SG138468A1 - A method of manufacturing a semiconductor device - Google Patents
A method of manufacturing a semiconductor deviceInfo
- Publication number
- SG138468A1 SG138468A1 SG200504773-3A SG2005047733A SG138468A1 SG 138468 A1 SG138468 A1 SG 138468A1 SG 2005047733 A SG2005047733 A SG 2005047733A SG 138468 A1 SG138468 A1 SG 138468A1
- Authority
- SG
- Singapore
- Prior art keywords
- shape
- conductivity type
- electrodes
- concentration impurity
- doping treatment
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title abstract 7
- 238000004519 manufacturing process Methods 0.000 title 1
- 239000012535 impurity Substances 0.000 abstract 4
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/124—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1259—Multistep manufacturing methods
- H01L27/127—Multistep manufacturing methods with a particular formation, treatment or patterning of the active layer specially adapted to the circuit arrangement
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
- H01L29/423—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
- H01L29/42312—Gate electrodes for field effect devices
- H01L29/42316—Gate electrodes for field effect devices for field-effect transistors
- H01L29/4232—Gate electrodes for field effect devices for field-effect transistors with insulated gate
- H01L29/42384—Gate electrodes for field effect devices for field-effect transistors with insulated gate for thin film field effect transistors, e.g. characterised by the thickness or the shape of the insulator or the dimensions, the shape or the lay-out of the conductor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/49—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET
- H01L29/4908—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET for thin film semiconductor, e.g. gate of TFT
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1345—Conductors connecting electrodes to cell terminals
- G02F1/13454—Drivers integrated on the active matrix substrate
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Nonlinear Science (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Thin Film Transistor (AREA)
- Liquid Crystal (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001056049 | 2001-02-28 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG138468A1 true SG138468A1 (en) | 2008-01-28 |
Family
ID=18916133
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200504773-3A SG138468A1 (en) | 2001-02-28 | 2002-02-18 | A method of manufacturing a semiconductor device |
SG200200834A SG103846A1 (en) | 2001-02-28 | 2002-02-18 | A method of manufacturing a semiconductor device |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200200834A SG103846A1 (en) | 2001-02-28 | 2002-02-18 | A method of manufacturing a semiconductor device |
Country Status (6)
Country | Link |
---|---|
US (5) | US6599785B2 (ko) |
KR (3) | KR100959030B1 (ko) |
CN (2) | CN1286156C (ko) |
MY (1) | MY127548A (ko) |
SG (2) | SG138468A1 (ko) |
TW (1) | TW533461B (ko) |
Families Citing this family (67)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4056571B2 (ja) | 1995-08-02 | 2008-03-05 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
US6346730B1 (en) * | 1999-04-06 | 2002-02-12 | Semiconductor Energy Laboratory Co., Ltd. | Liquid crystal display device having a pixel TFT formed in a display region and a drive circuit formed in the periphery of the display region on the same substrate |
