JP2006522341A - 光路長が変更された異なる角度の光の合成により光学的に干渉する断層撮影におけるスペックルの減少 - Google Patents
光路長が変更された異なる角度の光の合成により光学的に干渉する断層撮影におけるスペックルの減少 Download PDFInfo
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Abstract
【解決手段】プローブカテーテル装置及び方法は、サンプルを照射する為に提供され、特に、干渉計(5)は電磁放射(10)を発射し、さらに、サンプル部は電磁放射を受け取り、サンプルを照射するために電磁放射から少なくとも2つの放射(30,40)の生成を促進する装置(20)を具備し、少なくとも2つの放射のうちの第二放射に対して少なくとも2つの放射のうちの第一放射を遅らせるような装置を構成する。
Description
という利点がある。
善し、複数の検出器を使用する方法ほど複雑ではないが、画像を得るために必要な時間がN増える。さらに、短い直径のカテーテル又は内視鏡内でのこの方法の実現は困難であるという問題がある。
図1Aは、本発明の実施形態に係るACPEを使用する装置を示す。光学ガラス20は従来のOCT撮影装置5の撮影路10に位置し、入射フィールドを、光路30と40にそれぞれある2つのビームレット1と2に分割する。ここでの記載において、ビームレットとは光線の一部分と定義する。光学部品により(例えば、光学ガラス20)、入射光線の一部分(ビームレット2)はビームレット1より大きい光路長の遅れとなる。さらに、ビームレット2はビームレット1とは違う角度でサンプルを照射する。レンズを使用し、サンプル(例えば、生物組織)にビームレット1とビームレット2を集束させることができる。その結果、それぞれ異なる角度で得られたサンプル内又は上の標本の多数のOCT画像はOCT表示画面に同時に現れることがある(図1Bを参照)。特に、図1Bによると上部の画像(すなわち、1+1と表示されたもの)が光路1(すなわち、入射と反射)から形成された画像に対応し、真中の画像(すなわち、1+2、2+1と表示されたもの)が光路1入射と光路2反射、そして光路2入射と光路1反射から形成された画像に対応する。更に、図1Bの下部の画像(すなわち、2+2)は光路2(入射と反射)から形成された画像に対応する。
の文献ではOCTのスペックル配分が確率密度関数で表されることを記述する:
Tのサブ画像は一般的に同じ振幅を持たない可能性がある。但し、等方性後方散乱という想定で、これらのサブ画像は元のOCT画像(S0OCT)はβ/m2ほど関連している、但し、βは明瞭なサブ画像に携わる光路長の組合せの数である。この結果、ACPEのSNRは次のように定義する:
本発明において、多偏光OCTシステムはACPEを実現する装置を利用できる(例えば、図1Aに図示)。本発明に係るこのようなシステムを使用すると、OCT画像は毎秒2フレーム(例えば、500軸画素×500横画素)で得ることができ、反対にしたグレー・スケール・テーブルで表示し、デジタル保管できる。このようにOCTシステムに使用できる光源を中心波長が1310nmで帯域幅が70nmとし、これによって、組織内の軸解像度を略8μmで提供できる。
1%の内部脂肪溶液と寒天から成っている固体ファントムを使用して、ACPEによりスペックル減少を測定することができる。例えば、4本の毛をゼリー状の内部脂肪・寒天内に異なった横断位置、且深さに埋め込むことができる。図2Aは、内部脂肪の略図である。図2Bと2Cは、BK7ガラス板がある場合とない場合の対応するOCT画像である。1〜5と表示したROIは、ACPEでSNR改善を測定する位置を表す。BK7ガラス板20(3.1mmのBK7ガラス部品がある)をサンプル部に挿入すると、元のOCT画像(図2C参照)のコピーが3枚形成され、これらの各画像は異なった照明角度で得られ、グループ遅延の増加、例えば800μm、によって分かれている。図2Cの上部及び下部の画像にある信号の振幅は、中央の画像のおよそ半分である(S1OCT/S2OCT=S3OCT/S2OCT=1:2)。図2(D)で示す合成されたACPEの画像は、図2Cに示す3つの画像を干渉がなく平均することによって得ることができる。図2(D)では、多くのスペックルが減少した合成画像を見ることができる。元のOCT画像と比較すると、図2Bに図示す5つの領域ACPE SNR改善の平均は、好ましくは1.54±0.12(平均±標準偏差)である。
