TW521416B - Three commonly housed diverse semiconductor dice - Google Patents

Three commonly housed diverse semiconductor dice Download PDF

Info

Publication number
TW521416B
TW521416B TW090112406A TW90112406A TW521416B TW 521416 B TW521416 B TW 521416B TW 090112406 A TW090112406 A TW 090112406A TW 90112406 A TW90112406 A TW 90112406A TW 521416 B TW521416 B TW 521416B
Authority
TW
Taiwan
Prior art keywords
die
pins
mosfet
scope
patent application
Prior art date
Application number
TW090112406A
Other languages
Chinese (zh)
Inventor
Chuan Cheah
Naresh Thapar
Srini Thiruvenkatachari
Original Assignee
Int Rectifier Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/577,867 external-priority patent/US6388319B1/en
Priority claimed from US09/812,464 external-priority patent/US6448643B2/en
Application filed by Int Rectifier Corp filed Critical Int Rectifier Corp
Application granted granted Critical
Publication of TW521416B publication Critical patent/TW521416B/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45117Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
    • H01L2224/45124Aluminium (Al) as principal constituent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48135Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
    • H01L2224/48137Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4911Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain
    • H01L2224/49111Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain the connectors connecting two common bonding areas, e.g. Litz or braid wires
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01013Aluminum [Al]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01079Gold [Au]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/12Passive devices, e.g. 2 terminal devices
    • H01L2924/1203Rectifying Diode
    • H01L2924/12032Schottky diode
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304Transistor
    • H01L2924/1306Field-effect transistor [FET]
    • H01L2924/13091Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/30107Inductance

Landscapes

  • Wire Bonding (AREA)
  • Electrodes Of Semiconductors (AREA)

Abstract

An SO-8 type package contains a control MOSFET die mounted on one lead frame section and a synchronous rectifier die comprising a synchronous MOSFET and Schottky diode die is mounted on a second lead frame pad section. The die are interconnected through the lead frame pads and wire bonds to define a buck converter circuit and the die and lead frame pads are overmolded with a common insulation housing.

Description

521416 A7 B7 五 發明說明( 本發明係關於半導體裝置,且更特別關於 裝置,苴中可兔置種新式 固定於為不同尺寸和不同接合面圖型的多個晶粒被 ,於-共同晶粒塾塊’且另一晶粒被固定於另—晶粒墊 塊,都設置在一共同包裝或封裝内。 例如DC至DC轉換器、同步轉換器、及類似者的許多 電路需要如M〇SFET和肖特基二極體的多數半導體组件。 廷些電路經常使用在可攜式電子裝#中m件通常分 別封裝且必須個別安裝在一支擇板上"分別封裝的元件佔 =廣大空間。再者’各元件產生熱量,且若靠近如微處理 态的其他組件則可干擾微處理器之操作。 凊參考第1圖,顯示有一傳統巴克轉換器電路,有時 稱為步降轉換器,其通常使用來縮減傳送到一可攜式電子 裝置或類似者之電路板上的積體電路和處理器之電壓。例 如,電路可使用來把12伏特DC之一輸入電壓減小至5伏特 DC(或在有些情形中的33或15伏特DC)以驅動一積體電路 或其他負載(未顯示)。 第1圖之電路為熟知,且使用一N通道M〇SFET 1〇來在 連接至该MOSFET閘極G的一適合控制電路丨丨之控制下實 施切換功能。一肖特基二極體12使其陰極連接至m〇sfet 10之汲極D,且使用來在通常用脈頻調變控制的m〇sfe丁 10係截止時允許輸出電流再流入電感器13和電容器14。 美國專利第5,814,884號揭露其中一m〇sfet和肖特基 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 經濟部智慧財產局員工消費合作社印製 521416 A7 B7521416 A7 B7 Five invention descriptions (The present invention is about semiconductor devices, and more specifically about devices. A new type of rabbit can be implanted and fixed to multiple grains with different sizes and different joint surface patterns. Yu-common grains 'Blocks' and another die are fixed in another-die pads, all placed in a common package or package. Many circuits such as DC-to-DC converters, synchronous converters, and the like require MOSFETs And most of the semiconductor components of Schottky diodes. These circuits are often used in portable electronic devices. M pieces are usually packaged separately and must be individually installed on a selective board. "The separately packaged components occupy a lot of space." Furthermore, 'each component generates heat, and it can interfere with the operation of the microprocessor if it is close to other components such as the micro-processing state. 凊 Refer to Figure 1, which shows a traditional Buck converter circuit, sometimes called a step-down converter , Which is typically used to reduce the voltage of integrated circuits and processors that are delivered to a portable electronic device or similar circuit board. For example, a circuit can be used to reduce one of the 12 volt DC input voltages 5 Volt DC (or 33 or 15 Volt DC in some cases) to drive an integrated circuit or other load (not shown). The circuit in Figure 1 is well known and uses an N-channel MOSFET 80 to A suitable control circuit connected to the MOSFET gate G implements the switching function. A Schottky diode 12 has its cathode connected to the drain D of the MOSFET 10, and is used in the usual pulse The frequency modulation-controlled MOSFET 10 allows the output current to flow into the inductor 13 and the capacitor 14 at the time of cut-off. U.S. Patent No. 5,814,884 discloses that one of the MOSFET and SCHOTT basic paper standards is applicable to the Chinese National Standard (CNS) A4 Specifications (210 X 297 mm) Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs 521416 A7 B7

