CN101567367A - 半导体器件 - Google Patents
半导体器件 Download PDFInfo
- Publication number
- CN101567367A CN101567367A CNA2009101415364A CN200910141536A CN101567367A CN 101567367 A CN101567367 A CN 101567367A CN A2009101415364 A CNA2009101415364 A CN A2009101415364A CN 200910141536 A CN200910141536 A CN 200910141536A CN 101567367 A CN101567367 A CN 101567367A
- Authority
- CN
- China
- Prior art keywords
- terminal
- semiconductor chip
- lead
- tabular
- chip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 148
- 230000001360 synchronised effect Effects 0.000 claims abstract description 25
- 239000004020 conductor Substances 0.000 claims description 64
- 238000004806 packaging method and process Methods 0.000 claims description 48
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 5
- 239000010931 gold Substances 0.000 claims description 5
- 229910052737 gold Inorganic materials 0.000 claims description 5
- 230000017525 heat dissipation Effects 0.000 abstract description 2
- 101000824035 Homo sapiens Serum response factor Proteins 0.000 description 39
- 102100022056 Serum response factor Human genes 0.000 description 39
- 238000009434 installation Methods 0.000 description 11
- 230000000694 effects Effects 0.000 description 8
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 4
- 230000003071 parasitic effect Effects 0.000 description 4
- 238000007639 printing Methods 0.000 description 4
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 229910052709 silver Inorganic materials 0.000 description 3
- 239000004332 silver Substances 0.000 description 3
- 241000218202 Coptis Species 0.000 description 2
- 235000002991 Coptis groenlandica Nutrition 0.000 description 2
- 239000003990 capacitor Substances 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 230000009466 transformation Effects 0.000 description 2
- 238000005452 bending Methods 0.000 description 1
- 230000033228 biological regulation Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000007767 bonding agent Substances 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 238000005755 formation reaction Methods 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000005057 refrigeration Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L24/39—Structure, shape, material or disposition of the strap connectors after the connecting process
- H01L24/40—Structure, shape, material or disposition of the strap connectors after the connecting process of an individual strap connector
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F16—ENGINEERING ELEMENTS AND UNITS; GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVE FUNCTIONING OF MACHINES OR INSTALLATIONS; THERMAL INSULATION IN GENERAL
- F16L—PIPES; JOINTS OR FITTINGS FOR PIPES; SUPPORTS FOR PIPES, CABLES OR PROTECTIVE TUBING; MEANS FOR THERMAL INSULATION IN GENERAL
- F16L55/00—Devices or appurtenances for use in, or in connection with, pipes or pipe systems
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49541—Geometry of the lead-frame
- H01L23/49562—Geometry of the lead-frame for devices being provided for in H01L29/00
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49568—Lead-frames or other flat leads specifically adapted to facilitate heat dissipation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/495—Lead-frames or other flat leads
- H01L23/49575—Assemblies of semiconductor devices on lead frames
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/02—Bonding areas ; Manufacturing methods related thereto
- H01L24/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L24/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L24/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L24/36—Structure, shape, material or disposition of the strap connectors prior to the connecting process
- H01L24/37—Structure, shape, material or disposition of the strap connectors prior to the connecting process of an individual strap connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L24/39—Structure, shape, material or disposition of the strap connectors after the connecting process
- H01L24/41—Structure, shape, material or disposition of the strap connectors after the connecting process of a plurality of strap connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/73—Means for bonding being of different types provided for in two or more of groups H01L24/10, H01L24/18, H01L24/26, H01L24/34, H01L24/42, H01L24/50, H01L24/63, H01L24/71
