CN101971364B - 氮化物类半导体元件及其制造方法 - Google Patents

氮化物类半导体元件及其制造方法 Download PDF

Info

Publication number
CN101971364B
CN101971364B CN2009801017261A CN200980101726A CN101971364B CN 101971364 B CN101971364 B CN 101971364B CN 2009801017261 A CN2009801017261 A CN 2009801017261A CN 200980101726 A CN200980101726 A CN 200980101726A CN 101971364 B CN101971364 B CN 101971364B
Authority
CN
China
Prior art keywords
layer
gan
nitride
based semiconductor
plane
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2009801017261A
Other languages
English (en)
Chinese (zh)
Other versions
CN101971364A (zh
Inventor
横川俊哉
大屋满明
山田笃志
加藤亮
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Publication of CN101971364A publication Critical patent/CN101971364A/zh
Application granted granted Critical
Publication of CN101971364B publication Critical patent/CN101971364B/zh
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80—Constructional details
    • H10H20/81—Bodies
    • H10H20/822—Materials of the light-emitting regions
    • H10H20/824—Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP
    • H10H20/825—Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP containing nitrogen, e.g. GaN
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/80—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials
    • H10D62/85—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group III-V materials, e.g. GaAs
    • H10D62/8503—Nitride Group III-V materials, e.g. AlN or GaN
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80—Constructional details
    • H10H20/81—Bodies
    • H10H20/822—Materials of the light-emitting regions
    • H10H20/824—Materials of the light-emitting regions comprising only Group III-V materials, e.g. GaP
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80—Constructional details
    • H10H20/83—Electrodes
    • H10H20/832—Electrodes characterised by their material
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80—Constructional details
    • H10H20/84—Coatings, e.g. passivation layers or antireflective coatings
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/01—Manufacture or treatment
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10H—INORGANIC LIGHT-EMITTING SEMICONDUCTOR DEVICES HAVING POTENTIAL BARRIERS
    • H10H20/00—Individual inorganic light-emitting semiconductor devices having potential barriers, e.g. light-emitting diodes [LED]
    • H10H20/80—Constructional details
    • H10H20/81—Bodies
    • H10H20/817—Bodies characterised by the crystal structures or orientations, e.g. polycrystalline, amorphous or porous
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00—Interconnections or connectors in packages
    • H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00—Encapsulations, e.g. protective coatings
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00—Package configurations
    • H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
    • H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL

Landscapes

  • Semiconductor Lasers (AREA)
  • Led Devices (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Chemical Vapour Deposition (AREA)
  • Physical Vapour Deposition (AREA)
CN2009801017261A 2008-11-06 2009-06-04 氮化物类半导体元件及其制造方法 Expired - Fee Related CN101971364B (zh)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
JP2008-285155 2008-11-06
JP2008285155 2008-11-06
JP2009-030147 2009-02-12
JP2009030147 2009-02-12
JP2009097684 2009-04-14
JP2009-097684 2009-04-14
PCT/JP2009/002532 WO2010052810A1 (ja) 2008-11-06 2009-06-04 窒化物系半導体素子およびその製造方法

Publications (2)

Publication Number Publication Date
CN101971364A CN101971364A (zh) 2011-02-09
CN101971364B true CN101971364B (zh) 2013-05-15

Family

ID=42152624

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2009801017261A Expired - Fee Related CN101971364B (zh) 2008-11-06 2009-06-04 氮化物类半导体元件及其制造方法

Country Status (6)

