TW535300B - Light emitting diode with enhanced light extraction, method for growing the same and method for manufacturing the same - Google Patents

Light emitting diode with enhanced light extraction, method for growing the same and method for manufacturing the same Download PDF

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TW535300B
TW535300B TW089125695A TW89125695A TW535300B TW 535300 B TW535300 B TW 535300B TW 089125695 A TW089125695 A TW 089125695A TW 89125695 A TW89125695 A TW 89125695A TW 535300 B TW535300 B TW 535300B
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Taiwan
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light
layer
emitting diode
expander
substrate
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TW089125695A
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English (en)
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Steven P Denbaars
Michael Mack
Brian Thibeault
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Cree Lighting Co
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/20Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/02Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
    • H01L33/20Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate
    • H01L33/22Roughened surfaces, e.g. at the interface between epitaxial layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2933/00Details relating to devices covered by the group H01L33/00 but not provided for in its subgroups
    • H01L2933/0091Scattering means in or on the semiconductor body or semiconductor body package
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/44Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the coatings, e.g. passivation layer or anti-reflective coating
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00Nanotechnology
    • Y10S977/70Nanostructure
    • Y10S977/701Integrated with dissimilar structures on a common substrate
    • Y10S977/712Integrated with dissimilar structures on a common substrate formed from plural layers of nanosized material, e.g. stacked structures
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S977/00Nanotechnology
    • Y10S977/70Nanostructure
    • Y10S977/832Nanostructure having specified property, e.g. lattice-constant, thermal expansion coefficient
    • Y10S977/834Optical properties of nanomaterial, e.g. specified transparency, opacity, or index of refraction

Description

535300 A7 五、發明說明(2) 3.8)。根據Snell’s法則,光線是由一具有高折射係數的區 域傳到一具有低折射係數的區域,其是在某個關鍵角度之 内(相對於該表面的垂直方向),將會穿到該較低係數的區 域。在該關鍵角度之外到達該表面的光線將不會穿過,但 將經歷整體内部反射(TIR)。在一個發光二極體的例子 中,孩T I R光線可持續在該發光二極體中反射,直到其被 吸收為止。由於此現象,許多由習用發光二極體所產生的 光線即不會發射,而降低其效率。 一種降低T I R光線的百分比的方法是要在該發光二極體 的表面上產生隨機結構型式的光線散射中心。(由shnitzer 等人提出,,!1〇% External Quantum Efficiency Fr〇m Surface Textured, Thin Film Li^ht Emitting』]^;,,Applied Physics Letters 63 ’ 2174-2176頁(1993))。該隨機結構係在反應離子 蚀刻期間,藉由使用次微米直徑聚苯乙烯顆粒在該發光二 極體表面上做為一遮罩而成型於該表面上。該結構化的表 面的特徵在於該光線波長的層級可使光線的折射及反射的 方式並典法由S n e 11法則來預測’由於隨機干擾效應。此方 法已可改善發射效率由9到3 0 %。 表面結構的缺點是其可防止發光二極體中的有效電流展 開’其具有較差的該特徵化的電極層的電氣導電性,例如 P -型GaN。在具有良好電氣導電性的裝置,來自該p及η 型接觸窗可展開於整個個別的疊層中。而對於以較差電氣 導電性製成的較大裝置,電流即無法由該接觸窗展開到整 個疊層。因此,部份該活動層即不能經歷到該電流,故不 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 訂---------"^丨 ----*------ 535300 A7 B7 經濟部智慧財產局員工消費合作社印製 五、發明說明(3 能發射光線。爲了要在整個二極體區域產生均勻的電流發 射,導電材料的一展開層可已沉積在該表面上。然而,此 展開層通常需要是光學上透明的,所以光線能夠傳送通過 該疊層。當一隨機表面結構被加入到該發光二極體表面, 一足夠薄,及光學上透明的電流展開器即不能輕易地沉 積。 另一個增加來自一發光二極體的光線凝聚的方法係包含 該發射表面的一周期性的樣式,或是内部介面,其可重新 導向該光線由其内部補捉角到由該表面的形狀與期間所決 足的足義模式。請參考Krames等人所提出的美國專利編號 5,779,924。此技術爲一隨機結構表面的一特殊例,其中該 干擾政應即不再隨機,而該表面即可將光線搞合到特殊的 模式或方向。此方法的一個缺點是該結構很難製造,係因 爲該表面形狀及樣式必須是均勻的,並且非常小,大約是 在該發光二極體光線的單一波長的程度。此樣式也會造成 沉積一光學上透明的電流展開層的困難,如前所述。 增加光凝聚也可利用將該發光二極體的放射表面做成半 球形,而在中心具有一放射層。當此結構增加放射光的量 時’其卻很難製造。由Scifres及Burnham所提出的美國專 利編虎3,9 5 4,5 3 4中,揭示的形成一種發光二極體的陣列, 在每個發光二極體之上個別有一半球形。該半球形係形成 於一基板中,而二極體陣列即成長於其上。然後,該二極 體及鏡片結構即由該基板上蚀刻掉。此方法的缺點是其限 於將該結構形成在該基板表面,而由該基板移除該結構會 --------訂i I I ! Μ* _------- -------------- (請先閱讀背面之注意事項再填寫本頁) -6 -
