US4723228B1
(en)
*
|
1983-08-31 |
1998-04-21 |
Texas Instruments Inc |
Memory decoding circuitry
|
JPH0666120B2
(ja)
*
|
1983-11-09 |
1994-08-24 |
株式会社東芝 |
半導体記憶装置の冗長部
|
US4868823B1
(en)
*
|
1984-08-31 |
1999-07-06 |
Texas Instruments Inc |
High speed concurrent testing of dynamic read/write memory array
|
JPS6199999A
(ja)
*
|
1984-10-19 |
1986-05-19 |
Hitachi Ltd |
半導体記憶装置
|
US4670246A
(en)
*
|
1984-11-05 |
1987-06-02 |
Pennwalt Corporation |
Microencapsulated pyrethroids
|
JPS61264599A
(ja)
*
|
1985-05-16 |
1986-11-22 |
Fujitsu Ltd |
半導体記憶装置
|
JPS6221357A
(ja)
*
|
1985-07-22 |
1987-01-29 |
Toshiba Corp |
メモリシステム
|
US4758988A
(en)
*
|
1985-12-12 |
1988-07-19 |
Motorola, Inc. |
Dual array EEPROM for high endurance capability
|
JPH0642313B2
(ja)
*
|
1985-12-20 |
1994-06-01 |
日本電気株式会社 |
半導体メモリ
|
JPS62165785A
(ja)
*
|
1986-01-17 |
1987-07-22 |
Mitsubishi Electric Corp |
半導体記憶装置
|
JPS62173700A
(ja)
*
|
1986-01-28 |
1987-07-30 |
Fujitsu Ltd |
半導体記憶装置
|
JP2530610B2
(ja)
*
|
1986-02-27 |
1996-09-04 |
富士通株式会社 |
半導体記憶装置
|
US4751656A
(en)
*
|
1986-03-10 |
1988-06-14 |
International Business Machines Corporation |
Method for choosing replacement lines in a two dimensionally redundant array
|
US4823252A
(en)
*
|
1986-03-28 |
1989-04-18 |
Tandem Computers Incorporated |
Overlapped control store
|
US4754396A
(en)
*
|
1986-03-28 |
1988-06-28 |
Tandem Computers Incorporated |
Overlapped control store
|
US5165039A
(en)
*
|
1986-03-28 |
1992-11-17 |
Texas Instruments Incorporated |
Register file for bit slice processor with simultaneous accessing of plural memory array cells
|
JPS62250593A
(ja)
*
|
1986-04-23 |
1987-10-31 |
Hitachi Ltd |
ダイナミツク型ram
|
JPS62287497A
(ja)
*
|
1986-06-06 |
1987-12-14 |
Fujitsu Ltd |
半導体記憶装置
|
JPS6337899A
(ja)
*
|
1986-07-30 |
1988-02-18 |
Mitsubishi Electric Corp |
半導体記憶装置
|
JPS6342090A
(ja)
*
|
1986-08-07 |
1988-02-23 |
Fujitsu Ltd |
ユニバーサルジョイント
|
US4837747A
(en)
*
|
1986-11-29 |
1989-06-06 |
Mitsubishi Denki Kabushiki Kaisha |
Redundary circuit with a spare main decoder responsive to an address of a defective cell in a selected cell block
|
JP2523586B2
(ja)
*
|
1987-02-27 |
1996-08-14 |
株式会社日立製作所 |
半導体記憶装置
|
JPH01109599A
(ja)
*
|
1987-10-22 |
1989-04-26 |
Nec Corp |
書込み・消去可能な半導体記憶装置
|
GB2212978A
(en)
*
|
1987-11-30 |
1989-08-02 |
Plessey Co Plc |
An integrated circuit having a patch array
|
JPH01220291A
(ja)
*
|
1988-02-29 |
1989-09-01 |
Nec Corp |
半導体メモリ装置
|
DE68928112T2
(de)
*
|
1988-03-18 |
1997-11-20 |
Toshiba Kawasaki Kk |
Masken-rom mit Ersatzspeicherzellen
|
US5426607A
(en)
*
|
1988-04-27 |
1995-06-20 |
Sharp Kabushiki Kaisha |
Redundant circuit for memory having redundant block operatively connected to special one of normal blocks
|
US4942575A
(en)
*
|
1988-06-17 |
1990-07-17 |
Modular Computer Systems, Inc. |
Error connection device for parity protected memory systems
|
JP2776835B2
(ja)
*
|
1988-07-08 |
1998-07-16 |
株式会社日立製作所 |
欠陥救済用の冗長回路を有する半導体メモリ
|
US5265055A
(en)
*
|
1988-10-07 |
1993-11-23 |
Hitachi, Ltd. |
Semiconductor memory having redundancy circuit
|
US5617365A
(en)
|
1988-10-07 |
1997-04-01 |
Hitachi, Ltd. |
Semiconductor device having redundancy circuit
