|
US2962838A
(en)
*
|
1957-05-20 |
1960-12-06 |
Union Carbide Corp |
Method for making synthetic unicrystalline bodies
|
|
JPS5749520B2
(enExample)
|
1974-02-04 |
1982-10-22 |
|
|
|
US4396529A
(en)
|
1978-11-13 |
1983-08-02 |
Nordson Corporation |
Method and apparatus for producing a foam from a viscous liquid
|
|
EP0173764B1
(en)
|
1984-08-31 |
1989-12-13 |
Gakei Electric Works Co., Ltd. |
Single crystal growing method and apparatus
|
|
US5679152A
(en)
*
|
1994-01-27 |
1997-10-21 |
Advanced Technology Materials, Inc. |
Method of making a single crystals Ga*N article
|
|
JP3735921B2
(ja)
*
|
1996-02-07 |
2006-01-18 |
三菱ウェルファーマ株式会社 |
GPIb・脂質複合体およびその用途
|
|
JPH10125753A
(ja)
|
1996-09-02 |
1998-05-15 |
Murata Mfg Co Ltd |
半導体のキャリア濃度測定方法、半導体デバイス製造方法及び半導体ウエハ
|
|
JPH10125653A
(ja)
|
1996-10-17 |
1998-05-15 |
Fujitsu Ltd |
半導体装置の製造方法
|
|
US6309595B1
(en)
|
1997-04-30 |
2001-10-30 |
The Altalgroup, Inc |
Titanium crystal and titanium
|
|
DE69842052D1
(de)
|
1997-10-30 |
2011-01-27 |
Sumitomo Electric Industries |
Gan einkristall-substrat und herstellungsmethode
|
|
US5942148A
(en)
*
|
1997-12-24 |
1999-08-24 |
Preston; Kenneth G. |
Nitride compacts
|
|
WO1999066565A1
(en)
*
|
1998-06-18 |
1999-12-23 |
University Of Florida |
Method and apparatus for producing group-iii nitrides
|
|
JP3592553B2
(ja)
*
|
1998-10-15 |
2004-11-24 |
株式会社東芝 |
窒化ガリウム系半導体装置
|
|
WO2000033388A1
(en)
*
|
1998-11-24 |
2000-06-08 |
Massachusetts Institute Of Technology |
METHOD OF PRODUCING DEVICE QUALITY (Al)InGaP ALLOYS ON LATTICE-MISMATCHED SUBSTRATES
|
|
US6177057B1
(en)
|
1999-02-09 |
2001-01-23 |
The United States Of America As Represented By The Secretary Of The Navy |
Process for preparing bulk cubic gallium nitride
|
|
US6190629B1
(en)
|
1999-04-16 |
2001-02-20 |
Cbl Technologies, Inc. |
Organic acid scrubber and methods
|
|
US6326313B1
(en)
*
|
1999-04-21 |
2001-12-04 |
Advanced Micro Devices |
Method and apparatus for partial drain during a nitride strip process step
|
|
US6406540B1
(en)
*
|
1999-04-27 |
2002-06-18 |
The United States Of America As Represented By The Secretary Of The Air Force |
Process and apparatus for the growth of nitride materials
|
|
US6117213A
(en)
*
|
1999-05-07 |
2000-09-12 |
Cbl Technologies, Inc. |
Particle trap apparatus and methods
|
|
US6562124B1
(en)
|
1999-06-02 |
2003-05-13 |
Technologies And Devices International, Inc. |
Method of manufacturing GaN ingots
|
|
JP4145437B2
(ja)
|
1999-09-28 |
2008-09-03 |
住友電気工業株式会社 |
単結晶GaNの結晶成長方法及び単結晶GaN基板の製造方法と単結晶GaN基板
|
|
US6398867B1
(en)
*
|
1999-10-06 |
2002-06-04 |
General Electric Company |
Crystalline gallium nitride and method for forming crystalline gallium nitride
|
|
US6441393B2
(en)
*
|
1999-11-17 |
2002-08-27 |
Lumileds Lighting U.S., Llc |
Semiconductor devices with selectively doped III-V nitride layers
|
|
JP4627830B2
(ja)
|
1999-12-20 |
2011-02-09 |
株式会社フルヤ金属 |
超臨界水酸化分解処理装置の反応容器及び反応容器の製造方法
|
|
US6596079B1
(en)
*
|
2000-03-13 |
2003-07-22 |
Advanced Technology Materials, Inc. |
III-V nitride substrate boule and method of making and using the same
|
|
JP2001345268A
(ja)
*
|
2000-05-31 |
2001-12-14 |
Matsushita Electric Ind Co Ltd |
半導体製造装置及び半導体の製造方法
|
|
JP3968968B2
(ja)
|