535300 經濟部智慧財產局員工消費合作社印製 A7 -----— ___B7 五、發明說明(4) 造成製造成本的增加。同時,每個半球皆有一放射層直接 地位於其上,其需要非常精密的製造。 美國專利編號5,793,062揭示一種結構,其用於加強來自 一發光二極體的光萃取,藉由包含光學性的非吸收層來將 重新導向光線離開吸收區域,例如接觸窗,也重新導向光 線朝向該發光二極體的表面。此結構的一個缺點是,該非 吸收層需要形成下部切除的狹角層,對許多材料系統而言 非常難以製造。 ^ 、另一個万法來加強光凝聚的是將光子耦合到表面電漿模 式,而在該發光二極體的放射表面上的一薄膜金屬層之 内,其會放射回到輻射模式。[Kn〇ck等人所提出, Strongly DirectionaL_Emission Jxoiil AlGaAs/Gn Aq j ^ht
Emmmg Diodes, Applied Physics Letter 57,2327-2329 頁, (1990)]。這些結構依賴將由該半導體發射回來的光子隸合 到該金屬層中的表面電漿,其另耦合到最終凝聚的光子: 此裝置的一個缺點是,其很難製造,因為該週期性結構為 單一方向架構的格柵,溝槽間距很窄(<〇1微米)。同時, 整體外部量子效率很低(1.4丄5%),其大部份是由於光子 到表面電漿,及表面的電漿鲁週遭光子轉換機制的效率 低。此結構也會造成對一電流展開層同樣的困難,如上 述。 光凝聚也可藉由使發光二極體片的侧表面有一角度,來 產生-反向截短的三角錐的方式來改善。該角度化的表面 提供了以一放射面來將TIR光線補捉在該基板材料中 本紙張尺度適用中國國豕標準(CNS)A4規格(210 X 297公爱)
(請先閱讀背面之注意事項再填寫本頁) d—0----rll.llk 訂----- 經濟部智慧財產局員工消費合作社印制衣 535300 A7 B7 五、發明說明(5) [Krames 等人提出 ,High Power Truncated Inverted PyramidfAL.Ga! x)0 5In0 5P/GaP Light Emitting Diodes Exhibiting >50% External Qauntum Efficiency, Applied Physics Letters 75 (1999)]。藉由此方法,外部量子效率對 於InGaAlP材料系統顯示增加了 3 5 %到5 0 %。此方法對於 將大量光線補捉在該基板中的裝置是可行的。對於在藍寶 石基板上成長的GaN裝置,許多光線被補捉在GaN膜 中,所以將發光二極體片的侧表面角度化的方式並不能達 到所需要的改善。 另有一種加強光凝聚的方法是光子循環利用[Shnitzer等 人提出 , "Ultrahigh Spontaneous Emission Quantum Efficiency, 99.7% Internally and 72% Externally. From AlGaAs/GaAs/AlGaAs Double Hetero structures". Applied Physics Letters 62,131-133頁,(1993)]。此方法根據發光二 極體具有一高效率的活動層,可立即轉換電子及孔洞成為 光線,反之亦然。T I R光線由該發光二極體表面反射出 來,並撞擊到該活動層,而轉換回到一電子-孔洞配對。 由於該活動層的高效率,該電子-孔洞配對可幾乎立即地 重新轉換為光線,並再次放射到任意的方向。一百分比的 該循環利用的光線將會撞擊到在該關键角度内的發光二極 體放射表面之一,而逃出。反射回到該活動層的光線即再 次經過同樣的過程。 此方法的一個缺點是其僅能夠用於以非常低光學損失的 材料製成的發光二極體,且不能夠用於在其表面上具有一 -8- 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) l· 卜 — !·--------訂---------線— #----ίί II (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 535300 A7 '^ --------B7__ —_ 五、發明說明(7 ) 施例:,該陣列係由一種比發光二極體包裝材料的折射係 數要高的材料所形成。該LEE可使用許多不同的方法來成 形,並提供許多不同表面來讓補捉的光線能夠逃出。 