|
JPH02276098A
(ja)
*
|
1989-01-10 |
1990-11-09 |
Matsushita Electron Corp |
半導体メモリ装置
|
US5089958A
(en)
*
|
1989-01-23 |
1992-02-18 |
Vortex Systems, Inc. |
Fault tolerant computer backup system
|
US4969125A
(en)
*
|
1989-06-23 |
1990-11-06 |
International Business Machines Corporation |
Asynchronous segmented precharge architecture
|
DE69027030T2
(de)
*
|
1989-07-06 |
1996-12-12 |
Mv Ltd |
Eine fehlertolerante datenspeicherungsanordnung
|
GB8916017D0
(en)
*
|
1989-07-13 |
1989-08-31 |
Hughes Microelectronics Ltd |
A non-volatile counter
|
JP3112018B2
(ja)
*
|
1989-09-20 |
2000-11-27 |
株式会社日立製作所 |
冗長メモリを有する半導体記憶装置
|
KR920009059B1
(ko)
*
|
1989-12-29 |
1992-10-13 |
삼성전자 주식회사 |
반도체 메모리 장치의 병렬 테스트 방법
|
US5278839A
(en)
*
|
1990-04-18 |
1994-01-11 |
Hitachi, Ltd. |
Semiconductor integrated circuit having self-check and self-repair capabilities
|
JP3001252B2
(ja)
*
|
1990-11-16 |
2000-01-24 |
株式会社日立製作所 |
半導体メモリ
|
US5276834A
(en)
*
|
1990-12-04 |
1994-01-04 |
Micron Technology, Inc. |
Spare memory arrangement
|
US5265054A
(en)
*
|
1990-12-14 |
1993-11-23 |
Sgs-Thomson Microelectronics, Inc. |
Semiconductor memory with precharged redundancy multiplexing
|
DE69122481T2
(de)
*
|
1990-12-14 |
1997-02-20 |
Sgs Thomson Microelectronics |
Halbleiterspeicher mit Multiplex-Redundanz
|
US5392247A
(en)
*
|
1991-09-19 |
1995-02-21 |
Mitsubishi Denki Kabushiki Kaisha |
Semiconductor memory device including redundancy circuit
|
JP2738195B2
(ja)
*
|
1991-12-27 |
1998-04-08 |
日本電気株式会社 |
不揮発性半導体記憶装置
|
US5257229A
(en)
*
|
1992-01-31 |
1993-10-26 |
Sgs-Thomson Microelectronics, Inc. |
Column redundancy architecture for a read/write memory
|
JP3040625B2
(ja)
*
|
1992-02-07 |
2000-05-15 |
松下電器産業株式会社 |
半導体記憶装置
|
JP2501993B2
(ja)
*
|
1992-02-24 |
1996-05-29 |
株式会社東芝 |
半導体記憶装置
|
WO1993021578A1
(de)
*
|
1992-04-16 |
1993-10-28 |
Siemens Aktiengesellschaft |
Integrierter halbleiterspeicher mit redundanzeinrichtung
|
KR950001837B1
(ko)
*
|
1992-07-13 |
1995-03-03 |
삼성전자주식회사 |
퓨우즈 박스를 공유하는 로우 리던던시 회로
|
JPH0636560A
(ja)
*
|
1992-07-21 |
1994-02-10 |
Mitsubishi Electric Corp |
半導体記憶装置
|
JPH0668700A
(ja)
*
|
1992-08-21 |
1994-03-11 |
Toshiba Corp |
半導体メモリ装置
|
JPH06242925A
(ja)
*
|
1993-02-15 |
1994-09-02 |
Mitsubishi Electric Corp |
ソート処理装置
|
GB9305801D0
(en)
*
|
1993-03-19 |
1993-05-05 |
Deans Alexander R |
Semiconductor memory system
|
US5491664A
(en)
*
|
1993-09-27 |
1996-02-13 |
Cypress Semiconductor Corporation |
Flexibilitiy for column redundancy in a divided array architecture
|
JPH07122076A
(ja)
*
|
1993-10-25 |
1995-05-12 |
Mitsubishi Electric Corp |
キャッシュメモリ
|
US5555212A
(en)
*
|
1994-09-19 |
1996-09-10 |
Kabushiki Kaisha Toshiba |
Method and apparatus for redundancy word line replacement in a semiconductor memory device
|
US5649152A
(en)
|
1994-10-13 |
1997-07-15 |
Vinca Corporation |
Method and system for providing a static snapshot of data stored on a mass storage system
|
US5835953A
(en)
|
1994-10-13 |
1998-11-10 |
Vinca Corporation |
Backup system that takes a snapshot of the locations in a mass storage device that has been identified for updating prior to updating
|
KR0174338B1
(ko)
