28 | 2009-02-12 | セイコーエプソン株式会社 | 半導体装置の製造方法 |
JP4284544B2 (ja) | 2005-06-29 | 2009-06-24 | セイコーエプソン株式会社 | 半導体装置及びその製造方法 |
JP4269173B2 (ja) | 2005-07-06 | 2009-05-27 | セイコーエプソン株式会社 | 半導体装置及びその製造方法 |
JP4656311B2 (ja) * | 2005-07-11 | 2011-03-23 | セイコーエプソン株式会社 | 電子モジュール |
JP4235834B2 (ja) | 2005-07-12 | 2009-03-11 | セイコーエプソン株式会社 | 半導体装置の製造方法 |
JP2007042736A (ja) * | 2005-08-01 | 2007-02-15 | Seiko Epson Corp | 半導体装置及び電子モジュール、並びに、電子モジュールの製造方法 |
JP4654821B2 (ja) * | 2005-08-01 | 2011-03-23 | セイコーエプソン株式会社 | 半導体装置及び電子デバイス |
JP4654820B2 (ja) * | 2005-08-01 | 2011-03-23 | セイコーエプソン株式会社 | 半導体装置及び電子デバイス |
JP4645832B2 (ja) * | 2005-08-02 | 2011-03-09 | セイコーエプソン株式会社 | 半導体装置及びその製造方法 |
JP4708148B2 (ja) | 2005-10-07 | 2011-06-22 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
JP2007214164A (ja) * | 2006-02-07 | 2007-08-23 | Epson Imaging Devices Corp | 電気光学装置、半導体装置、電気光学装置の製造方法及び電子機器 |
JP2007232838A (ja) * | 2006-02-28 | 2007-09-13 | Epson Imaging Devices Corp | 電気光学装置、実装構造体、電気光学装置の製造方法及び電子機器 |
JP5618537B2 (ja) * | 2006-03-21 | 2014-11-05 | プロメラス,エルエルシー | チップ積層並びにチップ・ウェハ接合に有用な方法及び材料 |
US8120168B2 (en) | 2006-03-21 | 2012-02-21 | Promerus Llc | Methods and materials useful for chip stacking, chip and wafer bonding |
JP5098204B2 (ja) * | 2006-04-07 | 2012-12-12 | セイコーエプソン株式会社 | 半導体装置及びその製造方法、並びに、電子機器 |
JP2007305764A (ja) * | 2006-05-11 | 2007-11-22 | Teikoku Tsushin Kogyo Co Ltd | 異形部品取付基板の製造方法 |
JP4920330B2 (ja) * | 2006-07-18 | 2012-04-18 | ソニー株式会社 | 実装構造体の実装方法、発光ダイオードディスプレイの実装方法、発光ダイオードバックライトの実装方法および電子機器の実装方法 |
JP4305547B2 (ja) | 2006-10-27 | 2009-07-29 | エプソンイメージングデバイス株式会社 | 実装構造体、電気光学装置、電子機器及び実装構造体の製造方法 |
US7893533B2 (en) * | 2006-10-25 | 2011-02-22 | Epson Imaging Devices Corporation | Semiconductor device, mounting structure, electro-optical apparatus, electronic system, and method for manufacturing electronic component |
JP5169071B2 (ja) * | 2007-08-21 | 2013-03-27 | セイコーエプソン株式会社 | 電子部品、電子装置、電子部品の実装構造体及び電子部品の実装構造体の製造方法 |
JP4548459B2 (ja) * | 2007-08-21 | 2010-09-22 | セイコーエプソン株式会社 | 電子部品の実装構造体 |
US7755261B2 (en) * | 2007-10-19 | 2010-07-13 | Seiko Epson Corporation | Electronic component, mounting structure thereof, and method for mounting electronic component |
JP4525734B2 (ja) | 2007-11-02 | 2010-08-18 | セイコーエプソン株式会社 | 電子部品の実装構造 |
JP4462332B2 (ja) * | 2007-11-05 | 2010-05-12 | セイコーエプソン株式会社 | 電子部品 |
JP5223383B2 (ja) * | 2008-03-05 | 2013-06-26 | セイコーエプソン株式会社 | 水晶振動子、水晶振動子パッケージ、電子部品、電子機器、電子部品の実装方法 |
JP5167870B2 (ja) * | 2008-03-05 | 2013-03-21 | セイコーエプソン株式会社 | 電子部品実装用基板及び電子部品の実装構造並びに水晶振動子パッケージ |
TWI364146B (en) * | 2008-03-27 | 2012-05-11 | Taiwan Tft Lcd Ass | Contact structure and connecting structure |
JP5056579B2 (ja) * | 2008-05-21 | 2012-10-24 | セイコーエプソン株式会社 | サーマルヘッドの製造方法、サーマルヘッドおよびサーマルプリンタ |
