JP2017533589A5 - - Google Patents

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JP2017533589A5
JP2017533589A5 JP2017522023A JP2017522023A JP2017533589A5 JP 2017533589 A5 JP2017533589 A5 JP 2017533589A5 JP 2017522023 A JP2017522023 A JP 2017522023A JP 2017522023 A JP2017522023 A JP 2017522023A JP 2017533589 A5 JP2017533589 A5 JP 2017533589A5
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silicon nitride
silicon
films
nitride film
high quality
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JP2017522023A 2014-10-24 2015-10-23 ケイ素含有膜の堆積のための組成物及びそれを使用した方法 Active JP6871161B2 (ja)

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US201462068248P 2014-10-24 2014-10-24
US62/068,248 2014-10-24
PCT/US2015/057045 WO2016065221A1 (en) 2014-10-24 2015-10-23 Compositions and methods using same for deposition of silicon-containing films

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JP2017533589A JP2017533589A (ja) 2017-11-09
JP2017533589A5 true JP2017533589A5 (enExample) 2021-02-18
JP6871161B2 JP6871161B2 (ja) 2021-05-12

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JP2017522023A Active JP6871161B2 (ja) 2014-10-24 2015-10-23 ケイ素含有膜の堆積のための組成物及びそれを使用した方法
JP2019164049A Active JP6949912B2 (ja) 2014-10-24 2019-09-09 ケイ素含有膜の堆積のための組成物及びそれを使用した方法
JP2021152399A Active JP7152576B2 (ja) 2014-10-24 2021-09-17 ケイ素含有膜の堆積のための組成物及びそれを使用した方法

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US (5) US10316407B2 (enExample)
EP (3) EP3209814B1 (enExample)
JP (4) JP2017535077A (enExample)
KR (3) KR102079501B1 (enExample)
CN (4) CN113373428B (enExample)
SG (3) SG10202000545RA (enExample)
TW (3) TWI658168B (enExample)
WO (2) WO2016065221A1 (enExample)

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