JP4149637B2 - 半導体装置 - Google Patents
半導体装置 Download PDFInfo
- Publication number
- JP4149637B2 JP4149637B2 JP2000154983A JP2000154983A JP4149637B2 JP 4149637 B2 JP4149637 B2 JP 4149637B2 JP 2000154983 A JP2000154983 A JP 2000154983A JP 2000154983 A JP2000154983 A JP 2000154983A JP 4149637 B2 JP4149637 B2 JP 4149637B2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- circuit
- node
- output
- short
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/145—Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/12—Programming voltage switching circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/30—Power supply circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/147—Voltage reference generators, voltage or current regulators; Internally lowered supply levels; Compensation for voltage drops
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Read Only Memory (AREA)
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
- Power Sources (AREA)
Priority Applications (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000154983A JP4149637B2 (ja) | 2000-05-25 | 2000-05-25 | 半導体装置 |
| US09/864,181 US6487120B2 (en) | 2000-05-25 | 2001-05-25 | Boosted voltage generating circuit and semiconductor memory device having the same |
| EP01112062A EP1158524A1 (en) | 2000-05-25 | 2001-05-25 | Semiconductor memory device having a boosted voltage generating circuit |
| US10/265,727 US6605986B2 (en) | 2000-05-25 | 2002-10-08 | Boosted voltage generating circuit and semiconductor memory device having the same |
| US10/464,462 US6771547B2 (en) | 2000-05-25 | 2003-06-19 | Boosted voltage generating circuit and semiconductor memory device having the same |
| US10/866,131 US6996024B2 (en) | 2000-05-25 | 2004-06-14 | Boosted voltage generating circuit and semiconductor memory device having the same |
| US11/269,696 US7203120B2 (en) | 2000-05-25 | 2005-11-09 | Boosted voltage generating circuit and semiconductor memory device having the same |
| US11/269,697 US7180796B2 (en) | 2000-05-25 | 2005-11-09 | Boosted voltage generating circuit and semiconductor memory device having the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000154983A JP4149637B2 (ja) | 2000-05-25 | 2000-05-25 | 半導体装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2001338493A JP2001338493A (ja) | 2001-12-07 |
| JP2001338493A5 JP2001338493A5 (enExample) | 2005-08-25 |
| JP4149637B2 true JP4149637B2 (ja) | 2008-09-10 |
Family
ID=18659994
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000154983A Expired - Fee Related JP4149637B2 (ja) | 2000-05-25 | 2000-05-25 | 半導体装置 |
Country Status (3)
| Country | Link |
|---|---|
| US (6) | US6487120B2 (enExample) |
| EP (1) | EP1158524A1 (enExample) |
| JP (1) | JP4149637B2 (enExample) |
Families Citing this family (72)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4149637B2 (ja) * | 2000-05-25 | 2008-09-10 | 株式会社東芝 | 半導体装置 |
| DE10108980A1 (de) * | 2001-02-23 | 2002-09-12 | Koninkl Philips Electronics Nv | Anordnung zur Ansteuerung von Anzeigeeinheiten mit adaptiver Startsequenz |
| JP2003208794A (ja) * | 2002-01-10 | 2003-07-25 | Seiko Epson Corp | 不揮発性半導体記憶装置 |