五、發明說明(2 二極體被安裝在—共同晶粒塾塊上以縮減板面朝、元件 數目、和成未的一包裝。 將期望來縮減由多個半導體裝置所需的板面空間’且 來縮減在此等電力轉換器和其他電力子系統中的元件數目 和組裝成本來供高密度應用。 發明之概要 依據本發明之一層面,一種半導體裝置包括··至少第 、第一、和第三半導體晶粒,各具有包含個別電極的相 反表面一傳導性導線架,包括第-和第二分立的晶粒塾 塊區,該等第一和第二半導體晶粒係設置在該第一晶粒墊 塊上,且該第三半導體晶粒係設置在該第二晶粒墊塊上; 第-多個插腳,係與該第—晶粒塾塊之—邊緣整合且從其 中延伸;第二多個插腳,係與該第二晶粒墊塊之一邊緣整 合且從其中延伸;帛三多個插腳係彼此分開,且自該等第 、和第一晶粒墊塊分開;第一多條結合配線,把該第一半 導體晶粒之一表面連接到該等第三多個插腳中之至少一 個;第二多條結合配線,把該第三半導體晶粒之一表面連 接到該等第三多個插腳中之至少另一個;及一封裝體,用 來封裝該導線架、半導體晶粒、及結合配線,該等第一, 第二和第三多個插腳延伸超過該封裝體之周邊來供外部連 接用。 該等封裝體和第一、第二、和第三多個插腳可依照— 個S0-8包裝標準。該等第一和第二多個插腳可延著該封裝 體之一共同邊緣來設置。較佳地,該等第三多個插腳係延 本紙張尺度適財國國家標準(CNS)A4規格(210 X 297公爱)V. Description of the invention (2 The diode is mounted on a common die block to reduce the board orientation, the number of components, and the package. It is expected that the board space required by multiple semiconductor devices will be reduced. 'To reduce the number of components and assembly costs in these power converters and other power subsystems for high-density applications. SUMMARY OF THE INVENTION According to one aspect of the present invention, a semiconductor device includes ... at least the first, first, And a third semiconductor die each having a conductive lead frame with an opposite surface including an individual electrode, including first and second discrete die bulk regions, and the first and second semiconductor die are disposed on the first A die pad, and the third semiconductor die is disposed on the second die pad; the first plurality of pins are integrated with and extend from the edge of the first die block; The second plurality of pins are integrated with and extend from one edge of the second die pad; the third plurality of pins are separated from each other and separated from the first die and the first die pad; Multiple bonding wires to connect the first half One surface of the conductor die is connected to at least one of the third plurality of pins; and a second plurality of bonding wires connects one surface of the third semiconductor die to at least one of the third plurality of pins. One; and a package for packaging the lead frame, semiconductor die, and bonding wiring, the first, second, and third pins extending beyond the periphery of the package for external connection. The package and the first, second, and third pins may be in accordance with a S0-8 packaging standard. The first and second pins may be disposed along a common edge of the package. Better The third and more pins are based on the paper standard (CNS) A4 (210 X 297)

521416 A7521416 A7

著孩封裝體之一相反共同邊緣而設置。 依據本發明之另一層面, 曰λ 孩專苐一和第二晶粒係 Μ_τΒ曰粒,各具有一.源極、 一和第二MOSFET晶粒與該等 ^弟 ^ , 寻们別苐一和弟二晶粒墊塊區One of the packages is opposite the common edge. According to another aspect of the present invention, the first and second crystal grains λ_M and τB are each provided with a source, a first and a second MOSFET crystal and the other ^, please do not find one Hedier