Country Link
US (4) US20110156048A1 (enExample)
EP (1) EP2226853B1 (enExample)
JP (2) JP4486701B1 (enExample)
KR (1) KR101139142B1 (enExample)
CN (1) CN101971364B (enExample)
WO (1) WO2010052810A1 (enExample)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101220042B1 (ko) 2006-02-20 2013-01-18 엘지이노텍 주식회사 질화물 반도체 발광소자 및 그 제조 방법
EP2226853B1 (en) * 2008-11-06 2014-02-26 Panasonic Corporation Nitride semiconductor element and method for manufacturing the same
CN101981713B (zh) 2009-03-11 2013-11-20 松下电器产业株式会社 氮化物系半导体元件及其制造方法
US8058639B2 (en) 2009-04-06 2011-11-15 Panasonic Corporation Nitride semiconductor element and method for production thereof
KR101171722B1 (ko) * 2009-12-25 2012-08-06 파나소닉 주식회사 질화물계 반도체 소자 및 그의 제조방법
EP2555257A1 (en) 2010-04-01 2013-02-06 Panasonic Corporation Nitride semiconductor element and manufacturing method therefor
JP4843123B2 (ja) 2010-04-01 2011-12-21 パナソニック株式会社 窒化物系半導体素子およびその製造方法
CN102511086A (zh) 2010-04-02 2012-06-20 松下电器产业株式会社 氮化物系半导体元件及其制造方法
JPWO2011135866A1 (ja) 2010-04-28 2013-07-18 パナソニック株式会社 窒化物系半導体素子およびその製造方法
JP5547279B2 (ja) * 2010-04-28 2014-07-09 パナソニック株式会社 窒化物系半導体素子およびその製造方法
EP2648456A1 (en) 2010-12-01 2013-10-09 Nec Corporation Wireless base station, relay base station, mobile terminal, mobile communication system and operation control method
EP2667421A1 (en) 2011-01-21 2013-11-27 Panasonic Corporation Gallium nitride compound semiconductor light emitting element and light source provided with said light emitting element
CN103283043A (zh) 2011-04-08 2013-09-04 松下电器产业株式会社 氮化物系半导体元件及其制造方法
WO2012140844A1 (ja) * 2011-04-12 2012-10-18 パナソニック株式会社 窒化ガリウム系化合物半導体発光素子およびその製造方法
JP2012231087A (ja) * 2011-04-27 2012-11-22 Mitsubishi Chemicals Corp 窒化物系ledの製造方法
CN103081138A (zh) 2011-05-18 2013-05-01 松下电器产业株式会社 氮化物类半导体发光元件及其制造方法
US9059077B2 (en) * 2011-10-13 2015-06-16 Tamura Corporation Crystal layered structure and method for manufacturing same, and semiconductor element
WO2014151264A1 (en) 2013-03-15 2014-09-25 Crystal Is, Inc. Planar contacts to pseudomorphic electronic and optoelectronic devices
KR102111140B1 (ko) * 2013-08-30 2020-05-14 서울바이오시스 주식회사 발광 다이오드 및 그것을 제조하는 방법
KR101439064B1 (ko) 2013-12-02 2014-09-05 단국대학교 산학협력단 이종 접합 구조를 가지는 발광 다이오드 및 이의 제조방법
JP2024106734A (ja) * 2023-01-27 2024-08-08 国立大学法人東海国立大学機構 半導体装置および半導体装置の製造方法

