JP6342998B2 - 可溶性金属酸化物カルボキシレートのスピンオン組成物及びそれらの使用方法 - Google Patents
可溶性金属酸化物カルボキシレートのスピンオン組成物及びそれらの使用方法 Download PDFInfo
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- JP6342998B2 JP6342998B2 JP2016522511A JP2016522511A JP6342998B2 JP 6342998 B2 JP6342998 B2 JP 6342998B2 JP 2016522511 A JP2016522511 A JP 2016522511A JP 2016522511 A JP2016522511 A JP 2016522511A JP 6342998 B2 JP6342998 B2 JP 6342998B2
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- Prior art keywords
- metal oxide
- dicarboxylate
- composition
- ester
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- 0 C*(C)C(*)(*)C(*)(*)[N+]([O-])O* Chemical compound C*(C)C(*)(*)C(*)(*)[N+]([O-])O* 0.000 description 1
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Classifications
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/092—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers characterised by backside coating or layers, by lubricating-slip layers or means, by oxygen barrier layers or by stripping-release layers or means
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/06—Coating on selected surface areas, e.g. using masks
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/02—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition
- C23C18/12—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material
- C23C18/1204—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by thermal decomposition characterised by the deposition of inorganic material other than metallic material inorganic material, e.g. non-oxide and non-metallic such as sulfides, nitrides based compounds
- C23C18/1208—Oxides, e.g. ceramics
- C23C18/1216—Metal oxides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/14—Decomposition by irradiation, e.g. photolysis, particle radiation or by mixed irradiation sources
- C23C18/143—Radiation by light, e.g. photolysis or pyrolysis
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/09—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers
- G03F7/091—Photosensitive materials characterised by structural details, e.g. supports, auxiliary layers characterised by antireflection means or light filtering or absorbing means, e.g. anti-halation, contrast enhancement
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P76/00—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography
- H10P76/20—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising organic materials
- H10P76/204—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising organic materials of organic photoresist masks
- H10P76/2041—Photolithographic processes
- H10P76/2043—Photolithographic processes using an anti-reflective coating
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Architecture (AREA)
- Structural Engineering (AREA)
- General Physics & Mathematics (AREA)
- Thermal Sciences (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Materials For Photolithography (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Paints Or Removers (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/930,711 US9201305B2 (en) | 2013-06-28 | 2013-06-28 | Spin-on compositions of soluble metal oxide carboxylates and methods of their use |
| US13/930,711 | 2013-06-28 | ||
| PCT/EP2014/063593 WO2014207142A1 (en) | 2013-06-28 | 2014-06-26 | Spin-on compositions of soluble metal oxide carboxylates and methods of their use |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2016532739A JP2016532739A (ja) | 2016-10-20 |
| JP2016532739A5 JP2016532739A5 (https=) | 2017-03-23 |
| JP6342998B2 true JP6342998B2 (ja) | 2018-06-13 |
Family
ID=51063419
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016522511A Active JP6342998B2 (ja) | 2013-06-28 | 2014-06-26 | 可溶性金属酸化物カルボキシレートのスピンオン組成物及びそれらの使用方法 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US9201305B2 (https=) |
| EP (1) | EP3014358B1 (https=) |
| JP (1) | JP6342998B2 (https=) |
| KR (1) | KR102128141B1 (https=) |
| CN (1) | CN105209973B (https=) |
| SG (1) | SG11201507487TA (https=) |
| TW (1) | TWI606098B (https=) |
| WO (1) | WO2014207142A1 (https=) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP4239409A1 (en) | 2022-03-03 | 2023-09-06 | Shin-Etsu Chemical Co., Ltd. | Composition for forming metal oxide film, patterning process, and method for forming metal oxide film |
| EP4276535A1 (en) | 2022-05-10 | 2023-11-15 | Shin-Etsu Chemical Co., Ltd. | Composition for forming metal oxide film, patterning process, and method for forming metal oxide film |
| EP4592753A2 (en) | 2024-01-23 | 2025-07-30 | Shin-Etsu Chemical Co., Ltd. | Composition for forming metal-containing film and patterning process |