接觸的表面係該等没極電極;且該等第一和第二刪FET 晶粒的該等個別源極和閑極電極被連接至該等第三多個插 腳中之個別者。 較:地’該第二半導體晶粒係—肖特基二極體晶粒, ㈣二f導體晶粒之該相反表面包括麵合至該第-晶粒墊 塊區的》肖特基_極體之陰極電極,使得該肖特基二極體 之該陰極電極電氣地連接至該第_個则贿晶粒之該汲 極電極且電氣連接至該等第-多個_,該肖特基二極體 晶粒之相反表面包含-陽極電極。較佳地,該肖特基二極 體晶粒之該陽極電極經由結合配線而耦合至該第一個 MOSFET晶粒之該源極電極。 依據發明之進-步改良,連接至一分立插腳的一單源 導線作用為用於控制M〇SFET之卡爾文接觸點;且晶粒間 的電力連線被做在該封裝體内部,而非於出腳處,可縮減 雜sfL且間化機板安裝。 從參考附圖的發明之下面描述,本發明之其他特徵和 優點將變得明顯。 圖式之簡單掠诫 第1圖係-已知巴克轉換器電路之電路圖; 第Θ係使用串‘之控制MOSFET和包含一並聯連 本紙張尺度適用中國國家標準(CNS)A4規297公髮一 I „ ------ (請先閱讀背面之注意事項me寫本頁) · ;線· 521416 A7 五、發明說明(4 經 Μ 部 智 慧 財 產 -局 員 工 消 費 合 -作 社 ,印 製 接的MOSFET和肖特基二極體之_同步整流器的電路圖; 第3圖係可使用來依據發明之一實施例而封裝第2圖 之MOSFET晶粒和肖特基晶粒兩者的一個8插腳s〇_8式包 裝之透視圖; 第4圖係第3圖之包裝和第2圖之電路的構造上視圖; 第5圖顯示有一經放大插圖的第3和4圖之包裝的導線 架之上視圖,且顯示MOSFET和肖特基二極體晶粒固定於 隔開的導線架墊塊之安裝且以結合配線於晶粒和導線架出 腳間;及 第6圖顯示發明之進一步實施例。 較佳實施例之詳細描沭 第2圖顯示使用N通道MOSFET 20作為切換或控制裝 置的一同步巴克轉換器電路,及取代第丨圖之二極體12的並 聯用於“同步整流”之一N通道MOSFET 21和一肖特基二極 體22,其中MOSFET 21在控制FE1: 20截止期間為導通。 依據本發明,MOSFET 20、MOSFET 21和肖特基二極 體22係如由第2圖中的點線方塊23顯示地共同包裝在一共 同封裝體内的晶粒。此電路有用來避免因第1圖之二極體12 的順向壓降所致的損失。它因肖特基二極體22於比本體二 極體者較低的順向電壓來導通而也消除垂直傳導MOSFET 21之内在本體二極體(未顯示)之效應。 第2圖之MOSFET 20、21可為從國際整流器公司(IRFC) 獲得的30v、35毫歐姆晶粒。替換地,晶粒20和21可為分別 具有尺寸 0_102x0.070x0.008 英吋、和 0·071χ0·070χ0·008 英 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 7 ------------------ (請先閱讀背面之注意事項再填寫本頁) 訂- --線·The contacting surfaces are the non-polar electrodes; and the individual source and sink electrodes of the first and second FET die are connected to individual ones of the third plurality of pins. Comparison: 'The second semiconductor grain system-Schottky diode grain, the opposite surface of the second f conductor grain includes the "Schottky_pole" which faces the first grain block region. The cathode electrode of the body such that the cathode electrode of the Schottky diode is electrically connected to the drain electrode of the _th crystal grain and electrically connected to the -multiple_, the Schottky The opposite surface of the diode crystal contains an anode electrode. Preferably, the anode electrode of the Schottky diode die is coupled to the source electrode of the first MOSFET die via a bonding wire. According to the further improvement of the invention, a single source wire connected to a discrete pin is used to control the Calvin contact point of the MOSFET; and the power connection between the grains is made inside the package instead of At the foot, the sfL can be reduced and the board can be installed. Other features and advantages of the present invention will become apparent from the following description of the invention with reference to the accompanying drawings. The simple precepts of the diagram. Figure 1 is a circuit diagram of a known Buck converter circuit. The Θ is a string of control MOSFETs and includes a parallel connection. I „------ (Please read the precautions on the back and write this page first) ·; line · 521416 A7 V. Description of the invention (4 Ministry of Intellectual Property-Bureau Staff Consumer Cooperation-Printing Company Circuit diagram of the MOSFET and Schottky diode_ synchronous rectifier; Figure 3 is an 8-pin that can be used to package both the MOSFET die and the Schottky die of Figure 2 according to an embodiment of the invention Perspective view of s〇_8 package; Figure 4 is a top view of the structure of the package of Figure 3 and the circuit of Figure 2; Figure 5 shows the lead frame of the package of Figures 3 and 4 with an enlarged illustration The top view shows the installation of the MOSFET and Schottky diode die fixed to the spaced apart leadframe pads and the bonding wiring between the die and the leadframe lead; and Figure 6 shows a further embodiment of the invention A detailed description of the preferred embodiment. Figure 2 shows the use of N-channel MOSFET 20 for A synchronous Barker converter circuit of a switching or control device, and one of the N-channel MOSFET 21 and a Schottky diode 22 which are used for "synchronous rectification" in parallel to replace the diode 12 in Fig. 丨, where the MOSFET 21 is in Control FE1: Turn-on period is 20. According to the present invention, MOSFET 20, MOSFET 21, and Schottky diode 22 are crystals packaged together in a common package as shown by the dotted line box 23 in FIG. This circuit is used to avoid the loss caused by the forward voltage drop of the diode 12 in Figure 1. It is turned on because the Schottky diode 22 has a lower forward voltage than the bulk diode. It also eliminates the effect of the intrinsic body diode (not shown) of the vertical conduction MOSFET 21. The MOSFETs 20 and 21 of Fig. 2 can be 30v and 35 milliohm die obtained from International Rectifier Corporation (IRFC). The grains 20 and 21 may have dimensions of 0_102x0.070x0.008 inches and 0.071 × 0.070 × 0 · 008 respectively. The paper size of the paper is applicable to China National Standard (CNS) A4 (210 X 297 mm) 7 --- --------------- (Please read the notes on the back before filling this page) Order- --Line ·