Family Cites Families (66)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0711429A (ja) 1993-06-23 1995-01-13 Toshiba Corp 金属蒸気発生方法および装置
JPH0711430A (ja) * 1993-06-29 1995-01-13 Mitsubishi Electric Corp 電子ビーム蒸着装置と電子ビームを用いた溶接装置及び自由電子レーザ装置
US5708301A (en) * 1994-02-28 1998-01-13 Sumitomo Chemical Company, Limited Electrode material and electrode for III-V group compound semiconductor
JP3494478B2 (ja) * 1994-08-22 2004-02-09 日亜化学工業株式会社 窒化ガリウム系化合物半導体素子
US6900465B2 (en) * 1994-12-02 2005-05-31 Nichia Corporation Nitride semiconductor light-emitting device
US6072197A (en) * 1996-02-23 2000-06-06 Fujitsu Limited Semiconductor light emitting device with an active layer made of semiconductor having uniaxial anisotropy
JP3735960B2 (ja) * 1996-09-06 2006-01-18 松下電器産業株式会社 半導体発光素子
JPH10341039A (ja) 1997-04-10 1998-12-22 Toshiba Corp 半導体発光素子およびその製造方法
JP4013288B2 (ja) 1997-06-25 2007-11-28 住友化学株式会社 3−5族化合物半導体用電極の製造方法と3−5族化合物半導体素子
JP3299145B2 (ja) 1997-07-15 2002-07-08 日本電気株式会社 窒化ガリウム系半導体のp型電極およびその形成方法
JPH11233890A (ja) 1998-02-12 1999-08-27 Matsushita Electric Ind Co Ltd 窒化ガリウム系化合物半導体素子
JP4183299B2 (ja) * 1998-03-25 2008-11-19 株式会社東芝 窒化ガリウム系化合物半導体発光素子
JP3494880B2 (ja) * 1998-03-26 2004-02-09 株式会社東芝 窒化物系半導体発光素子のp側電極及び窒化物系半導体発光素子
JP2000049114A (ja) * 1998-07-30 2000-02-18 Sony Corp 電極およびその形成方法ならびに半導体装置およびその製造方法
JP3525061B2 (ja) 1998-09-25 2004-05-10 株式会社東芝 半導体発光素子の製造方法
JP2000174333A (ja) 1998-12-02 2000-06-23 Toshiba Corp 窒化ガリウム系化合物半導体発光素子及び製造方法
JP4627850B2 (ja) 1999-09-09 2011-02-09 シャープ株式会社 Iii族窒化物半導体の電極形成方法
JP2001160656A (ja) 1999-12-01 2001-06-12 Sharp Corp 窒化物系化合物半導体装置
JP3929008B2 (ja) 2000-01-14 2007-06-13 シャープ株式会社 窒化物系化合物半導体発光素子およびその製造方法
JP2001308462A (ja) 2000-04-21 2001-11-02 Matsushita Electric Ind Co Ltd 窒化物半導体素子の製造方法
JP2002170989A (ja) 2000-12-04 2002-06-14 Sharp Corp 窒化物系化合物半導体発光素子
JP3453558B2 (ja) 2000-12-25 2003-10-06 松下電器産業株式会社 窒化物半導体素子
US6649942B2 (en) * 2001-05-23 2003-11-18 Sanyo Electric Co., Ltd. Nitride-based semiconductor light-emitting device
CN1214467C (zh) * 2001-05-28 2005-08-10 昭和电工株式会社 半导体器件,半导体层及其生产方法
JP2003332697A (ja) 2002-05-09 2003-11-21 Sony Corp 窒化物半導体素子及びその製造方法
JP2004335559A (ja) * 2003-04-30 2004-11-25 Nichia Chem Ind Ltd Iii族窒化物基板を用いる半導体素子
US8350384B2 (en) * 2009-11-24 2013-01-08 Stats Chippac, Ltd. Semiconductor device and method of forming electrical interconnect with stress relief void
KR100590532B1 (ko) * 2003-12-22 2006-06-15 삼성전자주식회사 플립칩형 질화물계 발광소자 및 그 제조방법
KR100506741B1 (ko) * 2003-12-24 2005-08-08 삼성전기주식회사 플립칩용 질화물 반도체 발광소자 및 그 제조방법
KR100586943B1 (ko) * 2003-12-26 2006-06-07 삼성전기주식회사 질화갈륨계 반도체 발광소자의 제조방법
JP4439955B2 (ja) 2004-03-15 2010-03-24 パナソニック株式会社 半導体装置及び半導体レーザ装置の製造方法
JP2005290510A (ja) * 2004-04-02 2005-10-20 Sodick Co Ltd 電子ビーム蒸着方法及びその装置
US7842527B2 (en) 2006-12-11 2010-11-30 The Regents Of The University Of California Metalorganic chemical vapor deposition (MOCVD) growth of high performance non-polar III-nitride optical devices
KR100773538B1 (ko) * 2004-10-07 2007-11-07 삼성전자주식회사 반사 전극 및 이를 구비하는 화합물 반도체 발광소자
TW200711171A (en) 2005-04-05 2007-03-16 Toshiba Kk Gallium nitride based semiconductor device and method of manufacturing same
DE102005061828B4 (de) * 2005-06-23 2017-05-24 Osram Opto Semiconductors Gmbh Wellenlängenkonvertierendes Konvertermaterial, lichtabstrahlendes optisches Bauelement und Verfahren zu dessen Herstellung
US7329907B2 (en) * 2005-08-12 2008-02-12 Avago Technologies, Ecbu Ip Pte Ltd Phosphor-converted LED devices having improved light distribution uniformity
JP2007116076A (ja) * 2005-09-22 2007-05-10 Matsushita Electric Ind Co Ltd 半導体素子
JP4137936B2 (ja) * 2005-11-16 2008-08-20 昭和電工株式会社 窒化ガリウム系化合物半導体発光素子
KR100742988B1 (ko) 2005-11-25 2007-07-26 (주)더리즈 p형 질화갈륨계 디바이스 제조방법
JP2009526370A (ja) * 2006-02-09 2009-07-16 キユーデイー・ビジヨン・インコーポレーテツド 半導体ナノ結晶およびドープされた有機材料を含む層を含むデバイスおよび方法
JP2007329418A (ja) * 2006-06-09 2007-12-20 Rohm Co Ltd 窒化物半導体発光素子
EP2041794A4 (en) 2006-06-21 2010-07-21 Univ California OPTOELECTRONIC AND ELECTRONIC COMPONENTS USING AN N-FACE OR M-PLANE GaN SUBSTRATE FROM AMMONOTHERMAL BREEDING
JP4984119B2 (ja) * 2006-08-28 2012-07-25 スタンレー電気株式会社 窒化物半導体結晶ないしそれを用いた発光素子及びその製造方法
JP2008109066A (ja) 2006-09-29 2008-05-08 Rohm Co Ltd 発光素子
TWI492411B (zh) * 2006-12-11 2015-07-11 美國加利福尼亞大學董事會 非極性與半極性發光裝置
JP2008153285A (ja) 2006-12-14 2008-07-03 Rohm Co Ltd 窒化物半導体装置および窒化物半導体製造方法
US7547908B2 (en) 2006-12-22 2009-06-16 Philips Lumilieds Lighting Co, Llc III-nitride light emitting devices grown on templates to reduce strain
JPWO2008111222A1 (ja) * 2007-03-15 2010-06-24 東芝ストレージデバイス株式会社 キャリッジアセンブリの組立方法および組立装置
JP2008235804A (ja) * 2007-03-23 2008-10-02 Rohm Co Ltd 発光素子
JP2008258503A (ja) * 2007-04-06 2008-10-23 Sumitomo Electric Ind Ltd 窒化物系半導体発光素子、および窒化物系半導体発光素子を作製する方法
KR100835116B1 (ko) 2007-04-16 2008-06-05 삼성전기주식회사 질화물 반도체 발광 소자
JP4924185B2 (ja) 2007-04-27 2012-04-25 住友電気工業株式会社 窒化物半導体発光素子
JP2009043613A (ja) 2007-08-09 2009-02-26 Toyota Motor Corp パルス電子ビーム発生装置およびパルス電子ビーム成膜装置
US7652301B2 (en) 2007-08-16 2010-01-26 Philips Lumileds Lighting Company, Llc Optical element coupled to low profile side emitting LED
KR100889956B1 (ko) 2007-09-27 2009-03-20 서울옵토디바이스주식회사 교류용 발광다이오드
US20100308357A1 (en) 2007-10-29 2010-12-09 Mitsubishi Chemical Corporation Semiconductor light emitting element and method for manufacturing the same
US7781780B2 (en) 2008-03-31 2010-08-24 Bridgelux, Inc. Light emitting diodes with smooth surface for reflective electrode
US8785965B2 (en) 2008-09-09 2014-07-22 Panasonic Corporation Nitride-based semiconductor light-emitting device and method for fabricating the same
JP2012507874A (ja) 2008-10-31 2012-03-29 ザ リージェンツ オブ ザ ユニバーシティ オブ カリフォルニア 無極性または半極性AlInNおよびAlInGaN合金に基づく光電子デバイス
US20100109025A1 (en) 2008-11-05 2010-05-06 Koninklijke Philips Electronics N.V. Over the mold phosphor lens for an led
EP2226853B1 (en) * 2008-11-06 2014-02-26 Panasonic Corporation Nitride semiconductor element and method for manufacturing the same
CN101981713B (zh) 2009-03-11 2013-11-20 松下电器产业株式会社 氮化物系半导体元件及其制造方法
WO2010113238A1 (ja) 2009-04-03 2010-10-07 パナソニック株式会社 窒化物系半導体素子およびその製造方法
US8058639B2 (en) 2009-04-06 2011-11-15 Panasonic Corporation Nitride semiconductor element and method for production thereof
JP4792136B2 (ja) 2010-01-18 2011-10-12 パナソニック株式会社 窒化物系半導体素子およびその製造方法