另外,該新發光二極體也可將該LEE陣列放置在該發光 二極體本身之内,該内部LEE陣列也形成來提供一在空間 上改交的折射係數。該L E E陣列在該發光二極體成長過程 期間形成,一旦形成了該陣列,該發光二極體結構剩餘的 疊層即由一磊晶沉積技術成長於該陣列上,來將該lee陣 列包含於該發光二極體之内。光束將會被補捉在該磊晶層 或基板之中,其可與該LEE陣列作用,而可折射及/或反 射到可逃出該發光二極體的光束。 該新發光二極體的另一具體實施例包含在該發光二極體 的暴露表面上的一分散器層,而該疊層係以一具有高於該 發光二極體包裝材料之折射係數的材料來製作。撞擊到發 光二極體上的該分散器層的光線有較高的機率來散射到一 逃出方向。利用一表面材料來形成該光線分散器層,將粗 糙度樣式化到半導體表面的問題即可消除,而比Schnitzer 的方法具有更佳的優點。 另外,該新發光二極體可將分散器層沉積在該發光二極 體本身之中。該分散器層能夠在該發光二極體的磊晶成長 之前形成在該基板中,或在其上,或是在該發光二極體磊 晶結構本身之中。該分散器層係以一種材料製成,.其折射 係數與該基板及/或蟲晶材料不同,所以能夠發生光線散 射0 -10- 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) M#-------訂---------線 ___1! (請先閱讀背面之注意事項再填寫本頁) -——I I I I I I I ^ I · 535300 經濟部智慧財產局員工消費合作社印製 A7 B7 五、發明說明(8) 大多數上述的具體實施例,也可使用拋式晶片安裝技 術’而該基板即成爲該發光二極體主要發射表面。 本發明的這些及另外其它的特徵及好處對於本技藝的那 些專業人士將可由以下的詳細説明,並配合所附圖面而更 加瞭解,其中·· 星·式之簡單説明 圖1所示爲一新發光二極體的L E E陣列在該第二分散器 層之上的剖面圖; 圖2所示爲一新發光二極體的LEE陣列在該基板表面上 的剖面圖; 圖3所示爲L E E的基本形狀的剖面圖,其可形成於陣列 中而與該新發光二極體整合; 圖4所示爲一具有内部Lee陣列的新發光二極體的剖面 圖’其形成在該基板與該第一分散器層之間的介面; 圖5所示爲一 LEE陣列形成在該第一分散器層之内的一 新發光二極體的剖面圖; 圖6所示爲一形成有空洞的lee陣列的新發光二極體的 剖面圖; 圖7所tf爲一 LEE陣列形成在與該第一分散器層之介面 處的該基板之内的一新發光二極體的剖面圖; 圖8所示爲一表面分散器層形成在該第二分散器層上的 一新發光二極體的剖面圖; 圖9所示爲一表面分散器層形成在該基板上的一新發光 二極體的剖面圖; -11 - 本紙張尺度適用中國國豕標準(CNS)A4規格(210 x 297公爱) - --------------# am— .1 n ·ϋ ϋ ϋ ϋ V mMmg mmmmm ϋ 1« ·ϋ 1 I 線! (請先閱讀背面之注意事項再填寫本頁) ϋ - 535300 五、發明說明(9 ) 圖1 0所7F爲-内邵分散器層形成在與該基板介面處的該 第一分散器之内的一新發光二極體的剖面圖; 圖1 1所示爲一内部分散器層形成在該第一分 的一新發光二極體的剖面圖; 曰 其是在該磊晶成 其是在該磊晶成 圖12所示爲一新發光二極體的剖面圖 長期間在原處形成的該内部分散器層; 圖1 3也顯示爲新發光二極體的剖面圖 長期間在原處形成的該内部分散器層; 圖14所示爲一新拋式晶片安裝發光二極體的剖面圖,其 具有一LEE陣列在該基板的表面上;及 圖15所示爲一新拋式晶片安裝發光二極體的剖面圖,立 具有一表面分散器層形成在該發光二極體層之— 發明詳細説明 口 1一具體f施例 圖1所示爲根據本發明所建構的該新發光二極體1〇的一 具體實施例。該新發光二極體具有—發光二極體二構, 包含一活動層13爽在兩個相反摻雜層14,1<:、 、、 丄)間。在+ 衾 較佳的發光二極體結構12中,該上層M ' ,馬p型,該底層15 經濟部智慧財產局員工消費合作社印製 爲η型,雖然疊層14,15中相對的摻雜 '二曰 本一 赚曰士 # 17 J貫現。茲新發 先一極體具有一第一分散層16,其由一導哈 卜 ’電材料製成,其 可由一第一接觸墊丨8展開電流到該發光- ’、 、、的^ 元一接體結構的底層 1 5。茲罘一接觸墊丨8也可視爲該η型接鳊 :«:,勢,因爲在該 開 佳具體實施例中該底層15爲η型。一導泰& " τ包何料的第二展 由 層2 0也可包含在該發光二極體結構的 一 』上層1 4上,用來 -12- 本紙張尺度適用中國國家標準(CNS)A4規格(21〇 X 297一公釐) 535300 A7