521416 五、發明說明(5 ) 寸的型式IRFC 73XXB MOSFET;且肖特基二極體22可為 尺寸〇.021><〇.〇5〇><〇.〇1〇英吋的型式53〖%又又又。 封裝體23可有第3和1圖中顯示的已知型式s〇-8包裝 之形式。因此,第3圖顯示有從一塑膠絕緣封裝體3〇延伸的 八支並排插腳1至8(第4圖)的s〇-8表面安裝封裝體。如在第 4圖中看到的,M0SFET晶粒2〇、M〇SFET晶粒21、和肖特 基一極體22被安裝在一共同包裝3〇中(如將稍後描述的), 且互相連接來獲得如第2圖或其他電路組態中的外部連 接。然而較佳地,把内部連接儘可能做得多來減少電路電 感。因此’如將在第6圖中顯示的,許多電力連接被做在包 裝30内。 在第4圖中,MOSFET 21之汲極和肖特基二極體22之 陰極被彼此連接,且如將稍後描述地連接至一共同導線架 部段之插腳7至8。MOSFET 21之源極和閘極由結合配線分 別連接至隔離插腳1和2,且肖特基二極體22之陽極由結合 配線連接至MOSFET 21之源極。 第5圖更詳細顯示有MOSFET 20、MOSFET 21、和肖 特基二極體22的導線架40。導線架40包括插腳7和8從其中 整體延伸的一第一晶粒墊塊41A。第一晶粒墊塊41A可大於 一傳統導線架之主墊塊本體,使得MOSFET 2 1和宵特基二 極體22兩者可安裝於它。導線架4〇也包括用來收納 MOSFET 20且插腳5和6從其中整體延伸的一第二晶粒墊 塊41B。根據發明之新式層面,塑膠絕緣封裝體3〇之側壁 係比傳統封裝體者薄’以不顯著減少對濕氣之電阻地來容 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) · ^-----裝· 1 (請先閱讀背面之注意事項寫本頁) 訂· •線- 經濟部智慧財產局員工消費合作社印製 521416 A7 B7 •濟 部 智 慧 財 產 局 員 工. 消 f 合 作 社 印 製 五、發明說明(6 納較大的晶粒墊塊41A、41B。 導線架也包含—腳1至4和岌經模鑄封裝體30内的個 別結合墊塊延伸部。這些原先與導線架本體4〇整合(在模轉 期間),但顯不於把插腳1至4彼此隔離和從晶粒墊塊41八、 41B隔離的其嚴苛情況。典型上,插腳1至*彼此共平面且 與晶粒墊塊4 1A、4 1B共平面。 導線架40係傳導性框架且可完成傳統導線架焊接。肖 特基二極體22之底陰極表面和m〇SFET 21之底汲極表面 經由一傳導樹脂晶粒附著組合物來連接至晶粒墊塊41 a, 且因此連接至插腳7和8。替換地,肖特基二極體22之陰極 表面和MOSFET 21之>及極表面可焊接至晶粒塾塊4ia,或 可使用含有銀粒子的傳導玻璃來連接至晶粒墊塊41A。 肖特基二極體22之陽極電極由金質結合配線5〇和5 1 結合至MOSFET 21之源極電極。MOSFET 21之源極和閘極 電極由金質配線52和53分別連接至插腳1和2之内部結合延 伸部。替換地,可使用铭質結合配線。 MOSFET 20之汲極經由一傳導樹脂附著組合物而連 接至晶粒墊塊41B,且因此也連接至導線架4〇之插腳5和 6。替換地,MOSFET 20之汲極表面可焊接至晶粒墊塊 41B,或可使用含有銀粒子的傳導玻璃來連接至晶粒墊塊 41B 〇 MOSFET 20之源極電極由金質結合配線54連接至插 腳3之内部結合延伸部。MOSFET 20之閘極電極由金質結 合配線55連接至插腳4之内部結合延伸部。替換地,可使用 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 9 1------------^ ---------^---------線 (請先閱讀背面之注意事項再填寫本頁) 521416 經濟部智慧財產局員工消費合作社印製521416 V. Description of the invention (5) inch IRFC 73XXB MOSFET; and Schottky diode 22 may have a size of .021 > < 0.0.05 > < 0.0.10 inch 53〗% again and again. The package body 23 may be in the form of a known type so-8 package shown in FIGS. 3 and 1. Therefore, Figure 3 shows a so-8 surface mount package with eight side-by-side pins 1 to 8 (Figure 4) extending from a plastic insulating package 30. As seen in FIG. 4, the MOSFET die 20, the MOSFET die 21, and the Schottky monopole 22 are mounted in a common package 30 (as will be described later), and Connect to each other to obtain external connections as in Figure 2 or other circuit configurations. However, it is better to make the internal connections as much as possible to reduce the circuit inductance. Therefore, as will be shown in Figure 6, many electrical connections are made in the package 30. In Fig. 4, the drain of the MOSFET 21 and the cathode of the Schottky diode 22 are connected to each other and to pins 7 to 8 of a common lead frame section as will be described later. The source and gate of the MOSFET 21 are connected to the isolation pins 1 and 2 by bonding wires, respectively, and the anode of the Schottky diode 22 is connected to the source of the MOSFET 21 by bonding wires. FIG. 5 shows the lead frame 40 with the MOSFET 20, the MOSFET 21, and the Schottky diode 22 in more detail. The lead frame 40 includes a first die pad 41A integrally extending from the pins 7 and 8 therefrom. The first die pad 41A may be larger than the main pad body of a conventional lead frame, so that both the MOSFET 21 and the Schottky diode 22 can be mounted on it. The lead frame 40 also includes a second die pad 41B for accommodating the MOSFET 20 and the pins 5 and 6 extending integrally therefrom. According to the new aspect of the invention, the side walls of the plastic insulation package 30 are thinner than those of traditional packages, so that the paper's dimensions are compatible with Chinese National Standard (CNS) A4 (210 X 297) without significantly reducing resistance to moisture. Mm) · ^ ----- install · 1 (please read the notes on the back to write this page) Order · • Line-Printed by the Intellectual Property Bureau of the Ministry of Economic Affairs and Consumer Cooperatives 521416 A7 B7 • Employees of the Ministry of Economic Affairs and Intellectual Property Printed by the cooperative Fifth, description of the invention (6 nanometers larger die pads 41A, 41B. The lead frame also contains—pins 1 to 4 and individual bonded pad extensions in the die-cast package 30. These were originally integrated with the leadframe body 40 (during the mold rotation), but were not as severe as the isolation of pins 1 to 4 from each other and from the die pads 41 and 41B. Typically, pins 1 to 4 * Coplanar with each other and coplanar with the die pads 4 1A, 4 1B. The lead frame 40 is a conductive frame and can be used for traditional lead frame welding. The bottom cathode surface of the Schottky diode 22 and the mSFET 21 The bottom drain surface is adhered to the composition via a conductive resin crystal Connected to the die pad 41a, and therefore to pins 7 and 8. Alternatively, the cathode surface of the Schottky diode 22 and the > and pole surfaces of the MOSFET 21 may be soldered to the die pad 4ia, or A conductive glass containing silver particles can be used to connect to the die pad 41A. The anode electrode of the Schottky diode 22 is bonded to the source electrode of the MOSFET 21 by gold bonding wires 50 and 51. The source of the MOSFET 21 The gate and gate electrodes are connected to the internal bonding extensions of pins 1 and 2 by gold wirings 52 and 53, respectively. Alternatively, a quality bonding wiring can be used. The drain of MOSFET 20 is connected to it via a conductive resin adhesion composition Die pad 41B, and therefore also connected to pins 5 and 6 of lead frame 40. Alternatively, the drain surface of MOSFET 20 may be soldered to die pad 41B, or may be connected using conductive glass containing silver particles To the die pad 41B. The source electrode of MOSFET 20 is connected to the internal bonding extension of pin 3 by gold bonding wiring 54. The gate electrode of MOSFET 20 is connected to the internal bonding extension of pin 4 by gold bonding wiring 55. . Alternatively, you can use the paper size With China National Standard (CNS) A4 specification (210 X 297 mm) 9 1 ------------ ^ --------- ^ --------- (Please read the notes on the back before filling out this page) 521416 Printed by the Consumer Cooperatives of the Intellectual Property Bureau of the Ministry of Economic Affairs

