JP2001338489A - 半導体装置 - Google Patents
半導体装置Info
- Publication number
- JP2001338489A JP2001338489A JP2000152651A JP2000152651A JP2001338489A JP 2001338489 A JP2001338489 A JP 2001338489A JP 2000152651 A JP2000152651 A JP 2000152651A JP 2000152651 A JP2000152651 A JP 2000152651A JP 2001338489 A JP2001338489 A JP 2001338489A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- power supply
- address
- signal
- refresh
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/406—Management or control of the refreshing or charge-regeneration cycles
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/406—Management or control of the refreshing or charge-regeneration cycles
- G11C11/40615—Internal triggering or timing of refresh, e.g. hidden refresh, self refresh, pseudo-SRAMs
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/406—Management or control of the refreshing or charge-regeneration cycles
- G11C11/40622—Partial refresh of memory arrays
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/4074—Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
- G11C2207/22—Control and timing of internal memory operations
- G11C2207/2227—Standby or low power modes
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2211/00—Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C2211/401—Indexing scheme relating to cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C2211/406—Refreshing of dynamic cells
- G11C2211/4067—Refresh in standby or low power modes
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
- Logic Circuits (AREA)
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000152651A JP2001338489A (ja) | 2000-05-24 | 2000-05-24 | 半導体装置 |
| US09/778,062 US6414894B2 (en) | 2000-05-24 | 2001-02-07 | Semiconductor device with reduced current consumption in standby state |
| DE10110157A DE10110157B4 (de) | 2000-05-24 | 2001-03-02 | Halbleitervorrichtung mit verringertem Stromverbrauch im Standby-Zustand |
| KR10-2001-0019955A KR100408615B1 (ko) | 2000-05-24 | 2001-04-13 | 스탠바이시에 소비 전류를 삭감 가능한 반도체 장치 |
| US10/167,437 US6597617B2 (en) | 2000-05-24 | 2002-06-13 | Semiconductor device with reduced current consumption in standby state |
| US10/607,259 US6868029B2 (en) | 2000-05-24 | 2003-06-27 | Semiconductor device with reduced current consumption in standby state |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000152651A JP2001338489A (ja) | 2000-05-24 | 2000-05-24 | 半導体装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2001338489A true JP2001338489A (ja) | 2001-12-07 |
| JP2001338489A5 JP2001338489A5 (enExample) | 2007-06-07 |
Family
ID=18658046
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000152651A Pending JP2001338489A (ja) | 2000-05-24 | 2000-05-24 | 半導体装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (3) | US6414894B2 (enExample) |
| JP (1) | JP2001338489A (enExample) |
| KR (1) | KR100408615B1 (enExample) |
| DE (1) | DE10110157B4 (enExample) |
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20030009125A (ko) * | 2001-06-15 | 2003-01-29 | 미쓰비시덴키 가부시키가이샤 | 반도체 기억 장치 |
| US6819618B2 (en) | 2003-02-25 | 2004-11-16 | Renesas Technology Corp. | Semiconductor memory device capable of executing refresh operation according to refresh space |
| JP2006500711A (ja) * | 2002-09-25 | 2006-01-05 | インフィネオン テヒノロギーズ アーゲー | メモリ・アレイを有するic用更新制御回路 |
