JPH08508363A - インコヒーレント放出放射源の作動方法 - Google Patents
インコヒーレント放出放射源の作動方法Info
- Publication number
- JPH08508363A JPH08508363A JP6521545A JP52154594A JPH08508363A JP H08508363 A JPH08508363 A JP H08508363A JP 6521545 A JP6521545 A JP 6521545A JP 52154594 A JP52154594 A JP 52154594A JP H08508363 A JPH08508363 A JP H08508363A
- Authority
- JP
- Japan
- Prior art keywords
- discharge
- electrodes
- dielectric
- electrode
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J61/00—Gas-discharge or vapour-discharge lamps
- H01J61/02—Details
- H01J61/38—Devices for influencing the colour or wavelength of the light
- H01J61/42—Devices for influencing the colour or wavelength of the light by transforming the wavelength of the light by luminescence
- H01J61/46—Devices characterised by the binder or other non-luminescent constituent of the luminescent material, e.g. for obtaining desired pouring or drying properties
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J65/00—Lamps without any electrode inside the vessel; Lamps with at least one main electrode outside the vessel
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/02—Use of particular materials as binders, particle coatings or suspension media therefor
- C09K11/025—Use of particular materials as binders, particle coatings or suspension media therefor non-luminescent particle coatings or suspension media
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/77—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals
- C09K11/7766—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals containing two or more rare earth metals
- C09K11/7774—Aluminates
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/77—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals
- C09K11/7766—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals containing two or more rare earth metals
- C09K11/7777—Phosphates
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K11/00—Luminescent, e.g. electroluminescent, chemiluminescent materials
- C09K11/08—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials
- C09K11/77—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals
- C09K11/7783—Luminescent, e.g. electroluminescent, chemiluminescent materials containing inorganic luminescent materials containing rare earth metals containing two or more rare earth metals one of which being europium
- C09K11/7797—Borates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J61/00—Gas-discharge or vapour-discharge lamps
- H01J61/02—Details
- H01J61/38—Devices for influencing the colour or wavelength of the light
- H01J61/42—Devices for influencing the colour or wavelength of the light by transforming the wavelength of the light by luminescence
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J61/00—Gas-discharge or vapour-discharge lamps
- H01J61/02—Details
- H01J61/38—Devices for influencing the colour or wavelength of the light
- H01J61/42—Devices for influencing the colour or wavelength of the light by transforming the wavelength of the light by luminescence
- H01J61/44—Devices characterised by the luminescent material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J61/00—Gas-discharge or vapour-discharge lamps
- H01J61/70—Lamps with low-pressure unconstricted discharge having a cold pressure < 400 Torr
- H01J61/76—Lamps with low-pressure unconstricted discharge having a cold pressure < 400 Torr having a filling of permanent gas or gases only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J65/00—Lamps without any electrode inside the vessel; Lamps with at least one main electrode outside the vessel
- H01J65/04—Lamps in which a gas filling is excited to luminesce by an external electromagnetic field or by external corpuscular radiation, e.g. for indicating plasma display panels
- H01J65/042—Lamps in which a gas filling is excited to luminesce by an external electromagnetic field or by external corpuscular radiation, e.g. for indicating plasma display panels by an external electromagnetic field
- H01J65/046—Lamps in which a gas filling is excited to luminesce by an external electromagnetic field or by external corpuscular radiation, e.g. for indicating plasma display panels by an external electromagnetic field the field being produced by using capacitive means around the vessel
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B41/00—Circuit arrangements or apparatus for igniting or operating discharge lamps
- H05B41/14—Circuit arrangements
- H05B41/26—Circuit arrangements in which the lamp is fed by power derived from dc by means of a converter, e.g. by high-voltage dc
- H05B41/28—Circuit arrangements in which the lamp is fed by power derived from dc by means of a converter, e.g. by high-voltage dc using static converters
- H05B41/2806—Circuit arrangements in which the lamp is fed by power derived from dc by means of a converter, e.g. by high-voltage dc using static converters with semiconductor devices and specially adapted for lamps without electrodes in the vessel, e.g. surface discharge lamps, electrodeless discharge lamps
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
- Y02B20/00—Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Plasma & Fusion (AREA)
- Inorganic Chemistry (AREA)
- Electromagnetism (AREA)
- Vessels And Coating Films For Discharge Lamps (AREA)
- Luminescent Compositions (AREA)
- Circuit Arrangements For Discharge Lamps (AREA)
- Discharge Lamps And Accessories Thereof (AREA)
- Gas-Filled Discharge Tubes (AREA)
Abstract
Description
Claims (1)
- 【特許請求の範囲】 1.非導電性材料から成る少なくとも部分的に透明な放電管(2)がガス充填物 (5)を封入され、少なくとも2つの電極(3、4)がガス充填物(5)の近く に設けられてリード線によって電気エネルギー供給源(10〜12)に接続され 、少なくとも1つの電極(4)とガス充填物(5)との間には誘電体膜が配置さ れているような誘電体妨害放電によってインコヒーレント放出放射源、特に放電 ランプ(1)を作動する方法において、電気エネルギー供給源は電極(3、4) 間に一連の電圧パルスを供給し、その場合個々のパルスnは約1ns〜約50μ sの大きさの値を持つ電圧Upn(t)及び期間Tpnの時間変化を有し、それぞ れパルスnは約500ns〜1msの大きさの値及び電圧特性線Uon(t)を 持つ期間Tonの休止時間によってその後続のパルスn+1から分離され、期間 Tpnの期間中電圧特性線Upn(t)はガス充填物(5)内へ特に有効電力が入 力されるように選定され、それに対して休止時間Tonの期間中電圧特性線Uon (t)はガス充填物(5)がそれぞれその前の電圧パルスUpn(t)前の状態 に似た状態へ復帰し得るように選定され、大きさUpn(t)、Tpn、Uon( t)、Tonは電極(3、4)間で比較的低い電流密度の放電パターンが生成す るように調整されることを特徴とするインコヒーレント放出放射源の作動方法。 2.電圧特性線Upn(t)は単極性であり、放電は単極性の場合個々のΔ状パ ターンを形成し、両側誘電体妨害放電の極性が変化する場合それに応じてΔの頂 点と逆向きΔの頂点とを向かい合わせて配置した形状に似た2つの同種のパター ンの鏡像的な重なりをそれぞれ生じ、これらの個々のパターンの間隔は、極端な 場合には全放電面が“カーテン”状パターンで放射するように減少することがで きることを特徴とする請求項1記載の方法。 3.期間Tonは個々の放電パターンの体積の時間平均値が最大になるように選 定されることを特徴とする請求項1又は2記載の方法。 4.期間Tpnの期間中、電極間(3、4)の電圧特性線Upn(t)として、放 電の再点弧電圧に合わせた値が選定されることを特徴とする請求項1乃至3の1 つに記載の方法。 5.電圧特性線Upn(t)、Uon(t)及び期間Tpn、Tonは封入圧力、充 填物の種類、火花長、誘電体及び電極構成に合わせられることを特徴とする請求 項4記載の方法。 6.電圧特性線Upn(t)は次の基本形状、すなわち二角形状、矩形状、台形 状、階段状、湾曲状、放物線状、正弦波状等の形状の1つ又は複数から直接に又 は近似的に構成されることを特徴とする請求項5記載の方法。 7.期間Tpnの期間中、電極(3、4)間の電圧特性線Upn(T)として、誘 電体によって惹起された電圧降下を加えて、少なくとも再点弧電圧に相当する最 大値が選定されることを特徴とする請求項6記載の方法。 8.電圧パルスの最大値はcm火花長及びパスカル封入圧当たり0.01〜2V の範囲にあることを特徴とする請求項7記載の方法。 9.誘電体膜の十分な厚み及び適当に低い比誘電率によって比較的低い電流密度 の放電パターンの形成が助成されることを特徴とする請求項1乃至8の1つに記 載の方法。 10.電圧特性線は周期的であることを特徴とする請求項1記載の方法。 11.少なくとも1電極の場合、誘電体膜は放電管(2)の壁によって形成され ることを特徴とする請求項1記載の方法。 12.全電極面積と誘電体に接触する電極面積との比はできる限り小さいことを 特徴とする請求項1記載の方法。 13.片側誘電体妨害放電の場合、誘電体非妨害形電極(3)の電圧特性線Upn (t)は誘電体妨害形電極(4)に対して、電力入力期間中、有効電力入力に 関して重要ではない正の電圧ピークを除いて、負の値で開始することを特徴とす る請求項1記載の方法。 14.片側誘電体妨害放電の場合、誘電体非妨害形電極(3)の電圧特性線Upn (t)は誘電体妨害形電極(4)に対して、電力入力期間中、有効電力入力に 関して重要ではない正の電圧ピークを除いて、専ら負であることを特徴とする請 求項1記載の方法。 15.複数の誘電体妨害形電極を使用する場合、両側誘電体妨害形電極間に単極 性又は両極性電圧パルス又は変化する極性を持つ電圧パルスが印加されることを 特徴とする請求項1記載の方法。 16.複数の誘電体妨害形電極を使用する場合、両側誘電体妨害形電極間に両極 性電圧パルスが印加されることを特徴とする請求項1記載の方法。 17.放電管(2)内に配置された1つ又は複数の特に棒状又は条帯状電極を使 用する場合、この電極は中心に又は偏心して配置され、その場合電極の1つ又は 複数は誘電体によって被覆することができることを特徴とする請求項1乃至16 の1つに記載の方法。 18.放電管の外部に配置された1つ又は複数の電極を使用する場合、この電極 は条帯状に形成されることを特徴とする請求項1乃至17の1つに記載の方法。 19.放電管(2)は管から構成され、その長手軸線に内部電極(3)が配置さ れ、その外壁に少なくとも1つの外部電極(4)が設けられることを特徴とする 請求項1記載の方法。 20.放電管(2)は側面及び2つのカバー面(7a、7b)によって画成され た平面形直方体状構造を有し、放射は主としてカバー面を通って行われ、その場 合放射面すなわ平ち平面形直方体状構造のカバー面(7a、7b)に平行な一平 面内に多数の平行な放電室(8)が形成されるようにカバー面に垂直に内部電極 (3)及び外部電極(4)が配置され、異なった電位を持つそれぞれ隣接する電 極(3、4)はガス封入放電室(8)及び誘電体膜によって分離されることを特 徴とする請求項1記載の方法。 21.電極は誘電体膜によってガス封入放電室から分離されることを特徴とする 請求項20記載の方法。 22.放電管はほぼ円筒状をして一端部に口金(9)を備え、放電管の内部には 特に片側を固定された中心棒状内部電極(3)が設けられ、放電管の外壁には少 なくとも1つの条帯状電極(4′a、4′b、4′c、4′d)が配置されるこ とを特徴とする請求項1記載の方法。 23.内部電極(3)は円形断面を有することを特徴とする請求項22記載の方 法。 24.ガス室を画成する壁は少なくとも一部分が蛍光体(6)によって被覆され ることを特徴とする請求項1乃至23の1つに記載の方法。 25.ガス充填物(5)の作動圧力は100Pa〜3MPaの範囲、特に約1k Pa以上であることを特徴とする請求項1乃至24の1つに記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE4311197A DE4311197A1 (de) | 1993-04-05 | 1993-04-05 | Verfahren zum Betreiben einer inkohärent strahlenden Lichtquelle |
DE4311197.1 | 1993-04-05 | ||
PCT/DE1994/000380 WO1994023442A1 (de) | 1993-04-05 | 1994-04-05 | Verfahren zum betreiben einer inkohärent emittierenden strahlungsquelle |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2001347842A Division JP3715231B2 (ja) | 1993-04-05 | 2001-11-13 | インコヒーレント放出放射源の作動方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH08508363A true JPH08508363A (ja) | 1996-09-03 |
JP3298886B2 JP3298886B2 (ja) | 2002-07-08 |
Family
ID=6484818
Family Applications (6)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP52154594A Expired - Lifetime JP3298886B2 (ja) | 1993-04-05 | 1994-04-05 | インコヒーレント放出放射源の作動方法 |
JP52154694A Expired - Fee Related JP3714952B2 (ja) | 1993-04-05 | 1994-04-05 | 誘電体妨害放電蛍光ランプ |
JP2001347842A Expired - Lifetime JP3715231B2 (ja) | 1993-04-05 | 2001-11-13 | インコヒーレント放出放射源の作動方法 |
JP2004162737A Withdrawn JP2004296446A (ja) | 1993-04-05 | 2004-06-01 | 蛍光ランプ |
JP2004162736A Pending JP2004303737A (ja) | 1993-04-05 | 2004-06-01 | 蛍光ランプ |
JP2005166606A Pending JP2005276846A (ja) | 1993-04-05 | 2005-06-07 | 蛍光ランプ |
Family Applications After (5)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP52154694A Expired - Fee Related JP3714952B2 (ja) | 1993-04-05 | 1994-04-05 | 誘電体妨害放電蛍光ランプ |
JP2001347842A Expired - Lifetime JP3715231B2 (ja) | 1993-04-05 | 2001-11-13 | インコヒーレント放出放射源の作動方法 |
JP2004162737A Withdrawn JP2004296446A (ja) | 1993-04-05 | 2004-06-01 | 蛍光ランプ |
JP2004162736A Pending JP2004303737A (ja) | 1993-04-05 | 2004-06-01 | 蛍光ランプ |
JP2005166606A Pending JP2005276846A (ja) | 1993-04-05 | 2005-06-07 | 蛍光ランプ |
Country Status (10)
Country | Link |
---|---|