US6509616B2 (en) | 2000-09-29 | 2003-01-21 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and its manufacturing method |
US7045444B2 (en) | 2000-12-19 | 2006-05-16 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing semiconductor device that includes selectively adding a noble gas element |
US6858480B2 (en) * | 2001-01-18 | 2005-02-22 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing semiconductor device |
JP4939690B2 (ja) * | 2001-01-30 | 2012-05-30 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
SG138468A1 (en) * | 2001-02-28 | 2008-01-28 | Semiconductor Energy Lab | A method of manufacturing a semiconductor device |
US6812081B2 (en) * | 2001-03-26 | 2004-11-02 | Semiconductor Energy Laboratory Co.,.Ltd. | Method of manufacturing semiconductor device |
JP4926329B2 (ja) | 2001-03-27 | 2012-05-09 | 株式会社半導体エネルギー研究所 | 半導体装置およびその作製方法、電気器具 |
US7112844B2 (en) | 2001-04-19 | 2006-09-26 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
JP3719189B2 (ja) * | 2001-10-18 | 2005-11-24 | セイコーエプソン株式会社 | 半導体装置の製造方法 |
US7786496B2 (en) * | 2002-04-24 | 2010-08-31 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method of manufacturing same |
US6818529B2 (en) * | 2002-09-12 | 2004-11-16 | Applied Materials, Inc. | Apparatus and method for forming a silicon film across the surface of a glass substrate |
JP4627961B2 (ja) * | 2002-09-20 | 2011-02-09 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
JP2004152929A (ja) * | 2002-10-30 | 2004-05-27 | Nec Electronics Corp | 半導体装置及びその製造方法 |
JP2004165241A (ja) * | 2002-11-11 | 2004-06-10 | Sanyo Electric Co Ltd | 半導体装置及びその製造方法 |
JP4175877B2 (ja) * | 2002-11-29 | 2008-11-05 | 株式会社半導体エネルギー研究所 | 半導体装置及びその作製方法 |
JP2004281631A (ja) * | 2003-03-14 | 2004-10-07 | Renesas Technology Corp | 半導体装置の設計方法 |
TWI231996B (en) * | 2003-03-28 | 2005-05-01 | Au Optronics Corp | Dual gate layout for thin film transistor |
TWI300605B (en) * | 2003-04-04 | 2008-09-01 | Au Optronics Corp | Method of reducing surface leakages of a thin film transistor substrate |
US7238963B2 (en) * | 2003-04-28 | 2007-07-03 | Tpo Displays Corp. | Self-aligned LDD thin-film transistor and method of fabricating the same |
JP2004342833A (ja) * | 2003-05-15 | 2004-12-02 | Seiko Epson Corp | 半導体装置の製造方法、電気光学装置、集積回路及び電子機器。 |
US7145209B2 (en) * | 2003-05-20 | 2006-12-05 | Tpo Displays Corp. | Thin film transistor and fabrication method thereof |
TW595004B (en) * | 2003-05-28 | 2004-06-21 | Au Optronics Corp | Manufacturing method of CMOS TFT device |
JP4046029B2 (ja) * | 2003-07-09 | 2008-02-13 | セイコーエプソン株式会社 | トランジスタの製造方法 |
JP4823478B2 (ja) * | 2003-09-19 | 2011-11-24 | 株式会社半導体エネルギー研究所 | 発光装置の作製方法 |
US7520790B2 (en) | 2003-09-19 | 2009-04-21 | Semiconductor Energy Laboratory Co., Ltd. | Display device and manufacturing method of display device |
US20050074914A1 (en) * | 2003-10-06 | 2005-04-07 | Toppoly Optoelectronics Corp. | Semiconductor device and method of fabrication the same |
KR100560470B1 (ko) * | 2003-11-24 | 2006-03-13 | 삼성에스디아이 주식회사 | 다이오드 접속된 트랜지스터의 제조 방법 및 이를 이용한화상 표시 장치 |
CN100521117C (zh) | 2004-02-25 | 2009-07-29 | 株式会社半导体能源研究所 | 半导体器件及其制造方法 |
US20050258488A1 (en) * | 2004-04-27 | 2005-11-24 | Toppoly Optoelectronics Corp. | Serially connected thin film transistors and fabrication methods thereof |