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/84—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a strap connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/0401—Bonding areas specifically adapted for bump connectors, e.g. under bump metallisation [UBM]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/0555—Shape
- H01L2224/05552—Shape in top view
- H01L2224/05553—Shape in top view being rectangular
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/05—Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
- H01L2224/0554—External layer
- H01L2224/05599—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/06—Structure, shape, material or disposition of the bonding areas prior to the connecting process of a plurality of bonding areas
- H01L2224/0601—Structure
- H01L2224/0603—Bonding areas having different sizes, e.g. different heights or widths
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13099—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L2224/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
- H01L2224/13001—Core members of the bump connector
- H01L2224/13099—Material
- H01L2224/131—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/13138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/13144—Gold [Au] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
- H01L2224/161—Disposition
- H01L2224/16151—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/16221—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/16245—Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/29198—Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
- H01L2224/29199—Material of the matrix
- H01L2224/29294—Material of the matrix with a principal constituent of the material being a liquid not provided for in groups H01L2224/292 - H01L2224/29291
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/29198—Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
- H01L2224/29298—Fillers
- H01L2224/29299—Base material
- H01L2224/293—Base material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
- H01L2224/29338—Base material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/29339—Silver [Ag] as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L2224/36—Structure, shape, material or disposition of the strap connectors prior to the connecting process
- H01L2224/37—Structure, shape, material or disposition of the strap connectors prior to the connecting process of an individual strap connector
- H01L2224/37001—Core members of the connector
- H01L2224/37099—Material
- H01L2224/371—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L2224/39—Structure, shape, material or disposition of the strap connectors after the connecting process
- H01L2224/40—Structure, shape, material or disposition of the strap connectors after the connecting process of an individual strap connector
- H01L2224/401—Disposition
- H01L2224/40135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/40137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L2224/39—Structure, shape, material or disposition of the strap connectors after the connecting process
- H01L2224/40—Structure, shape, material or disposition of the strap connectors after the connecting process of an individual strap connector
- H01L2224/401—Disposition
- H01L2224/40151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/40221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/40245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/34—Strap connectors, e.g. copper straps for grounding power devices; Manufacturing methods related thereto
- H01L2224/39—Structure, shape, material or disposition of the strap connectors after the connecting process
- H01L2224/40—Structure, shape, material or disposition of the strap connectors after the connecting process of an individual strap connector
- H01L2224/401—Disposition
- H01L2224/40151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/40221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/40245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/40247—Connecting the strap to a bond pad of the item
- H01L2224/40249—Connecting the strap to a bond pad of the item the bond pad protruding from the surface of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
- H01L2224/45144—Gold (Au) as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/485—Material
- H01L2224/48505—Material at the bonding interface
- H01L2224/48599—Principal constituent of the connecting portion of the wire connector being Gold (Au)
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4911—Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain
- H01L2224/49111—Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain the connectors connecting two common bonding areas, e.g. Litz or braid wires