2000-07-10 |
2007-08-29 |
住友電気工業株式会社 |
単結晶GaN基板の製造方法
|
|
JP4374156B2
(ja)
*
|
2000-09-01 |
2009-12-02 |
日本碍子株式会社 |
Iii−v族窒化物膜の製造装置及び製造方法
|
|
WO2002021604A1
(en)
*
|
2000-09-08 |
2002-03-14 |
Sharp Kabushiki Kaisha |
Nitride semiconductor light-emitting device and optical device including the same
|
|
US7053413B2
(en)
*
|
2000-10-23 |
2006-05-30 |
General Electric Company |
Homoepitaxial gallium-nitride-based light emitting device and method for producing
|
|
AU2002219978A1
(en)
*
|
2000-11-30 |
2002-06-11 |
Kyma Technologies, Inc. |
Method and apparatus for producing miiin columns and miiin materials grown thereon
|
|
JP2002217118A
(ja)
|
2001-01-22 |
2002-08-02 |
Japan Pionics Co Ltd |
窒化ガリウム膜半導体の製造装置、排ガス浄化装置、及び製造設備
|
|
EP2400046A1
(en)
*
|
2001-03-30 |
2011-12-28 |
Technologies and Devices International Inc. |
Method and apparatus for growing submicron group III nitride structures utilizing HVPE techniques
|
|
US7160388B2
(en)
*
|
2001-06-06 |
2007-01-09 |
Nichia Corporation |
Process and apparatus for obtaining bulk monocrystalline gallium-containing nitride
|
|
US6860948B1
(en)
*
|
2003-09-05 |
2005-03-01 |
Haynes International, Inc. |
Age-hardenable, corrosion resistant Ni—Cr—Mo alloys
|
|
US20060011135A1
(en)
|
2001-07-06 |
2006-01-19 |
Dmitriev Vladimir A |
HVPE apparatus for simultaneously producing multiple wafers during a single epitaxial growth run
|
|
US7501023B2
(en)
*
|
2001-07-06 |
2009-03-10 |
Technologies And Devices, International, Inc. |
Method and apparatus for fabricating crack-free Group III nitride semiconductor materials
|
|
US20070032046A1
(en)
|
2001-07-06 |
2007-02-08 |
Dmitriev Vladimir A |
Method for simultaneously producing multiple wafers during a single epitaxial growth run and semiconductor structure grown thereby
|
|
US7169227B2
(en)
*
|
2001-08-01 |
2007-01-30 |
Crystal Photonics, Incorporated |
Method for making free-standing AIGaN wafer, wafer produced thereby, and associated methods and devices using the wafer
|
|
US7105865B2
(en)
*
|
2001-09-19 |
2006-09-12 |
Sumitomo Electric Industries, Ltd. |
AlxInyGa1−x−yN mixture crystal substrate
|
|
CA2464083C
(en)
|
2001-10-26 |
2011-08-02 |
Ammono Sp. Z O.O. |
Substrate for epitaxy
|
|
JP4131101B2
(ja)
|
2001-11-28 |
2008-08-13 |
日亜化学工業株式会社 |
窒化物半導体素子の製造方法
|
|
US7017514B1
(en)
*
|
2001-12-03 |
2006-03-28 |
Novellus Systems, Inc. |
Method and apparatus for plasma optimization in water processing
|
|
JP4513264B2
(ja)
|
2002-02-22 |
2010-07-28 |
三菱化学株式会社 |
窒化物単結晶の製造方法
|
|
US7063741B2
(en)
*
|
2002-03-27 |
2006-06-20 |
General Electric Company |
High pressure high temperature growth of crystalline group III metal nitrides
|
|
JP3803788B2
(ja)
*
|
2002-04-09 |
2006-08-02 |
農工大ティー・エル・オー株式会社 |
Al系III−V族化合物半導体の気相成長方法、Al系III−V族化合物半導体の製造方法ならびに製造装置
|
|
WO2003098757A1
(en)
*
|
2002-05-17 |
2003-11-27 |
Ammono Sp.Zo.O. |
Light emitting element structure having nitride bulk single crystal layer
|
|
US7335262B2
(en)
*
|
2002-05-17 |
2008-02-26 |
Ammono Sp. Z O.O. |
Apparatus for obtaining a bulk single crystal using supercritical ammonia
|
|
US7601441B2
(en)
*
|
2002-06-24 |
2009-10-13 |
Cree, Inc. |
One hundred millimeter high purity semi-insulating single crystal silicon carbide wafer