Also Published As

Publication number Publication date
CN101971364A (zh) 2011-02-09
US20110284905A1 (en) 2011-11-24
KR101139142B1 (ko) 2012-04-26
US20110156048A1 (en) 2011-06-30
EP2226853A1 (en) 2010-09-08
US20130092968A1 (en) 2013-04-18
US8648378B2 (en) 2014-02-11
WO2010052810A1 (ja) 2010-05-14
US20130119398A1 (en) 2013-05-16
JP2010267950A (ja) 2010-11-25
JPWO2010052810A1 (ja) 2012-03-29
KR20100087372A (ko) 2010-08-04
US8686561B2 (en) 2014-04-01
EP2226853A4 (en) 2012-05-02
EP2226853B1 (en) 2014-02-26
JP4486701B1 (ja) 2010-06-23
US8110851B2 (en) 2012-02-07

Similar Documents

Publication Publication Date Title
JP4486701B1 (ja) 窒化物系半導体素子およびその製造方法
JP4558846B1 (ja) 窒化物系半導体素子およびその製造方法
CN102203967B (zh) 氮化物类半导体元件以及其制造方法
CN102007576A (zh) 氮化物系半导体元件及其制造方法
JP5776021B2 (ja) 窒化物系半導体素子及び光源
JP4843123B2 (ja) 窒化物系半導体素子およびその製造方法
JP2012070016A (ja) 窒化物系半導体素子およびその製造方法
JPWO2011135866A1 (ja) 窒化物系半導体素子およびその製造方法
JP4843122B2 (ja) 窒化物系半導体素子およびその製造方法
JP5547279B2 (ja) 窒化物系半導体素子およびその製造方法

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20130515

Termination date: 20200604

CF01 Termination of patent right due to non-payment of annual fee