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73219—Layer and TAB connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73201—Location after the connecting process on the same surface
- H01L2224/73221—Strap and wire connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
- H01L2224/732—Location after the connecting process
- H01L2224/73251—Location after the connecting process on different surfaces
- H01L2224/73253—Bump and layer connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/83801—Soldering or alloying
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/8385—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/84—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a strap connector
- H01L2224/848—Bonding techniques
- H01L2224/84801—Soldering or alloying
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/84—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a strap connector
- H01L2224/848—Bonding techniques
- H01L2224/8485—Bonding techniques using a polymer adhesive, e.g. an adhesive based on silicone, epoxy, polyimide, polyester
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/85—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
- H01L2224/8538—Bonding interfaces outside the semiconductor or solid-state body
- H01L2224/85399—Material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/10—Bump connectors ; Manufacturing methods related thereto
- H01L24/12—Structure, shape, material or disposition of the bump connectors prior to the connecting process
- H01L24/13—Structure, shape, material or disposition of the bump connectors prior to the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L24/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/42—Wire connectors; Manufacturing methods related thereto
- H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/00014—Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01005—Boron [B]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01047—Silver [Ag]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01075—Rhenium [Re]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01082—Lead [Pb]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/014—Solder alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
- H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/14—Integrated circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/1901—Structure
- H01L2924/1904—Component type
- H01L2924/19041—Component type being a capacitor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/19—Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
- H01L2924/1901—Structure
- H01L2924/1904—Component type
- H01L2924/19043—Component type being a resistor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/30107—Inductance
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Dc-Dc Converters (AREA)
- Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Die Bonding (AREA)
Abstract
Description
Claims (8)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004020474 | 2004-01-28 | ||
JP2004020474A JP2005217072A (ja) | 2004-01-28 | 2004-01-28 | 半導体装置 |
JP2004-020474 | 2004-01-28 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2004101048396A Division CN100521196C (zh) | 2004-01-28 | 2004-12-29 | 半导体器件 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN101567367A true CN101567367A (zh) | 2009-10-28 |
CN101567367B CN101567367B (zh) | 2011-07-20 |
Family
ID=34792612
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2004101048396A Expired - Fee Related CN100521196C (zh) | 2004-01-28 | 2004-12-29 | 半导体器件 |
CN2009101415364A Expired - Fee Related CN101567367B (zh) | 2004-01-28 | 2004-12-29 | 半导体器件 |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2004101048396A Expired - Fee Related CN100521196C (zh) | 2004-01-28 | 2004-12-29 | 半导体器件 |
Country Status (4)
Country | Link |
---|---|
US (3) | US7145224B2 (zh) |
JP (1) | JP2005217072A (zh) |
KR (5) | KR101100838B1 (zh) |
CN (2) | CN100521196C (zh) |
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104810343A (zh) * | 2014-01-28 | 2015-07-29 | 英飞凌科技奥地利有限公司 | 具有多个接触夹片的半导体器件 |
CN105405831A (zh) * | 2015-12-24 | 2016-03-16 | 江苏长电科技股份有限公司 | 一种框架外露多芯片正装平铺夹芯封装结构及其工艺方法 |
CN105405832A (zh) * | 2015-12-24 | 2016-03-16 | 江苏长电科技股份有限公司 | 部分框架外露多芯片平铺夹芯封装结构及其工艺方法 |
CN105405833A (zh) * | 2015-12-24 | 2016-03-16 | 江苏长电科技股份有限公司 | 一种多芯片多搭平铺夹芯封装结构及其工艺方法 |
CN105448880A (zh) * | 2015-12-24 | 2016-03-30 | 江苏长电科技股份有限公司 | 一种多芯片单搭平铺夹芯封装结构及其工艺方法 |
CN105448881A (zh) * | 2015-12-24 | 2016-03-30 | 江苏长电科技股份有限公司 | 一种框架外露多芯片多搭平铺夹芯封装结构及其工艺方法 |