五、發明說明(n) 上,其較佳的方法是蒸發或濺鍍。該第一展開器1 6較佳地 是以η型AlInGaN製成,並可由反應離子蝕刻來暴露接觸 窗。其可使用 Ni,Al/Ni/Au,Al/Ti/Au,或 Al/Pt/Au做爲 n 型 接觸窗18或28到該基板24或第一展開器16。 藍寶石,AIN,SiC或GaN可以做爲該基板24,其SiC及 GaN爲導電性,而A1N及藍寶石即爲絕緣。SiC具有一更 密集的晶格來符合第三族氮化物,例如G aN,並產生高品 質的第三族氮化物薄膜。碳化矽也可具有一非常高的熱導 電性,所以在碳化矽上的第三族氮化物裝置的整體輸出功 率並非限於該基板的熱消散(如在一些裝置形成在藍寶石 上的狀況)。SiC基板可由美國North Carolina, Durham的 Cree Research公司生產,而其製造方法則可見於美國專利 參考編號Re· 34,861 ; 4,946,547及5,200,022中的科學文獻。 較佳地是,該LEE 26使用以下的方法來形成在該裝置 上。該L E E材料係由蒸發,化學氣相沉積(CVD)或濺鍍法 來沉積在該表面。該較佳的LEE材料爲SiC,SiNx,A1N, SiOxNy,Si3N4 ’ ZnSe ’ Ti02 ’ Ta205,GaN,或 Si〇,其中 最佳的是ZnSe,Ti02,SiNx,AIN及GaN。該較佳的LEE 厚度的範圍是100 nm到10 m。在該L E E材料沉積之後, 一光感聚合物,像是光阻,係先被暴露出來,並發展成爲 一遮罩0 然後該LEEs 26可以兩種方式形成在LEE材料.上。首 先,該L E E材料可用一濕式化學蝕刻由該遮罩中蝕刻除 去。此蚀刻可切除該遮罩層底部來形成該L E E結構。第 -14- 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) (請先閱讀背面之注意事項再填寫本頁) 訂---------詩丨 經濟部智慧財產局員工消費合作社印製 FH ϋ .1 ϋ · 經濟部智慧財產局員工消費合作社印製 535300 A7 _ - B7 五、發明說明(14 ) 極體裝置的一陣列中,較佳地是在該基板6 6及第—展開器 6 4之間的介面處。該L E E材料必須爲一不同的折射係數 η 2,與該第二展開器材料的η丨不同,藉以提供反射及折 射,而通常能將補捉到的光線重新導引到一個允許該光線 由該發光二極體60逃出的方向。 該LEEs 74較佳地是使用一光阻罩及該lee材料的濕式 化學蚀刻來形成。爲了形成該内部L e E陣列,該磊晶材料 即必須重新成長於該LEEs。此最好是由金屬有機化學氣 相沉積(MOCVD)法,氣相磊晶(VPE),或分子束磊晶(mbe) 來元成’而以MOCVD爲最佳。該較佳的遮罩材料爲Μα。, SiN2,Si3N4,Ti02,A1N及SiO。該LEE遮罩材料的較佳厚 度爲0·1 β m到10 " m之間,LEE之間的較佳距離爲1 a 50 Am之間。此外,該内部發光二極體可以放置在該發光 二極體結構内不同的位置。 第四及第五具體實施例 圖5所示爲根據本發明建構的該新發光二極體7 〇的一第 四具體實施例。其具有與上述具體實施例相同的發光二極 體結構72,展開層75,76,基板78及接觸窗80,82。 然而,在此具體實施例中,一磊晶材料層8 4係在形成 LEEs 86之前成長在該基板上。該磊晶層8 4係由M〇c vD, VPE或MBE成長,然後該LEEs 86即成長在該磊晶層的表面 上的陣列中,而該第二展開器7 5的剩餘部份即形成在該 LEEs 86之上。此具體實施例可用於在該LEE陣列上重新 成長該發光二極體的結構76,但需要一額外的磊晶成長步 -17- 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) • 1- !| I — I — I 1 ί I I J « — — — — — I— ^ « — — — — — — I— I ^ (請先閱讀背面之注意事項再填寫、本頁) -H ϋ n n · 535300
