JP2005509275A - Cvd用の複部構成の滑らかな基板支持部材 - Google Patents
Cvd用の複部構成の滑らかな基板支持部材 Download PDFInfo
- Publication number
- JP2005509275A JP2005509275A JP2002592174A JP2002592174A JP2005509275A JP 2005509275 A JP2005509275 A JP 2005509275A JP 2002592174 A JP2002592174 A JP 2002592174A JP 2002592174 A JP2002592174 A JP 2002592174A JP 2005509275 A JP2005509275 A JP 2005509275A
- Authority
- JP
- Japan
- Prior art keywords
- support
- support members
- shelf
- glass substrate
- support member
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/76—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
- H10P72/7604—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
- H10P72/7614—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a plurality of individual support members, e.g. support posts or protrusions
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C17/00—Surface treatment of glass, not in the form of fibres or filaments, by coating
- C03C17/001—General methods for coating; Devices therefor
- C03C17/002—General methods for coating; Devices therefor for flat glass, e.g. float glass
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4581—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber characterised by material of construction or surface finish of the means for supporting the substrate
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/76—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
- H10P72/7604—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
- H10P72/7622—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by supporting substrates others than wafers, e.g. chips
Landscapes
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Geochemistry & Mineralogy (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical Vapour Deposition (AREA)
- Surface Treatment Of Glass (AREA)
- Physical Vapour Deposition (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US29300901P | 2001-05-22 | 2001-05-22 | |
| US09/963,020 US6528767B2 (en) | 2001-05-22 | 2001-09-24 | Pre-heating and load lock pedestal material for high temperature CVD liquid crystal and flat panel display applications |
| PCT/US2002/013993 WO2002095808A1 (en) | 2001-05-22 | 2002-05-02 | Smooth multipart substrate support member for cvd |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2005509275A true JP2005509275A (ja) | 2005-04-07 |
| JP2005509275A5 JP2005509275A5 (https=) | 2008-09-11 |
Family
ID=26967690
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002592174A Pending JP2005509275A (ja) | 2001-05-22 | 2002-05-02 | Cvd用の複部構成の滑らかな基板支持部材 |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US6528767B2 (https=) |
| EP (1) | EP1390968B1 (https=) |
| JP (1) | JP2005509275A (https=) |
| KR (1) | KR100570559B1 (https=) |
| CN (1) | CN1276466C (https=) |
| DE (1) | DE60220787T2 (https=) |
| TW (1) | TW591685B (https=) |
| WO (1) | WO2002095808A1 (https=) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2012023557A1 (ja) * | 2010-08-20 | 2012-02-23 | 昭和電工株式会社 | 化合物半導体の製造装置、化合物半導体の製造方法及び化合物半導体 |
| JP2015536048A (ja) * | 2012-09-28 | 2015-12-17 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 改善されたエッジリングリップ |
| TWI579216B (zh) * | 2013-06-20 | 2017-04-21 | 克及第石墨科技有限公司 | Fixed pin for fixed wafer in crystal boat and its manufacturing method |
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| US20080156657A1 (en) * | 2000-02-17 | 2008-07-03 | Butterfield Paul D | Conductive polishing article for electrochemical mechanical polishing |
| US20040020789A1 (en) * | 2000-02-17 | 2004-02-05 | Applied Materials, Inc. | Conductive polishing article for electrochemical mechanical polishing |
| US7374644B2 (en) * | 2000-02-17 | 2008-05-20 | Applied Materials, Inc. | Conductive polishing article for electrochemical mechanical polishing |
| US6528767B2 (en) * | 2001-05-22 | 2003-03-04 | Applied Materials, Inc. | Pre-heating and load lock pedestal material for high temperature CVD liquid crystal and flat panel display applications |