US (2) | US5604410A (ja) |
EP (4) | EP1078972B1 (ja) |
JP (6) | JP3298886B2 (ja) |
KR (1) | KR100299151B1 (ja) |
CN (1) | CN1066854C (ja) |
CA (2) | CA2155340C (ja) |
CZ (1) | CZ286740B6 (ja) |
DE (5) | DE4311197A1 (ja) |
HU (1) | HU215307B (ja) |
WO (2) | WO1994022975A1 (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008153234A (ja) * | 2008-02-18 | 2008-07-03 | Sharp Corp | 照明装置および液晶表示装置 |
JP2013034989A (ja) * | 2011-07-13 | 2013-02-21 | Gs Yuasa Corp | 紫外線照射装置 |
Families Citing this family (491)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19517515A1 (de) * | 1995-05-12 | 1996-11-14 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Entladungslampe und Verfahren zum Betreiben derartiger Entladungslampen |
DE19526211A1 (de) * | 1995-07-18 | 1997-01-23 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Verfahren zum Betreiben von Entladungslampen bzw. -strahler |
US6153971A (en) * | 1995-09-21 | 2000-11-28 | Matsushita Electric Industrial Co., Ltd. | Light source with only two major light emitting bands |
DE19543342A1 (de) * | 1995-11-22 | 1997-05-28 | Heraeus Noblelight Gmbh | Verfahren und Strahlungsanordnung zur Erzeugung von UV-Strahlen zur Körperbestrahlung sowie Verwendung |
DE19548003A1 (de) * | 1995-12-21 | 1997-06-26 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Schaltungsanordnung zur Erzeugung von Impulsspannungsfolgen, insbesondere für den Betrieb von dielektrisch behinderten Entladungen |
JP3277788B2 (ja) * | 1996-01-16 | 2002-04-22 | ウシオ電機株式会社 | 放電ランプ点灯装置 |
KR100643442B1 (ko) | 1996-06-26 | 2006-11-10 | 오스람 게젤샤프트 미트 베쉬랭크터 하프퉁 | 발광 변환 소자를 포함하는 발광 반도체 소자 |
DE19636965B4 (de) * | 1996-09-11 | 2004-07-01 | Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH | Elektrische Strahlungsquelle und Bestrahlungssystem mit dieser Strahlungsquelle |
JP3546610B2 (ja) * | 1996-09-20 | 2004-07-28 | ウシオ電機株式会社 | 誘電体バリア放電装置 |
DE19651552A1 (de) * | 1996-12-11 | 1998-06-18 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Kaltkathode für Entladungslampen, Entladungslampe mit dieser Kaltkathode und Betriebsweise für diese Entladungslampe |
JP3355976B2 (ja) * | 1997-02-05 | 2002-12-09 | ウシオ電機株式会社 | 放電ランプ点灯装置 |
DE19711893A1 (de) | 1997-03-21 | 1998-09-24 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Flachstrahler |
US5998921A (en) * | 1997-03-21 | 1999-12-07 | Stanley Electric Co., Ltd. | Fluorescent lamp with coil shaped internal electrode |
KR100375615B1 (ko) * | 1997-03-21 | 2003-04-18 | 파텐트-트로이한트-게젤샤프트 퓌어 엘렉트리쉐 글뤼람펜 엠베하 | 백그라운드조명을위한평면형형광램프와이러한평면형형광램프를포함하는액정디스플레이장치 |
DE19711892A1 (de) | 1997-03-21 | 1998-09-24 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Flachstrahler |
DE19718395C1 (de) * | 1997-04-30 | 1998-10-29 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Leuchtstofflampe und Verfahren zu ihrem Betrieb |
DE59801941D1 (de) | 1997-07-22 | 2001-12-06 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Beleuchtungssystem mit einer dielektrisch behinderten entladungslampe und einer schaltungsanordnung zum erzeugen von impulsspannungsfolgen. |
DE19734885C1 (de) * | 1997-08-12 | 1999-03-11 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Verfahren zum Erzeugen von Impulsspannungsfolgen für den Betrieb von Entladungslampen und zugehörige Schaltungsanordnung |
DE19734883C1 (de) * | 1997-08-12 | 1999-03-18 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Verfahren zum Erzeugen von Impulsspannungsfolgen für den Betrieb von Entladungslampen und zugehörige Schaltungsanordnung |
DE69824053T2 (de) * | 1997-11-06 | 2005-05-12 | Matsushita Electric Industrial Co. Ltd. | Lumineszenzmittel, pulverförmiges Lumineszenzmittel, Plasma-Anzeigetafel, und Herstellungsverfahren derselben |
EP0926705A1 (de) | 1997-12-23 | 1999-06-30 | Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH | Flachstrahler mit örtlich modulierter Flächenleuchtdichte |
US6045721A (en) * | 1997-12-23 | 2000-04-04 | Patent-Treuhand-Gesellschaft Fur Elekrische Gluhlampen Mbh | Barium magnesium aluminate phosphor |
EP0932185A1 (de) | 1997-12-23 | 1999-07-28 | Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH | Signallampe und Leuchtstoffe dazu |
JP3353684B2 (ja) * | 1998-01-09 | 2002-12-03 | ウシオ電機株式会社 | 誘電体バリア放電ランプ光源装置 |
JP3521731B2 (ja) | 1998-02-13 | 2004-04-19 | ウシオ電機株式会社 | 誘電体バリア放電ランプ光源装置 |
DE19811520C1 (de) * | 1998-03-17 | 1999-08-12 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Entladungslampe mit dielektrisch behinderten Entladungen |
DE19817480B4 (de) * | 1998-03-20 | 2004-03-25 | Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH | Flachstrahlerlampe für dielektrisch behinderte Entladungen mit Abstandshaltern |
DE19817475B4 (de) * | 1998-04-20 | 2004-04-15 | Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH | Entladungslampe mit dielektrisch behinderten Elektroden sowie Beleuchtungssystem mit einer solchen Entladungslampe |
DE19817477A1 (de) | 1998-04-20 | 1999-10-21 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Leuchtstofflampe mit auf die geometrische Entladungsverteilung abgestimmter Leuchtstoffschichtdicke |
DE19817476B4 (de) * | 1998-04-20 | 2004-03-25 | Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH | Leuchtstofflampe mit Abstandshaltern und lokal verdünnter Leuchtstoffschichtdicke |
DE19826809A1 (de) | 1998-06-16 | 1999-12-23 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Dielektrische Schicht für Entladungslampen und zugehöriges Herstellungsverfahren |
DE19826808C2 (de) * | 1998-06-16 | 2003-04-17 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Entladungslampe mit dielektrisch behinderten Elektroden |
DE19839336A1 (de) | 1998-08-28 | 2000-03-09 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Elektronisches Vorschaltgerät für Entladungslampe mit dielektrisch behinderten Entladungen |
DE19839329A1 (de) * | 1998-08-28 | 2000-03-09 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Elektronisches Vorschaltgerät für Entladungslampe mit dielektrisch behinderten Entladungen |
DE19843419A1 (de) | 1998-09-22 | 2000-03-23 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Entladungslampe mit dielektrisch behinderten Elektroden |
DE19844721A1 (de) * | 1998-09-29 | 2000-04-27 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Entladungslampe für dielektrisch behinderte Entladungen mit verbesserter Elektrodenkonfiguration |
DE19844725A1 (de) | 1998-09-29 | 2000-03-30 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Gasentladungslampe mit steuerbarer Leuchtlänge |
DE19844720A1 (de) * | 1998-09-29 | 2000-04-06 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Dimmbare Entladungslampe für dielektrisch behinderte Entladungen |
DE19905219A1 (de) | 1998-09-30 | 2000-08-31 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Flache Beleuchtungsvorrichtung |
DE19845228A1 (de) | 1998-10-01 | 2000-04-27 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Dimmbare Entladungslampe für dielektrisch behinderte Entladungen |
WO2000024025A1 (en) * | 1998-10-20 | 2000-04-27 | Koninklijke Philips Electronics N.V. | Plasma display panel |
DE19858810A1 (de) | 1998-12-21 | 2000-06-29 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Flache Beleuchtungsvorrichtung und Betriebsverfahren |
EP1082752A1 (en) * | 1999-03-25 | 2001-03-14 | Koninklijke Philips Electronics N.V. | Lighting arrangement |
US6191539B1 (en) * | 1999-03-26 | 2001-02-20 | Korry Electronics Co | Fluorescent lamp with integral conductive traces for extending low-end luminance and heating the lamp tube |
DE19916877A1 (de) | 1999-04-14 | 2000-10-19 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Entladungslampe mit Sockel |
DE19919169A1 (de) * | 1999-04-28 | 2000-11-02 | Philips Corp Intellectual Pty | Vorrichtung zur Desinfektion von Wasser mit einer UV-C-Gasentladungslampe |
DE19927791A1 (de) * | 1999-06-18 | 2000-12-21 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Farbanzeige mit sequentieller Primärfarberzeugung |
DE19928438A1 (de) * | 1999-06-23 | 2000-12-28 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Verfahren zum Betrieb einer Entladungslampe |
DE69938465T2 (de) | 1999-10-18 | 2009-06-04 | Ushio Denki K.K. | Dielektrisch behinderte entladungslampe und lichtquelle |
DE19953531A1 (de) | 1999-11-05 | 2001-05-10 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Entladungslampe mit Elektrodenhalterung |
DE19955108A1 (de) * | 1999-11-16 | 2001-05-17 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Entladungslampe mit verbesserter Temperaturhomogenität |
DE19960053A1 (de) | 1999-12-13 | 2001-06-21 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Flache Beleuchtungsvorrichtung |
DE10005975A1 (de) * | 2000-02-09 | 2001-08-16 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Betriebsverfahren für eine Entladungslampe mit mindestens einer dielektrisch behinderten Elektrode |
DE10011484A1 (de) | 2000-03-09 | 2001-09-13 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Verbessertes Pulsbetriebsverfahren für eine Stille Entladungslampe |
DE10014407A1 (de) * | 2000-03-24 | 2001-09-27 | Philips Corp Intellectual Pty | Niederdruckgasentladungslampe |
US6541924B1 (en) | 2000-04-14 | 2003-04-01 | Macquarie Research Ltd. | Methods and systems for providing emission of incoherent radiation and uses therefor |
AU2001250151B2 (en) * | 2000-04-14 | 2004-07-22 | Macquarie Research Ltd | Methods and systems for providing emission of incoherent radiation and uses therefor |
US20040183461A1 (en) * | 2000-04-14 | 2004-09-23 | Kane Deborah Maree | Methods and systems for providing emission of incoherent radiation and uses therefor |
DE60130204T2 (de) | 2000-04-19 | 2008-05-21 | Koninklijke Philips Electronics N.V. | Hochdruckentladungslampe |
DE10023504A1 (de) * | 2000-05-13 | 2001-11-15 | Philips Corp Intellectual Pty | Edelgas-Niederdruck-Entladungslampe, Verfahren zum Herstellen einer Edelgas-Niederdruck-Entladungslampe Lampe sowie Verwendung einer Gasentladungslampe |
DE10026913A1 (de) * | 2000-05-31 | 2001-12-06 | Philips Corp Intellectual Pty | Gasentladungslampe mit Leuchtstoffschicht |
US6961441B1 (en) | 2000-09-29 | 2005-11-01 | General Electric Company | Method and apparatus for steganographic embedding of meta-data |