_ ^ .— (請先閱讀背面之注意事項ml寫本頁) · 線· A7 ---—____ _ __ 五、發明說明(7 ) 在呂質結合配線。 插腳1至8之内部結合延伸部典型係鍍有銀或金。結合 配線一般結合至晶粒表面,或如技術中已知地使用熱音^ 球體結合而結合至内部結合延伸部,雖然可使用其他程序 而不偏離發明之範疇。 此後,可為如NITTO MP7400的一模鑄組合物之封裝 體30以一傳統模鑄操作來形成;然而,可使用如陶瓷、隱 式材料或注模式金屬等其他類型材料。 第6圖顯示發明之第二實施例,其中第5圖之相同標號 識別相同元件。第6圖之元件已從其第5圖之位置重新配 置,使MOSFET 20固定於墊塊41八而乂〇317£丁 21和肖特基 二極體22固定於墊塊41B。M〇SFET 2〇、21之閘極以配^ 分別結合至插腳2和4,且MOSFET 21之源極電極連接至插 腳5和2。依據第6圖之進一步發明,M〇SFET 2〇之源極電 極由在封裝體30内的結合配線1〇〇結合至墊塊41β。因此, MOSFET 20之源極傳統上分別内部地連接至m〇sfet 和肖特基二極體22之汲極和陰極電極,然而第5圖中這些連 接係由外部來做。更依據發明地,一卡爾文接觸點由結合 配線101結合至插腳1。 請注意到可使用其他包裝型式,但共同包裝在一表面 安裝包裝(較佳為SO-8)中減少相當的機板空間。所產生裝 置可使用傳統大量生產焊接技術來向下焊接至一印刷電路 板。 雖然相關於特定實施例而描述了本發明,對那些熟知 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) 10_ ^ .— (Please read the note on the back first to write this page) · Wire · A7 ------- ____ _ __ 5. Description of the invention (7) Combine wiring in Lu Zhi. The internal joint extensions of pins 1 to 8 are typically plated with silver or gold. Bonding The wiring is generally bonded to the surface of the die, or bonded to the internal bonding extension using thermal sound ball bonding as known in the art, although other procedures can be used without departing from the scope of the invention. Thereafter, the package body 30, which may be a die-casting composition such as NITTO MP7400, is formed by a conventional die-casting operation; however, other types of materials such as ceramics, implicit materials, or injection-molded metals may be used. Fig. 6 shows a second embodiment of the invention, in which the same reference numerals of Fig. 5 identify the same elements. The components in FIG. 6 have been reconfigured from the positions in FIG. 5 so that the MOSFET 20 is fixed to the pad 41 and the MOSFET 21 and Schottky diode 22 are fixed to the pad 41B. The gates of MOSFETs 20 and 21 are coupled to pins 2 and 4, respectively, and the source electrode of MOSFET 21 is connected to pins 5 and 2. According to a further invention of FIG. 6, the source electrode of the MOSFET 20 is bonded to the pad 41β by the bonding wiring 100 in the package 30. Therefore, the source of the MOSFET 20 is traditionally connected internally to the drain and cathode electrodes of the MOSFET and Schottky diode 22, respectively. However, these connections in Figure 5 are made externally. More preferably, a Calvin contact is bonded to the pin 1 by a bonding wiring 101. Please note that other packaging types can be used, but co-packaging reduces the equivalent board space in a surface mount package (preferably SO-8). The resulting device can be soldered down to a printed circuit board using conventional mass production soldering techniques. Although the present invention has been described in relation to specific embodiments, the Chinese National Standard (CNS) A4 specification (210 X 297 mm) applies to those who are familiar with this paper size. 10