| EP4606882A1 (en) | 2024-02-20 | 2025-08-27 | Shin-Etsu Chemical Co., Ltd. | Cleaning solution, method for cleaning substrate, and method for forming metal-containing film |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5889568B2 (ja) | 2011-08-11 | 2016-03-22 | メルク、パテント、ゲゼルシャフト、ミット、ベシュレンクテル、ハフツングMerck Patent GmbH | 酸化タングステン膜形成用組成物およびそれを用いた酸化タングステン膜の製造法 |
| US9315636B2 (en) | 2012-12-07 | 2016-04-19 | Az Electronic Materials (Luxembourg) S.A.R.L. | Stable metal compounds, their compositions and methods |
| US9296922B2 (en) * | 2013-08-30 | 2016-03-29 | Az Electronic Materials (Luxembourg) S.A.R.L. | Stable metal compounds as hardmasks and filling materials, their compositions and methods of use |
| US9418836B2 (en) | 2014-01-14 | 2016-08-16 | Az Electronic Materials (Luxembourg) S.A.R.L. | Polyoxometalate and heteropolyoxometalate compositions and methods for their use |
| US9409793B2 (en) | 2014-01-14 | 2016-08-09 | Az Electronic Materials (Luxembourg) S.A.R.L. | Spin coatable metallic hard mask compositions and processes thereof |
| US9499698B2 (en) * | 2015-02-11 | 2016-11-22 | Az Electronic Materials (Luxembourg)S.A.R.L. | Metal hardmask composition and processes for forming fine patterns on semiconductor substrates |
| TW201741766A (zh) * | 2015-12-17 | 2017-12-01 | 陶氏全球科技責任有限公司 | 具有高介電常數之光可成像薄膜 |
| US10241409B2 (en) * | 2015-12-22 | 2019-03-26 | AZ Electronic Materials (Luxembourg) S.à.r.l. | Materials containing metal oxides, processes for making same, and processes for using same |
| CN109153884B (zh) * | 2016-05-19 | 2021-03-09 | 三井化学株式会社 | 含金属膜形成用组合物、含金属膜形成用组合物的制造方法、半导体装置以及半导体装置的制造方法 |
| EP3559746B1 (en) * | 2016-12-21 | 2021-03-31 | Merck Patent GmbH | Composition of spin-on materials containing metal oxide nanoparticles and an organic polymer |
| CN110418811B (zh) | 2017-03-16 | 2022-05-13 | 默克专利股份有限公司 | 光刻组合物及其使用方法 |
| TWI755564B (zh) * | 2017-09-06 | 2022-02-21 | 德商馬克專利公司 | 含有旋轉塗佈無機氧化物的組合物、製造電子裝置之方法以及在矽基板上塗佈硬遮罩組合物之方法 |
| US11276572B2 (en) * | 2017-12-08 | 2022-03-15 | Tokyo Electron Limited | Technique for multi-patterning substrates |
| US10354922B1 (en) | 2017-12-27 | 2019-07-16 | International Business Machines Corporation | Simplified block patterning with wet strippable hardmask for high-energy implantation |
| KR102626153B1 (ko) | 2019-07-08 | 2024-01-16 | 메르크 파텐트 게엠베하 | 에지 보호층 및 잔류 금속 하드마스크 성분을 제거하기 위한 린스 및 이의 사용 방법 |
| US20210389670A1 (en) * | 2020-06-12 | 2021-12-16 | Taiwan Semiconductor Manufacturing Co., Ltd. | Photoresist composition and method of manufacturing a semiconductor device |
| CN112462572B (zh) * | 2020-12-09 | 2022-08-16 | 清华大学 | 光刻胶、光刻胶的图案化方法及生成印刷电路板的方法 |
| JPWO2022138010A1 (https=) * | 2020-12-24 | 2022-06-30 | ||
| WO2022233919A2 (en) | 2021-05-06 | 2022-11-10 | Merck Patent Gmbh | Spin on metal-organic formulations |
| KR20240037974A (ko) * | 2021-07-28 | 2024-03-22 | 제이에스알 가부시끼가이샤 | 레지스트 하층막 형성용 조성물, 반도체 기판의 제조 방법 및 레지스트 하층막의 형성 방법 |
| JPWO2023136260A1 (https=) * | 2022-01-14 | 2023-07-20 |
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| EP4239409A1 (en) | 2022-03-03 | 2023-09-06 | Shin-Etsu Chemical Co., Ltd. | Composition for forming metal oxide film, patterning process, and method for forming metal oxide film |
| KR20230130557A (ko) | 2022-03-03 | 2023-09-12 | 신에쓰 가가꾸 고교 가부시끼가이샤 | 금속 산화막 형성용 조성물, 패턴 형성 방법 및 금속 산화막 형성 방법 |
| EP4276535A1 (en) | 2022-05-10 | 2023-11-15 | Shin-Etsu Chemical Co., Ltd. | Composition for forming metal oxide film, patterning process, and method for forming metal oxide film |
| KR20230157882A (ko) | 2022-05-10 | 2023-11-17 | 신에쓰 가가꾸 고교 가부시끼가이샤 | 금속 산화막 형성용 조성물, 패턴 형성 방법 및 금속 산화막 형성 방법 |
| EP4592753A2 (en) | 2024-01-23 | 2025-07-30 | Shin-Etsu Chemical Co., Ltd. | Composition for forming metal-containing film and patterning process |
| KR20250115331A (ko) | 2024-01-23 | 2025-07-30 | 신에쓰 가가꾸 고교 가부시끼가이샤 | 금속 함유막 형성용 조성물, 패턴 형성 방법 |
| EP4606882A1 (en) | 2024-02-20 | 2025-08-27 | Shin-Etsu Chemical Co., Ltd. | Cleaning solution, method for cleaning substrate, and method for forming metal-containing film |
| KR20250128245A (ko) | 2024-02-20 | 2025-08-27 | 신에쓰 가가꾸 고교 가부시끼가이샤 | 세정액, 기판의 세정 방법 및 금속 함유막의 형성 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20150004801A1 (en) | 2015-01-01 |
| SG11201507487TA (en) | 2015-10-29 |
| EP3014358A1 (en) | 2016-05-04 |
| KR20160025508A (ko) | 2016-03-08 |
| JP2016532739A (ja) | 2016-10-20 |
| KR102128141B1 (ko) | 2020-06-30 |
| TW201512325A (zh) | 2015-04-01 |
| US9201305B2 (en) | 2015-12-01 |
| WO2014207142A1 (en) | 2014-12-31 |
| TWI606098B (zh) | 2017-11-21 |
| EP3014358B1 (en) | 2017-08-16 |
| CN105209973A (zh) | 2015-12-30 |
| CN105209973B (zh) | 2019-08-13 |
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