DE10048409A1 (de) | 2000-09-29 | 2002-04-11 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Entladungslampe mit kapazitiver Feldmodulation |
DE10048410A1 (de) | 2000-09-29 | 2002-04-11 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Dielektrische Barriere-Entladungslampe |
JP3818043B2 (ja) * | 2000-10-12 | 2006-09-06 | 株式会社日立製作所 | 緑色蛍光体およびそれを用いた画像表示装置 |
JP2002212553A (ja) * | 2001-01-19 | 2002-07-31 | Kasei Optonix Co Ltd | 真空紫外線用燐酸ランタン蛍光体及び希ガス放電ランプ |
DE10104364A1 (de) * | 2001-02-01 | 2002-08-14 | Philips Corp Intellectual Pty | Plasmabildschirm mit einer Leuchtstoffschicht |
JP3471782B2 (ja) * | 2001-02-13 | 2003-12-02 | Nec液晶テクノロジー株式会社 | 平面型蛍光ランプユニット及びそれを用いた液晶表示装置 |
DE10111191A1 (de) | 2001-03-08 | 2002-09-19 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Verfahren mit Kontaktsystem |
DE10121095A1 (de) * | 2001-04-27 | 2002-10-31 | Philips Corp Intellectual Pty | Gasentladungslampe mit Down-Conversion-Leuchtstoff |
US6833677B2 (en) * | 2001-05-08 | 2004-12-21 | Koninklijke Philips Electronics N.V. | 150W-1000W mastercolor ceramic metal halide lamp series with color temperature about 4000K, for high pressure sodium or quartz metal halide retrofit applications |
DE10122211A1 (de) | 2001-05-08 | 2002-11-14 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Flache Beleuchtungsvorrichtung mit Spiegelfläche |
DE10126159A1 (de) * | 2001-05-30 | 2002-12-05 | Philips Corp Intellectual Pty | Gasentladungslampe mit Down-Conversion-Leuchtstoff |
DE10129630A1 (de) * | 2001-06-20 | 2003-01-02 | Philips Corp Intellectual Pty | Niederdruckgasentladungslampe mit Leuchtstoffbeschichtung |
DE10133326A1 (de) | 2001-07-10 | 2003-01-23 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Dielektrische Barrieren-Entladungslampe mit Zündhilfe |
DE10133411A1 (de) * | 2001-07-13 | 2003-01-23 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Verwendung eines UVA-Leuchtstoffs |
DE10133949C1 (de) * | 2001-07-17 | 2003-03-20 | Inst Niedertemperatur Plasmaph | Vorrichtung zur Erzeugung von Gasentladungen, die nach dem Prinzip der dielektrisch behinderten Entladung aufgebaut ist, für Lichtquellen und Sichtanzeigeeinrichtungen |
DE10134965A1 (de) * | 2001-07-23 | 2003-02-06 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Flache Entladungslampe |
DE10140355A1 (de) * | 2001-08-17 | 2003-02-27 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Entladungslampe mit Zündhilfe |
DE10140356A1 (de) * | 2001-08-17 | 2003-02-27 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Röhrförmige Entladungslampe mit Zündhilfe |
JP4727093B2 (ja) * | 2001-09-12 | 2011-07-20 | パナソニック株式会社 | プラズマディスプレイ装置 |
TW558732B (en) * | 2001-09-19 | 2003-10-21 | Matsushita Electric Ind Co Ltd | Light source apparatus and liquid crystal display apparatus using the same |
US6891334B2 (en) | 2001-09-19 | 2005-05-10 | Matsushita Electric Industrial Co., Ltd. | Light source device and liquid crystal display employing the same |
DE10147961A1 (de) * | 2001-09-28 | 2003-04-10 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Dielektrische Barriere-Entladungslampe und Verfahren sowie Schaltunggsanordnung zum Zünden und Betreiben dieser Lampe |
US6806648B2 (en) * | 2001-11-22 | 2004-10-19 | Matsushita Electric Industrial Co., Ltd. | Light source device and liquid crystal display device |
US6906461B2 (en) * | 2001-12-28 | 2005-06-14 | Matsushita Electric Industrial Co., Ltd. | Light source device with inner and outer electrodes and liquid crystal display device |
DE10214156A1 (de) * | 2002-03-28 | 2003-10-09 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Entladungslampe für dielektrisch behinderte Entladungen mit gewellter Deckenplattenstruktur |
JP3889987B2 (ja) * | 2002-04-19 | 2007-03-07 | パナソニック フォト・ライティング 株式会社 | 放電灯装置及びバックライト |
JP2003336052A (ja) * | 2002-05-17 | 2003-11-28 | Matsushita Electric Ind Co Ltd | プラズマディスプレイ装置 |
DE10222100A1 (de) | 2002-05-17 | 2003-11-27 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Dielektrische Barriere-Entladungslampe mit Sockel |
DE10236420A1 (de) | 2002-08-08 | 2004-02-19 | Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH | Dielektrische Barriere-Entladungslampe mit verbesserter Farbwiedergabe |
TWI230962B (en) * | 2002-08-30 | 2005-04-11 | Harison Toshiba Lighting Corp | Lighting device |
DE10254208A1 (de) * | 2002-11-20 | 2004-06-03 | Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH | Dielektrische Barriere-Entladungslampe und Verwendung dieser Lampe für die Röntgenbildbetrachtung |
US6827877B2 (en) * | 2003-01-28 | 2004-12-07 | Osram Sylvania Inc. | Red-emitting phosphor blend for plasma display panels |
JP3793880B2 (ja) * | 2003-02-06 | 2006-07-05 | 松永 浩 | 点灯装置 |
US6730458B1 (en) | 2003-03-03 | 2004-05-04 | Samsung Electronics Co., Ltd. | Method for forming fine patterns through effective glass transition temperature reduction |
DE10312720A1 (de) * | 2003-03-21 | 2004-09-30 | Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH | Dielektrische Barriere-Entladungslampe mit Quetschdichtung |
US6831421B1 (en) | 2003-03-24 | 2004-12-14 | The United States Of America As Represented By The Secretary Of The Air Force | Shunt-induced high frequency excitation of dielectric barrier discharges |
DE60312648T2 (de) * | 2003-04-30 | 2007-11-22 | Centrum Für Angewandte Nanotechnologie (Can) Gmbh | Lumineszente Kern-Mantel-Nanoteilchen |
DE10324832A1 (de) * | 2003-06-02 | 2004-12-23 | Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH | Entladungslampe mit Leuchtstoff |
DE10326755A1 (de) | 2003-06-13 | 2006-01-26 | Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH | Entladungslampe mit Zweibanden-Leuchtstoff |
WO2005006388A2 (en) * | 2003-07-15 | 2005-01-20 | Philips Intellectual Property & Standards Gmbh | Colour tunable lighting element |
DE10336088A1 (de) * | 2003-08-06 | 2005-03-03 | Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH | UV-Strahler mit rohrförmigem Entladungsgefäß |
DE10347636A1 (de) * | 2003-10-09 | 2005-05-04 | Patent Treuhand Ges Fuer Elektrische Gluehlampen Mbh | Entladungslampe mit mindestens einer Außenelektrode und Verfahren zu ihrer Herstellung |
WO2005037956A1 (ja) * | 2003-10-21 | 2005-04-28 | Sumitomo Chemical Company, Limited | 蛍光体及び蛍光体ペースト |
US7863816B2 (en) * | 2003-10-23 | 2011-01-04 | General Electric Company | Dielectric barrier discharge lamp |
JP3872472B2 (ja) * | 2003-11-12 | 2007-01-24 | 日亜化学工業株式会社 | 投写管用緑色発光イットリウムシリケート蛍光体及びそれを用いた投写管 |
DE10359882A1 (de) * | 2003-12-19 | 2005-07-14 | Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH | Schaltungsanordnung zum Betreiben von elektrischen Lampen |
DE102004020398A1 (de) * | 2004-04-23 | 2005-11-10 | Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH | Dielektrische Barriere-Entladungslampe mit Außenelektroden und Beleuchtungssystem mit dieser Lampe |
US11158768B2 (en) | 2004-05-07 | 2021-10-26 | Bruce H. Baretz | Vacuum light emitting diode |
US7196473B2 (en) * | 2004-05-12 | 2007-03-27 | General Electric Company | Dielectric barrier discharge lamp |
DE102004025266A1 (de) * | 2004-05-19 | 2005-12-08 | Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH | Beleuchtungssystem mit einem Gehäuse und einer darin angeordneten Flachlampe |
WO2005116164A1 (en) * | 2004-05-27 | 2005-12-08 | Philips Intellectual Property & Standards Gmbh | Low-pressure mercury vapor discharge lamp comprising uv-a phosphor |
US20060006804A1 (en) * | 2004-07-06 | 2006-01-12 | Lajos Reich | Dielectric barrier discharge lamp |
US7446477B2 (en) | 2004-07-06 | 2008-11-04 | General Electric Company | Dielectric barrier discharge lamp with electrodes in hexagonal arrangement |
KR20060004791A (ko) * | 2004-07-08 | 2006-01-16 | 삼성코닝 주식회사 | 평판 램프 |
US7390437B2 (en) * | 2004-08-04 | 2008-06-24 | Intematix Corporation | Aluminate-based blue phosphors |
JP4575123B2 (ja) * | 2004-11-29 | 2010-11-04 | 浜松ホトニクス株式会社 | 誘電体バリア放電ランプ |
JP5244398B2 (ja) * | 2005-01-07 | 2013-07-24 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | セグメント化された誘電バリア放電ランプ |
JP2008537286A (ja) * | 2005-03-30 | 2008-09-11 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 放電ランプ並びにそのような放電ランプを含むディスプレイ装置を背面照明するためのバックライトユニット |
DE102005034505A1 (de) * | 2005-07-20 | 2007-02-01 | Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH | Schaltungsanorndung mit transformatorlosem Wandler mit Drossel für den gepulsten Betrieb von dielektrischen Barriere-Entladungslampen |
KR100725763B1 (ko) | 2005-12-05 | 2007-06-08 | 주식회사 신안유브이 | 전계 자외선 방전등 |
US7495396B2 (en) * | 2005-12-14 | 2009-02-24 | General Electric Company | Dielectric barrier discharge lamp |
DE102006010791A1 (de) * | 2006-03-08 | 2007-09-13 | Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH | Beleuchtungssystem mit einer Flachlampe und einem Rahmen |
DE202006005212U1 (de) * | 2006-03-31 | 2006-07-20 | Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH | Beleuchtungssystem mit dielektrischer Barriere-Entladungslampe, Betriebsgerät und Verbindungskabel |
CN101421374A (zh) * | 2006-04-11 | 2009-04-29 | 皇家飞利浦电子股份有限公司 | 包含uv-磷光体的放电灯 |
US20080174226A1 (en) | 2007-01-23 | 2008-07-24 | Nulight Technology Corporation | Mercury-free flat fluorescent lamps |
DE102007006861B3 (de) * | 2007-02-12 | 2008-05-29 | Universität Karlsruhe (Th) | Transparente Strahlungsquelle und Verfahren zur Strahlungserzeugung |
DE202007002131U1 (de) * | 2007-02-13 | 2007-04-19 | Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH | Beleuchtungssystem mit einer Flachlampe und einem Rahmen |
DE202007004236U1 (de) * | 2007-03-22 | 2007-06-14 | Patent-Treuhand-Gesellschaft für elektrische Glühlampen mbH | Dielektrische Barriere-Entladungslampe mit Zündhilfe |
WO2009139908A1 (en) * | 2008-05-15 | 2009-11-19 | Rutgers, The State University | Fluorescent excimer lamps |
WO2009146744A1 (de) * | 2008-06-05 | 2009-12-10 | Osram Gesellschaft mit beschränkter Haftung | Verfahren zur behandlung von oberflächen, strahler für dieses verfahren sowie bestrahlungssystem mit diesem strahler |
US10378106B2 (en) | 2008-11-14 | 2019-08-13 | Asm Ip Holding B.V. | Method of forming insulation film by modified PEALD |