經濟部智慧財產局員工消費合作社印製 五、發明說明(15) 驟。 在以GaN為王的發光二極體中,其具有LEEs在其疊層之 中’在咸LEE材料上的重新成長可在一 m〇cvD成長系統 中由侧向累積過成長(LE0)來達成。此可提供標準平面成 長中優良的材料品質,而導致另外增加的發光二極體放 射’成為該光凝聚的額外好處。 此外’該發光二極體處理提供了根據本發明所建構的該 發光二極體9 0的另一具體實施例,其示於圖6。在此具體 貫施例中,該L E 0成長狀況可調整來在該遮罩材料9 4上 產生LEE空洞92。該空洞92係做為線性(或曲線 的)LEEs ’而存在於該第一展開器層9 6。該空洞及該LEEs 即重新導向該内部補捉的光線來增強光凝聚。在半導體材 料中空洞的形成係由Fini提出。(請參考Fini等人所提, Hi.sh Quality Coalescence of Laterally Overgrown GaN Stripes on, GaN/Sapphire Seed Lavers Applied Physics Letters 75? 12 .,1706-1708 頁,(1999))。 笫六具體f施例 圖7所示為該新發光二極體丨〇 〇的一第六具體實施例, 其具有與前述發光二極體相同的疊層。在此具體實施例 中’该LEEs 102係位在該基板1〇4及該第一展開器1〇6之 間的介面處的一陣列中,但是是在該基板1 〇 4中。該lEEs 102係直接形成於該基板1 〇 4中,其係藉由濕式化學或乾 式蚀刻技術來姓刻該基板穿過一遮罩。然後該LEEs即成 長於該蚀刻的區域中,該發光二極體的剩餘疊層即由 -18- 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公釐) --------訂---------_線 (請先閱讀背面之注意事項再填寫本頁) 535300 A7 17 五、發明說明( 料即覆蓋在該表面上,該較佳遮罩材料爲矽石或聚苯乙烯 微球粒,或是像是一旋塗光阻的一薄聚合物層。該遮罩材 料係做爲一遮罩,其用於該分散器材料的濕式化學蝕刻, 或做爲乾式蝕刻的一奪格遮罩,例如尺1£。在該樣式被轉 移到孩分散器材料之後,所剩餘的遮罩材料即被移除,而 留下一分散器在該發光二極體表面上。 此處的具體實施例爲一種由Schnitzer等人提出的發光二 極體的改吾。其提供了不需要蝕刻該分散器層到該半導體 材料的優點。由此可使得分散器技術可輕易地應用在以 GaN爲主的材料系統,其中該第一展開器材料基本上爲一 非常薄的金屬層,其並不能輕易地中斷。 第八具體實施例 圖9所示爲一新的發光二極體12〇,其爲圖8中該發光二 極體1 1 0的變化。發光二極體丨2 〇具有相同的發光二極體 疊層,但在此具體實施例中,該分散器層122係應用到該 基板1 2 4的底面上。此方法可特別地應用到發光二極體, 其中该基板的折射係數係類似於該發光二極體磊晶層,例 如在S i C上的AlInGaN磊晶層。 第九及第十具體實施例 圖1 0及1 1所示爲新發光二極體丨3 〇及丨4 〇,其個別的分 散器層134,144係位於其第一展開器層132,142之 中。對於這些具體實施例,該分散器層係數,n2,.必須不 同於该第一分散器層的折射係數,η 1,所以會發生光線的 散射。對於此分散益層的較佳材料爲碎石,或Ti〇2微球 -20- 本紙張尺度適用中國國家標準(CNS)A4規格(210 X 297公爱) -----------------------— It — I----1 "Ί "^1^1 (請先閱讀背面之注意事項再填寫本頁) 經濟部智慧財產局員工消費合作社印製 經濟部智慧財產局員工消費合作社印製 535300 A7 -----B7 五、發明說明(18) 粒0 對於圖1 0中的發光二極體丨3 0,該分散器層1 3 4係沉積 在該基板1 3 6及該第一展開器丨3 2之間的介面處。然後該 發光二極體層即由MOCVD,VPE或MBE成長在該分散器層 之上。對於圖1 1中的發光二極體1 4 〇,該分散器層1 4 4係 位在該第一展開器層1 4 2之内。該第一展開器的一疊層會 先成長,然後即形成分散器層丨4 4。然後該第一展開器及 該發光二極體層的剩餘部份即成長於該分散器層之上。 該分散器層也可形成在該發光二極體丨3 〇,1 4 〇的其它 疊層之内,包含該發光二極體結構及該基板的疊層。該分 散器也可由其它方法及其它材料來形成。因此,本發明並 不會受限於如所示的該分散器層的配置。 第十一具體實施例 分散器層也可使用原處技術來形成在發光二極體中,當 MOCVD被用做爲該磊晶成長工具。此技術係特別適用於 以GaN爲主的發光二極體。圖12及13顯示兩個具有分散 器層152,162的發光二極體15〇及160,其形成在該第 一展開器層154,164的原處。在發光二極體15〇中,其 基板155即以SiC或藍寶石製成,而該第一展開器154即 形成由AlxInyGamN,Ousl,的製成的未接合島。 在该第一展開器成長的初始階段,即形成島丨5 6。在接合 孩島1 5 6 I前,即停止成長,而一較低折射係數材料的疊 層152,例如AlGaN,si%或SiN,其即沉積在,及/或在該 島之間,其產生該所需要的内部係數的不連續性。然後其 ----------r I ! ---1----^---------^ (請先閱讀背面之注意事項再填寫本頁) -21 -