|
|
US7316747B2
(en)
*
|
2002-06-24 |
2008-01-08 |
Cree, Inc. |
Seeded single crystal silicon carbide growth and resulting crystals
|
|
EP1518009B1
(en)
|
2002-06-26 |
2013-07-17 |
Ammono S.A. |
Process for obtaining of bulk monocrystalline gallium-containing nitride
|
|
KR101030068B1
(ko)
*
|
2002-07-08 |
2011-04-19 |
니치아 카가쿠 고교 가부시키가이샤 |
질화물 반도체 소자의 제조방법 및 질화물 반도체 소자
|
|
JP3821229B2
(ja)
|
2002-12-09 |
2006-09-13 |
ソニー株式会社 |
オーディオ信号の再生方法および再生装置
|
|
EP1576210B1
(en)
*
|
2002-12-11 |
2010-02-10 |
AMMONO Sp. z o.o. |
A substrate for epitaxy and a method of preparing the same
|
|
TWI334890B
(en)
|
2002-12-11 |
2010-12-21 |
Ammono Sp Zoo |
Process for obtaining bulk mono-crystalline gallium-containing nitride, eliminating impurities from the obtained crystal and manufacturing substrates made of bulk mono-crystalline gallium-containing nitride
|
|
US7638815B2
(en)
*
|
2002-12-27 |
2009-12-29 |
Momentive Performance Materials Inc. |
Crystalline composition, wafer, and semi-conductor structure
|
|
WO2004061923A1
(en)
*
|
2002-12-27 |
2004-07-22 |
General Electric Company |
Gallium nitride crystal, homoepitaxial gallium-nitride-based devices and method for producing same
|
|
US7786503B2
(en)
*
|
2002-12-27 |
2010-08-31 |
Momentive Performance Materials Inc. |
Gallium nitride crystals and wafers and method of making
|
|
US7859008B2
(en)
*
|
2002-12-27 |
2010-12-28 |
Momentive Performance Materials Inc. |
Crystalline composition, wafer, device, and associated method
|
|
US7098487B2
(en)
*
|
2002-12-27 |
2006-08-29 |
General Electric Company |
Gallium nitride crystal and method of making same
|
|
JP2004284876A
(ja)
|
2003-03-20 |
2004-10-14 |
Rikogaku Shinkokai |
不純物含有窒化ガリウム粉体およびその製造方法
|
|
JP2004342845A
(ja)
*
|
2003-05-15 |
2004-12-02 |
Kobe Steel Ltd |
微細構造体の洗浄装置
|
|
US7309534B2
(en)
*
|
2003-05-29 |
2007-12-18 |
Matsushita Electric Industrial Co., Ltd. |
Group III nitride crystals usable as group III nitride substrate, method of manufacturing the same, and semiconductor device including the same
|
|
JP4433696B2
(ja)
|
2003-06-17 |
2010-03-17 |
三菱化学株式会社 |
窒化物結晶の製造方法
|
|
JP2005011973A
(ja)
|
2003-06-18 |
2005-01-13 |
Japan Science & Technology Agency |
希土類−鉄−ホウ素系磁石及びその製造方法
|
|
US7170095B2
(en)
*
|
2003-07-11 |
2007-01-30 |
Cree Inc. |
Semi-insulating GaN and method of making the same
|
|
US7125801B2
(en)
*
|
2003-08-06 |
2006-10-24 |
Matsushita Electric Industrial Co., Ltd. |
Method of manufacturing Group III nitride crystal substrate, etchant used in the method, Group III nitride crystal substrate, and semiconductor device including the same
|
|
JP2005069454A
(ja)
*
|
2003-08-28 |
2005-03-17 |
Toyota Motor Corp |
ガス供給装置
|
|
WO2005034301A1
(ja)
*
|
2003-09-25 |
2005-04-14 |
Matsushita Electric Industrial Co., Ltd. |
窒化物半導体素子およびその製造方法
|
|
JP2005119893A
(ja)
|
2003-10-14 |
2005-05-12 |
Matsushita Electric Ind Co Ltd |
無機組成物およびその製造方法並びにそれを用いたiii族元素窒化物の製造方法。
|
|
US7009215B2
(en)
*
|
2003-10-24 |
2006-03-07 |
General Electric Company |
Group III-nitride based resonant cavity light emitting devices fabricated on single crystal gallium nitride substrates
|
|
JP2005191530A
(ja)
*
|
2003-12-03 |
2005-07-14 |