TWI366218B (en) * | 2004-06-01 | 2012-06-11 | Semiconductor Energy Lab | Method for manufacturing semiconductor device |
TWI242886B (en) * | 2004-07-05 | 2005-11-01 | Au Optronics Corp | Display pixel and method of fabricating the same |
JP3948472B2 (ja) | 2004-11-09 | 2007-07-25 | セイコーエプソン株式会社 | 半導体装置の製造方法 |
JP2006245031A (ja) * | 2005-02-28 | 2006-09-14 | Casio Comput Co Ltd | 薄膜トランジスタパネル |
JP5117667B2 (ja) * | 2005-02-28 | 2013-01-16 | カシオ計算機株式会社 | 薄膜トランジスタパネル |
US8026531B2 (en) | 2005-03-22 | 2011-09-27 | Semiconductor Energy Laboratory Co., Ltd. | Light emitting device |
TWI257521B (en) * | 2005-05-13 | 2006-07-01 | Au Optronics Corp | Active matrix substrate and method for fabricating the same |
US8153511B2 (en) * | 2005-05-30 | 2012-04-10 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device |
KR100731750B1 (ko) * | 2005-06-23 | 2007-06-22 | 삼성에스디아이 주식회사 | 박막트랜지스터 및 이를 이용한 유기전계발광표시장치의제조방법 |
US7446026B2 (en) * | 2006-02-08 | 2008-11-04 | Freescale Semiconductor, Inc. | Method of forming a CMOS device with stressor source/drain regions |
US7696024B2 (en) * | 2006-03-31 | 2010-04-13 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
KR20090024244A (ko) * | 2006-06-09 | 2009-03-06 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체장치의 제작 방법 |
TW200802858A (en) * | 2006-06-26 | 2008-01-01 | Tatung Co Ltd | Structure of semiconductor with low heat carrier effect |
TW200805866A (en) * | 2006-07-04 | 2008-01-16 | Powertech Ind Ltd | Charger for current socket and power transmission method |
KR20080074565A (ko) * | 2007-02-09 | 2008-08-13 | 삼성전자주식회사 | 표시 장치 및 그 제조 방법 |
TWI331401B (en) * | 2007-04-12 | 2010-10-01 | Au Optronics Corp | Method for fabricating a pixel structure and the pixel structure |
CN101577102B (zh) * | 2008-05-08 | 2011-09-28 | 联咏科技股份有限公司 | 扫描驱动器 |
JP5515281B2 (ja) * | 2008-12-03 | 2014-06-11 | ソニー株式会社 | 薄膜トランジスタ、表示装置、電子機器および薄膜トランジスタの製造方法 |
US8581237B2 (en) * | 2008-12-17 | 2013-11-12 | Semiconductor Energy Laboratory Co., Ltd. | Light-emitting element |
JP4752927B2 (ja) * | 2009-02-09 | 2011-08-17 | ソニー株式会社 | 薄膜トランジスタおよび表示装置 |
US20110045182A1 (en) * | 2009-03-13 | 2011-02-24 | Tokyo Electron Limited | Substrate processing apparatus, trap device, control method for substrate processing apparatus, and control method for trap device |
US8784181B2 (en) * | 2009-08-14 | 2014-07-22 | Igt | Gaming system and method for providing a casual wagering game |
WO2011043194A1 (en) | 2009-10-09 | 2011-04-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
EP2486595B1 (en) | 2009-10-09 | 2019-10-23 | Semiconductor Energy Laboratory Co. Ltd. | Semiconductor device |
US9418510B2 (en) | 2009-11-12 | 2016-08-16 | Igt | Gaming system, gaming device and method for providing a game having a dynamic award scheme |
KR20190093705A (ko) | 2009-11-27 | 2019-08-09 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 반도체 장치의 제작방법 |
JP5978625B2 (ja) * | 2011-06-07 | 2016-08-24 | ソニー株式会社 | 放射線撮像装置、放射線撮像表示システムおよびトランジスタ |
US9214067B2 (en) | 2012-09-06 | 2015-12-15 | Igt | Gaming system and method for providing a streaming symbols game |
US8992301B2 (en) | 2012-09-27 | 2015-03-31 | Igt | Gaming system and method for providing a game which populates symbols along a path |
US9028318B2 (en) | 2012-09-27 | 2015-05-12 | Igt | Gaming system and method for providing a game which populates symbols along a path |