CN105448882A (zh) * | 2015-12-24 | 2016-03-30 | 江苏长电科技股份有限公司 | 一种框架外露多芯片单搭平铺夹芯封装结构及其工艺方法 |
CN105551982A (zh) * | 2015-12-24 | 2016-05-04 | 江苏长电科技股份有限公司 | 一种多芯片正装平铺夹芯封装结构及其工艺方法 |
CN105609425A (zh) * | 2015-12-24 | 2016-05-25 | 江苏长电科技股份有限公司 | 部分框架外露多芯片单搭平铺夹芯封装结构及其工艺方法 |
CN105633051A (zh) * | 2015-12-24 | 2016-06-01 | 江苏长电科技股份有限公司 | 部分框架外露多芯片多搭平铺夹芯封装结构及其工艺方法 |
CN105702640A (zh) * | 2014-12-16 | 2016-06-22 | 英飞凌科技美国公司 | 具有减小的外形规格和增加的载流能力的功率半导体封装 |
CN107680950A (zh) * | 2013-11-27 | 2018-02-09 | 万国半导体股份有限公司 | 一种多芯片叠层的封装结构及其封装方法 |
CN110676235A (zh) * | 2019-10-25 | 2020-01-10 | 成都赛力康电气有限公司 | 一种便于扩展的新型功率mos模组结构 |
CN116884932A (zh) * | 2023-09-06 | 2023-10-13 | 深圳智芯微电子科技有限公司 | 芯片封装结构 |
Families Citing this family (125)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7501702B2 (en) * | 2004-06-24 | 2009-03-10 | Fairchild Semiconductor Corporation | Integrated transistor module and method of fabricating same |
JP2006049341A (ja) | 2004-07-30 | 2006-02-16 | Renesas Technology Corp | 半導体装置およびその製造方法 |
JP2006073655A (ja) * | 2004-08-31 | 2006-03-16 | Toshiba Corp | 半導体モジュール |
JP2007116012A (ja) * | 2005-10-24 | 2007-05-10 | Renesas Technology Corp | 半導体装置及びそれを用いた電源装置 |
JP4899481B2 (ja) * | 2006-01-10 | 2012-03-21 | サンケン電気株式会社 | 外部に露出する放熱体を上部に有する樹脂封止型半導体装置の製法 |
US7868432B2 (en) * | 2006-02-13 | 2011-01-11 | Fairchild Semiconductor Corporation | Multi-chip module for battery power control |
JP4875380B2 (ja) | 2006-02-24 | 2012-02-15 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
DE102006012781B4 (de) * | 2006-03-17 | 2016-06-16 | Infineon Technologies Ag | Multichip-Modul mit verbessertem Systemträger und Verfahren zu seiner Herstellung |
JP4916745B2 (ja) | 2006-03-28 | 2012-04-18 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
US7768075B2 (en) | 2006-04-06 | 2010-08-03 | Fairchild Semiconductor Corporation | Semiconductor die packages using thin dies and metal substrates |
US7618896B2 (en) | 2006-04-24 | 2009-11-17 | Fairchild Semiconductor Corporation | Semiconductor die package including multiple dies and a common node structure |
DE102006021959B4 (de) * | 2006-05-10 | 2011-12-29 | Infineon Technologies Ag | Leistungshalbleiterbauteil und Verfahren zu dessen Herstellung |
TWI452662B (zh) * | 2006-05-19 | 2014-09-11 | Fairchild Semiconductor | 雙邊冷卻整合電源裝置封裝與模組及製造方法 |
US7663211B2 (en) * | 2006-05-19 | 2010-02-16 | Fairchild Semiconductor Corporation | Dual side cooling integrated power device package and module with a clip attached to a leadframe in the package and the module and methods of manufacture |
TW200812066A (en) * | 2006-05-30 | 2008-03-01 | Renesas Tech Corp | Semiconductor device and power source unit using the same |
JP5191689B2 (ja) * | 2006-05-30 | 2013-05-08 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
JP5165214B2 (ja) * | 2006-06-26 | 2013-03-21 | オンセミコンダクター・トレーディング・リミテッド | 半導体装置 |
JP5261636B2 (ja) * | 2006-10-27 | 2013-08-14 | セミコンダクター・コンポーネンツ・インダストリーズ・リミテッド・ライアビリティ・カンパニー | 半導体装置 |
US20080180921A1 (en) * | 2007-01-31 | 2008-07-31 | Cyntec Co., Ltd. | Electronic package structure |
JP2008218688A (ja) * | 2007-03-05 | 2008-09-18 | Denso Corp | 半導体装置 |
US7872350B2 (en) * | 2007-04-10 | 2011-01-18 | Qimonda Ag | Multi-chip module |
JP5272191B2 (ja) * | 2007-08-31 | 2013-08-28 | 三菱電機株式会社 | 半導体装置および半導体装置の製造方法 |
US8067825B2 (en) * | 2007-09-28 | 2011-11-29 | Stats Chippac Ltd. | Integrated circuit package system with multiple die |
US7800219B2 (en) * | 2008-01-02 | 2010-09-21 | Fairchild Semiconductor Corporation | High-power semiconductor die packages with integrated heat-sink capability and methods of manufacturing the same |
US8642394B2 (en) | 2008-01-28 | 2014-02-04 | Infineon Technologies Ag | Method of manufacturing electronic device on leadframe |
JP2009200338A (ja) * | 2008-02-22 | 2009-09-03 | Renesas Technology Corp | 半導体装置の製造方法 |
US8507320B2 (en) * | 2008-03-18 | 2013-08-13 | Infineon Technologies Ag | Electronic device including a carrier and a semiconductor chip attached to the carrier and manufacturing thereof |
US8138587B2 (en) * | 2008-09-30 | 2012-03-20 | Infineon Technologies Ag | Device including two mounting surfaces |
US7898067B2 (en) * | 2008-10-31 | 2011-03-01 | Fairchild Semiconductor Corporaton | Pre-molded, clip-bonded multi-die semiconductor package |
WO2010113120A1 (en) * | 2009-04-02 | 2010-10-07 | Koninklijke Philips Electronics N.V. | An integrated circuit system with a thermally isolating frame construction and method for producing such integrated circuit system |
JP2010258366A (ja) * | 2009-04-28 | 2010-11-11 | Renesas Electronics Corp | 半導体装置 |