521416 五、發明說明(8 該技術者’許多其他變化和修正及其他應賴變得明顯。 因此較佳地,本發明不被此中之 ,^ 付疋揭路所限,而口 Α π 附申請專利範圍限制。k /、又所 元件標號對照 0、2〇、21...N通道MOSFET 11…控制電路 12、22·..肖特基二極體 13…電感器 14·.·電容器 23···方塊 3 〇…封裝體 4〇.··導線架 41A··.第一晶粒塾塊 41B ·..弟—晶粒塾塊 50-55···金質配線 100、101…結合配線 . I I---------I «11ΙΙΙΙΙ — (請先閱讀背面之注意事項再填寫本頁} 經-^部智慧財產局員工消費合作牡印製 本纸張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐)521416 V. Description of the invention (8 The skilled person's many other changes and amendments and other dependencies become obvious. Therefore, preferably, the present invention is not limited by this, ^ Limits on the scope of patent applications. K /, and the reference numbers of components are 0, 20, 21 ... N-channel MOSFETs 11 ... control circuits 12, 22 ... Schottky diodes 13 ... inductors 14 ... capacitors 23 ··· Block 3 〇 ... Package 4 ··· Lead frame 41A ·· .. First die block 41B ··· Brother—die block 50-55 ·· Gold wiring 100, 101 ... Combined wiring. I I --------- I «11ΙΙΙΙΙ— (Please read the precautions on the back before filling out this page} The Ministry of Intellectual Property Bureau's consumer cooperation printed on this paper is applicable to China National Standard (CNS) A4 (210 X 297 mm)

Claims (1)