US9039512B2 (en) | 2012-09-27 | 2015-05-26 | Igt | Gaming system and method for providing a game which populates symbols along a path |
US8851979B2 (en) | 2013-03-07 | 2014-10-07 | Igt | Gaming system and method for providing a symbol elimination game |
US8784191B1 (en) | 2013-03-07 | 2014-07-22 | Igt | Gaming system and method for providing a symbol elimination game |
CN103178006B (zh) * | 2013-03-29 | 2015-09-23 | 上海和辉光电有限公司 | 调整低温多晶硅晶体管阀值电压的方法 |
KR20160084567A (ko) * | 2015-01-05 | 2016-07-14 | 삼성디스플레이 주식회사 | 표시장치 |
US10186106B2 (en) | 2016-09-21 | 2019-01-22 | Igt | Gaming system and method for determining awards based on interacting symbols |
Family Cites Families (86)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56111258A (en) | 1980-01-07 | 1981-09-02 | Chiyou Lsi Gijutsu Kenkyu Kumiai | Thin film semiconductor device |
US4394182A (en) * | 1981-10-14 | 1983-07-19 | Rockwell International Corporation | Microelectronic shadow masking process for reducing punchthrough |
JPS60127761A (ja) | 1983-12-15 | 1985-07-08 | Matsushita Electric Ind Co Ltd | Mosトランジスタの製造方法 |
US5170244A (en) * | 1986-03-06 | 1992-12-08 | Kabushiki Kaisha Toshiba | Electrode interconnection material, semiconductor device using this material and driving circuit substrate for display device |
US4851363A (en) * | 1986-07-11 | 1989-07-25 | General Motors Corporation | Fabrication of polysilicon fets on alkaline earth alumino-silicate glasses |
GB8909011D0 (en) | 1989-04-20 | 1989-06-07 | Friend Richard H | Electroluminescent devices |
JP2553704B2 (ja) | 1989-06-16 | 1996-11-13 | 松下電子工業株式会社 | 半導体装置の製造方法 |
JPH0395938A (ja) | 1989-09-07 | 1991-04-22 | Canon Inc | 半導体装置の製造方法 |
JPH0395939A (ja) | 1989-09-07 | 1991-04-22 | Canon Inc | 半導体装置の製造方法 |
DE69127395T2 (de) * | 1990-05-11 | 1998-01-02 | Asahi Glass Co Ltd | Verfahren zum Herstellen eines Dünnfilm-Transistors mit polykristallinem Halbleiter |
KR940004446B1 (ko) * | 1990-11-05 | 1994-05-25 | 미쓰비시뎅끼 가부시끼가이샤 | 반도체장치의 제조방법 |
US5528397A (en) * | 1991-12-03 | 1996-06-18 | Kopin Corporation | Single crystal silicon transistors for display panels |
JPH04258160A (ja) | 1991-02-13 | 1992-09-14 | Nec Corp | 半導体装置 |
JPH04369271A (ja) | 1991-06-17 | 1992-12-22 | Casio Comput Co Ltd | 薄膜トランジスタ |
JP2731056B2 (ja) | 1991-10-09 | 1998-03-25 | シャープ株式会社 | 薄膜トランジスタの製造方法 |
US6759680B1 (en) * | 1991-10-16 | 2004-07-06 | Semiconductor Energy Laboratory Co., Ltd. | Display device having thin film transistors |
JP2650543B2 (ja) * | 1991-11-25 | 1997-09-03 | カシオ計算機株式会社 | マトリクス回路駆動装置 |
JP2564725B2 (ja) * | 1991-12-24 | 1996-12-18 | 株式会社半導体エネルギー研究所 | Mos型トランジスタの作製方法 |
US5532176A (en) * | 1992-04-17 | 1996-07-02 | Nippondenso Co., Ltd. | Process for fabricating a complementary MIS transistor |
CN100442532C (zh) * | 1992-07-06 | 2008-12-10 | 株式会社半导体能源研究所 | 有源矩阵显示器件 |
US5705424A (en) * | 1992-09-11 | 1998-01-06 | Kopin Corporation | Process of fabricating active matrix pixel electrodes |
EP0588370A3 (en) | 1992-09-18 | 1994-06-08 | Matsushita Electric Ind Co Ltd | Manufacturing method of thin film transistor and semiconductor device utilized for liquid crystal display |
EP0589478B1 (en) | 1992-09-25 | 1999-11-17 | Sony Corporation | Liquid crystal display device |
JPH06148685A (ja) | 1992-11-13 | 1994-05-27 | Toshiba Corp | 液晶表示装置 |
JP3587537B2 (ja) * | 1992-12-09 | 2004-11-10 | 株式会社半導体エネルギー研究所 | 半導体装置 |
TW435820U (en) * | 1993-01-18 | 2001-05-16 | Semiconductor Energy Lab | MIS semiconductor device |