*
|
1994-11-30 |
1999-04-01 |
윌리엄 티. 엘리스 |
간단하게 테스트할 수 있는 구성을 갖는 랜덤 액세스 메모리
|
US5544113A
(en)
*
|
1994-11-30 |
1996-08-06 |
International Business Machines Corporation |
Random access memory having a flexible array redundancy scheme
|
JP3631277B2
(ja)
*
|
1995-01-27 |
2005-03-23 |
株式会社日立製作所 |
メモリモジュール
|
US5901105A
(en)
*
|
1995-04-05 |
1999-05-04 |
Ong; Adrian E |
Dynamic random access memory having decoding circuitry for partial memory blocks
|
JPH0955087A
(ja)
*
|
1995-08-11 |
1997-02-25 |
Texas Instr Japan Ltd |
半導体メモリ装置
|
US6037799A
(en)
*
|
1995-12-29 |
2000-03-14 |
Stmicroelectronics, Inc. |
Circuit and method for selecting a signal
|
US5771195A
(en)
*
|
1995-12-29 |
1998-06-23 |
Sgs-Thomson Microelectronics, Inc. |
Circuit and method for replacing a defective memory cell with a redundant memory cell
|
US5612918A
(en)
*
|
1995-12-29 |
1997-03-18 |
Sgs-Thomson Microelectronics, Inc. |
Redundancy architecture
|
US5790462A
(en)
*
|
1995-12-29 |
1998-08-04 |
Sgs-Thomson Microelectronics, Inc. |
Redundancy control
|
US5841709A
(en)
*
|
1995-12-29 |
1998-11-24 |
Stmicroelectronics, Inc. |
Memory having and method for testing redundant memory cells
|
US5745431A
(en)
*
|
1996-01-05 |
1998-04-28 |
International Business Machines Corporation |
Address transition detector (ATD) for power conservation
|
JP2848451B2
(ja)
*
|
1996-07-10 |
1999-01-20 |
日本電気株式会社 |
半導体メモリ
|
JP3613622B2
(ja)
*
|
1996-09-27 |
2005-01-26 |
株式会社日立製作所 |
半導体メモリ
|
US5796662A
(en)
*
|
1996-11-26 |
1998-08-18 |
International Business Machines Corporation |
Integrated circuit chip with a wide I/O memory array and redundant data lines
|
JPH117792A
(ja)
*
|
1997-06-19 |
1999-01-12 |
Mitsubishi Electric Corp |
半導体記憶装置
|
KR19990050806A
(ko)
*
|
1997-12-17 |
1999-07-05 |
윤종용 |
불 휘발성 메모리 장치
|
US6205515B1
(en)
*
|
1998-03-16 |
2001-03-20 |
Winbond Electronic Corporation |
Column redundancy circuitry with reduced time delay
|
KR100281284B1
(ko)
*
|
1998-06-29 |
2001-02-01 |
김영환 |
컬럼 리던던시 회로
|
JP4260247B2
(ja)
*
|
1998-09-02 |
2009-04-30 |
富士通マイクロエレクトロニクス株式会社 |
半導体記憶装置
|
US5978291A
(en)
*
|
1998-09-30 |
1999-11-02 |
International Business Machines Corporation |
Sub-block redundancy replacement for a giga-bit scale DRAM
|
KR100399887B1
(ko)
|
1999-05-27 |
2003-09-29 |
주식회사 하이닉스반도체 |
반도체 메모리의 칼럼 구제 회로
|
US6144593A
(en)
*
|
1999-09-01 |
2000-11-07 |
Micron Technology, Inc. |
Circuit and method for a multiplexed redundancy scheme in a memory device
|
US6563743B2
(en)
*
|
2000-11-27 |
2003-05-13 |
Hitachi, Ltd. |
Semiconductor device having dummy cells and semiconductor device having dummy cells for redundancy
|
JP3875570B2
(ja)
*
|
2001-02-20 |
2007-01-31 |
株式会社東芝 |
半導体記憶装置のデータ書き込み方法及び半導体記憶装置
|
US20030058698A1
(en)
*
|
2001-09-26 |
2003-03-27 |
Gerhard Mueller |
Memory with high performance unit architecture
|
JP4425532B2
(ja)
*
|
2002-08-29 |
2010-03-03 |
富士通マイクロエレクトロニクス株式会社 |
半導体メモリ
|
KR100480071B1
(ko)
*
|
2002-11-12 |
2005-03-31 |
엘지전자 주식회사 |
가변 감쇠기
|
JP2004234770A
(ja)
*
|
2003-01-31 |
2004-08-19 |
Renesas Technology Corp |
半導体記憶装置とテスト方法
|
US6809972B2
(en)
*
|
2003-03-13 |
2004-10-26 |
Infineon Technologies Ag |