SNRの改善を生体内で論証するためには、ACPE OCT撮影を患者の前腕の腹部で行うことができる。図3Aと3Bは、代表的な一組の画像を示す。図3Aは、BK7 ACPE部品の挿入前に生体内で得た前腕の腹部のOCT画像を示す。これらの映像の視覚的な判定によると、合成されたACPEの画像(図3B)の質的な改善が明らかである。表皮(E)と皮膚(D)の間にある境界は、図3Bで示すように、ACPEを利用した方が明確に表れる。さらに、真皮脈管構造と一致する横の構造は図3BのACPE画像で容易に識別される。図3Bにある元のOCT画像とACPEのSNRを測定することができ、1.56というSNRの改善ができる。
2 ビームレット
5 OCT撮影装置
10 撮影路
20 光学ガラス
30 光路
40 光路
50 対物レンズ
Claims (26)
- サンプルを照射する装置は、
a)電磁放射を送る干渉計と、
b)前記サンプルを放射するために、前記電磁放射から少なくとも2つの放射の生成を促進する装置を含み、前記装置は少なくとも2つの放射のうちの第二放射に対して少なくとも2つの放射のうちの第一放射を遅らせるように構成され、該電磁放射を受け取るサンプル部と、を有することを特徴とするサンプルを照射する装置。 - サンプルを照射する装置はさらに、
c)前記干渉計が、前記第一と前記第二とさらなる放射を受け取り、該第一と該第二とさらなる放射に基づく信号を形成し、さらなる電磁放射を提供する基準部と、
d)第一と第二画像が互いに異なり、該第一放射に基づく前記第一画像と該第二放射に基づく前記第二画像を形成する処理装置と、を有することを特徴とする請求項1に記載のサンプルを照射する装置。 - 前記処理装置が前記第一及び前記第二画像に基づいてさらなる画像を形成することを特徴とする請求項2に記載のサンプルを照射する装置。
- 前記さらなる画像に、前記第一画像のノイズ及び前記第二画像のノイズより小さいノイズがあることを特徴とする請求項3に記載のサンプルを照射する装置。
- 少なくとも2つの放射と関連してm=2でN=3の画像が得られることを特徴とする請求項5に記載のサンプルを照射する装置。
- 前記さらなる画像は前記第一及び前記第二画像の数字的な組合せに基づいて形成されることを特徴とする請求項3に記載のサンプルを照射する装置。
- 互いに異なる第一及び第二角度であって、前記サンプルは前記第一角度では前記第一放射によって照射され、該サンプルは前記第二角度では前記第二放射に照射されることを特徴とする請求項2に記載のサンプルを照射する装置。
- 前記第一及び前記第二角度は、前記第一及び前記第二放射のそれぞれの位相と入射角の少なくとも1つと遅れとに基いて、互いに異なることを特徴とする請求項8に記載のサンプルを照射する装置。
- さらに第一の電磁エネルギーを検出する検出器から成り、この検出器は、前記検出されたエネルギーを前記処理装置に伝送することを特徴とする請求項2に記載のサンプルを照射する装置。
- 前記第一放射の遅れが前記第二放射の遅れより大きいもので、装置は、該第一及び該第二放射のそれぞれの1つを遅らせるように各セクションが構成される2つのセクションを具備することを特徴とする請求項1に記載のサンプルを照射する装置。
- 前記第二放射の光路と比較した前記第一放射の光路の遅れは空中で少なくとも500μmであることを特徴とする請求項1に記載のサンプルを照射する装置。
- 前記第二放射の光路と比較される前記第一放射の光路の遅れが空中で少なくとも1mmであることを特徴とする請求項1に記載のサンプルを照射する装置。
- 前記装置は少なくとも1.5の屈折率を有することを特徴とする請求項1に記載のサンプルを照射する装置。
- 前記装置は少なくとも3.0の屈折率を有することを特徴とする請求項1に記載のサンプルを照射する装置。
- 前記装置がシリコンを含むことを特徴とする請求項1に記載のサンプルを照射する装置。
- 前記装置は、少なくとも1つの表面に反射防止の膜が形成されることを特徴とする請求項1に記載のサンプルを照射する装置。
- 前記装置は、反射防止膜BK7ガラスを有することを特徴とする請求項1に記載のサンプルを照射する装置。
- 前記ガラスは、略1.6mm〜略7.7mmの厚さであることを特徴とする請求項16に記載のサンプルを照射する装置。
- 前記ガラスは、略1.51〜略3.5の屈折率であることを特徴とする請求項16に記載のサンプルを照射する装置。
- カテーテルは、
a)電磁放射を送る干渉計と、
b)サンプルを照射するために前記該電磁放射から少なくとも2つの放射の生成を促進する装置を具備し、前記装置は少なくとも2つの放射のうちの第二放射に関して少なくとも2つの放射のうちの第一放射を遅らせるように構成され、前記電磁放射を受け取るサンプル部と、を備えることを特徴とするカテーテル。 - 光学的に干渉する断層撮影画像の検出装置は、
a)電磁放射を送る干渉計と、