WO1994018706A1 (en) * | 1993-02-10 | 1994-08-18 | Seiko Epson Corporation | Active matrix substrate and thin film transistor, and method of its manufacture |
US5953582A (en) * | 1993-02-10 | 1999-09-14 | Seiko Epson Corporation | Active matrix panel manufacturing method including TFTS having variable impurity concentration levels |
CN1098818A (zh) * | 1993-03-05 | 1995-02-15 | 株式会社半导体能源研究所 | 半导体集成电路、半导体器件、晶体管及其制造方法 |
US5830787A (en) * | 1993-03-18 | 1998-11-03 | Lg Semicon Co., Ltd. | Method for fabricating a thin film transistor |
JPH06291314A (ja) | 1993-04-06 | 1994-10-18 | Casio Comput Co Ltd | 薄膜トランジスタの製造方法 |
JP2789293B2 (ja) * | 1993-07-14 | 1998-08-20 | 株式会社半導体エネルギー研究所 | 半導体装置作製方法 |
US5594569A (en) * | 1993-07-22 | 1997-01-14 | Semiconductor Energy Laboratory Co., Ltd. | Liquid-crystal electro-optical apparatus and method of manufacturing the same |
US5719065A (en) * | 1993-10-01 | 1998-02-17 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing semiconductor device with removable spacers |
US5923962A (en) * | 1993-10-29 | 1999-07-13 | Semiconductor Energy Laboratory Co., Ltd. | Method for manufacturing a semiconductor device |
TW264575B (ko) * | 1993-10-29 | 1995-12-01 | Handotai Energy Kenkyusho Kk | |
JP3431033B2 (ja) | 1993-10-29 | 2003-07-28 | 株式会社半導体エネルギー研究所 | 半導体作製方法 |
US7081938B1 (en) * | 1993-12-03 | 2006-07-25 | Semiconductor Energy Laboratory Co., Ltd. | Electro-optical device and method for manufacturing the same |
JP3325992B2 (ja) * | 1994-01-08 | 2002-09-17 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
JP3398453B2 (ja) | 1994-02-24 | 2003-04-21 | 株式会社東芝 | 薄膜トランジスタの製造方法 |
US5401982A (en) * | 1994-03-03 | 1995-03-28 | Xerox Corporation | Reducing leakage current in a thin-film transistor with charge carrier densities that vary in two dimensions |
JPH07294961A (ja) * | 1994-04-22 | 1995-11-10 | Semiconductor Energy Lab Co Ltd | アクティブマトリクス型表示装置の駆動回路および設計方法 |
US5786247A (en) * | 1994-05-06 | 1998-07-28 | Vlsi Technology, Inc. | Low voltage CMOS process with individually adjustable LDD spacers |
US6773971B1 (en) * | 1994-07-14 | 2004-08-10 | Semiconductor Energy Laboratory Co., Ltd. | Method of manufacturing a semiconductor device having lightly-doped drain (LDD) regions |
US6906383B1 (en) * | 1994-07-14 | 2005-06-14 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method of manufacture thereof |
US5413945A (en) * | 1994-08-12 | 1995-05-09 | United Micro Electronics Corporation | Blanket N-LDD implantation for sub-micron MOS device manufacturing |
JP3464287B2 (ja) | 1994-09-05 | 2003-11-05 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
JPH08116065A (ja) * | 1994-10-12 | 1996-05-07 | Sony Corp | 薄膜半導体装置 |
US5550066A (en) * | 1994-12-14 | 1996-08-27 | Eastman Kodak Company | Method of fabricating a TFT-EL pixel |
JPH08264784A (ja) | 1995-03-28 | 1996-10-11 | Sony Corp | 電界効果型半導体装置の製造方法 |
JPH08274336A (ja) | 1995-03-30 | 1996-10-18 | Toshiba Corp | 多結晶半導体薄膜トランジスタ及びその製造方法 |
JP3292657B2 (ja) | 1995-04-10 | 2002-06-17 | キヤノン株式会社 | 薄膜トランジスタ及びそれを用いた液晶表示装置の製造法 |
JPH09191111A (ja) | 1995-11-07 | 1997-07-22 | Semiconductor Energy Lab Co Ltd | 半導体装置およびその作製方法 |
KR970064327A (ko) * | 1996-02-27 | 1997-09-12 | 모리시다 요이치 | 고주파 전력 인가장치, 플라즈마 발생장치, 플라즈마 처리장치, 고주파 전력 인가방법, 플라즈마 발생방법 및 플라즈마 처리방법 |
JP3208079B2 (ja) | 1996-02-27 | 2001-09-10 | 松下電器産業株式会社 | 高周波電力印加装置及びプラズマ処理装置 |