Circuit technique for column redundancy fuse latches
|
US7827362B2
(en)
*
|
2004-08-24 |
2010-11-02 |
Symantec Corporation |
Systems, apparatus, and methods for processing I/O requests
|
US7577807B2
(en)
*
|
2003-09-23 |
2009-08-18 |
Symantec Operating Corporation |
Methods and devices for restoring a portion of a data store
|
US7725760B2
(en)
*
|
2003-09-23 |
2010-05-25 |
Symantec Operating Corporation |
Data storage system
|
US7239581B2
(en)
*
|
2004-08-24 |
2007-07-03 |
Symantec Operating Corporation |
Systems and methods for synchronizing the internal clocks of a plurality of processor modules
|
US7904428B2
(en)
*
|
2003-09-23 |
2011-03-08 |
Symantec Corporation |
Methods and apparatus for recording write requests directed to a data store
|
US7409587B2
(en)
*
|
2004-08-24 |
2008-08-05 |
Symantec Operating Corporation |
Recovering from storage transaction failures using checkpoints
|
US7577806B2
(en)
|
2003-09-23 |
2009-08-18 |
Symantec Operating Corporation |
Systems and methods for time dependent data storage and recovery
|
US7296008B2
(en)
*
|
2004-08-24 |
2007-11-13 |
Symantec Operating Corporation |
Generation and use of a time map for accessing a prior image of a storage device
|
US7730222B2
(en)
*
|
2004-08-24 |
2010-06-01 |
Symantec Operating System |
Processing storage-related I/O requests using binary tree data structures
|
US7631120B2
(en)
*
|
2004-08-24 |
2009-12-08 |
Symantec Operating Corporation |
Methods and apparatus for optimally selecting a storage buffer for the storage of data
|
US7991748B2
(en)
*
|
2003-09-23 |
2011-08-02 |
Symantec Corporation |
Virtual data store creation and use
|
US7287133B2
(en)
*
|
2004-08-24 |
2007-10-23 |
Symantec Operating Corporation |
Systems and methods for providing a modification history for a location within a data store
|
CN103927238B
(zh)
*
|
2005-10-14 |
2017-04-12 |
塞门铁克操作公司 |
一种在数据存储器中用于时间线压缩的技术
|
KR101297754B1
(ko)
*
|
2006-07-11 |
2013-08-26 |
삼성전자주식회사 |
메모리 컴파일링 시스템 및 컴파일링 방법
|
US7643371B2
(en)
*
|
2006-12-28 |
2010-01-05 |
Spansion Llc |
Address/data multiplexed device
|
US7397722B1
(en)
*
|
2007-02-02 |
2008-07-08 |
Freescale Semiconductor, Inc. |
Multiple block memory with complementary data path
|
US9229887B2
(en)
*
|
2008-02-19 |
2016-01-05 |
Micron Technology, Inc. |
Memory device with network on chip methods, apparatus, and systems
|
US8086913B2
(en)
*
|
2008-09-11 |
2011-12-27 |
Micron Technology, Inc. |
Methods, apparatus, and systems to repair memory
|
US9123552B2
(en)
|
2010-03-30 |
2015-09-01 |
Micron Technology, Inc. |
Apparatuses enabling concurrent communication between an interface die and a plurality of dice stacks, interleaved conductive paths in stacked devices, and methods for forming and operating the same
|
KR101051943B1
(ko)
*
|
2010-05-31 |
2011-07-26 |
주식회사 하이닉스반도체 |
반도체 메모리 장치
|
KR20170034176A
(ko)
|
2015-09-18 |
2017-03-28 |
에스케이하이닉스 주식회사 |
반도체 장치
|
KR20170034177A
(ko)
|
2015-09-18 |
2017-03-28 |
에스케이하이닉스 주식회사 |
리페어 장치
|
KR20170051039A
(ko)
|
2015-11-02 |
2017-05-11 |
에스케이하이닉스 주식회사 |
반도체 장치 및 그 구동 방법
|
CN113496746B
(zh)
*
|
2020-04-03 |
2024-05-14 |
澜起科技股份有限公司 |
用于检测存储模块缺陷的装置和方法以及存储器系统
|