| KR100429296B1 (ko) * | 2002-09-09 | 2004-04-29 | 한국전자통신연구원 | 반도체 소자 제조 장치 및 이를 이용한 반도체 소자 제조방법 |
| TWI220786B (en) * | 2002-09-11 | 2004-09-01 | Au Optronics Corp | Supporting structure |
| JP2004260174A (ja) * | 2003-02-25 | 2004-09-16 | Samsung Electronics Co Ltd | 半導体素子製造装置 |
| US6917755B2 (en) * | 2003-02-27 | 2005-07-12 | Applied Materials, Inc. | Substrate support |
| US20040226513A1 (en) * | 2003-05-12 | 2004-11-18 | Applied Materials, Inc. | Chamber for uniform heating of large area substrates |
| US6833717B1 (en) * | 2004-02-12 | 2004-12-21 | Applied Materials, Inc. | Electron beam test system with integrated substrate transfer module |
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| US7824498B2 (en) * | 2004-02-24 | 2010-11-02 | Applied Materials, Inc. | Coating for reducing contamination of substrates during processing |
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| US6187134B1 (en) * | 1999-07-09 | 2001-02-13 | The Board Of Trustees Of The Leland Stanford Junior University | Reusable wafer support for semiconductor processing |
| US6322116B1 (en) * | 1999-07-23 | 2001-11-27 | Asm America, Inc. | Non-contact end effector |
| US6452195B1 (en) * | 1999-08-18 | 2002-09-17 | Ibis Technology Corporation | Wafer holding pin |
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| US20030072639A1 (en) * | 2001-10-17 | 2003-04-17 | Applied Materials, Inc. | Substrate support |
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-
2002
- 2002-05-02 EP EP02736640A patent/EP1390968B1/en not_active Expired - Lifetime
- 2002-05-02 WO PCT/US2002/013993 patent/WO2002095808A1/en not_active Ceased
- 2002-05-02 DE DE60220787T patent/DE60220787T2/de not_active Expired - Lifetime
- 2002-05-02 CN CNB028124952A patent/CN1276466C/zh not_active Expired - Fee Related
- 2002-05-02 JP JP2002592174A patent/JP2005509275A/ja active Pending
- 2002-05-02 KR KR1020037015225A patent/KR100570559B1/ko not_active Expired - Fee Related
- 2002-05-14 TW TW091110067A patent/TW591685B/zh not_active IP Right Cessation
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2003
- 2003-03-04 US US10/379,520 patent/US6924462B2/en not_active Expired - Lifetime
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| JPH0666381B2 (ja) * | 1989-05-18 | 1994-08-24 | 株式会社エンヤシステム | ウエハチヤツク方法及び装置 |
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| WO1999053603A1 (en) * | 1998-04-10 | 1999-10-21 | Varian Semiconductor Equipment Associates, Inc. | Electrostatic wafer clamp having low particulate contamination of wafers |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2012023557A1 (ja) * | 2010-08-20 | 2012-02-23 | 昭和電工株式会社 | 化合物半導体の製造装置、化合物半導体の製造方法及び化合物半導体 |
| JP2012044030A (ja) * | 2010-08-20 | 2012-03-01 | Showa Denko Kk | 化合物半導体の製造装置、化合物半導体の製造方法及び化合物半導体 |
| US9064696B2 (en) | 2010-08-20 | 2015-06-23 | Toyoda Gosei Co., Ltd. | Apparatus for manufacturing compound semiconductor, method for manufacturing compound semiconductor, and compound semiconductor |
| JP2015536048A (ja) * | 2012-09-28 | 2015-12-17 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 改善されたエッジリングリップ |
| TWI579216B (zh) * | 2013-06-20 | 2017-04-21 | 克及第石墨科技有限公司 | Fixed pin for fixed wafer in crystal boat and its manufacturing method |
Also Published As
| Publication number | Publication date |
|---|---|
| US6924462B2 (en) | 2005-08-02 |
| CN1276466C (zh) | 2006-09-20 |
| US6528767B2 (en) | 2003-03-04 |
| EP1390968B1 (en) | 2007-06-20 |
| DE60220787D1 (de) | 2007-08-02 |
| WO2002095808A1 (en) | 2002-11-28 |
| US20030164362A1 (en) | 2003-09-04 |
| TW591685B (en) | 2004-06-11 |
| US20020175160A1 (en) | 2002-11-28 |
| EP1390968A1 (en) | 2004-02-25 |
| CN1518757A (zh) | 2004-08-04 |
| DE60220787T2 (de) | 2008-04-10 |
| KR20040007594A (ko) | 2004-01-24 |
| KR100570559B1 (ko) | 2006-04-13 |
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