| US6876582B2 (en) * | 2002-05-24 | 2005-04-05 | Hynix Semiconductor, Inc. | Flash memory cell erase scheme using both source and channel regions |
| US6937517B2 (en) * | 2002-07-18 | 2005-08-30 | Micron Technology, Inc. | Clock regulation scheme for varying loads |
| JP2004063019A (ja) * | 2002-07-30 | 2004-02-26 | Renesas Technology Corp | 内部電圧発生回路 |
| JP4230997B2 (ja) * | 2002-08-09 | 2009-02-25 | 株式会社ルネサステクノロジ | 半導体装置およびそれを用いたメモリカード |
| US6842380B2 (en) * | 2002-08-27 | 2005-01-11 | Micron Technology, Inc. | Method and apparatus for erasing memory |
| DE10248498A1 (de) * | 2002-10-17 | 2004-05-06 | Infineon Technologies Ag | Schaltungsanordnung zur Spannungsregelung |
| CN100423421C (zh) * | 2003-05-13 | 2008-10-01 | 富士通株式会社 | 半导体集成电路装置 |
| JP4318511B2 (ja) * | 2003-08-26 | 2009-08-26 | 三洋電機株式会社 | 昇圧回路 |
| US7095653B2 (en) * | 2003-10-08 | 2006-08-22 | Micron Technology, Inc. | Common wordline flash array architecture |
| ITRM20030512A1 (it) * | 2003-11-05 | 2005-05-06 | St Microelectronics Srl | Circuito a pompa di carica a basso tempo di assestamento |
| KR100572323B1 (ko) * | 2003-12-11 | 2006-04-19 | 삼성전자주식회사 | 멀티레벨 고전압 발생장치 |
| JP2005222580A (ja) * | 2004-02-03 | 2005-08-18 | Renesas Technology Corp | 半導体記憶装置 |
| JP4426361B2 (ja) * | 2004-03-31 | 2010-03-03 | パナソニック株式会社 | 不揮発性半導体記憶装置 |
| KR100562654B1 (ko) * | 2004-04-20 | 2006-03-20 | 주식회사 하이닉스반도체 | 균등화신호(bleq) 구동회로 및 이를 사용한 반도체메모리 소자 |
| JP2006031801A (ja) * | 2004-07-14 | 2006-02-02 | Nec Electronics Corp | 電位切換回路,それを備えたフラッシュメモリ,及び電位切換方法 |
| US7038954B2 (en) * | 2004-08-30 | 2006-05-02 | Micron Technology, Inc. | Apparatus with equalizing voltage generation circuit and methods of use |
| US7154794B2 (en) * | 2004-10-08 | 2006-12-26 | Lexmark International, Inc. | Memory regulator system with test mode |
| FR2878986B1 (fr) * | 2004-12-08 | 2007-04-27 | Atmel Corp | Principe de regulation de puissance d'une sortie a haute tension dans des dispositifs de circuits integres |
| JP4587804B2 (ja) * | 2004-12-22 | 2010-11-24 | 株式会社リコー | ボルテージレギュレータ回路 |
| US7266018B2 (en) * | 2005-04-11 | 2007-09-04 | Intel Corporation | Reducing sneak currents in virtual ground memory arrays |
| KR100697284B1 (ko) * | 2005-05-02 | 2007-03-20 | 삼성전자주식회사 | 플래시 메모리 장치 및 그것의 프로그램 방법 |
| KR100680441B1 (ko) * | 2005-06-07 | 2007-02-08 | 주식회사 하이닉스반도체 | 안정적인 승압 전압을 발생하는 승압 전압 발생기 |
| JP4927356B2 (ja) * | 2005-07-11 | 2012-05-09 | エルピーダメモリ株式会社 | 半導体装置 |
| JPWO2007043095A1 (ja) | 2005-09-30 | 2009-04-16 | スパンション エルエルシー | 記憶装置、および記憶装置の制御方法 |
| KR100729353B1 (ko) | 2005-11-22 | 2007-06-15 | 삼성전자주식회사 | 통합된 레귤레이터/펌프 구조를 갖는 플래시 메모리 장치 |
| US20070126494A1 (en) * | 2005-12-06 | 2007-06-07 | Sandisk Corporation | Charge pump having shunt diode for improved operating efficiency |
| US7372320B2 (en) * | 2005-12-16 | 2008-05-13 | Sandisk Corporation | Voltage regulation with active supplemental current for output stabilization |
| US20070139099A1 (en) * | 2005-12-16 | 2007-06-21 | Sandisk Corporation | Charge pump regulation control for improved power efficiency |