JP2011023587A (ja) * | 2009-07-16 | 2011-02-03 | Shinko Electric Ind Co Ltd | 半導体装置 |
CN102484109B (zh) * | 2009-08-03 | 2014-12-10 | 株式会社安川电机 | 电力变换装置 |
US20110075392A1 (en) | 2009-09-29 | 2011-03-31 | Astec International Limited | Assemblies and Methods for Directly Connecting Integrated Circuits to Electrically Conductive Sheets |
JP5126278B2 (ja) * | 2010-02-04 | 2013-01-23 | 株式会社デンソー | 半導体装置およびその製造方法 |
JP2011187809A (ja) * | 2010-03-10 | 2011-09-22 | Renesas Electronics Corp | 半導体装置および多層配線基板 |
JP5655339B2 (ja) * | 2010-03-26 | 2015-01-21 | サンケン電気株式会社 | 半導体装置 |
JP5099243B2 (ja) * | 2010-04-14 | 2012-12-19 | 株式会社デンソー | 半導体モジュール |
CN103996628A (zh) * | 2010-04-16 | 2014-08-20 | 万国半导体有限公司 | 双引线框架多芯片共同封装体的制造方法 |
JP5253455B2 (ja) * | 2010-06-01 | 2013-07-31 | 三菱電機株式会社 | パワー半導体装置 |
DE102010030838A1 (de) * | 2010-07-02 | 2012-01-05 | Robert Bosch Gmbh | Halbleiterbauteil mit verbesserter Wärmeabfuhr |
JP5709299B2 (ja) | 2010-09-29 | 2015-04-30 | ローム株式会社 | 半導体パワーモジュールおよびその製造方法 |
US9620954B2 (en) | 2010-12-13 | 2017-04-11 | Infineon Technologies Americas Corp. | Semiconductor package having an over-temperature protection circuit utilizing multiple temperature threshold values |
US8587101B2 (en) * | 2010-12-13 | 2013-11-19 | International Rectifier Corporation | Multi-chip module (MCM) power quad flat no-lead (PQFN) semiconductor package utilizing a leadframe for electrical interconnections |
US9659845B2 (en) | 2010-12-13 | 2017-05-23 | Infineon Technologies Americas Corp. | Power quad flat no-lead (PQFN) package in a single shunt inverter circuit |
US9711437B2 (en) | 2010-12-13 | 2017-07-18 | Infineon Technologies Americas Corp. | Semiconductor package having multi-phase power inverter with internal temperature sensor |
US8749034B2 (en) | 2011-01-03 | 2014-06-10 | International Rectifier Corporation | High power semiconductor package with conductive clip and flip chip driver IC with integrated control transistor |
CN102593108B (zh) * | 2011-01-18 | 2014-08-20 | 台达电子工业股份有限公司 | 功率半导体封装结构及其制造方法 |
US20120200281A1 (en) * | 2011-02-07 | 2012-08-09 | Texas Instruments Incorporated | Three-Dimensional Power Supply Module Having Reduced Switch Node Ringing |
JP5936310B2 (ja) | 2011-03-17 | 2016-06-22 | 三菱電機株式会社 | パワー半導体モジュール及びその取り付け構造 |
CN103493200B (zh) * | 2011-04-18 | 2016-06-22 | 三菱电机株式会社 | 半导体装置、逆变器装置及车用旋转电机 |
JP5947537B2 (ja) * | 2011-04-19 | 2016-07-06 | トヨタ自動車株式会社 | 半導体装置及びその製造方法 |
JP5254398B2 (ja) * | 2011-04-22 | 2013-08-07 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
JP5431406B2 (ja) * | 2011-04-22 | 2014-03-05 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
US8614503B2 (en) * | 2011-05-19 | 2013-12-24 | International Rectifier Corporation | Common drain exposed conductive clip for high power semiconductor packages |
US8344464B2 (en) * | 2011-05-19 | 2013-01-01 | International Rectifier Corporation | Multi-transistor exposed conductive clip for high power semiconductor packages |
US8531016B2 (en) | 2011-05-19 | 2013-09-10 | International Rectifier Corporation | Thermally enhanced semiconductor package with exposed parallel conductive clip |
EP2720263A4 (en) * | 2011-06-09 | 2015-04-22 | Mitsubishi Electric Corp | SEMICONDUCTOR COMPONENT |
ITMI20111217A1 (it) | 2011-06-30 | 2012-12-31 | St Microelectronics Srl | Sistema contenitore/dissipatore per componente elettronico |
US8723311B2 (en) * | 2011-06-30 | 2014-05-13 | Stmicroelectronics S.R.L. | Half-bridge electronic device with common heat sink on mounting surface |
ITMI20111213A1 (it) * | 2011-06-30 | 2012-12-31 | St Microelectronics Srl | Dispositivo elettronico a semi-ponte con dissipatore di calore ausiliario comune |
ITMI20111219A1 (it) | 2011-06-30 | 2012-12-31 | St Microelectronics Srl | Sistema con dissipatore di calore condiviso |
ITMI20111216A1 (it) | 2011-06-30 | 2012-12-31 | St Microelectronics Srl | Dispositivo elettronico di potenza ad elevata dissipazione di calore e stabilita? |
ITMI20111208A1 (it) | 2011-06-30 | 2012-12-31 | St Microelectronics Srl | Sistema con dissipatore di calore stabilizzato |
ITMI20111218A1 (it) | 2011-06-30 | 2012-12-31 | St Microelectronics Srl | Dispositivo di potenza ad elevata velocita? di commutazione |
ITMI20111214A1 (it) | 2011-06-30 | 2012-12-31 | St Microelectronics Srl | Dispositivo di potenza a spessore ridotto |
US9881898B2 (en) * | 2011-11-07 | 2018-01-30 | Taiwan Semiconductor Manufacturing Co.,Ltd. | System in package process flow |
US10163877B2 (en) * | 2011-11-07 | 2018-12-25 | Taiwan Semiconductor Manufacturing Co., Ltd. | System in package process flow |