JP5003592B2 (ja) * | 2008-05-21 | 2012-08-15 | セイコーエプソン株式会社 | サーマルヘッドおよびサーマルプリンタ |
JP4737466B2 (ja) * | 2009-02-09 | 2011-08-03 | セイコーエプソン株式会社 | 半導体装置及びその製造方法 |
JP2010186789A (ja) * | 2009-02-10 | 2010-08-26 | Hitachi Ltd | 絶縁回路基板、インバータ装置、及びパワー半導体装置 |
JP5326625B2 (ja) * | 2009-02-10 | 2013-10-30 | セイコーエプソン株式会社 | 電子部品の実装構造、及び電子部品の実装方法 |
JP2011054731A (ja) * | 2009-09-01 | 2011-03-17 | Renesas Electronics Corp | 半導体装置の製造方法 |
JP2011061035A (ja) * | 2009-09-10 | 2011-03-24 | Renesas Electronics Corp | 半導体装置の製造方法及びマスク |
JP5057113B2 (ja) | 2009-11-17 | 2012-10-24 | セイコーエプソン株式会社 | 半導体装置および電子部品並びにそれらの製造方法 |
US9142533B2 (en) * | 2010-05-20 | 2015-09-22 | Taiwan Semiconductor Manufacturing Company, Ltd. | Substrate interconnections having different sizes |
TWI419284B (zh) * | 2010-05-26 | 2013-12-11 | Chipmos Technologies Inc | 晶片之凸塊結構及凸塊結構之製造方法 |
JP5838881B2 (ja) * | 2012-03-27 | 2016-01-06 | 富士通株式会社 | 光射出部材の実装方法及び実装装置 |
US9425136B2 (en) | 2012-04-17 | 2016-08-23 | Taiwan Semiconductor Manufacturing Company, Ltd. | Conical-shaped or tier-shaped pillar connections |
US9646923B2 (en) | 2012-04-17 | 2017-05-09 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor devices, methods of manufacture thereof, and packaged semiconductor devices |
US9299674B2 (en) | 2012-04-18 | 2016-03-29 | Taiwan Semiconductor Manufacturing Company, Ltd. | Bump-on-trace interconnect |
US9111817B2 (en) | 2012-09-18 | 2015-08-18 | Taiwan Semiconductor Manufacturing Company, Ltd. | Bump structure and method of forming same |
CN105283973B (zh) * | 2013-09-27 | 2018-05-08 | 京瓷株式会社 | 热电模块 |
DE112016003061B4 (de) * | 2015-07-07 | 2023-05-17 | Alps Alpine Co., Ltd. | Eingabevorrichtung |
JP6582727B2 (ja) * | 2015-08-21 | 2019-10-02 | セイコーエプソン株式会社 | 接合構造体、圧電デバイス、液体噴射ヘッド、及び接合構造体の製造方法 |
TWI590433B (zh) * | 2015-10-12 | 2017-07-01 | 財團法人工業技術研究院 | 發光元件以及顯示器的製作方法 |
JP6582919B2 (ja) * | 2015-11-24 | 2019-10-02 | セイコーエプソン株式会社 | Memsデバイス、液体噴射ヘッド、及び、液体噴射装置 |
KR20180041296A (ko) * | 2016-10-13 | 2018-04-24 | 삼성디스플레이 주식회사 | 표시 패널 |
KR101897653B1 (ko) * | 2017-03-06 | 2018-09-12 | 엘비세미콘 주식회사 | 컴플라이언트 범프의 제조방법 |
JP6909435B2 (ja) * | 2017-07-25 | 2021-07-28 | 大日本印刷株式会社 | 貫通電極基板およびその製造方法 |
JP2020107834A (ja) * | 2018-12-28 | 2020-07-09 | 大日本印刷株式会社 | 電子ユニット |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5017420A (en) * | 1986-10-23 | 1991-05-21 | Hoechst Celanese Corp. | Process for preparing electrically conductive shaped articles from polybenzimidazoles |
JPH01158743A (ja) * | 1987-12-16 | 1989-06-21 | Seiko Epson Corp | Icの実装構造 |
JPH04315137A (ja) * | 1991-04-15 | 1992-11-06 | Fujitsu Ltd | 液晶表示装置 |
JPH05182516A (ja) | 1991-12-30 | 1993-07-23 | Casio Comput Co Ltd | 異方導電性接着剤および導電接続構造 |
JP2833326B2 (ja) * | 1992-03-03 | 1998-12-09 | 松下電器産業株式会社 | 電子部品実装接続体およびその製造方法 |