| JP4841282B2 (ja) * | 2006-03-24 | 2011-12-21 | 富士通セミコンダクター株式会社 | 電源装置の制御回路、電源装置、およびその制御方法 |
| US20070229149A1 (en) * | 2006-03-30 | 2007-10-04 | Sandisk Corporation | Voltage regulator having high voltage protection |
| US7606075B2 (en) * | 2006-04-19 | 2009-10-20 | Micron Technology, Inc. | Read operation for NAND memory |
| JP4843376B2 (ja) * | 2006-05-17 | 2011-12-21 | 株式会社東芝 | 電源回路 |
| KR100733953B1 (ko) | 2006-06-15 | 2007-06-29 | 삼성전자주식회사 | 플래시 메모리 장치의 전압 레귤레이터 |
| US7626866B2 (en) * | 2006-07-28 | 2009-12-01 | Micron Technology, Inc. | NAND flash memory programming |
| US7554311B2 (en) * | 2006-07-31 | 2009-06-30 | Sandisk Corporation | Hybrid charge pump regulation |
| US7461106B2 (en) * | 2006-09-12 | 2008-12-02 | Motorola, Inc. | Apparatus and method for low complexity combinatorial coding of signals |
| US7368979B2 (en) | 2006-09-19 | 2008-05-06 | Sandisk Corporation | Implementation of output floating scheme for hv charge pumps |
| JP4956218B2 (ja) * | 2007-02-15 | 2012-06-20 | 株式会社東芝 | 不揮発性半導体記憶装置 |
| CN101641777B (zh) * | 2007-03-29 | 2012-05-23 | 富士通株式会社 | 半导体装置及偏压产生电路 |
| US7489554B2 (en) * | 2007-04-05 | 2009-02-10 | Sandisk Corporation | Method for current sensing with biasing of source and P-well in non-volatile storage |
| JP2008269727A (ja) * | 2007-04-24 | 2008-11-06 | Matsushita Electric Ind Co Ltd | 昇圧回路、半導体記憶装置およびその駆動方法 |
| US8576096B2 (en) * | 2007-10-11 | 2013-11-05 | Motorola Mobility Llc | Apparatus and method for low complexity combinatorial coding of signals |
| US8209190B2 (en) * | 2007-10-25 | 2012-06-26 | Motorola Mobility, Inc. | Method and apparatus for generating an enhancement layer within an audio coding system |
| JP5367977B2 (ja) * | 2007-12-12 | 2013-12-11 | セイコーインスツル株式会社 | 不揮発性半導体記憶装置およびその書き込み方法と読み出し方法 |
| JP2009163782A (ja) | 2007-12-13 | 2009-07-23 | Toshiba Corp | 半導体記憶装置 |
| US7995392B2 (en) | 2007-12-13 | 2011-08-09 | Kabushiki Kaisha Toshiba | Semiconductor memory device capable of shortening erase time |
| US7916544B2 (en) | 2008-01-25 | 2011-03-29 | Micron Technology, Inc. | Random telegraph signal noise reduction scheme for semiconductor memories |
| US7839689B2 (en) | 2008-01-31 | 2010-11-23 | Mosaid Technologies Incorporated | Power supplies in flash memory devices and systems |
| KR100894490B1 (ko) * | 2008-03-03 | 2009-04-22 | 주식회사 하이닉스반도체 | 반도체 메모리장치의 내부전압 생성회로 |
| US7889103B2 (en) * | 2008-03-13 | 2011-02-15 | Motorola Mobility, Inc. | Method and apparatus for low complexity combinatorial coding of signals |
| US20090234642A1 (en) * | 2008-03-13 | 2009-09-17 | Motorola, Inc. | Method and Apparatus for Low Complexity Combinatorial Coding of Signals |
| JP5011182B2 (ja) * | 2008-03-24 | 2012-08-29 | ルネサスエレクトロニクス株式会社 | チャージポンプ回路 |
| US8639519B2 (en) * | 2008-04-09 | 2014-01-28 | Motorola Mobility Llc | Method and apparatus for selective signal coding based on core encoder performance |
| JP2010124590A (ja) * | 2008-11-19 | 2010-06-03 | Seiko Instruments Inc | 昇圧回路 |
| US20100148840A1 (en) * | 2008-12-16 | 2010-06-17 | Siyou Weng | Pulse modulated charge pump circuit |