DE102011088250A1 (de) * | 2011-12-12 | 2013-06-13 | Robert Bosch Gmbh | Leistungsmodul für einen elektrischen Antrieb |
DE102011089740B4 (de) * | 2011-12-23 | 2017-01-19 | Conti Temic Microelectronic Gmbh | Leistungsmodul |
JP5787784B2 (ja) | 2012-02-15 | 2015-09-30 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
US8847385B2 (en) * | 2012-03-27 | 2014-09-30 | Infineon Technologies Ag | Chip arrangement, a method for forming a chip arrangement, a chip package, a method for forming a chip package |
US8916968B2 (en) | 2012-03-27 | 2014-12-23 | Infineon Technologies Ag | Multichip power semiconductor device |
US9589872B2 (en) * | 2012-03-28 | 2017-03-07 | Infineon Technologies Americas Corp. | Integrated dual power converter package having internal driver IC |
JP5924110B2 (ja) * | 2012-05-11 | 2016-05-25 | 株式会社ソシオネクスト | 半導体装置、半導体装置モジュールおよび半導体装置の製造方法 |
US9437508B2 (en) | 2012-05-15 | 2016-09-06 | Panasonic Intellectual Property Management Co., Ltd. | Method for manufacturing semiconductor device and semiconductor device |
JP5924164B2 (ja) * | 2012-07-06 | 2016-05-25 | 株式会社豊田自動織機 | 半導体装置 |
US9018744B2 (en) | 2012-09-25 | 2015-04-28 | Infineon Technologies Ag | Semiconductor device having a clip contact |
JP5970316B2 (ja) * | 2012-09-26 | 2016-08-17 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
JP6165525B2 (ja) * | 2012-10-31 | 2017-07-19 | 株式会社東芝 | 半導体電力変換装置およびその製造方法 |
US9171837B2 (en) | 2012-12-17 | 2015-10-27 | Nxp B.V. | Cascode circuit |
JP5487290B2 (ja) * | 2012-12-21 | 2014-05-07 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
JP5966921B2 (ja) * | 2012-12-28 | 2016-08-10 | トヨタ自動車株式会社 | 半導体モジュールの製造方法 |
KR101984831B1 (ko) | 2013-01-31 | 2019-05-31 | 삼성전자 주식회사 | 반도체 패키지 및 그 제조 방법 |
JP5493021B2 (ja) * | 2013-03-08 | 2014-05-14 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
JP5966979B2 (ja) * | 2013-03-14 | 2016-08-10 | 株式会社デンソー | 半導体装置及びその製造方法 |
US9041170B2 (en) | 2013-04-02 | 2015-05-26 | Infineon Technologies Austria Ag | Multi-level semiconductor package |
WO2014202282A1 (de) * | 2013-06-20 | 2014-12-24 | Conti Temic Microelectronic Gmbh | Leiterplatte |
US8884420B1 (en) * | 2013-07-12 | 2014-11-11 | Infineon Technologies Austria Ag | Multichip device |
DE102013217802B4 (de) * | 2013-09-05 | 2020-01-09 | Infineon Technologies Ag | Halbleiteranordnung, verfahren zur herstellung einer halbleiteranordnung und verfahren zum betrieb einer halbleiteranordnung |
JP2015056563A (ja) * | 2013-09-12 | 2015-03-23 | 株式会社東芝 | 半導体装置およびその製造方法 |
US10109592B2 (en) * | 2013-11-26 | 2018-10-23 | Infineon Technologies Ag | Semiconductor chip with electrically conducting layer |
US9704787B2 (en) * | 2014-10-16 | 2017-07-11 | Infineon Technologies Americas Corp. | Compact single-die power semiconductor package |
US9437516B2 (en) * | 2014-01-07 | 2016-09-06 | Infineon Technologies Austria Ag | Chip-embedded packages with backside die connection |
JP6228490B2 (ja) * | 2014-03-04 | 2017-11-08 | ローム株式会社 | 半導体装置および半導体装置の製造方法 |
KR101555301B1 (ko) * | 2014-05-13 | 2015-09-23 | 페어차일드코리아반도체 주식회사 | 반도체 패키지 |
US9431327B2 (en) * | 2014-05-30 | 2016-08-30 | Delta Electronics, Inc. | Semiconductor device |
DE102014114933B4 (de) | 2014-10-15 | 2021-08-12 | Infineon Technologies Austria Ag | Halbleiterbauelement |
JP6152842B2 (ja) * | 2014-11-04 | 2017-06-28 | トヨタ自動車株式会社 | 半導体装置とその製造方法 |
DE102016107792B4 (de) | 2016-04-27 | 2022-01-27 | Infineon Technologies Ag | Packung und halbfertiges Produkt mit vertikaler Verbindung zwischen Träger und Klammer sowie Verfahren zum Herstellen einer Packung und einer Charge von Packungen |
US9773753B1 (en) * | 2016-11-18 | 2017-09-26 | Advanced Semiconductor Engineering, Inc. | Semiconductor devices and methods of manufacturing the same |
CN110050339B (zh) * | 2016-12-16 | 2023-12-22 | 日立能源有限公司 | 具有低栅极通路电感的功率半导体模块 |
DE102017202345A1 (de) | 2017-02-14 | 2018-08-16 | Infineon Technologies Ag | Leiterrahmen, halbleitergehäuse, das einen leiterrahmen umfasst, und verfahren zum bilden eines halbleitergehäuses |
EP3596826B1 (en) * | 2017-03-15 | 2024-05-01 | ABB Schweiz AG | A solid state switching device |
US10262928B2 (en) * | 2017-03-23 | 2019-04-16 | Rohm Co., Ltd. | Semiconductor device |
CN110462825B (zh) * | 2017-03-29 | 2023-07-11 | 日本电产株式会社 | 半导体封装装置及其制造方法 |
DE102017107327B4 (de) | 2017-04-05 | 2024-03-21 | Infineon Technologies Austria Ag | Feldeffekt-Halbleiterbauelement und Verfahren zu dessen Herstellung |
US10727151B2 (en) * | 2017-05-25 | 2020-07-28 | Infineon Technologies Ag | Semiconductor chip package having a cooling surface and method of manufacturing a semiconductor package |