六、申請專利範圍 第90112406號申請案申請專利範圍修正本911220 1· 一種半導體裝置,包含有: .· 至少第―、第二、和第三半導體晶粒,各具有包含 個別電極的相反表面; 傳導性導線架,包括第一和第二分立的晶粒塾塊 區、亥等第-和第二半導體晶粒係設置在該第一晶粒墊 塊上’且該第三半導體晶粒係設置在該第二晶粒墊塊 上; 第-多個插W,係與該第一晶粒墊塊之一邊緣整合 且從其中延伸; 第二多個插腳,係與該第二晶粒墊塊之一邊緣整合 且從其中延伸; 第三多個插腳,係彼此分開且自該等第一和第二晶 粒墊塊分開; Βθ 第一多條結合配線,把該第一半導體晶粒之一表面 連接到該等第三多個插腳中之至少一個; 第二多條結合配線,把該第三半導體晶粒之一表面 連接到該等第三多個插腳中之至少一個;及 一封裝體,用來封裝該導線架、半導體晶粒、及結 σ配線’該等第_,第二和第三多個插腳延伸超過該封 裝體之周邊來供外部連接用。 2·依據申請專利範圍第1項之裝置,其中·· 該等第一和第三晶粒係MOSFET晶粒,各具有一源 極、汲極和閘極電極; 521416 ABC D •六、申請專利範圍 々=等第-和第二M0SFET晶粒與該等個別第一和 第一 aa粒墊塊區接觸的表面係該等汲極電極;且 該等第一和第三M0SFET絲的該等個別閑極電 極:該第—個M0贿晶粒之該源極電極被連接至該 4弟二多個插腳中之個別者。 裝 3·依據申請專利範圍第旧之裝置,其中該第一半導體晶 粒係-肖特基二極體晶粒,該第一半導體晶粒之相反 表面包3耦合至該第一晶粒墊塊區的該肖特基二極體 之陰極電極,使得該宵特基二極體之該陰極電極電氣 地連接至該第一個M〇SFET晶粒之該汲極電極且電氣 訂 連接至該等第一多個插腳,該肖特基二極體晶粒之相 反表面包含一陽極電極。 4·依據申請專利範圍第3項之裝置,其中該肖特基二極體 晶粒之該陽極電極經由結合配線而耦合至該第一個 MOSFE丁晶粒之該源極電極。 線 5.依據申請專利範圍第1、2、3或4項之裝置,其甲該等 封裝體及第一、第二、和第三多個插腳依照一個s〇_8 包裝標準。 6·依據申睛專利範圍第1、2、3或4項之裝置,其中該等 第三多個插腳係延著該封裝體之一相反共同邊緣而設 置。 7.依據申請專利範圍第1、2、3或4項之裝置,其中該等 第三多個插腳具有與其餘者共平面且相對於個別晶粒 墊塊區之一經放大的結合墊塊區。6. Application for Patent Scope No. 90112406 Application for Amendment of Patent Scope 911220 1. A semiconductor device comprising: .. at least the first, second, and third semiconductor dies, each having an opposite surface including an individual electrode; A conductive lead frame includes first and second discrete grain bulk regions, first and second semiconductor grains are provided on the first grain pad, and the third semiconductor grain is provided. On the second die pad; the first plurality of pins are integrated with and extended from an edge of the first die pad; the second plurality of pins are connected to the second die pad One of the edges is integrated and extends from it; the third plurality of pins are separated from each other and separated from the first and second die pads; Βθ is a first plurality of bonding wires, one of the first semiconductor die Surface-connected to at least one of the third plurality of pins; a second plurality of bonding wires connecting one surface of the third semiconductor die to at least one of the third plurality of pins; and a package body To encapsulate the lead frame A semiconductor die, and a wiring junction σ 'of _ such, second, and third plurality of pins extending beyond the perimeter of the closure to the body of the package for external connection. 2. The device according to item 1 of the scope of patent application, in which the first and third die-based MOSFET die each have a source electrode, a drain electrode, and a gate electrode; 521416 ABC D • VI. Patent Application Range 々 = The surfaces of the first- and second-M0SFET grains in contact with the individual first and first aa pad regions are the drain electrodes; and the individual of the first and third M0SFET wires Idle electrode: The source electrode of the first M0 die is connected to one of the two or more pins. Device 3. The oldest device according to the scope of the patent application, wherein the first semiconductor die system is a Schottky diode die, and the opposite surface package 3 of the first semiconductor die is coupled to the first die pad. The cathode electrode of the Schottky diode in the region, so that the cathode electrode of the Schottky diode is electrically connected to the drain electrode of the first MOSFET die and is electrically connected to the The first plurality of pins, an opposite surface of the Schottky diode grains includes an anode electrode. 4. The device according to item 3 of the scope of patent application, wherein the anode electrode of the Schottky diode chip is coupled to the source electrode of the first MOSFE die by a bonding wire. Line 5. The device according to item 1, 2, 3 or 4 of the scope of patent application, the package body and the first, second, and third pins are in accordance with a so_8 packaging standard. 6. The device according to item 1, 2, 3 or 4 of the Shen Yan patent scope, wherein the third plurality of pins are arranged along the opposite common edge of one of the packages. 7. The device according to claim 1, 2, 3, or 4, wherein the third plurality of pins have an enlarged bonding pad area that is coplanar with the rest and relative to one of the individual die pad areas. 13 六、申請專利範圍 8· —種半導體裝置,包含有: 第一和第二MQSFET晶粒,各具有包含個別汲極、 源極和閘極電極的相反表面; 一肖特基二極體晶粒,具有包含個別陽極和陰極電 極的相反表面; 一傳導性導線架,包括第一和第二分立的晶粒墊塊 區,該第一個MOSFET晶粒和該肖特基二極體晶粒係設 置在該第一晶粒墊塊上,使得其之該等汲極和陰極電極 電氣地耦合至該第一晶粒墊塊區,且該第二M〇SFET晶 粒係設置在該第二晶粒墊塊上,使得其汲極電極電氣地 耦合至其中; 第一多個插腳,係與該第二晶粒墊塊之一邊緣整合 且從其中延伸; 第二多個插腳,係與該第二晶粒墊塊之一邊緣整合 且從其中延伸; 第三多個插腳,係彼此分開且自該等第一和第二晶 粒墊塊分開; 第一多條結合配線,把該第一個M〇SFET晶粒之該 源極電極連接到該等第三多個插腳中之至少一個; 第二多條結合配線,把該第二MOSFET晶粒之該源 極便連接到該等第三多個插腳中之另一個,或連接至該 第一晶粒墊塊;及 一封裝體,用來封裝該導線架、M〇SFE1^0肖特基 二極體晶粒、及結合配線,該等第一,第二和第三多個 i、申請專利範圍 插腳延伸超過該封裝體之周邊來供外部連接用。 9.依據申請專利範圍第8項之裝置’其中該肖特基二極體 曰曰粒之n亥%極電極經由結合配線而輕合至該第一個 MOSFET晶粒之該源極電極。 1〇·依據申請專利範圍第8或9項之裝置,其中該等封裝體 及第一、第二、和第三多個插腳依照一個s〇_8包裝標 準。 、 11·依據申請專利範圍第8或9項之裝置,其中該等第一和 第二多個插腳係延著該封裝體之一共同邊緣來設置。 12. 依據申請專利範圍第8或9項之裝置,其中該等第三多 個插腳係延著該封裝體之一相反共同邊緣而設置。 13. 依據申請專利範圍第8或9項之裝置,其中各個該等第 三多個插腳具有肖其餘者共平面且相對於個別晶粒墊 塊區之一經放大的結合墊塊區。 14·依據申請專利範圍第1、2、3、*、8、或9項之裝置, 其更包括把該第三MOSFET晶粒之該源極連接到該等 第三多個插腳中之一個的一卡爾文接觸結合配線。13 6. Scope of Patent Application 8. A semiconductor device including: first and second MQSFET dies, each having opposite surfaces including individual drain, source, and gate electrodes; a Schottky diode Grains having opposite surfaces containing individual anode and cathode electrodes; a conductive leadframe including first and second discrete die pad regions, the first MOSFET die and the Schottky diode die Is disposed on the first die pad so that the drain and cathode electrodes thereof are electrically coupled to the first die pad region, and the second MOSFET chip is placed on the second die The die pad is electrically coupled to its drain electrode; the first plurality of pins are integrated with and extend from one edge of the second die pad; the second plurality of pins are connected to the One edge of the second die pad is integrated and extends therefrom; a third plurality of pins are separated from each other and separated from the first and second die pads; a first plurality of bonding wires connect the first The source electrode of a MoSFET die is connected to the third At least one of the two pins; a second plurality of bonding wires connecting the source of the second MOSFET die to the other of the third plurality of pins, or to the first die pad ; And a package for packaging the lead frame, MoSFE1 ^ 0 Schottky diode die, and bonding wiring, the first, second and third multiple i, patent application pin extensions Beyond the periphery of the package for external connection. 9. The device according to item 8 of the scope of the patent application, wherein the Schottky diode is referred to as the n% electrode of the grain and is lightly closed to the source electrode of the first MOSFET die through bonding wiring. 10. The device according to item 8 or 9 of the scope of patent application, wherein the package body and the first, second, and third pins are in accordance with a so_8 packaging standard. 11. The device according to item 8 or 9 of the scope of patent application, wherein the first and second pins are arranged along a common edge of the package. 12. The device according to item 8 or 9 of the scope of patent application, wherein the third plurality of pins are arranged along the opposite common edge of one of the packages. 13. The device according to item 8 or 9 of the scope of the patent application, wherein each of the third plurality of pins has an enlarged bonding pad area coplanar with respect to one of the individual die pad areas. 14. The device according to item 1, 2, 3, *, 8, or 9 of the scope of patent application, which further includes a device that connects the source of the third MOSFET die to one of the third pins. One Calvin contact bonding wiring.
TW090112406A 2000-05-24 2001-05-23 Three commonly housed diverse semiconductor dice TW521416B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/577,867 US6388319B1 (en) 1999-05-25 2000-05-24 Three commonly housed diverse semiconductor dice
US09/812,464 US6448643B2 (en) 2000-05-24 2001-03-20 Three commonly housed diverse semiconductor dice