US5431328A (en) * | 1994-05-06 | 1995-07-11 | Industrial Technology Research Institute | Composite bump flip chip bonding |
TW386222B (en) * | 1994-12-02 | 2000-04-01 | Semiconductor Energy Lab | Electric device having non-light emitting type display and method for making the electric device |
US5861661A (en) * | 1995-12-27 | 1999-01-19 | Industrial Technology Research Institute | Composite bump tape automated bonded structure |
JPH09293753A (ja) | 1996-04-24 | 1997-11-11 | Canon Inc | 電気回路部品及び電気回路部品の製造方法及び導電ボール及び導電接続部材及び導電接続部材の製造方法 |
US5925930A (en) * | 1996-05-21 | 1999-07-20 | Micron Technology, Inc. | IC contacts with palladium layer and flexible conductive epoxy bumps |
JPH10173006A (ja) | 1996-12-09 | 1998-06-26 | Hitachi Ltd | 半導体装置および半導体装置の製造方法 |
FI970822A (fi) * | 1997-02-27 | 1998-08-28 | Nokia Mobile Phones Ltd | Menetelmä ja järjestely komponentin liittämiseksi |
US6063647A (en) * | 1997-12-08 | 2000-05-16 | 3M Innovative Properties Company | Method for making circuit elements for a z-axis interconnect |
US5956235A (en) * | 1998-02-12 | 1999-09-21 | International Business Machines Corporation | Method and apparatus for flexibly connecting electronic devices |
JP2001217268A (ja) | 2000-02-01 | 2001-08-10 | Hitachi Ltd | 半導体装置及びその製造方法 |
JP2002043558A (ja) | 2000-07-24 | 2002-02-08 | Nippon Hoso Kyokai <Nhk> | 積層型固体撮像装置 |
JP2002134541A (ja) | 2000-10-23 | 2002-05-10 | Citizen Watch Co Ltd | 半導体装置とその製造方法ならびに半導体装置の実装構造 |
-
2004
- 2004-06-23 JP JP2004184946A patent/JP2005101527A/ja active Pending
- 2004-08-10 US US10/914,121 patent/US7122896B2/en not_active Expired - Lifetime
- 2004-08-17 CN CNB2004100582422A patent/CN100338738C/zh not_active Expired - Lifetime
- 2004-08-20 KR KR1020040065970A patent/KR100639452B1/ko active IP Right Grant
Cited By (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1901149B (zh) * | 2005-07-19 | 2011-05-04 | 精工爱普生株式会社 | 半导体装置及其制造方法 |
US7544598B2 (en) | 2005-07-19 | 2009-06-09 | Seiko Epson Corporation | Semiconductor device and method of manufacturing the same |
CN102157472A (zh) * | 2007-08-13 | 2011-08-17 | 精工爱普生株式会社 | 电子设备 |
CN102157472B (zh) * | 2007-08-13 | 2013-07-24 | 精工爱普生株式会社 | 电子设备 |
CN102170274B (zh) * | 2007-10-19 | 2014-11-12 | 精工爱普生株式会社 | 电子部件及其安装结构以及安装方法 |
CN101414809B (zh) * | 2007-10-19 | 2011-04-06 | 精工爱普生株式会社 | 电子部件及其安装结构以及安装方法 |
CN102170274A (zh) * | 2007-10-19 | 2011-08-31 | 精工爱普生株式会社 | 电子部件及其安装结构以及安装方法 |
US8215969B2 (en) | 2008-03-27 | 2012-07-10 | Taiwan Tft Lcd Association | Contact structure and forming method thereof and connecting structure thereof |
CN101577261B (zh) * | 2008-05-09 | 2011-05-11 | 台湾薄膜电晶体液晶显示器产业协会 | 接点结构与其形成方法及其接合结构 |
CN109314827A (zh) * | 2016-04-27 | 2019-02-05 | 精工爱普生株式会社 | 安装结构体、超声波器件、超声波检测头、超声波装置以及电子设备 |