TW334581B (en) * | 1996-06-04 | 1998-06-21 | Handotai Energy Kenkyusho Kk | Semiconductor integrated circuit and fabrication method thereof |
JP3305961B2 (ja) * | 1996-09-26 | 2002-07-24 | 株式会社東芝 | 多結晶シリコン薄膜トランジスタの製造方法 |
US6590230B1 (en) * | 1996-10-15 | 2003-07-08 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
JP3645377B2 (ja) | 1996-10-24 | 2005-05-11 | 株式会社半導体エネルギー研究所 | 集積回路の作製方法 |
JP3597331B2 (ja) | 1996-10-24 | 2004-12-08 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
TW451284B (en) * | 1996-10-15 | 2001-08-21 | Semiconductor Energy Lab | Semiconductor device and method of manufacturing the same |
US6337520B1 (en) * | 1997-02-26 | 2002-01-08 | Samsung Electronics Co., Ltd. | Composition for a wiring, a wiring using the composition, manufacturing method thereof, a display using the wiring and manufacturing method thereof |
JP3392672B2 (ja) * | 1996-11-29 | 2003-03-31 | 三洋電機株式会社 | 表示装置 |
JP3762002B2 (ja) * | 1996-11-29 | 2006-03-29 | 株式会社東芝 | 薄膜トランジスタ、及び液晶表示装置 |
JPH10229197A (ja) * | 1997-02-17 | 1998-08-25 | Sanyo Electric Co Ltd | 薄膜トランジスタ、薄膜トランジスタの製造方法 |
JPH10233511A (ja) | 1997-02-21 | 1998-09-02 | Toshiba Corp | 薄膜トランジスタ装置及び薄膜トランジスタ装置の製造方法並びに液晶表示装置 |
JP4401448B2 (ja) * | 1997-02-24 | 2010-01-20 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
JPH1065181A (ja) | 1997-04-04 | 1998-03-06 | Semiconductor Energy Lab Co Ltd | 半導体装置およびその作製方法 |
JP4566294B2 (ja) | 1997-06-06 | 2010-10-20 | 株式会社半導体エネルギー研究所 | 連続粒界結晶シリコン膜、半導体装置 |
JP4318768B2 (ja) * | 1997-07-23 | 2009-08-26 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
JP4068219B2 (ja) | 1997-10-21 | 2008-03-26 | 株式会社半導体エネルギー研究所 | 半導体装置の作製方法 |
KR100274893B1 (ko) | 1998-08-12 | 2000-12-15 | 김순택 | 박막트랜지스터 및 그 제조방법 |
US6372558B1 (en) * | 1998-08-18 | 2002-04-16 | Sony Corporation | Electrooptic device, driving substrate for electrooptic device, and method of manufacturing the device and substrate |
JP4536187B2 (ja) * | 1998-11-17 | 2010-09-01 | 株式会社半導体エネルギー研究所 | 半導体装置およびその作製方法 |
US6909114B1 (en) * | 1998-11-17 | 2005-06-21 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device having LDD regions |
US6420758B1 (en) * | 1998-11-17 | 2002-07-16 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device having an impurity region overlapping a gate electrode |
US6365917B1 (en) * | 1998-11-25 | 2002-04-02 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
EP1020920B1 (en) * | 1999-01-11 | 2010-06-02 | Sel Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device having a driver TFT and a pixel TFT on a common substrate |
US6777716B1 (en) * | 1999-02-12 | 2004-08-17 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor display device and method of manufacturing therefor |
JP4549475B2 (ja) * | 1999-02-12 | 2010-09-22 | 株式会社半導体エネルギー研究所 | 半導体装置、電子機器、および半導体装置の作製方法 |
US6306694B1 (en) * | 1999-03-12 | 2001-10-23 | Semiconductor Energy Laboratory Co., Ltd. | Process of fabricating a semiconductor device |
US6281552B1 (en) * | 1999-03-23 | 2001-08-28 | Semiconductor Energy Laboratory Co., Ltd. | Thin film transistors having ldd regions |
TW480554B (en) * | 1999-07-22 | 2002-03-21 | Semiconductor Energy Lab | Semiconductor device and manufacturing method thereof |
US6541294B1 (en) * | 1999-07-22 | 2003-04-01 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method thereof |