535300 五、發明說明( 19 經濟部智慧財產局員工消費合作社印製 成長即按正常方式成長,而來完成該第一展開層及該發光 二極體結構。 對於該發光二極體1 6 0,除了使用島來形成該不連續 性,成長狀況即可在該第一展開器層成長的初始階段期間 被改變,而來在其表面上加入一粗糙度。對於以AlInGaN 爲王的發光二極體,該系晶層可藉由增加二矽石的流動, 改、文氨的泥動,或增加該第一層成長的速率來成長爲粗糙 的。一旦加入了粗糙度,較低折射係數A1GaN或其它介電 層162即被沉積。然後即依正常狀況成長來完成該第一展 開器及該發光二極體結構。 如上所述,該提出的分散器層可以放置在其它的疊層 中’包含該發光二極體結構的疊層及該基板,本發明並不 受限於所示的配置。 抛式晶片具體實施例 最後’在上述的所有具體實施例中,該裝置可使用拋式 晶片接合技術。圖1 4所示爲一新的發光二極體1 7 〇接合於 這樣的架構中。該發光二極體結構1 7 2係以一導電反射層 1 7 5來披覆,而一第二展開層丨8 9則由一導電黏合媒體來 固接告該反射層1 7 5。然後一次托架1 7 6即安裝在該第二 展開層189上。一ρ·接觸窗188包含於一次托架176上, 並接合於該第二展開器層1 89。施加於該p -接觸窗1 8 8的 電流即被展開到該第二展開器層,及該發光二極體結構的 上層。 一 η-接觸窗178也包含在該次托架176上,並經由一第 -22- 本紙張尺度適用中國國家標準(CNS)A4規格(210 χ 297公釐) • L. I -*#I 訂·---- ——線· (請先閱讀背面之注意事項再填寫本頁) 535300 A7
五、發明說明(2〇 ) 經濟部智慧財產局員工消費合作社印製 一導電接合層182而耦合於該第一展開器層18〇。來自該 η -接觸窗1 7 8的電流通過該層1 8 2到該第一展開器丨8 〇, 並進入該發光二極體結構的底層。LEEs ! 86即形成於基板 184的底面上。 由發光二極體170發射出的光線主要穿過其基板184, 由此結構凝聚光線,其依據所使用的L E E陣列或分散器的 形式而由該習用接合結構來改善。此處,該重新導向的光 線可在該第一穿出來逃出穿過該晶片,其在重新導向之後 降低任何光線回來穿過該基板的光學損失。 圖1 5顯示一新發光二極體丨9 〇,其使用類似於發光二極 體1 7 0的拋式晶片接合。然而,除了利用LEEs,其具有一 分散器層192在該第二展開器194及該反射層196的介面 處。 雖然本發明已藉由其某些較佳具體實施例來加以説明其 細節,但也可有其它的版本。其它利用L e E陣列的發光二 極體架構,也可由本技藝的一專業人士來想像。該新發光 二極體可具有不同的LEE陣列及分散器層的組合。LEEs可 具有不同的形狀,尺寸,相鄰L E E之間的空間,並可放置 在不同的位置。類似地,該分散器層可用不同的材料製 成,並放置在不同的位置。因此,所附申請專利範圍的精 神及範圍必須不受限於以上所述的該較佳具體實施例。 -23- 本紙張尺度適用中國國家標準(CNS)A4規格(210 x 297公楚) ir ί··蓼--------訂---------線·锤 l· (請先閱讀背面之注意事項再填寫本頁) -ϋ I n I n n ϋ n n n -

Claims (1)

  1. 535300 A B c D 第08912569S號專利申請案 中文申請專利範圍修正本(91年12月) 申請專辞氧圍