CN109314827B (zh) * | 2016-04-27 | 2021-05-18 | 精工爱普生株式会社 | 安装结构体、超声波器件、超声波检测头、超声波装置以及电子设备 |
US11581478B2 (en) | 2016-04-27 | 2023-02-14 | Seiko Epson Corporation | Mounting structure, ultrasonic device, ultrasonic probe, ultrasonic apparatus, and electronic apparatus |
US11917922B2 (en) | 2016-04-27 | 2024-02-27 | Seiko Epson Corporation | Mounting structure, ultrasonic device, ultrasonic probe, ultrasonic apparatus, and electronic apparatus |
CN108878637A (zh) * | 2017-05-09 | 2018-11-23 | 精工爱普生株式会社 | 安装结构体、超声波器件、超声波探头及超声波装置 |
CN108878637B (zh) * | 2017-05-09 | 2023-11-10 | 精工爱普生株式会社 | 安装结构体、超声波器件、超声波探头及超声波装置 |
Also Published As
Publication number | Publication date |
---|---|
US20050062153A1 (en) | 2005-03-24 |
KR20050021248A (ko) | 2005-03-07 |
KR100639452B1 (ko) | 2006-10-26 |
US7122896B2 (en) | 2006-10-17 |
JP2005101527A (ja) | 2005-04-14 |
CN100338738C (zh) | 2007-09-19 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN100338738C (zh) | 电子部件的安装结构、安装方法、电光装置及电子设备 | |
US7161245B2 (en) | Electronic component-mounted structure, method for mounting electronic component, electro-optical device, and electronic apparatus | |
US11063026B2 (en) | Display module and method of manufacturing the same | |
CN105762153B (zh) | 显示设备 | |
TWI545632B (zh) | 有機發光顯示裝置及其製造方法 | |
KR101975730B1 (ko) | 이방성 도전 필름, 이방성 도전 필름의 제조 방법, 접속체의 제조 방법 및 접속 방법 | |
US20080099916A1 (en) | Bonding structure and method of fabricating the same | |
CN1892322A (zh) | 显示基板、显示装置、及其方法 | |
CN1256476A (zh) | 矩阵型显示装置及其制造方法和热压键合头 | |
CN103140052B (zh) | 电子模块 | |
CN1683961A (zh) | 电子部件、安装结构体、电光装置和电子设备 | |
CN102113423A (zh) | 基板模块及其制造方法 | |
CN112447102B (zh) | 可拉伸显示装置 | |
CN1837906A (zh) | 显示设备和柔性基片 | |
CN1224510A (zh) | 液晶显示装置、液晶显示装置的制造方法及电子仪器 | |
KR20110037106A (ko) | 이방성 도전 필름 및 이를 포함하는 표시 장치 | |
CN1967832A (zh) | 布线基板及使用该布线基板的半导体器件 | |
CN1819169A (zh) | 电子部件、电光学装置及电子机器 | |
CN1229854C (zh) | 半导体器件的安装方法及结构、电光装置及其制造方法 | |
CN1892306A (zh) | 图像显示装置 | |
CN1218394C (zh) | 多芯片安装结构、电光学装置及电子机器 | |
CN1607425A (zh) | 热压接装置和热压接方法 | |
US6798137B2 (en) | Apparatus and method for warpage compensation of a display panel substrate assembly | |
CN1828375A (zh) | 驱动芯片、具有其的显示设备及制造显示设备的方法 | |
US20140132895A1 (en) | Liquid crystal display device and production method thereof |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20160602 Address after: 100015 Jiuxianqiao Road, Beijing, No. 10, No. Patentee after: BOE TECHNOLOGY GROUP Co.,Ltd. Address before: Hongkong, China Patentee before: BOE Technology (Hongkong) Co.,Ltd. Effective date of registration: 20160602 Address after: Hongkong, China Patentee after: BOE Technology (Hongkong) Co.,Ltd. Address before: Tokyo, Japan Patentee before: Seiko Epson Corp. |
|
CX01 | Expiry of patent term | ||
CX01 | Expiry of patent term |
Granted publication date: 20070919 |