JP5195371B2 (ja) * | 2008-12-05 | 2013-05-08 | ウシオ電機株式会社 | エキシマランプ装置 |
US9394608B2 (en) | 2009-04-06 | 2016-07-19 | Asm America, Inc. | Semiconductor processing reactor and components thereof |
DE102009030310A1 (de) * | 2009-06-24 | 2010-12-30 | Osram Gesellschaft mit beschränkter Haftung | Dielektrische Barriere-Entladungslampe mit Entladungsräumen |
US8802201B2 (en) | 2009-08-14 | 2014-08-12 | Asm America, Inc. | Systems and methods for thin-film deposition of metal oxides using excited nitrogen-oxygen species |
US9493366B2 (en) | 2010-06-04 | 2016-11-15 | Access Business Group International Llc | Inductively coupled dielectric barrier discharge lamp |
JP5504095B2 (ja) * | 2010-08-10 | 2014-05-28 | 株式会社オーク製作所 | 放電ランプ |
DE102010043208A1 (de) | 2010-11-02 | 2012-05-03 | Osram Ag | Vorrichtung zum Bestrahlen von Oberflächen |
DE102010043215A1 (de) | 2010-11-02 | 2012-05-03 | Osram Ag | Strahler mit Sockel für die Bestrahlung von Oberflächen |
US9312155B2 (en) | 2011-06-06 | 2016-04-12 | Asm Japan K.K. | High-throughput semiconductor-processing apparatus equipped with multiple dual-chamber modules |
JP6055170B2 (ja) * | 2011-06-15 | 2016-12-27 | セイコーエプソン株式会社 | 光源装置、放電灯の駆動方法およびプロジェクター |
US9793148B2 (en) | 2011-06-22 | 2017-10-17 | Asm Japan K.K. | Method for positioning wafers in multiple wafer transport |
US10364496B2 (en) | 2011-06-27 | 2019-07-30 | Asm Ip Holding B.V. | Dual section module having shared and unshared mass flow controllers |
US10854498B2 (en) | 2011-07-15 | 2020-12-01 | Asm Ip Holding B.V. | Wafer-supporting device and method for producing same |
US20130023129A1 (en) | 2011-07-20 | 2013-01-24 | Asm America, Inc. | Pressure transmitter for a semiconductor processing environment |
US9017481B1 (en) | 2011-10-28 | 2015-04-28 | Asm America, Inc. | Process feed management for semiconductor substrate processing |
US8946830B2 (en) | 2012-04-04 | 2015-02-03 | Asm Ip Holdings B.V. | Metal oxide protective layer for a semiconductor device |
US9558931B2 (en) | 2012-07-27 | 2017-01-31 | Asm Ip Holding B.V. | System and method for gas-phase sulfur passivation of a semiconductor surface |
US9659799B2 (en) | 2012-08-28 | 2017-05-23 | Asm Ip Holding B.V. | Systems and methods for dynamic semiconductor process scheduling |
US9021985B2 (en) | 2012-09-12 | 2015-05-05 | Asm Ip Holdings B.V. | Process gas management for an inductively-coupled plasma deposition reactor |
DE102012018854B4 (de) * | 2012-09-25 | 2018-02-15 | Berger GmbH & Co.KG | Flächige Gasentladungslampe für dielektrisch behinderte Entladungen mit drei Elektroden und zwei Gasräumen |
US9324811B2 (en) | 2012-09-26 | 2016-04-26 | Asm Ip Holding B.V. | Structures and devices including a tensile-stressed silicon arsenic layer and methods of forming same |
US20140099798A1 (en) * | 2012-10-05 | 2014-04-10 | Asm Ip Holding B.V. | UV-Curing Apparatus Provided With Wavelength-Tuned Excimer Lamp and Method of Processing Semiconductor Substrate Using Same |
US10714315B2 (en) | 2012-10-12 | 2020-07-14 | Asm Ip Holdings B.V. | Semiconductor reaction chamber showerhead |
US9133389B2 (en) * | 2012-10-31 | 2015-09-15 | Empire Technology Development Llc | Light guide structure and illuminating device |
US9640416B2 (en) | 2012-12-26 | 2017-05-02 | Asm Ip Holding B.V. | Single-and dual-chamber module-attachable wafer-handling chamber |
US20160376700A1 (en) | 2013-02-01 | 2016-12-29 | Asm Ip Holding B.V. | System for treatment of deposition reactor |
US9589770B2 (en) | 2013-03-08 | 2017-03-07 | Asm Ip Holding B.V. | Method and systems for in-situ formation of intermediate reactive species |
US9484191B2 (en) | 2013-03-08 | 2016-11-01 | Asm Ip Holding B.V. | Pulsed remote plasma method and system |
US8993054B2 (en) | 2013-07-12 | 2015-03-31 | Asm Ip Holding B.V. | Method and system to reduce outgassing in a reaction chamber |
US9018111B2 (en) | 2013-07-22 | 2015-04-28 | Asm Ip Holding B.V. | Semiconductor reaction chamber with plasma capabilities |
US9793115B2 (en) | 2013-08-14 | 2017-10-17 | Asm Ip Holding B.V. | Structures and devices including germanium-tin films and methods of forming same |
US9240412B2 (en) | 2013-09-27 | 2016-01-19 | Asm Ip Holding B.V. | Semiconductor structure and device and methods of forming same using selective epitaxial process |
US9556516B2 (en) | 2013-10-09 | 2017-01-31 | ASM IP Holding B.V | Method for forming Ti-containing film by PEALD using TDMAT or TDEAT |
US10179947B2 (en) | 2013-11-26 | 2019-01-15 | Asm Ip Holding B.V. | Method for forming conformal nitrided, oxidized, or carbonized dielectric film by atomic layer deposition |
US10683571B2 (en) | 2014-02-25 | 2020-06-16 | Asm Ip Holding B.V. | Gas supply manifold and method of supplying gases to chamber using same |
US10167557B2 (en) | 2014-03-18 | 2019-01-01 | Asm Ip Holding B.V. | Gas distribution system, reactor including the system, and methods of using the same |
US9447498B2 (en) | 2014-03-18 | 2016-09-20 | Asm Ip Holding B.V. | Method for performing uniform processing in gas system-sharing multiple reaction chambers |
US11015245B2 (en) | 2014-03-19 | 2021-05-25 | Asm Ip Holding B.V. | Gas-phase reactor and system having exhaust plenum and components thereof |
US9404587B2 (en) | 2014-04-24 | 2016-08-02 | ASM IP Holding B.V | Lockout tagout for semiconductor vacuum valve |
US10858737B2 (en) | 2014-07-28 | 2020-12-08 | Asm Ip Holding B.V. | Showerhead assembly and components thereof |
US9543180B2 (en) | 2014-08-01 | 2017-01-10 | Asm Ip Holding B.V. | Apparatus and method for transporting wafers between wafer carrier and process tool under vacuum |
US9890456B2 (en) | 2014-08-21 | 2018-02-13 | Asm Ip Holding B.V. | Method and system for in situ formation of gas-phase compounds |
US9657845B2 (en) | 2014-10-07 | 2017-05-23 | Asm Ip Holding B.V. | Variable conductance gas distribution apparatus and method |
US10941490B2 (en) | 2014-10-07 | 2021-03-09 | Asm Ip Holding B.V. | Multiple temperature range susceptor, assembly, reactor and system including the susceptor, and methods of using the same |
KR102300403B1 (ko) | 2014-11-19 | 2021-09-09 | 에이에스엠 아이피 홀딩 비.브이. | 박막 증착 방법 |
KR102263121B1 (ko) | 2014-12-22 | 2021-06-09 | 에이에스엠 아이피 홀딩 비.브이. | 반도체 소자 및 그 제조 방법 |
US9478415B2 (en) | 2015-02-13 | 2016-10-25 | Asm Ip Holding B.V. | Method for forming film having low resistance and shallow junction depth |
US10529542B2 (en) | 2015-03-11 | 2020-01-07 | Asm Ip Holdings B.V. | Cross-flow reactor and method |
US10276355B2 (en) | 2015-03-12 | 2019-04-30 | Asm Ip Holding B.V. | Multi-zone reactor, system including the reactor, and method of using the same |
US10458018B2 (en) | 2015-06-26 | 2019-10-29 | Asm Ip Holding B.V. | Structures including metal carbide material, devices including the structures, and methods of forming same |
US10600673B2 (en) | 2015-07-07 | 2020-03-24 | Asm Ip Holding B.V. | Magnetic susceptor to baseplate seal |
US10043661B2 (en) | 2015-07-13 | 2018-08-07 | Asm Ip Holding B.V. | Method for protecting layer by forming hydrocarbon-based extremely thin film |
US9899291B2 (en) | 2015-07-13 | 2018-02-20 | Asm Ip Holding B.V. | Method for protecting layer by forming hydrocarbon-based extremely thin film |
US10083836B2 (en) | 2015-07-24 | 2018-09-25 | Asm Ip Holding B.V. | Formation of boron-doped titanium metal films with high work function |
US10087525B2 (en) | 2015-08-04 | 2018-10-02 | Asm Ip Holding B.V. | Variable gap hard stop design |
US9647114B2 (en) | 2015-08-14 | 2017-05-09 | Asm Ip Holding B.V. | Methods of forming highly p-type doped germanium tin films and structures and devices including the films |
US9711345B2 (en) | 2015-08-25 | 2017-07-18 | Asm Ip Holding B.V. | Method for forming aluminum nitride-based film by PEALD |
US9960072B2 (en) | 2015-09-29 | 2018-05-01 | Asm Ip Holding B.V. | Variable adjustment for precise matching of multiple chamber cavity housings |
US9909214B2 (en) | 2015-10-15 | 2018-03-06 | Asm Ip Holding B.V. | Method for depositing dielectric film in trenches by PEALD |
US10211308B2 (en) | 2015-10-21 | 2019-02-19 | Asm Ip Holding B.V. | NbMC layers |
US10322384B2 (en) | 2015-11-09 | 2019-06-18 | Asm Ip Holding B.V. | Counter flow mixer for process chamber |
US9455138B1 (en) | 2015-11-10 | 2016-09-27 | Asm Ip Holding B.V. | Method for forming dielectric film in trenches by PEALD using H-containing gas |
US9905420B2 (en) | 2015-12-01 | 2018-02-27 | Asm Ip Holding B.V. | Methods of forming silicon germanium tin films and structures and devices including the films |
US9607837B1 (en) | 2015-12-21 | 2017-03-28 | Asm Ip Holding B.V. | Method for forming silicon oxide cap layer for solid state diffusion process |
US9627221B1 (en) | 2015-12-28 | 2017-04-18 | Asm Ip Holding B.V. | Continuous process incorporating atomic layer etching |
US9735024B2 (en) | 2015-12-28 | 2017-08-15 | Asm Ip Holding B.V. | Method of atomic layer etching using functional group-containing fluorocarbon |
US11139308B2 (en) | 2015-12-29 | 2021-10-05 | Asm Ip Holding B.V. | Atomic layer deposition of III-V compounds to form V-NAND devices |
US10468251B2 (en) | 2016-02-19 | 2019-11-05 | Asm Ip Holding B.V. | Method for forming spacers using silicon nitride film for spacer-defined multiple patterning |
US9754779B1 (en) | 2016-02-19 | 2017-09-05 | Asm Ip Holding B.V. | Method for forming silicon nitride film selectively on sidewalls or flat surfaces of trenches |
US10529554B2 (en) | 2016-02-19 | 2020-01-07 | Asm Ip Holding B.V. | Method for forming silicon nitride film selectively on sidewalls or flat surfaces of trenches |
US10501866B2 (en) | 2016-03-09 | 2019-12-10 | Asm Ip Holding B.V. | Gas distribution apparatus for improved film uniformity in an epitaxial system |
US10343920B2 (en) | 2016-03-18 | 2019-07-09 | Asm Ip Holding B.V. | Aligned carbon nanotubes |
US9892913B2 (en) | 2016-03-24 | 2018-02-13 | Asm Ip Holding B.V. | Radial and thickness control via biased multi-port injection settings |
US10865475B2 (en) | 2016-04-21 | 2020-12-15 | Asm Ip Holding B.V. | Deposition of metal borides and silicides |
US10190213B2 (en) | 2016-04-21 | 2019-01-29 | Asm Ip Holding B.V. | Deposition of metal borides |