b)サンプルを照射するために前記電磁放射から少なくとも2つの放射の生成を促進する装置を具備し、前記装置は少なくとも2つの放射のうちの第二放射に関して少なくとも2つの放射のうちの第一放射を遅らせるように構成され、該電磁放射を受け取るサンプル部と、を備えることを特徴とする光学的に干渉する断層撮影画像の検出装置。 - サンプルを照射する方法は、
a)干渉計から電磁放射を提供する工程と、
b)少なくとも2つの放射のうちの第二放射に対して少なくとも2つの放射のうちの第一放射は遅れ、サンプル部に関しては、サンプルを照射するために前記電磁放射から少なくとも2つの放射の生成を促進する工程と、を有することを特徴とするサンプルを照射する方法。 - 画像撮影する装置は、
a)サンプルを照射するために電磁放射からの少なくとも2つの放射の生成を促進する装置を具備し、前記装置は少なくとも2つの放射のうちの第二放射に関して少なくとも2つの放射のうちの第一放射を遅らせるように構成されている、前記電磁放射を受け取るサンプル部と、
b)前記第一及び前記第二放射は第三放射を干渉し、前記サンプル部からの該第一、該第二放射と基準部からの少なくとも1つの第三放射を受け取るデバイスと、
c)前記第一と前記第二と前記第三放射の少なくとも1つのスペクトルを周波数成分に分ける少なくとも1つの分光分離器と、
d)各検出器が少なくとも1つの周波数の一部を検出することができる複数の検出器を含む少なくとも1つの検出装置と、を有することを特徴とする画像撮影する装置。 - 画像撮影する装置は、
a)サンプル部に少なくとも1つの第一電磁放射と、反射防止された基準部に少なくとも1つの第二電磁放射を提供し、これら放射の周波数が時間とともに変わり、また、前記サンプル部は第一電磁放射を受け取り、前記サンプル部はサンプルを照射するように前記電磁放射からの少なくとも2つの放射の生成を促進する装置を具備し、少なくとも2つの放射のうちの第二放射に対して少なくとも2つの放射のうちの第一放射を遅らせるように構成されている、少なくとも1つの第一装置と、
b)該サンプル部で発生する該第一、該第二放射と前記基準部で発生する該第二電磁放射との間の干渉を検出する少なくとも1つの第二装置と、を有することを特徴とする画像撮影する装置。 - 画像撮影する装置は、
a)サンプル部に少なくとも1つの第一電磁放射と、基準部に少なくとも1つの第二電磁放射を提供し、該第一と第二電磁放射の少なくとも1つが時間とともに変わるスペクトルを有し、前記スペクトルはある一定の時間に多数の周波数を有し、サンプル部は前記第一電磁波を受け取り、前記サンプル部は、サンプルを照射するために該電磁放射から少なくとも2つの放射の発生を促進する装置を具備し、少なくとも2つの放射のうちの第一放射が少なくとも2つの放射のうちの第二放射に対して遅れるように配置されている、少なくとも1つの第一装置と、
b)該サンプル部で発生する該第一、該第二放射と基準部で発生する該第二電磁放射の間の干渉を検出する少なくとも1つの第二装置と、から構成することを特徴とする画像撮影する装置。
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CA2519937A1 (en) | 2004-10-14 |
EP1611470A2 (en) | 2006-01-04 |
EP2436307B1 (en) | 2015-10-21 |
US9226665B2 (en) | 2016-01-05 |
EP1611470A4 (en) | 2009-06-17 |
JP4805142B2 (ja) | 2011-11-02 |
CA2519937C (en) | 2012-11-20 |
JP2011209293A (ja) | 2011-10-20 |
WO2004088361A3 (en) | 2005-04-07 |
US8174702B2 (en) | 2012-05-08 |
AU2004225188B2 (en) | 2010-04-15 |
AU2004225188A1 (en) | 2004-10-14 |
EP1611470B1 (en) | 2015-10-14 |
US20100157309A1 (en) | 2010-06-24 |
US8559012B2 (en) | 2013-10-15 |
US20060227333A1 (en) | 2006-10-12 |
WO2004088361A2 (en) | 2004-10-14 |
JP5571621B2 (ja) | 2014-08-13 |
US7567349B2 (en) | 2009-07-28 |
EP2436307A1 (en) | 2012-04-04 |
US20130314716A1 (en) | 2013-11-28 |
US20120281237A1 (en) | 2012-11-08 |
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