JP2007524824A5 - - Google Patents

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Publication number
JP2007524824A5
JP2007524824A5 JP2006517462A JP2006517462A JP2007524824A5 JP 2007524824 A5 JP2007524824 A5 JP 2007524824A5 JP 2006517462 A JP2006517462 A JP 2006517462A JP 2006517462 A JP2006517462 A JP 2006517462A JP 2007524824 A5 JP2007524824 A5 JP 2007524824A5
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Japan
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web
substrate
space
layer
test strip
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JP2006517462A
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JP4800209B2 (ja
JP2007524824A (ja
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Priority claimed from PCT/US2004/019687 external-priority patent/WO2004113902A1/en
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Claims (10)

  1. 第一および第二側面を有し、当該第一および第二側面に平行な中心縦軸を有する基板と該基板に貼り付けられ、試料チャンバーを少なくとも部分的に画定する空間域を有するスペース層とを含むテストストリップ本体
    前記基板上に貼り付けられ、かつ前記スペース層の前記空間域内に位置決めされる測定電極、
    前記試料チャンバー内に位置決めされる第一部分および前記スペース層と前記基板のあいだに挟まれている第二部分を有する前記基板上に配置される試薬層からなるテストストリップ。
  2. 前記テストストリップ本体が前記スペース層にはりつけられるカバー層、前記カバー層により少なくとも部分的に境界される前記試験チャンバー、前記基板、および前記空間域を画定する前記スペース層の部分を備える請求項1記載のテストストリップ。
  3. 前記空間域が前記中心縦軸に整列され、前記ストリップ本体の末端に配置される試料受取開口を終結するチャネルを備える請求項1または2記載のテストストリップ。
  4. 前記スペース層と基板とのあいだに配置された接着剤層をさらに備える請求項1〜3のいずれか1項に記載のテストストリップ。
  5. 前記試薬層が約1〜20ミクロンのあいだの厚さを有する請求項1〜4のいずれか1項に記載のテストストリップ。
  6. 前記試薬層がシリカを含む請求項1〜5のいずれか1項に記載のテストストリップ。
  7. 請求項1〜6のいずれか1項に記載のテストストリップを製造する方法であって、
    (a)第一および第二ウェブ縁を有する基板材料のウェブを供給する工程、
    (b)ウェブ上に複数の離間された電極組を形成する工程、
    (c)前記ウェブに、前記第一ウェブ縁に平行に向けられた試薬材料の連続ストライプを設け、該ストライプによりそれぞれの電極組の少なくとも一方の電極を覆う工程、
    (d)その中に形成された複数の空洞を有するスペース材料のウェブを提供する工程、
    (e)前記スペース層材料のウェブを基板材料のウェブに積層し、前記複数の電極組のそれぞれ一つに整列される各空洞を有するウェブを形成し、および
    (f)前記ウェブを複数のテストストリップに切断し、それによって前記切断物が第一および第二側面を有する複数のテストストリップを画定しおよび前記基板および前記スペース層材料の間に位置決めされ、しかも前記テストストリップ第一および第二側面まで延びる試薬層を含む方法。
  8. スペース材料のウェブが接着剤により基板材料のウェブに積層される請求項7記載の方法。
  9. 前記スペース層材料のウェブを積層した後および前記ウェブを切断する前に、前記スペース層材料のウェブに被覆層材料のウェブを積層することをさらに含む請求項7または8記載の方法。
  10. 前記試薬ストライプが約3〜20μmまでのあいだの厚さまで乾燥する請求項7〜9のいずれか1項に記載の方法。
JP2006517462A 2003-06-20 2004-06-18 テストストリップ用の試薬ストライプ Active JP4800209B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US48039703P 2003-06-20 2003-06-20
US60/480,397 2003-06-20
PCT/US2004/019687 WO2004113902A1 (en) 2003-06-20 2004-06-18 Reagent stripe for test strip

Related Child Applications (1)

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JP2011127587A Division JP5159920B2 (ja) 2003-06-20 2011-06-07 テストストリップ用の試薬ストライプ

Publications (3)

Publication Number Publication Date
JP2007524824A JP2007524824A (ja) 2007-08-30
JP2007524824A5 true JP2007524824A5 (ja) 2009-10-01
JP4800209B2 JP4800209B2 (ja) 2011-10-26

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ID=33539293

Family Applications (7)

Application Number Title Priority Date Filing Date
JP2006517430A Pending JP2007524816A (ja) 2003-06-20 2004-06-18 細い均一な試薬ストリップの製造方法およびその試薬
JP2006517462A Active JP4800209B2 (ja) 2003-06-20 2004-06-18 テストストリップ用の試薬ストライプ
JP2006517460A Active JP4447009B2 (ja) 2003-06-20 2004-06-18 スロットベント開口を有するテストストリップ
JP2006517459A Active JP4619359B2 (ja) 2003-06-20 2004-06-18 フレア状に形成された試料受入チャンバーを持つ試験片
JP2010177438A Active JP4912489B2 (ja) 2003-06-20 2010-08-06 フレア状に形成された試料受入チャンバーを持つ試験片を作製する方法
JP2011000051A Active JP5064576B2 (ja) 2003-06-20 2011-01-04 細い均一な試薬ストリップの製造方法およびその試薬
JP2011127587A Active JP5159920B2 (ja) 2003-06-20 2011-06-07 テストストリップ用の試薬ストライプ

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JP2006517430A Pending JP2007524816A (ja) 2003-06-20 2004-06-18 細い均一な試薬ストリップの製造方法およびその試薬

Family Applications After (5)

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JP2006517460A Active JP4447009B2 (ja) 2003-06-20 2004-06-18 スロットベント開口を有するテストストリップ
JP2006517459A Active JP4619359B2 (ja) 2003-06-20 2004-06-18 フレア状に形成された試料受入チャンバーを持つ試験片
JP2010177438A Active JP4912489B2 (ja) 2003-06-20 2010-08-06 フレア状に形成された試料受入チャンバーを持つ試験片を作製する方法
JP2011000051A Active JP5064576B2 (ja) 2003-06-20 2011-01-04 細い均一な試薬ストリップの製造方法およびその試薬
JP2011127587A Active JP5159920B2 (ja) 2003-06-20 2011-06-07 テストストリップ用の試薬ストライプ

Country Status (14)

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US (8) US7829023B2 (ja)
EP (4) EP1642117B1 (ja)
JP (7) JP2007524816A (ja)
KR (1) KR100785670B1 (ja)
CN (2) CN1846131B (ja)
CA (4) CA2529657C (ja)
ES (4) ES2681398T3 (ja)
HK (1) HK1094599A1 (ja)
HU (1) HUE039852T2 (ja)
MX (1) MXPA05013635A (ja)
PL (4) PL1642117T3 (ja)
PT (1) PT1639352T (ja)
TR (1) TR201810169T4 (ja)
WO (4) WO2004113902A1 (ja)

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