    1 · 一種具看加強光凝聚結構之發光二極體(LED),包含: 一發光二極體結構(12),具有: 一羞晶成長p -型層(14); 一慕晶成長η -型層(15);及 一磊晶成長活動層(13),其位在該ρ-型與η-型層 (14,15)之間; 一第一展開器層(16),其相鄰於該發光二極體結構 (12); 一第二展開器層(2〇),其相鄰於該發光二極體結構 (12),並相對於該第一展開器層(16);及 與該發光二極體沉積置成一體之光凝聚結構(26),該 光凝聚結構提供了表面來允許在該發光二極體内補捉的 光線可以分散’反射及/或折射出該發光二極體。 2.如申請專利範圍第1項之發光二極體,進一步包含一基 板(24),其相鄰於該第一展開器層(16),並相對於該發 光二極體結構(12)。 3·如申請專利範圍第1項之發光二極體,其中該光凝聚結 構(26)包含一光凝聚元件(LEEs)的陣列。 4·如申請專利範圍第i項之發光二極體,其中該光凝聚結 構包含一分散器層(1 12, 122, 134, 144, 152, 162)。 ^ 5·如申請專利範圍第2項之發光二極體,其中該光凝聚録 構(26)係沉積在該第二展開器層(2〇)之上,相對於梦發 光二極體結構(12),或是沉積在該基板(24)上,而相對 於該發光二極體結構(12)。
    535300 A B c D 、申清專利範圍 6 ·如申叫專利範圍第2項之發光二極體,其中該光凝聚辞 構(74)係沉積在該基板(66)及該第一展開器層(64)之間的 該介面上,該結構(74)係大致上在該第一展開器層(64) 之内。 7 · —種具有加強光凝聚之發光二極體,包含: 一 P-型層(14); 一 η-型層(15); 一位在該ρ -型及η -型層(14,15)之間的活動層(13),其 中不是?_型(14)或η_型(15)為一上層,就是另一層為底 層; 一第一展開器層(16),其相鄰於該底層; 一位在該上層的第二展開器層(2〇); 個別的電氣接觸窗(18,22)在該展開器層(16,20)之上, 所以施加於該接.觸窗(1 8,22)的一偏壓即會造成該活動層 (13)來發出光線; 一基板(24)’其相鄰於該第一展開器層(16);及 光凝聚結構(26),其整合於該疊層,並平行於該疊 層,並大致上覆蓋於該發光二極體,該光凝聚結構(26) 提供了表面來允許補捉在該發光二極體之内的光線可以 分散,反射及/或折射出該發光二極體。 8· —種具有加強光凝聚結構之發光二極體(發光二極體), 包含: 一發光二極體結構(172),包含: 一蠢晶成長ρ -型層; -2- 本紙張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐) 535300 A B c D 六、申請專利範圍 一磊晶成長η -型層;及 一磊晶成長活動層,其位在該ρ -型與η -型層之 間; 一反射層(175),其沉積在該發光二極體結構(172)上; 一位在該反射層(175)上的第二展開器層(189); 一位在該第二展開器層(189)之上的次托架(176); 一第一展開器層(180),其相鄰於該發光二極體結構 (172),並相對於該反射層(174); 一施加於該第一及第二展開器層(丨89,180)上的偏壓, 使該活動層發出光鎳,該基板(184)成為該主要光線發射 表面;及 光凝聚結構(186),其與該發光二極體構成整體,該光 凝聚結構(186)係平行於該發光二極體結構(172),並大致 上覆蓋了該發光二極體的區域。 9· 一種成長一具有一内部分散器層的發光二極體來加強光 凝聚之方法,包含: 放置一基板(155)在一反應器中來成長半導體材料; 成長一第一半導體層(164)在該基板(155)之上,該第一 層(164)具有一粗糙表面; 停止該半導體層的成長; 成長一半導體材料分散器層(162)在該粗糙層上,該分 散器層具有與該第一層不同的折射係數; 成長一第二層在該分散器層(162)之上,該第二層具有 與該第一層(164)類似的折射係數;及 -3- 本纸張尺度適用中國國家標準(CNS) A4規格(210 X 297公釐) 535300 8 8 8 8 A B c D 「、申請專利範圍 成長一半導體光線發射結構(72)在該第二層之上。 10· —種用於製造具有一内部分散器層來加強光凝聚之— AlInGaN發光二極體之方法,包含: 放置一基板(155)在一反應器中用來成長半導體材料; 成長出由AlxInyGak.yN,OSxSl,OSySl製成的未接合 島(156)在該基板(155)上; 停止該島的成長(15 6); 沉積一分散器層(152)在該未接合島(156)上,該分散5| 層具有一與該向度沉積的G a N材料不同的折射係數· 在該分散器層成長出由AlJiiyGaiLyN,〇 j,〇 < $1製成的材料層(154)’該層具有一平滑表面;及 成長出一光線結構(72)在該層(154)之上。 -4 本紙張尺度適用中國國家標準(CNS) A4規格(210X 297公釐)
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