KR102153159B1 (ko) * | 2017-06-12 | 2020-09-08 | 매그나칩 반도체 유한회사 | 전력 반도체의 멀티칩 패키지 |
DE102017127089B4 (de) | 2017-11-17 | 2022-05-25 | Infineon Technologies Austria Ag | Multi-Die-Gehäuse und Leistungswandler |
JP7131903B2 (ja) * | 2017-12-08 | 2022-09-06 | ローム株式会社 | 半導体パッケージ |
US10784213B2 (en) | 2018-01-26 | 2020-09-22 | Hong Kong Applied Science and Technology Research Institute Company Limited | Power device package |
WO2020008545A1 (ja) * | 2018-07-04 | 2020-01-09 | 新電元工業株式会社 | 電子モジュール |
JP7119666B2 (ja) * | 2018-07-09 | 2022-08-17 | 株式会社アイシン | スイッチング素子ユニット及びスイッチング素子モジュール |
SG11202100905XA (en) * | 2018-08-08 | 2021-02-25 | Agency Science Tech & Res | Semiconductor package and method of forming the same |
US20200194347A1 (en) * | 2018-12-18 | 2020-06-18 | Alpha And Omega Semiconductor (Cayman) Ltd. | Semiconductor package and method of making the same |
US11676756B2 (en) | 2019-01-07 | 2023-06-13 | Delta Electronics (Shanghai) Co., Ltd. | Coupled inductor and power supply module |
US11316438B2 (en) | 2019-01-07 | 2022-04-26 | Delta Eletronics (Shanghai) Co., Ltd. | Power supply module and manufacture method for same |
CN111415908B (zh) | 2019-01-07 | 2022-02-22 | 台达电子企业管理(上海)有限公司 | 电源模块、芯片嵌入式封装模块及制备方法 |
CN111415909B (zh) * | 2019-01-07 | 2022-08-05 | 台达电子企业管理(上海)有限公司 | 多芯片封装功率模块 |
CN110349940B (zh) * | 2019-06-27 | 2020-11-17 | 深圳第三代半导体研究院 | 一种芯片封装结构及其制作方法 |
JP7416638B2 (ja) * | 2020-02-05 | 2024-01-17 | ローム株式会社 | 半導体装置および半導体装置の製造方法 |
TWI727861B (zh) * | 2020-07-23 | 2021-05-11 | 朋程科技股份有限公司 | 晶片封裝結構及其製造方法 |
JP7337034B2 (ja) * | 2020-09-15 | 2023-09-01 | 三菱電機株式会社 | 半導体パッケージおよび半導体装置 |
CN113345871B (zh) * | 2021-04-25 | 2022-09-13 | 华中科技大学 | 一种低寄生电感串联功率模块 |
Family Cites Families (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3129020B2 (ja) | 1992-04-09 | 2001-01-29 | 富士電機株式会社 | 半導体装置 |
JP2894089B2 (ja) | 1992-06-19 | 1999-05-24 | 竹内精工株式会社 | 直線運動用ベアリング |
KR20000057810A (ko) * | 1999-01-28 | 2000-09-25 | 가나이 쓰토무 | 반도체 장치 |
KR100335481B1 (ko) * | 1999-09-13 | 2002-05-04 | 김덕중 | 멀티 칩 패키지 구조의 전력소자 |
US6693350B2 (en) * | 1999-11-24 | 2004-02-17 | Denso Corporation | Semiconductor device having radiation structure and method for manufacturing semiconductor device having radiation structure |
JP3601432B2 (ja) | 2000-10-04 | 2004-12-15 | 株式会社デンソー | 半導体装置 |
US6703707B1 (en) * | 1999-11-24 | 2004-03-09 | Denso Corporation | Semiconductor device having radiation structure |
JP2001291823A (ja) | 2000-04-05 | 2001-10-19 | Toshiba Digital Media Engineering Corp | 半導体装置 |
JP4292686B2 (ja) | 2000-06-08 | 2009-07-08 | 株式会社デンソー | 冷媒冷却型両面冷却半導体装置 |
JP4423746B2 (ja) | 2000-05-10 | 2010-03-03 | 株式会社デンソー | 冷媒冷却型両面冷却半導体装置 |
JP4192396B2 (ja) | 2000-04-19 | 2008-12-10 | 株式会社デンソー | 半導体スイッチングモジュ−ル及びそれを用いた半導体装置 |
JP3578335B2 (ja) | 2000-06-29 | 2004-10-20 | 株式会社デンソー | 電力用半導体装置 |
JP4774581B2 (ja) | 2000-06-30 | 2011-09-14 | 株式会社デンソー | 冷却流体冷却型半導体装置 |
EP2244289B1 (en) | 2000-04-19 | 2014-03-26 | Denso Corporation | Coolant cooled type semiconductor device |
US6545364B2 (en) * | 2000-09-04 | 2003-04-08 | Sanyo Electric Co., Ltd. | Circuit device and method of manufacturing the same |
JP4479121B2 (ja) * | 2001-04-25 | 2010-06-09 | 株式会社デンソー | 半導体装置の製造方法 |
US6707671B2 (en) * | 2001-05-31 | 2004-03-16 | Matsushita Electric Industrial Co., Ltd. | Power module and method of manufacturing the same |
US7215022B2 (en) * | 2001-06-21 | 2007-05-08 | Ati Technologies Inc. | Multi-die module |
JP2003046036A (ja) | 2001-08-01 | 2003-02-14 | Denso Corp | 半導体装置 |
JP3627738B2 (ja) * | 2001-12-27 | 2005-03-09 | 株式会社デンソー | 半導体装置 |
US6946740B2 (en) | 2002-07-15 | 2005-09-20 | International Rectifier Corporation | High power MCM package |
JP4294405B2 (ja) * | 2003-07-31 | 2009-07-15 | 株式会社ルネサステクノロジ | 半導体装置 |
JP3809168B2 (ja) * | 2004-02-03 | 2006-08-16 | 株式会社東芝 | 半導体モジュール |
DE102004047358B3 (de) * | 2004-09-29 | 2005-11-03 | Infineon Technologies Ag | In zwei Halbleiterkörpern integrierte Schaltungsanordnung mit einem Leistungsbauelement und einer Ansteuerschaltung |
-
2004
- 2004-01-28 JP JP2004020474A patent/JP2005217072A/ja active Pending
- 2004-12-29 CN CNB2004101048396A patent/CN100521196C/zh not_active Expired - Fee Related
- 2004-12-29 CN CN2009101415364A patent/CN101567367B/zh not_active Expired - Fee Related
-
2005
- 2005-01-25 US US11/041,200 patent/US7145224B2/en active Active
- 2005-01-27 KR KR1020050007393A patent/KR101100838B1/ko active IP Right Grant
-
2008
- 2008-05-30 US US12/130,782 patent/USRE41869E1/en active Active
-
2010
- 2010-01-26 KR KR1020100006824A patent/KR101168973B1/ko active IP Right Grant