US10087522B2 (en) | 2016-04-21 | 2018-10-02 | Asm Ip Holding B.V. | Deposition of metal borides |
US10032628B2 (en) | 2016-05-02 | 2018-07-24 | Asm Ip Holding B.V. | Source/drain performance through conformal solid state doping |
US10367080B2 (en) | 2016-05-02 | 2019-07-30 | Asm Ip Holding B.V. | Method of forming a germanium oxynitride film |
KR102592471B1 (ko) | 2016-05-17 | 2023-10-20 | 에이에스엠 아이피 홀딩 비.브이. | 금속 배선 형성 방법 및 이를 이용한 반도체 장치의 제조 방법 |
US11453943B2 (en) | 2016-05-25 | 2022-09-27 | Asm Ip Holding B.V. | Method for forming carbon-containing silicon/metal oxide or nitride film by ALD using silicon precursor and hydrocarbon precursor |
US10388509B2 (en) | 2016-06-28 | 2019-08-20 | Asm Ip Holding B.V. | Formation of epitaxial layers via dislocation filtering |
US10612137B2 (en) | 2016-07-08 | 2020-04-07 | Asm Ip Holdings B.V. | Organic reactants for atomic layer deposition |
US9859151B1 (en) | 2016-07-08 | 2018-01-02 | Asm Ip Holding B.V. | Selective film deposition method to form air gaps |
US9793135B1 (en) | 2016-07-14 | 2017-10-17 | ASM IP Holding B.V | Method of cyclic dry etching using etchant film |
US10714385B2 (en) | 2016-07-19 | 2020-07-14 | Asm Ip Holding B.V. | Selective deposition of tungsten |
KR102354490B1 (ko) | 2016-07-27 | 2022-01-21 | 에이에스엠 아이피 홀딩 비.브이. | 기판 처리 방법 |
US9812320B1 (en) | 2016-07-28 | 2017-11-07 | Asm Ip Holding B.V. | Method and apparatus for filling a gap |
US9887082B1 (en) | 2016-07-28 | 2018-02-06 | Asm Ip Holding B.V. | Method and apparatus for filling a gap |
US10177025B2 (en) | 2016-07-28 | 2019-01-08 | Asm Ip Holding B.V. | Method and apparatus for filling a gap |
US10395919B2 (en) | 2016-07-28 | 2019-08-27 | Asm Ip Holding B.V. | Method and apparatus for filling a gap |
KR102532607B1 (ko) | 2016-07-28 | 2023-05-15 | 에이에스엠 아이피 홀딩 비.브이. | 기판 가공 장치 및 그 동작 방법 |
US10090316B2 (en) | 2016-09-01 | 2018-10-02 | Asm Ip Holding B.V. | 3D stacked multilayer semiconductor memory using doped select transistor channel |
US10410943B2 (en) | 2016-10-13 | 2019-09-10 | Asm Ip Holding B.V. | Method for passivating a surface of a semiconductor and related systems |
US10643826B2 (en) | 2016-10-26 | 2020-05-05 | Asm Ip Holdings B.V. | Methods for thermally calibrating reaction chambers |
US11532757B2 (en) | 2016-10-27 | 2022-12-20 | Asm Ip Holding B.V. | Deposition of charge trapping layers |
US10229833B2 (en) | 2016-11-01 | 2019-03-12 | Asm Ip Holding B.V. | Methods for forming a transition metal nitride film on a substrate by atomic layer deposition and related semiconductor device structures |
US10435790B2 (en) | 2016-11-01 | 2019-10-08 | Asm Ip Holding B.V. | Method of subatmospheric plasma-enhanced ALD using capacitively coupled electrodes with narrow gap |
US10714350B2 (en) | 2016-11-01 | 2020-07-14 | ASM IP Holdings, B.V. | Methods for forming a transition metal niobium nitride film on a substrate by atomic layer deposition and related semiconductor device structures |
US10643904B2 (en) | 2016-11-01 | 2020-05-05 | Asm Ip Holdings B.V. | Methods for forming a semiconductor device and related semiconductor device structures |
US10134757B2 (en) | 2016-11-07 | 2018-11-20 | Asm Ip Holding B.V. | Method of processing a substrate and a device manufactured by using the method |
KR102546317B1 (ko) | 2016-11-15 | 2023-06-21 | 에이에스엠 아이피 홀딩 비.브이. | 기체 공급 유닛 및 이를 포함하는 기판 처리 장치 |
US10340135B2 (en) | 2016-11-28 | 2019-07-02 | Asm Ip Holding B.V. | Method of topologically restricted plasma-enhanced cyclic deposition of silicon or metal nitride |
KR20180068582A (ko) | 2016-12-14 | 2018-06-22 | 에이에스엠 아이피 홀딩 비.브이. | 기판 처리 장치 |
US9916980B1 (en) | 2016-12-15 | 2018-03-13 | Asm Ip Holding B.V. | Method of forming a structure on a substrate |
US11581186B2 (en) | 2016-12-15 | 2023-02-14 | Asm Ip Holding B.V. | Sequential infiltration synthesis apparatus |
US11447861B2 (en) | 2016-12-15 | 2022-09-20 | Asm Ip Holding B.V. | Sequential infiltration synthesis apparatus and a method of forming a patterned structure |
KR102700194B1 (ko) | 2016-12-19 | 2024-08-28 | 에이에스엠 아이피 홀딩 비.브이. | 기판 처리 장치 |
US10269558B2 (en) | 2016-12-22 | 2019-04-23 | Asm Ip Holding B.V. | Method of forming a structure on a substrate |
US10867788B2 (en) | 2016-12-28 | 2020-12-15 | Asm Ip Holding B.V. | Method of forming a structure on a substrate |
US11390950B2 (en) | 2017-01-10 | 2022-07-19 | Asm Ip Holding B.V. | Reactor system and method to reduce residue buildup during a film deposition process |
US10655221B2 (en) | 2017-02-09 | 2020-05-19 | Asm Ip Holding B.V. | Method for depositing oxide film by thermal ALD and PEALD |
US10468261B2 (en) | 2017-02-15 | 2019-11-05 | Asm Ip Holding B.V. | Methods for forming a metallic film on a substrate by cyclical deposition and related semiconductor device structures |
US10529563B2 (en) | 2017-03-29 | 2020-01-07 | Asm Ip Holdings B.V. | Method for forming doped metal oxide films on a substrate by cyclical deposition and related semiconductor device structures |
US10283353B2 (en) | 2017-03-29 | 2019-05-07 | Asm Ip Holding B.V. | Method of reforming insulating film deposited on substrate with recess pattern |
US10103040B1 (en) | 2017-03-31 | 2018-10-16 | Asm Ip Holding B.V. | Apparatus and method for manufacturing a semiconductor device |
USD830981S1 (en) | 2017-04-07 | 2018-10-16 | Asm Ip Holding B.V. | Susceptor for semiconductor substrate processing apparatus |
KR102457289B1 (ko) | 2017-04-25 | 2022-10-21 | 에이에스엠 아이피 홀딩 비.브이. | 박막 증착 방법 및 반도체 장치의 제조 방법 |
US10446393B2 (en) | 2017-05-08 | 2019-10-15 | Asm Ip Holding B.V. | Methods for forming silicon-containing epitaxial layers and related semiconductor device structures |
US10892156B2 (en) | 2017-05-08 | 2021-01-12 | Asm Ip Holding B.V. | Methods for forming a silicon nitride film on a substrate and related semiconductor device structures |
US10770286B2 (en) | 2017-05-08 | 2020-09-08 | Asm Ip Holdings B.V. | Methods for selectively forming a silicon nitride film on a substrate and related semiconductor device structures |
US10504742B2 (en) | 2017-05-31 | 2019-12-10 | Asm Ip Holding B.V. | Method of atomic layer etching using hydrogen plasma |
US10886123B2 (en) | 2017-06-02 | 2021-01-05 | Asm Ip Holding B.V. | Methods for forming low temperature semiconductor layers and related semiconductor device structures |
US12040200B2 (en) | 2017-06-20 | 2024-07-16 | Asm Ip Holding B.V. | Semiconductor processing apparatus and methods for calibrating a semiconductor processing apparatus |
US11306395B2 (en) | 2017-06-28 | 2022-04-19 | Asm Ip Holding B.V. | Methods for depositing a transition metal nitride film on a substrate by atomic layer deposition and related deposition apparatus |
US10685834B2 (en) | 2017-07-05 | 2020-06-16 | Asm Ip Holdings B.V. | Methods for forming a silicon germanium tin layer and related semiconductor device structures |
KR20190009245A (ko) | 2017-07-18 | 2019-01-28 | 에이에스엠 아이피 홀딩 비.브이. | 반도체 소자 구조물 형성 방법 및 관련된 반도체 소자 구조물 |
US10541333B2 (en) | 2017-07-19 | 2020-01-21 | Asm Ip Holding B.V. | Method for depositing a group IV semiconductor and related semiconductor device structures |
US11374112B2 (en) | 2017-07-19 | 2022-06-28 | Asm Ip Holding B.V. | Method for depositing a group IV semiconductor and related semiconductor device structures |
US11018002B2 (en) | 2017-07-19 | 2021-05-25 | Asm Ip Holding B.V. | Method for selectively depositing a Group IV semiconductor and related semiconductor device structures |
US10312055B2 (en) | 2017-07-26 | 2019-06-04 | Asm Ip Holding B.V. | Method of depositing film by PEALD using negative bias |
US10590535B2 (en) | 2017-07-26 | 2020-03-17 | Asm Ip Holdings B.V. | Chemical treatment, deposition and/or infiltration apparatus and method for using the same |
US10605530B2 (en) | 2017-07-26 | 2020-03-31 | Asm Ip Holding B.V. | Assembly of a liner and a flange for a vertical furnace as well as the liner and the vertical furnace |
US10692741B2 (en) | 2017-08-08 | 2020-06-23 | Asm Ip Holdings B.V. | Radiation shield |
US10770336B2 (en) | 2017-08-08 | 2020-09-08 | Asm Ip Holding B.V. | Substrate lift mechanism and reactor including same |
US11769682B2 (en) | 2017-08-09 | 2023-09-26 | Asm Ip Holding B.V. | Storage apparatus for storing cassettes for substrates and processing apparatus equipped therewith |
US10249524B2 (en) | 2017-08-09 | 2019-04-02 | Asm Ip Holding B.V. | Cassette holder assembly for a substrate cassette and holding member for use in such assembly |
US11139191B2 (en) | 2017-08-09 | 2021-10-05 | Asm Ip Holding B.V. | Storage apparatus for storing cassettes for substrates and processing apparatus equipped therewith |
US10236177B1 (en) | 2017-08-22 | 2019-03-19 | ASM IP Holding B.V.. | Methods for depositing a doped germanium tin semiconductor and related semiconductor device structures |
USD900036S1 (en) | 2017-08-24 | 2020-10-27 | Asm Ip Holding B.V. | Heater electrical connector and adapter |
US11830730B2 (en) | 2017-08-29 | 2023-11-28 | Asm Ip Holding B.V. | Layer forming method and apparatus |
US11295980B2 (en) | 2017-08-30 | 2022-04-05 | Asm Ip Holding B.V. | Methods for depositing a molybdenum metal film over a dielectric surface of a substrate by a cyclical deposition process and related semiconductor device structures |
KR102491945B1 (ko) | 2017-08-30 | 2023-01-26 | 에이에스엠 아이피 홀딩 비.브이. | 기판 처리 장치 |
US11056344B2 (en) | 2017-08-30 | 2021-07-06 | Asm Ip Holding B.V. | Layer forming method |
KR102401446B1 (ko) | 2017-08-31 | 2022-05-24 | 에이에스엠 아이피 홀딩 비.브이. | 기판 처리 장치 |
US10607895B2 (en) | 2017-09-18 | 2020-03-31 | Asm Ip Holdings B.V. | Method for forming a semiconductor device structure comprising a gate fill metal |
KR102630301B1 (ko) | 2017-09-21 | 2024-01-29 | 에이에스엠 아이피 홀딩 비.브이. | 침투성 재료의 순차 침투 합성 방법 처리 및 이를 이용하여 형성된 구조물 및 장치 |
US10844484B2 (en) | 2017-09-22 | 2020-11-24 | Asm Ip Holding B.V. | Apparatus for dispensing a vapor phase reactant to a reaction chamber and related methods |
US10658205B2 (en) | 2017-09-28 | 2020-05-19 | Asm Ip Holdings B.V. | Chemical dispensing apparatus and methods for dispensing a chemical to a reaction chamber |
US10403504B2 (en) | 2017-10-05 | 2019-09-03 | Asm Ip Holding B.V. | Method for selectively depositing a metallic film on a substrate |