Sumitomo Electric Ind Ltd |
発光装置
|
|
CN100466178C
(zh)
*
|
2003-12-26 |
2009-03-04 |
松下电器产业株式会社 |
Iii族氮化物晶体的制造方法以及由此得到的iii族氮化物晶体与应用该晶体的iii族氮化物晶体基板
|
|
JP4304276B2
(ja)
|
2004-03-31 |
2009-07-29 |
独立行政法人産業技術総合研究所 |
高圧装置の効率的な断熱方法及び装置
|
|
ATE418806T1
(de)
*
|
2004-04-02 |
2009-01-15 |
Nichia Corp |
Nitrid-halbleiterlaservorrichtung
|
|
JP4790607B2
(ja)
*
|
2004-04-27 |
2011-10-12 |
パナソニック株式会社 |
Iii族元素窒化物結晶製造装置およびiii族元素窒化物結晶製造方法
|
|
US7432142B2
(en)
*
|
2004-05-20 |
2008-10-07 |
Cree, Inc. |
Methods of fabricating nitride-based transistors having regrown ohmic contact regions
|
|
US7303632B2
(en)
*
|
2004-05-26 |
2007-12-04 |
Cree, Inc. |
Vapor assisted growth of gallium nitride
|
|
US7858996B2
(en)
*
|
2006-02-17 |
2010-12-28 |
The Regents Of The University Of California |
Method for growth of semipolar (Al,In,Ga,B)N optoelectronic devices
|
|
AU2005252111A1
(en)
|
2004-06-11 |
2005-12-22 |
Takeda Pharmaceutical Company Limited |
Highly selective novel amidation method
|
|
WO2005121415A1
(en)
|
2004-06-11 |
2005-12-22 |
Ammono Sp. Z O.O. |
Bulk mono-crystalline gallium-containing nitride and its application
|
|
JP2006069827A
(ja)
|
2004-08-31 |
2006-03-16 |
Kyocera Kinseki Corp |
人工水晶の製造方法
|
|
PL371405A1
(pl)
*
|
2004-11-26 |
2006-05-29 |
Ammono Sp.Z O.O. |
Sposób wytwarzania objętościowych monokryształów metodą wzrostu na zarodku
|
|
JP4276627B2
(ja)
|
2005-01-12 |
2009-06-10 |
ソルボサーマル結晶成長技術研究組合 |
単結晶育成用圧力容器およびその製造方法
|
|
US7704324B2
(en)
*
|
2005-01-25 |
2010-04-27 |
General Electric Company |
Apparatus for processing materials in supercritical fluids and methods thereof
|
|
CN101137774B
(zh)
|
2005-03-14 |
2012-03-21 |
日本碍子株式会社 |
易氧化性或易吸湿性物质的容器以及易氧化性或易吸湿性物质的加热和加压处理方法
|
|
US7316746B2
(en)
*
|
2005-03-18 |
2008-01-08 |
General Electric Company |
Crystals for a semiconductor radiation detector and method for making the crystals
|
|
US20060210800A1
(en)
*
|
2005-03-21 |
2006-09-21 |
Irene Spitsberg |
Environmental barrier layer for silcon-containing substrate and process for preparing same
|
|
US8101498B2
(en)
*
|
2005-04-21 |
2012-01-24 |
Pinnington Thomas Henry |
Bonded intermediate substrate and method of making same
|
|
KR100700082B1
(ko)
*
|
2005-06-14 |
2007-03-28 |
주식회사 실트론 |
결정 성장된 잉곳의 품질평가 방법
|
|
EP1739213B1
(de)
*
|
2005-07-01 |
2011-04-13 |
Freiberger Compound Materials GmbH |
Vorrichtung und Verfahren zum Tempern von III-V-Wafern sowie getemperte III-V-Halbleitereinkristallwafer
|
|
EP1917382A4
(en)
|
2005-07-08 |
2009-09-02 |
Univ California |
METHOD FOR GROWING GROUP III NITRIDE CRYSTALS IN SUPERCRITICAL AMMONIA USING AUTOCLAVE
|
|
US8101020B2
(en)
*
|
2005-10-14 |
2012-01-24 |
Ricoh Company, Ltd. |
Crystal growth apparatus and manufacturing method of group III nitride crystal
|
|
KR20070042594A
(ko)
|
2005-10-19 |
2007-04-24 |
삼성코닝 주식회사 |
편평한 측면을 갖는 a면 질화물 반도체 단결정 기판
|
|
EP1977029B1
(en)
|
2005-12-20 |
2020-07-22 |
SLT Technologies, Inc. |
Crystalline composition
|
|
JP2007197302A
(ja)
*
|
2005-12-28 |
2007-08-09 |
Sumitomo Electric Ind Ltd |
Iii族窒化物結晶の製造方法および製造装置
|
|
JP5896442B2
(ja)
*
|
2006-01-20 |
2016-03-30 |
国立研究開発法人科学技術振興機構 |
Iii族窒化物膜の成長方法
|
|
JP5454829B2
(ja)
|
2006-03-06 |
2014-03-26 |
三菱化学株式会社 |
超臨界溶媒を用いた結晶製造方法および結晶製造装置