- 2010-01-26 KR KR1020100006821A patent/KR101168972B1/ko active IP Right Grant
- 2010-06-23 US US12/821,999 patent/USRE43663E1/en active Active
-
2011
- 2011-12-23 KR KR1020110141384A patent/KR101127199B1/ko active IP Right Grant
- 2011-12-23 KR KR1020110141519A patent/KR101127195B1/ko active IP Right Grant
Cited By (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107680950B (zh) * | 2013-11-27 | 2020-04-07 | 万国半导体股份有限公司 | 一种多芯片叠层的封装结构及其封装方法 |
CN107680950A (zh) * | 2013-11-27 | 2018-02-09 | 万国半导体股份有限公司 | 一种多芯片叠层的封装结构及其封装方法 |
CN104810343A (zh) * | 2014-01-28 | 2015-07-29 | 英飞凌科技奥地利有限公司 | 具有多个接触夹片的半导体器件 |
CN104810343B (zh) * | 2014-01-28 | 2018-02-09 | 英飞凌科技奥地利有限公司 | 具有多个接触夹片的半导体器件 |
US9837380B2 (en) | 2014-01-28 | 2017-12-05 | Infineon Technologies Austria Ag | Semiconductor device having multiple contact clips |
CN105702640A (zh) * | 2014-12-16 | 2016-06-22 | 英飞凌科技美国公司 | 具有减小的外形规格和增加的载流能力的功率半导体封装 |
CN105702640B (zh) * | 2014-12-16 | 2019-07-12 | 英飞凌科技美国公司 | 具有减小的外形规格和增加的载流能力的功率半导体封装 |
CN105448880A (zh) * | 2015-12-24 | 2016-03-30 | 江苏长电科技股份有限公司 | 一种多芯片单搭平铺夹芯封装结构及其工艺方法 |
CN105609425A (zh) * | 2015-12-24 | 2016-05-25 | 江苏长电科技股份有限公司 | 部分框架外露多芯片单搭平铺夹芯封装结构及其工艺方法 |
CN105633051A (zh) * | 2015-12-24 | 2016-06-01 | 江苏长电科技股份有限公司 | 部分框架外露多芯片多搭平铺夹芯封装结构及其工艺方法 |
CN105551982A (zh) * | 2015-12-24 | 2016-05-04 | 江苏长电科技股份有限公司 | 一种多芯片正装平铺夹芯封装结构及其工艺方法 |
CN105448882A (zh) * | 2015-12-24 | 2016-03-30 | 江苏长电科技股份有限公司 | 一种框架外露多芯片单搭平铺夹芯封装结构及其工艺方法 |
CN105448881A (zh) * | 2015-12-24 | 2016-03-30 | 江苏长电科技股份有限公司 | 一种框架外露多芯片多搭平铺夹芯封装结构及其工艺方法 |
CN105405833A (zh) * | 2015-12-24 | 2016-03-16 | 江苏长电科技股份有限公司 | 一种多芯片多搭平铺夹芯封装结构及其工艺方法 |
CN105405832A (zh) * | 2015-12-24 | 2016-03-16 | 江苏长电科技股份有限公司 | 部分框架外露多芯片平铺夹芯封装结构及其工艺方法 |
CN105405831A (zh) * | 2015-12-24 | 2016-03-16 | 江苏长电科技股份有限公司 | 一种框架外露多芯片正装平铺夹芯封装结构及其工艺方法 |
CN110676235A (zh) * | 2019-10-25 | 2020-01-10 | 成都赛力康电气有限公司 | 一种便于扩展的新型功率mos模组结构 |
CN116884932A (zh) * | 2023-09-06 | 2023-10-13 | 深圳智芯微电子科技有限公司 | 芯片封装结构 |
Also Published As
Publication number | Publication date |
---|---|
CN100521196C (zh) | 2009-07-29 |
KR101100838B1 (ko) | 2012-01-02 |
KR20100028605A (ko) | 2010-03-12 |
USRE41869E1 (en) | 2010-10-26 |
KR101127195B1 (ko) | 2012-03-29 |
JP2005217072A (ja) | 2005-08-11 |
CN101567367B (zh) | 2011-07-20 |
KR20120008481A (ko) | 2012-01-30 |
KR20100028606A (ko) | 2010-03-12 |
USRE43663E1 (en) | 2012-09-18 |
KR101168973B1 (ko) | 2012-07-27 |
KR101168972B1 (ko) | 2012-07-27 |
KR20120008480A (ko) | 2012-01-30 |
US20050161785A1 (en) | 2005-07-28 |
US7145224B2 (en) | 2006-12-05 |
KR101127199B1 (ko) | 2012-03-29 |
KR20050077759A (ko) | 2005-08-03 |
CN1649146A (zh) | 2005-08-03 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN101567367B (zh) | 半导体器件 | |
US8044520B2 (en) | Semiconductor device | |
US20140063744A1 (en) | Vertically Stacked Power FETS and Synchronous Buck Converter Having Low On-Resistance | |
US8044468B2 (en) | Semiconductor device | |
KR101116197B1 (ko) | 반도체 장치 및 전원 시스템 | |
US7095099B2 (en) | Low profile package having multiple die | |
US20060044772A1 (en) | Semiconductor module | |
JP2006216940A (ja) | 半導体装置 | |
JP4250191B2 (ja) | Dc/dcコンバータ用半導体装置 | |
JP2001068498A (ja) | 半導体装置 | |
JP4705945B2 (ja) | 半導体装置 | |
JP4250193B2 (ja) | Dc/dcコンバータ用半導体装置 | |
TW521416B (en) | Three commonly housed diverse semiconductor dice | |
JP2005051109A (ja) | パワー半導体モジュール | |
JP4800290B2 (ja) | 半導体装置 | |
JP2011181970A (ja) | 半導体装置 | |
US20230335474A1 (en) | Semiconductor power module package having lead frame anchored bars | |
CN115188756A (zh) | 芯片堆叠结构 | |
CN117174706A (zh) | 半桥电路封装结构 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
ASS | Succession or assignment of patent right |
Owner name: NEC CORP. Free format text: FORMER OWNER: RENESAS TECHNOLOGY CORP. Effective date: 20100812 |
|
C41 | Transfer of patent application or patent right or utility model | ||
COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: TOKYO, JAPAN TO: KANAGAWA, JAPAN |
|
TA01 | Transfer of patent application right |
Effective date of registration: 20100812 Address after: Kanagawa, Japan Applicant after: NEC ELECTRONICS Corp. Address before: Tokyo, Japan Applicant before: Renesas Technology Corp. |
|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
CP02 | Change in the address of a patent holder |
Address after: Tokyo, Japan Patentee after: Renesas Electronics Corp. Address before: Kanagawa, Japan Patentee before: Renesas Electronics Corp. |
|
CP02 | Change in the address of a patent holder | ||
CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110720 Termination date: 20211229 |