US6646287B1 (en) * | 1999-11-19 | 2003-11-11 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device with tapered gate and insulating film |
SG138468A1 (en) * | 2001-02-28 | 2008-01-28 | Semiconductor Energy Lab | A method of manufacturing a semiconductor device |
-
2002
- 2002-02-18 SG SG200504773-3A patent/SG138468A1/en unknown
- 2002-02-18 SG SG200200834A patent/SG103846A1/en unknown
- 2002-02-20 TW TW091102943A patent/TW533461B/zh not_active IP Right Cessation
- 2002-02-21 US US10/078,414 patent/US6599785B2/en not_active Expired - Lifetime
- 2002-02-25 MY MYPI20020638A patent/MY127548A/en unknown
- 2002-02-28 KR KR1020020010940A patent/KR100959030B1/ko not_active IP Right Cessation
- 2002-02-28 CN CNB021065519A patent/CN1286156C/zh not_active Expired - Fee Related
- 2002-02-28 CN CN2006101398562A patent/CN1917220B/zh not_active Expired - Fee Related
-
2003
- 2003-04-25 US US10/422,829 patent/US6979603B2/en not_active Expired - Lifetime
-
2005
- 2005-11-29 US US11/288,218 patent/US7531839B2/en not_active Expired - Fee Related
-
2007
- 2007-02-28 KR KR1020070020342A patent/KR100928163B1/ko active IP Right Grant
-
2009
- 2009-04-16 US US12/424,807 patent/US8017951B2/en not_active Expired - Fee Related
- 2009-08-12 KR KR1020090074085A patent/KR100972308B1/ko active IP Right Grant
-
2011
- 2011-09-07 US US13/226,803 patent/US8242508B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US20020119606A1 (en) | 2002-08-29 |
US8242508B2 (en) | 2012-08-14 |
CN1917220A (zh) | 2007-02-21 |
KR100959030B1 (ko) | 2010-05-20 |
US6979603B2 (en) | 2005-12-27 |
KR20090096585A (ko) | 2009-09-11 |
KR100972308B1 (ko) | 2010-07-26 |
US20060289865A1 (en) | 2006-12-28 |
US7531839B2 (en) | 2009-05-12 |
KR20020070878A (ko) | 2002-09-11 |
CN1917220B (zh) | 2012-08-15 |
MY127548A (en) | 2006-12-29 |
CN1373504A (zh) | 2002-10-09 |
SG103846A1 (en) | 2004-05-26 |
US20030203545A1 (en) | 2003-10-30 |
US20090203175A1 (en) | 2009-08-13 |
CN1286156C (zh) | 2006-11-22 |
US8017951B2 (en) | 2011-09-13 |
US20120007094A1 (en) | 2012-01-12 |
KR100928163B1 (ko) | 2009-11-25 |
TW533461B (en) | 2003-05-21 |
US6599785B2 (en) | 2003-07-29 |
KR20070043732A (ko) | 2007-04-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
SG138468A1 (en) | A method of manufacturing a semiconductor device | |
EP1001467A3 (en) | Semiconductor device and method of manufacturing the same | |
KR930005257A (ko) | 박막 전계효과 소자 및 그의 제조방법 | |
KR930006972A (ko) | 전계 효과 트랜지스터의 제조 방법 | |
KR970024304A (ko) | 박막 트랜지스터 제조방법 | |
KR950034822A (ko) | 고전압 트랜지스터 및 그 제조방법 | |
JP3588945B2 (ja) | アクティブマトリクス基板の製造方法 | |
TW200502632A (en) | Thin film transistor array panel and manufacturing method thereof | |
JP2002258324A5 (ko) | ||
KR970022464A (ko) | Cmos박막반도체장치 및 그 제조방법 | |
KR940010384A (ko) | 박막트랜지스터 제조방법 | |
JP2000223711A5 (ko) | ||
KR960019779A (ko) | 액정표시장치용 박막트랜지스터 및 그 제조방법 | |
EP0710989A3 (en) | Field-effect transistor and method of producing same | |
JP2005064123A (ja) | 薄膜トランジスタおよび表示装置 | |
KR100332565B1 (ko) | 액정표시장치제조방법 | |
JPS5346287A (en) | Production of semiconductor integrated circuit | |
KR970054507A (ko) | 박막 트랜지스터 및 그 제조 방법 | |
JPH01145863A (ja) | 半導体装置の製造方法 | |
KR960026959A (ko) | 저도핑 드레인(ldd) 구조의 모스 트랜지스터 및 그 제조방법 | |
KR970076039A (ko) | 액정표시장치의 제조방법 | |
KR970003940A (ko) | 반도체 소자의 트랜지스터 제조방법 | |
KR970030794A (ko) | 씨모스 트랜지스터 및 그 제조방법 | |
KR950012645A (ko) | 반도체 장치의 박막 트랜지스터 제조방법 | |
KR920007215A (ko) | 다층구조의 시모스 트랜지스터의 제조방법 |