Publications (1)

Publication Number Publication Date
TW521416B true TW521416B (en) 2003-02-21

Family

ID=27077364

Family Applications (1)

Application Number Title Priority Date Filing Date
TW090112406A TW521416B (en) 2000-05-24 2001-05-23 Three commonly housed diverse semiconductor dice

Country Status (2)

Country Link
JP (1) JP3583382B2 (en)
TW (1) TW521416B (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4489485B2 (en) 2004-03-31 2010-06-23 株式会社ルネサステクノロジ Semiconductor device
JP4985809B2 (en) 2010-03-23 2012-07-25 サンケン電気株式会社 Semiconductor device
JP4985810B2 (en) * 2010-03-23 2012-07-25 サンケン電気株式会社 Semiconductor device
EP2765600A4 (en) 2011-09-30 2015-06-10 Rohm Co Ltd Semiconductor device
JP6520437B2 (en) * 2015-06-12 2019-05-29 富士電機株式会社 Semiconductor device

Also Published As

Publication number Publication date
JP2001358288A (en) 2001-12-26
JP3583382B2 (en) 2004-11-04

Similar Documents

Publication Publication Date Title
USRE43663E1 (en) Semiconductor device
JP2896126B2 (en) Semiconductor devices and surface mount packages
US7227198B2 (en) Half-bridge package
US5977630A (en) Plural semiconductor die housed in common package with split heat sink
US7615854B2 (en) Semiconductor package that includes stacked semiconductor die
US6448643B2 (en) Three commonly housed diverse semiconductor dice
KR101086751B1 (en) Semiconductor device and power supply system
JP4010792B2 (en) Semiconductor device
US8476752B2 (en) Package structure for DC-DC converter
WO2004064110A2 (en) Space-efficient package for laterally conducting device
WO2020262212A1 (en) Semiconductor device
JP4250191B2 (en) Semiconductor device for DC / DC converter
EP1079434A2 (en) Power device packaging structure
CN112530918B (en) Power semiconductor package with integrated inductor, resistor and capacitor
TW521416B (en) Three commonly housed diverse semiconductor dice
JP4709349B2 (en) Semiconductor die housing equipment
JP4705945B2 (en) Semiconductor device
JP4800290B2 (en) Semiconductor device
JP4250193B2 (en) Semiconductor device for DC / DC converter
JP2011181970A (en) Semiconductor device
JP4843605B2 (en) Semiconductor device module having flip chip device on common lead frame

Legal Events

Date Code Title Description
GD4A Issue of patent certificate for granted invention patent
MM4A Annulment or lapse of patent due to non-payment of fees