JP6055503B2 - 試料分配システムおよび実験室自動化システム - Google Patents
試料分配システムおよび実験室自動化システム Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
- G01N35/1081—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices characterised by the means for relatively moving the transfer device and the containers in an horizontal plane
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
- G01N27/22—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating capacitance
- G01N27/24—Investigating the presence of flaws
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N2035/00178—Special arrangements of analysers
- G01N2035/00277—Special precautions to avoid contamination (e.g. enclosures, glove- boxes, sealed sample carriers, disposal of contaminated material)
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/04—Details of the conveyor system
- G01N2035/0401—Sample carriers, cuvettes or reaction vessels
- G01N2035/0406—Individual bottles or tubes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/04—Details of the conveyor system
- G01N2035/0401—Sample carriers, cuvettes or reaction vessels
- G01N2035/0429—Sample carriers adapted for special purposes
- G01N2035/0432—Sample carriers adapted for special purposes integrated with measuring devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/04—Details of the conveyor system
- G01N2035/0401—Sample carriers, cuvettes or reaction vessels
- G01N2035/0437—Cleaning cuvettes or reaction vessels
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
- G01N35/04—Details of the conveyor system
- G01N2035/0474—Details of actuating means for conveyors or pipettes
- G01N2035/0477—Magnetic
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Description
− 少なくとも1つの試料容器を搬送するように各々が適合された、いくつかの試料容器搬送装置と、
− いくつかの試料容器搬送装置を搬送するように適合された輸送表面と、
− 試料容器搬送装置を輸送表面上で移動させるように適合された駆動手段と、
− 輸送表面上の汚れを検出するように適合された汚れ検出装置と
を備える試料分配システムに関する。
汚れ検出装置は、特に、汚れの場所、程度、タイプ、領域、厚さ、および/または何らかの他の特性などのパラメータを検出するように適合され得る。これに応じて、たとえば適切な対策が適合した方法で開始されることが可能である。
− それぞれの試料容器搬送装置は、少なくとも1つの磁気的に活性な要素であって、少なくとも1つの電磁作動装置によって生成された磁場と相互作用するように適合され、それにより、駆動力が試料容器搬送装置にかけられる、少なくとも1つの磁気的に活性な要素を備え、
− 駆動手段は、いくつかの電磁作動装置であって、輸送表面の下方に静的に配置され、磁気力を試料容器搬送装置上にかけることによって、輸送表面上に配置された試料容器搬送装置を移動させるように適合される、電磁作動装置を備え、
− 試料分配システムは、制御装置であって、輸送表面の下方に配置された電磁作動装置を始動するように適合され、それにより、それぞれの試料容器搬送装置は、輸送表面上で、特に2次元的に事前規定可能な移動通路に沿って移動する、制御装置を備える。
別の実施形態によれば、
− 駆動手段は、それぞれの試料容器搬送装置内の駆動装置として適合され、
− 試料分配システムは、制御装置であって、それぞれの試料容器搬送装置の駆動装置を始動させるように適合され、それにより、それぞれの試料容器搬送装置は、輸送表面上で事前規定可能な移動通路に沿って移動する、制御装置を備える。
図示されるように、場115の各々には、電磁石120が割り当てられ、または電磁石は割り当てられない。場115は、いずれの場合も、正方形であり、輸送表面110にわたって互いに並行して一様に分散される。
Claims (8)
- 試料分配システム(100)であって、
少なくとも1つの試料容器(145)を搬送するように各々が適合された、いくつかの試料容器搬送装置(140)と、
前記いくつかの試料容器搬送装置(140)を搬送するように適合された輸送表面(110)と、
いくつかの電磁作動装置(120)であって、前記輸送表面(110)の下方に静的に配置され、磁気力を前記試料容器搬送装置(140)上にかけることによって、前記輸送表面(110)上に配置された試料容器搬送装置(140)を移動させるように適合される、いくつかの電磁作動装置(120)と、
制御装置(150)であって、前記電磁作動装置(120)を始動するように適合され、それにより、それぞれの試料容器搬送装置(140)が、前記輸送表面(110)上で、事前規定可能な移動通路に沿って移動する、制御装置(150)と、
前記輸送表面(110)上の汚れ(160)を検出するように適合された汚れ検出装置(111)とを備え、
前記汚れ検出装置(111)が、静電容量接触感知領域(112)を含む、試料分配システム(100)。 - 前記汚れ検出装置(111)が、いくつかのセンサ場(115)を含み、前記センサ場(115)が、前記輸送表面(110)にわたって分散されることを特徴とする、請求項1に記載の試料分配システム(100)。
- 各々の試料容器搬送装置(140)が、汚れセンサ(142)を備え、前記汚れセンサ(142)は、前記汚れ検出装置(111)の構成要素部分であることを特徴とする、請求項1または2に記載の試料分配システム(100)。
- 前記制御装置(150)が、前記汚れ検出装置(111)と信号接続しており、前記制御装置(150)は、検出された汚れ(160)に応じて前記試料容器搬送装置(140)の移動を制御するように適合されることを特徴とする、請求項1から3のいずれか一項に記載の試料分配システム(100)。
- 前記汚れ検出装置(111)が、前記輸送表面(110)上の汚れ(160)の位置を決定するように適合され、前記制御装置(150)は、それぞれの試料容器搬送装置(140)の移動通路を規定するように適合され、それにより、前記容器搬送装置(140)は、汚れ(160)の位置にわたって進まないことを特徴とする、請求項4に記載の試料分配システム(100)。
- 前記制御装置(150)が、汚れ(160)の検出後、汚れ(160)の位置、または前記汚れから事前に規定可能な距離を離して位置する試料容器搬送装置(140)を停止させるように適合されることを特徴とする、請求項5に記載の試料分配システム(100)。
- 前記制御装置(150)が、汚れ(160)の検出後にすべての前記試料容器搬送装置(140)を停止させるように適合されることを特徴とする、請求項1から6のいずれか一項に記載の試料分配システム(100)。
- 実験室自動化システムであって、
試料容器および/または前記試料容器内の試料を処理するように適合された、いくつかの事前分析ステーション、分析ステーションおよび/または事後分析ステーションと、
請求項1から7のいずれか一項に記載の、試料容器を前記事前分析ステーションと、分析ステーションと、事後分析ステーションの間で輸送するための試料分配システムとを備える、実験室自動化システム。
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EP14162952.7 | 2014-03-31 | ||
EP14162952.7A EP2927695B1 (de) | 2014-03-31 | 2014-03-31 | Probenverteilungssystem und Laborautomatisierungssystem |
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JP2015197437A JP2015197437A (ja) | 2015-11-09 |
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US9658241B2 (en) | 2017-05-23 |
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