JP2020187141A - 試験室試料分配システムおよび試験室自動化システム - Google Patents
試験室試料分配システムおよび試験室自動化システム Download PDFInfo
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- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/04—Details of the conveyor system
- G01N2035/0474—Details of actuating means for conveyors or pipettes
- G01N2035/0477—Magnetic
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
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- G01N2035/0474—Details of actuating means for conveyors or pipettes
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- G01—MEASURING; TESTING
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- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/04—Details of the conveyor system
- G01N2035/0496—Other details
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- G—PHYSICS
- G01—MEASURING; TESTING
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- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
- G01N35/1004—Cleaning sample transfer devices
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Abstract
Description
スは、搬送平面を清掃するために人の手による動作が必要とされないように、制御デバイスによって制御され得る。搬送平面を清掃するために試験室試料分配システムの動作を止めることも必要とされない。清掃デバイスは、通常動作中、試料容器キャリアと同じように移動し得る。清掃デバイスは、全搬送平面の連続的な清掃が提供されるように、搬送平面にわたって駆動され得る。
容器キャリアおよび清掃デバイスに磁気駆動力が印加されるように、電磁アクチュエータによって生成される磁場と相互作用するための磁気作動デバイスを含む。磁気作動デバイスは、永久磁石として具現化され得る。
20 第1の分析ステーション、第1の試験室ステーション
30 第2の分析ステーション、第2の試験室ステーション
100 試験室試料分配システム
110 搬送平面
120 電磁アクチュエータ
125 強磁性コア
130 位置センサ
140 試料容器キャリア
145 試料容器
150 制御デバイス
200 清掃デバイス
210 本体
220 清掃布
230 永久磁石
240 容器
241 清掃流体
242 弁
244 出口開口部
246 受信機
Claims (12)
- − 1つまたは複数の試料容器(145)を搬送するように適合されたいくつかの試料容器キャリア(140)と、
− 清掃デバイス(200)と、
− 前記試料容器キャリア(140)および前記清掃デバイス(200)を支持するように適合された搬送平面(110)と、
− 前記試料容器キャリア(140)および前記清掃デバイス(200)を前記搬送平面(110)上で移動させるように適合された駆動手段(120)と、
− 前記試料容器キャリア(140)が対応する搬送経路に沿って移動し前記清掃デバイス(200)が清掃経路に沿って移動するように前記駆動手段(120)を駆動させることによって、前記搬送平面(110)の上で前記試料容器キャリア(140)の動きを制御しかつ前記清掃デバイス(200)の動きを制御するように構成された制御デバイス(150)とを備え、
− 前記清掃デバイス(200)が、前記搬送平面(110)を清掃するのに適合された清掃手段(220)を備える、試験室試料分配システム(100)。 - − 前記清掃手段(220)が清掃布を含む
ことを特徴とする、
請求項1に記載の試験室試料分配システム(100)。 - − 前記清掃布が帯電防止清掃布である
ことを特徴とする、
請求項2に記載の試験室試料分配システム(100)。 - − 前記清掃布がマイクロファイバ清掃布である
ことを特徴とする、
請求項2または3に記載の試験室試料分配システム(100)。 - − 前記清掃デバイス(200)が、清掃流体(241)を蓄えるための容器(240)と、前記搬送平面(110)上に前記清掃流体を散布するための散布手段(242、244、246)とを備える
ことを特徴とする、
請求項1から4のいずれか一項に記載の試験室試料分配システム(100)。 - − 前記清掃デバイス(200)が、前記搬送平面(110)または前記搬送平面(110)の一部に放電するように適合された静電気放電手段を備える
ことを特徴とする、
請求項1から5のいずれか一項に記載の試験室試料分配システム(100)。 - − 前記制御デバイス(150)が、前記試料容器キャリア(140)が前記清掃デバイス(200)に対して優先権を有するように、前記試料容器キャリア(140)の動きを制御しかつ前記清掃デバイス(200)の動きを制御するように構成される
ことを特徴とする、
請求項1から6のいずれか一項に記載の試験室試料分配システム(100)。 - − 前記制御デバイス(150)が、前記清掃デバイス(200)の清掃機能を作動させ、特に清掃流体(241)の散布を作動させるように構成される
ことを特徴とする、
請求項1から7のいずれか一項に記載の試験室試料分配システム(100)。 - − 前記清掃デバイス(200)および前記試料容器キャリア(140)が、同一の水平断面を有する
ことを特徴とする、
請求項1から8のいずれか一項に記載の試験室試料分配システム(100)。 - − 前記駆動手段(120)が、前記搬送平面(110)の下方に位置し、前記制御デバイス(150)によって制御可能である電磁アクチュエータ(120)として形成され、
− 前記試料容器キャリア(140)および前記清掃デバイス(200)が、それぞれ、前記試料容器キャリア(140)および前記清掃デバイス(200)に磁気駆動力が印加されるように前記電磁アクチュエータ(120)によって生成される磁場と相互作用するための磁気作動デバイス(230)を含む
ことを特徴とする、
請求項1から9のいずれか一項に記載の試験室試料分配システム(100)。 - − 前記駆動手段(120)が、前記試料容器キャリア(140)内および前記清掃デバイス(200)内に位置し、前記制御デバイス(150)によって制御可能な電気モータによって駆動される車輪として形成される
ことを特徴とする、
請求項1から9のいずれか一項に記載の試験室試料分配システム(100)。 - − いくつかの試験室ステーション(20、30)、好ましくは分析前ステーション、分析ステーション、および/または分析後ステーションと、
− 請求項1から11のいずれか一項に記載の試験室試料分配システム(100)と
を備える、試験室自動化システム(10)。
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EP15160360.2A EP3073270B1 (en) | 2015-03-23 | 2015-03-23 | Laboratory sample distribution system and laboratory automation system |
EP15160360.2 | 2015-03-23 |
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