US10319588B2 (en) | 2017-10-10 | 2019-06-11 | Asm Ip Holding B.V. | Method for depositing a metal chalcogenide on a substrate by cyclical deposition |
US10923344B2 (en) | 2017-10-30 | 2021-02-16 | Asm Ip Holding B.V. | Methods for forming a semiconductor structure and related semiconductor structures |
KR102443047B1 (ko) | 2017-11-16 | 2022-09-14 | 에이에스엠 아이피 홀딩 비.브이. | 기판 처리 장치 방법 및 그에 의해 제조된 장치 |
US10910262B2 (en) | 2017-11-16 | 2021-02-02 | Asm Ip Holding B.V. | Method of selectively depositing a capping layer structure on a semiconductor device structure |
US11022879B2 (en) | 2017-11-24 | 2021-06-01 | Asm Ip Holding B.V. | Method of forming an enhanced unexposed photoresist layer |
WO2019103610A1 (en) | 2017-11-27 | 2019-05-31 | Asm Ip Holding B.V. | Apparatus including a clean mini environment |
JP7214724B2 (ja) | 2017-11-27 | 2023-01-30 | エーエスエム アイピー ホールディング ビー.ブイ. | バッチ炉で利用されるウェハカセットを収納するための収納装置 |
US10290508B1 (en) | 2017-12-05 | 2019-05-14 | Asm Ip Holding B.V. | Method for forming vertical spacers for spacer-defined patterning |
US10872771B2 (en) | 2018-01-16 | 2020-12-22 | Asm Ip Holding B. V. | Method for depositing a material film on a substrate within a reaction chamber by a cyclical deposition process and related device structures |
TWI799494B (zh) | 2018-01-19 | 2023-04-21 | 荷蘭商Asm 智慧財產控股公司 | 沈積方法 |
CN111630203A (zh) | 2018-01-19 | 2020-09-04 | Asm Ip私人控股有限公司 | 通过等离子体辅助沉积来沉积间隙填充层的方法 |
USD903477S1 (en) | 2018-01-24 | 2020-12-01 | Asm Ip Holdings B.V. | Metal clamp |
US11018047B2 (en) | 2018-01-25 | 2021-05-25 | Asm Ip Holding B.V. | Hybrid lift pin |
USD880437S1 (en) | 2018-02-01 | 2020-04-07 | Asm Ip Holding B.V. | Gas supply plate for semiconductor manufacturing apparatus |
US10535516B2 (en) | 2018-02-01 | 2020-01-14 | Asm Ip Holdings B.V. | Method for depositing a semiconductor structure on a surface of a substrate and related semiconductor structures |
US11081345B2 (en) | 2018-02-06 | 2021-08-03 | Asm Ip Holding B.V. | Method of post-deposition treatment for silicon oxide film |
JP7124098B2 (ja) | 2018-02-14 | 2022-08-23 | エーエスエム・アイピー・ホールディング・ベー・フェー | 周期的堆積プロセスにより基材上にルテニウム含有膜を堆積させる方法 |
US10896820B2 (en) | 2018-02-14 | 2021-01-19 | Asm Ip Holding B.V. | Method for depositing a ruthenium-containing film on a substrate by a cyclical deposition process |
US10731249B2 (en) | 2018-02-15 | 2020-08-04 | Asm Ip Holding B.V. | Method of forming a transition metal containing film on a substrate by a cyclical deposition process, a method for supplying a transition metal halide compound to a reaction chamber, and related vapor deposition apparatus |
KR102636427B1 (ko) | 2018-02-20 | 2024-02-13 | 에이에스엠 아이피 홀딩 비.브이. | 기판 처리 방법 및 장치 |
US10658181B2 (en) | 2018-02-20 | 2020-05-19 | Asm Ip Holding B.V. | Method of spacer-defined direct patterning in semiconductor fabrication |
US10975470B2 (en) | 2018-02-23 | 2021-04-13 | Asm Ip Holding B.V. | Apparatus for detecting or monitoring for a chemical precursor in a high temperature environment |
US11473195B2 (en) | 2018-03-01 | 2022-10-18 | Asm Ip Holding B.V. | Semiconductor processing apparatus and a method for processing a substrate |
US11629406B2 (en) | 2018-03-09 | 2023-04-18 | Asm Ip Holding B.V. | Semiconductor processing apparatus comprising one or more pyrometers for measuring a temperature of a substrate during transfer of the substrate |
US11114283B2 (en) | 2018-03-16 | 2021-09-07 | Asm Ip Holding B.V. | Reactor, system including the reactor, and methods of manufacturing and using same |
KR102646467B1 (ko) | 2018-03-27 | 2024-03-11 | 에이에스엠 아이피 홀딩 비.브이. | 기판 상에 전극을 형성하는 방법 및 전극을 포함하는 반도체 소자 구조 |
US11088002B2 (en) | 2018-03-29 | 2021-08-10 | Asm Ip Holding B.V. | Substrate rack and a substrate processing system and method |
US10510536B2 (en) | 2018-03-29 | 2019-12-17 | Asm Ip Holding B.V. | Method of depositing a co-doped polysilicon film on a surface of a substrate within a reaction chamber |
US11230766B2 (en) | 2018-03-29 | 2022-01-25 | Asm Ip Holding B.V. | Substrate processing apparatus and method |
KR102501472B1 (ko) | 2018-03-30 | 2023-02-20 | 에이에스엠 아이피 홀딩 비.브이. | 기판 처리 방법 |
US12025484B2 (en) | 2018-05-08 | 2024-07-02 | Asm Ip Holding B.V. | Thin film forming method |
TWI843623B (zh) | 2018-05-08 | 2024-05-21 | 荷蘭商Asm Ip私人控股有限公司 | 藉由循環沉積製程於基板上沉積氧化物膜之方法及相關裝置結構 |
KR20190129718A (ko) | 2018-05-11 | 2019-11-20 | 에이에스엠 아이피 홀딩 비.브이. | 기판 상에 피도핑 금속 탄화물 막을 형성하는 방법 및 관련 반도체 소자 구조 |
KR102596988B1 (ko) | 2018-05-28 | 2023-10-31 | 에이에스엠 아이피 홀딩 비.브이. | 기판 처리 방법 및 그에 의해 제조된 장치 |
US11718913B2 (en) | 2018-06-04 | 2023-08-08 | Asm Ip Holding B.V. | Gas distribution system and reactor system including same |
TWI840362B (zh) | 2018-06-04 | 2024-05-01 | 荷蘭商Asm Ip私人控股有限公司 | 水氣降低的晶圓處置腔室 |
US11286562B2 (en) | 2018-06-08 | 2022-03-29 | Asm Ip Holding B.V. | Gas-phase chemical reactor and method of using same |
US10797133B2 (en) | 2018-06-21 | 2020-10-06 | Asm Ip Holding B.V. | Method for depositing a phosphorus doped silicon arsenide film and related semiconductor device structures |
KR102568797B1 (ko) | 2018-06-21 | 2023-08-21 | 에이에스엠 아이피 홀딩 비.브이. | 기판 처리 시스템 |
TW202409324A (zh) | 2018-06-27 | 2024-03-01 | 荷蘭商Asm Ip私人控股有限公司 | 用於形成含金屬材料之循環沉積製程 |
WO2020003000A1 (en) | 2018-06-27 | 2020-01-02 | Asm Ip Holding B.V. | Cyclic deposition methods for forming metal-containing material and films and structures including the metal-containing material |
US10612136B2 (en) | 2018-06-29 | 2020-04-07 | ASM IP Holding, B.V. | Temperature-controlled flange and reactor system including same |
KR102686758B1 (ko) | 2018-06-29 | 2024-07-18 | 에이에스엠 아이피 홀딩 비.브이. | 박막 증착 방법 및 반도체 장치의 제조 방법 |
US10755922B2 (en) | 2018-07-03 | 2020-08-25 | Asm Ip Holding B.V. | Method for depositing silicon-free carbon-containing film as gap-fill layer by pulse plasma-assisted deposition |
US10388513B1 (en) | 2018-07-03 | 2019-08-20 | Asm Ip Holding B.V. | Method for depositing silicon-free carbon-containing film as gap-fill layer by pulse plasma-assisted deposition |
US10767789B2 (en) | 2018-07-16 | 2020-09-08 | Asm Ip Holding B.V. | Diaphragm valves, valve components, and methods for forming valve components |
US10483099B1 (en) | 2018-07-26 | 2019-11-19 | Asm Ip Holding B.V. | Method for forming thermally stable organosilicon polymer film |
US11053591B2 (en) | 2018-08-06 | 2021-07-06 | Asm Ip Holding B.V. | Multi-port gas injection system and reactor system including same |
US10883175B2 (en) | 2018-08-09 | 2021-01-05 | Asm Ip Holding B.V. | Vertical furnace for processing substrates and a liner for use therein |
US10829852B2 (en) | 2018-08-16 | 2020-11-10 | Asm Ip Holding B.V. | Gas distribution device for a wafer processing apparatus |
US11430674B2 (en) | 2018-08-22 | 2022-08-30 | Asm Ip Holding B.V. | Sensor array, apparatus for dispensing a vapor phase reactant to a reaction chamber and related methods |
KR102707956B1 (ko) | 2018-09-11 | 2024-09-19 | 에이에스엠 아이피 홀딩 비.브이. | 박막 증착 방법 |
US11024523B2 (en) | 2018-09-11 | 2021-06-01 | Asm Ip Holding B.V. | Substrate processing apparatus and method |
US11049751B2 (en) | 2018-09-14 | 2021-06-29 | Asm Ip Holding B.V. | Cassette supply system to store and handle cassettes and processing apparatus equipped therewith |
TWI844567B (zh) | 2018-10-01 | 2024-06-11 | 荷蘭商Asm Ip私人控股有限公司 | 基材保持裝置、含有此裝置之系統及其使用之方法 |
US11232963B2 (en) | 2018-10-03 | 2022-01-25 | Asm Ip Holding B.V. | Substrate processing apparatus and method |
KR102592699B1 (ko) | 2018-10-08 | 2023-10-23 | 에이에스엠 아이피 홀딩 비.브이. | 기판 지지 유닛 및 이를 포함하는 박막 증착 장치와 기판 처리 장치 |
US10847365B2 (en) | 2018-10-11 | 2020-11-24 | Asm Ip Holding B.V. | Method of forming conformal silicon carbide film by cyclic CVD |
US10811256B2 (en) | 2018-10-16 | 2020-10-20 | Asm Ip Holding B.V. | Method for etching a carbon-containing feature |
KR102605121B1 (ko) | 2018-10-19 | 2023-11-23 | 에이에스엠 아이피 홀딩 비.브이. | 기판 처리 장치 및 기판 처리 방법 |
KR102546322B1 (ko) | 2018-10-19 | 2023-06-21 | 에이에스엠 아이피 홀딩 비.브이. | 기판 처리 장치 및 기판 처리 방법 |
USD948463S1 (en) | 2018-10-24 | 2022-04-12 | Asm Ip Holding B.V. | Susceptor for semiconductor substrate supporting apparatus |
US10381219B1 (en) | 2018-10-25 | 2019-08-13 | Asm Ip Holding B.V. | Methods for forming a silicon nitride film |
US11087997B2 (en) | 2018-10-31 | 2021-08-10 | Asm Ip Holding B.V. | Substrate processing apparatus for processing substrates |
KR20200051105A (ko) | 2018-11-02 | 2020-05-13 | 에이에스엠 아이피 홀딩 비.브이. | 기판 지지 유닛 및 이를 포함하는 기판 처리 장치 |
US11572620B2 (en) | 2018-11-06 | 2023-02-07 | Asm Ip Holding B.V. | Methods for selectively depositing an amorphous silicon film on a substrate |
US11031242B2 (en) | 2018-11-07 | 2021-06-08 | Asm Ip Holding B.V. | Methods for depositing a boron doped silicon germanium film |
US10818758B2 (en) | 2018-11-16 | 2020-10-27 | Asm Ip Holding B.V. | Methods for forming a metal silicate film on a substrate in a reaction chamber and related semiconductor device structures |
US10847366B2 (en) | 2018-11-16 | 2020-11-24 | Asm Ip Holding B.V. | Methods for depositing a transition metal chalcogenide film on a substrate by a cyclical deposition process |
US10559458B1 (en) | 2018-11-26 | 2020-02-11 | Asm Ip Holding B.V. | Method of forming oxynitride film |
US12040199B2 (en) | 2018-11-28 | 2024-07-16 | Asm Ip Holding B.V. | Substrate processing apparatus for processing substrates |
US11217444B2 (en) | 2018-11-30 | 2022-01-04 | Asm Ip Holding B.V. | Method for forming an ultraviolet radiation responsive metal oxide-containing film |
KR102636428B1 (ko) | 2018-12-04 | 2024-02-13 | 에이에스엠 아이피 홀딩 비.브이. | 기판 처리 장치를 세정하는 방법 |
US11158513B2 (en) | 2018-12-13 | 2021-10-26 | Asm Ip Holding B.V. | Methods for forming a rhenium-containing film on a substrate by a cyclical deposition process and related semiconductor device structures |
JP7504584B2 (ja) | 2018-12-14 | 2024-06-24 | エーエスエム・アイピー・ホールディング・ベー・フェー | 窒化ガリウムの選択的堆積を用いてデバイス構造体を形成する方法及びそのためのシステム |
TWI819180B (zh) | 2019-01-17 | 2023-10-21 | 荷蘭商Asm 智慧財產控股公司 | 藉由循環沈積製程於基板上形成含過渡金屬膜之方法 |
KR20200091543A (ko) | 2019-01-22 | 2020-07-31 | 에이에스엠 아이피 홀딩 비.브이. | 기판 처리 장치 |
CN111524788B (zh) | 2019-02-01 | 2023-11-24 | Asm Ip私人控股有限公司 | 氧化硅的拓扑选择性膜形成的方法 |