| US6992946B2 (en) | 2003-01-30 | 2006-01-31 | Renesas Technology Corp. | Semiconductor device with reduced current consumption in standby state |
| JP2007066463A (ja) * | 2005-09-01 | 2007-03-15 | Renesas Technology Corp | 半導体装置 |
| JP2008071371A (ja) * | 2002-10-29 | 2008-03-27 | Renesas Technology Corp | メモリ制御システム |
| JP2008078892A (ja) * | 2006-09-20 | 2008-04-03 | Matsushita Electric Ind Co Ltd | 半導体集積回路装置及び電子装置 |
| US7460428B2 (en) | 2005-07-11 | 2008-12-02 | Samsung Electronics Co., Ltd. | Dynamic random access memory and communications terminal including the same |
| JP2009009680A (ja) * | 2007-05-25 | 2009-01-15 | Nec Electronics Corp | 半導体装置 |
| US7692978B2 (en) | 2007-05-25 | 2010-04-06 | Nec Electronics Corporation | Semiconductor device that uses a plurality of source voltages |
Families Citing this family (94)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2000070621A1 (fr) * | 1999-05-14 | 2000-11-23 | Hitachi, Ltd. | Dispositif a circuit integre a semi-conducteurs |
| JP3534681B2 (ja) * | 2000-06-01 | 2004-06-07 | 松下電器産業株式会社 | 半導体記憶装置 |
| US7733069B2 (en) | 2000-09-29 | 2010-06-08 | Canon Kabushiki Kaisha | Power converting apparatus and power generating apparatus |
| US6449203B1 (en) * | 2001-03-08 | 2002-09-10 | Micron Technology, Inc. | Refresh controller and address remapping circuit and method for dual mode full/reduced density DRAMs |
| KR100421904B1 (ko) * | 2001-03-21 | 2004-03-10 | 주식회사 하이닉스반도체 | 반도체 소자의 리프래쉬 회로 |
| US6590822B2 (en) * | 2001-05-07 | 2003-07-08 | Samsung Electronics Co., Ltd. | System and method for performing partial array self-refresh operation in a semiconductor memory device |
| JP2003068076A (ja) * | 2001-08-27 | 2003-03-07 | Elpida Memory Inc | 半導体記憶装置の電力制御方法及び半導体記憶装置 |
| US6771553B2 (en) | 2001-10-18 | 2004-08-03 | Micron Technology, Inc. | Low power auto-refresh circuit and method for dynamic random access memories |
| US6751159B2 (en) * | 2001-10-26 | 2004-06-15 | Micron Technology, Inc. | Memory device operable in either a high-power, full-page size mode or a low-power, reduced-page size mode |
| US6807122B2 (en) * | 2001-11-14 | 2004-10-19 | Hitachi, Ltd. | Semiconductor memory device requiring refresh |
| US6838331B2 (en) * | 2002-04-09 | 2005-01-04 | Micron Technology, Inc. | Method and system for dynamically operating memory in a power-saving error correction mode |
| US6751143B2 (en) * | 2002-04-11 | 2004-06-15 | Micron Technology, Inc. | Method and system for low power refresh of dynamic random access memories |
| KR100452319B1 (ko) * | 2002-05-10 | 2004-10-12 | 삼성전자주식회사 | 반도체 메모리 장치의 내부전원전압 발생회로 및내부전원전압 제어방법 |
| US6731548B2 (en) * | 2002-06-07 | 2004-05-04 | Micron Technology, Inc. | Reduced power registered memory module and method |
| JP4041358B2 (ja) * | 2002-07-04 | 2008-01-30 | 富士通株式会社 | 半導体メモリ |
| US7149824B2 (en) | 2002-07-10 | 2006-12-12 | Micron Technology, Inc. | Dynamically setting burst length of memory device by applying signal to at least one external pin during a read or write transaction |
| KR100881815B1 (ko) * | 2002-07-12 | 2009-02-03 | 주식회사 하이닉스반도체 | 반도체 메모리 장치 |
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| KR100557590B1 (ko) * | 2002-12-26 | 2006-03-03 | 주식회사 하이닉스반도체 | 반도체 메모리 장치의 오토 리프레시 제어회로 |
| US7039818B2 (en) * | 2003-01-22 | 2006-05-02 | Texas Instruments Incorporated | Low leakage SRAM scheme |