| US8219408B2 (en) * | 2008-12-29 | 2012-07-10 | Motorola Mobility, Inc. | Audio signal decoder and method for producing a scaled reconstructed audio signal |
| US8175888B2 (en) * | 2008-12-29 | 2012-05-08 | Motorola Mobility, Inc. | Enhanced layered gain factor balancing within a multiple-channel audio coding system |
| US8140342B2 (en) * | 2008-12-29 | 2012-03-20 | Motorola Mobility, Inc. | Selective scaling mask computation based on peak detection |
| US8200496B2 (en) * | 2008-12-29 | 2012-06-12 | Motorola Mobility, Inc. | Audio signal decoder and method for producing a scaled reconstructed audio signal |
| KR101005136B1 (ko) * | 2009-05-29 | 2011-01-04 | 주식회사 하이닉스반도체 | 고전압 발생 장치 |
| JP5259505B2 (ja) | 2009-06-26 | 2013-08-07 | 株式会社東芝 | 半導体記憶装置 |
| IT1397283B1 (it) * | 2009-11-30 | 2013-01-04 | St Microelectronics Rousset | Stadio a pompa di carica, metodo di controllo di uno stadio a pompa di carica e memoria comprendente uno stadio a pompa di carica. |
| US8428936B2 (en) * | 2010-03-05 | 2013-04-23 | Motorola Mobility Llc | Decoder for audio signal including generic audio and speech frames |
| US8423355B2 (en) * | 2010-03-05 | 2013-04-16 | Motorola Mobility Llc | Encoder for audio signal including generic audio and speech frames |
| US8456914B2 (en) * | 2011-03-07 | 2013-06-04 | Elpida Memory, Inc. | Memory device with multiple planes |
| JP5890207B2 (ja) * | 2012-03-13 | 2016-03-22 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| US9129600B2 (en) | 2012-09-26 | 2015-09-08 | Google Technology Holdings LLC | Method and apparatus for encoding an audio signal |
| US9190903B2 (en) | 2013-12-20 | 2015-11-17 | Infineon Technologies, Ag | System and method for a controlled feedback charge pump |
| CN109634344A (zh) * | 2017-03-08 | 2019-04-16 | 长江存储科技有限责任公司 | 一种高带宽低压差线性稳压器 |
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-
2000
- 2000-05-25 JP JP2000154983A patent/JP4149637B2/ja not_active Expired - Fee Related
-
2001
- 2001-05-25 US US09/864,181 patent/US6487120B2/en not_active Expired - Fee Related
- 2001-05-25 EP EP01112062A patent/EP1158524A1/en not_active Withdrawn
-
2002
- 2002-10-08 US US10/265,727 patent/US6605986B2/en not_active Expired - Fee Related
-
2003
- 2003-06-19 US US10/464,462 patent/US6771547B2/en not_active Expired - Fee Related
-
2004
- 2004-06-14 US US10/866,131 patent/US6996024B2/en not_active Expired - Fee Related
-
2005
- 2005-11-09 US US11/269,696 patent/US7203120B2/en not_active Expired - Fee Related
- 2005-11-09 US US11/269,697 patent/US7180796B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US20030210089A1 (en) | 2003-11-13 |
| US6771547B2 (en) | 2004-08-03 |
| US20060055452A1 (en) | 2006-03-16 |
| EP1158524A1 (en) | 2001-11-28 |
| US7203120B2 (en) | 2007-04-10 |
| US7180796B2 (en) | 2007-02-20 |
| JP2001338493A (ja) | 2001-12-07 |
| US6605986B2 (en) | 2003-08-12 |
| US20060055453A1 (en) | 2006-03-16 |
| US20030112056A1 (en) | 2003-06-19 |
| US20040240271A1 (en) | 2004-12-02 |
| US6996024B2 (en) | 2006-02-07 |
| US20020003724A1 (en) | 2002-01-10 |
| US6487120B2 (en) | 2002-11-26 |
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