TWI845607B (zh) | 2019-02-20 | 2024-06-21 | 荷蘭商Asm Ip私人控股有限公司 | 用來填充形成於基材表面內之凹部的循環沉積方法及設備 |
KR102626263B1 (ko) | 2019-02-20 | 2024-01-16 | 에이에스엠 아이피 홀딩 비.브이. | 처리 단계를 포함하는 주기적 증착 방법 및 이를 위한 장치 |
JP2020136678A (ja) | 2019-02-20 | 2020-08-31 | エーエスエム・アイピー・ホールディング・ベー・フェー | 基材表面内に形成された凹部を充填するための方法および装置 |
KR20200102357A (ko) | 2019-02-20 | 2020-08-31 | 에이에스엠 아이피 홀딩 비.브이. | 3-d nand 응용의 플러그 충진체 증착용 장치 및 방법 |
TWI842826B (zh) | 2019-02-22 | 2024-05-21 | 荷蘭商Asm Ip私人控股有限公司 | 基材處理設備及處理基材之方法 |
US11742198B2 (en) | 2019-03-08 | 2023-08-29 | Asm Ip Holding B.V. | Structure including SiOCN layer and method of forming same |
KR20200108243A (ko) | 2019-03-08 | 2020-09-17 | 에이에스엠 아이피 홀딩 비.브이. | SiOC 층을 포함한 구조체 및 이의 형성 방법 |
KR20200108242A (ko) | 2019-03-08 | 2020-09-17 | 에이에스엠 아이피 홀딩 비.브이. | 실리콘 질화물 층을 선택적으로 증착하는 방법, 및 선택적으로 증착된 실리콘 질화물 층을 포함하는 구조체 |
KR20200116033A (ko) | 2019-03-28 | 2020-10-08 | 에이에스엠 아이피 홀딩 비.브이. | 도어 개방기 및 이를 구비한 기판 처리 장치 |
KR20200116855A (ko) | 2019-04-01 | 2020-10-13 | 에이에스엠 아이피 홀딩 비.브이. | 반도체 소자를 제조하는 방법 |
KR20200123380A (ko) | 2019-04-19 | 2020-10-29 | 에이에스엠 아이피 홀딩 비.브이. | 층 형성 방법 및 장치 |
KR20200125453A (ko) | 2019-04-24 | 2020-11-04 | 에이에스엠 아이피 홀딩 비.브이. | 기상 반응기 시스템 및 이를 사용하는 방법 |
KR20200130121A (ko) | 2019-05-07 | 2020-11-18 | 에이에스엠 아이피 홀딩 비.브이. | 딥 튜브가 있는 화학물질 공급원 용기 |
KR20200130118A (ko) | 2019-05-07 | 2020-11-18 | 에이에스엠 아이피 홀딩 비.브이. | 비정질 탄소 중합체 막을 개질하는 방법 |
KR20200130652A (ko) | 2019-05-10 | 2020-11-19 | 에이에스엠 아이피 홀딩 비.브이. | 표면 상에 재료를 증착하는 방법 및 본 방법에 따라 형성된 구조 |
JP2020188254A (ja) | 2019-05-16 | 2020-11-19 | エーエスエム アイピー ホールディング ビー.ブイ. | ウェハボートハンドリング装置、縦型バッチ炉および方法 |
JP2020188255A (ja) | 2019-05-16 | 2020-11-19 | エーエスエム アイピー ホールディング ビー.ブイ. | ウェハボートハンドリング装置、縦型バッチ炉および方法 |
USD947913S1 (en) | 2019-05-17 | 2022-04-05 | Asm Ip Holding B.V. | Susceptor shaft |
USD975665S1 (en) | 2019-05-17 | 2023-01-17 | Asm Ip Holding B.V. | Susceptor shaft |
USD935572S1 (en) | 2019-05-24 | 2021-11-09 | Asm Ip Holding B.V. | Gas channel plate |
USD922229S1 (en) | 2019-06-05 | 2021-06-15 | Asm Ip Holding B.V. | Device for controlling a temperature of a gas supply unit |
KR20200141003A (ko) | 2019-06-06 | 2020-12-17 | 에이에스엠 아이피 홀딩 비.브이. | 가스 감지기를 포함하는 기상 반응기 시스템 |
KR20200143254A (ko) | 2019-06-11 | 2020-12-23 | 에이에스엠 아이피 홀딩 비.브이. | 개질 가스를 사용하여 전자 구조를 형성하는 방법, 상기 방법을 수행하기 위한 시스템, 및 상기 방법을 사용하여 형성되는 구조 |
USD944946S1 (en) | 2019-06-14 | 2022-03-01 | Asm Ip Holding B.V. | Shower plate |
USD931978S1 (en) | 2019-06-27 | 2021-09-28 | Asm Ip Holding B.V. | Showerhead vacuum transport |
KR20210005515A (ko) | 2019-07-03 | 2021-01-14 | 에이에스엠 아이피 홀딩 비.브이. | 기판 처리 장치용 온도 제어 조립체 및 이를 사용하는 방법 |
JP7499079B2 (ja) | 2019-07-09 | 2024-06-13 | エーエスエム・アイピー・ホールディング・ベー・フェー | 同軸導波管を用いたプラズマ装置、基板処理方法 |
CN112216646A (zh) | 2019-07-10 | 2021-01-12 | Asm Ip私人控股有限公司 | 基板支撑组件及包括其的基板处理装置 |
KR20210010307A (ko) | 2019-07-16 | 2021-01-27 | 에이에스엠 아이피 홀딩 비.브이. | 기판 처리 장치 |
KR20210010816A (ko) | 2019-07-17 | 2021-01-28 | 에이에스엠 아이피 홀딩 비.브이. | 라디칼 보조 점화 플라즈마 시스템 및 방법 |
KR20210010820A (ko) | 2019-07-17 | 2021-01-28 | 에이에스엠 아이피 홀딩 비.브이. | 실리콘 게르마늄 구조를 형성하는 방법 |
US11643724B2 (en) | 2019-07-18 | 2023-05-09 | Asm Ip Holding B.V. | Method of forming structures using a neutral beam |
KR20210010817A (ko) | 2019-07-19 | 2021-01-28 | 에이에스엠 아이피 홀딩 비.브이. | 토폴로지-제어된 비정질 탄소 중합체 막을 형성하는 방법 |
TWI839544B (zh) | 2019-07-19 | 2024-04-21 | 荷蘭商Asm Ip私人控股有限公司 | 形成形貌受控的非晶碳聚合物膜之方法 |
CN112309843A (zh) | 2019-07-29 | 2021-02-02 | Asm Ip私人控股有限公司 | 实现高掺杂剂掺入的选择性沉积方法 |
CN112309899A (zh) | 2019-07-30 | 2021-02-02 | Asm Ip私人控股有限公司 | 基板处理设备 |
CN112309900A (zh) | 2019-07-30 | 2021-02-02 | Asm Ip私人控股有限公司 | 基板处理设备 |
US11227782B2 (en) | 2019-07-31 | 2022-01-18 | Asm Ip Holding B.V. | Vertical batch furnace assembly |
US11587814B2 (en) | 2019-07-31 | 2023-02-21 | Asm Ip Holding B.V. | Vertical batch furnace assembly |
US11587815B2 (en) | 2019-07-31 | 2023-02-21 | Asm Ip Holding B.V. | Vertical batch furnace assembly |
CN118422165A (zh) | 2019-08-05 | 2024-08-02 | Asm Ip私人控股有限公司 | 用于化学源容器的液位传感器 |
USD965524S1 (en) | 2019-08-19 | 2022-10-04 | Asm Ip Holding B.V. | Susceptor support |
USD965044S1 (en) | 2019-08-19 | 2022-09-27 | Asm Ip Holding B.V. | Susceptor shaft |
JP2021031769A (ja) | 2019-08-21 | 2021-03-01 | エーエスエム アイピー ホールディング ビー.ブイ. | 成膜原料混合ガス生成装置及び成膜装置 |
USD979506S1 (en) | 2019-08-22 | 2023-02-28 | Asm Ip Holding B.V. | Insulator |
KR20210024423A (ko) | 2019-08-22 | 2021-03-05 | 에이에스엠 아이피 홀딩 비.브이. | 홀을 구비한 구조체를 형성하기 위한 방법 |
USD930782S1 (en) | 2019-08-22 | 2021-09-14 | Asm Ip Holding B.V. | Gas distributor |
USD949319S1 (en) | 2019-08-22 | 2022-04-19 | Asm Ip Holding B.V. | Exhaust duct |
USD940837S1 (en) | 2019-08-22 | 2022-01-11 | Asm Ip Holding B.V. | Electrode |
KR20210024420A (ko) | 2019-08-23 | 2021-03-05 | 에이에스엠 아이피 홀딩 비.브이. | 비스(디에틸아미노)실란을 사용하여 peald에 의해 개선된 품질을 갖는 실리콘 산화물 막을 증착하기 위한 방법 |
US11286558B2 (en) | 2019-08-23 | 2022-03-29 | Asm Ip Holding B.V. | Methods for depositing a molybdenum nitride film on a surface of a substrate by a cyclical deposition process and related semiconductor device structures including a molybdenum nitride film |
KR20210029090A (ko) | 2019-09-04 | 2021-03-15 | 에이에스엠 아이피 홀딩 비.브이. | 희생 캡핑 층을 이용한 선택적 증착 방법 |
KR20210029663A (ko) | 2019-09-05 | 2021-03-16 | 에이에스엠 아이피 홀딩 비.브이. | 기판 처리 장치 |
US11562901B2 (en) | 2019-09-25 | 2023-01-24 | Asm Ip Holding B.V. | Substrate processing method |
CN112593212B (zh) | 2019-10-02 | 2023-12-22 | Asm Ip私人控股有限公司 | 通过循环等离子体增强沉积工艺形成拓扑选择性氧化硅膜的方法 |
TWI846953B (zh) | 2019-10-08 | 2024-07-01 | 荷蘭商Asm Ip私人控股有限公司 | 基板處理裝置 |
KR20210042810A (ko) | 2019-10-08 | 2021-04-20 | 에이에스엠 아이피 홀딩 비.브이. | 활성 종을 이용하기 위한 가스 분배 어셈블리를 포함한 반응기 시스템 및 이를 사용하는 방법 |
KR20210043460A (ko) | 2019-10-10 | 2021-04-21 | 에이에스엠 아이피 홀딩 비.브이. | 포토레지스트 하부층을 형성하기 위한 방법 및 이를 포함한 구조체 |
US12009241B2 (en) | 2019-10-14 | 2024-06-11 | Asm Ip Holding B.V. | Vertical batch furnace assembly with detector to detect cassette |
TWI834919B (zh) | 2019-10-16 | 2024-03-11 | 荷蘭商Asm Ip私人控股有限公司 | 氧化矽之拓撲選擇性膜形成之方法 |
US11637014B2 (en) | 2019-10-17 | 2023-04-25 | Asm Ip Holding B.V. | Methods for selective deposition of doped semiconductor material |
KR20210047808A (ko) | 2019-10-21 | 2021-04-30 | 에이에스엠 아이피 홀딩 비.브이. | 막을 선택적으로 에칭하기 위한 장치 및 방법 |
KR20210050453A (ko) | 2019-10-25 | 2021-05-07 | 에이에스엠 아이피 홀딩 비.브이. | 기판 표면 상의 갭 피처를 충진하는 방법 및 이와 관련된 반도체 소자 구조 |
US11646205B2 (en) | 2019-10-29 | 2023-05-09 | Asm Ip Holding B.V. | Methods of selectively forming n-type doped material on a surface, systems for selectively forming n-type doped material, and structures formed using same |
KR20210054983A (ko) | 2019-11-05 | 2021-05-14 | 에이에스엠 아이피 홀딩 비.브이. | 도핑된 반도체 층을 갖는 구조체 및 이를 형성하기 위한 방법 및 시스템 |
US11501968B2 (en) | 2019-11-15 | 2022-11-15 | Asm Ip Holding B.V. | Method for providing a semiconductor device with silicon filled gaps |
KR20210062561A (ko) | 2019-11-20 | 2021-05-31 | 에이에스엠 아이피 홀딩 비.브이. | 기판의 표면 상에 탄소 함유 물질을 증착하는 방법, 상기 방법을 사용하여 형성된 구조물, 및 상기 구조물을 형성하기 위한 시스템 |
CN112951697A (zh) | 2019-11-26 | 2021-06-11 | Asm Ip私人控股有限公司 | 基板处理设备 |
KR20210065848A (ko) | 2019-11-26 | 2021-06-04 | 에이에스엠 아이피 홀딩 비.브이. | 제1 유전체 표면과 제2 금속성 표면을 포함한 기판 상에 타겟 막을 선택적으로 형성하기 위한 방법 |
CN112885692A (zh) | 2019-11-29 | 2021-06-01 | Asm Ip私人控股有限公司 | 基板处理设备 |
CN112885693A (zh) | 2019-11-29 | 2021-06-01 | Asm Ip私人控股有限公司 | 基板处理设备 |
JP7527928B2 (ja) | 2019-12-02 | 2024-08-05 | エーエスエム・アイピー・ホールディング・ベー・フェー | 基板処理装置、基板処理方法 |
KR20210070898A (ko) | 2019-12-04 | 2021-06-15 | 에이에스엠 아이피 홀딩 비.브이. | 기판 처리 장치 |
TW202125596A (zh) | 2019-12-17 | 2021-07-01 | 荷蘭商Asm Ip私人控股有限公司 | 形成氮化釩層之方法以及包括該氮化釩層之結構 |
US11527403B2 (en) | 2019-12-19 | 2022-12-13 | Asm Ip Holding B.V. | Methods for filling a gap feature on a substrate surface and related semiconductor structures |
KR20210089079A (ko) | 2020-01-06 | 2021-07-15 | 에이에스엠 아이피 홀딩 비.브이. | 채널형 리프트 핀 |
TW202140135A (zh) | 2020-01-06 | 2021-11-01 | 荷蘭商Asm Ip私人控股有限公司 | 氣體供應總成以及閥板總成 |
US11993847B2 (en) | 2020-01-08 | 2024-05-28 | Asm Ip Holding B.V. | Injector |
KR102675856B1 (ko) | 2020-01-20 | 2024-06-17 | 에이에스엠 아이피 홀딩 비.브이. | 박막 형성 방법 및 박막 표면 개질 방법 |
TW202130846A (zh) | 2020-02-03 | 2021-08-16 | 荷蘭商Asm Ip私人控股有限公司 | 形成包括釩或銦層的結構之方法 |
TW202146882A (zh) | 2020-02-04 | 2021-12-16 | 荷蘭商Asm Ip私人控股有限公司 | 驗證一物品之方法、用於驗證一物品之設備、及用於驗證一反應室之系統 |
US11776846B2 (en) | 2020-02-07 | 2023-10-03 | Asm Ip Holding B.V. | Methods for depositing gap filling fluids and related systems and devices |
US11781243B2 (en) | 2020-02-17 | 2023-10-10 | Asm Ip Holding B.V. | Method for depositing low temperature phosphorous-doped silicon |
TW202203344A (zh) | 2020-02-28 | 2022-01-16 | 荷蘭商Asm Ip控股公司 | 專用於零件清潔的系統 |
KR20210116240A (ko) | 2020-03-11 | 2021-09-27 | 에이에스엠 아이피 홀딩 비.브이. | 조절성 접합부를 갖는 기판 핸들링 장치 |
KR20210116249A (ko) | 2020-03-11 | 2021-09-27 | 에이에스엠 아이피 홀딩 비.브이. | 록아웃 태그아웃 어셈블리 및 시스템 그리고 이의 사용 방법 |
CN113394086A (zh) | 2020-03-12 | 2021-09-14 | Asm Ip私人控股有限公司 | 用于制造具有目标拓扑轮廓的层结构的方法 |
KR20210124042A (ko) | 2020-04-02 | 2021-10-14 | 에이에스엠 아이피 홀딩 비.브이. | 박막 형성 방법 |
TW202146689A (zh) | 2020-04-03 | 2021-12-16 | 荷蘭商Asm Ip控股公司 | 阻障層形成方法及半導體裝置的製造方法 |
TW202145344A (zh) | 2020-04-08 | 2021-12-01 | 荷蘭商Asm Ip私人控股有限公司 | 用於選擇性蝕刻氧化矽膜之設備及方法 |
US11821078B2 (en) | 2020-04-15 | 2023-11-21 | Asm Ip Holding B.V. | Method for forming precoat film and method for forming silicon-containing film |
KR20210128343A (ko) | 2020-04-15 | 2021-10-26 | 에이에스엠 아이피 홀딩 비.브이. | 크롬 나이트라이드 층을 형성하는 방법 및 크롬 나이트라이드 층을 포함하는 구조 |
US11996289B2 (en) | 2020-04-16 | 2024-05-28 | Asm Ip Holding B.V. | Methods of forming structures including silicon germanium and silicon layers, devices formed using the methods, and systems for performing the methods |
TW202146831A (zh) | 2020-04-24 | 2021-12-16 | 荷蘭商Asm Ip私人控股有限公司 | 垂直批式熔爐總成、及用於冷卻垂直批式熔爐之方法 |
KR20210132600A (ko) | 2020-04-24 | 2021-11-04 | 에이에스엠 아이피 홀딩 비.브이. | 바나듐, 질소 및 추가 원소를 포함한 층을 증착하기 위한 방법 및 시스템 |
JP2021172884A (ja) | 2020-04-24 | 2021-11-01 | エーエスエム・アイピー・ホールディング・ベー・フェー | 窒化バナジウム含有層を形成する方法および窒化バナジウム含有層を含む構造体 |
KR20210134226A (ko) | 2020-04-29 | 2021-11-09 | 에이에스엠 아이피 홀딩 비.브이. | 고체 소스 전구체 용기 |
KR20210134869A (ko) | 2020-05-01 | 2021-11-11 | 에이에스엠 아이피 홀딩 비.브이. | Foup 핸들러를 이용한 foup의 빠른 교환 |
TW202147543A (zh) | 2020-05-04 | 2021-12-16 | 荷蘭商Asm Ip私人控股有限公司 | 半導體處理系統 |