| KR100524950B1 (ko) * | 2003-02-28 | 2005-11-01 | 삼성전자주식회사 | 전류 소모를 줄이는 인터페이싱 회로 |
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| KR100591759B1 (ko) * | 2003-12-03 | 2006-06-22 | 삼성전자주식회사 | 반도체 메모리의 전원 공급장치 |
| KR100596434B1 (ko) * | 2003-12-29 | 2006-07-05 | 주식회사 하이닉스반도체 | 레이아웃 면적을 줄일 수 있는 반도체 메모리 장치 |
| US7342841B2 (en) * | 2004-12-21 | 2008-03-11 | Intel Corporation | Method, apparatus, and system for active refresh management |
| US8438328B2 (en) | 2008-02-21 | 2013-05-07 | Google Inc. | Emulation of abstracted DIMMs using abstracted DRAMs |
| US8041881B2 (en) | 2006-07-31 | 2011-10-18 | Google Inc. | Memory device with emulated characteristics |
| US7580312B2 (en) | 2006-07-31 | 2009-08-25 | Metaram, Inc. | Power saving system and method for use with a plurality of memory circuits |
| US8089795B2 (en) | 2006-02-09 | 2012-01-03 | Google Inc. | Memory module with memory stack and interface with enhanced capabilities |
| US8130560B1 (en) | 2006-11-13 | 2012-03-06 | Google Inc. | Multi-rank partial width memory modules |
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| US9542352B2 (en) | 2006-02-09 | 2017-01-10 | Google Inc. | System and method for reducing command scheduling constraints of memory circuits |
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| KR20200033690A (ko) * | 2018-09-20 | 2020-03-30 | 에스케이하이닉스 주식회사 | 파워다운모드를 제공하는 반도체장치 및 이를 사용하여 파워다운모드를 제어하는 방법 |
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| US11495276B2 (en) | 2020-05-07 | 2022-11-08 | SK Hynix Inc. | Electronic devices for controlling clock generation |
| KR102749604B1 (ko) * | 2020-09-24 | 2025-01-02 | 에스케이하이닉스 주식회사 | 파워게이팅동작을 수행하는 장치 |
| KR20240117196A (ko) | 2023-01-25 | 2024-08-01 | 삼성전자주식회사 | 클럭 드라이버, 이의 동작 방법, 클럭 드라이버를 포함하는 메모리 장치, 및 메모리 시스템 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| KR20030009125A (ko) * | 2001-06-15 | 2003-01-29 | 미쓰비시덴키 가부시키가이샤 | 반도체 기억 장치 |
| JP2006500711A (ja) * | 2002-09-25 | 2006-01-05 | インフィネオン テヒノロギーズ アーゲー | メモリ・アレイを有するic用更新制御回路 |
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| US6819618B2 (en) | 2003-02-25 | 2004-11-16 | Renesas Technology Corp. | Semiconductor memory device capable of executing refresh operation according to refresh space |
| US7460428B2 (en) | 2005-07-11 | 2008-12-02 | Samsung Electronics Co., Ltd. | Dynamic random access memory and communications terminal including the same |
| JP2007066463A (ja) * | 2005-09-01 | 2007-03-15 | Renesas Technology Corp | 半導体装置 |
| JP2008078892A (ja) * | 2006-09-20 | 2008-04-03 | Matsushita Electric Ind Co Ltd | 半導体集積回路装置及び電子装置 |
| JP2009009680A (ja) * | 2007-05-25 | 2009-01-15 | Nec Electronics Corp | 半導体装置 |
| JP2009193666A (ja) * | 2007-05-25 | 2009-08-27 | Nec Electronics Corp | 半導体装置 |
| US7692978B2 (en) | 2007-05-25 | 2010-04-06 | Nec Electronics Corporation | Semiconductor device that uses a plurality of source voltages |
Also Published As
| Publication number | Publication date |
|---|---|
| US20020163845A1 (en) | 2002-11-07 |
| US6597617B2 (en) | 2003-07-22 |
| US6868029B2 (en) | 2005-03-15 |
| KR100408615B1 (ko) | 2003-12-06 |
| US20010045579A1 (en) | 2001-11-29 |
| DE10110157B4 (de) | 2005-04-14 |
| KR20010107547A (ko) | 2001-12-07 |
| US20040027902A1 (en) | 2004-02-12 |
| US6414894B2 (en) | 2002-07-02 |
| DE10110157A1 (de) | 2001-11-29 |
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