|
|
JP5454828B2
(ja)
|
2006-03-06 |
2014-03-26 |
三菱化学株式会社 |
超臨界溶媒を用いた結晶製造方法および結晶製造装置
|
|
JP4968708B2
(ja)
|
2006-03-06 |
2012-07-04 |
日本碍子株式会社 |
窒化物単結晶の製造方法
|
|
TWI299896B
(en)
|
2006-03-16 |
2008-08-11 |
Advanced Semiconductor Eng |
Method for forming metal bumps
|
|
WO2007111962A2
(en)
|
2006-03-22 |
2007-10-04 |
The Procter & Gamble Company |
Aerosol product comprising a foaming concentrate composition comprising particulate materials
|
|
WO2007122866A1
(ja)
|
2006-03-23 |
2007-11-01 |
Ngk Insulators, Ltd. |
単結晶の製造方法
|
|
JP5382900B2
(ja)
|
2006-03-29 |
2014-01-08 |
公益財団法人鉄道総合技術研究所 |
液状化による地中構造物の浮き上がり防止方法
|
|
KR20090029697A
(ko)
|
2006-04-07 |
2009-03-23 |
더 리전츠 오브 더 유니버시티 오브 캘리포니아 |
초임계 암모니아 내에서 넓은 표면적 질화 갈륨 결정을 성장시키는 방법 및 넓은 표면적 질화 갈륨 결정
|
|
US8764903B2
(en)
|
2009-05-05 |
2014-07-01 |
Sixpoint Materials, Inc. |
Growth reactor for gallium-nitride crystals using ammonia and hydrogen chloride
|
|
JP2007290921A
(ja)
|
2006-04-26 |
2007-11-08 |
Mitsubishi Chemicals Corp |
窒化物単結晶の製造方法、窒化物単結晶、およびデバイス
|
|
JP2009536605A
(ja)
|
2006-05-08 |
2009-10-15 |
ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア |
アルミニウムを含むiii族窒化物半導体化合物の成長方法及び材料。
|
|
WO2007149487A2
(en)
|
2006-06-21 |
2007-12-27 |
The Regents Of The University Of California |
Opto-electronic and electronic devices using n-face or m-plane gan substrate prepared with ammonothermal growth
|
|
JP4462251B2
(ja)
*
|
2006-08-17 |
2010-05-12 |
日立電線株式会社 |
Iii−v族窒化物系半導体基板及びiii−v族窒化物系発光素子
|
|
JP5129527B2
(ja)
|
2006-10-02 |
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|
|
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(en)
|
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|
|
US20080111144A1
(en)
*
|
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|
|
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(ko)
|
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|
|
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(ja)
|
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|
|
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(en)
|
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|
|
US7749325B2
(en)
*
|
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|
|
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(ja)
|
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|
|
US20100213576A1
(en)
*
|
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|
|
TW200923536A
(en)
*
|
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|
|
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(en)
|
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|
|
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(en)
*
|
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|
|
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(en)
|
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|
|
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(ja)
|
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2013-12-25 |
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|
|
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(en)
|
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|
|
US8852341B2
(en)
*
|
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|