KR20210141379A (ko) | 2020-05-13 | 2021-11-23 | 에이에스엠 아이피 홀딩 비.브이. | 반응기 시스템용 레이저 정렬 고정구 |
TW202146699A (zh) | 2020-05-15 | 2021-12-16 | 荷蘭商Asm Ip私人控股有限公司 | 形成矽鍺層之方法、半導體結構、半導體裝置、形成沉積層之方法、及沉積系統 |
KR20210143653A (ko) | 2020-05-19 | 2021-11-29 | 에이에스엠 아이피 홀딩 비.브이. | 기판 처리 장치 |
KR20210145078A (ko) | 2020-05-21 | 2021-12-01 | 에이에스엠 아이피 홀딩 비.브이. | 다수의 탄소 층을 포함한 구조체 및 이를 형성하고 사용하는 방법 |
KR102702526B1 (ko) | 2020-05-22 | 2024-09-03 | 에이에스엠 아이피 홀딩 비.브이. | 과산화수소를 사용하여 박막을 증착하기 위한 장치 |
TW202201602A (zh) | 2020-05-29 | 2022-01-01 | 荷蘭商Asm Ip私人控股有限公司 | 基板處理方法 |
TW202212620A (zh) | 2020-06-02 | 2022-04-01 | 荷蘭商Asm Ip私人控股有限公司 | 處理基板之設備、形成膜之方法、及控制用於處理基板之設備之方法 |
TW202218133A (zh) | 2020-06-24 | 2022-05-01 | 荷蘭商Asm Ip私人控股有限公司 | 形成含矽層之方法 |
TW202217953A (zh) | 2020-06-30 | 2022-05-01 | 荷蘭商Asm Ip私人控股有限公司 | 基板處理方法 |
KR102707957B1 (ko) | 2020-07-08 | 2024-09-19 | 에이에스엠 아이피 홀딩 비.브이. | 기판 처리 방법 |
TW202219628A (zh) | 2020-07-17 | 2022-05-16 | 荷蘭商Asm Ip私人控股有限公司 | 用於光微影之結構與方法 |
TW202204662A (zh) | 2020-07-20 | 2022-02-01 | 荷蘭商Asm Ip私人控股有限公司 | 用於沉積鉬層之方法及系統 |
US12040177B2 (en) | 2020-08-18 | 2024-07-16 | Asm Ip Holding B.V. | Methods for forming a laminate film by cyclical plasma-enhanced deposition processes |
KR20220027026A (ko) | 2020-08-26 | 2022-03-07 | 에이에스엠 아이피 홀딩 비.브이. | 금속 실리콘 산화물 및 금속 실리콘 산질화물 층을 형성하기 위한 방법 및 시스템 |
TW202229601A (zh) | 2020-08-27 | 2022-08-01 | 荷蘭商Asm Ip私人控股有限公司 | 形成圖案化結構的方法、操控機械特性的方法、裝置結構、及基板處理系統 |
USD990534S1 (en) | 2020-09-11 | 2023-06-27 | Asm Ip Holding B.V. | Weighted lift pin |
USD1012873S1 (en) | 2020-09-24 | 2024-01-30 | Asm Ip Holding B.V. | Electrode for semiconductor processing apparatus |
US12009224B2 (en) | 2020-09-29 | 2024-06-11 | Asm Ip Holding B.V. | Apparatus and method for etching metal nitrides |
KR20220045900A (ko) | 2020-10-06 | 2022-04-13 | 에이에스엠 아이피 홀딩 비.브이. | 실리콘 함유 재료를 증착하기 위한 증착 방법 및 장치 |
CN114293174A (zh) | 2020-10-07 | 2022-04-08 | Asm Ip私人控股有限公司 | 气体供应单元和包括气体供应单元的衬底处理设备 |
TW202229613A (zh) | 2020-10-14 | 2022-08-01 | 荷蘭商Asm Ip私人控股有限公司 | 於階梯式結構上沉積材料的方法 |
KR20220053482A (ko) | 2020-10-22 | 2022-04-29 | 에이에스엠 아이피 홀딩 비.브이. | 바나듐 금속을 증착하는 방법, 구조체, 소자 및 증착 어셈블리 |
TW202223136A (zh) | 2020-10-28 | 2022-06-16 | 荷蘭商Asm Ip私人控股有限公司 | 用於在基板上形成層之方法、及半導體處理系統 |
TW202235649A (zh) | 2020-11-24 | 2022-09-16 | 荷蘭商Asm Ip私人控股有限公司 | 填充間隙之方法與相關之系統及裝置 |
TW202235675A (zh) | 2020-11-30 | 2022-09-16 | 荷蘭商Asm Ip私人控股有限公司 | 注入器、及基板處理設備 |
US11946137B2 (en) | 2020-12-16 | 2024-04-02 | Asm Ip Holding B.V. | Runout and wobble measurement fixtures |
TW202231903A (zh) | 2020-12-22 | 2022-08-16 | 荷蘭商Asm Ip私人控股有限公司 | 過渡金屬沉積方法、過渡金屬層、用於沉積過渡金屬於基板上的沉積總成 |
USD1023959S1 (en) | 2021-05-11 | 2024-04-23 | Asm Ip Holding B.V. | Electrode for substrate processing apparatus |
USD981973S1 (en) | 2021-05-11 | 2023-03-28 | Asm Ip Holding B.V. | Reactor wall for substrate processing apparatus |
USD980814S1 (en) | 2021-05-11 | 2023-03-14 | Asm Ip Holding B.V. | Gas distributor for substrate processing apparatus |
USD980813S1 (en) | 2021-05-11 | 2023-03-14 | Asm Ip Holding B.V. | Gas flow control plate for substrate processing apparatus |
USD990441S1 (en) | 2021-09-07 | 2023-06-27 | Asm Ip Holding B.V. | Gas flow control plate |
Family Cites Families (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US1022399A (en) * | 1911-08-18 | 1912-04-09 | Joseph T Thomasson | Animal-shoeing apparatus. |
CH451374A (de) * | 1963-12-31 | 1968-05-15 | Philips Nv | Leuchtstoff |
JPS5915951B2 (ja) * | 1974-12-10 | 1984-04-12 | 松下電器産業株式会社 | ディスプレイ用真空紫外線励起螢光体装置 |
JPS5941474B2 (ja) * | 1976-04-30 | 1984-10-06 | 大日本塗料株式会社 | 気体放電発光素子 |
US4161457A (en) * | 1977-03-15 | 1979-07-17 | Dai Nippon Toryo Co., Ltd. | Process for preparing a divalent europium activated alkaline earth metal aluminate phosphor |
US4423349A (en) * | 1980-07-16 | 1983-12-27 | Nichia Denshi Kagaku Co., Ltd. | Green fluorescence-emitting material and a fluorescent lamp provided therewith |
EP0062993A1 (en) * | 1981-04-09 | 1982-10-20 | The Secretary of State for Defence in Her Britannic Majesty's Government of the United Kingdom of Great Britain and | Cathode ray tube phosphor layers |
JPS5813688A (ja) * | 1981-07-20 | 1983-01-26 | Mitsubishi Chem Ind Ltd | 螢光体の製造方法 |
JPS5834560A (ja) * | 1981-08-21 | 1983-03-01 | 周 成祥 | 放電灯ディスプレイ装置 |
CA1198148A (en) * | 1982-06-28 | 1985-12-17 | E. I. Du Pont De Nemours And Company | Electrostatic printing process |
US4583026A (en) * | 1983-07-19 | 1986-04-15 | Mitsubishi Denki Kabushiki Kaisha | Low-pressure mercury vapor discharge lamp |
JPS6155839A (ja) * | 1984-08-26 | 1986-03-20 | Osamu Tada | 螢光ランプの製造方法 |
JPH079795B2 (ja) * | 1986-12-01 | 1995-02-01 | 東芝ライテック株式会社 | 放電ランプ |
AU607520B2 (en) * | 1987-08-06 | 1991-03-07 | Shing Cheung Chow | Discharge lamp type display device |
EP0331738B1 (en) * | 1987-08-10 | 1996-11-27 | Mitsubishi Denki Kabushiki Kaisha | Green light emitting rare gas discharge lamp |
CH675504A5 (ja) * | 1988-01-15 | 1990-09-28 | Asea Brown Boveri | |
JPH02135277A (ja) * | 1988-11-17 | 1990-05-24 | Sanyo Electric Co Ltd | 蛍光ランプ |
US5117160C1 (en) * | 1989-06-23 | 2001-07-31 | Nec Corp | Rare gas discharge lamp |
JP2671575B2 (ja) * | 1989-11-22 | 1997-10-29 | 日本電気株式会社 | ガス放電表示素子の駆動方法 |
KR930005688B1 (ko) * | 1990-02-06 | 1993-06-24 | 삼성전관 주식회사 | 녹색 발광 형광체 |
FR2672281B1 (fr) * | 1991-02-04 | 1993-04-16 | Rhone Poulenc Chimie | Phosphate mixte de lanthane, terbium et cerium, procede de fabrication de celui-ci. |
US5047173A (en) * | 1991-03-08 | 1991-09-10 | Gte Products Corporation | Method of reducing the powder weight of europium activated strontium tetraborate phosphor |
KR930008163B1 (ko) * | 1991-04-02 | 1993-08-26 | 삼성전관 주식회사 | 방전관 |
DE4209763A1 (de) * | 1991-06-18 | 1992-12-24 | Hartmut Dipl Phys Schmidt | Elektronisch betriebene kompaktleuchtstofflampe |
US5132043A (en) * | 1991-12-24 | 1992-07-21 | Gte Products Corporation | Method of preparing small particle size borate phosphor |
US5436532A (en) * | 1993-03-26 | 1995-07-25 | Rockwell International Corporation | Fluorescent lamp with improved efficiency |
-
1993
- 1993-04-05 DE DE4311197A patent/DE4311197A1/de not_active Withdrawn
-
1994
- 1994-04-05 US US08/491,872 patent/US5604410A/en not_active Expired - Lifetime
- 1994-04-05 DE DE59410414T patent/DE59410414D1/de not_active Expired - Lifetime
- 1994-04-05 CN CN94191696A patent/CN1066854C/zh not_active Expired - Lifetime
- 1994-04-05 WO PCT/DE1994/000382 patent/WO1994022975A1/de active IP Right Grant
- 1994-04-05 EP EP00121142A patent/EP1078972B1/de not_active Expired - Lifetime
- 1994-04-05 EP EP94911105A patent/EP0738311B1/de not_active Expired - Lifetime
- 1994-04-05 CZ CZ19952421A patent/CZ286740B6/cs not_active IP Right Cessation
- 1994-04-05 JP JP52154594A patent/JP3298886B2/ja not_active Expired - Lifetime
- 1994-04-05 DE DE59410196T patent/DE59410196D1/de not_active Expired - Lifetime
- 1994-04-05 KR KR1019950704400A patent/KR100299151B1/ko not_active IP Right Cessation
- 1994-04-05 US US08/525,757 patent/US5714835A/en not_active Expired - Lifetime
- 1994-04-05 DE DE59410172T patent/DE59410172D1/de not_active Expired - Lifetime
- 1994-04-05 WO PCT/DE1994/000380 patent/WO1994023442A1/de active IP Right Grant
- 1994-04-05 JP JP52154694A patent/JP3714952B2/ja not_active Expired - Fee Related
- 1994-04-05 DE DE59405921T patent/DE59405921D1/de not_active Expired - Lifetime
- 1994-04-05 EP EP94911103A patent/EP0733266B1/de not_active Expired - Lifetime
- 1994-04-05 HU HU9502905A patent/HU215307B/hu unknown
- 1994-04-05 EP EP00124154A patent/EP1076084B1/de not_active Expired - Lifetime
- 1994-04-05 CA CA002155340A patent/CA2155340C/en not_active Expired - Lifetime
- 1994-04-05 CA CA002159906A patent/CA2159906C/en not_active Expired - Lifetime
-
2001
- 2001-11-13 JP JP2001347842A patent/JP3715231B2/ja not_active Expired - Lifetime
-
2004
- 2004-06-01 JP JP2004162737A patent/JP2004296446A/ja not_active Withdrawn
- 2004-06-01 JP JP2004162736A patent/JP2004303737A/ja active Pending
-
2005
- 2005-06-07 JP JP2005166606A patent/JP2005276846A/ja active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008153234A (ja) * | 2008-02-18 | 2008-07-03 | Sharp Corp | 照明装置および液晶表示装置 |
JP4668287B2 (ja) * | 2008-02-18 | 2011-04-13 | シャープ株式会社 | 照明装置および液晶表示装置 |
JP2013034989A (ja) * | 2011-07-13 | 2013-02-21 | Gs Yuasa Corp | 紫外線照射装置 |
Also Published As
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPH08508363A (ja) | インコヒーレント放出放射源の作動方法 | |
CA2157208C (en) | Neon fluorescent lamp and method of operating | |
US5965988A (en) | Discharge lamp with galvanic and dielectric electrodes and method | |
US7855497B2 (en) | Dielectric barrier discharge lamp comprising an UV-B phosphor | |
EP1532224B1 (en) | Device for generating radiation | |
JP2004269845A (ja) | 蛍光灯用途の青−緑蛍光体 | |
JP5137391B2 (ja) | 誘電体バリア放電ランプ | |
US6034471A (en) | Neon gas discharge lamp providing white light with improved phosphor | |
JP5850539B2 (ja) | 放電ランプ、使用方法及びシステム | |
JPS5916707B2 (ja) | 高圧水銀けい光ランプ | |
US5565741A (en) | Method of operating a neon discharge lamp particularly useful on a vehicle | |
US6130511A (en) | Neon discharge lamp for generating amber light | |
CA2294850C (en) | Discharge lamp having dielectrically impeded electrodes | |
US5637965A (en) | Low pressure sodium-mercury lamp yielding substantially white light | |
JPH0785843A (ja) | 可変光色蛍光ランプ及びその点灯方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20080419 Year of fee payment: 6 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20090419 Year of fee payment: 7 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100419 Year of fee payment: 8 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110419 Year of fee payment: 9 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120419 Year of fee payment: 10 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120419 Year of fee payment: 10 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130419 Year of fee payment: 11 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130419 Year of fee payment: 11 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20140419 Year of fee payment: 12 |
|
EXPY | Cancellation because of completion of term |